Auxiliary stage for forging impact notch projector
By designing an auxiliary stage for a forging impact notch projector, and utilizing a screw and positioning frame to achieve parallel positioning of the sample and calibration line, the problems of complex sample adjustment and insufficient stability in existing technologies are solved, thereby improving the accuracy and efficiency of testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- JIANGSU HUAYI FORGING CO LTD
- Filing Date
- 2025-08-26
- Publication Date
- 2026-07-03
AI Technical Summary
Existing impact specimen notch projectors are complex to operate during specimen adjustment and lack stability, resulting in inaccurate test results.
An auxiliary stage for a forging impact notch projector was designed, including an adjustment bracket and a positioning assembly. The parallel positioning of the sample and the projector calibration line is achieved by a screw and a positioning frame. Combined with the elastic clamping of the fixed guide plate and the movable guide plate, the sample remains stable during the adjustment process.
It simplifies the sample adjustment process, improves detection efficiency and accuracy, and avoids detection errors caused by sample displacement during adjustment.
Smart Images

Figure CN224457210U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of impact test specimen notch projector technology, and in particular to an auxiliary stage for an impact notch projector for forgings. Background Technology
[0002] The impact specimen notch projector is a testing device designed according to standards such as GB / T229-2007. It is mainly used for the geometric dimension inspection of U-shaped and V-shaped notches on impact specimens of metallic materials, ensuring that the specimen processing meets the specifications. Existing impact specimen notch projectors are shown in the attached image. Figure 1 As shown, place the sample on the adjustment bracket of the projection device, turn on the projector to project the sample notch on the adjustment bracket onto the display screen, and adjust the front-back and left-right positions of the sample by adjusting the fine adjustment knob at the bottom of the adjustment bracket to align it with the calibration line for comparison.
[0003] Existing impact notch projectors still have certain shortcomings. For example, operators usually place the sample directly on the projection platform. Although the front-back and left-right positions of the sample can be adjusted by fine-tuning knobs, the sample usually needs to be parallel to the horizontal calibration line of the projector during testing to avoid inaccurate calibration of the left and right dimensions of the sample notch. This requires the operator to move and adjust the sample multiple times to make it parallel to the horizontal calibration line, which increases the operation time and makes it difficult to accurately adjust to a horizontal position, affecting the accuracy of the test results. In addition, the sample lacks positioning during the current adjustment, and the sample is prone to displacement due to the rapid movement of the bottom platform, which also interferes with the test results. Therefore, there is a need for an auxiliary stage for forging impact notch projectors that can quickly position the sample and shorten the adjustment time.
[0004] The information disclosed in this background section is only intended to enhance the understanding of the background technology of this utility model, and therefore may include prior art that is not known to those skilled in the art. Utility Model Content
[0005] To address the issues of numerous sample adjustment steps and insufficient sample stability in existing impact notch projectors, this invention provides an auxiliary stage for an impact notch projector for forgings.
[0006] The auxiliary platform for a forging impact notch projector provided by this utility model adopts the following technical solution:
[0007] An auxiliary platform for a forging impact notch projector includes a projection device and an adjusting bracket. The adjusting bracket is fixedly connected to the inner side of the projection device and can adjust the position of the sample forward and backward and left and right. A positioning component is fixedly connected to one side of the adjusting bracket. The positioning component includes a support frame, a screw, and a positioning frame. The support frame is fixedly connected to the adjusting bracket, and the top of the support frame is threadedly connected to the screw. A positioning frame is sleeved on the outer side of one end of the screw. Rotating the screw laterally can push the positioning frame to move above the adjusting bracket. The long side of the positioning frame is parallel to the horizontal calibration line of the projector. A standard sample is inserted into the inner side of the positioning frame, and the positioning frame can make the standard sample parallel to the horizontal calibration line of the projector.
