Chip testing indenter
CN309866353SActive Publication Date: 2026-03-24HANGZHOU CHANGCHUAN TECH CO LTD
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-08-20
- Publication Date
- 2026-03-24
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Figure 000006_ABST
Abstract
1. The name of the design product: chip test pressure head. 2. The use of the design product: for pressure test bare die type chip, and provide test temperature. 3. The design points of the design product: in shape. 4. The picture or photo that best shows the design points: design 1 perspective view 1. 5. The top design content has been embodied in the perspective view 3 of each design, and the top view of each design is omitted. 6. Design 1 is designated as the basic design.
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