Test device and test system

Abstract

The application relates to the chip field and particularly discloses a testing device and a testing system, the testing device comprising a shell, a testing mainboard, a testing seat and at least one testing hard disk, the testing mainboard being in signal connection with the at least one testing hard disk, the testing hard disk being arranged in the shell, a testing position being arranged on the testing hard disk, and a testing seat being arranged on the top surface of the shell and corresponding to the position of the testing position; the testing seat is used for placing a to-be-tested controller and connecting the contact of the to-be-tested controller with a bonding pad on the testing position. Through the above mode, the application realizes the rapid testing of the controller and improves the testing efficiency.

Description

Technical Field

[0001] This application relates to the field of chips, and more particularly to a testing device and a testing system. Background Technology

[0002] Storage modules, such as hard drives, are generally composed of printed circuit boards, storage chips, electronic components, and a main controller.

[0003] Currently, due to the inability to perform functional anomaly testing on the main controller of the storage module for issues such as abnormal packaging wire bonding or poor soldering, testing is usually carried out after attaching the controller to the storage module. If there are any defects in the controller itself, they cannot be detected immediately, resulting in low testing efficiency.

[0004] Therefore, how to achieve rapid testing of controllers and improve testing efficiency has become an urgent problem to be solved in this field. Utility Model Content

[0005] This application discloses a testing apparatus and a testing system, the purpose of which is to enable rapid testing of controllers and improve testing efficiency.

[0006] This application discloses a testing device, which includes a housing, a test motherboard, a test socket, and at least one test hard disk. The test motherboard is signal-connected to at least one of the test hard disks. The test hard disks are disposed inside the housing and have test positions. A test socket is disposed on the top surface of the housing corresponding to the test positions. The test socket is used to place a controller under test (DUT) and connect the contacts of the DUT to the pads on the test positions.

[0007] Optionally, the top surface of the housing has a through slot corresponding to the test position. The test base includes a test board, which is embedded in the through slot. The controller under test is placed on the test board and connected to the pads on the test position through the test board.

[0008] Optionally, the test board is provided with a plurality of test probes, each of the test probes corresponding to each contact of the controller under test; the contacts of the controller under test are connected to the pads on the test position through the test probes.

[0009] Optionally, the test fixture further includes a cover plate, which is rotatably connected to the housing and fastens onto the housing to press the controller under test onto the test plate.

[0010] Optionally, a pressing part is provided on the side of the cover plate near the test plate. The pressing part is located in the middle of the cover plate and protrudes from the surface of the cover plate near the test plate; the pressing part presses the controller under test.

[0011] Optionally, the test motherboard is provided with a master control switch and a slave control switch. The master control switch is connected to the control circuit between the test motherboard and the computer, and is used to control the signal between the test motherboard and the computer to be turned on or off. The slave control switch is connected to the control circuit between the test motherboard and the test hard drive, and is used to control the signal between the test motherboard and the test hard drive to be turned on or off.

[0012] Optionally, the test motherboard has a first interface on the side closest to the test hard drive, and the test hard drive has a second interface on the side closest to the test motherboard. The first interface and the second interface have the same interface type, and the second interface is connected to the first interface. The test motherboard has a third interface on the side furthest from the test hard drive, and the third interface is used to connect to the computer via a data cable.

[0013] Optionally, the housing further includes a base plate connected to the bottom of the housing, and the base plate extends relative to the housing to form an extension. The test motherboard is mounted on the extension, and the housing has an internal cavity. An opening is provided on the side wall of the housing near the extension, and the test motherboard is connected to the test hard drive through the opening.

[0014] Optionally, the housing is provided with a first limiting member and a second limiting member near the edge of the through groove and along the width direction of the through groove, and a rotating shaft is provided at one end of the cover. The rotating shaft is connected between the first limiting member and the second limiting member. A torsion spring is sleeved on the rotating shaft. The cover is rotatably connected to the housing through the rotating shaft. A protrusion is provided on the side of the cover away from the rotating shaft. The protrusion is inclined upward at a preset angle relative to the cover.

