An automatic cleaning device for integrated circuit test probes
By designing an automatic cleaning device for integrated circuit test probes, which combines gear-driven brush scrubbing and cleaning fluid rinsing with hot air drying, the problem of difficult removal of contaminants from the probe surface is solved, achieving efficient and precise cleaning results and improving testing accuracy and cleaning efficiency.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SUZHOU ASEN SEMICON CO LTD
- Filing Date
- 2025-08-13
- Publication Date
- 2026-08-04
AI Technical Summary
In the prior art, integrated circuit test probes are easily contaminated with solder residue, oxide layer and dust during use, resulting in poor test signal transmission. In addition, manual cleaning is inefficient and easily damages the probes, making it difficult to achieve the synergy of wiping and precision cleaning.
An automatic cleaning device for integrated circuit test probes was designed, comprising a scrubbing unit and a cleaning unit. The device uses gear transmission to drive a brush for scrubbing and a micro cleaning fluid pump and precision spray nozzles for all-round rinsing with cleaning fluid. Combined with a hot air drying component, it achieves an efficient and precise cleaning process.
It achieves efficient scrubbing and precise cleaning of probes, improves testing accuracy, avoids probe damage, ensures thorough cleaning and rapid drying, and is suitable for high-frequency precision cleaning needs.
Smart Images
Figure CN224586467U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of probe cleaning technology, specifically to an automatic cleaning device for integrated circuit test probes. Background Technology
[0002] This device is suitable for the routine cleaning and maintenance of test probes on integrated circuit production lines. During integrated circuit testing, probes frequently come into contact with chip pins, easily accumulating solder residue, oxide layers, and dust, leading to poor test signal transmission and increased data errors. Traditional cleaning methods often involve manual wiping with alcohol swabs, which is inefficient and prone to damaging the probes due to uneven pressure, and cannot reach deep into crevices for cleaning. Furthermore, manual cleaning struggles to achieve a synergistic effect of wiping and precision cleaning, resulting in incomplete cleaning. Therefore, there is an urgent need for a cleaning device that can automatically perform wiping and rinsing with a special cleaning solution, and is adapted to the fine structure of the probes to solve these problems. Utility Model Content
[0003] The purpose of this invention is to address the shortcomings of existing technologies by proposing an automatic cleaning device for integrated circuit test probes.
[0004] To achieve the above objectives, the present invention adopts the following technical solution: an automatic cleaning device for integrated circuit test probes, comprising a support frame, a wiping unit disposed on the lower side of the support frame, the wiping unit comprising a pressing pedal, a rack connected to one side of the pressing pedal, a spur gear disposed on one side of the rack, a first bevel gear connected to one side of the spur gear, a second bevel gear disposed on one side of the first bevel gear, a connecting cylinder connected to the middle position of the second bevel gear, a brush disposed on the inner side of the connecting cylinder, a spring connected to the lower side of the pressing pedal, a first connecting shell connected to the lower end of the spring, and a limit connecting rod disposed on the first connecting shell.
[0005] As a further description of the above technical solution:
[0006] A cleaning unit is provided on one side of the scrubbing unit. The cleaning unit includes a micro cleaning liquid pump. A deionized water tank is connected to one side of the micro cleaning liquid pump. A corrosion-resistant liquid outlet pipe is connected to the other side of the micro cleaning liquid pump. One end of the corrosion-resistant liquid outlet pipe is connected to an annular connecting pipe. A precision spray nozzle is provided on the annular connecting pipe. One end of the precision spray nozzle is connected to a second connecting shell.
[0007] As a further description of the above technical solution:
[0008] The rack is slidably connected to the support frame, the pressing pedal is slidably connected to the limiting connecting rod, the upper end of the spring is fixedly connected to the lower side of the pressing pedal, and the spring is located inside the first connecting shell.
[0009] As a further description of the above technical solution:
[0010] The first bevel gear is fixedly connected to one side of the spur gear via a rotating shaft. The first bevel gear and the spur gear are rotatably connected to an extension plate on the lower side of the support frame. The spur gear is meshed with one side of the rack.
[0011] As a further description of the above technical solution:
[0012] The second bevel gear meshes with the first bevel gear, the upper end of the connecting cylinder is rotatably connected to the support frame, the lower side of the connecting cylinder is attached to the upper side of the second connecting shell, and several sets of brushes are evenly distributed on the inner side of the connecting cylinder.
[0013] As a further description of the above technical solution:
[0014] The pressing pedal is slidably connected to a groove provided on the first connecting shell, the pressing pedal is fixedly disposed on the lower side of the rack, and the micro cleaning fluid pump is fixedly disposed on the support frame.
