Quick-switchable compatible chip test seat

Abstract

The utility model provides a compatible chip test seat of quick switching, including test seat bottom plate, test seat main part, pressurizing frame adjusting frame and adaptive pressurizing frame which are sequentially arranged from bottom to top, the top surface of test seat main part is provided with the mounting groove, and the chip to be tested is arranged in the mounting groove, the top surface of pressurizing frame adjusting frame is provided with a plurality of first limit boss in interval, the bottom surface of adaptive pressurizing frame is provided with a plurality of second limit boss in interval, pressurizing frame adjusting frame is provided with the handle of stirring, and the handle of stirring is driven to move horizontally, and the first limit boss is switched below or one side of the second limit boss, makes adaptive pressurizing frame position switch at first height and second height, when the edge of the pressure head of test seat gland is in contact with the top surface of adaptive pressurizing frame, adaptive pressurizing frame prevents the pressure head from continuing to press down and realizes the limit, and adaptive pressurizing frame switches at first height and second height and realizes the switching of limit stroke.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, and in particular to a compatible chip test socket with quick switching capability. Background Technology

[0002] In chip testing and packaging labs, small-batch chip testing currently uses conventional test sockets with test socket covers to apply pressure to the chips under test. However, because the test socket covers are easily worn consumable materials, the latches on the test socket covers wear down easily during repeated testing, causing the contact gaps to gradually increase. Ultimately, this results in insufficient pressure on the test chip, leading to data errors. Furthermore, because chips come in various sizes and shapes, the test socket covers used with the test sockets are also custom-made. Even for chips of the same size but different heights, special covers with different pressure strokes are required. Especially for chips of the same model, the different heights of chips with and without solder balls necessitate special covers with different pressure strokes, resulting in significant cost waste.

[0003] Therefore, there is a need to provide a compatible chip test socket that can be quickly switched to solve the above problems. Utility Model Content

[0004] The purpose of this invention is to provide a compatible chip test socket that can be quickly switched. The test socket is equipped with a pressure adjustment frame and an adapter pressure frame. The horizontal movement of the pressure adjustment frame enables the switching of the limit stroke of the adapter pressure frame at a first height and a second height, thus enabling the testing of chips of two different heights.

[0005] This utility model provides a quick-switchable compatible chip test socket, comprising a test socket base plate, a test socket body, a pressure frame adjustment frame, and an adapter pressure frame arranged sequentially from bottom to top. The top surface of the test socket body has a mounting groove, in which the chip to be tested is placed. The top surface of the pressure frame adjustment frame has multiple first limiting protrusions spaced apart, and the bottom surface of the adapter pressure frame has multiple second limiting protrusions spaced apart. The pressure frame adjustment frame has a toggle handle; pushing the toggle handle moves the pressure frame adjustment frame horizontally. The first limiting protrusions switch below or to one side of the second limiting protrusions, causing the adapter pressure frame to switch positions at a first height and a second height. When the edge of the pressure head of the test socket cover contacts the top surface of the adapter pressure frame, the adapter pressure frame prevents the pressure head from pressing down further, thus limiting its movement. The switching between the first and second heights of the adapter pressure frame achieves the switching of the limiting stroke.

[0006] Preferably, the first limiting boss is a right-angled trapezoid, and the second limiting boss is an inverted right-angled trapezoid. When the first limiting boss is below the second limiting boss, the top surface of the first limiting boss abuts against the bottom surface of the second limiting boss, and the adapter pressure frame is positioned at a first height. When the first limiting boss is on one side of the second limiting boss, the hypotenuse of the first limiting boss abuts against the hypotenuse of the second limiting boss, and the adapter pressure frame is positioned at a second height. The difference between the first height and the second height is the height of the second limiting boss.

[0007] Preferably, it further includes a test base outer frame, which is disposed outside the test base body, the pressure frame adjustment frame and the adapter pressure frame. The test base outer frame is provided with a toggle groove that matches the toggle handle, and the toggle groove allows the toggle handle to move horizontally.

