Contact of a probe for continuity check
CN309665842SActive Publication Date: 2025-12-12OMRON CORP
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Patent Information
- Application Number
- CN202530252735.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Priority Date
- 2024-11-28
- Filing Date
- 2025-05-07
- Publication Date
- 2025-12-12
- Estimated Expiration
- 2040-05-07
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Figure 000001_ABST
Abstract
1. The name of the design product: the contact of the probe for continuity check. 2. The use of the design product: the whole product is a probe for continuity check, which is used for continuity check of the inspection objects such as liquid crystal panel, semiconductor device, substrate, etc. in the technical field of products such as electrification products, electrical and electronic equipment, etc. which need to confirm electrical continuity; the part requested to be protected is the contact of the probe, which is used to contact the electrode of the inspection object. 3. The design points of the design product: the shape of the part requested to be protected. 4. The picture or photo that best indicates the design points: perspective view 1. 5. The rear view is symmetrical to the front view, and the rear view is omitted. 6. Other circumstances that need to be explained: this design is a partial design, and the thin ink covered part in the view is not the part requested to be protected.
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