A function testing device for electric control master board of charging pile

Abstract

The utility model discloses a kind of charging pile electric control main control panel function test device, it includes test fixture, test fixture includes bottom frame, fixed apron and quick compression forceps, the side plate of bottom frame is equipped with power supply interface and test host interface;The inside of bottom frame is equipped with voltmeter and CP foot voltage test circuit;Fixed apron is set in the top of bottom frame by fixed column, fixed apron is equipped with the installation slot hole of charging pile electric control main control panel and MCU main control panel matched;Bottom frame rear has support column, the upper end of support column is equipped with crossbeam, quick compression forceps is installed on crossbeam, quick compression forceps bottom end is equipped with protective cover, the lower surface of protective cover is equipped with test probe, protective cover is equipped with cable connected with test probe;Protective cover is driven by quick compression forceps to press down and rise, to drive test probe and MCU main control panel and charging pile electric control main control panel electrical contact and separate;MCU main control panel is electrically connected with test host by test probe.The utility model makes that test efficiency is efficient and simplifies manual operation action.

Description

Technical Field

[0001] This utility model relates to the field of charging pile testing technology, and in particular to a functional testing device for the main control board of a charging pile. Background Technology

[0002] In existing technologies, the testing of the main control function of the charging pile PCBA board requires testing the high voltage, communication, and reset functions on the board. The original method uses a multimeter and manual plugging and unplugging of the interface. In addition, the lower board of the PCBA is coated with conformal coating before testing, which makes it impossible to measure the voltage at the component pins when measuring the voltage at the testing station. The measurement must be performed on the upper board, which has the problems of poor contact leading to short circuits, low work efficiency, and electric shock safety hazards.

[0003] Manually testing the voltage on the entire machine requires a multimeter and manual plugging and unplugging of the communication interface. It also requires manual judgment to compare the measured value with the standard value to see if it is within the specification range. This results in tedious manual operations, easy fatigue for personnel, and low work efficiency. It also poses risks of defects, omissions, and easy damage to parts interfaces, and has a low rate of automation. Utility Model Content

[0004] The purpose of this utility model is to provide a functional testing device for the main control board of a charging pile.

[0005] The technical solution adopted in this utility model is: A functional testing device for the main control board of a charging pile includes a test fixture, which comprises a base frame, a fixed guard plate, and a quick clamp. The side plate of the base frame is provided with a power interface and a test host interface. The interior of the base frame is provided with a voltmeter and a CP pin voltage testing circuit. The fixed guard plate is mounted on the top of the base frame via a fixing post. The upper surface of the fixed guard plate is provided with mounting slots that match the main control board of the charging pile and the MCU main control board. The main control board of the charging pile and the MCU main control board can be detachably mounted on the fixed guard plate. The bottom frame has a vertical support column at its rear, with a crossbeam at the top. The quick-release clamp is mounted on the crossbeam via a mounting base. A protective cover is fixedly installed at the bottom of the quick-release clamp. The lower surface of the protective cover has a test probe that is electrically connected to the test contacts on the upper surface of the charging pile's main control board and the MCU main control board. The protective cover contains a cable connected to the test probe. The other end of the cable passes through a through hole in the protective cover and is electrically connected to the power interface, test host interface, voltmeter, and CP pin voltage test circuit inside the bottom frame. The protective cover is pressed down and raised by the quick-release clamp to cause the test probe to make electrical contact and separate from the MCU main control board and the charging pile's main control board. The MCU main control board is electrically connected to the test host via the test probe.

[0006] Furthermore, the side panel of the protective cover is equipped with spring pins that correspond to the reset button on the MCU main control board; Furthermore, a guide optical axis is vertically installed on the upper end of the bottom frame, and the protective cover slides up and down along the guide optical axis under the drive of the quick clamp.

[0007] Furthermore, a test program is configured on the test host, and commands are sent through the test program to verify the consistency between the MCU response and the protocol.

[0008] Furthermore, the upper surface of the bottom frame is provided with a voltmeter window for easy display of the voltmeter reading; on the side of the voltmeter window on the upper surface of the bottom frame, there is a power switch and a test switch for the CP pin voltage test circuit; the power switch controls the opening and closing of the external power supply.

[0009] Furthermore, the power interface connects to an external 220V AC power supply.

