Image Target Scale for Laser Alignment Instrument Calibration

CN309346051SActive Publication Date: 2025-06-20TIANJIN INST OF METROLOGICAL SUPERVISION & TESTING +1
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Patent Information

Application Number
CN202430693599.6
Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
Filing Date
2024-11-01
Publication Date
2025-06-20
Estimated Expiration
2039-11-01

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Abstract

1. Name of the Design Product: Image Target Scale for Laser Alignment Instrument Calibration. 2. Use of the Design Product: Used for calibrating the horizontal laser line error, horizontal laser line emission angle error, horizontal laser line compensation error, vertical laser line error, vertical laser line orthogonality error, and lower point error of a laser alignment instrument by computer vision method, with a scale division value of 1 mm for the engraved lines. 3. Design Key Points of the Design Product: The combination of the pattern and the shape. 4. Picture or Photograph that Best Illustrates the Design Key Points: Front View. 5. The rear view is symmetrical to the front view, so the rear view is omitted. 6. The design product is made of transparent material.
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