Wafer inspection machine
CN309287087SActive Publication Date: 2025-05-13창추안 테크놀로지 (수저우) 컴퍼니 리미티드
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Patent Information
- Application Number
- CN202430516039.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-14
- Publication Date
- 2025-05-13
- Estimated Expiration
- 2039-08-14
Smart Images
Figure 000007_ABST
Abstract
1. The name of the product of this design: wafer inspection machine. 2. Purpose of this design product: This design product is used for defect detection on the surface of wafers. 3. The design key point of this appearance design product lies in the shape of the product. 4. The picture or photo that best illustrates the design points: Stereoscopic diagram 1.
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