[0010] Furthermore, the CP pin voltage test circuit includes test switch S1, test switch S2, resistor R1 and resistor R2. One end of test switch S1 and one end of test switch S2 are connected to the CP pin of the electric pile control main board. The other end of test switch S1 is grounded through resistor R1, and the other end of test switch S2 is grounded through resistor R2.

[0011] This utility model adopts the above technical solution. By using a functional test fixture with PC software, the functional test fixture is accurately positioned and the test results are accurate. The testing efficiency is high and the manual operation is simplified. The original manual plugging and unplugging of wires and manual measurement with a multimeter are replaced by the current method where only manual placement of the board, pressing of the fixture and switch button are required to achieve automatic testing and output of measurement results. This improves work efficiency and reduces the fatigue of operators. Attached Figure Description

[0012] The present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments; Figure 1 This is a front view schematic diagram of the structure of a functional testing device for the main control board of a charging pile electrical control according to this utility model; Figure 2 This is a side view schematic diagram of the structure of a functional testing device for the main control board of a charging pile electrical control according to this utility model; Figure 3 This is a schematic diagram of the circuit principle of a functional testing device for the main control board of a charging pile. Detailed Implementation

[0013] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings.

[0014] like Figures 1 to 3As shown in the figure, this utility model discloses a functional testing device for the main control board of a charging pile, which includes a test fixture, a base frame 1, a fixed guard plate 2, and a quick clamp 5. The side plate of the base frame 1 is provided with a power interface and a test host interface; the interior of the base frame 1 is provided with a voltmeter and a CP pin voltage testing circuit; the fixed guard plate 2 is set above the base frame 1 by a fixing post, and the upper surface of the fixed guard plate 2 is provided with mounting slots that match the main control board of the charging pile and the MCU main control board. The main control board of the charging pile and the MCU main control board can be detachably installed on the fixed guard plate 2. The bottom frame 1 has a vertical support column 3 at its rear. The upper end of the support column 3 is provided with a crossbeam 4. The quick clamp 5 is mounted on the crossbeam 4 through the mounting base 51. The bottom end of the quick clamp 5 is fixedly installed with a protective cover 6. The lower surface of the protective cover 6 is provided with a test probe, which is electrically connected to the test contacts on the upper surface of the charging pile main control board and the MCU main control board. The protective cover 6 is provided with a cable connected to the test probe. The other end of the cable passes through the through hole provided in the protective cover and is electrically connected to the power interface, test host interface, voltmeter and CP pin voltage test circuit in the bottom frame 1. The protective cover 6 is driven by the quick clamp 5 to press down and rise, so as to drive the test probe to make electrical contact and separate from the MCU main control board and the charging pile main control board. The MCU main control board is electrically connected to the test host through the test probe.

[0015] Furthermore, the bottom frame 1 includes an upper plate 8 and a bottom plate 11 disposed opposite to each other, and four side plates 12 disposed on the upper surface of the bottom plate 11. The bottom plate 11, the upper plate 8 and the four side plates 12 are combined to form an internal receiving cavity of the bottom frame 1.

[0016] Furthermore, the side panel of the protective cover 6 is provided with a spring pin 9 corresponding to the reset button of the MCU main control board 7; Furthermore, a guide optical axis 10 is vertically installed on the upper end of the bottom frame 1, and the protective cover 6 slides up and down along the guide optical axis 10 under the drive of the quick clamp 5.

[0017] Furthermore, a test program is configured on the test host, and commands are sent through the test program to verify the consistency between the MCU response and the protocol.

[0018] Furthermore, the upper surface of the bottom frame 1 is provided with a voltmeter window (not shown in the figure) to facilitate the display of the voltmeter reading; the upper surface of the bottom frame 1 is provided with a power switch and a test switch for the CP pin voltage test circuit on the side of the voltmeter window; the power switch controls the opening and closing of the external power supply.

[0019] Furthermore, the power interface connects to an external 220V AC power supply.

[0020] Furthermore, the CP pin voltage test circuit includes test switch S1, test switch S2, resistor R1 and resistor R2. One end of test switch S1 and one end of test switch S2 are connected to the CP pin of the electric pile control main board. The other end of test switch S1 is grounded through resistor R1, and the other end of test switch S2 is grounded through resistor R2.

