AUTOMATIC ADDRESS ASSIGNMENT

Abstract

A method for assigning an address to an electronic device (114) is presented. The method comprises: a) Starting a test system (112) to perform a test of a circuit arrangement (110) comprising the electronic device (114); b) Implementing a communication protocol between the circuit arrangement (110) and the test system (112); c) Reading a predetermined unique identifier (UID) of the electronic device (114) using the test system (112); d) Assigning the UID to at least one property of the electronic device (114) within a lookup table (136), wherein the property is determined using the test system (112); and e) Assigning an address to the electronic device (114) using the lookup table (136). Furthermore, an electronic device (114), a circuit arrangement (110), a test system (112) and an application of the method and the devices are presented.

Description

TECHNICAL FIELD

[0001] The present disclosure relates to a method for assigning an address to an electronic device, an electronic device, a circuit arrangement, a test system and a use thereof. BACKGROUND

[0002] Groups of electronic devices, and especially networks, typically require addresses for the electronic devices to enable communication. When assigning an address to one electronic device, interference with the address of another electronic device should be avoided for the sake of clarity. This can be particularly problematic for electronic devices of the same type. Thus, predefined address ranges may typically be required. Furthermore, assigning such addresses typically requires additional connected passive components for address selection. SUMMARY

[0003] In a first aspect, a method for assigning an address to an electronic device is presented. The method comprises: a) starting a test system for performing a test of a circuit arrangement comprising the electronic device; b) Implementing a communication protocol between the circuit arrangement and the test system; c) reading a predetermined unique identifier (UID) of the electronic device using the test system; d) assigning the UID to at least one property of the electronic device within a lookup table, the property being determined using the test system; and e) Assigning an address to the electronic device using the lookup table.

[0004] In another aspect, an electronic device is presented. The electronic device has an assigned address using at least the following steps: a) starting a test system for performing a test of a circuit arrangement comprising the electronic device; b) Implementing a communication protocol between the circuit arrangement and the test system; c) reading a predetermined unique identifier (UID) of the electronic device using the test system; d) assigning the UID to at least one property of the electronic device within a lookup table, the property being determined using the test system; and e) Assigning an address to the electronic device using the lookup table.

[0005] In a further aspect, a circuit arrangement is presented. The circuit arrangement comprises at least one electronic device and at least one interface. The electronic device has an assigned address using at least the following steps: a) starting a test system for performing a test of a circuit arrangement comprising the electronic device; b) Implementing a communication protocol between the circuit arrangement and the test system; c) reading a predetermined unique identifier (UID) of the electronic device using the test system; d) assigning the UID to at least one property of the electronic device within a lookup table, the property being determined using the test system; and e) Assigning an address to the electronic device using the lookup table.

[0006] In a further aspect, a test system is presented. The test system is configured to perform a test of at least one circuit arrangement. The circuit arrangement comprises at least one electronic device and at least one interface. The test system is further configured to read a predetermined unique identifier (UID) of the electronic device. The test system is further configured to determine at least one property of the electronic device.

[0007] In a further aspect, a use of at least one of the method, the electronic device, the circuit arrangement, and the test system is presented. The intended use is an automotive application.

[0008] Those skilled in the art will recognize additional features and advantages upon reading the following detailed description and upon viewing the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0009] The present disclosure is illustrated by way of example and not limitation in the figures of the accompanying drawings, in which like reference numerals refer to similar or identical elements. The elements of the drawings are not necessarily to scale relative to one another. The features of the various illustrated examples may be combined, provided they are not mutually exclusive. Fig. 1 schematically illustrates an exemplary embodiment of a circuit arrangement in interaction with a test system according to the present disclosure; Fig. 2 illustrates a flowchart of an exemplary embodiment of a method for assigning an address to an electronic device according to the present disclosure; and Fig. 3 illustrates a diagram of an exemplary embodiment of a specific procedure for address assignment. DETAILED DESCRIPTION

[0010] In a first aspect, a method for assigning an address to an electronic device is presented. The term "electronic device," as used generally herein, is a broad term and is intended to give its ordinary and customary meaning to one of ordinary skill in the art and is not intended to be limited to any specific or customized meaning. The electronic device may be any device that uses electrical energy during operation. The electronic device may be or include at least one electronic circuit. The electronic device may include at least one electronic component. The electronic component may be connected to at least one other electronic component. Thus, the electronic device may be an assembly of at least two electronic components that are at least partially interconnected by conductive elements.As an example, the electronic components may include resistors, inductors, capacitors, diodes, and / or transistors and / or arrays thereof, such as logic gates and / or processors. As an example, the conductive elements may include wires and / or traces.

[0011] In particular, the electronic device can be or comprise at least one integrated circuit. Thus, the electronic device or at least a part of the electronic device can be arranged on at least one piece of semiconductor material, in particular silicon, silicon carbide and / or gallium nitride. Thus, the electronic device can be or comprise at least one semiconductor device. The semiconductor device can be a device comprising at least one semiconductor material, in particular silicon, silicon carbide and / or gallium nitride. In particular, the electronic device can be network compatible. Thus, the electronic device can be configured to communicate with at least one further electronic device. The electronic device can be configured to interpret and / or track at least one communication protocol.The electronic device may include at least one input / output module for transmitting and / or receiving data. As explained in more detail below, the electronic device may include at least one pin.

[0012] The term "address," as used generally herein, is a broad term and is intended to give its ordinary and customary meaning to one of ordinary skill in the art and is not intended to be limited to any specific or customized meaning. The address may be an identifier or tag configured to identify the electronic device within a group of electronic devices. In particular, the electronic device may be part of a network. The address may be a network address. The network may be an at least partially interconnected group of electronic devices of identical or different types. The address may be configured to control or direct a data transmission between electronic devices. Thus, the address may be configured to identify a source and / or destination of a data packet being transmitted.

[0013] The term "assigning," including grammatical variations thereof, as generally used herein is a broad term and is intended to give its ordinary and customary meaning to one of ordinary skill in the art and is not intended to be limited to any specific or customized meaning. Assigning may be assigning or designating a first entity to a second entity, in this case, an address to an electronic device. Assigning may be linking or connecting the first entity and the second entity, in this case, the address and the electronic device. Thus, after assignment, the address and the electronic device may be associated with each other. Assigning an address to the electronic device may enable the electronic device to communicate with other electronic devices, particularly within a network.In particular, assigning an address to the electronic device may enable other electronic devices to address the electronic device, such as when sending a data packet.

[0014] In a step a), the method comprises starting a test system for performing a test of a circuit arrangement comprising the electronic device. The term “circuit arrangement,” as generally used here, is a broad term and is intended to give its ordinary and customary meaning to the average person skilled in the art and is not intended to be limited to a specific or customer-specific meaning. The circuit arrangement can be or comprise at least one electronic circuit, in particular at least one integrated circuit. In particular, the circuit arrangement can comprise a plurality of electronic circuits. Thus, the circuit arrangement can also comprise a plurality of electronic devices. The electronic devices can be at least partially interconnected.Thus, the circuit arrangement may be an arrangement of at least two electronic devices that are at least partially interconnected by conductive elements.

