Memory chip aging test fixture

CN309245038SActive Publication Date: 2025-04-18SHENZHEN MIKEFANGDE SEMICON CO LTD
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Patent Information

Application Number
CN202430222070.6
Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
Filing Date
2024-04-19
Publication Date
2025-04-18
Estimated Expiration
2039-04-19

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Abstract

1. The name of this design product: memory chip aging test fixture. 2. Purpose of this design product: SD NAND card opening and aging test. 3. The design highlights of this design product are shape and pattern. 4. The picture or photo that best illustrates the design points: Stereoscopic diagram 1.
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