[0008] Preferably, an outer frame pressure block is provided above the toggle groove, and the outer frame pressure block prevents the toggle handle from disengaging from the toggle groove.

[0009] Preferably, the test base body is provided with a first positioning hole, and a first positioning pin is provided in the first positioning hole; the pressure frame adjustment frame is provided with a waist-shaped positioning hole, the first positioning pin passes through the waist-shaped positioning hole, and the waist-shaped positioning hole allows the pressure frame adjustment frame to move horizontally relative to the test base body.

[0010] Preferably, the adapter pressure frame is provided with a second positioning hole, through which the first positioning pin passes, and the second positioning hole allows the adapter pressure frame to move vertically relative to the test base body.

[0011] Preferably, the edge of the pressure head is provided with a first wave-shaped tooth, and the top surface of the adapter pressure frame is provided with a second wave-shaped tooth that can mesh with the first wave-shaped tooth. When the edge of the pressure head contacts the top surface of the adapter pressure frame, the first wave-shaped tooth meshes with the second wave-shaped tooth.

[0012] Preferably, a needle plate is provided at the center of the mounting groove, and a probe is inserted into the needle plate; a guide slope is formed at the edge of the mounting groove, and the chip is mounted in the mounting groove via the guide slope and maintains good contact with the probe.

[0013] Preferably, the test base plate has a pinhole group at its center, and the pinholes of the pinhole group are arranged one-to-one with the probes in the needle plate, allowing the probes to extend out from the pinholes.

[0014] Compared with the prior art, the technical solution of this utility model embodiment has at least the following beneficial effects:

[0015] This utility model provides a quick-switchable compatible chip test socket, comprising a test socket base plate, a test socket body, a pressure frame adjustment frame, and an adapter pressure frame arranged sequentially from bottom to top. The top surface of the test socket body has a mounting groove in which the chip to be tested is placed. The top surface of the pressure frame adjustment frame has multiple first limiting protrusions spaced apart, and the bottom surface of the adapter pressure frame has multiple second limiting protrusions spaced apart. The pressure frame adjustment frame has a toggle handle; pushing the toggle handle causes the pressure frame adjustment frame to move horizontally. The first limiting protrusions switch below or to one side of the second limiting protrusions, allowing the adapter pressure frame to switch between a first height and a second height. When the edge of the pressure head of the test socket cover contacts the top surface of the adapter pressure frame, the adapter pressure frame prevents the pressure head from pressing down further, thus achieving a limit. The switching of the adapter pressure frame between the first and second heights achieves the switching of the limit stroke, enabling compatibility with testing chips of two different heights. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the structure of the compatible chip test socket that can be quickly switched in this embodiment of the present invention;

[0017] Figure 2 This is a front view of the compatible chip test socket that can be quickly switched in this embodiment of the present invention;

[0018] Figure 3 This is a cross-sectional view of a compatible chip test stand that can be quickly switched in an embodiment of this utility model;

[0019] Figure 4 This is a schematic diagram of the cooperation between the first limiting boss and the second limiting boss in an embodiment of this utility model;

[0020] Figure 5 This is an exploded view of a compatible chip test socket that can be quickly switched in this embodiment of the present invention;

[0021] Figure 6 This is an exploded view of the pressure head, the adapter pressure frame, the pressure frame adjustment frame, and the test seat in an embodiment of this utility model.