[0008] Furthermore, two fixed guide plates are symmetrically fixed on one side of the inner wall of the positioning frame, and two movable guide plates are symmetrically fixed on the other side of the inner wall of the positioning frame. The fixed guide plates and movable guide plates are located on both sides of the standard sample, respectively. The standard sample is squeezed and fixed on one side of the fixed guide plate by the movable guide plate. The fixed guide plate and the horizontal calibration line of the projector are kept parallel.
[0009] Furthermore, a fixing rod is fixed to the lower side wall of the fixed guide plate, and the fixed guide plate is rigidly connected to the positioning frame through the fixing rod. A spring is fixed to the lower side wall of the movable guide plate, and the spring is fixedly connected to the inner wall of the positioning frame. Guide rods are symmetrically arranged on both sides of the spring. A second guide hole is symmetrically arranged on the inner side of one side of the positioning frame. One end of the guide rod is fixedly connected to the movable guide plate, and the other end of the guide rod passes through the second guide hole. The movable guide plate achieves lateral elastic displacement through the spring and the guide rod passing through the second guide hole, which facilitates the compression and fixing of standard samples of different sizes.
[0010] Furthermore, the upper ends of both the fixed guide plate and the movable guide plate are inclined plates, which makes the installation of the standard sample smoother.
[0011] Furthermore, the support frame includes an L-shaped fixing plate, a support plate, a connecting plate, and a threaded hole. One end of the L-shaped fixing plate is fixedly connected to an adjusting bracket. The top surface of the L-shaped fixing plate is fixed with a support plate, and the top surface of the support plate is fixed with a connecting plate. The connecting plate has a threaded hole in the middle, and the threaded hole and the screw form a precision helical pair.
[0012] Furthermore, a guide rod is symmetrically fixed on one side of the outer wall of the positioning frame, and a first guide hole is symmetrically provided on the side of the connecting plate. The guide rod passes through the first guide hole and is clearance-fitted with the first guide hole.
[0013] Furthermore, a limiting plate is fixed to one end of the screw, a T-shaped rotating groove is provided in the middle of one side wall of the positioning frame, the limiting plate is located inside the T-shaped rotating groove, and a rotating plate is fixed to the other end of the screw.
[0014] Furthermore, an observation port is provided in the middle of the other side wall of the positioning frame, and a notch is provided in the middle of one side wall of the standard sample, with the notch located on the side of the observation port.
[0015] In summary, this utility model has the following beneficial technical effects:
[0016] (1) By using the parallel design of the fixed guide plate and the horizontal calibration line of the projector, the standard sample is inserted into the inner side of the positioning frame and then pressed and attached to the fixed guide plate by the movable guide plate, ensuring that the standard sample is always parallel to the calibration line, avoiding angular deviation when manually placed, thereby improving the accuracy of notch size comparison, and eliminating the need for repeated manual fine-tuning, thus improving detection efficiency.
[0017] (2) The adjustment bracket is linked with the positioning component. The horizontal movement of the positioning frame is achieved through the screw and T-shaped rotating groove. The operator can rotate the rotating plate to move the positioning frame and the inner standard sample to the projection position. At the same time, when the operator operates the adjustment bracket to make small adjustments to the sample in the front, back, left and right directions, the positioning frame positions the sample so that the sample can move stably and synchronously with the adjustment bracket. This avoids the situation where the sample is prone to slippage when the bottom bracket is adjusted quickly, which is a common problem for conventional samples. This further improves the accuracy of comparative testing. Attached Figure Description
[0018] Figure 1 This is a schematic diagram of the main structure of this utility model;
[0019] Figure 2 This is a three-dimensional schematic diagram of the positioning component and standard sample of this utility model;
[0020] Figure 3 This is a partial sectional view of the positioning frame of this utility model;
[0021] Figure 4 This is a utility model Figure 3 Enlarged view of point A in the middle;
[0022] Figure 5 This is a three-dimensional schematic diagram of the support frame and screw of this utility model.
