Chip test socket locking mechanism

Abstract

The utility model relates to chip testing technical field, especially a kind of chip test seat locking mechanism, including test base and the base gland being hinged on test base, locking plate is slidably connected in base gland along the thickness direction of base gland, by rotating lifting knob, locking plate is slid in base gland, when needing to test chip, chip is placed in test base, then base gland is covered on test base, locking in buckle seat using locking buckle, the preliminary locking of base gland is realized, by artificial rotating lifting knob, locking plate is moved to the side close to test base, the short side part of L-shaped hook claw is inserted into U-shaped hook claw opening end, even if again dialing locking buckle, base gland also cannot loosen from test base at this time, to ensure the cooperation stability of base gland and test base in the whole testing process, ensure the accuracy of test.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, and in particular to a chip test socket locking mechanism. Background Technology

[0002] Chip test sockets are the key carriers for achieving electrical connection between chips and test equipment. Their core function is to accurately fix the chip and ensure the contact stability of the chip during testing. Traditional chip test socket locking mechanisms are mainly snap-fit ​​types. However, after prolonged use, elastic fatigue occurs, causing the snap-fit ​​to loosen. This leads to poor contact between the chip and the test probe, resulting in test data deviation. Furthermore, if the snap-fit ​​is accidentally touched during testing, the test socket will loosen directly, affecting the test. Therefore, a chip test socket locking mechanism is needed to maintain the locking stability of the test socket during testing and avoid accidental opening. Utility Model Content

[0003] In view of the shortcomings of the prior art described above, the purpose of this utility model is to provide a chip test socket locking mechanism to solve the problem of test socket locking stability in the prior art.

[0004] To achieve the above and other related objectives, this utility model provides the following technical solution: A chip test socket locking mechanism includes a test base and a base cover hinged to the test base. A locking buckle is provided on the base cover away from the hinge point. A latch is provided on the test base. When the base cover covers the test base, the locking buckle is locked onto the latch. The mechanism further includes: A locking plate is slidably connected inside the base cover along the thickness direction. A lifting knob is provided on the base cover. By rotating the lifting knob, the locking plate is driven to slide inside the base cover. The hook assembly includes an L-shaped hook on the locking plate near the locking buckle and a U-shaped hook on the locking buckle near the test base. When the base cover covers the test base, the lifting knob drives the locking plate to move towards the test base, so that the short side of the L-shaped hook extends into the opening end of the U-shaped hook to lock the base cover.

[0005] To achieve the above technical solution, when testing the chip, the chip is placed inside the test base, and then the base cover is placed on top of the test base and locked onto the buckle using a locking buckle, achieving initial locking of the base cover. At this time, the short side of the L-shaped hook is not yet fully inserted into the opening end of the U-shaped hook. Then, by manually rotating the lifting knob, the locking plate is moved closer to the test base, causing the short side of the L-shaped hook to extend into the opening end of the U-shaped hook. At this point, the inner side of the short side of the L-shaped hook contacts the inner side of the U-shaped hook. Even if the locking buckle is moved again, the base cover will not loosen from the test base, thus ensuring the stability of the fit between the base cover and the test base throughout the entire testing process and ensuring the accuracy of the test.

[0006] In one embodiment of the present invention, the locking plate is disposed at the bottom of the lifting knob, and the lifting knob and the locking plate are connected by a sliding bearing, and the lifting knob and the base cover are threadedly connected.

[0007] To achieve the above technical solution, the lifting knob is threadedly connected to the base cover. This allows the lifting knob to be rotated, which in turn drives the locking plate to reciprocate towards the test base within the base cover. This, in turn, causes the L-shaped hook and U-shaped hook to lock together, thus preventing the base cover from accidentally opening during the test.

[0008] In one embodiment of the present invention, the base cover is provided with a knob through hole, the lifting knob is located in the knob through hole, the upper side of the lifting knob extends out of the base cover, and a knob seat is provided between the part of the lifting knob extending out of the base cover and the base cover, the radial dimension of the knob seat is larger than the radial dimension of the knob through hole.

