Housing of semiconductor device testing instrument

CN309034936SActive Publication Date: 2024-12-27NIHON MICRONICS KK
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Patent Information

Application Number
CN202430101353.5
Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
Priority Date
2023-08-31
Filing Date
2024-02-29
Publication Date
2024-12-27
Estimated Expiration
2039-02-28

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Abstract

1. Name of the product of this design: Shell part of a semiconductor device testing instrument. 2. Purpose of this design product: This product as a whole is a test instrument for semiconductor devices, and part of it is a shell that protects built-in components. 3. The key design point of this design product lies in the shape of the part for which protection is sought. 4. The picture or photo that best illustrates the key points of the design: 3D drawing of Design 1. 5. Designate Design 1 as the base design. 6. Other situations that need explanation: This design requires partial protection of the design. The part represented by the solid line is the part for which protection is required, the part represented by the dotted line is the part that is not required to be protected, and the dot-dash line is the boundary line between the part for which protection is required and the part that is not required to be protected.
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