Split type movable high and low temperature test chamber
CN309954992SActive Publication Date: 2026-05-01NEWARE TECH LTD
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- NEWARE TECH LTD
- Filing Date
- 2025-11-17
- Publication Date
- 2026-05-01
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Figure 000001_ABST
Abstract
1. Name of the product in this design: Split-type portable high and low temperature test chamber. 2. Purpose of this design: For reliability testing of industrial products at high and low temperatures. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: a 3D model.
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