A test device based on specular reflection
Patent Information
- Application Number
- CN202522273051.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-10-28
- Publication Date
- 2026-11-03
- Estimated Expiration
- 2035-10-28
AI Technical Summary
Existing testing methods for LED indicator lights on the Jier UD152 product are inefficient, subjective, inconsistent, and unquantifiable. Furthermore, contact testing carries the risk of damage and cannot accurately reflect optical performance.
A test device based on specular reflection is used, including a base, controller, feed drive mechanism, support platform, PIN test connection unit, limit guide fixture and reflective mirror unit. Non-contact optical detection is achieved through specular reflection to directly evaluate the optical performance of LEDs.
It improves testing efficiency, avoids potential damage to products caused by contact testing, and enables objective, rapid, and non-contact optical performance evaluation.
Smart Images

Figure CN224934135U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the technical field of testing fixtures, and in particular to a testing device based on specular reflection. Background Technology
[0002] During the production and assembly of the Jier UD152 product, the LED indicator lights on its panel are crucial status display units, used to convey information such as power on / off status, battery level, fault status, and operating mode to the user. The reliability of their luminous performance, such as on / off state, color, and brightness, directly affects the user experience and product quality. Therefore, conducting 100% testing of the LED indicator lights on the Jier UD152 product is an essential procedure in the final testing stage of the production line.
[0003] Currently, the industry generally uses the following two traditional methods to test the LED indicator lights of the Jier UD152 product: The first method is manual visual inspection. The operator must directly power on the product and manually trigger the corresponding functions. Then, they must visually observe the indicator light windows on the equipment panel, relying on experience to judge whether the LEDs are lit correctly and whether the colors are accurate. This method has significant drawbacks: Inefficiency: The limited speed of manual observation, judgment, and reaction has become a bottleneck for accelerating the production line.
[0004] Highly subjective and inconsistent: Different operators, and even the same operator under different fatigue states, have different judgment standards for "moderate brightness" and "accurate color", resulting in inconsistent product quality standards.
[0005] Fatigue and high rate of missed detection: Long-term, repetitive visual work can easily lead to visual fatigue and lack of concentration for operators, thereby increasing the risk of missing defective products, such as those that are dim, flickering, or have uneven brightness.
[0006] Unquantifiable and untraceable: Test results rely on subjective human judgment and cannot generate objective, quantifiable data, such as specific brightness values and chromaticity coordinates. Therefore, effective data analysis and quality traceability cannot be performed.
[0007] The second method is the contact-based electrical performance testing method. This method involves contacting the LED's circuit pins with a test probe and measuring its electrical parameters such as current and voltage to indirectly infer the luminous state. However, this method also has inherent drawbacks: Electrical parameters cannot accurately reflect optical performance: normal electrical parameters do not necessarily equate to normal visual performance. For example, electrical measurements may fail to detect optical or structural problems in LEDs, such as color shift, lens contamination, or misaligned installation.
[0008] Risk of damage: Frequent contact of the probe may scratch delicate circuits or even generate static electricity, causing potential damage to LED chips or internal ICs.
[0009] In summary, existing testing methods for the LED indicator lights of the Jier UD152 product have significant shortcomings in terms of testing efficiency, consistency, reliability, and data quantification. Therefore, there is an urgent need in this field for an automated testing solution that can achieve rapid, objective, non-contact, and quantifiable testing to overcome the inherent deficiencies of existing technologies and improve production efficiency and product quality. Utility Model Content
[0010] Therefore, it is necessary to provide a test device based on specular reflection to address the technical problem of how to improve the testing efficiency of the Giler UD152.
[0011] A test device based on specular reflection includes: a base, a controller, a feed drive mechanism, a support frame, a PIN test connection unit, a limiting guide fixture, and a reflective mirror unit. The controller is mounted on the base, the feed drive mechanism is located adjacent to the controller, and the support frame is mounted on the feed drive mechanism. The PIN test connection unit is located between the support frame and the feed drive mechanism. The limiting guide fixture is mounted on the support frame. A portion of the PIN test connection unit passes through the support frame and extends into the limiting guide fixture to form an electrical connection with the product under test placed in the limiting guide fixture. The reflective mirror unit is located adjacent to the feed drive mechanism on the base.
