A test bench

Abstract

The application provides a test bench. The test bench is used in cooperation with a device to be tested, and comprises a bench sleeve and a clamping component. The bench sleeve is provided with a receiving cavity, and the receiving cavity penetrates through two opposite sides of the bench sleeve in a first direction. The clamping component has a shape and size suitable for the receiving cavity, and at least a part of the clamping component is in contact with the inner wall of the receiving cavity to form a friction force. The friction force is not less than the sum of the gravity of the device to be tested and the gravity of the clamping component, so that the clamping component is assembled on the bench sleeve through the friction force. When the device to be tested is placed on the clamping component, an external force is applied to the device to be tested to extrude the clamping component and form a groove, and the sum of the external force, the gravity of the device to be tested and the gravity of the clamping component is greater than the friction force. The groove has a shape and size suitable for at least a part of the device to be tested entering the groove, so that the device to be tested is clamped on the test bench through the groove. The test bench has excellent universality.

Description

Technical Field

[0001] This utility model relates to the field of test bench technology, and in particular to a test bench that can be used for projection display devices with different structures. Background Technology

[0002] Generally speaking, projection display devices need to undergo optical effect testing before mass production, and the optical effect testing process requires fixing the projection display device on a test stand.

[0003] Existing test benches require one-to-one design and manufacturing for projection display devices with different structures, which not only leads to high manufacturing costs but also results in poor versatility of existing test benches. Utility Model Content

[0004] The test bench provided by this utility model aims to solve at least some of the defects of existing test benches.

[0005] This utility model provides a test bench. The test bench is used in conjunction with the device under test, and the test bench includes: A test stand sleeve, wherein a receiving cavity is provided on the test stand sleeve and the receiving cavity extends through the two opposite sides of the test stand sleeve in a first direction; A clamping member having a shape and size adapted to the receiving cavity, and at least a portion of the clamping member contacting the inner wall surface of the receiving cavity to generate friction; The frictional force is not less than the sum of the weight of the device under test and the weight of the clamping component, so that the clamping component is assembled on the frame sleeve by the frictional force; When the device under test is placed on the clamping component, an external force is applied to the device under test to compress the clamping component to form a groove, and the sum of the external force, the weight of the device under test, and the weight of the clamping component is greater than the frictional force. The groove has a shape and size that are adapted to at least a portion of the device under test entering the groove, so that the device under test is clamped on the test bench through the groove; Wherein, the first direction is parallel to the gravity direction of the device under test or the gravity direction of the clamping component.

[0006] In some embodiments, the clamping member is composed of a plurality of pins arranged in a predetermined manner, and the frictional force is generated between the pins of the clamping member that contact the inner wall surface of the receiving cavity and the inner wall surface of the receiving cavity.

[0007] In some embodiments, the clamping member has a first end and a second end opposite to each other in the first direction; The device under test is placed at the first end of the clamping component, and the groove is recessed into the first end of the clamping component.

[0008] In some embodiments, when the device under test is placed at the first end of the clamping member, an external force applied to the device under test can force the pin of the clamping member that is in contact with the device under test in the first direction to protrude from the second end of the clamping member until the device under test is clamped in the groove; When the device under test is clamped in the groove and the external force applied to the device under test is eliminated, the sum of the weight of the device under test and the weight of the clamping component is balanced with the frictional force.

[0009] In some embodiments, the test bench further includes: A reset baffle and multiple guide rods, one end of each guide rod being movably connected to the frame sleeve, and the other end of each guide rod being connected to the reset baffle; The reset baffle and the second end of the clamping component are located on the same side.

[0010] In some embodiments, the test stand sleeve has multiple through holes, and the through holes extend through the two opposite sides of the test stand sleeve in the first direction.

[0011] In some embodiments, each of the guide rods is inserted into a corresponding through hole, and the guide rod is movable within the through hole along the first direction.

[0012] In some embodiments, the reset baffle may be moved along the first direction toward or away from the second end of the clamping member, guided by the guide rod.