[0015] This application also discloses a testing system, including a computer, and the testing system further includes the aforementioned testing device, which is signal-connected to the computer.

[0016] This application improves upon traditional testing equipment by connecting a test motherboard to at least one test hard drive, enabling the test motherboard to acquire and test test signals from at least one test hard drive. When testing the controller under test (DUT), the DUT is mounted on a test socket, and the test socket connects the contacts of the DUT to the pads on the test positions of the test hard drive. This allows the DUT to be mounted on the test positions of the test hard drive and establish electrical connection. Thus, after connecting an external device (such as a computer) to the test motherboard, the DUT on the test hard drive can be tested, achieving rapid testing of the controller and improving testing efficiency. Attached Figure Description

[0017] The accompanying drawings are provided to further illustrate the embodiments of this application and form part of the specification. They serve to demonstrate implementation methods of this application and, together with the textual description, explain the principles of this application. Obviously, the drawings described below are merely some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without any creative effort. In the drawings:

[0018] Figure 1 This is a schematic diagram of the first embodiment of the test device of this application;

[0019] Figure 2 This is a schematic diagram of the test hard disk in the first embodiment of the test device of this application;

[0020] Figure 3 This is a schematic diagram of a second embodiment of the testing device of this application;

[0021] Figure 4 This is a schematic diagram of the third embodiment of the test device of this application;

[0022] Figure 5 This is a schematic diagram of the fourth embodiment of the test device of this application;

[0023] Figure 6 This is a schematic diagram of one embodiment of the test system of this application.

[0024] Among them, 10 is the test system; 100 is the test device; 200 is the computer; 300 is the data cable; 400 is the controller under test; 110 is the housing; 111 is the through slot; 112 is the base plate; 113 is the extension; 114 is the opening; 115 is the cavity; 116 is the first limiting member; 117 is the second limiting member; 120 is the test motherboard; 121 is the main control switch; 122 is the slave control switch; 123 is the first interface; 124 is the third interface; 130 is the test socket; 131 is the test board; 132 is the test probe; 133 is the cover plate; 134 is the pressing part; 135 is the rotating shaft; 136 is the torsion spring; 137 is the protrusion; 140 is the test hard disk; 141 is the test position; and 142 is the second interface. Detailed Implementation

[0025] The present application will now be described in detail with reference to the accompanying drawings and optional embodiments. It should be noted that, without conflict, the various embodiments or technical features described below can be arbitrarily combined to form new embodiments.

[0026] Figure 1 This is a schematic diagram of the first embodiment of the testing device of this application. Figure 2 This is a schematic diagram of the test hard disk in the first embodiment of the test device of this application, as shown below. Figure 1 and Figure 2 As shown in the figure, this application discloses a testing device 100, which includes a housing 110, a testing motherboard 120, a testing socket 130, and at least one testing hard disk 140. The testing motherboard 120 is signal-connected to at least one testing hard disk 140. The testing hard disk 140 is disposed inside the housing 110 and has a test position 141. The top surface of the housing 110 is provided with a testing socket 130 corresponding to the test position 141. The testing socket 130 is used to place a controller under test 400 and connect the contacts of the controller under test 400 to the pads on the test position 141.

[0027] This application improves upon the conventional testing device 100 by connecting the test motherboard 120 to at least one test hard disk 140, enabling the test motherboard 120 to acquire test signals from at least one test hard disk 140. When testing the controller under test 400, the controller under test 400 is mounted on the test socket 130, and the contacts of the controller under test 400 are connected to the pads on the test position 141 of the test hard disk 140 via the test socket 130, thus enabling the controller under test 400 to be mounted on the test position 141 of the test hard disk 140 and to conduct with the test hard disk 140. In this way, after the test motherboard 120 is connected to an external device (such as a computer 200), the controller under test 400 on the test hard disk 140 can be tested, thereby achieving rapid testing of the controller and improving testing efficiency.

[0028] Among them, test bit 141 on test hard disk 140 is the location or area on test hard disk 140 where no controller is installed, while controller under test 400 is the main controller on the hard disk.

