Micrometer scale equal thickness interferometric micro-displacement measuring instrument
CN309611056SActive Publication Date: 2025-11-18周乃云
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Patent Information
- Application Number
- CN202530344338.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-06-16
- Publication Date
- 2025-11-18
- Estimated Expiration
- 2040-06-16
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Figure 000017_ABST
Abstract
1. The name of the design product: micron order equal thickness interference measurement micro displacement measuring instrument. 2. The use of the design product: instrument for micron order equal thickness interference measurement micro displacement measurement. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: combination state reference drawing.
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