Test probe (UT-C17)
CN309856844SActive Publication Date: 2026-03-20UNI TREND TECH (CHINA) CO LTD
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-07-14
- Publication Date
- 2026-03-20
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Figure 000007_ABST
Abstract
1. The name of the design product: test probe (UT-C17). 2. The use of the design product: the design product is connected with external detection equipment, and is used to contact with measured objects to measure voltage, current, resistance, etc. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view 1.
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