[0029] In this embodiment of the application, a through groove 111 is provided on the top surface of the housing 110 corresponding to the test position 141. The test base 130 includes a test plate 131, which is embedded in the through groove 111. The controller under test 400 is placed on the test plate 131 and is connected to the pad on the test position 141 through the test plate 131.

[0030] When the controller under test 400 needs to be tested, the controller under test 400 is placed on the test board 131 in the through slot 111 of the housing 110, so that the controller under test 400 is connected to the pads on the test hard disk 140 through the test board 131, thereby achieving conductivity with the test hard disk, so that the controller under test 400 can be tested normally on the test motherboard 120 through the test hard disk 140.

[0031] Specifically, the test board 131 is provided with multiple test probes 132, each test probe 132 corresponding to each contact of the controller under test 400; the contacts of the controller under test 400 are connected to the pads on the test position 141 through the test probes 132.

[0032] After the controller under test 400 is placed on the test board 131, multiple contacts of the controller under test 400 make contact with multiple test probes 132 of the test board 131 one by one. Then, the multiple test probes 132 are connected to the pads on the test hard disk 140 to realize the conduction between the controller under test 400 and the test hard disk 140. This forms a signal path, allowing the controller under test 400 to be tested normally on the test motherboard 120 through the test hard disk 140.

[0033] Furthermore, the test motherboard 120 has a first interface 123 on the side near the test hard drive 140, and the test hard drive 140 has a second interface 142 on the side near the test motherboard 120. The first interface 123 and the second interface 142 have the same interface type and are connected to the first interface 123 through the second interface 142. The test motherboard 120 has a third interface 124 on the side away from the test hard drive 140. The third interface 124 is used to connect to the computer 200 through the data cable 300.

[0034] The first interface 123 and the second interface 142 both include an M.2 interface, and the third interface 124 includes a USB interface. The third interface 124 is connected to the computer 200 via a data cable 300.

[0035] In this embodiment, the interfaces of the test motherboard 120 and the test hard disk 140 are designed. Since the external interface of the computer 200 is generally a USB interface, the third interface 124 on the test motherboard 120 that connects to the computer 200 is set as a USB interface. This allows the test motherboard 120 to be connected to the external USB interface of the computer 200 only through the data cable 300. This eliminates the need to open the internal parts of the computer 200 to connect other types of interfaces, making the connection more convenient.

[0036] In addition, since the output interface on the test hard drive 140 is generally an M.2 interface, setting the first interface 123 and the second interface 142 on the test hard drive 140 that are connected to the test motherboard 120 as M.2 interfaces is beneficial for quick connection between the test hard drive 140 and the test motherboard 120, or for plugging and unplugging the test motherboard 120 when needed.

[0037] Specifically, the housing 110 also includes a base plate 112, which is connected to the bottom of the housing 110 and extends relative to the housing 110 to form an extension 113. The test motherboard 120 is mounted on the extension 113, and the housing 110 has a cavity 115 inside. An opening 114 is provided on the side wall of the housing 110 near the extension 113, and the test motherboard 120 is connected to the test hard disk 140 through the opening 114.

[0038] In this embodiment, both the test motherboard 120 and the test hard drive 140 are supported by the base plate 112. The base plate 112 effectively supports the test motherboard 120 and the test hard drive 140, thereby improving the structural stability of the test motherboard 120 and the test hard drive 140. A housing 110 is provided above the test hard drive 140, which can protect the test hard drive 140 and prevent external moisture and dust from entering the housing 110 to a certain extent, thus preventing corrosion of the electronic components on the test hard drive 140 and extending the service life of the test hard drive 140.

[0039] The test motherboard 120 is mounted on the extension 113 and exposed outside the housing 110, making it convenient for testers to connect the test motherboard 120 to external devices.

[0040] Since the test motherboard 120 and the test hard disk 140 are connected through the opening 114 on the housing 110, when it is necessary to test other types of controllers under test 400 or to replace the test motherboard 120, the test motherboard 120 can be directly removed and replaced with a test motherboard 120 of the appropriate specifications and plugged into the test hard disk 140 for testing. This helps to improve the adaptability of the test device 100 to testing different types of controllers under test 400.