[0015] The circuit assembly may be or include at least one printed circuit board (PCB). The term "printed circuit board," or "PCB" for short, as used generally herein, is a broad term and is intended to give its ordinary and customary meaning to one of ordinary skill in the art and is not intended to be limited to any specific or customized meaning. The PCB may be or include a carrier or support for at least one electronic component or electronic device. The PCB may comprise a flat plate configured to support and / or interconnect electronic components or electronic devices. Thus, the PCB may comprise at least one insulating material, such as plastic, and / or at least one conductive material, such as a metal.The conductive material can be patterned on the insulating material to form a circuit arrangement or at least a part thereof, in particular at least connections between electronic components or electronic devices. Thus, the PCB can comprise multiple conductive tracks or at least one conductive track.

[0016] The term "test," as used generally herein, is a broad term and is intended to give its ordinary and customary meaning to one of ordinary skill in the art and is not intended to be limited to any specific or customized meaning. A test may be or include a process of evaluating or analyzing a performance or quality of an entity, such as a circuit assembly or an electronic device. Thus, the test may be configured to identify or determine whether the circuit assembly is operating correctly. The test of the circuit assembly may be performed to weed out faulty circuit assembly. The test of the circuit assembly may be performed to identify and / or resolve a problem in a circuit assembly, such as a faulty electronic device, that can be replaced or repaired.Thus, the test can also be configured to identify or determine which parts of the circuitry can operate correctly and which parts of the circuitry cannot operate correctly. The test can be configured to measure and / or determine electronic parameters, such as resistance, capacitance, or inductance, to identify defects, e.g., using an electrical probe.

[0017] As stated, the circuit arrangement may comprise at least one PCB. Thus, the test may in particular be or comprise an in-circuit test (ICT). Thus, the test system may be or comprise an ICT system. The term "in-circuit test," or "ICT" for short, as generally used herein, is a broad term and is intended to give its ordinary and customary meaning to those of ordinary skill in the art and is not intended to be limited to a specific or customized meaning. The ICT may be or comprise a test of a PCB, in particular of the electronic devices of the PCB and / or the connections between the electronic devices. In the ICT, an electrical probe may test the PCB for quantities, such as short circuits or opens, that may indicate whether the PCB is correctly assembled. The ICT may be performed using an adapter, in particular a needle adapter, to contact the PCB.

[0018] The term "system," as used generally herein, is a broad term and is intended to give its ordinary and customary meaning to one of ordinary skill in the art and is not intended to be limited to any specific or customized meaning. The system may be any set of interacting or interdependent units or components that form a whole. In particular, the components may interact with each other to perform at least one common function. The components may be handled independently or may be coupled or connectable. The term "test system," as used generally herein, is a broad term and is intended to give its ordinary and customary meaning to one of ordinary skill in the art and is not intended to be limited to any specific or customized meaning.The test system may be a system configured to test an entity, such as a circuit arrangement, in which particular reference may be made to the definitions of the terms "test" and "system" above. As stated, the test system may in particular be or comprise an ICT system. The term "in-circuit test system", or "ICT system" for short, as generally used herein, is a broad term and is intended to give its ordinary and customary meaning to one of ordinary skill in the art and is not intended to be limited to any specific or customized meaning. The ICT system may be a system for performing an ICT of a PCB, in which particular reference may be made to the definitions of the terms "ICT" and "PCB" above. Testing of the circuit arrangement, in particular the PCB, may typically be required before it is used.Thus, the test system, especially the ICT system, may be required anyway before the circuit arrangement is put into operation. Therefore, by additionally using the test system for address assignment, the use of additional specific passive components for address assignment can be avoided.

[0019] Step a) may further comprise connecting the test system to an interface of the circuit arrangement using an adapter of the test system. The adapter may, in particular, be a needle adapter. Even further, step a) may comprise contacting a pin of the electronic device using the adapter, in particular the needle adapter. The term "interface," as generally used herein, is a broad term and is intended to give its ordinary and customary meaning to a person of ordinary skill in the art and is not intended to be limited to a specific or customer-specific meaning. The interface may be a boundary across which two or more entities can transfer information, such as a data packet. The interface may be a physical interface and / or a logical interface. In particular, the interface of the circuit arrangement may enable communication between the circuit arrangement and the test system.In particular, the interface can enable communication between an electronic device and the test system. Furthermore, the interface can enable communication between components of the circuit arrangement, i.e. internally within the circuit arrangement. The interface can in particular be a serial interface. However, the interface can in principle also be a parallel interface. The interface can comprise at least one pin. The interface can comprise at least one bus, in particular at least one serial bus. The bus can comprise at least one pin. The bus can comprise at least one signal line, i.e. a conductive path. The signal line can in particular be a data line. In particular, the bus can comprise a clock line and a data line. The data line can be used to transmit a data packet. The clock line can be used for synchronization.As an example, the bus can be an inter-integrated circuit (I. 2 C). However, other options may also be possible.

[0020] The term "adapter," as used generally herein, is a broad term and is intended to give its ordinary and customary meaning to one of ordinary skill in the art and is not intended to be limited to any specific or customized meaning. The adapter may be a device configured to establish an electrical connection with an object, such as a pin of an electrical device or the circuitry, in particular a bus of the circuitry interface. In particular, the adapter may be configured to establish an electrical connection between the electrical device and the test system and / or between the circuitry and the test system. Thus, the test system may be activated for electrically testing the electronic device and / or the circuitry. As stated, the adapter may in particular be a needle adapter.Thus, the adapter can comprise at least one pin, in particular a plurality of pins. A first pin can be brought into physical contact with a pin of an electronic device. A second pin can be brought into physical contact with a pin of the bus. Thus, the adapter can be connected to the interface of the circuit arrangement, in particular to a bus of the interface, to enable communication between the circuit arrangement and the test system.

[0021] In a step b), the method further comprises implementing a communication protocol between the circuit arrangement and the test system. The term “communication protocol,” as generally used here, is a broad term and is intended to give its ordinary and customary meaning to the average person skilled in the art and is not intended to be limited to a specific or customer-specific meaning. The communication protocol may be or comprise a set of rules and / or assignments that enable entities to transmit information, such as a message or a data packet, to one another. The communication protocol may, in particular, determine at least one of a format, a syntax, a semantics, a synchronization, and an error checking of messages exchanged between the entities. The entities may, in particular, comprise electronic devices, but also, for example, the test system.The entities can all agree on the communication protocol used. Multiple communication protocols can be used in parallel for different purposes, or in other words, for different aspects or functions of communication between entities. The communication protocols can be assigned to different layers, such as those defined in the Open Systems Interconnect model. Thus, the communication protocol can be a layered communication protocol and / or a standardized communication protocol. The communication protocol can be implemented in software and / or hardware.

[0022] The term "implementing," including any grammatical variations thereof, as generally used herein, is a broad term and is intended to give its ordinary and customary meaning to one of ordinary skill in the art and is not intended to be limited to any specific or customized meaning. Implementing can be an act of realizing something, making something, or bringing something into effect. Thus, the communication protocol can be implemented by programming software and / or hardware, e.g., by executing a software program in a processor or by hardware programming a field-programmable gate array. The communication protocol can be implemented by providing an infrastructure for communication, such as a hardware infrastructure, e.g., at least one interface.Thus, implementing may include providing an interface that connects the circuitry to the test system and enables the circuitry to communicate with the test system. Furthermore, implementing may include aligning or coordinating the circuitry and the system to use a common communication protocol to communicate with each other. Thus, at least one common communication protocol may be established in both the circuitry and the test protocol.