[0009] To achieve the above technical solution, a knob seat is set on the lifting knob, and the radial dimension of the knob seat is larger than the radial dimension of the knob through hole. The knob seat can play a limiting protection role, preventing the locking plate from moving downward beyond the limit after the knob seat is rotated, which would cause the chip in the test working surface to be crushed.

[0010] In one embodiment of the present invention, the U-shaped hook is located on the locking buckle on the upper side of the buckle seat, and the root of the U-shaped hook is detachably connected to the locking buckle.

[0011] To achieve the above technical solution, the U-shaped hook is set on the upper side of the buckle seat. Furthermore, the U-shaped hook and the buckle seat need to be spaced apart. The size of the space can prevent the U-shaped hook and the buckle seat from colliding when the locking buckle is rotated, which would affect the normal use of the base cover. The detachable connection can facilitate the replacement and maintenance of the U-shaped hook.

[0012] In one embodiment of the present invention, a hook groove is provided on the locking plate near the locking buckle, and the long side of the L-shaped hook is detachably connected in the hook groove.

[0013] To achieve the above technical solution, the setting of the hook claw groove can provide assembly space for the assembly of the L-shaped hook claw, improve the stability of the L-shaped hook claw in use, and avoid the L-shaped hook claw interfering with the lifting and lowering movement of the locking plate.

[0014] In one embodiment of the present invention, a locking groove is provided inside the base cover, and the locking plate is located inside the locking groove and slides in cooperation with the locking groove.

[0015] To achieve the above technical solution, the locking groove provides assembly space for the locking plate and sufficient displacement space for the locking plate, ensuring the locking stability of the locking plate.

[0016] In one embodiment of the present invention, a guide post is provided on the locking plate, and a guide groove is provided inside the base cover, with the guide post and the guide groove slidingly engaged.

[0017] To achieve the above technical solution, the guide post can guide the movement of the locking plate within the base cover, thereby improving the stability of the locking plate's movement.

[0018] As described above, the chip test socket locking mechanism of this utility model has the following beneficial effects: When testing the chip, place the chip inside the test base, then cover the test base with the base cover and lock it onto the buckle using the locking buckle to achieve initial locking of the base cover.

[0019] By manually rotating the lifting knob, the locking plate moves closer to the test base, causing the short side of the L-shaped hook to extend into the opening of the U-shaped hook. At this point, the inner side of the short side of the L-shaped hook contacts the inner side of the U-shaped hook. Even if the locking buckle is moved again, the base cover will not loosen from the test base, thus ensuring the stability of the fit between the base cover and the test base throughout the entire test process and ensuring the accuracy of the test. Attached Figure Description

[0020] Figure 1 The diagram shown is a structural schematic of the chip test socket locking mechanism disclosed in an embodiment of this utility model.

[0021] Figure 2 The diagram shown is a cross-sectional view of the chip test socket locking mechanism disclosed in this embodiment of the present invention.

[0022] Figure 3The diagram shown is a schematic diagram of the locking plate structure of the chip test socket locking mechanism disclosed in this embodiment of the present invention.

[0023] Figure 4 Displayed as Figure 3 A partial enlarged view of the figure marked A in the attached diagram.

[0024] Explanation of the technical feature labels in the attached drawings: 1. Test base; 2. Base cover; 3. Locking buckle; 4. Buckle seat; 5. Locking plate; 6. Lifting knob; 7. L-shaped hook claw; 8. U-shaped hook claw; 9. Knob through hole; 10. Knob seat; 11. Hook claw groove; 12. Locking groove; 13. Guide post; 14. Guide slide. Detailed Implementation

[0025] The following specific embodiments illustrate the implementation of this utility model. Those skilled in the art can easily understand other advantages and effects of this utility model from the content disclosed in this specification.