[0022] Explanation of reference numerals in the attached figures:

[0023] 1. Test base plate; 11. Pinhole assembly;

[0024] 2. Test base body; 21. Mounting slot; 22. First positioning hole; 23. Needle plate; 24. Guide slope;

[0025] 3. Pressure frame adjustment bracket; 31. First limit boss; 32. Toggle handle; 33. Waist-shaped positioning hole;

[0026] 4. Adaptive pressure frame; 41. Second limiting boss; 42. Second positioning hole; 43. Second wave-shaped teeth;

[0027] 5. Test socket outer frame; 51. Actuating groove; 52. Outer frame pressure block;

[0028] 6. Chips;

[0029] 7. Pressure head; 71. First wave tooth;

[0030] 8. First locating pin;

[0031] 9. Probe;

[0032] 10. Test the PCB. Detailed Implementation

[0033] To make the objectives, features, and beneficial effects of this utility model more apparent and understandable, the specific embodiments of this utility model will be described in detail below with reference to the accompanying drawings. It is to be understood that the specific embodiments described below are merely for explaining this utility model and are not intended to limit it. Furthermore, the same or similar reference numerals may be used in the drawings to refer to the same or similar elements in different embodiments, and descriptions of the same or similar elements in different embodiments, as well as descriptions of prior art elements, features, effects, etc., may be omitted.

[0034] The purpose of this invention is to provide a compatible chip test socket that can be quickly switched. The test socket is equipped with a pressure adjustment frame and an adapter pressure frame. The horizontal movement of the pressure adjustment frame enables the switching of the limit stroke of the adapter pressure frame at a first height and a second height, thus enabling the testing of chips of two different heights.

[0035] Figure 1 This is a schematic diagram of the structure of the compatible chip test socket that can be quickly switched in this embodiment of the present invention; Figure 2 This is a front view of the compatible chip test socket that can be quickly switched in this embodiment of the present invention; Figure 3 This is a cross-sectional view of a compatible chip test stand that can be quickly switched in an embodiment of this utility model; Figure 4 This is a schematic diagram of the cooperation between the first limiting boss and the second limiting boss in an embodiment of this utility model; Figure 5 This is an exploded view of a compatible chip test socket that can be quickly switched in this embodiment of the present invention; Figure 6 This is an exploded view of the pressure head, the adapter pressure frame, the pressure frame adjustment frame, and the test seat in an embodiment of this utility model.

[0036] Now see Figures 1 to 6This utility model provides a quick-switchable compatible chip test socket, comprising a test socket base plate 1, a test socket body 2, a pressure frame adjustment frame 3, and an adapter pressure frame 4 arranged sequentially from bottom to top. The top surface of the test socket body 2 has a mounting groove 21, in which the chip 6 to be tested is placed. The top surface of the pressure frame adjustment frame 3 has multiple first limiting protrusions 31 spaced apart, and the bottom surface of the adapter pressure frame 4 has multiple second limiting protrusions 41 spaced apart. The pressure frame adjustment frame 3 is equipped with a lever. The handle 32 pushes the toggle handle 32 to move the pressure frame adjustment bracket 3 horizontally. The first limiting boss 31 switches below or to one side of the second limiting boss 41, so that the position of the adapter pressure frame 4 switches between the first height and the second height. When the edge of the pressure head 7 of the test seat cover contacts the top surface of the adapter pressure frame 4, the adapter pressure frame 4 prevents the pressure head 7 from pressing down to achieve the limit. The adapter pressure frame 4 switches between the first height and the second height to achieve the switching of the limit stroke, which is compatible with the testing of chips 6 of two different heights.

[0037] Specifically, the protrusion at the center of the pressure head 7 contacts the chip 6, applying pressure to the chip 6. The pressure frame 4 prevents the pressure head 7 from pressing down further, thus preventing the pressure head 7 from applying greater pressure to the chip 6.

[0038] In some embodiments, the first limiting boss 31 has a right-angled trapezoidal structure, and the second limiting boss 41 has an inverted right-angled trapezoidal structure. When the first limiting boss 31 is below the second limiting boss 41, the top surface of the first limiting boss 31 abuts against the bottom surface of the second limiting boss 41, and the pressure frame 4 is positioned at a first height. When the first limiting boss 31 is on one side of the second limiting boss 41, the hypotenuse of the first limiting boss 31 abuts against the hypotenuse of the second limiting boss 41, and the pressure frame 4 is positioned at a second height. The difference between the first height and the second height is the height of the second limiting boss 41.

