Chip Test Turntable (2-axis)
CN309378557SActive Publication Date: 2025-07-11SHAOXING YUANFANG SEMICON CO LTD
View PDF 0 Cites 0 Cited by
Patent Information
- Application Number
- CN202430646198.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-14
- Publication Date
- 2025-07-11
- Estimated Expiration
- 2039-10-14
Smart Images
Figure 000007_ABST
Abstract
1. The name of the design product: Chip Testing Turntable (2-axis). 2. The use of the design product: This design product is used for the testing of gyroscope chips, accelerometer chips, IMU modules, etc., and can be used for high-speed and low-speed rotation as well as positioning. 3. The key design points of the design product: lie in the shape. 4. The picture or photo that best shows the key design points: the perspective view.
Need to check novelty before this filing date? Find Prior Art