Calibration procedure

DE102023127697A1Inactive Publication Date: 2025-04-10SENSITEC GMBH
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Patent Information

Application Number
DE102023127697
Authority / Receiving Office
DE · DE
Patent Type
Applications
Current Assignee / Owner
Filing Date
2023-10-10
Publication Date
2025-04-10
Estimated Expiration
Not applicable · inactive patent

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Abstract

A method (100, 101, 102) for determining calibration values ​​(ε) of a measuring device (10) comprising an angle sensor, wherein the angle sensor is configured to determine a positioning angle (ε(t)) of a device (12) and wherein the measuring device (10) comprises a timing device for measuring an elapsed time, comprises the steps: a) rotating the device (12) at a constant angular velocity (ε); b) dividing a measuring range (16) of the angle sensor into a number of successive sectors (18), each of the sectors having a starting angle (ε); c) during a complete sweep of the measuring range (16), repeatedly performing the following steps for each sector (18): d) measuring at least one associated positioning angle (ε(t)) and a time; e) Summing up the determined positioning angles (μ(t)) each minus the starting angle (μ) assigned to sector (18).i) in a sector angle sum memory (&Ggr;i) assigned to sector (18); f) summing the determined times, each less the time measured in the respective sector during the first measurement, in a sector time sum memory (&sgr;i) assigned to the sector; g) storing a time difference between a first execution of step c) in the sector and the first execution of step c) in the next sector in a sector duration memory (&tgr;i) assigned to the sector; h) storing a number of steps c) performed in the respective sector (18) in a sector measurement count memory (Li) assigned to sector (18).;
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Description

The invention relates to methods for determining calibration values of a measuring device having an angle sensor, wherein the angle sensor is configured to determine a control angle of a device. The invention furthermore relates to a method for calibrating the measuring device having the angle sensor by means of the determined calibration values.In the prior art, a large number of angle sensors are known, the measuring methods of which are based on different physical effects. For example, optical, magnetic, inductive and capacitive angle sensors are known.Magnetic angle sensors are known in various embodiments. In some possible embodiments, an orientation of a device, for example a wave, in space is to be measured. For this purpose, the device is provided with a magnet arranged to rotate together with the device, the magnetic field generated by the magnet also rotating together with the device. By measuring the magnetic field, in particular the orientation of the magnetic field lines, by means of a magnetic field sensor in the vicinity of the magnet, a setting angle of the device can then be measured. As magnets, for example, diametrical magnets can be used which are arranged radially aligned on one end of a shaft. It is likewise possible to arrange pole rings on a periphery of a shaft, as a result of which a more complex magnetic field with a plurality of pole changes is produced during one rotation. If pole rings are used, then a length sensor can also be used as the magnetic sensor. Magnetic field sensors can be designed, for example, as integrated circuits which measure a solid angle of a magnetic field or a location of a pole change (length sensor).Angle sensors are often integrated into a measuring device which can provide basic conditions, for example a supply voltage, necessary for the magnetic field sensors and / or which have an evaluation device which determines, in particular calculates, a setting angle from electrical measured values.The measuring device can be configured such that an absolute position relative to a zero position physically arranged and / or marked on the sensor device is determined as the setting angle. Such measuring devices can be designed, for example, as true power-on sensors, the absolute position of which can be measured even after a temporary loss of the supply voltage directly after the supply voltage again prevails, without a movement of the system being necessary. In some such embodiments, the absolute position can also be available immediately after application of the supply voltage if the angle of attack has been changed in the meantime. For this purpose, a plurality of magnetic tracks, for example pole rings, can be provided, wherein one of the tracks is configured for incremental measurement and one of the tracks is configured for measurement of reference positions.Other measuring devices are configured to output the setting angle only incrementally. After the switching on, its zero position is set, for example, to the position of the shaft during the switching on. If an absolute position is to be output, then a position must first be set as a zero position, for example by means of an external sensor which indicates