Mask base fabric testing machine
CN310044601SActive Publication Date: 2026-06-23SHANGHAI STRATOSPHERE INFORMATION TECH CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- SHANGHAI STRATOSPHERE INFORMATION TECH CO LTD
- Filing Date
- 2026-02-25
- Publication Date
- 2026-06-23
Smart Images

Figure 000005_ABST
Abstract
1. Name of the product in this design: Mask base fabric testing machine. 2. Purpose of this design: For the detection of defects in the base fabric of face masks. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: 3D view 1.
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