Housing of semiconductor device testing instrument
CN309034936SActive Publication Date: 2024-12-27NIHON MICRONICS KK
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Patent Information
- Application Number
- CN202430101353.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Priority Date
- 2023-08-31
- Filing Date
- 2024-02-29
- Publication Date
- 2024-12-27
- Estimated Expiration
- 2039-02-28
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Figure 000007_ABST
Abstract
1. Name of the product of this design: Shell part of a semiconductor device testing instrument. 2. Purpose of this design product: This product as a whole is a test instrument for semiconductor devices, and part of it is a shell that protects built-in components. 3. The key design point of this design product lies in the shape of the part for which protection is sought. 4. The picture or photo that best illustrates the key points of the design: 3D drawing of Design 1. 5. Designate Design 1 as the base design. 6. Other situations that need explanation: This design requires partial protection of the design. The part represented by the solid line is the part for which protection is required, the part represented by the dotted line is the part that is not required to be protected, and the dot-dash line is the boundary line between the part for which protection is required and the part that is not required to be protected.
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