a zero position of the shaft.All types of angle sensors have different linear and / or non-linear measurement errors depending on the design, calibration methods being used for their correction. The calibration methods may relate, with respect to magnetic angle sensors, for example to a correction of the arrangement of the magnet or of the angle sensor. Further calibration methods are based on determining calibration values for a calibration, which are then used in a calibration method for correcting determined angle measurement values.Various such calibration methods are known. Usually, they assume that there is an external reference which is compared with the measured angle of attack. In further calibration methods, a simulated error is placed over the measured values and the actual error is calculated from the thus modified measured values by mathematical methods.Against this background, the present invention has the object of proposing a method for determining calibration values and a method for calibrating a measuring device which has low complexity and a reduced resource requirement and does not require an external reference.The object is achieved by a method according to claim 1, a method according to claim 2, a method according to claim 3 and a method according to claim 10. Further advantageous embodiments are the subject matter of the dependent claims.To achieve the object, a method for determining calibration values of a measuring device having an angle sensor, wherein the angle sensor is configured to determine a control angle of a device and wherein the measuring device has a time measuring device for measuring an elapsed time, comprises the steps of: a) rotating the device at a constant angular speed; b) dividing a measuring range of the angle sensor into a number of successive sectors, wherein each of the sectors has a starting angle; c) during a full sweep of the measuring range, repeatedly carrying out the following step for each sector: d) measuring at least one associated control angle (φ(t)) and a time; during or after step c): e) averaging the determined control angles (φ(t)) in a sector control angle average memory associated with the sector (18); f) averaging the determined times in a sector mean time memory assigned to the sector; g) storing a time difference between a first execution of step d) in each sector and the first execution of step d) in the next sector in a sector time duration memory assigned to the sector (τ i); h) determining the calibration values (ε i) by combining the determined values of the sector angle mean memory, the sector mean time memory and / or the sector time duration memory (τ i).No external reference is required to carry out this method. It can therefore be carried out particularly easily.To achieve the object, a method for determining calibration values of a measuring device having an angle sensor, wherein the angle sensor is configured to determine a control angle of a device and wherein the measuring device has a time measuring device for measuring an elapsed time, has the following steps: a) rotating the device at a constant angular speed; b) dividing the measuring range of the angle sensor into a number of successive sectors, wherein each of the sectors has a starting angle; c) repeatedly carrying out the following steps for each sector during a full revolution: d) measuring at least one associated control angle and determining a time; e) summing up the determined control angles in each case minus the starting angle associated with the sector in a sector control angle sum memory associated with the sector; f) summing the determined times, optionally each minus the time measured in the first measurement in the respective sector, in a sector time sum memory assigned to the sector; g) storing the time or a time difference between a first execution of step c) in the sector and the first execution of step c) in the next sector in a sector time duration memory assigned to the sector; h) storing a number of steps c) executed in the respective sector in a sector measurement number memory assigned to the sector.In addition to storage space for temporary variables in which, for example, a current angle of attack is stored, this method requires only four storage devices per sector, the sector time duration memory, the sector angle sum memory, the sector time sum memory and the sector measurement number memory in which aggregated numerical values are stored. No external references are necessary for comparison with the determined angle of attack. The computing operations frequently necessary for carrying out the method can be implemented in a simple and energy-saving manner. As a result, the method has a low complexity and is particularly well suited for implementation, for example, in microcontrollers or generally in computing devices with low storage and computing resources.To achieve the object, a method for determining calibration values of a measuring device having an angle sensor, wherein the angle sensor is configured to determine a control angle of a device and wherein the measuring device has a time measuring