[0021] This invention connects the main control board of the electric vehicle (EV) and the 36-pin interface of the MCU main control board via probes. Each probe corresponds one-to-one with a pin of the 36-pin interface, and a physical connection is established by soldering wires to ensure uninterrupted / short-circuited communication signals between the two boards. An external rated input voltage (AC 220V) is applied to check if the power supply board is supplying power normally. The output voltage / current of the main control board and the MCU main control board are measured to verify the power conversion function and overcurrent / overvoltage protection. The voltage at the CP pin is checked to verify if it meets the standard, thus verifying the handshake protocol between the charging pile and the EV. The reset button is triggered using spring pin 9 to observe whether the MCU can initialize peripherals normally after restarting. A PC tool is connected via a 6-pin test host interface to send commands and verify the MCU response and protocol consistency.

[0022] This utility model adopts the above technical solution. By using a functional test fixture with PC software, the functional test fixture is accurately positioned and the test results are accurate. The testing efficiency is high and the manual operation is simplified. The original manual plugging and unplugging of wires and manual measurement with a multimeter are replaced by the current method where only manual placement of the board, pressing of the fixture and switch button are required to achieve automatic testing and output of measurement results. This improves work efficiency and reduces the fatigue of operators.

[0023] Obviously, the described embodiments are only a part of the embodiments of this application, not all of them. Without conflict, the embodiments and features in the embodiments of this application can be combined with each other. The components of the embodiments of this application described and illustrated herein can generally be arranged and designed in various different configurations. Therefore, the detailed description of the embodiments of this application is not intended to limit the scope of the claimed application, but merely to illustrate selected embodiments of this application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without inventive effort are within the scope of protection of this application.

Claims

1. A functional testing device for the main control board of a charging pile, characterized in that: It includes a test fixture, which consists of a base frame, a fixed guard plate, and a quick clamp. The side plate of the base frame is equipped with a power interface and a test host interface. The interior of the base frame is equipped with a voltmeter and a CP pin voltage test circuit. The fixed guard plate is mounted on top of the base frame via a fixing post. The upper surface of the fixed guard plate is equipped with mounting slots that match the charging pile's main control board and the MCU main control board. The charging pile's main control board and the MCU main control board can be detachably mounted on the fixed guard plate. The bottom frame has a vertical support column at its rear, with a crossbeam at the top. The quick-release clamp is mounted on the crossbeam via a mounting base. A protective cover is fixedly installed at the bottom of the quick-release clamp. The lower surface of the protective cover has a test probe that is electrically connected to the test contacts on the upper surface of the charging pile's main control board and the MCU main control board. The protective cover contains a cable connected to the test probe. The other end of the cable passes through a through hole in the protective cover and is electrically connected to the power interface, test host interface, voltmeter, and CP pin voltage test circuit inside the bottom frame. The protective cover is pressed down and raised by the quick-release clamp to cause the test probe to make electrical contact and separate from the MCU main control board and the charging pile's main control board. The MCU main control board is electrically connected to the test host via the test probe.

2. The charging pile electronic control main control board functional testing device according to claim 1, characterized in that: The side panel of the protective cover is equipped with spring pins that correspond to the reset button on the MCU main control board.

3. The charging pile electronic control main control board functional testing device according to claim 1, characterized in that: A guide optical axis is vertically mounted on the upper part of the bottom frame, and the protective cover slides up and down along the guide optical axis under the drive of the quick clamp.

4. The charging pile electronic control main control board functional testing device according to claim 1, characterized in that: The test host is configured with a test program, which sends commands to verify the consistency of the MCU response and the protocol.

5. The functional testing device for the main control board of a charging pile according to claim 1, characterized in that: The power interface connects to an external 220V AC power supply.

6. The functional testing device for the main control board of a charging pile according to claim 1, characterized in that: The CP pin voltage test circuit includes test switch S1, test switch S2, resistor R1 and resistor R2. One end of test switch S1 and one end of test switch S2 are connected to the CP pin of the electric pile control main board. The other end of test switch S1 is grounded through resistor R1, and the other end of test switch S2 is grounded through resistor R2.

7. A functional testing device for the main control board of a charging pile according to claim 1 or 6, characterized in that: The upper surface of the bottom frame has a voltmeter window for easy display of the voltmeter reading; the upper surface of the bottom frame has a power switch and a test switch for the CP pin voltage test circuit on the side of the voltmeter window; the power switch controls the opening and closing of the external power supply.

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