[0012] Furthermore, the feed drive mechanism includes a feed support frame, a feed drive motor, a feed coupling, a feed lead screw, a feed lead screw block, a feed sliding seat, a feed guide rod, and a feed stage.
[0013] Furthermore, the feed support frame is connected to the base body, the feed drive motor is disposed on one side of the feed support frame, and the feed coupling connects the feed drive motor and the feed lead screw respectively; the feed lead screw is movably disposed in the feed support frame, the feed lead screw nut is movably connected to the feed lead screw, the feed sliding seat is movably disposed in the feed support frame, and the feed lead screw nut is connected to the feed sliding seat.
[0014] Furthermore, the support frame includes a lifting platform, a rotating lifting rod, and a spring.
[0015] Furthermore, the lifting platform is movably mounted on the feeding platform, and the limiting guide fixture is connected to the lifting platform; a plurality of rotating lifting rods are evenly arranged around the periphery of the lifting platform, each rotating lifting rod is connected to the lifting platform and the feeding platform, each rotating lifting rod is fitted with a spring, and each spring is disposed between the lifting platform and the feeding platform.
[0016] Furthermore, the PIN test connection unit has a test control circuit board, a number of test PIN pins, and wire terminals.
[0017] Furthermore, the test control circuit board is disposed on the feed stage, and a plurality of test pins are evenly distributed on the test control circuit board. Each test pin passes through the lifting platform and extends into the limiting guide fixture; the wire terminal is connected to the side of the test control circuit board.
[0018] Furthermore, the limiting guide fixture has a fixture base, a receiving cavity, and a light guide tube; the fixture base is disposed on the lifting platform, the receiving cavity is disposed in the fixture base, the light guide tube is disposed on the side of the fixture base, the light guide tube is connected to the receiving cavity, and one end of the light guide tube is disposed opposite to the reflective mirror unit.
[0019] Furthermore, the reflective mirror unit includes a mirror mount, an inclined limiting frame, and a reflector.
[0020] Furthermore, the mirror base is disposed on the base body, the inclined limiting frame is disposed on the mirror base, and the reflector is disposed within the inclined limiting frame.
[0021] In summary, this utility model discloses a testing device based on specular reflection, comprising a base, a controller, a feed drive mechanism, a support frame, a PIN pin test connection unit, a limiting guide fixture, and a reflective mirror unit. The controller is mounted on the base, the feed drive mechanism is located adjacent to the controller, and the support frame is mounted on the feed drive mechanism. The PIN pin test connection unit is located between the support frame and the feed drive mechanism. The limiting guide fixture is mounted on the support frame, and the PIN pin test connection unit partially passes through the support frame and is movably connected to the limiting guide fixture. The reflective mirror unit is located adjacent to the feed drive mechanism on the base. This utility model achieves non-contact optical detection through specular reflection, avoiding potential damage to products caused by contact testing, and can directly and objectively evaluate the optical performance of LEDs. Therefore, this utility model, a testing device based on specular reflection, solves the technical problem of how to improve the testing efficiency of the Jier UD152. Attached Figure Description
[0022] Figure 1 This is a schematic diagram of the structure of a test device based on specular reflection according to the present invention; Figure 2 This is a schematic diagram of the structure of a test device based on mirror reflection according to this utility model from another direction; Figure 3 This is a schematic diagram of the structure of a test device based on specular reflection according to this utility model from another direction. Detailed Implementation
[0023] To make the above-mentioned objects, features, and advantages of this utility model more apparent and understandable, the specific embodiments of this utility model will be described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a full understanding of this utility model. However, this utility model can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this utility model. Therefore, this utility model is not limited to the specific embodiments disclosed below.
[0024] In the description of this utility model, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc., indicating the orientation or positional relationship are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this utility model and simplifying the description, and are not intended to indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model.
[0025] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this utility model, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified.
[0026] In this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise explicitly limited. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.
[0027] In this utility model, unless otherwise explicitly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.
[0028] It should be noted that when an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. When an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used herein are for illustrative purposes only and do not represent the only possible implementation.