device for measuring an elapsed time, has the following steps: a) rotating the device at a constant angular speed; b) dividing the measuring range of the angle sensor into a number of successive sectors, wherein each sector is assigned a sector start and a sector end in the form of a control angle; c) measuring the control angle; d) determining a current sector in which the control angle lies; e) If the measurement carried out in step c) is a first measurement in the current sector, storing the time elapsed since the first measurement in the previous sector in a sector time memory assigned to the previous sector; f) adding the setting angle minus the angle of the sector start to a sector setting angle sum memory assigned to the current sector; g) adding a time elapsed since the first measurement in this sector to a sector time sum memory assigned to the current sector; h) increasing a sector measurement number memory assigned to the current sector by 1; i) repeating steps c) to h) until setting angles were determined in all sectors and the determined setting angle is again in the sector in which the first first measurement was carried out; j) after step i), store the time elapsed from the initial measurement in the previous sector until the new initial measurement in the starting sector in a sector time duration memory assigned to the previous sector.In addition to storage space for temporary variables in which, for example, a current angle of attack is stored, this method requires only four storage devices per sector, the sector time duration memory, the sector angle sum memory, the sector time sum memory and the sector measurement number memory in which aggregated numerical values are stored. No external references are necessary for comparison with the determined angle of attack. The computing operations frequently necessary for carrying out the method can be implemented in a simple and energy-saving manner. As a result, the method has a low complexity and is particularly well suited for implementation, for example, in microcontrollers or generally in computing devices with low storage and computing resources.In some embodiments, in the step of adding the angle of attack, the respective start angle assigned to the respective sector is subtracted from the angle of attack or, after adding all the angles of attack of a sector, the start angle multiplied by the value of the associated sector measurement number memory is subtracted from the value of the sector angle sum memory and / or, in the step of adding the time, the time which was measured in the respective sector during the first measurement is subtracted or, after adding all the times of a sector, the time which was measured in the respective sector during the first measurement multiplied by the value of the associated sector measurement number memory is subtracted from the value of the sector time sum memory.These alternatives result from the fact that the reference values, i.e. the first time or the starting angle, of each sector can be mathematically subtracted either individually from each summed value or from the respective sum, but then multiplied by the number of measurements in one step.In some embodiments, before step b), the step of measuring at least one assigned control angle (φ(t)) is carried out once and the control angle determined in this case is used for the splitting in step b) as sector start of the starting sector.Thus, the determination of the calibration values can be started immediately after a first measurement. This achieves a particularly rapid start of the method.In some embodiments, after step b), a step b.1) waiting until the determined pitch angle changes from one sector to the next, whereby this next sector is defined as a starting sector, is carried out.In this case, the division into sectors can be predetermined and stored, for example, in a read-only memory (e.g., ROM or EEPROM), so that virtually no dynamic resources are required for dividing the measurement range.In some embodiments, the method comprises the step of: k) obtaining an average angular error amount for each sector from the values stored in the sector time duration memory, the sector angular sum memory, the sector time sum memory, and the sector measurement count memory.The combination of these four values per sector only requires basic calculations and reduces the values to be stored per sector to one. This method is therefore particularly well suited for power-saving and resource-limited measuring devices.In some embodiments, the method comprises the step of after step j): l) repeating steps c), d), f), g) and h) with the proviso that the second memories associated with the starting sector are not used, but rather are associated with the starting sector.By means of the values contained in the second memory and the memory associated with the starting sector, the angular velocity selected in step a) can be estimated with little computing effort and higher accuracy.In some embodiments, the method includes the steps of: m) determining an angle offset from the average angle error amounts; n) subtracting the angle offset