High and low temperature test chamber (desktop)

CN309586736SActive Publication Date: 2025-11-07HEFEI JUQUE ELECTRONICS CO LTD
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Patent Information

Application Number
CN202530131693.7
Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
Filing Date
2025-03-18
Publication Date
2025-11-07
Estimated Expiration
2040-03-18

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Abstract

1. The name of the design product: high and low temperature test chamber (desktop). 2. The use of the design product: the design product is used to provide high temperature, low temperature environment test equipment. 3. The design points of the design product: the combination of shape and pattern. 4. The picture or photo that best indicates the design points: design 1 perspective view. 5. The rear view, top view, bottom view, left view and right view of design 2, design 3 and design 4 are the same as those of design 1, and the rear view, top view, bottom view, left view and right view of design 2, design 3 and design 4 are omitted. 6. Design 1 is designated as the basic design.
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