An automobile chip testing device

Abstract

The utility model relates to the technical field of automobile chip testing, specifically relates to a kind of automobile chip testing device, including detection platform main body, the top of detection platform main body is equipped with connecting cover, the top of detection platform main body and located inside the fixed connection of connecting cover has connecting seat, the top of connecting seat is fixedly connected with placing table, the bottom end of placing table inside is equipped with jacking assembly, both ends in placing table inside are equipped with limiting component, compared with existing testing device, support table displacement, chip is displaced from the inside of placing table, it is convenient to take chip, support table rotates, so that the chip placed on the top of support table can rotate, it is convenient to observe the surface of chip, and when testing chip, the both ends of chip are limited by two sets of limiting components, prevent chip from deviating, affect the accuracy of chip testing, the flexible clamping of limiting component can prevent damage to the surface of chip.

Description

Technical Field

[0001] This utility model relates to the field of automotive chip testing technology, and specifically to an automotive chip testing device. Background Technology

[0002] Testing of chips for new energy vehicles requires testing equipment, the main body of which is generally a test socket. The chip test socket usually consists of a metal chassis and one or more pins. These pins are responsible for connecting to the pins of the integrated circuit chip to achieve electrical connection between the chip and the test equipment. Rigid base: generally made of high-strength materials, such as engineering plastics or metals, used to fix the chip and provide structural support. Contact terminals: responsible for contacting the chip and transmitting signals to the test equipment. These terminals are usually made of gold-plated or other highly conductive materials to ensure low-resistance connection and reduce signal loss. Flexible device: some high-grade test sockets are equipped with flexible devices, such as springs or pins, to better adapt to changes in the chip's contact surface during testing and improve contact reliability.

[0003] In existing technologies, the test socket has a relatively deep test slot into which the chip is directly loaded for testing. This ensures good isolation of the chip from the outside environment during testing. The chip is then elastically compacted to ensure good contact between the chip and the test points of the test socket. However, after the chip test is completed, it is not easy to remove the chip from the test slot, and unloading the chip from the test slot is quite troublesome. Therefore, it is particularly important to improve the existing test device and design a new type of automotive chip test device to solve the above-mentioned technical defects and improve the practicality of the overall test device. Utility Model Content

[0004] The purpose of this invention is to provide an automotive chip testing device. A support platform is displaced to the top of a placement platform, allowing the chip to be moved out of the placement platform for easy retrieval. Simultaneously, the support platform rotates, enabling the chip placed on top to rotate and allowing for observation of its surface. During chip testing, two sets of limiting components restrict the chip's ends to prevent displacement and ensure accurate testing. The flexible clamping of the limiting components prevents damage to the chip's surface, thus addressing the problems mentioned in the background art.

[0005] To achieve the above objectives, this utility model provides the following technical solution:

[0006] An automotive chip testing device includes a testing platform body, a connecting cover on the top of the testing platform body, a connecting seat fixedly connected to the top of the testing platform body and inside the connecting cover, a placement platform fixedly connected to the top of the connecting seat, a lifting component at the bottom of the placement platform, limiting components at both ends of the placement platform, a test plate slidably connected to the top of the connecting seat and above the placement platform, and a testing camera inside the connecting cover.

[0007] The lifting assembly is used to guide the chip. The lifting assembly consists of a movable base, a first rotating rod, a support platform, a drive gear, a second rotating rod, and a rotating disk. The movable base is slidably connected to the inside of the detection platform body and located below the placement platform. The first rotating rod is rotatably connected to the top of the movable base. The support platform is fixedly connected to the top of the first rotating rod. The drive gear is rotatably connected to the inside of the movable base. The second rotating rod is rotatably connected to the bottom of the movable base. The rotating disk is rotatably connected to the inside of the detection platform body and located at the bottom of the second rotating rod.

[0008] The limiting component is used to limit the chip on both sides.

[0009] In a preferred embodiment of this utility model, the support platform and the placement platform are slidably connected, the first rotating rod is fixedly connected to the drive gear, and a drive rack is meshed with the outer side of the drive gear.

[0010] As a preferred embodiment of this utility model, a guide groove is provided on the outer side of the movable seat and on the outer side of the drive gear, the drive rack is slidably connected to the guide groove, and an electric telescopic rod is fixedly connected to the outer side of the drive rack.

[0011] In a preferred embodiment of this utility model, the second rotating rod is rotatably connected to the rotating disk, and the driving end of the first drive motor is fixedly connected to the center of the rotating disk.