[0029] Please refer to the following: Figures 1 to 3 This utility model discloses a testing device based on specular reflection, comprising: a base 1, a controller 2, a feed drive mechanism 3, a support frame 4, a PIN pin test connection unit 5, a limiting guide fixture 6, and a reflective mirror unit 7. The controller 2 is mounted on the base 1, the feed drive mechanism 3 is mounted adjacent to the controller 2, and the support frame 4 is mounted on the feed drive mechanism 3. The PIN pin test connection unit 5 is located between the support frame 4 and the feed drive mechanism 3. The limiting guide fixture 6 is mounted on the support frame 4, and a portion of the structure of the PIN pin test connection unit 5 passes through the support frame 4 and extends into the limiting guide fixture 6 to form an electrical connection with the product under test placed in the limiting guide fixture 6. The reflective mirror unit 7 is mounted on the base 1 adjacent to the feed drive mechanism 3.
[0030] Specifically, when the specular reflection-based testing device of this invention is in operation, the user can place the product to be tested, such as the UD152 or other products, into the limiting guide fixture 6. The limiting guide fixture 6 limits the product to be tested and allows the electrical connection components, such as PIN pins, of the PIN test connection unit 5 to pass through the pre-drilled through holes on the support frame 4, so that the electrical connection components can be electrically connected to the product to be tested. Afterward, the user can press a preset button on the controller 2 to drive the support frame 4 via the feed drive mechanism 3, moving the PIN test connection unit 5 and the limiting guide fixture 6 to a preset position. At this time, the light from the indicator light of the product to be tested placed in the limiting guide fixture 6 can be conducted out from the limiting guide fixture 6 and reflected at a preset angle by the reflecting mirror unit 7. Thus, the user only needs to observe the light source reflected by the reflecting mirror unit 7, without having to painstakingly observe the light source in a small position on the relatively small product to be tested. This can improve the testing efficiency of the Jier UD152 product or other similar products.
[0031] Furthermore, the controller 2 is connected to the feed drive mechanism 3, and can also be electrically connected to the PIN test connection unit 5. Thus, the user can control the operation of the feed drive mechanism 3 or control the power supply or test program at the PIN test connection unit 5 through the controller 2. Specifically, the controller 2 has a main control base 201 and several buttons 202; the main control base 201 is disposed on the base 1, and the buttons 202 are evenly distributed on the main control base 201. The main control base 201 has necessary electrical components and other parts.
[0032] Furthermore, the feed drive mechanism 3 includes a feed support frame 301, a feed drive motor 302, a feed coupling 303, a feed lead screw 304, a feed lead screw nut 305, a feed sliding seat 306, a feed guide rod 307, and a feed platform 308; the feed support frame 301 is connected to the base 1, the feed drive motor 302 is disposed on one side of the feed support frame 301, and the feed coupling 303 connects the feed drive motor 302 and the feed lead screw 304 respectively; the feed lead screw 304 is movably disposed within the feed support frame 301, and the feed lead screw nut 305 is movably disposed within the feed support frame 301. The feed slide block 306 is movably connected to the feed screw 304 and is movably disposed in the feed support frame 301. The feed screw block 305 is connected to the feed slide block 306. The two feed guide rods 307 are disposed opposite to each other in the feed support frame 301, and the feed slide block 306 is movably connected to the feed guide rods 307. The feed stage 308 is connected to the feed slide block 306, the support frame 4 is disposed on the feed stage 308, and the PIN test connection unit 5 is connected to the feed stage 308 below the support frame 4.
[0033] Specifically, when the user presses the preset button 202 on the controller 2, the feed drive motor 302 starts and drives the feed screw 304 to rotate forward or reverse via the feed coupling 303. This allows the feed lead screw block 305 to reciprocate along the feed lead screw 304. Furthermore, the feed lead screw block 305 drives the feed sliding seat 306 to reciprocate along the limiting guides of the two feed guide rods 307 within the feed support frame 301. When the feed support frame 301 moves, the support platform 4 and the PIN test connection unit 5 mounted on it can also reciprocate, thus enabling the product to be tested, placed in the limiting guide fixture 6, to complete processes such as power-on, testing, and adjustment of the light source refraction position.