[0023] In a step c), the method further comprises reading out a predetermined unique identifier (UID) of the electronic device using the test system. The term “unique identifier,” or “UID” for short, as generally used here, is a broad term and is intended to give its ordinary and customary meaning to a person of ordinary skill in the art and is not intended to be limited to a specific or customer-specific meaning. The UID may be a tag or indicator configured to uniquely or unambiguously identify or tag an entity, in particular an electronic device. In other words, the UID may in particular be an attribute of the electronic device configured to uniquely distinguish the electronic device from other electronic devices, in particular including other electronic devices of the same type.Thus, two or more electronic devices of the same type may have different UIDs. In other words, two or more electronic devices that are identical in design may have different UIDs. The UID may be programmed on a non-volatile memory of the electronic device. The UID may be hardware-programmed on the electronic device. The UID may be derived from an assigned chip identifier (chip ID) using a predetermined algorithm. The chip ID and / or the algorithm may be determined by a manufacturer of the electronic device.

[0024] In a step d), the method further comprises assigning the UID to at least one property of the electronic device within a lookup table. The property is determined using the test system. The property may be a different property than the UID. In other words, the property may not be the UID or may be different from the UID. The property may be determined directly using the test system. In particular, the property of the electronic device may comprise a position of the electronic device in the circuit arrangement. Thus, step d) may in particular comprise assigning the UID to a position of the electronic device within a lookup table. In particular, step d) may comprise assigning the UID to a position of the electronic device in the circuit arrangement within a lookup table.As an example, the test system may test the circuitry by contacting the electronic devices included in the circuitry. When contacting an electronic device in the circuitry, the test system may also know or measure a position of the electronic device in the circuitry. As stated, in step c), the test system may read the UID of the electronic device. Thus, the test system may know the UID and position of the electronic device and may associate the UID and position in a lookup table for further processing. The test system may then store and / or forward the lookup table.

[0025] Additionally or alternatively, the property can be determined indirectly using the test system. In particular, when predetermined mounting options on a PCB are taken into account, further properties can be derived from the position, such as a type or a function of the electronic device, which can also be assigned using the UID. Thus, the property of the electronic device can comprise a function of the electronic device. Furthermore, the property of the electronic device can comprise a type number of the electronic device. The type number can also be referred to as a part number. Electronic devices of the same type, or in other words, electronic devices with an identical structure, can have the same type number. As stated, however, electronic devices of the same type can, in particular, have a different ID.Further options for the property besides the position, function or type number may also be conceivable.

[0026] The term "lookup table," as used generally herein, is a broad term and is intended to give its ordinary and customary meaning to one of ordinary skill in the art and is not intended to be limited to any specific or customized meaning. The lookup table may be a data structure that maps at least two entities. Thus, the lookup table may comprise multiple data tuples, e.g., data pairs. In particular, the lookup table may provide a link between the UID and at least one other property of the electronic device, such as a position and / or a function and / or a type number. The lookup table may be later retrievable for further processing. The lookup table may be stored, e.g., in memory, or passed to other entities, e.g., a processor, for further processing. The lookup table may be implemented as an array.Thus, associated entities can be indexed with an identical index. Other options for implementing a lookup table are possible and well known to those skilled in the art.

[0027] In a step e), the method further comprises assigning an address to the electronic device using the lookup table. In particular, step e) may comprise using the UID and / or the property of the electronic device determined using the test system to assign the address to the electronic device. Thus, step e) may in particular comprise using the UID to assign the address to the electronic device. As stated, the UID can uniquely distinguish the electronic device from other electronic devices, in particular including other electronic devices of the same type. Thus, the presented method can ensure that different electronic devices, even though they may be of the same type, can also be assigned different addresses.The circuit arrangement may comprise a plurality of electronic devices. The method may comprise assigning an individual address to each electronic device of the circuit arrangement. At least two of the electronic devices may be of the same type. The method may comprise assigning different addresses to the at least two electronic devices of the same type. In other words, different addresses may be assigned to the at least two electronic devices of the same type. This avoids interference with an address of another electronic device and establishes a clear assignment for further communication. Furthermore, predefined address ranges may also be avoided.

[0028] Throughout the present disclosure, the method steps presented may be performed in the order given. However, it should be noted that a different order may also be possible. The method may comprise further method steps not listed. Furthermore, one or more of the method steps may be performed once or repeatedly. Furthermore, two or more of the method steps may be performed simultaneously or with an overlap in time. In particular, steps a) to c) may be performed during a test of the circuit arrangement. Step d) and / or step e) may also be performed during the test. Thus, at least one of step d) and step e) may be performed at least partially using the test system. Furthermore, at least one of step d) and step e) may be performed upon initial power-up of the circuit arrangement.In other words, step d) and / or step e) may be performed after the test and not using the test system, as will also be explained in more detail below. The initial power-up of the circuit arrangement may be a first start of operation of the circuit arrangement or a restart of operation of the circuit arrangement.

[0029] The communication protocol may determine at least one set of addresses. The addresses may include already occupied addresses, i.e. addresses that cannot be further assigned, e.g. because they have already been assigned to another entity such as another electronic device. However, the addresses may in particular also include addresses that are still available and not already occupied. Thus, the set of addresses may comprise at least one set of available addresses. Step e) may include assigning the UID and / or the property of the electronic device determined using the test system to an available address. Thus, step e) may include assigning the UID and / or the property of the electronic device, e.g. a position of the electronic device, to an available address. The addresses may be stored in an address list, e.g.an array of addresses, wherein a first number of addresses may be available and a second number of addresses may be occupied. As an example, step e) may include assigning the UID and / or property to a first available address in the address list, which may then be occupied thereafter. Thus, the next UID and / or property may be assigned to the next available address in the address list.

[0030] The communication protocol may further specify at least one set of commands for communication between the circuitry and the test system. Additionally or alternatively, the communication protocol may specify a set of commands for communication within the circuitry, such as a set of commands for communication between the electronic devices and a controller of the circuitry. The set of commands may include at least one general command sent to all electronic devices included in the circuitry. The term “general command,” as used generally herein, is a broad term and is intended to give its ordinary and customary meaning to one of ordinary skill in the art and is not intended to be limited to any specific or customized meaning. The general command may be an instruction that is sent globally to all connected devices, e.g.,to all network members. Thus, the general command cannot be sent only to a selected group of devices, which may require their addresses to be known in advance. The general command cannot require confirmation from a recipient of the general command.

[0031] The general command can be a general read command or a general assignment command. Other options may also be possible. Furthermore, the general command can trigger at least one arbitration. Step c) can include sending a general read command from the test system to send the UID to the test system. The general assignment command can be sent via the interface to all electronic devices of the circuit arrangement. Thus, the test system can request all electronic devices to send their respective UIDs via the interface. Step e) can include sending a general assignment command from the test system. The general assignment command can include the UID of the electronic device and the address assigned to the electronic device. The general assignment command can be sent via the interface to all electronic devices of the circuit arrangement.Thus, each electronic device can recognize its own UID and accept the address sent with that UID. Step e) may further include confirming the assigned address through a handshake between the electronic device and the test system. Thus, the test system may be configured to assign the address to the electronic device using the lookup table.