[0041] Figure 3 This is a schematic diagram of a second embodiment of the testing device of this application, as shown below. Figure 3 As shown, the test fixture 130 also includes a cover plate 133, which is rotatably connected to the housing 110. The cover plate 133 is fastened to the housing 110 to press the controller under test 400 onto the test plate 131.

[0042] The difference between this embodiment and the previous embodiment is that a cover plate 133 is also installed on the top surface of the housing 110. The cover plate 133 is rotatably connected to the housing 110, for example, by a rotating shaft 135, so that the cover plate 133 can be opened or closed above the housing 110.

[0043] When testing the controller under test 400, it can be placed on the test board 131 in the through slot 111 of the housing 110. After aligning the contacts of the controller under test 400 with the test probes 132 on the test board 131, the cover plate 133 is rotated and fastened above the controller under test 400. On the one hand, the cover plate 133 presses the controller under test 400 onto the test board 131, ensuring that the contacts of the controller under test 400 make full contact with the test probes 132 on the test board 131, reducing the likelihood of poor contact or intermittent contact. This allows the contacts of the controller under test 400 to be stably connected to the pads on the test hard disk 140 through the test probes 132, ensuring the stability of the test. On the other hand, the cover plate 133 fastening onto the housing 110 can, to some extent, prevent moisture and dust from the external environment from entering the housing 110 and causing corrosion to the controller under test 400 inside the housing 110, ensuring the normal operation of the controller under test 400.

[0044] Specifically, the housing 110 is located near the edge of the through groove 111, and a first limiting member 116 and a second limiting member 117 are respectively provided along the width direction of the through groove 111. A rotating shaft 135 is provided at one end of the cover plate 133. The rotating shaft 135 is connected between the first limiting member 116 and the second limiting member 117. A torsion spring 136 is sleeved on the rotating shaft 135. The cover plate 133 is rotatably connected to the housing 110 through the rotating shaft 135. A protrusion 137 is provided on the side of the cover plate 133 away from the rotating shaft 135. The protrusion 137 is inclined upward at a preset angle relative to the cover plate 133.

[0045] In this embodiment, two limiting structures, a first limiting member 116 and a second limiting member 117, are symmetrically arranged in the width direction of the through groove 111. A cylindrical rotating shaft 135 is assembled at the end of the cover plate 133. The two ends of the rotating shaft 135 are respectively connected to the first limiting member 116 and the second limiting member 117 to form a stable support structure. A torsion spring 136 is fitted on the outer periphery of the rotating shaft 135. The automatic reset function of the cover plate 133 is realized by the elastic force of the torsion spring 136. The rotating shaft 135, the torsion spring 136 and the first limiting member 116 and the second limiting member 117 of the housing 110 are hinged together.

[0046] When it is necessary to open the cover 133, the operator only needs to lift the protrusion 137. Due to the inclined design of the protrusion 137, it is easier to apply force to make the cover 133 rotate around the pivot 135, thereby opening the cover 133 and installing or removing the controller under test 400. When the operator releases the protrusion 137, the torsion spring 136 releases its elastic potential energy, pushing the cover 133 to automatically reset and re-fasten onto the housing 110. This not only improves the convenience of operation but also ensures that the cover 133 can be accurately fastened onto the housing 110 each time, further guaranteeing the clamping and protection effect on the controller under test 400 inside the housing 110.

[0047] Figure 4 This is a schematic diagram of the third embodiment of the test device of this application, as shown below. Figure 4 As shown, a pressing part 134 is provided on the side of the cover plate 133 near the test plate 131. The pressing part 134 is located in the middle of the cover plate 133 and protrudes from the surface of the cover plate 133 near the test plate 131; the pressing part 134 presses the controller 400 under test.

