Crystal oscillator electrical performance test fixture system

Abstract

The utility model relates to component test equipment technical field, concretely relates to a crystal oscillator electric performance test fixture system, it includes: PCB board, which is equipped with the connector for installing the measured crystal oscillator, relay, is located on the PCB board, and the switch end is connected the VCC foot of measured crystal oscillator, cable seat group, including GND seat, OE1 seat, VDD seat, V_S seat and OUT_P seat, oscilloscope needle, is located in the PCB board output end, OE1 seat connects the OE foot of measured crystal oscillator, GND seat connects the GND foot of measured crystal oscillator, OUT_P seat connects the OUT foot of measured crystal oscillator, VDD seat is connected the VCC foot of measured crystal oscillator through the switch end of relay, and the coil of relay is connected V_S seat and GND seat respectively, the output end of OUT_P seat is parallel two ways signal passage: first way is connected oscilloscope needle through 0Ω resistance, and second way is connected SMB connector after 10pF electric capacity, 470Ω resistance are connected in series gradually. The utility model realizes the synchronous measurement of frequency and waveform through hardware design and signal passage optimization, thereby balances precision, efficiency and cost.

Description

Technical Field

[0001] This utility model relates to the field of component testing equipment technology, specifically to a crystal oscillator electrical performance testing fixture system. Background Technology

[0002] Crystal oscillators are electronic components that utilize the piezoelectric effect of quartz crystals or other piezoelectric materials to generate high-precision, highly stable frequency signals. They are widely used in various electronic instruments and equipment such as communications, CPU clocks, consumer electronics, navigation systems, and automotive radar. There are many testing methods for crystal oscillators, such as using a frequency counter to measure the output frequency and calculate the error between the output frequency and the nominal value, using a spectrum analyzer to measure the noise power of the carrier signal at the offset frequency, and using an oscilloscope to test the output waveform. Our company mainly uses PCB test boards to test the electrical characteristics of crystal oscillators and uses test sockets with appropriate packages to fix the devices. Custom-made test fixtures from manufacturers are time-consuming and expensive, and the original fixtures cannot simultaneously measure the output frequency and output waveform, requiring manual switching during testing. Therefore, it is necessary to develop a suitable fixture system for testing the electrical characteristics of crystal oscillators. Utility Model Content

[0003] This invention provides a crystal oscillator electrical performance testing fixture system. Through hardware design and signal path optimization, it achieves synchronous measurement of frequency and waveform, thereby balancing accuracy, efficiency and cost. It is especially suitable for the testing needs of small to medium batches of multi-variety crystal oscillators.

[0004] To achieve the above objectives, this utility model provides the following technical solution: a crystal oscillator electrical performance testing fixture system, comprising: a PCB board with a connector for mounting the crystal oscillator under test; a relay on the PCB board, the switch of which is connected to the VCC pin of the crystal oscillator under test; a cable socket assembly including a GND socket, an OE1 socket, a VDD socket, a V_S socket, and an OUT_P socket; and an oscilloscope connector on the output end of the PCB board; the OE1 socket is connected to the OE pin of the crystal oscillator under test, the GND socket is connected to the GND pin of the crystal oscillator under test, and the OUT_P socket is connected to the OUT pin of the crystal oscillator under test; the VDD socket is connected to the VCC pin of the crystal oscillator under test through the switch of the relay, and the two ends of the relay coil are connected to the V_S socket and the GND socket respectively; the output end of the OUT_P socket is connected in parallel to two signal paths: the first path is connected to the oscilloscope connector via a 0Ω resistor, and the second path is connected to the SMB connector in series with a 10pF capacitor and a 470Ω resistor.

[0005] Preferably, the PCB board is further provided with: an adjustable spring clip mechanism for adapting to crystal oscillator packages of different thicknesses; and load capacitor adjustment holes with at least two pairs of soldering holes for inserting through-hole load capacitors.

[0006] Preferably, the relay is a fast-response relay with a contact action time of ≤1ms.

[0007] Preferably, the connector is a replaceable test socket, compatible with 4-pin and 8-pin 5032 packaged crystal oscillators under test and those with voltage control function.

[0008] Preferably, the PCB board has a stacked structure comprising at least two ground planes and a shielding layer between adjacent signal layers.

[0009] Preferably, the output terminal of the SMB connector is connected to a frequency counter, and the output terminal of the oscilloscope connector is connected to an oscilloscope, so as to realize synchronous measurement of frequency and waveform.

[0010] Preferably, the V_S socket provides a 5-12V DC voltage for controlling the rapid switching on and off of the relay.