[0032] Additionally or alternatively, the reading of the UID in step c) can be triggered by the test system detecting a predetermined logical state of the electronic device. The logical state can be determined in the communication protocol. In particular, the predetermined logical state can comprise a predetermined voltage applied to at least one pin of the electronic device. In other words, if the test system detects the predetermined voltage at the pin during the test of the circuit arrangement, the test system can read the UID of the electronic device. The predetermined voltage can be any voltage, e.g., a supply voltage or even 0 V. The predetermined voltage can also be a voltage interval, e.g., to cover voltage fluctuations in an electronic circuit. The predetermined voltage can also cause an electric current.Thus, additionally or alternatively, if the test system detects an electrical current when contacting the pin during testing of the circuit arrangement, the test system can read the UID of the electronic device.

[0033] The term "pin," as used generally herein, is a broad term and is intended to give its ordinary and customary meaning to one of ordinary skill in the art and is not intended to be limited to any specific or customized meaning. The pin may be an electrical contact of a device, such as an electronic device or the circuitry, in particular a bus of the circuitry interface. The pin may be conductive and in particular may comprise a metal accessible to an exterior of the electronic device and / or the circuitry. The pin may be configured to be contacted by at least one further entity external to the electronic device and / or the circuitry, in particular by the test system, such as using the needle adapter.Thus, the pin can enable an electrical connection and consequently signal transmission between the electronic device and the test system. Additionally or alternatively, the pin can enable an electrical connection and consequently signal transmission between the circuit arrangement and the test system.

[0034] The circuit arrangement may further comprise a controller. The term "controller," as used generally herein, is a broad term and is intended to give its ordinary and customary meaning to one of ordinary skill in the art and is not intended to be limited to any specific or customized meaning. The controller may be an entity configured to observe or regulate or operate or manage at least one further entity. The controller may be a computing device. The controller may be an electronic device. Thus, the controller may be or comprise at least one electronic circuit, in particular an integrated circuit. The controller may comprise at least one processor, e.g., a central processing unit. The controller may further comprise at least one memory.The controller may comprise at least one peripheral device, in particular an input / output module, such as a universal asynchronous receiver-transmitter. The controller may, in particular, be a microcontroller. The circuit arrangement may comprise multiple microcontrollers. The controller may, in particular, be a main microcontroller of the circuit arrangement or a central microcontroller of the circuit arrangement. However, a multi-master arrangement within the circuit arrangement may also be possible.

[0035] At least one of step d) and step e) can be performed at least partially using the controller, in particular the main microcontroller of the circuit arrangement. In particular, in step d), the assignment of the UID to the property of the electronic device, e.g., the position of the electronic device, within a lookup table can be performed using the controller. Thus, the lookup table can be provided to the controller for assigning the address to the electronic device. In particular, the lookup table can be provided to the controller by the test system. Step e) can comprise sending a general assignment command from the controller. The general assignment command can comprise the UID of the electronic device and the address assigned to the electronic device.The general assignment command can be sent to all electronic devices in the circuitry via the interface. Thus, each electronic device can recognize its own UID and accept the address sent with that UID. Step e) can further include confirming the assigned address through a handshake between the electronic device and the controller. Thus, the controller can be configured to assign the address to the electronic device using the lookup table.

[0036] The method may be at least partially computer-implemented. The term "computer-implemented," as used herein, is a broad term and is intended to give its ordinary and customary meaning to one of ordinary skill in the art and is not intended to be limited to any specific or customized meaning. In particular, the term may refer, without limitation, to a method comprising at least one computing device, e.g., a microcontroller. As indicated, the computing device may comprise at least one processor configured to at least partially perform at least one of the method steps according to the present disclosure. The method steps may be performed at least partially automatically, in particular without user interaction. Of course, however, the method steps illustrated may also be performed at least partially with user interaction.For example, a user can manually start a test system in step a). The test itself can also be at least partially controlled or guided by a user. Furthermore, the assignments in steps d) and e) can also, in principle, be supported by at least one user.

[0037] In another aspect, an electronic device is presented. The electronic device has an assigned address using at least the following steps: a) starting a test system for performing a test of a circuit arrangement comprising the electronic device; b) Implementing a communication protocol between the circuit arrangement and the test system; c) reading a predetermined unique identifier (UID) of the electronic device using the test system; d) assigning the UID to at least one property of the electronic device within a lookup table, the property being determined using the test system; and e) Assigning an address to the electronic device using the lookup table.

[0038] The address may be assigned using a method according to any of the embodiments relating to the method as disclosed above or below in more detail. As stated, the electronic device may comprise at least one pin. The pin may be configured to be contacted by an adapter of the test system. In particular, the pin may be configured to be contacted by a needle adapter of the test system. The electronic device may be network compatible. The electronic device may be a semiconductor device. The electronic device may comprise at least one electronic circuit, in particular at least one integrated circuit.For further definitions and embodiments relating to the electronic device, reference may also be made in particular to the definitions and embodiments presented with respect to the method for assigning an address to the electronic device.

[0039] In a further aspect, a circuit arrangement is presented. The circuit arrangement comprises at least one electronic device and at least one interface. The electronic device has an assigned address using at least the following steps: a) starting a test system for performing a test of a circuit arrangement comprising the electronic device; b) Implementing a communication protocol between the circuit arrangement and the test system; c) reading a predetermined unique identifier (UID) of the electronic device using the test system; d) assigning the UID to at least one property of the electronic device within a lookup table, the property being determined using the test system; and e) Assigning an address to the electronic device using the lookup table.

[0040] The address may be assigned using a method according to one of the embodiments relating to a method as disclosed in more detail above or below. The electronic device may be an electronic device according to one of the embodiments relating to an electronic device as disclosed in more detail above or below. As stated, the circuit arrangement may comprise at least one PCB. The interface may be a serial interface. The interface may comprise at least one bus, in particular at least one serial bus. The bus may comprise at least one signal line, in particular a data line. The bus may comprise a clock line and a data line. The bus may in particular comprise an I 2C. The interface can be configured to be connected to an adapter of the test system, in particular to a needle adapter. Furthermore, the electronic device can be connected to the interface of the circuit arrangement. As stated, the electronic device can comprise at least one pin. The pin can be part of the interface of the circuit arrangement. The circuit arrangement can further comprise at least one controller, in particular a main microcontroller. The controller can be connected to the interface of the circuit arrangement. The controller can be configured to assign the address to the electronic device using the lookup table. The controller can be configured to send a general assignment command to the at least one electronic device of the circuit arrangement, such as to assign the address to the electronic device.For further definitions and embodiments relating to the circuit arrangement, reference may also be made in particular to the definitions and embodiments presented with respect to the method for assigning an address to the electronic device.

[0041] In a further aspect, a test system is presented. The test system is configured to perform a test of at least one circuit arrangement. The circuit arrangement comprises at least one electronic device and at least one interface. The test system is further configured to read a predetermined unique identifier (UID) of the electronic device. The test system is further configured to determine at least one property of the electronic device.