[0039] In some embodiments, the test base outer frame 5 is also included. The test base outer frame 5 is disposed outside the test base body 2, the pressure frame adjustment frame 3 and the adapter pressure frame 4. The test base outer frame 5 is provided with a toggle groove 51 that matches the toggle handle 32. The toggle groove 51 allows the toggle handle 32 to move horizontally.

[0040] In some embodiments, an outer frame pressing block 52 is provided above the toggle groove 51, and the outer frame pressing block 52 prevents the toggle handle 32 from disengaging from the toggle groove 51.

[0041] In some embodiments, the test base body 2 is provided with a first positioning hole 22, and a first positioning pin 8 is provided in the first positioning hole 22; the pressure frame adjustment frame 3 is provided with a waist-shaped positioning hole 33, the first positioning pin 8 passes through the waist-shaped positioning hole 33, and the waist-shaped positioning hole 33 allows the pressure frame adjustment frame 3 to move horizontally relative to the test base body 2.

[0042] In some embodiments, the adapter pressure frame 4 is provided with a second positioning hole 42, through which the first positioning pin 8 passes. The second positioning hole 42 allows the adapter pressure frame 4 to move vertically relative to the test seat body 2.

[0043] In some embodiments, the edge of the pressure head 7 is provided with a first wave tooth 71, and the top surface of the adapter pressure frame 4 is provided with a second wave tooth 43 that can mesh with the first wave tooth 71. When the edge of the pressure head 7 contacts the top surface of the adapter pressure frame 4, the first wave tooth 71 and the second wave tooth 43 mesh.

[0044] In some embodiments, a needle plate 23 is provided at the center of the mounting groove 21, and a probe 9 is inserted into the needle plate 23; a guide slope 24 is formed at the edge of the mounting groove 21, and the chip 6 is mounted in the mounting groove 21 via the guide slope 24 and maintains good contact with the probe 9.

[0045] In some embodiments, a pinhole group 11 is provided at the center of the test base plate 1, and the pinholes of the pinhole group 11 are arranged one-to-one with the probes 9 in the needle plate 23, allowing the probes 9 to extend out from the pinholes.

[0046] Specifically, the test socket is mounted on the test PCB (Printed Circuit Board) 10, and the probe 9 maintains good contact with the test PCB 10.

[0047] In summary, the compatible chip test socket with quick switching capability provided by this utility model includes a test socket base plate 1, a test socket body 2, a pressure frame adjustment frame 3, and an adapter pressure frame 4 arranged sequentially from bottom to top. The top surface of the test socket body 2 is provided with a mounting groove 21, in which the chip 6 to be tested is placed. The top surface of the pressure frame adjustment frame 3 is provided with multiple first limiting protrusions 31 spaced apart, and the bottom surface of the adapter pressure frame 4 is provided with multiple second limiting protrusions 41 spaced apart. The pressure frame adjustment frame 3 is provided with a lever. The handle 32 pushes the toggle handle 32 to move the pressure frame adjustment bracket 3 horizontally. The first limiting boss 31 switches below or to one side of the second limiting boss 41, so that the position of the adapter pressure frame 4 switches between the first height and the second height. When the edge of the pressure head 7 of the test seat cover contacts the top surface of the adapter pressure frame 4, the adapter pressure frame 4 prevents the pressure head 7 from pressing down to achieve the limit. The adapter pressure frame 4 switches between the first height and the second height to achieve the switching of the limit stroke, which is compatible with the testing of chips 6 of two different heights.

[0048] Although specific embodiments have been described above, these embodiments are not intended to limit the scope of this utility model disclosure, even when only a single embodiment is described with respect to a particular feature. The feature examples provided in this utility model disclosure are intended to be illustrative and not limiting, unless otherwise stated. In practice, one or more technical features of the dependent claims may be combined with the technical features of the independent claims as needed and where technically feasible, and may be derived from the technical features of the respective independent claims in any suitable manner rather than solely by the specific combinations listed in the claims.