[0011] The beneficial effects of this utility model are as follows: This crystal oscillator electrical performance testing fixture system achieves synchronous measurement of frequency and waveform through hardware design and signal path optimization. The relay controls the power supply on / off; the fast-response relay controls the coil's on / off state via the 5-12V voltage input to the V_S socket, thereby switching the power supply to the VCC pin of the crystal oscillator under test. This design avoids manual power supply plugging and unplugging, achieving rapid control of test start and stop, and reducing human interference. The crystal oscillator output signal, i.e., the OUT pin, is output to the frequency meter through an SMB connector. A 10pF capacitor in the path blocks the DC component, and a 470Ω resistor achieves impedance matching, enabling parallel measurement of dual signal paths and ensuring the integrity of the high-frequency signal. The output signal is directly connected to the oscilloscope pins via a 0Ω resistor, providing a low-impedance path and preserving the original waveform characteristics for oscilloscope analysis. The two-way parallel design eliminates switching delay, achieving real-time synchronous testing of frequency and waveform. The replaceable test socket can adapt to various pin configurations of the 5032 package, expanding the testing range by changing the connector. Elastic pressure is used to adapt to different package thicknesses, ensuring contact stability. Pre-drilled soldering holes allow for the connection of external through-hole capacitors to simulate actual circuit load conditions and verify crystal oscillator frequency stability. The multi-layer board structure incorporates a ground plane and shielding layer, reducing crosstalk between signal layers and ensuring high-frequency signal measurement accuracy. Automatic relay power switching and dual-path parallel measurement eliminate manual operation steps, improving testing efficiency by over 50%. Fast relays reduce the impact of power supply transients, and the capacitor / resistor network optimizes signal transmission, keeping frequency measurement errors within ±1ppm. Grounding and shielding designs suppress noise power to below -150dBc / Hz, meeting the requirements of high-frequency applications such as automotive radar. A universal PCB board and replaceable test sockets replace custom fixtures, reducing costs by 60%-80%; load capacitor holes and spring clips support rapid adaptation to new device models, shortening development cycles. Pre-drilled SMB connectors and pins allow connection to equipment such as phase noise analyzers, supporting future functional upgrades. This system balances accuracy, efficiency, and cost through modular design, making it particularly suitable for testing small to medium batches of diverse crystal oscillators. Attached Figure Description

[0012] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0013] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0014] Figure 2 This is a partial structural cross-sectional view of the present invention.

[0015] In the diagram: 1. PCB board; 2. Connector; 3. Relay; 4. GND connector; 5. OE1 connector; 6. VDD connector; 7. V_S connector; 8. OUT_P connector; 9. Oscilloscope pin; 10. 0Ω resistor; 11. 10pF capacitor; 12. 470Ω resistor; 13. SMB connector; 14. Adjustable spring snap mechanism; 15. Load capacitor adjustment hole. Detailed Implementation

[0016] The technical solution of this utility model will now be clearly and completely described with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this utility model.

[0017] according to Figure 1 , Figure 2 As shown, a crystal oscillator electrical performance testing fixture system includes: a PCB board 1 with a connector 2 for mounting the crystal oscillator under test; a relay 3 on the PCB board, the switching terminal of which is connected to the VCC pin of the crystal oscillator under test; a cable header assembly including a GND header 4, an OE1 header 5, a VDD header 6, a V_S header 7, and an OUT_P header 8; and an oscilloscope pin 9 on the output end of the PCB board. The OE1 header 5 is connected to the OE pin of the crystal oscillator under test, the GND header 4 is connected to the GND pin of the crystal oscillator under test, and the OUT_P header 8 is connected to the OUT pin of the crystal oscillator under test. The VDD header 6 is connected to the VCC pin of the crystal oscillator under test through the switching terminal of the relay 3, and the two ends of the relay coil are connected to the V_S header 7 and the GND header 4, respectively. The output terminal of the OUT_P header 8 is connected in parallel to two signal paths: the first path is connected to the oscilloscope pin 9 via a 0Ω resistor 10, and the second path is connected to the SMB connector 13 after being connected in series with a 10pF capacitor 11 and a 470Ω resistor 12. The PCB board 1 is also provided with: an adjustable spring snap-fit ​​mechanism 14, which is used to adapt to the test crystal oscillator package of different thicknesses; and a load capacitor adjustment hole 15, which reserves at least two pairs of solder holes for inserting a through-hole load capacitor.

[0018] The relay 3 is a fast-response relay with a contact action time of ≤1ms. The connector 2 is a replaceable test socket, compatible with 4-pin and 8-pin 5032-packaged crystal oscillators under test and those with voltage-controlled operation. The PCB board 1 has a multilayer structure including at least two ground planes, with shielding layers between adjacent signal layers. The output of the SMB connector 13 is connected to a frequency counter, and the output of the oscilloscope connector 9 is connected to an oscilloscope, enabling synchronous measurement of frequency and waveform. The V_S socket 7 provides a 5-12V DC voltage to control the rapid switching of the relay 3.

[0019] This crystal oscillator electrical performance testing fixture system achieves synchronous measurement of frequency and waveform through hardware design and signal path optimization. Specifically, a relay controls the power supply switching; the fast-response relay controls the coil's on / off state via a 5-12V voltage input to V_S connector 7, thereby switching the power supply to the VCC pin of the crystal oscillator under test. This design avoids manual power supply plugging and unplugging, enabling rapid control of test start and stop, and reducing human interference.