[0042] As already stated, the property can be selected from the group consisting of: a position of the electronic device in the circuit arrangement; a function of the electronic device within the circuit arrangement; a type number of the electronic device. Further options may be possible. The electronic device may be an electronic device according to one of the embodiments relating to an electronic device as disclosed in more detail above or below. The circuit arrangement may be a circuit arrangement according to one of the embodiments relating to a circuit arrangement as disclosed in more detail above or below. In particular, the circuit arrangement may comprise at least one PCB. Thus, the test system may be an ICT system configured to perform an ICT. Furthermore, the test system may be configured to assign the UID to the property of the electronic device, e.g.the position, within a lookup table. The test system can be configured to send at least one general command to the circuit arrangement. The general command can be at least one of a general read command and a general assignment command. Other options may also be possible. The test system may comprise at least one adapter, in particular at least one needle adapter. The adapter can be configured to be connected to the interface of the circuit arrangement. The adapter can further be configured to contact the electronic device, in particular at least one pin of the electronic device. For further definitions and embodiments relating to the test system, reference may also be made in particular to the definitions and embodiments presented with regard to the method for assigning an address to the electronic device.

[0043] In a further aspect, a use of at least one of the presented method, the electronic device, the circuit arrangement, and the test system is presented. The intended use is an automotive application. In other words, the method and / or the electronic device and / or the circuit arrangement and / or the test system can be used in particular for an automotive application. Other uses may of course also be possible, as the person skilled in the art will immediately recognize. In particular, the method is a method according to one of the embodiments relating to a method as disclosed in more detail above or below. The electronic device is an electronic device according to one of the embodiments relating to an electronic device as disclosed in more detail above or below.The circuit arrangement is a circuit arrangement according to one of the embodiments relating to a circuit arrangement as disclosed in more detail above or below. The test system is a test system according to one of the embodiments relating to a test system as disclosed in more detail above or below.

[0044] The methods and devices presented here have significant advantages over the prior art, as already indicated throughout the description. As stated, they can help avoid the assignment of interfering addresses, especially for electronic devices of the same type. This can lead to reduced susceptibility to errors, such as attempting to address a specific electronic device with an address that has also been assigned to another electronic device. This can ultimately increase the operational reliability of a system that uses the electronic device or the circuitry comprising the electronic device, such as an automotive system with significant safety requirements. Consequently, the methods and devices presented can further help avoid predefined address ranges, which can lead to greater flexibility.Furthermore, by using a test system to assign addresses, which can already be used to test the circuitry prior to operation, additional components for assigning addresses may no longer be required. This can lead to reduced process complexity and ultimately reduce costs. As explained, the test system can perform multiple tasks during address assignment. Thus, the test system can also take over the work of a controller of the circuitry, in particular, a main microcontroller of the circuitry. Furthermore, as also explained, a serial interface can be used, which can lead to a reduction in the number of pins on the controller.

[0045] As used herein, the terms "have," "comprise," or "include," or any grammatical variations thereof, are used non-exclusively. Thus, these terms can refer both to a situation in which, besides the feature introduced by these terms, no other features are presupposed in the entity described in that context, and to a situation in which one or more other features are present. As an example, the expressions "A has B," "A includes B," and "A includes B" can both refer to a situation in which, besides B, no other element in A is present (i.e., a situation in which A consists solely and exclusively of B), and to a situation in which, besides B, one or more other elements are present in entity A, such as element C, elements C and D, or even other elements.

[0046] It should also be noted that the terms "at least one," "one or more," or similar expressions indicating that a feature or element may be present once or more than once are typically used only once when introducing that feature or element. In most cases, when referring to the feature or element in question, the terms "at least one" or "one or more" are not repeated, regardless of the fact that the feature or element in question may be present once or more than once.

[0047] Furthermore, as used herein, the terms "preferably," "more preferably," "particularly," "more preferably," "particularly," "more specifically," or similar terms are used in connection with optional features without limiting alternative possibilities. Thus, features introduced by these terms are optional features and are not intended to limit the scope of the claims in any way. The disclosure may be practiced using alternative features, as one skilled in the art will recognize.Likewise, features introduced by "in one embodiment of the disclosure" or similar expressions are intended to be optional features, without any limitation as to alternative embodiments of the disclosure, without any limitations as to the scope of the disclosure, and without any limitation as to the possibility of combining the features so introduced with other optional or non-optional features of the disclosure.