[0013] In some embodiments, when the reset baffle moves along the first direction toward the second end of the clamping member, the reset baffle can force the pin protruding from the second end of the clamping member to push up the device under test along the first direction until the reset baffle abuts against the second end of the clamping member.

[0014] In some embodiments, the test bench further includes: Multiple tripods, the tripods protruding from the frame sleeve along the first direction, and the tripods and the second end of the clamping member are located on the same side.

[0015] At least one beneficial effect of the test bench provided in this embodiment of the present invention is that: the test bench includes a bench sleeve and a clamping component; a receiving cavity is provided on the bench sleeve, and the receiving cavity extends through both opposite sides of the bench sleeve in a first direction; the clamping component has a shape and size adapted to the receiving cavity, and at least a portion of the clamping component contacts the inner wall surface of the receiving cavity to form friction; the friction is not less than the sum of the weight of the device under test and the weight of the clamping component, so that the clamping component is assembled on the bench sleeve by friction; when the device under test is placed on the clamping component, an external force is applied to the device under test to compress the clamping component to form a groove, and the sum of the external force, the weight of the device under test, and the weight of the clamping component is greater than the friction; the groove and at least a portion of the device under test entering the groove have a shape and size adapted to each other, so that the device under test is clamped on the test bench through the groove; in summary, the clamping component can flexibly clamp devices under test with different structures according to the shape and size of the device under test, thereby improving the versatility of the test bench and saving costs. Attached Figure Description

[0016] One or more embodiments are illustrated by way of example with reference to the accompanying drawings. These illustrations do not constitute a limitation on the embodiments. Elements having the same reference numerals in the drawings are denoted as similar elements. Unless otherwise stated, the figures in the drawings are not to be limited by scale.

[0017] Figure 1 This is a schematic diagram of the test bench provided in this application when it is not in operation; Figure 2 This is provided by the embodiments of this application. Figure 1 A magnified view of a portion at point A; Figure 3 This is a schematic diagram of the structure of a test bench without clamping components provided in an embodiment of this application; Figure 4 This is a schematic diagram of the test bench provided in the embodiments of this application during operation; Figure 5 This is a schematic diagram of the test bench provided in this application embodiment during reset.

[0018] Figure label: 100. Test bench; 1001. First direction; 1. Bench sleeve; 101. Receiving cavity; 102. Through hole; 2. Clamping component; 21. Ejector pin; 201. First end; 202. Second end; 3. Reset baffle; 4. Guide rod; 5. Leg; 200. Device to be tested. Detailed Implementation

[0019] The present invention will now be described in detail with reference to specific embodiments. It should be emphasized that the following description is merely exemplary and is not intended to limit the scope and application of the present invention.

[0020] It should be noted that, unless otherwise expressly specified and limited, the terms "parallel to each other," "first direction," "along," "towards," "through," "through," "inserted," "inside," "length direction," "width direction," etc., used in this specification to indicate the orientation or positional relationship are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. The terms "installation," "connection," "joining," "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features; thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature; "multiple," "several," or "a number" means two or more; "and / or" includes any and all combinations of one or more of the associated listed items. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0021] like Figures 1-4 As shown, the term "flexible" refers to the ability or characteristic of the clamping component 2 to quickly adapt to changes in the shape and size of the device under test 200 of different specifications and models.

[0022] like Figures 1-4 As shown, the term "soft" refers to the physical softness of the contact position or contact surface of the pin 21 that abuts against the device under test 200, emphasizing tactile comfort and low damage characteristics.

[0023] The devices under test include projection display devices, such as head-up displays, AR projection devices, and projection vehicle lights.