[0023] Explanation of reference numerals in the attached drawings: 1. Projection equipment; 2. Adjustment bracket; 3. Positioning assembly; 31. Support frame; 311. L-shaped fixing plate; 312. Support plate; 313. Connecting plate; 314. Threaded hole; 315. First guide hole; 32. Screw; 321. Limiting plate; 322. Rotating plate; 33. Positioning frame; 331. Observation port; 332. Fixed guide plate; 333. Movable guide plate; 334. Guide rod; 335. T-shaped rotating groove; 336. Fixing rod; 337. Guide rod; 338. Spring; 339. Second guide hole; 4. Standard sample; 41. Notch. Detailed Implementation
[0024] The following is in conjunction with the appendix Figure 1-5 The present invention will be described in further detail below.
[0025] Example 1: In this example, refer to Figure 1 and Figure 2 As shown, specifically, an auxiliary platform for a forging impact notch projector includes a projection device 1 and an adjusting bracket 2. The adjusting bracket 2 is fixedly connected to the inner side of the projection device 1. The adjusting bracket 2 can adjust the sample position back and forth and left and right. A fine-tuning knob is provided at the bottom of the adjusting bracket 2. The specific operation method and principle can refer to the impact notch projector of the prior art. A positioning component 3 is fixedly connected to one side of the adjusting bracket 2, and is fixedly connected to the side of the plate placed on the top of the adjusting bracket 2. The positioning component 3 includes a support frame 31, a screw 32 and a positioning frame 33. The support frame 31 is fixedly connected to the adjusting bracket 2. The top of the support frame 31 is threadedly connected to the screw 32. The positioning frame 33 is sleeved on the outer side of one end of the screw 32. The support frame 31 includes an L-shaped fixing plate 311, a support plate 312, a connecting plate 313 and a threaded hole 314. One end of the L-shaped fixing plate 311 is fixedly connected to the adjusting bracket 2. A support plate 312 is fixed to the top surface of plate 311, and a connecting plate 313 is fixed to the top surface of support plate 312. A threaded hole 314 is provided in the middle of the connecting plate 313. The threaded hole 314 and the screw 32 form a precision helical pair. A limit plate 321 is fixed to one end of the screw 32. A T-shaped rotating groove 335 is provided in the middle of one side wall of the positioning frame 33. The limit plate 321 is located inside the T-shaped rotating groove 335. A rotating plate 322 is fixed to the other end of the screw 32. Rotating the screw 32 laterally can push the positioning frame 33 to move above the adjusting bracket 2. The long side of the positioning frame 33 is parallel to the horizontal calibration line of the projector (the style of the projector calibration line can refer to the existing technology, with a horizontal line set at the bottom parallel to the sample, and an inverted V-shape or inverted U-shape set on the horizontal line for calibration). A standard sample 4 is inserted into the inner side of the positioning frame 33. The positioning frame 33 can make the standard sample 4 parallel to the horizontal calibration line of the projector.
[0026] Specifically, through the above technical solution, when the operator tests the standard sample 4, he / she directly inserts it into the inner side of the positioning frame 33, which is parallel to the horizontal calibration line of the projector, so that the standard sample 4 is directly parallel to the horizontal calibration line of the projector. This eliminates the need for the operator to repeatedly adjust the sample angle, simplifies the operation steps, avoids errors caused by manual adjustment, and improves the accuracy of the test.