from each of the average angle error amounts for each sector to form a calibration value for the sector.This ensures that the calibration values have an average of 0. The arithmetic operations necessary for carrying out these method steps can also be carried out simply and with low energy consumption.The object is furthermore achieved by a method for calibrating a measuring device having an angle sensor by means of calibration values determined according to one of the preceding claims, which method has the steps: o) measuring the control angle; p) determining between the centers of which at least two sectors the measured control angle lies; q) forming a correction value from an interpolation between the calibration values which are assigned to the sectors determined in step p); r) linking the correction value to the measured control angle, in particular by addition or subtraction, in order to obtain a calibrated control angle.Interpolation between two adjacent sectors can be carried out in a computationally simple manner and with low energy consumption. The method can thus be used in measuring devices with low storage and computing resources, for example in sensor electronics.Further features and variants of the invention are evident from the attached figures, which show forms of the invention only schematically. They show in detail: FIG. 1 shows a schematic illustration of a measuring device having an angle sensor and a measuring range of the angle sensor divided into sectors; FIG. 2 shows a flow chart of a method for determining calibration values according to one embodiment of the invention; FIG. 3 is a flow diagram of a method for determining calibration values according to an embodiment of the invention; FIG. 4 shows a flow chart of a method for determining calibration values according to one embodiment of the invention, and FIG. 5 shows a flow diagram of a method for calibrating a measuring device having an angle sensor.The figures contain partly simplified schematic representations. In part, identical reference numerals are used for identical, but possibly non-identical, elements. Different views of like elements could be scaled differently. Directional indications such as, for example, "left", "right", "top" and "bottom" are to be understood with reference to the respective figure and can vary in the individual representations with respect to the object represented.A measuring device 10 shown in FIG. 1 has a device in the form of a shaft 12 which is rotatably mounted about an axis 14. An angle sensor is arranged and configured to measure a setting angle φ(t) of the shaft 12. The angle sensor has a measurement range 16 of 360° or, equivalently, 2π, which is divided into 4 sectors 18. Each of the sectors 18 has a starting angle αiand a central angle μ i where E is the number of sectors 18 and a sector number i ∈[0,1,..., E-1]. The starting angles α i are defined as α i:= i·2π / E, and the central angles μ i asThe measuring device 10 has a processing device which converts the measured setting angle φ(t) into a corrected setting angle φ corr( t) by means of calibration values.A method 100 for determining such calibration values is illustrated in FIG. 2. In a method step a), the device whose setting angle φ(t) is to be measured is set in a rotation at a constant angular speed ω. In a further method step b), a measurement range of the angle sensor, here 360°, as shown in FIG. 1, is divided into a number E of successive sectors 18, each of which has a starting angle α i.The method steps a) and b) can be carried out in any desired sequence.The start angles α i may be set in one of two ways, for example. Thus, for example, in a method step before step b), step c) can be carried out once and the angle of attack determined in this case can be used for the division in step b) as a sector start of the starting sector. This has the particular advantage that the sectors 18 are fixed with the first measurement and the first measurement can therefore already be used for the determination of the calibration values.Alternatively, the start angles α i may be related to another start point, for example a zero crossing of the angle sensor. In this case, in a method step b.1) after step b) it is then possible to wait until the ascertained control angle φ(t) changes from one sector 18 to the next, as a result of which this next sector 18 is defined as the starting sector.While the shaft 14 rotates once over the entire measurement range 16, the control angle φ(t) is measured in a method step c). In a method step d), a current sector 18 with the sector number i is then determined, in which the measured angle of attack φ(t) lies.In a method step e), it is checked whether the measurement just carried out in method step c) is a first measurement in the current sector 18. If so, the time elapsed since the first measurement in the previous sector 18 is stored in a sector time memory T i-1 associated with the previous sector.In a further method step f), the angle φ(t) minus the starting angle α i of the current sector 18 is added to a sector angle sum memory Γ i assigned to the current