[0024] In the following description, such as Figures 1-5As shown, the following situations exist: the device under test 200 is a heads-up display. The process of the device under test 200 being forced by external force to make the pin 21 of the clamping component 2, which is in contact with the device under test 200 in the first direction 1001, protrude from the second end 202 of the clamping component 2, or the process of the reset baffle 3 moving away from the second end 202 of the clamping component 2 along the first direction 1001 is defined as downward movement. The process of the reset baffle 3 moving towards the second end 202 of the clamping component 2 along the first direction 1001 is defined as upward movement. The position of the pin when the device under test 200 is not placed on the clamping component 2 or the position of the pin after the reset baffle 3 abuts against the second end 202 is defined as the first initial position. The position of the reset baffle 3 when the test bench 100 is not working is defined as the second initial position.

[0025] Please see Figure 4 The test stand 100 is used in conjunction with the device under test 200. Specifically, the device under test 200 needs to undergo optical effect testing before mass production, and the device under test 200 needs to be fixed on the test stand 100 during the optical effect testing process.

[0026] like Figures 1-5 As shown, the test bench 100 includes a bench sleeve 1 and a clamping component 2.

[0027] The platform sleeve 1 has a receiving cavity 101, and the receiving cavity 101 extends through the two opposite sides of the platform sleeve 1 in the first direction 1001.

[0028] In the embodiments of this application, the projection of the stand sleeve 1 onto the first plane has a shape including but not limited to a rectangle, and the projection of the receiving cavity 101 onto the first plane has a shape including but not limited to a rectangle, and the normal of the first plane is parallel to the first direction 1001. In addition, the clamping member 2 has a shape and size that are adapted to the receiving cavity 101, and at least a portion of the clamping member 2 contacts the inner wall surface of the receiving cavity 101 to form friction.

[0029] In addition, the friction force is not less than the sum of the weight of the device under test 200 and the weight of the clamping component 2. This ensures that the device under test 200 cannot move downwards by its own weight when placed on the clamping component 2. At the same time, it also ensures that the clamping component 2 can be reliably fixed on the stand sleeve whether the device under test 200 is placed on it or not.

[0030] When the device under test 200 is not placed on the clamping component 2, the frictional force is balanced with the weight of the clamping component 2, so that the clamping component 2 is assembled on the stand sleeve 1 by frictional force.

[0031] It should be noted that the projection of the clamping component 2 onto the aforementioned first plane has a shape including, but not limited to, a rectangle.

[0032] It is understandable that when the device under test 200 is placed on the clamping component 2, an external force needs to be applied to the device under test 200 to squeeze the clamping component 2 to form a groove, and the sum of the external force, the weight of the device under test and the weight of the clamping component is greater than the frictional force.

[0033] The groove has a shape and size that are compatible with the portion of the device under test 200 that enters the groove, so that the device under test 200 is clamped on the test bench 100 through the groove.

[0034] Specifically, the first direction 1001 is parallel to the gravity direction of the device under test 200 or the gravity direction of the clamping component 2, and the gravity direction of the device under test 200 is downward.

[0035] In summary, the clamping component 2 can flexibly clamp the device under test 200 with different structures according to the shape and size of the device under test 200, thereby improving the versatility of this test bench 100. In contrast, existing test benches require one-to-one design and manufacturing for different structures of the device under test. Therefore, compared with existing test benches, the excellent versatility can reduce the design and manufacturing costs of this test bench 100.

[0036] In some embodiments, such as Figures 1-5 As shown, the clamping component 2 is composed of multiple ejector pins 21 arranged in a preset manner, and the ejector pins 21 that are in contact with the inner wall surface of the receiving cavity 101 and the inner wall surface of the receiving cavity 101 form a frictional force.

[0037] In this embodiment of the application, the preset situation refers to the axial direction of the ejector pin 21 being parallel to the first direction 1001, and the clamping member 2 being arranged in an orderly manner in the length and width directions.

[0038] In some embodiments, refer to Figures 1-5 The clamping component 2 has a first end 201 and a second end 202 opposite each other in the first direction 1001.

[0039] Specifically, the device under test 200 is placed at the first end 201 of the clamping component 2, and the groove is recessed downward from the first end 201 of the clamping component 2.