[0048] The difference between this embodiment and the previous embodiment is that in this embodiment, a pressing part 134 is also provided in the middle of the cover plate 133. When the controller under test 400 needs to be tested, the controller under test 400 is first placed on the test plate 131 in the through slot 111, so that the multiple contacts on the controller under test 400 are aligned with the multiple test probes 132 on the test plate 131. Then, the cover plate 133 is rotated. When the cover plate 133 is fastened on the housing 110, the pressing part 134 can press the middle of the controller under test 400 stably and evenly, so that the test probes 132 are more tightly and stably connected to the contacts of the controller under test 400.

[0049] Furthermore, since the pressing part 134 is located in the middle of the cover plate 133, it can ensure that the pressure is concentrated on the key parts of the controller under test 400, avoiding test errors caused by uneven pressure. At the same time, it can effectively prevent the controller under test 400 from warping, further enhancing the contact effect between the controller under test 400 and the test board 131.

[0050] Meanwhile, the pressing part 134 protrudes from the surface of the cover plate 133 on the side close to the test plate 131, which can effectively prevent other parts of the cover plate 133 from making unnecessary contact with the test plate 131 or the controller under test 400, reducing interference factors. This not only improves the accuracy of the test, but also prevents the controller under test 400 or the test plate 131 from being damaged due to friction or collision between the cover plate 133 and other components.

[0051] Moreover, the pressing part 134 can be used to make the test controller 400 of different specifications and sizes more versatile. By simply adjusting the size and shape of the pressing part 134, it can be adapted to various types of test controllers 400, which further improves the practicality and applicability of the test device 100.

[0052] Figure 5 This is a schematic diagram of the third embodiment of the test device of this application, as shown below. Figure 5 As shown, the test motherboard 120 is equipped with a master control switch 121 and a slave control switch 122. The master control switch 121 is connected to the control circuit between the test motherboard 120 and the computer 200, and is used to control the signal between the test motherboard 120 and the computer 200 to be turned on or off. The slave control switch 122 is connected to the control circuit between the test motherboard 120 and the test hard disk 140, and is used to control the signal between the test motherboard 120 and the test hard disk 140 to be turned on or off.

[0053] In this embodiment, an independent master control switch 121 and slave control switch 122 are provided on the test motherboard 120. The master control switch 121 controls the signal connection and disconnection between the test motherboard 120 and the computer 200, so that the test device 100 can be turned on or off according to the actual situation.

[0054] For example, when continuous testing of the controller under test 400 is not required, the test motherboard 120 can be completely shut down via the main control switch 121 after the test is completed, thereby turning off the test device 100. When the next test is conducted, the controller under test 400 is installed on the test device 100, and then the main control switch 121 is turned on to allow the test device 100 to perform normal testing. This can effectively reduce energy consumption and improve safety during the testing process.

[0055] By controlling the signal between the test motherboard 120 and the hard drive under test through the control switch 122, when multiple test hard drives 140 are connected to the test motherboard 120, the signal between each test hard drive 140 and the test motherboard 120 can be controlled through the control switch 122 between each test hard drive 140 and the test motherboard 120. In this way, different numbers of test hard drives 140 can be tested independently according to actual testing needs, thus improving the diversity of testing.

[0056] Figure 6 This is a schematic diagram of one embodiment of the testing system of this application, as shown below. Figure 6 As shown in the illustration, this application also discloses a testing system 10, including a computer 200. The testing system 10 further includes the aforementioned testing device 100, which is signal-connected to the computer 200. When the controller under test 400 is installed on the testing device 100, the computer 200 can perform a loading program test on the controller under test 400, which can, to a certain extent, screen out controllers under test 400 with quality problems.

[0057] In the traditional test system 10, the test device 100 cannot perform abnormal tests on the main controller of the storage module. If there is a problem with the controller itself, it cannot be detected in time, thus affecting the test efficiency of the test system 10.