[0012] As a preferred embodiment of this utility model, the limiting component consists of a moving frame, a limiting block, two sets of third rotating rods, two sets of sliding blocks, and two sets of damping springs. The moving frame is slidably connected to the inside of the placement platform, the limiting block is slidably connected to the outside of the moving frame, both sets of the third rotating rods are rotatably connected to the end of the limiting block extending into the moving frame, the sliding block is rotatably connected to the end of the third rotating rod away from the limiting block, and the damping spring is fixedly connected to the outside of the sliding block.

[0013] As a preferred embodiment of this utility model, a fixed frame is fixedly connected to the bottom of the placement platform and to the bottom of the two sets of movable frames. The movable frames and the fixed frame are slidably connected. A positive and negative lead screw is rotatably connected inside the fixed frame. The movable frames move axially on the outside of the positive and negative lead screws through ball bearings. The front end of the positive and negative lead screws is fixedly connected to the drive end of a second drive motor.

[0014] In a preferred embodiment of this utility model, the two sets of sliding blocks are connected by a connecting plate, the connecting plate is fixedly connected to the bottom of the moving frame, the sliding block and the connecting plate are slidably connected, the damping spring and the connecting plate are fixedly connected, and elastic balls are fixedly connected to both ends of the connecting plate. The sliding block is connected to the elastic ball through a fixed rod.

[0015] Compared with the prior art, the beneficial effects of this utility model are:

[0016] 1. In this utility model, through the design of the lifting component, the first drive motor is started, which drives the rotating disk to rotate, so that the second rotating rod can be displaced, which drives the moving seat to be displaced, thereby causing the first rotating rod to be displaced, which in turn drives the support platform to be displaced, moving the support platform to the top of the placement platform, thereby moving the chip out from the inside of the placement platform for easy removal of the chip. The electric telescopic rod is started, which drives the drive rack to be displaced, so that the drive gear can be rotated, which drives the first rotating rod to rotate, which drives the support platform to rotate, so that the chip placed on the top of the support platform can be rotated, making it convenient to observe the surface of the chip.

[0017] 2. In this utility model, through the design of the limiting components, when testing the chip, the two ends of the chip are limited by two sets of limiting components to prevent the chip from shifting and affecting the accuracy of the chip test. The flexible clamping of the limiting components can prevent damage to the surface of the chip. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0019] Figure 2 This is a schematic diagram of the main structure of the testing platform of this utility model;

[0020] Figure 3 This is a schematic diagram of the lifting component structure of this utility model;

[0021] Figure 4 This is a schematic diagram of the movable base structure of this utility model;

[0022] Figure 5 This is a schematic diagram of the limiting component structure of this utility model.

[0023] In the diagram: 1. Main body of the testing platform; 2. Connecting cover; 3. Connecting seat; 4. Placement platform; 5. Lifting assembly; 6. Limiting assembly; 7. Test plate; 8. Moving seat; 9. First rotating rod; 10. Support platform; 11. Drive gear; 12. Second rotating rod; 13. Rotating disk; 14. Drive rack; 15. Guide groove; 16. Moving frame; 17. Limiting block; 18. Third rotating rod; 19. Sliding block; 20. Damping spring; 21. Fixing frame; 22. Positive and negative lead screws; 23. Connecting plate; 24. Elastic ball. Detailed Implementation

[0024] The technical solutions of the present utility model will be clearly and completely described below with reference to the embodiments of the present utility model. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of the present utility model without creative effort are within the protection scope of the present utility model.

[0025] Example:

[0026] Please see Figures 1-5 This utility model provides a technical solution:

[0027] An automotive chip testing device includes a testing platform body 1, a connecting cover 2 on the top of the testing platform body 1, a connecting seat 3 fixedly connected to the top of the testing platform body 1 and inside the connecting cover 2, a placement platform 4 fixedly connected to the top of the connecting seat 3, a lifting component 5 at the bottom of the placement platform 4, limiting components 6 at both ends of the placement platform 4, a test plate 7 slidably connected to the top of the connecting seat 3 and above the placement platform 4, and a testing camera inside the connecting cover 2.

[0028] The lifting assembly 5 is used to guide the chip. The lifting assembly 5 consists of a movable seat 8, a first rotating rod 9, a support platform 10, a drive gear 11, a second rotating rod 12, and a rotating disk 13. The movable seat 8 is slidably connected to the inside of the detection platform body 1 and is located below the placement platform 4. The first rotating rod 9 is rotatably connected to the top of the movable seat 8. The support platform 10 is fixedly connected to the top of the first rotating rod 9. The drive gear 11 is rotatably connected to the inside of the movable seat 8. The second rotating rod 12 is rotatably connected to the bottom of the movable seat 8. The rotating disk 13 is rotatably connected to the inside of the detection platform body 1 and is located at the bottom of the second rotating rod 12.