[0027] Example 2: In this example, refer to Figure 2 and Figure 3As shown, specifically, two fixed guide plates 332 are symmetrically fixed on one side of the inner wall of the positioning frame 33. The fixed guide plates 332 are parallel to the horizontal calibration line of the projector. When inserting the sample, the standard sample 4 is attached to the fixed guide plate 332. Two movable guide plates 333 are symmetrically fixed on the other side of the inner wall of the positioning frame 33. The fixed guide plate 332 and the movable guide plate 333 are located on both sides of the standard sample 4. The standard sample 4 is pressed and fixed to one side of the fixed guide plate 332 by the movable guide plate 333. A fixing rod 336 is fixed to the lower side wall of the fixed guide plate 332. The fixed guide plate 332 is rigidly connected to the positioning frame 33 through the fixing rod 336. The lower side wall of the movable guide plate 333 is fixed. A spring 338 is fixedly connected to the inner wall of the positioning frame 33. The spring 338 enables the movable guide plate 333 to elastically compress the standard sample 4. It can be used for samples of different sizes. Guide rods 337 are symmetrically arranged on both sides of the spring 338. A second guide hole 339 is symmetrically arranged on one side of the inner wall of the positioning frame 33. One end of the guide rod 337 is fixedly connected to the movable guide plate 333, and the other end of the guide rod 337 passes through the second guide hole 339, which improves the movement stability of the movable guide plate 333. The movable guide plate 333 achieves lateral elastic displacement through the spring 338 and the guide rod 337 passing through the second guide hole 339, which facilitates the compression and fixing of standard samples 4 of different sizes.
[0028] Specifically, through the above technical solution, the positioning frame 33 can elastically clamp samples of different sizes through two sets of inner guide plates, which has a wide range of applications. At the same time, by positioning the sample through the positioning frame 33, when the operator fine-tunes the adjustment bracket 2, the standard sample 4 can move synchronously with the adjustment bracket 2, avoiding the problem of sample slippage due to lack of positioning in conventional operation.
[0029] Example 3: In this example, refer to Figure 2 As shown, specifically, the upper ends of both the fixed guide plate 332 and the movable guide plate 333 are inclined plates;
[0030] Specifically, the installation of the standard sample 4 is smoother and less prone to jamming by the guidance of the fixed guide plate 332 and the movable guide plate 333.
[0031] Example 4: In this example, refer to Figure 2 and Figure 5 As shown, specifically, a guide rod 334 is symmetrically fixed on one side of the outer wall of the positioning frame 33, and a first guide hole 315 is symmetrically provided on the side of the connecting plate 313. The guide rod 334 passes through the first guide hole 315, and the guide rod 334 and the first guide hole 315 are fitted with a clearance.
[0032] Specifically, the guide rod 334 cooperates with the first guide hole 315 to ensure that the positioning frame 33 moves only along the axial direction of the screw 32, avoiding lateral displacement.
[0033] Example 5: In this example, refer to Figure 2 and Figure 3 As shown, specifically, an observation port 331 is provided in the middle of the other side wall of the positioning frame 33, and a notch 41 is provided in the middle of one side wall of the standard sample 4. The notch 41 is located on one side of the observation port 331.
[0034] Specifically, the observation port 331 facilitates the operator's subsequent observation of the projection of the notch 41, while the fixed guide plate 332 supports both ends of the sample, and the middle part of the sample can be easily observed during projection, which facilitates the operator's quick calibration and avoids the problem of difficulty in distinguishing multiple structural projections and the sample being too close together.
[0035] Working principle: The operator positions the notch 41 of the standard sample 4 towards the inside of the projection device 1, and then inserts the standard sample 4 into the inside of the positioning frame 33 through the guidance of the fixed guide plate 332 and the movable guide plate 333. The elastic compression of the movable guide plate 333 makes the sample fit tightly against the fixed guide plate 332. Then, the operator rotates the screw 32 on one side of the positioning frame 33, so that the screw 32 drives the positioning frame 33 to move axially along the first guide hole 315 until the positioning frame 33 and the standard sample 4 move to the projection position of the adjustment bracket 2. Then, the operator turns on the switch of the projection device 1, so that the projection is generated on the display screen. Since the fixed guide plate 332 and the projection line are parallel to the horizontal calibration line, there is no need to adjust the placement angle of the standard sample, simplifying the operation steps.
[0036] The operator then adjusts the left-right and front-back positions of the sample by adjusting the fine-tuning knob at the bottom of the bracket 2 according to the pattern on the display screen until the test is completed. During the adjustment process, the sample is positioned by the positioning frame 33, which can effectively prevent the sample from slipping during the adjustment and improve the accuracy of the test.