[0026] Please see Figures 1 to 4 It should be understood that the structures, proportions, sizes, etc., illustrated in the accompanying drawings are merely for illustrative purposes to aid those skilled in the art and are not intended to limit the scope of this invention. Therefore, they have no substantial technical significance. Any modifications to the structure, changes in proportions, or adjustments to size, without affecting the effectiveness and purpose of this invention, should still fall within the scope of the disclosed technical content. Furthermore, the terms "upper," "lower," "left," "right," "middle," and "one" used in this specification are merely for clarity and not intended to limit the scope of this invention. Changes or adjustments to their relative relationships, without substantially altering the technical content, should also be considered within the scope of this invention.

[0027] Please see Figures 1 to 4 This utility model provides a chip test socket locking mechanism, including a test base 1 and a base cover 2 hinged to the test base 1. A locking buckle 3 is provided on the base cover 2 away from the hinge point. A buckle 4 is provided on the test base 1. When the base cover 2 covers the test base 1, the locking buckle 3 is locked on the buckle 4. When the chip needs to be tested, the chip is placed in the test base 1, and then the base cover 2 is covered on the test base 1. The locking buckle 3 is used to lock it on the buckle 4, realizing the initial locking of the base cover 2. At this time, the short side of the L-shaped hook 7 has not yet fully extended into the opening end of the U-shaped hook 8.

[0028] The locking plate 5 is slidably connected to the base cover 2 along the thickness direction. A lifting knob 6 is provided on the base cover 2. By rotating the lifting knob 6, the locking plate 5 slides within the base cover 2. An L-shaped hook 7 is located on the locking plate 5 near the locking buckle 3, and a U-shaped hook 8 is located on the locking buckle 3 near the test base 1. When the base cover 2 covers the test base 1, manually rotating the lifting knob 6 moves the locking plate 5 towards the test base 1, causing the short side of the L-shaped hook 7 to extend into the opening of the U-shaped hook 8. At this point, the inner side of the short side of the L-shaped hook 7 contacts the inner side of the U-shaped hook 8. Even if the locking buckle 3 is moved again, the base cover 2 will not loosen from the test base 1, thus ensuring the stability of the fit between the base cover 2 and the test base 1 throughout the entire testing process and guaranteeing the accuracy of the test.

[0029] The locking plate 5 is located at the bottom of the lifting knob 6, and the lifting knob 6 and the locking plate 5 are connected by a sliding bearing. The lifting knob 6 is threadedly connected to the base cover 2. By threading the lifting knob 6 to the base cover 2, the lifting knob 6 can be rotated to drive the locking plate 5 to reciprocate towards the test base 1 inside the base cover 2, thereby driving the L-shaped hook 7 and the U-shaped hook 8 to lock together, so as to prevent the base cover 2 from being accidentally opened during the test.

[0030] The base cover 2 is provided with a knob through hole 9. The lifting knob 6 is located in the knob through hole 9. The upper side of the lifting knob 6 extends out of the base cover 2. Furthermore, a knob seat 10 is provided between the part of the lifting knob 6 extending out of the base cover 2 and the base cover 2. The radial dimension of the knob seat 10 is larger than the radial dimension of the knob through hole 9. By providing a knob seat 10 on the lifting knob 6 and making the radial dimension of the knob seat 10 larger than the radial dimension of the knob through hole 9, the knob seat 10 can play a limiting protection role, preventing the locking plate 5 from displacing downwards beyond the limit after rotating the knob seat 10, which would cause damage to the chip in the test working surface.

[0031] The U-shaped hook 8 is located on the locking buckle 3 on the upper side of the buckle seat 4. The root of the U-shaped hook 8 is detachably connected to the locking buckle 3. The U-shaped hook 8 is set on the upper side of the buckle seat 4. The U-shaped hook 8 and the buckle seat 4 need to be fitted with a gap. The size of the gap can prevent the U-shaped hook 8 from colliding with the buckle seat 4 when the locking buckle 3 is rotated, which would affect the normal use of the base cover 2. The detachable connection can facilitate the replacement and maintenance of the U-shaped hook 8.

[0032] A hook groove 11 is provided on the locking plate 5 near the locking buckle 3. The long side of the L-shaped hook 7 is detachably connected in the hook groove 11. The hook groove 11 provides assembly space for the L-shaped hook 7, improves the stability of the L-shaped hook 7, and avoids the L-shaped hook 7 interfering with the lifting and lowering movement of the locking plate 5.