[0048] In summary, and without excluding other possible embodiments, the following embodiments can be considered: Embodiment 1: A method for assigning an address to an electronic device, the method comprising: a) starting a test system for performing a test of a circuit arrangement comprising the electronic device; b) Implementing a communication protocol between the circuit arrangement and the test system; c) reading a predetermined unique identifier (UID) of the electronic device using the test system; d) assigning the UID to at least one property of the electronic device within a lookup table, the property being determined using the test system; and e) Assigning an address to the electronic device using the lookup table. Embodiment 2: The method of the preceding embodiment, wherein the property of the electronic device comprises a position of the electronic device in the circuit arrangement. Embodiment 3: The method according to any one of the preceding embodiments, wherein the property of the electronic device comprises a function of the electronic device within the circuit arrangement. Embodiment 4: The method of any preceding embodiment, wherein the characteristic of the electronic device comprises a type number of the electronic device. Embodiment 5: The method according to any one of the preceding embodiments, wherein the circuit arrangement comprises a plurality of electronic devices, the method comprising assigning an individual address to each electronic device of the circuit arrangement. Embodiment 6: The method according to the preceding embodiment, wherein at least two of the electronic devices are of the same type, wherein different addresses are assigned to the at least two electronic devices of the same type. Embodiment 7: The method according to any one of the preceding embodiments, wherein the circuit arrangement comprises at least one printed circuit board (PCB), wherein the test of the circuit arrangement is an in-circuit test (ICT), wherein the test system is an ICT system, Embodiment 8: The method of any preceding embodiment, wherein the electronic device is part of a network and wherein the address is a network address. Embodiment 9: The method of any preceding embodiment, wherein the communication protocol determines at least one set of addresses. Embodiment 10: The method of the preceding embodiment, wherein the set of addresses comprises at least one set of available addresses. Embodiment 11: The method of the preceding embodiment, wherein step e) comprises assigning the UID and / or the property of the electronic device determined using the test system to an available address. Embodiment 12: The method according to any one of the preceding embodiments, wherein the communication protocol determines at least one set of commands for communication between the circuit arrangement and the test system. Embodiment 13: The method according to the preceding embodiment, wherein the set of commands comprises at least one general command that is sent to all electronic devices included in the circuitry. Embodiment 14: The method of the preceding embodiment, wherein the general command triggers at least one arbitration. Embodiment 15: The method according to any one of the preceding embodiments, wherein the reading of the UID in step c) is triggered by detecting a predetermined logical state of the electronic device with the test system. Embodiment 16: The method according to the preceding embodiment, wherein the logical state is determined in the communication protocol. Embodiment 17: The method of any of the two preceding embodiments, wherein the predetermined logic state comprises a predetermined voltage applied to at least one pin of the electronic device. Embodiment 18: The method according to any one of the preceding embodiments, wherein step c) comprises sending a general read command from the test system for sending the UID to the test system. Embodiment 19: The method according to any one of the preceding embodiments, wherein at least one of step d) and step e) is performed at least partially using the test system. Embodiment 20: The method of any preceding embodiment, wherein step e) comprises sending a general assignment command from the test system, wherein the general assignment command comprises the UID of the electronic device and the address assigned to the electronic device. Embodiment 21: The method according to the preceding embodiment, wherein step e) comprises confirming the assigned address by a handshake between the electronic device and the test system. Embodiment 22: The method according to any one of the preceding embodiments, wherein at least one of step d) and step e) is carried out at least partially using a controller, in particular a main microcontroller of the circuit arrangement. Embodiment 23: The method of the preceding embodiment, wherein the lookup table is provided to the controller for assigning the address to the electronic device. Embodiment 24: The method of any of the two preceding embodiments, wherein step e) comprises sending a general assignment command from the controller, wherein the general assignment command comprises the UID of the electronic device and the address assigned to the electronic device. Embodiment 25: The method according to any one of the three preceding embodiments, wherein step e) comprises confirming the assigned address by a handshake between the electronic device and the controller. Embodiment 26: The method according to any one of the preceding embodiments, wherein at least one of step d) and step e) is performed upon initial power-up of the circuit arrangement. Embodiment 27: The method of any preceding embodiment, wherein the UID is programmed on a non-volatile memory of the electronic device. Embodiment 28: The method of any preceding embodiment, wherein the UID is derived from an assigned chip identifier (chip ID) using a predetermined algorithm. Embodiment 29: The method according to any one of the preceding embodiments, wherein step a) comprises connecting the test system to an interface of the circuit arrangement using an adapter of the test system, in particular a needle adapter of the test system. Embodiment 30: The method according to the preceding embodiment, wherein step a) further comprises contacting a pin of the electronic device using the adapter, in particular the needle adapter. Embodiment 31: The method according to any one of the preceding embodiments, wherein the method is at least partially computer-implemented. Embodiment 32: An electronic device having an assigned address using at least the following steps: a) starting a test system for performing a test of a circuit arrangement comprising the electronic device; b) Implementing a communication protocol between the circuit arrangement and the test system; c) reading a predetermined unique identifier (UID) of the electronic device using the test system; d) assigning the UID to at least one property of the electronic device within a lookup table, the property being determined using the test system; and a) Assigning an address to the electronic device using the lookup table. Embodiment 33: The electronic device according to the preceding embodiment, wherein the address is assigned using a method according to any of the preceding method embodiments. Embodiment 34: The electronic device according to any one of the preceding embodiments relating to an electronic device, wherein the electronic device comprises at least one pin configured to be contacted by an adapter of the test system, in particular by a needle adapter of the test system. Embodiment 35: The electronic device according to any one of the preceding embodiments relating to an electronic device, wherein the electronic device is network compatible. Embodiment 36: The electronic device according to any one of the preceding embodiments relating to an electronic device, wherein the electronic device is a semiconductor device. Embodiment 37: The electronic device according to any one of the preceding embodiments relating to an electronic device, wherein the electronic device comprises at least one electronic circuit, in particular at least one integrated circuit. Embodiment 38: A circuit arrangement comprising at least one electronic device and at least one interface, wherein the electronic device is assigned an address using at least the following steps: a) starting a test system for performing a test of a circuit arrangement comprising the electronic device; b) Implementing a communication protocol between the circuit arrangement and the test system; c) reading a predetermined unique identifier (UID) of the electronic device using the test system; d) assigning the UID to at least one property of the electronic device within a lookup table, the property being determined using the test system; and a) Assigning an address to the electronic device using the lookup table. Embodiment 39: The circuit arrangement according to the preceding embodiment, wherein the address is assigned using a method according to any one of the preceding method embodiments. Embodiment 40: The circuit arrangement according to any one of the preceding embodiments relating to a circuit arrangement, wherein the electronic device is an electronic device according to any one of the preceding embodiments relating to an electronic device. Embodiment 41: The circuit arrangement according to any one of the preceding embodiments relating to a circuit arrangement, wherein the circuit arrangement comprises at least one printed circuit board (PCB). Embodiment 42: The circuit arrangement according to any one of the preceding embodiments relating to a circuit arrangement, wherein the interface is a serial interface. Embodiment 43: The circuit arrangement according to one of the preceding embodiments relating to a circuit arrangement, wherein the interface comprises at least one bus, in particular at least one serial bus. Embodiment 44: The circuit arrangement according to the preceding embodiment, wherein the bus comprises at least one signal line, in particular a data line. Embodiment 45: The circuit arrangement according to one of the preceding two embodiments, wherein the bus comprises a clock line and a data line. Embodiment 46: The circuit arrangement according to one of the preceding three embodiments, wherein the bus comprises an inter-integrated circuit (I 2 C) is. Embodiment 47: The circuit arrangement according to any one of the preceding embodiments relating to a circuit arrangement, wherein the interface is configured to be connected to an adapter of the test system, in particular to a needle adapter. Embodiment 48: The circuit arrangement according to any one of the preceding embodiments relating to a circuit arrangement, wherein the electronic device is connected to the interface of the circuit arrangement. Embodiment 49: The circuit arrangement according to any one of the preceding embodiments relating to a circuit arrangement, wherein the electronic device comprises at least one pin, wherein the pin is part of the interface of the circuit arrangement. Embodiment 50: The circuit arrangement according to one of the preceding embodiments relating to a circuit arrangement, wherein the circuit arrangement comprises at least one controller, in particular a main microcontroller. Embodiment 51: The circuit arrangement according to the preceding embodiment, wherein the controller is connected to the interface of the circuit arrangement. Embodiment 52: The circuit arrangement according to any one of the two preceding embodiments, wherein the controller is configured to assign the address to the electronic device using the lookup table. Embodiment 53: The circuit arrangement according to any one of the three preceding embodiments, wherein the controller is configured to send a general assignment command to the at least one electronic device of the circuit arrangement. Embodiment 54: A test system configured to perform a test of at least one circuit arrangement, wherein the circuit arrangement comprises at least one electronic device and at least one interface, wherein the test system is further configured to read out a predetermined unique identifier (UID) of the electronic device, wherein the test system is further configured to determine at least one property of the electronic device. Embodiment 55: The test system according to the preceding embodiment, wherein the characteristic is selected from the group consisting of: a position of the electronic device in the circuit arrangement; a function of the electronic device within the circuit arrangement; a type number of the electronic device. Embodiment 56: The test system according to any one of the preceding embodiments relating to a test system, wherein the electronic device is an electronic device according to any one of the preceding claims relating to an electronic device. Embodiment 57: The test system according to any one of the preceding embodiments relating to a test system, wherein the circuit arrangement is a circuit arrangement according to any one of the preceding claims relating to a circuit arrangement. Embodiment 58: The test system according to any one of the preceding embodiments, wherein the circuit arrangement comprises at least one printed circuit board (PCB), wherein the test system is an in-circuit test (ICT) system configured to perform an ICT. Embodiment 59: The test system of any preceding embodiment relating to a test system, wherein the test system is configured to assign the UID to the property of the electronic device within a lookup table. Embodiment 60: The test system of the preceding embodiment, wherein the test system is further configured to assign an address to the electronic device using the lookup table. Embodiment 61: The test system according to any one of the preceding embodiments relating to a test system, wherein the test system is configured to send at least one general command, in particular at least one of a general read command and a general assignment command, to the circuit arrangement. Embodiment 62: The test system according to one of the preceding embodiments relating to a test system, wherein the test system comprises at least one adapter, in particular at least one needle adapter. Embodiment 63: The test system according to the preceding embodiment, wherein the adapter is configured to be connected to the interface of the circuit arrangement. Embodiment 64: The test system according to one of the two preceding embodiments, wherein the adapter is configured to contact the electronic device, in particular at least one pin of the electronic device. Embodiment 65: A use of the method according to one of the preceding method embodiments, an electronic device according to one of the preceding embodiments relating to an electronic device, a circuit arrangement according to one of the preceding embodiments relating to a circuit arrangement and / or a test system according to one of the preceding embodiments relating to a test system, wherein the intended use is an automotive application.