[0015] As a further description of the above technical solution:
[0016] The annular connecting pipe is fixedly mounted on the support frame, and the precision spray nozzle is installed through the second connecting shell.
[0017] This utility model has the following beneficial effects:
[0018] 1. The cleaning unit achieves efficient probe cleaning: pressing the pedal drives the rack and pinion system, which in turn drives the spur gear and bevel gear transmission to rotate the connecting cylinder. Multiple sets of nylon brushes on the inner side of the cylinder perform multi-segment circumferential cleaning of the probe, reaching deep into crevices to remove dirt. A spring pushes the pedal back to its original position, and a limiting connecting rod ensures stable movement. 45# steel transmission components guarantee strength. This design can quickly remove oxide layers and contaminants from the probe surface, improving testing accuracy.
[0019] 2. Precision cleaning and rapid drying of the probe are achieved through a cleaning unit and drying assembly: A miniature cleaning fluid pump draws deionized water from the deionized water tank, which is then discharged through a corrosion-resistant outlet pipe and a ring-shaped distribution pipe, and the probe is thoroughly rinsed by a precision spray nozzle to avoid residual ions from ordinary water; the hot air drying assembly sprays hot air through drying nozzles to quickly remove residual moisture from the probe surface and prevent oxidation; when the probe is pulled up, it is scrubbed again by a brush, forming a closed-loop cleaning process from scrubbing to rinsing to drying to scrubbing again. The corrosion-resistant piping and specialized cleaning fluid are compatible with the probe material, making it suitable for high-frequency precision cleaning needs. Attached Figure Description
[0020] Figure 1A three-dimensional structural diagram of an automatic cleaning device for integrated circuit test probes proposed in this utility model. Figure 1 ;
[0021] Figure 2 A three-dimensional structural diagram of an automatic cleaning device for integrated circuit test probes proposed in this utility model. Figure 2 ;
[0022] Figure 3 This is a partial structural schematic diagram of an automatic cleaning device for integrated circuit test probes proposed in this utility model;
[0023] Figure 4 This is a partial exploded view of an automatic cleaning device for integrated circuit test probes proposed in this utility model.
[0024] Legend:
[0025] 1. Support frame; 2. Scrubbing unit; 21. Pressing pedal; 22. Rack; 23. Circular gear; 24. First bevel gear; 25. Second bevel gear; 26. Connecting cylinder; 27. Brush; 28. Spring; 29. Limiting connecting rod; 210. First connecting shell; 3. Cleaning unit; 31. Miniature cleaning fluid pump; 32. Deionized water tank; 33. Corrosion-resistant liquid outlet pipe; 34. Annular connecting pipe; 35. Precision spray nozzle; 36. Second connecting shell. Detailed Implementation
[0026] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0027] In the description of this utility model, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the accompanying drawings and are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance. The utility model will be further described in detail below with reference to the accompanying drawings.
[0028] In this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.
[0029] Example 1:
[0030] like Figures 1 to 4 As shown, this embodiment provides an automatic cleaning device for integrated circuit test probes, including a support frame 1. A wiping unit 2 is provided on the lower side of the support frame 1. The wiping unit 2 includes a pressing pedal 21. A rack 22 is connected to one side of the pressing pedal 21. A spur gear 23 is provided on one side of the rack 22. A first bevel gear 24 is connected to one side of the spur gear 23. A second bevel gear 25 is provided on one side of the first bevel gear 24. A connecting cylinder 26 is connected to the middle position of the second bevel gear 25. A brush 27 is provided on the inner side of the connecting cylinder 26. A spring 28 is connected to the lower side of the pressing pedal 21. A first connecting shell 210 is connected to the lower end of the spring 28. A limit connecting rod 29 is provided on the first connecting shell 210.
[0031] In this embodiment, the support frame 1, the wiping unit 2, and the cleaning unit 3 constitute an automatic cleaning device for integrated circuit test probes according to this application.
[0032] Specifically, a cleaning unit 3 is provided on one side of the scrubbing unit 2. The cleaning unit 3 includes a micro cleaning liquid pump 31. One side of the micro cleaning liquid pump 31 is connected to a deionized water tank 32. The other side of the micro cleaning liquid pump 31 is connected to a corrosion-resistant outlet pipe 33. One end of the corrosion-resistant outlet pipe 33 is connected to an annular connecting pipe 34. A precision spray nozzle 35 is provided on the annular connecting pipe 34. One end of the precision spray nozzle 35 is connected to a second connecting shell 36.