sector 18.In a further method step g), a time elapsed since the first execution of step c) in the current sector 18, i.e. since the first measurement of the control angle φ(t) in the current sector 18, is added to a sector time sum memory σ i assigned to the current sector 18.In a further method step h), a value stored in a sector measurement number memory L i assigned to the current sector is increased by 1.In a further method step i), steps c) to h) are repeated until setting angles φ(t) have been determined in all sectors 18 and the determined setting angle φ(t) is again in the sector in which the first initial measurement was carried out.In a further method step j), which is carried out after step i), the time elapsed from the first measurement in the previous sector until the new first measurement in the starting sector is stored in a sector time duration memory τ i-1 assigned to the previous sector.A further, extended method 101 is illustrated in FIG. 3. This additionally includes a step k) in which an average angular error amount ε i for each sector 18 is obtained from the values stored in the sector time duration memory τ i, the sector angular sum memory σ i, the sector time sum memory Γ i and the sector measurement number memory L i.The angular error amount ε i for a sector 18 having the sector number i can be calculated from the memories τ i, σ i, Γ i, L i, as well as the starting angle α i and the angular velocity ω, for example, as follows:The angular error amounts ε i can be used, for example, as calibration values for a method for calibrating the measuring device 10.Another, extended method 102 is illustrated in FIG. 4. In a method step I) which is carried out after method step j), steps c), d), f), g) and h) are repeated with the proviso that not the memories τ 0, σ 0, Γ 0, L 0, assigned to the starting sector are used, but second memories τ E, σ E, Γ E, L E. assigned to the starting sector are used.If the angular velocity ω is not known, it can be estimated from the values stored in this way, in particular on the basis of the following formula:Moreover, the method 102 can comprise, for example, the following steps: m) determining an angle offset φ b from the average angle error amounts ε i and n) subtracting the angle offset φ b from each of the average angle error amounts ε i for each sector to form a calibration value for the sector.Steps m) and n) effect normalization of the angular error amounts ε i. This normalization and in particular the calculation of the angular offset φ b depends on desired properties of the correction values. If the average total error is to be 0, then the angular offset φ b is defined as the average of the angular error amounts ε i. If, on the other hand, the extreme values of the errors are to be arranged symmetrically around 0, then the angle offset φ b is half a sum of the highest and the lowest angle error amounts ε i.The corrected angular error amount ε i, which in this case forms the calibration value, for each sector 18 is then obtained by subtracting the angular offset φ b in step n).A method 200 for calibrating the measuring device on the basis of the determined calibration values ε i as is illustrated in FIG. 5, has a method step o), in which the angle of attack φ(t) is measured. In a method step p), it is subsequently determined that the measured setting angle φ(t) lies between the centers of which at least two sectors 18. In the simplest case, two sectors 18 are identified with the numbers i and i+1. In a method step q), a correction value ε is then formed from an interpolation between the calibration values which are assigned to the sectors 18 determined in step p), for example to the sectors 18 with the numbers i and i+1. The correction value ε is weighted, for example, with the angular distance from the central angles of the sectors 18 determined in step p), or inversely weighted with the angular distance from the central angles of the two sectors 18. For the simplest case, a linear combination between the angular distances of the two central angles μ i and μ i+1, applies:Other interpolations, for example between calibration values of more than two sectors 18 and / or non-linear interpolations are conceivable depending on the application.If the correction value ε is thus known, in a method step r) the correction value ε is linked to the measured control angle φ(t), in particular by addition or subtraction, in order to obtain a calibrated control angle φ corr( t). The simplest form of this correction is to subtract φ corr( t)= φ(t)-ε.In some embodiments in which measured values of the control angles φ(t) have a shift with respect to a definition of the sectors 18, i.e. α 0 ≠ 0, a normalized control angle φ(t)-α 0 can be used for normalization instead of the control angle φ(t) in some or all of the above-mentioned method steps.In the embodiments shown here, the sectors 18 all have the same size, i.e. an angle of each of the sectors 18 can likewise have different sizes, in order, for example, to improve the accuracy of the calibration in specific angle ranges.A variety of methods are known for measuring time. In