[0058] Based on the above problems, this application improves the test device 100 in the test system 10 by connecting the test motherboard 120 to at least one test hard disk 140, enabling the test motherboard 120 to acquire test signals from at least one test hard disk 140. When testing the controller under test 400, the controller under test 400 is installed on the test socket 130, and the contacts of the controller under test 400 are connected to the pads on the test position 141 of the test hard disk 140 through the test socket 130, so that the controller under test 400 is installed on the test position 141 of the test hard disk 140 through the test socket 130 and is connected to the test hard disk 140. In this way, after the test motherboard 120 is connected to an external device (such as a computer 200), the controller under test 400 on the test hard disk 140 can be tested, thereby realizing rapid testing of the controller and improving the testing efficiency of the test system 10.

[0059] It should be noted that the inventive concept of this application can form many embodiments, but due to the limited space of the application documents, they cannot all be listed. Therefore, without conflict, the embodiments described above or the technical features can be arbitrarily combined to form new embodiments. After the embodiments or technical features are combined, the original technical effect will be enhanced.

[0060] The above description, in conjunction with specific optional embodiments, provides a further detailed explanation of this application and should not be construed as limiting the specific implementation of this application to these descriptions. For those skilled in the art, various simple deductions or substitutions can be made without departing from the concept of this application, and all such modifications or substitutions should be considered within the scope of protection of this application.

Claims

1. A testing device, characterized in that, The testing device includes a housing, a test motherboard, a test socket, and at least one test hard disk. The test motherboard is signal-connected to at least one of the test hard disks. The test hard disks are disposed inside the housing and have test positions. A test socket is disposed on the top surface of the housing corresponding to the test positions. The test socket is used to place the controller under test and connect the contacts of the controller under test to the pads on the test position.

2. The testing apparatus according to claim 1, characterized in that, The top surface of the housing has a through slot corresponding to the test position. The test base includes a test board, which is embedded in the through slot. The controller under test is placed on the test board and connected to the pads on the test position through the test board.

3. The testing apparatus according to claim 2, characterized in that, The test board is provided with multiple test probes, each of which corresponds to a contact of the controller under test; the contacts of the controller under test are connected to the pads on the test position through the test probes.

4. The testing apparatus according to claim 3, characterized in that, The test fixture also includes a cover plate, which is rotatably connected to the housing and is fastened to the housing to press the controller under test onto the test plate.

5. The testing apparatus according to claim 4, characterized in that, A pressing part is provided on the side of the cover plate near the test plate. The pressing part is located in the middle of the cover plate and protrudes from the surface of the cover plate near the test plate. The pressing part presses the controller under test.

6. The testing apparatus according to claim 5, characterized in that, The test motherboard is equipped with a master control switch and a slave control switch. The master control switch is connected to the control circuit between the test motherboard and the computer, and is used to control the signal between the test motherboard and the computer to be turned on or off. The slave control switch is connected to the control circuit between the test motherboard and the test hard drive, and is used to control the signal between the test motherboard and the test hard drive to be turned on or off.

7. The testing apparatus according to claim 6, characterized in that, The test motherboard has a first interface on the side closest to the test hard drive, and the test hard drive has a second interface on the side closest to the test motherboard. The first interface and the second interface have the same interface type, and the second interface is connected to the first interface. The test motherboard has a third interface on the side away from the test hard drive, which is used to connect to the computer via a data cable.

8. The testing apparatus according to claim 7, characterized in that, The housing also includes a base plate connected to the bottom of the housing, and the base plate extends relative to the housing to form an extension. The test motherboard is mounted on the extension. The housing has an internal cavity. An opening is provided on the side wall of the housing near the extension, and the test motherboard is connected to the test hard drive through the opening.

9. The testing apparatus according to claim 8, characterized in that, The housing is located near the edge of the through groove, and a first limiting member and a second limiting member are respectively provided along the width direction of the through groove. A rotating shaft is provided at one end of the cover plate, and the rotating shaft is connected between the first limiting member and the second limiting member. A torsion spring is sleeved on the rotating shaft, and the cover plate is rotatably connected to the housing through the rotating shaft. The cover plate has a protrusion on the side away from the pivot, and the protrusion is tilted upward at a predetermined angle relative to the cover plate.

10. A testing system, comprising a computer, characterized in that, The testing system further includes a testing device as described in any one of claims 1 to 9, wherein the testing device is connected to the computer signal.

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