High current long life replaceable test probe

CN224695956UActive Publication Date: 2026-08-28承盛航空测试科技(苏州)有限公司
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Patent Information

Application Number
CN202521413904.7
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-07-07
Publication Date
2026-08-28
Estimated Expiration
2035-07-07

AI Technical Summary

Technical Problem

[0006]但该结构虽然能满足客户的一些大电流使用要求，但是缺陷是随着客户使用寿命会在3W次以内就会出现针尖被电火花击打毁坏，无法使用，客户更换时就只能换整根探针，成本过高，无法满足市场行情的成本管控，为此，我们提出一款高电流高寿命可更换式测试探针

Benefits of technology

1、本实用新型，通过内管位置卡台弹片的设计，在探针针头插入外套管内部的过程中，内管位置的卡台弹片会受外套管内壁的限制，使得内管处的卡台弹片会受力往里收缩，当探针针头顶部的接触端头收到被测芯片力道往下压合时，探针针头会随着压力向下进行移动，但是由于探针针头底部位置的特殊锥度设计，也就是底部的锥度针杆，会慢慢的贴合到内管的卡台弹片上，形成一个接触良好的硬性接触；

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a high current high life replaceable test probe relates to test probe technical field, this high current high life replaceable test probe, including the outer sleeve, the inside bushing installation of outer sleeve has the inner tube, and the inside bottom of inner tube is fixedly installed with the spring, the top of spring is installed with a ceramic bead, and the top of ceramic bead is installed with the probe needle, the bottom of outer sleeve is provided with the fixed end of connection, and the fixed end of connection is one of screw type, welding type, soldering line type etc. Structure, the outside of fixed end of connection is provided with the pcb board, the utility model discloses, through the design of inner tube position card station elastic sheet, can make the probe needle and the inner tube between formation one contact good rigid contact, in this case, the probe needle can accelerate the overload speed of current when detecting the measured chip, makes its test more stable.
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Claims

1. A high-current, long-life, replaceable test probe, characterized in that: Includes an outer tube (1), an inner tube (2) is inserted into the inner tube (1), and a spring (3) is fixedly installed at the bottom of the inner tube (2). A ceramic bead (4) is installed on the top of the spring (3), and a probe needle (5) is installed above the ceramic bead (4). The top of the inner tube (2) is cut into card plate spring structure (21) on both sides of the tube by laser cutting process near the opening.

2. The high-current, long-life replaceable test probe according to claim 1, characterized in that: The bottom of the outer tube (1) is provided with a connecting and fixing end (11), and the connecting and fixing end (11) is one of the threaded, welded, or wire-welded structures. A PCB board (8) is provided on the outside of the connecting and fixing end (11).

3. The high-current, long-life replaceable test probe according to claim 1, characterized in that: The probe tip (5) has a contact end (51) at its top, and the chip to be tested (6) is installed above the contact end (51). The bottom of the probe tip (5) is fixedly connected to a tapered needle rod (52).

4. The high-current, long-life replaceable test probe according to claim 1, characterized in that: A needle-loading fixture (7) is provided on the outside of the outer tube (1).

5. A high-current, long-life replaceable test probe according to claim 3, characterized in that: The contact tip (51) is one of the C-type, E-type and I-type structures, and the contact tip (51) is matched and installed with the chip under test (6).