[0040] In some embodiments, please continue to refer to Figures 1-5When the device under test 200 is placed at the first end 201 of the clamping member 2, the external force applied to the device under test 200 can force the pin 21 of the clamping member 2, which is in contact with the device under test 200 in the first direction 1001, to move downward and protrude from the second end 202 of the clamping member 2 until the first end of the clamping member 2 forms a groove that can stably clamp the device under test 200.

[0041] When the device under test 200 is clamped in the groove and the external force applied to the device under test 200 is eliminated, the sum of the weight of the device under test 200 and the weight of the clamping component 2 is balanced with the frictional force, which allows the device under test 200 that has entered the groove to continue to maintain stability after the external force is withdrawn.

[0042] In addition, the contact position or contact surface of the pin 21 of the clamping component 2 that contacts the device under test 200 in the first direction 1001 is soft. This design can prevent the hard pin 21 from scratching the appearance of the device under test 200.

[0043] In some embodiments, such as Figures 1-5 As shown, the test bench 100 also includes a reset baffle 3 and multiple guide rods 4.

[0044] One end of the guide rod 4 is movably connected to the platform sleeve 1, and the other end of the guide rod 4 is connected to the reset baffle 3.

[0045] In addition, the reset baffle 3 and the second end 202 of the clamping component 2 are located on the same side.

[0046] It should be noted that the direction of the above-mentioned support force is upward, and the support force includes, but is not limited to, the frictional force between the clamping component 2 and the pin 21 that is in contact with the device under test 200 in the first direction 1001.

[0047] In some embodiments, such as Figures 1-5 As shown, the test stand sleeve 1 has multiple through holes 102, and the through holes 102 penetrate through the test stand sleeve 1 on opposite sides in the first direction 1001.

[0048] In this embodiment, the outer surface of the guide rod 4 has a shape that matches the through hole 102, and the shape includes, but is not limited to, a circle.

[0049] In some embodiments, refer to Figures 1-5 Each guide rod 4 is inserted into a corresponding through hole 102, and the guide rod 4 can move along the first direction 1001 within the through hole 102.

[0050] In some embodiments, please continue to refer to Figures 1-5The reset baffle 3 can move along the first direction 1001 towards the second end 202 of the clamping component 2 under the guidance of the guide rod 4. Therefore, the guide rod 4 and the through hole 102 can achieve a guiding function when they cooperate with each other.

[0051] In some embodiments, such as Figures 1-5 As shown, when the reset baffle 3 moves along the first direction 1001 toward the second end 202 of the clamping member 2 (or the reset baffle 3 moves upward), the reset baffle 3 can force the ejector pin 21 protruding from the second end 202 of the clamping member 2 to push up (or move upward) the device under test 200 along the first direction 1001 until the reset baffle 3 abuts against the second end 202 of the clamping member 2. Therefore, the reset baffle 3 can reset the ejector pin 21 protruding from the second end 202 of the clamping member 2 to the first initial position.

[0052] After the reset baffle 3 resets the pin 21 protruding from the second end 202 of the clamping component 2 to the first initial position, the user removes the device under test 200 and then moves the reset baffle downward to the second initial position for easy use next time.

[0053] In some embodiments, refer to Figures 1-5 The test bench 100 also includes: multiple tripods 5.

[0054] It is understood that the leg 5 protrudes from the frame sleeve 1 along the first direction 1001, and the leg 5 and the second end 202 of the clamping component 2 are located on the same side.

[0055] To further explain, the tripod 5 is a cuboid, and the length direction of the tripod 5 is parallel to the first direction 1001. The shape of the projection of the tripod 5 onto the first plane includes, but is not limited to, a rectangle or a square.