[0049] Further optional features and embodiments are disclosed in more detail in the following description of embodiments, preferably in conjunction with the dependent embodiments. The respective optional features can be implemented in isolation as well as in any possible combination, as will be appreciated by those skilled in the art. The scope of the disclosure is not limited to the preferred embodiments. The embodiments are illustrated schematically in the figures. Identical reference numerals in these figures refer to identical or functionally comparable elements.

[0050] Fig. 1 schematically illustrates an exemplary embodiment of a circuit arrangement 110 in interaction with a test system 112. The circuit arrangement 110 comprises at least one electronic device 114, e.g., three electronic devices 114, as in Fig. 1. A different number may of course also be possible. In principle, the circuit arrangement 110 may also comprise only one electronic device 114. The electronic device 114 may be a semiconductor device. The electronic device 114 may comprise an electronic circuit, in particular an integrated circuit. As shown in Fig. 1, the circuit arrangement 110 may in particular comprise a plurality of electronic devices 114. The method for assigning an address to the electronic devices 114 may then in particular comprise assigning an individual address to each electronic device 114 of the circuit arrangement 110. In particular, at least two of the electronic devices 114 may be of the same type. As an example, two of the three electronic devices 114 shown in Fig. 1, be of the same type or, in other words, be identical in structure. In such a case, different addresses can be assigned to the at least two electronic devices 114 of the same type. Thus, during subsequent operation of the circuit arrangement 110, all electronic devices 114 can be individually addressable and distinguishable. This can lead to error-free operation of the circuit arrangement 110, for example, when used in an automotive application.

[0051] In addition to the electronic devices 114, the circuit arrangement 110 further comprises at least one interface 116. The interface 116 can be, in particular, a serial interface. The interface 116 can comprise at least one bus 118. The bus 118 can be, in particular, a serial bus. The bus 118 can comprise at least one signal line, in particular a data line. The bus 118 can further comprise a clock line. In particular, the bus 118 can comprise an inter-integrated circuit (I 2C). The interface 116 can be configured to connect to the test system 112 for data transmission. Thus, the interface 116 can include at least one pin 120 that can be contacted from outside the circuitry 110. Consequently, the interface 116 can be configured to connect the circuitry 110 to at least one external device, such as the test system 112. Furthermore, the interface 116 can be configured to interconnect internal devices of the circuitry 110.

[0052] The circuit arrangement 110 may further comprise at least one controller 122. The controller 122 may in particular be a microcontroller, more precisely a main microcontroller of the circuit arrangement. The controller 122 may be connected to the interface 116. The electronic devices 114 may also be connected to the interface 116. The controller 122 and / or the electronic devices 114, or at least one of them, may comprise at least one input / output module 124. The input / output module 124 may itself be a device interface and may in particular also be a serial interface. The input / output module 124 may enable a device to receive information from other devices via the interface 116 and / or to send information to other devices via the interface 116.Thus, the electronic devices 114 and the controller 122 may be interconnected via the interface 116, in particular via the bus 118. As a result, the controller 122 may be configured to control the electronic devices 114, such as sending data packets to the electronic devices 114 and / or receiving data packets from the electronic devices 114. In particular, the controller 122 may be configured to send commands to the electronic devices 114. The controller 122 may be configured to send general commands to all electronic devices 114 of the circuit arrangement 110. However, as indicated, external devices, such as the test system 112, may also be configured to do so via pin 120.

[0053] The test system 112 may include an adapter 126. The adapter 126 may, in particular, be a needle adapter. The test system 112 may further include at least one evaluation module 128. The evaluation module 128 may be configured to evaluate or analyze signals received by the adapter 126. The evaluation module 128 may be configured to at least partially control the adapter 128. The evaluation module 128 may include at least one processor or at least one microprocessor. In particular, the evaluation module 128 may include at least one central processing unit or at least one field-programmable gate array. The evaluation module 128 may be connected to the adapter 126 and optionally also to further entities included in Fig. 1. As an example, the evaluation module 128 may be part of a cloud. The adapter 126 may be configured to connect to the interface 116, such as by contacting the pin 120 with a pin. In other words, the interface 116 may be configured to connect to the adapter 126 or to be contacted by the adapter 126.

[0054] Furthermore, the electronic devices 114 can also be configured to be connected to the adapter 126 or to be contacted by the adapter 126. Thus, the electronic devices 114 can also each comprise a pin 130. The pins 130 can be configured to be contacted by external devices, such as, in particular, by the test system 112. Thus, the pins 130 can enable signal transmission to an outside of the circuit arrangement 110. In this sense, the pins 130 can also be part of the interface 116 of the circuit arrangement 110. The adapter 126 can also be configured to contact the pins 130. Thus, the adapter 126 can be configured to contact the electronic devices 114 or to be connected to the electronic devices 114 via the pins 130.

[0055] The circuit arrangement 110 may include a printed circuit board (PCB) 132. The electronic device 114, the controller 122, and the interface 116 may be arranged on the PCB 132. Thus, the test system 112 may, in particular, be an in-circuit test (ICT) system configured to perform an ICT. Thus, a test of the circuit arrangement 110 may, in particular, be an ICT. The controller 122 and the electronic devices 114 may further form a network 134 on the PCB 132. Thus, the electronic devices 114 may be part of the network 134, and the address assigned to them may be a network address. The electronic devices 114 may be network-compatible.As stated, the electronic devices 114 may, in particular, include input / output modules 124 that enable them to receive information from other devices via the interface 116 and to send information to other devices via the interface 116. In principle, entities outside the circuit arrangement 110 may also be part of the network 134. Such entities may, for example, also communicate with the circuit arrangement 110 and its components using the interface 116 and, in particular, the pin 120.

[0056] Fig. 2 illustrates a flowchart of an exemplary embodiment of a method for assigning an address to the electronic device 114. Fig. Figure 3 illustrates a diagram of an exemplary embodiment of a specific procedure for address assignment, including the use of a lookup table 136. Thus, Fig. 2 and Fig. 3 described in conjunction below. The procedure includes: a) (designated by reference numeral 138) starting the test system 112 to perform a test of the circuit arrangement 110 comprising the electronic device 114; b) (designated by reference numeral 140) implementing a communication protocol between the circuit arrangement 110 and the test system 112; c) (designated by reference numeral 142) reading a predetermined unique identifier (UID) of the electronic device 114 using the test system 112; d) (designated by reference numeral 144) assigning the UID to at least one characteristic of the electronic device 114 within the lookup table 136, the characteristic being determined using the test system 112; and e) (designated by reference numeral 146) assigning an address to the electronic device 114 using the lookup table 136.