[0049] While the present invention has been disclosed above, it is not limited thereto. Any person skilled in the art can make various modifications and alterations without departing from the spirit and scope of the present invention; therefore, the scope of protection of the present invention should be determined by the scope defined in the claims.

Claims

1. A compatible chip test socket with quick switching capability, characterized in that, The device includes, from bottom to top, a test base plate, a test body, a pressure frame adjustment frame, and an adapter pressure frame. The top surface of the test body has a mounting groove into which the chip to be tested is placed. The top surface of the pressure frame adjustment frame has multiple first limiting protrusions spaced apart, and the bottom surface of the adapter pressure frame has multiple second limiting protrusions spaced apart. The pressure frame adjustment frame has a toggle handle; pushing the toggle handle moves the pressure frame adjustment frame horizontally. The first limiting protrusions switch below or to one side of the second limiting protrusions, causing the adapter pressure frame to switch between a first height and a second height. When the edge of the pressure head of the test base contacts the top surface of the adapter pressure frame, the adapter pressure frame prevents the pressure head from pressing down further, thus limiting its movement. The switching between the first and second heights of the adapter pressure frame achieves the switching of the limiting stroke.

2. The quick-switchable compatible chip test socket according to claim 1, characterized in that, The first limiting boss has a right-angled trapezoidal structure, and the second limiting boss has an inverted right-angled trapezoidal structure. When the first limiting boss is below the second limiting boss, the top surface of the first limiting boss abuts against the bottom surface of the second limiting boss, and the adapter pressure frame is located at a first height. When the first limiting boss is on one side of the second limiting boss, the hypotenuse of the first limiting boss abuts against the hypotenuse of the second limiting boss, and the adapter pressure frame is located at a second height. The difference between the first height and the second height is the height of the second limiting boss.

3. The quick-switchable compatible chip test socket according to claim 1, characterized in that, It also includes a test base outer frame, which is disposed outside the test base body, the pressure frame adjustment frame and the adapter pressure frame. The test base outer frame is provided with a toggle groove that matches the toggle handle, and the toggle groove allows the toggle handle to move horizontally.

4. The quick-switchable compatible chip test socket according to claim 3, characterized in that, An outer frame pressure block is provided above the toggle slot, which prevents the toggle handle from disengaging from the toggle slot.

5. The quick-switchable compatible chip test socket according to claim 1, characterized in that, The test base body is provided with a first positioning hole, and a first positioning pin is provided in the first positioning hole; the pressure frame adjustment frame is provided with a waist-shaped positioning hole, the first positioning pin passes through the waist-shaped positioning hole, and the waist-shaped positioning hole allows the pressure frame adjustment frame to move horizontally relative to the test base body.

6. The quick-switchable compatible chip test socket according to claim 5, characterized in that, The adapter pressure frame is provided with a second positioning hole, through which the first positioning pin passes. The second positioning hole allows the adapter pressure frame to move vertically relative to the test base body.

7. The quick-switchable compatible chip test socket according to claim 1, characterized in that, The edge of the pressure head is provided with a first wave-shaped tooth, and the top surface of the adapter pressure frame is provided with a second wave-shaped tooth that can mesh with the first wave-shaped tooth. When the edge of the pressure head contacts the top surface of the adapter pressure frame, the first wave-shaped tooth meshes with the second wave-shaped tooth.

8. The quick-switchable compatible chip test socket according to claim 1, characterized in that, A needle plate is provided at the center of the mounting slot, and a probe is inserted into the needle plate; a guide slope is formed at the edge of the mounting slot, and the chip is mounted in the mounting slot via the guide slope and maintains good contact with the probe.

9. The quick-switchable compatible chip test socket according to claim 8, characterized in that, The test base plate has a pinhole group at its center. The pinholes in the pinhole group are arranged one-to-one with the probes in the needle plate, allowing the probes to extend out of the pinholes.

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