High and low temperature test chamber (desktop)
CN309586736SActive Publication Date: 2025-11-07HEFEI JUQUE ELECTRONICS CO LTD
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Patent Information
- Application Number
- CN202530131693.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-18
- Publication Date
- 2025-11-07
- Estimated Expiration
- 2040-03-18
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Figure 000004_ABST
Abstract
1. The name of the design product: high and low temperature test chamber (desktop). 2. The use of the design product: the design product is used to provide high temperature, low temperature environment test equipment. 3. The design points of the design product: the combination of shape and pattern. 4. The picture or photo that best indicates the design points: design 1 perspective view. 5. The rear view, top view, bottom view, left view and right view of design 2, design 3 and design 4 are the same as those of design 1, and the rear view, top view, bottom view, left view and right view of design 2, design 3 and design 4 are omitted. 6. Design 1 is designated as the basic design.
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