Probe detection all-in-one machine
CN309552863SActive Publication Date: 2025-10-21MINGCHA ZHIXIN (SHENZHEN) TECHNOLOGY CO LTD
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Patent Information
- Application Number
- CN202430699089.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-05
- Publication Date
- 2025-10-21
- Estimated Expiration
- 2039-11-05
Smart Images
Figure 000007_ABST
Abstract
1. The name of the design product: probe detection all-in-one machine. 2. The use of the design product: for detecting surface scratches, cracks, impurities, deformation and other appearance defects of the probe, and measuring the length, diameter, head shape and other dimensions of the probe. 3. The design points of the design product: in shape. 4. The picture or photo that best shows the design points: perspective view.
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