[0034] Furthermore, in another embodiment, the support frame 4 has a lifting platform 401, a rotating lifting rod 402, and a spring 403; the lifting platform 401 is movably disposed on the feeding platform 308, the limiting guide fixture 6 is connected to the lifting platform 401, a plurality of rotating lifting rods 402 are evenly disposed around the periphery of the lifting platform 401, each rotating lifting rod 402 is respectively connected to the lifting platform 401 and the feeding platform 308, each rotating lifting rod 402 is fitted with a spring 403, and each spring 403 is disposed between the lifting platform 401 and the feeding platform 308.
[0035] Specifically, in this embodiment described above, the power-on method for the product under test can be set to be powered on by an operator pressing a button. That is, when the user places the product under test in the limiting guide fixture 6, at this time, the PIN pin test connection unit 5 and the product under test have not yet formed a physical contact connection. At this time, the user can press down the limiting guide fixture 6 or the lifting platform 401 until an electrical connection is formed between the product under test and the PIN pin test connection unit 5, or directly rotate the two diagonally arranged rotating lifting rods 402 to make the lifting platform 401 sink as a whole, so that an electrical connection is formed between the product under test and the PIN pin test connection unit 5; either way, the product under test can be powered on for testing. At this time, the user then uses the feed drive mechanism 3 to move the limiting guide fixture 6 to the preset test position so that the reflective mirror unit 7 can reflect the light source.
[0036] Furthermore, the PIN test connection unit 5 includes a test control circuit board 501, a plurality of test PINs 502, and wire terminals 503. The test control circuit board 501 is disposed on the feed stage 308, and the plurality of test PINs 502 are evenly distributed on the test control circuit board 501. Each test PIN 502 passes through the lifting platform 401 and extends into the limiting guide fixture 6. The wire terminals 503 are connected to the side of the test control circuit board 501. Specifically, the test control circuit board 501 is provided with conventional electrical components to enable it to perform testing functions. The wire terminals 503 can be used to connect the test control circuit board 501 to external host computer or other equipment.
[0037] Furthermore, the limiting and guiding fixture 6 includes a fixture base 601, a receiving cavity 602, and a light guide tube 603. The fixture base 601 is disposed on the lifting platform 401, the receiving cavity 602 is disposed within the fixture base 601, and the light guide tube 603 is disposed on the side of the fixture base 601. The light guide tube 603 is connected to the receiving cavity 602, and one end of the light guide tube 603 is disposed opposite to the reflective mirror unit 7. Specifically, after the test PIN needle 502 passes through the lifting platform 401, it extends into the receiving cavity 602. The product to be tested can be placed in the receiving cavity 602 by the user, and the receiving cavity 602 limits the product to be tested. When the product under test is electrically connected to the PIN test connection unit 5 and powered on, the light source generated during the test can be transmitted from the accommodating cavity 602 to the light guide tube 603, and emitted from one end of the light guide tube 603 so as to be reflected by the reflective mirror unit 7 to a direction that is convenient for the user to observe.
[0038] Furthermore, the reflecting mirror unit 7 includes a mirror base 701, an inclined limiting frame 702, and a reflector 703. The mirror base 701 is mounted on the base 1, the inclined limiting frame 702 is mounted on the mirror base 701, and the reflector 703 is disposed within the inclined limiting frame 702. Specifically, the inclined limiting frame 702 has an inclined structure, and the reflector 703 is disposed on its inclined plane. This allows the user to observe the state of the light source emitted from the light guide tube 603, such as its color and quantity, from a preset angle through the light-emitting mirror 703.
[0039] In summary, the present invention discloses a test device based on specular reflection, comprising a base 1, a controller 2, a feed drive mechanism 3, a support frame 4, a PIN needle test connection unit 5, a limiting guide fixture 6, and a reflective mirror unit 7. The controller 2 is mounted on the base 1, the feed drive mechanism 3 is mounted adjacent to the controller 2, and the support frame 4 is mounted on the feed drive mechanism 3. The PIN needle test connection unit 5 is mounted between the support frame 4 and the feed drive mechanism 3. The limiting guide fixture 6 is mounted on the support frame 4. The PIN needle test connection unit 5 partially passes through the support frame 4 and is movably connected to the limiting guide fixture 6. The reflective mirror unit 7 is mounted on the base 1 adjacent to the feed drive mechanism 3. This invention achieves non-contact optical detection through specular reflection, avoiding potential damage to products caused by contact testing, and can directly and objectively evaluate the optical performance of LEDs; therefore, this invention, a testing device based on specular reflection, solves the technical problem of how to improve the testing efficiency of the Jier UD152.
