Elastic probe array ICT test quick-locking device
By designing the sockets, inserts, and limiting components, the problems of time-consuming and uneven installation and replacement of the elastic probe array ICT testing device are solved, achieving fast and uniform probe fixation, and improving detection accuracy and work efficiency.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- KUNSHAN XINGLIANDA ELECTRICAL CO LTD
- Filing Date
- 2025-07-08
- Publication Date
- 2026-07-03
Smart Images
Figure CN224456828U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of locking device technology, and in particular to a fast locking device for ICT testing of elastic probe arrays. Background Technology
[0002] In the field of electronic product manufacturing, ICT (Information and Testing Technology) is an efficient and accurate testing method that can quickly detect problems such as short circuits, open circuits, and abnormal component parameters during product production. It plays a crucial role in ensuring product quality and improving production efficiency. Flexible probe arrays, as key components in ICT testing, are electrically connected to test points on the circuit board to detect various circuit parameters. Existing flexible probe array ICT testing devices typically use threaded fastening or adhesive bonding to fix the probes during installation and replacement. Threaded fastening requires tools such as screwdrivers to repeatedly tighten the screws, which is not only time-consuming but also prone to uneven force on multiple probes when installed simultaneously due to inconsistent tightness, affecting testing accuracy. While adhesive bonding achieves fixation, the curing time is long, and any overflow can contaminate the testing area. Later probe replacement requires solvent removal of the adhesive, which can easily damage the testing fixture. Therefore, this invention proposes a rapid locking device for flexible probe array ICT testing. Utility Model Content
[0003] The purpose of this invention is to address the problems in the prior art where threaded fastening requires the use of screwdrivers and other tools to repeatedly tighten screws, which is not only time-consuming but also prone to uneven force on multiple probes when multiple probes are installed simultaneously due to inconsistent tightness, affecting detection accuracy. Although adhesive bonding can achieve fixation, the adhesive curing time is long, and once the adhesive overflows, it will contaminate the detection area. When replacing probes later, solvents are needed to remove the adhesive, which can easily damage the detection frame. Therefore, this invention proposes a quick locking device for elastic probe array ICT testing.
[0004] The technical solution of this utility model: a quick locking device for ICT testing of elastic probe array, including a testing frame and a driver set on the testing frame for testing, and further including: a fixing plate fixedly set on the bottom surface of the driver, the bottom surface of the fixing plate having multiple insertion holes, each insertion hole having an insertion block inserted into it, and an elastic probe for testing fixedly set at one end of each insertion block; a sliding groove opened on one side of the fixing plate, the sliding groove having a limiting component for limiting the elastic probe.
[0005] Optionally, the limiting component includes multiple sliding bars with multiple locking holes. One end of each sliding bar is fixedly connected to a guide rod, which movably passes through and extends to connect with a limiting block. A spring is sleeved on the outer wall of the guide rod, with one end of the spring fixedly connected to the fixed plate and the other end of the spring fixedly connected to the limiting block. The other end of the sliding bar is fixedly connected to a limiting strip.
[0006] Optionally, the socket is connected to the slide groove.
[0007] Optionally, the outer wall of the insert block is provided with a slot.
[0008] Optionally, the locking hole is gourd-shaped.
[0009] Optionally, a handle is fixedly provided on one side of the limiting strip.
[0010] In summary, this application includes at least one of the following beneficial technical effects:
[0011] This utility model achieves the effect of quick and convenient installation and replacement of elastic probes by setting a fixing plate structure with a socket, a plug and a limiting component. After inserting the plug into the socket, push the sliding bar of the limiting component to make the locking hole lock the plug, thus completing the fixing. This greatly shortens the installation time and improves work efficiency.
[0012] Furthermore, this utility model achieves the effect of ensuring uniform force on multiple elastic probes and improving detection accuracy through the cooperative structure of spring, guide rod and gourd-shaped locking hole in the limiting component. The spring provides stable clamping force, and the gourd-shaped locking hole can accurately limit the insertion block, avoiding the problem of uneven force caused by inconsistent tightness when multiple probes are installed, effectively ensuring the accuracy and reliability of detection. Attached Figure Description
[0013] Figure 1 A schematic diagram of a rapid locking device for ICT testing of elastic probe arrays is provided.
[0014] Figure 2 for Figure 1 Schematic diagram of the middle fixing plate;
[0015] Figure 3 for Figure 2 A schematic diagram of the split structure;
[0016] Figure 4 for Figure 3 A schematic diagram of the internal cross-sectional structure of the central fixing plate.
[0017] Figure label:
[0018] 1. Testing frame; 2. Driver; 3. Fixing plate; 4. Insertion hole; 5. Insertion block; 6. Flexible probe; 7. Slide groove;
[0019] 8. Limiting component; 81. Sliding bar; 82. Locking hole; 83. Guide rod; 84. Limiting block; 85. Spring; 86. Limiting strip;
[0020] 9. Card slot; 10. Handle. Detailed Implementation
[0021] The technical solution of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are some embodiments of this utility model, but not all embodiments.
[0022] The components of the present invention embodiments described and shown in the accompanying drawings can typically be arranged and designed in a variety of different configurations. Therefore, the following detailed description of the embodiments of the present invention provided in the drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention.
[0023] Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.
[0024] In the description of this utility model, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the accompanying drawings and are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.
[0025] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.