[0033] In this embodiment, the support frame 1, pressing pedal 21, rack 22, spur gear 23, first bevel gear 24, and second bevel gear 25 are made of 45# steel; the connecting cylinder 26 is made of ABS plastic; the brush 27 has nylon bristles with a rubber fixing seat at the base; the spring 28 is made of 65Mn steel; the first connecting shell 210 is made of PVC plastic; and the limiting connecting rod 29 is made of 45# steel.
[0034] Specifically, the rack 22 is slidably connected to the support frame 1, the pressing pedal 21 is slidably connected to the limiting connecting rod 29, the upper end of the spring 28 is fixedly connected to the lower side of the pressing pedal 21, and the spring 28 is disposed inside the first connecting shell 210.
[0035] In a preferred embodiment, the housing of the miniature cleaning fluid pump 31 is made of aluminum alloy; the deionized water tank 32 is made of PP plastic; the corrosion-resistant outlet pipe 33 is made of PVC hose; the annular connecting pipe 34 and the precision spray nozzle 35 are made of 304 stainless steel; and the second connecting shell 36 is made of ABS plastic.
[0036] Example 2:
[0037] Specifically, the first bevel gear 24 is fixedly connected to one side of the spur gear 23 via a rotating shaft. The first bevel gear 24 and the spur gear 23 are rotatably connected to an extension plate on the lower side of the support frame 1. The spur gear 23 is meshed with one side of the rack 22.
[0038] In this embodiment, the rotating shaft rigidly connects the spur gear 23 and the first bevel gear 24 to ensure that they rotate synchronously; the 40Cr steel rotating shaft, in conjunction with the bearing, reduces transmission friction, and the chrome-plated surface improves wear resistance; the extension plate provides stable support for the transmission components, ensuring that the first bevel gear 24 and the second bevel gear 25 mesh precisely.
[0039] Specifically, the second bevel gear 25 is meshed with the first bevel gear 24, the upper end of the connecting cylinder 26 is rotatably connected to the support frame 1, the lower side of the connecting cylinder 26 is attached to the upper side of the second connecting shell 36, and several sets of brushes 27 are evenly distributed on the inner side of the connecting cylinder 26.
[0040] With this configuration, the inner wall of the connecting cylinder 26 is made of smooth ABS plastic, and a nitrile rubber sealing ring is provided in the groove; the bristles of the brush 27 are made of nylon filaments with a diameter of 0.1mm.
[0041] Example 3:
[0042] Specifically, the pressing pedal 21 is slidably connected to a groove provided on the first connecting shell 210, the pressing pedal 21 is fixedly disposed on the lower side of the rack 22, and the micro cleaning fluid pump 31 is fixedly disposed on the support frame 1.
[0043] When the connecting cylinder 26 rotates, the brush 27 performs multi-segment, multi-angle scrubbing on the probe, and the nylon bristles can penetrate deep into the fine gaps of the probe; the rubber fixing seat and sealing ring ensure that the brush is firmly installed and prevent it from falling off during high-speed rotation; the 1-2mm gap prevents the connecting cylinder from rubbing against the second connecting shell to prevent abnormal noise or wear.
[0044] Specifically, the annular connecting pipe 34 is fixedly mounted on the support frame 1, and the precision spray nozzle 35 is disposed through the second connecting shell 36.
[0045] In this embodiment, pressing the pedal 21 causes the rack 22 to slide down, driving the spur gear 23 to rotate. Through the bevel gear transmission, the connecting cylinder 26 rotates, and the brush 27 performs circumferential cleaning on the inserted probe. The spring 28 pushes the pedal to reset after pressing, and the limiting connecting rod 29 restricts the pedal offset. The 45 steel component ensures the transmission strength, the nylon brush can effectively remove dirt from the probe surface, and the rubber fixing seat prevents the brush bristles from falling off.
[0046] It should be noted that a hot air drying assembly (not shown) is provided on one side of the second connecting shell 36. The hot air drying assembly includes a hot air generator (not shown) and a drying nozzle (not shown). The drying nozzle is obliquely disposed on the inner side of the second connecting shell 36.
[0047] Specifically, during automatic cleaning, a device (not shown, but could be a robotic arm or a cylinder) that moves the probe downwards can move 22 downwards, while the downward-moving device moves the probe to the inside of 26, thus achieving automatic cleaning.
[0048] It should be noted that the precision spray nozzle, through its structural design, transforms high-pressure fluids (such as deionized water and specialized cleaning agents) into a precise and uniform spray effect, enabling targeted cleaning of tiny parts while avoiding damage caused by excessive impact.
