Upper and lower partition integrated high and low temperature test chamber
CN309954935SActive Publication Date: 2026-05-01NEWARE TECH LTD
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- NEWARE TECH LTD
- Filing Date
- 2025-10-30
- Publication Date
- 2026-05-01
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Figure 000001_ABST
Abstract
1. Name of the product in this design: Integrated High and Low Temperature Test Chamber with Upper and Lower Partitions. 2. Purpose of this design: It is an integrated upper and lower partition test device for providing high and low temperature environments. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: a 3D model.
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