[0033] The base cover 2 is provided with a locking groove 12. The locking plate 5 is located in the locking groove 12 and slides with the locking groove 12. The locking groove 12 provides assembly space for the locking plate 5 and provides sufficient displacement space for the displacement of the locking plate 5, ensuring the locking stability of the locking plate 5.

[0034] A guide post 13 is provided on the locking plate 5, and a guide groove 14 is provided in the base cover 2. The guide post 13 and the guide groove 14 slide together. The guide post 13 can guide the movement of the locking plate 5 in the base cover 2 and improve the movement stability of the locking plate 5.

[0035] When testing a chip, this invention places the chip inside the test base 1, then covers the test base 1 with the base cover 2, and locks it onto the buckle 4 using the locking buckle 3, achieving initial locking of the base cover 2. At this time, the short side of the L-shaped hook 7 has not yet fully extended into the opening end of the U-shaped hook 8. Then, by manually rotating the lifting knob 6, the locking plate 5 is moved closer to the test base 1, so that the short side of the L-shaped hook 7 extends into the opening end of the U-shaped hook 8. At this time, the inner side of the short side of the L-shaped hook 7 contacts the inner side of the U-shaped hook 8. Even if the locking buckle 3 is moved again, the base cover 2 will not loosen from the test base 1, thus ensuring the stability of the fit between the base cover 2 and the test base 1 throughout the entire testing process and ensuring the accuracy of the test.

[0036] The above embodiments are merely illustrative of the principles and effects of this utility model and are not intended to limit the scope of this utility model. Any person skilled in the art can modify or alter the above embodiments without departing from the spirit and scope of this utility model. Therefore, all equivalent modifications or alterations made by those skilled in the art without departing from the spirit and technical concept disclosed in this utility model should still be covered by the claims of this utility model.

Claims

1. A chip test socket locking mechanism, comprising a test base and a base cover hinged to the test base, wherein a locking buckle is provided on the base cover away from the hinge point, and a buckle seat is provided on the test base, wherein when the base cover covers the test base, the locking buckle is locked onto the buckle seat, characterized in that, Also includes: A locking plate is slidably connected inside the base cover along the thickness direction. A lifting knob is provided on the base cover. By rotating the lifting knob, the locking plate is driven to slide inside the base cover. The hook assembly includes an L-shaped hook on the locking plate near the locking buckle and a U-shaped hook on the locking buckle near the test base. When the base cover covers the test base, the lifting knob drives the locking plate to move towards the test base, so that the short side of the L-shaped hook extends into the opening end of the U-shaped hook to lock the base cover.

2. The chip test socket locking mechanism according to claim 1, characterized in that, The locking plate is located at the bottom of the lifting knob, and the lifting knob and the locking plate are connected by a sliding bearing. The lifting knob and the base cover are connected by a thread.

3. The chip test socket locking mechanism according to claim 1, characterized in that, The base cover is provided with a knob through hole, the lifting knob is located in the knob through hole, the upper side of the lifting knob extends out of the base cover, and a knob seat is provided between the part of the lifting knob extending out of the base cover and the base cover, the radial dimension of the knob seat is larger than the radial dimension of the knob through hole.

4. The chip test socket locking mechanism according to claim 1, characterized in that, The U-shaped hook is located on the locking buckle on the upper side of the buckle seat, and the root of the U-shaped hook is detachably connected to the locking buckle.

5. The chip test socket locking mechanism according to claim 1, characterized in that, A hook groove is provided on the locking plate near the locking buckle, and the long side of the L-shaped hook is detachably connected in the hook groove.

6. The chip test socket locking mechanism according to claim 1, characterized in that, The base cover has a locking groove, and the locking plate is located in the locking groove and slides in contact with the locking groove.

7. The chip test socket locking mechanism according to claim 1, characterized in that, A guide post is provided on the locking plate, and a guide groove is provided inside the base cover. The guide post and the guide groove are slidably engaged.

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