[0056] In summary, the test bench provided by this utility model includes a bench sleeve and a clamping component. The bench sleeve has a receiving cavity extending through both opposite sides of the bench sleeve in a first direction. The clamping component has a shape and size adapted to the receiving cavity, and at least a portion of the clamping component contacts the inner wall of the receiving cavity to form friction. The friction is not less than the sum of the weight of the device under test and the weight of the clamping component, so that the clamping component is assembled onto the bench sleeve by friction. When the device under test is placed on the clamping component, an external force is applied to the device under test to compress the clamping component and form a groove, and the sum of the external force, the weight of the device under test, and the weight of the clamping component is greater than the friction. The groove and at least a portion of the device under test entering the groove have a shape and size adapted to each other, so that the device under test is clamped onto the test bench through the groove. In conclusion, the clamping component can flexibly clamp devices under test with different structures according to the shape and size of the device under test, thereby improving the versatility of this test bench and saving costs.

[0057] The above description, in conjunction with specific / preferred embodiments, provides a further detailed explanation of the present invention. It should not be construed that the specific implementation of the present invention is limited to these descriptions. Those skilled in the art can make various modifications and improvements without departing from the concept of the present invention, and all of these fall within the protection scope of the present invention.

Claims

1. A test bench for use with a device under test, characterized in that, include: A test stand sleeve, wherein a receiving cavity is provided on the test stand sleeve and the receiving cavity extends through the two opposite sides of the test stand sleeve in a first direction; A clamping member having a shape and size adapted to the receiving cavity, and at least a portion of the clamping member contacting the inner wall surface of the receiving cavity to generate friction; The frictional force is not less than the sum of the weight of the device under test and the weight of the clamping component, so that the clamping component is assembled on the frame sleeve by the frictional force; When the device under test is placed on the clamping component, an external force is applied to the device under test to compress the clamping component to form a groove, and the sum of the external force, the weight of the device under test, and the weight of the clamping component is greater than the frictional force. The groove has a shape and size that are adapted to at least a portion of the device under test entering the groove, so that the device under test is clamped on the test bench through the groove; Wherein, the first direction is parallel to the gravity direction of the device under test or the gravity direction of the clamping component.

2. The test bench according to claim 1, characterized in that, The clamping component consists of multiple pins arranged in a preset configuration, and the frictional force is generated between the pins of the clamping component that are in contact with the inner wall surface of the receiving cavity and the inner wall surface of the receiving cavity.

3. The test bench according to claim 2, characterized in that, The clamping component has a first end and a second end opposite to each other in the first direction; The device under test is placed at the first end of the clamping component, and the groove is recessed into the first end of the clamping component.

4. The test bench according to claim 3, characterized in that, When the device under test is placed at the first end of the clamping member, the external force applied to the device under test can force the pin of the clamping member that is in contact with the device under test in the first direction to protrude from the second end of the clamping member until the device under test is clamped in the groove; When the device under test is clamped in the groove and the external force applied to the device under test is eliminated, the sum of the weight of the device under test and the weight of the clamping component is balanced with the frictional force.

5. The test bench according to claim 3, characterized in that, Also includes: A reset baffle and multiple guide rods, one end of each guide rod being movably connected to the frame sleeve, and the other end of each guide rod being connected to the reset baffle; The reset baffle and the second end of the clamping component are located on the same side.

6. The test bench according to claim 5, characterized in that, The test stand sleeve has multiple through holes, and the through holes extend through the two opposite sides of the test stand sleeve in the first direction.

7. The test bench according to claim 6, characterized in that, Each of the guide rods is inserted into a corresponding through hole, and the guide rod can move along the first direction within the through hole.

8. The test bench according to claim 7, characterized in that, The reset baffle can move along the first direction toward the second end of the clamping component, guided by the guide rod.

9. The test bench according to claim 8, characterized in that, When the reset baffle moves along the first direction toward the second end of the clamping member, the reset baffle can force the pin protruding from the second end of the clamping member to push up the device under test along the first direction until the reset baffle abuts against the second end of the clamping member.

10. The test bench according to claim 3, characterized in that, Also includes: Multiple tripods, the tripods protruding from the frame sleeve along the first direction, and the tripods and the second end of the clamping member are located on the same side.

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