[0040] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0041] The embodiments described above are merely illustrative of several implementations of this utility model, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the utility model patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this utility model, and these all fall within the protection scope of this utility model. Therefore, the protection scope of this utility model patent should be determined by the appended claims.
Claims
1. A testing device based on specular reflection, characterized in that, It includes: The device comprises a base (1), a controller (2), a feed drive mechanism (3), a support frame (4), a PIN test connection unit (5), a limiting guide fixture (6), and a reflective mirror unit (7). The controller (2) is disposed on the base (1), the feed drive mechanism (3) is disposed on the adjacent side of the controller (2), and the support frame (4) is disposed on the feed drive mechanism (3). The PIN test connection unit (5) is disposed between the support frame (4) and the feed drive mechanism (3). The limiting guide fixture (6) is disposed on the support frame (4). A portion of the structure of the PIN test connection unit (5) passes through the support frame (4) and extends into the limiting guide fixture (6) to form an electrical connection with the product to be tested placed in the limiting guide fixture (6). The reflective mirror unit (7) is disposed on the base (1) adjacent to the feed drive mechanism (3).
2. The testing device based on specular reflection according to claim 1, characterized in that: The feed drive mechanism (3) includes a feed support frame (301), a feed drive motor (302), a feed coupling (303), a feed lead screw (304), a feed lead screw block (305), a feed sliding seat (306), a feed guide rod (307), and a feed stage (308).
3. The testing device based on specular reflection according to claim 2, characterized in that: The feed support frame (301) is connected to the base (1), the feed drive motor (302) is disposed on one side of the feed support frame (301), and the feed coupling (303) connects the feed drive motor (302) and the feed screw (304) respectively; the feed screw (304) is movably disposed in the feed support frame (301), the feed screw nut (305) is movably connected to the feed screw (304), the feed sliding seat (306) is movably disposed in the feed support frame (301), and the feed screw nut (305) is connected to the feed sliding seat (306).
4. The testing device based on specular reflection according to claim 2, characterized in that: The support frame (4) has a lifting platform (401), a rotating lifting rod (402), and a spring (403).
5. The testing device based on specular reflection according to claim 4, characterized in that: The lifting platform (401) is movably mounted on the feeding platform (308), and the limiting guide fixture (6) is connected to the lifting platform (401); a plurality of rotating lifting rods (402) are evenly arranged around the lifting platform (401), each rotating lifting rod (402) is connected to the lifting platform (401) and the feeding platform (308), and each rotating lifting rod (402) is fitted with a spring (403), and each spring (403) is arranged between the lifting platform (401) and the feeding platform (308).
6. The testing device based on specular reflection according to claim 5, characterized in that: The PIN test connection unit (5) has a test control circuit board (501), a number of test PIN pins (502) and wire terminals (503).
7. The testing device based on specular reflection according to claim 6, characterized in that: The test control circuit board (501) is disposed on the feed stage (308), and a plurality of test pins (502) are evenly distributed on the test control circuit board (501). Each test pin (502) passes through the lifting platform (401) and extends into the limiting guide fixture (6); the wire terminal (503) is connected to the side of the test control circuit board (501).
8. The testing device based on specular reflection according to claim 7, characterized in that: The limiting guide fixture (6) has a fixture base (601), a receiving cavity (602), and a light guide tube (603); the fixture base (601) is disposed on the lifting platform (401), the receiving cavity (602) is disposed in the fixture base (601), the light guide tube (603) is disposed on the side of the fixture base (601), the light guide tube (603) is connected to the receiving cavity (602), and one end of the light guide tube (603) is disposed opposite to the reflecting mirror unit (7).
9. A testing device based on specular reflection according to claim 8, characterized in that: The reflective mirror unit (7) has a mirror mount (701), a slope limiting mount (702), and a reflector (703).
10. A testing device based on specular reflection according to claim 9, characterized in that: The mirror base (701) is disposed on the base (1), the inclined limiting frame (702) is disposed on the mirror base (701), and the reflector (703) is disposed in the inclined limiting frame (702).