[0020] The crystal oscillator output signal, i.e., the OUT pin, is output to the frequency meter via SMB connector 13. A 10pF capacitor 11 in the path blocks the DC component, and a 470Ω resistor 12 achieves impedance matching, enabling parallel measurement via dual signal paths and ensuring high-frequency signal integrity. The output signal is directly connected to oscilloscope pin 9 via a 0Ω resistor 10, providing a low-impedance path and preserving the original waveform characteristics for oscilloscope analysis. The parallel dual-path design eliminates switching delay, enabling real-time synchronous testing of frequency and waveform.

[0021] The replaceable test socket is compatible with various pin configurations of the 5032 package, and the testing range can be expanded by changing connector 2. It also adapts to different package thicknesses through elastic pressure, ensuring contact stability. Reserved solder holes allow for the connection of external through-hole capacitors to simulate actual circuit load conditions and verify crystal oscillator frequency stability. The multilayer board structure incorporates a ground plane and shielding layer to reduce crosstalk between signal layers and ensure the accuracy of high-frequency signal measurements.

[0022] Automatic relay power switching and dual-channel parallel measurement eliminate manual operation steps, improving testing efficiency by over 50%. Fast relays reduce the impact of power supply transients, and optimized capacitor / resistor networks control signal transmission, keeping frequency measurement errors within ±1ppm. Grounding and shielding designs suppress noise power to below -150dBc / Hz, meeting the requirements of high-frequency applications such as automotive radar. A universal PCB board and replaceable test sockets replace custom fixtures, reducing costs by 60%-80%; load capacitor holes and spring clips support rapid adaptation to new device models, shortening development cycles. Reserved SMB connectors and pins allow connection to phase noise analyzers and other equipment, supporting future functional upgrades. This system balances accuracy, efficiency, and cost through modular design, making it particularly suitable for testing small to medium batches of diverse crystal oscillators.

[0023] The above description is merely a specific embodiment of this utility model, but the protection scope of this utility model is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this utility model should be included within the protection scope of this utility model. Therefore, the protection scope of this utility model should be determined by the scope of the claims.

Claims

1. A crystal oscillator electrical performance testing fixture system, characterized in that, include: PCB board (1), on which a connector (2) for mounting the crystal oscillator under test is provided; The relay (3) is located on the PCB board, and its switching terminal is connected to the VCC pin of the crystal oscillator under test. The cable socket assembly includes GND socket (4), OE1 socket (5), VDD socket (6), V_S socket (7) and OUT_P socket (8); Oscilloscope pin (9) is located at the output end of the PCB board; The OE1 connector (5) is connected to the OE pin of the crystal oscillator under test, the GND connector (4) is connected to the GND pin of the crystal oscillator under test, and the OUT_P connector (8) is connected to the OUT pin of the crystal oscillator under test. The VDD socket (6) is connected to the VCC pin of the crystal oscillator under test through the switching terminal of the relay (3), and the two ends of the relay coil are connected to the V_S socket (7) and the GND socket (4) respectively. The output terminal of the OUT_P socket (8) is connected to two signal paths in parallel: the first path is connected to the oscilloscope pin (9) via a 0Ω resistor (10), and the second path is connected to the SMB connector (13) in series with a 10pF capacitor (11) and a 470Ω resistor (12).

2. The crystal oscillator electrical performance testing fixture system according to claim 1, characterized in that: The PCB board (1) is also provided with: An adjustable spring snap-fit ​​mechanism (14) is used to adapt to the test crystal oscillator package of different thicknesses; The load capacitor adjustment hole (15) has at least two pairs of welding holes reserved for plugging in a direct-plug load capacitor.

3. The crystal oscillator electrical performance testing fixture system according to claim 1, characterized in that: The relay (3) is a fast-response relay with a contact action time of ≤1ms.

4. The crystal oscillator electrical performance testing fixture system according to claim 1, characterized in that: The connector (2) is a replaceable test socket, compatible with 4-pin and 8-pin 5032 packaged crystal oscillators and crystal oscillators with voltage control function.

5. The crystal oscillator electrical performance testing fixture system according to claim 1, characterized in that: The PCB board (1) has a stacked structure containing at least two ground planes and a shielding layer between adjacent signal layers.

6. The crystal oscillator electrical performance testing fixture system according to claim 1, characterized in that: The output of the SMB connector (13) is connected to a frequency counter, and the output of the oscilloscope connector (9) is connected to an oscilloscope, so as to realize synchronous measurement of frequency and waveform.

7. The crystal oscillator electrical performance testing fixture system according to claim 1, characterized in that: The V_S socket (7) provides a 5-12V DC voltage for controlling the rapid switching on and off of the relay (3).

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