[0029] The limiting component 6 is used to limit the chip on both sides.

[0030] Furthermore, the support platform 10 and the placement platform 4 are slidably connected, the first rotating rod 9 is fixedly connected to the drive gear 11, and the drive rack 14 is meshed with the outer side of the drive gear 11. A guide groove 15 is provided on the outer side of the movable seat 8 and located on the outer side of the drive gear 11. The drive rack 14 and the guide groove 15 are slidably connected. An electric telescopic rod is fixedly connected to the outer side of the drive rack 14. When the electric telescopic rod is activated, the drive rack 14 is moved, so that the drive gear 11 can rotate, which in turn drives the first rotating rod 9 to rotate. When the movable seat 8 is moved, the guide groove 15 can prevent the drive rack 14 from affecting the displacement of the movable seat 8.

[0031] Secondly, the second rotating rod 12 is rotatably connected to the rotating disk 13. The driving end of the first drive motor is fixedly connected to the center of the rotating disk 13. When the first drive motor is started, the rotating disk 13 is rotated, which allows the second rotating rod 12 to move, thereby moving the movable seat 8, which in turn causes the first rotating rod 9 to move, and thus moves the support platform 10.

[0032] Furthermore, the limiting component 6 consists of a moving frame 16, a limiting block 17, two sets of third rotating rods 18, two sets of sliding blocks 19, and two sets of damping springs 20. The moving frame 16 is slidably connected to the inside of the placement platform 4, and the limiting block 17 is slidably connected to the outside of the moving frame 16. Both sets of third rotating rods 18 are rotatably connected to one end of the limiting block 17 extending into the moving frame 16. The sliding block 19 is rotatably connected to the end of the third rotating rod 18 away from the limiting block 17. The damping springs 20 are fixedly connected to the outside of the sliding block 19. When testing the chip, the two sets of limiting components 6 limit both ends of the chip to prevent the chip from shifting and affecting the accuracy of the chip test. The flexible clamping of the limiting component 6 can prevent damage to the surface of the chip.

[0033] Furthermore, a fixing frame 21 is fixedly connected to the bottom of the placement platform 4 and the bottom of the two sets of moving frames 16. The moving frames 16 and the fixing frame 21 are slidably connected. The fixing frame 21 is rotatably connected to a positive and negative lead screw 22. The moving frames 16 move axially on the outside of the positive and negative lead screw 22 through ball bearings. The front end of the positive and negative lead screw 22 is fixedly connected to the drive end of the second drive motor. When the second drive motor is started, the positive and negative lead screw 22 is rotated, which causes the two sets of moving frames 16 to move and the two sets of limiting blocks 17 to move, so that the limiting blocks 17 can clamp and fix the chip.

[0034] Furthermore, the two sets of sliding blocks 19 are connected by a connecting plate 23, which is fixedly connected to the bottom of the moving frame 16. The sliding blocks 19 and the connecting plate 23 are slidably connected, and the damping spring 20 is fixedly connected to the connecting plate 23. Both ends of the connecting plate 23 are fixedly connected to elastic balls 24. The sliding blocks 19 are connected to the elastic balls 24 through a fixed rod. When the limiting block 17 contacts the chip, it is displaced by a relative force, which drives the third rotating rod 18 to move, causing the sliding blocks 19 to move. At the same time, the fixed rod moves. Through the damping spring 20 and the elastic balls 24, the limiting block 17 can be buffered, so that the limiting block 17 can flexibly clamp the chip.