[0049] In use, firstly, by inserting the probe into the inside of the connecting cylinder 26, the operator presses the pressing pedal 21 with their foot, causing the pressing pedal 21 to slide downward on the limiting connecting rod 29. At the same time, the rack 22 moves downward, causing the spur gear 23 and the first bevel gear 24 to rotate, and the second bevel gear 25 to rotate. Simultaneously, the connecting cylinder 26 rotates, and the probe is cleaned by the brush 27 to remove dirt. The probe passes through the second connecting shell 36 and falls into the collection groove (not shown) provided on the lower side of the second connecting shell 36. By continuing to insert the probe downward, the micro cleaning fluid pump 31 is activated to draw deionized water from the deionized water tank 32. Through the corrosion-resistant outlet pipe 33 and the annular connecting pipe 34, the deionized water is sprayed through the precision spray nozzle 35, rinsing the probe inside the second connecting shell 36 with deionized water. After rinsing, the probe can be pulled up and dried by the hot air drying assembly, and then cleaned by the brush 27.
[0050] It should be noted that all electrical components mentioned in this article are connected to an external main controller and 220V AC mains power. The main controller can be a conventional known device that can be controlled by a computer or other means. The detailed description of known functions and known components is omitted in the specific embodiments disclosed herein. In order to ensure the compatibility of the device, the operating methods used are consistent with the parameters of commercially available instruments.
[0051] Finally, it should be noted that the above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Although the present utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.
Claims
1. An integrated circuit test probe automatic cleaning apparatus characterized by: The device includes a support frame (1), a scrubbing unit (2) on the lower side of the support frame (1), a pressing pedal (21) on one side of the pressing pedal (21), a rack (22) on one side of the rack (22), a spur gear (23) on one side of the rack (22), a first bevel gear (24) on one side of the spur gear (23), a second bevel gear (25) on one side of the first bevel gear (24), a connecting cylinder (26) on the middle position of the second bevel gear (25), a brush (27) on the inner side of the connecting cylinder (26), a spring (28) on the lower side of the pressing pedal (21), a first connecting shell (210) on the lower end of the spring (28), and a limit connecting rod (29) on the first connecting shell (210).
2. An integrated circuit test probe automatic cleaning apparatus according to claim 1, wherein: A cleaning unit (3) is provided on one side of the scrubbing unit (2). The cleaning unit (3) includes a micro cleaning liquid pump (31). A deionized water tank (32) is connected to one side of the micro cleaning liquid pump (31). A corrosion-resistant liquid outlet pipe (33) is connected to the other side of the micro cleaning liquid pump (31). An annular connecting pipe (34) is connected to one end of the corrosion-resistant liquid outlet pipe (33). A precision spray nozzle (35) is provided on the annular connecting pipe (34). A second connecting shell (36) is connected to one end of the precision spray nozzle (35).
3. An integrated circuit test probe automatic cleaning apparatus according to claim 2, wherein: The rack (22) is slidably connected to the support frame (1), the pressing pedal (21) is slidably connected to the limiting connecting rod (29), the upper end of the spring (28) is fixedly connected to the lower side of the pressing pedal (21), and the spring (28) is located inside the first connecting shell (210).
4. An integrated circuit test probe automatic cleaning apparatus according to claim 3, wherein: The first bevel gear (24) is fixedly connected to one side of the spur gear (23) via a rotating shaft. The first bevel gear (24) and the spur gear (23) are rotatably connected to an extension plate provided on the lower side of the support frame (1). The spur gear (23) is meshed on one side of the rack (22).
5. An integrated circuit test probe automatic cleaning apparatus according to claim 4, wherein: The second bevel gear (25) meshes with the first bevel gear (24). The upper end of the connecting cylinder (26) is rotatably connected to the support frame (1). The lower side of the connecting cylinder (26) is attached to the upper side of the second connecting shell (36). Several sets of brushes (27) are provided and evenly distributed on the inner side of the connecting cylinder (26).
6. An integrated circuit test probe automatic cleaning apparatus according to claim 5, wherein: The pressing pedal (21) is slidably connected to a groove provided on the first connecting shell (210), the pressing pedal (21) is fixedly provided on the lower side of the rack (22), and the micro cleaning fluid pump (31) is fixedly provided on the support frame (1).
7. An integrated circuit test probe automatic cleaning apparatus according to claim 6, wherein: The annular connecting pipe (34) is fixedly mounted on the support frame (1), and the precision spray nozzle (35) is mounted through the second connecting shell (36).