general, a number of events, for example pulses of a pulse source during the interval to be measured, is counted in order to determine a time interval. The number of pulses which the pulse source emits per selected time unit is known, for example, as frequency. The length of the time interval can then be determined from the number of counted pulses during a time interval.Thus, a time measuring device is understood to be any device which can determine a measured value or count value dependent on the expiration of the time. In some embodiments, the time measuring device has a clock generator as the pulse source, which supplies, for example, a known number of pulses per unit of time, for example, per second. These pulses can be counted, for example, by means of a counting device, wherein a count value of the counting device is a measure of the time that has elapsed since the count value was 0. In some embodiments, other events can be counted, for example the execution of one of the method steps, for example the step of measuring the angle of displacement. Thus, the time would be detected by means of the number of measurements made.The number E of sectors can be selected arbitrarily. The greater the number E, the greater the memory requirement for carrying out the method, since one memory space is required for each memory τ i, σ i, Γ i, L i of each sector. On the other hand, the greater the number E of sectors 18, the greater the achievable accuracy of calibration. The selection of the number E will thus largely require a balance between the required accuracy and the available resources for calibration.The person skilled in the art will easily recognize further embodiments which can be formed by a combination of the features mentioned above or else by a combination with further features not disclosed here, without departing from the inventive concept.The present invention makes it possible to carry out a calibration method for an angle sensor, in particular a rotational angle sensor, with only low requirements imposed on the hardware of a measuring device.List of reference characters10 Measuring device 12 Shaft 14 Axis 16 Measuring region 18 Sector 100 Method for ascertaining calibration values 101 Method for ascertaining calibration values 102 Method for ascertaining calibration values 200 Method for calibrating α i Starting angle μ i Central angle E Number of sectors φ(t) Setting angle φ corr( t) Corrected setting angle φ b Angle offset ε Correction value ε i Angle error amount, Calibration value σ i Sector time sum memory Γ i Sector setting angle sum memory τ i Sector time duration memory L i Sector measurement number memory ω Angular velocity a) to r) Method steps

Claims

Method (100, 101, 102) for determining calibration values (ε i) of a measuring device (10) comprising an angle sensor, wherein the angle sensor is configured for determining a control angle (φ(t)) of a device (12) and wherein the measuring device (10) comprises a time measuring device for measuring an elapsed time, comprising the steps of: a) rotating the device (12) at a constant angular speed (ω); b) dividing a measuring range (16) of the angle sensor into a number of successive sectors (18), wherein each of the sectors comprises a starting angle (α i) ; c) During a full sweep of the measurement area (16), repeatedly carrying out the following step for each sector (18): d) measuring at least one associated pitch (φ(t)) and a time; during or after step c): e) averaging the determined pitch (φ(t)) in a sector pitch average memory associated with the sector (18); f) averaging the determined times in a sector pitch average memory associated with the sector; g) storing a time difference between a first carrying out of step d) in each sector and the first carrying out of step d) in the next sector in a sector time memory associated with the sector (τ i); h) Determination of the calibration values (ε i) by combination of the determined values of the sector angular mean memory, of the sector mean time memory and / or of the sector time duration memory (τ i).Method (100, 101, 102) for determining calibration values (ε i) of a measuring device (10) comprising an angle sensor, wherein the angle sensor is configured for determining a control angle (φ(t)) of a device (12) and wherein the measuring device (10) comprises a time measuring device for measuring an elapsed time, comprising the steps of: a) rotating the device (12) at a constant angular speed (ω); b) dividing a measuring range (16) of the angle sensor into a number of successive sectors (18), wherein each of the sectors comprises a starting angle (α i) ; c) During a full sweep of the measurement region (16), repeatedly carrying out the following steps for each sector (18): d) measuring at least one associated pitch angle (φ(t)) and determining a time (t); e) adding the determined pitch angles (φ(t)) in a sector pitch sum memory (Γ i); f) associated with the sector (18), adding the determined time (t) in a sector time sum memory (σ i); g) associated with the sector, storing a time difference between a first carrying out of step d) in the sector and