[0026] Example
[0027] like Figure 1 and Figure 2As shown, the elastic probe array ICT test quick locking device proposed in this utility model includes a test frame 1 and a driver 2 set on the test frame 1 for testing. The driver 2 is an electric push rod that can push the fixed plate 3 to move vertically up and down. It also includes: a fixed plate 3 fixedly set on the bottom surface of the driver 2. The bottom surface of the fixed plate 3 has multiple insertion holes 4. Insert blocks 5 are inserted into the insertion holes 4 respectively. The outer wall of the insert block 5 has a slot 9, which facilitates the limiting of the insert block 5.
[0028] Furthermore, an elastic probe 6 for detection is fixedly installed at one end of the insertion block 5. The elastic probe 6 is existing technology and will not be described in detail here. A sliding groove 7 is opened on one side of the fixing plate 3, and multiple sliding grooves 7 are provided. The insertion hole 4 is connected to the sliding groove 7.
[0029] like Figure 3 and Figure 4 As shown, a limiting component 8 for limiting the elastic probe 6 is slidably arranged inside the slide groove 7. The limiting component 8 includes multiple sliding strips 81, and the sliding strips 81 are slidably connected to the slide groove 7. Multiple locking holes 82 are provided on the sliding strips 81. The locking holes 82 are gourd-shaped and can be engaged with the slots 9 on the outer wall of the insert block 5, thereby stably limiting the elastic probe 6. A guide rod 83 is fixedly connected to one end of the sliding strip 81. The guide rod 83 is movably connected to the fixed plate 3 and extends to the limiting block 84. The guide rod 83 can limit the sliding strip 81 and ensure the stability of the movement.
[0030] Furthermore, a spring 85 is sleeved on the outer wall of the guide rod 83. One end of the spring 85 is fixedly connected to the fixing plate 3, and the other end of the spring 85 is fixedly connected to the limiting block 84, which can reset the sliding bar 81, thereby making the locking hole 82 and the slot 9 stably locked together to prevent shaking. The other end of the sliding bar 81 is fixedly connected to the limiting bar 86, and a handle 10 is fixedly provided on one side of the limiting bar 86, which makes it easy to pull multiple sliding bars 81 simultaneously in the slide groove 7 through the handle 10, thereby improving the efficiency of installing and replacing the elastic probe 6.
[0031] The working principle of this embodiment is as follows: When it is necessary to install or replace the elastic probe 6, the handle 10 is used to pull the sliding bar 81 to slide inside the groove 7, and the sliding bar 81 drives the locking hole 82 to move simultaneously. Then, the insert 5 is aligned with the insertion hole 4 on the bottom surface of the fixing plate 3 and inserted through the locking hole 82.
[0032] At this time, release the handle 10, and the spring 85 pushes the limit block 84 to move. The limit block 84 drives the guide rod 83 to move, and the guide rod 83 drives the sliding strip 81 to slide in the slide groove 7. The sliding strip 81 drives the locking hole 82 to engage with the slot 9 on the insert block 5, thus avoiding uneven force caused by inconsistent tightness when multiple probes are installed, thereby effectively ensuring the accuracy and reliability of the detection.
[0033] During the testing process, the driver 2 drives the fixed plate 3 to move vertically downwards, and the fixed plate 3 drives multiple elastic probes 6 on it to move vertically downwards simultaneously, thereby testing the circuit and other parameters.
[0034] The above specific embodiments are merely several optional embodiments of this utility model. Based on the technical solution of this utility model and the relevant teachings of the above embodiments, those skilled in the art can make various alternative improvements and combinations to the above specific embodiments.
Claims
1. A fast locking device for ICT test of an elastic probe array, comprising a detection frame (1) and a driver (2) arranged on the detection frame (1) for detection, characterized in that, Also includes: A fixing plate (3) is fixedly installed on the bottom surface of the driver (2). The bottom surface of the fixing plate (3) is provided with multiple insertion holes (4). Insert blocks (5) are respectively inserted into the insertion holes (4). An elastic probe (6) for detection is fixedly installed at one end of the insertion block (5). A groove (7) is provided on one side of the fixed plate (3), and a limiting component (8) for limiting the elastic probe (6) is slidably provided inside the groove (7).
2. The elastic probe array ICT test quick locking device according to claim 1, characterized in that, The limiting component (8) includes multiple sliding bars (81), each sliding bar (81) having multiple locking holes (82). One end of each sliding bar (81) is fixedly connected to a guide rod (83). The guide rod (83) is movably connected to the fixing plate (3) and extends to connect to a limiting block (84). A spring (85) is sleeved on the outer wall of the guide rod (83). One end of the spring (85) is fixedly connected to the fixing plate (3), and the other end of the spring (85) is fixedly connected to the limiting block (84). The other end of the sliding bar (81) is fixedly connected to a limiting strip (86).
3. The elastic probe array ICT test quick locking device according to claim 1, characterized in that, The insertion hole (4) is connected to the slide groove (7).
4. The rapid locking device for ICT testing of elastic probe arrays according to claim 1, characterized in that, The outer wall of the insert (5) is provided with a slot (9).
5. The elastic probe array ICT test quick locking device according to claim 2, characterized in that, The locking hole (82) is gourd-shaped.
6. The elastic probe array ICT test quick locking device according to claim 2, characterized in that, A handle (10) is fixedly provided on one side of the limiting strip (86).