Contact of a probe for continuity check

CN309665842SActive Publication Date: 2025-12-12OMRON CORP
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Patent Information

Application Number
CN202530252735.2
Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
Priority Date
2024-11-28
Filing Date
2025-05-07
Publication Date
2025-12-12
Estimated Expiration
2040-05-07

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Abstract

1. The name of the design product: the contact of the probe for continuity check. 2. The use of the design product: the whole product is a probe for continuity check, which is used for continuity check of the inspection objects such as liquid crystal panel, semiconductor device, substrate, etc. in the technical field of products such as electrification products, electrical and electronic equipment, etc. which need to confirm electrical continuity; the part requested to be protected is the contact of the probe, which is used to contact the electrode of the inspection object. 3. The design points of the design product: the shape of the part requested to be protected. 4. The picture or photo that best indicates the design points: perspective view 1. 5. The rear view is symmetrical to the front view, and the rear view is omitted. 6. Other circumstances that need to be explained: this design is a partial design, and the thin ink covered part in the view is not the part requested to be protected.
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