[0035] In this embodiment, the specific implementation scenario is as follows: In actual use, the chip is placed inside the placement stage 4, the second drive motor is started, driving the forward and reverse lead screws 22 to rotate, causing the two sets of moving frames 16 to move, and causing the two sets of limiting blocks 17 to move, so that the limiting blocks 17 can clamp and fix the chip. When the limiting blocks 17 come into contact with the chip, they are displaced by a relative force, causing the third rotating rod 18 to move, causing the sliding block 19 to move, and at the same time the fixing rod to move. Through the damping spring 20 and the elastic ball 24, the limiting blocks 17 can be buffered, so that the limiting blocks 17 can flexibly clamp the chip. The chip is tested through the test board 7. After the chip test is completed, the first drive motor is started, driving the rotating disk 1 Rotation 3 causes the second rotating rod 12 to shift, which in turn causes the moving seat 8 to shift, thereby causing the first rotating rod 9 to shift, which in turn causes the support platform 10 to shift, moving the support platform 10 to the top of the placement platform 4. This allows the chip to be moved out of the placement platform 4 for easy removal. Activating the electric telescopic rod causes the drive rack 14 to shift, which in turn causes the drive gear 11 to rotate, causing the first rotating rod 9 to rotate, which in turn causes the support platform 10 to rotate, allowing the chip placed on top of the support platform 10 to rotate. The chip surface is monitored by a detection camera to check for damage penetrating the chip surface. Compared with existing testing devices, this invention improves the overall practicality of the testing device through its design.

[0036] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. An automotive chip testing device, comprising a testing platform body (1), characterized in that: The top of the main body (1) of the testing platform is provided with a connecting cover (2). A connecting seat (3) is fixedly connected to the top of the main body (1) and inside the connecting cover (2). A placement platform (4) is fixedly connected to the top of the connecting seat (3). A lifting component (5) is provided at the bottom of the placement platform (4). Limiting components (6) are provided at both ends of the placement platform (4). A test plate (7) is slidably connected to the top of the connecting seat (3) and above the placement platform (4). A testing camera is provided inside the connecting cover (2). The lifting assembly (5) is used to guide the chip. The lifting assembly (5) consists of a movable seat (8), a first rotating rod (9), a support platform (10), a drive gear (11), a second rotating rod (12), and a rotating disk (13). The movable seat (8) is slidably connected to the inside of the detection platform body (1) and located below the placement platform (4). The first rotating rod (9) is rotatably connected to the top of the movable seat (8). The support platform (10) is fixedly connected to the top of the first rotating rod (9). The drive gear (11) is rotatably connected to the inside of the movable seat (8). The second rotating rod (12) is rotatably connected to the bottom of the movable seat (8). The rotating disk (13) is rotatably connected to the inside of the detection platform body (1) and located at the bottom of the second rotating rod (12). The limiting component (6) is used to limit the chip on both sides.

2. The automotive chip testing device according to claim 1, characterized in that: The support platform (10) and the placement platform (4) are slidably connected. The first rotating rod (9) is fixedly connected to the drive gear (11). The drive gear (11) is meshed with a drive rack (14) on its outer side.

3. The automotive chip testing device according to claim 2, characterized in that: A guide groove (15) is provided on the outside of the movable seat (8) and on the outside of the drive gear (11). The drive rack (14) is slidably connected to the guide groove (15). An electric telescopic rod is fixedly connected to the outside of the drive rack (14).

4. The automotive chip testing device according to claim 1, characterized in that: The second rotating rod (12) is rotatably connected to the rotating disk (13), and the driving end of the first driving motor is fixedly connected to the center of the rotating disk (13).

5. The automotive chip testing device according to claim 1, characterized in that: The limiting component (6) consists of a moving frame (16), a limiting block (17), two sets of third rotating rods (18), two sets of sliding blocks (19), and two sets of damping springs (20). The moving frame (16) is slidably connected to the inside of the placement platform (4), and the limiting block (17) is slidably connected to the outside of the moving frame (16). Both sets of third rotating rods (18) are rotatably connected to one end of the limiting block (17) extending into the moving frame (16). The sliding block (19) is rotatably connected to one end of the third rotating rod (18) away from the limiting block (17). The damping springs (20) are fixedly connected to the outside of the sliding block (19).

6. The automotive chip testing device according to claim 5, characterized in that: A fixed frame (21) is fixedly connected to the bottom of the placement platform (4) and the bottom of the two sets of moving frames (16). The moving frames (16) and the fixed frame (21) are slidably connected. A positive and negative lead screw (22) is rotatably connected inside the fixed frame (21). The moving frame (16) moves axially on the outside of the positive and negative lead screw (22) through ball bearings. The front end of the positive and negative lead screw (22) is fixedly connected to the drive end of the second drive motor.

7. The automotive chip testing device according to claim 6, characterized in that: The two sets of sliding blocks (19) are connected by a connecting plate (23). The connecting plate (23) is fixedly connected to the bottom of the moving frame (16). The sliding block (19) and the connecting plate (23) are slidably connected. The damping spring (20) and the connecting plate (23) are fixedly connected. Both ends of the connecting plate (23) are fixedly connected to elastic balls (24). The sliding block (19) is connected to the elastic ball (24) through a fixed rod.

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