the first carrying out of step d) in the next sector in a sector time duration memory (τ i); associated with the sector; h) storing a number of steps d) performed in each sector (18) in a sector measurement number memory (L i). associated with the sector (18).Method (100, 101, 102) for determining calibration values (ε i) of a measuring device (10) having an angle sensor, wherein the angle sensor is configured to determine a setting angle (φ(t)) of a device (12), and wherein the measuring device (10) has a time measuring device for measuring an elapsed time, comprising the steps: a) rotating the device (12) at a constant angular speed (ω); b) dividing a measuring range (16) of the angle sensor into a number of successive sectors (18), wherein each of the sectors is assigned a starting angle (α i) ; c) measuring the setting angle (φ(t)) and determining a time (t); d) determining a current sector in which the setting angle (φ(t)) lies; e) If the measurement carried out in step c) is a first measurement in the current sector (18), storing the time elapsed since the first measurement in the previous sector (18) in a sector time duration memory (τ i); f) assigned to the previous sector (18), adding the angle of attack (φ(t)) to a sector angle sum memory (Γ i); g) assigned to the current sector (18), adding the time (t) to a sector time sum memory (σ i); h) assigned to the current sector (18), increasing a sector measurement number memory (L i) assigned to the current sector by 1; i) Repeating steps c) to h) until setting angles (φ(t)) have been determined in all sectors (18) and the determined setting angle (φ(t)) lies again in the sector (18) in which the first first measurement has been carried out; j) after step i), storing the time elapsed since the first measurement in the preceding sector (18) until the new first measurement in the starting sector in a sector time duration memory (τ i). assigned to the preceding sector (18).Method according to Claim 2 or 3, characterized in that, in the step of adding the angle of attack (φ(t)), the respective starting angle (α i) assigned to the respective sector (18) is subtracted from the angle of attack (φ(t)), or, after adding all the angles of attack (φ(t)) of a sector, the starting angle (α i) multiplied by the value of the associated sector measurement number memory (L i) is subtracted from the value of the sector angle sum memory (Γ i) and / or in that, in the step of adding the time (t), the time which was measured in the first measurement in the respective sector is subtracted in each case, or, after adding all the times (t) of a sector, the time is subtracted, The value of the sector time sum memory (σ i) is subtracted from the value of the sector time sum memory (σ i) which was measured in the respective sector in the first measurement multiplied by the value of the associated sector measurement number memory (L .Method according to one of Claims 2 to 4, characterized in that before step b) the step of measuring at least one associated setting angle (φ(t)) is carried out once and the setting angle (φ(t)) determined in this case is used for the splitting in step b) as the starting angle (α i) of the starting sector.Method according to one of Claims 2 to 4, characterized bythe step: b.1) After step b): waiting until the ascertained angle of attack (φ(t)) passes from one sector (18) to the next, whereby this next sector (18) is defined as a starting sector.A method according to any one of claims 2 to 6, characterized bythe steps of: k) obtaining an average angular error amount (ε i) for each sector from the values stored in the sector time duration memory (τ i), the sector angular sum memory (Γ i), the sector time sum memory (σ i) and the sector measurement number memory (L i).Method according to one of Claims 2 to 7, characterized bythe steps: I) after step j), repeating steps c), d), f), g) and h) with the proviso that the memories (τ 0, σ 0, Γ 0, L 0) assigned to the starting sector are not used, but second memories (τ E, σ E, Γ E, L E). assigned to the starting sector are used.Method according to any of claims 2 to 8, characterized bythe steps of: m) determining an angular offset (φ b) from the average angular error amounts (ε i); n), subtracting the angular offset (φ b) from each of the average angular error amounts (ε i) for each sector (18) to form a calibration value for the sector.Method (200) for calibrating a measuring device having an angle sensor by means of calibration values (ε i), determined according to one of the preceding claims, having the steps: o) measuring the control angle (φ(t)); p) determining between the central angles (μ i) which at least two sectors (18) the measured control angle (φ(t)) lies; q) forming a correction value (ε) from an interpolation between calibration values (ε i), which are associated with the sectors (18) determined in step p); r) linking the correction value (ε) to the measured control angle (φ(t)), in particular by addition or subtraction, in order to obtain a calibrated control angle (φ corr( t)).

Citation Information

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