[0037] The foregoing has shown and described the basic principles, main features, and advantages of this utility model. Those skilled in the art should understand that this utility model is not limited to the above embodiments. The descriptions of the above embodiments and specifications are merely illustrative of the principles of this utility model. Various changes and modifications can be made to this utility model without departing from its spirit and scope, and all such changes and modifications fall within the scope of protection claimed by this utility model. The scope of protection of this utility model is defined by the appended claims and their equivalents.
Claims
1. An auxiliary stage for a forging impact notch projector, comprising a projection device and an adjustment bracket, characterized in that: An adjustment bracket is fixedly connected to the inner side of the projection device. The adjustment bracket can adjust the position of the sample back and forth and left and right. A positioning component is fixedly connected to one side of the adjustment bracket. The positioning component includes a support frame, a screw, and a positioning frame. The support frame is fixedly connected to an adjustment bracket. The top of the support frame is threadedly connected to the screw. A positioning frame is sleeved on the outer side of one end of the screw. Rotating the screw laterally can push the positioning frame to move above the adjustment bracket. The long side of the positioning frame is parallel to the horizontal calibration line of the projector. A standard sample is inserted into the inner side of the positioning frame. The positioning frame enables the standard sample to be parallel to the horizontal calibration line of the projector.
2. The auxiliary stage for a forging impact notch projector according to claim 1, wherein: Two fixed guide plates are symmetrically fixed on one side of the inner wall of the positioning frame, and two movable guide plates are symmetrically fixed on the other side of the inner wall of the positioning frame. The fixed guide plates and movable guide plates are located on both sides of the standard sample. The standard sample is squeezed and fixed on one side of the fixed guide plate by the movable guide plate. The fixed guide plate and the horizontal calibration line of the projector are kept parallel.
3. The auxiliary platform for a forging impact notch projector according to claim 2, characterized in that: A fixing rod is fixed to the lower side wall of the fixed guide plate, and the fixed guide plate is rigidly connected to the positioning frame through the fixing rod. A spring is fixed to the lower side wall of the movable guide plate, and the spring is fixedly connected to the inner wall of the positioning frame. Guide rods are symmetrically arranged on both sides of the spring. A second guide hole is symmetrically arranged on the inner side of one side of the positioning frame. One end of the guide rod is fixedly connected to the movable guide plate, and the other end of the guide rod passes through the second guide hole. The movable guide plate achieves lateral elastic displacement through the spring and the guide rod passing through the second guide hole, which facilitates the compression and fixing of standard samples of different sizes.
4. The auxiliary stage for a forging impact notch projector according to claim 3, wherein: The upper ends of both the fixed guide plate and the movable guide plate are inclined plates, which make the installation of the standard sample smoother.
5. The auxiliary stage for a forging impact notch projector according to claim 4, wherein: The support frame includes an L-shaped fixing plate, a support plate, a connecting plate, and a threaded hole. One end of the L-shaped fixing plate is fixedly connected to an adjusting bracket. The top surface of the L-shaped fixing plate is fixed with a support plate, and the top surface of the support plate is fixed with a connecting plate. The middle part of the connecting plate is provided with a threaded hole, which forms a precision helical pair with the screw.
6. The auxiliary stage for a forging impact notch projector according to claim 5, wherein: A guide rod is symmetrically fixed on one side of the outer wall of the positioning frame, and a first guide hole is symmetrically provided on the side of the connecting plate. The guide rod passes through the first guide hole and is clearance-fitted with the first guide hole.
7. The auxiliary stage for a forging impact notch projector according to claim 6, wherein: One end of the screw is fixed with a limiting plate, and a T-shaped rotating groove is provided in the middle of one side wall of the positioning frame. The limiting plate is located inside the T-shaped rotating groove, and a rotating plate is fixed to the other end of the screw.
8. An auxiliary platform for a forging impact notch projector according to claim 7, characterized in that: An observation port is provided in the middle of the other side wall of the positioning frame, and a notch is provided in the middle of one side wall of the standard sample, with the notch located on the side of the observation port.