[0057] Thus, the electronic device 114, as comprised, for example, by the circuit arrangement 110, ultimately has an address that is assigned using at least the steps mentioned above. The method steps illustrated can be performed in the specified order. However, it should be noted that a different order may also be possible. The method may comprise further method steps that are not listed. Furthermore, one or more of the method steps can be performed once or repeatedly. Furthermore, two or more of the method steps can be performed simultaneously or with a temporal overlap. In particular, steps a) to c) can be performed during a test of the circuit arrangement 110. Step d) and / or step e) can also be performed during the test.Thus, at least one of step d) and step e) can be performed at least partially using the test system 112. Furthermore, at least one of step d) and step e) can be performed upon initial power-up of the circuit arrangement 110 and / or using the controller 122. The method can be at least partially computer-implemented.

[0058] The UID may be programmed on a non-volatile memory of the electronic device 114 and / or may be derived from a chip identifier (chip ID) assigned by a manufacturer of the electronic device 114 using a predetermined algorithm. The property of the electronic device 114, as mentioned in step d), may in particular include a position of the electronic device 114 in the circuit arrangement 110. Thus, the lookup table 136 in Fig. 3 a UID assigned to a position, such as UID1 to POS1, UID2 to POS2, UID3 to POS3, etc. Additionally or alternatively, however, the property may also include a function of the electronic device 114 within the circuit arrangement 110 and / or a type number of the electronic device 114. Other options may also be possible. The position of the electronic device 114 may be determined directly during testing of the circuit arrangement 110.

[0059] As an example, and without limiting further options, the test system 112 may test the circuitry 110, such as to determine whether the circuitry is operating correctly or not. For this purpose, the adapter 126 may, among other things, contact pin 120. Thus, the test system 112 may be connected to the circuitry 110, in particular to the interface 116 and more specifically to the bus 118. By contacting pin 120 with the adapter 126, the test system 112 may be connected to the bus 118 to communicate with the electronic devices 114 and the controller 122. The communication protocol implemented between the circuitry 110 and the test system 112 may determine a set of commands for the communication. The set of commands may include at least one general command.Thus, the test system 112 can send a general read command to all electronic devices 114 of the circuitry 110, asking them for their respective UIDs. For this purpose, the controller 122 can be turned off and / or disconnected from the bus 118 so that it does not interfere. The general read command can trigger at least one arbitration. Subsequently, the electronic devices 114 can send their respective UIDs to the test system via the bus 118.

[0060] Furthermore, the adapter 126 can contact the pins 130 during testing of the circuitry 110. The reading of the UID can then be triggered by the test system 112 detecting a predetermined logical state of the electronic devices 114. The logical state can be determined in the communication protocol. In particular, the logical state can be a predetermined voltage applied to the pins 130. The test system 112 can detect the predetermined voltage and thus know that the corresponding electronic device 114 has a UID that can be read. As one example, the predetermined voltage can cause an electrical current to flow from the pin 130 to the adapter 126, which can be detected by the test system 112.Thus, when testing circuitry 110, test system 112 can know, by contacting pins 130, which electronic devices 114 have a UID to be read.

[0061] The test system 112 may further know a position of the electronic devices 114 when performing the test of the circuit assembly 110, since the test system 112 typically needs to spatially contact the electronic devices 114 during the test. Thus, the test system 112 may assign the read UID of the electronic device 114 to its position in the circuit assembly 110 within the lookup table 136. The test system 112 may also derive further properties of the electronic device 114 from its position, such as its function and / or its type number. When considering an ICT of the PCB 132, such properties may be derived, for example, by considering given mounting options on the PCB 132.Thus, the test system is configured to perform a test of the circuit arrangement 110, to read a UID of the electronic device 114, and to further determine at least one property of the electronic device 114. The property may, in particular, be at least one of a position of the electronic device 114, a function of the electronic device 114, and a type number of the electronic device 114. Other options may also be possible. The test system 112 may further be configured to assign the UID to the property within the lookup table 136.

[0062] Further, the test system 112 may be configured to assign an address to the electronic device 114 using the lookup table 136. To this end, the test system 112 may send a general assignment command to the electronic devices 114 using the bus 118. Again, the controller 122 may be turned off and / or disconnected from the bus 118 so that it does not interfere. The general assignment command may include the UID of the electronic device 114 and the address assigned to the electronic device 114. Each electronic device 114 may recognize its own UID and accept the address sent with it, which may ultimately be confirmed by a handshake between the electronic device 114 and the test system 112.

[0063] Alternatively, the generated lookup table 136 can be provided to the controller 122. For example, upon initial power-up of the circuitry 110, the controller 122 can then send a general assignment command accordingly. In this case, the test system 112 can be disconnected from the bus 118 or turned off so that it does not interfere. As before, the general assignment command can include the UID of the electronic device 114 and the address assigned to the electronic device 114. Each electronic device 114 can recognize its own UID and accept the address sent with it, which can ultimately be confirmed by a handshake between the electronic device 114 and the controller 122. Thus, the controller 122 can also be configured to send a general assignment command and assign the address to the electronic device 114 using the lookup table 136.

[0064] The address can be determined in the communication protocol. The communication protocol can generally determine a set of addresses. The set of addresses can include available addresses and already occupied addresses. As an example, the set of addresses can be in the form of an address list 148 with addresses ADDR1, ADDR2, ADDR3, etc., as in Fig.3. As an example, ADDR1 may be available, ADDR2 may be occupied, and ADDR3 may be available again. Thus, the set of addresses comprises a set of available addresses, in this case ADDR1 and ADDR3. When assigning an address to the electronic device 114 using the lookup table 136, the respective UID associated with a property of the electronic device 114, e.g., a position of the electronic device 114, may be specifically assigned to an available address, as indicated by the arrows 150. Thus, in the given example, UID1 and POS1 may be assigned to ADDR1. ADDR2 may, as stated, be occupied and therefore cannot be used for assignment. Thus, UID2 and POS2 may then be assigned to the next available address. ADDR3 may be available again. Thus, UID2 and POS2 may then be assigned to ADDR3. Other schemes may also be possible.

[0065] Although specific examples have been illustrated and described herein, it will be understood by one of ordinary skill in the art that a variety of alternative and / or equivalent implementations may be substituted for the specific examples shown and described without departing from the scope of the present disclosure. This application is intended to cover any adaptations or variations of the specific examples discussed herein. Therefore, this disclosure is intended to be limited only by the claims and their equivalents.

[0066] It should be noted that the methods and devices, including their preferred embodiments, as set forth in this document can be used independently or in combination with the other methods and devices disclosed in this document. Furthermore, the features set forth in the context of a device are also applicable to a corresponding method, and vice versa. Furthermore, all aspects of the methods and devices set forth in this document can be combined in any desired manner. In particular, the features of the claims can be combined with one another in any desired manner.

[0067] It should be noted that the description and drawings merely illustrate the principles of the proposed methods and systems. Those skilled in the art will be able to implement various arrangements that, although not expressly described or shown herein, embody the principles of the disclosure and are included within its spirit and scope. Furthermore, all examples and embodiments set forth herein are expressly intended to be illustrative only to assist the reader in understanding the principles of the proposed methods and systems. Furthermore, all statements herein that provide principles, aspects, and embodiments of the disclosure, as well as specific examples thereof, are intended to include their equivalents.

Claims

[1] A method for assigning an address to an electronic device (114), the method comprising: a) starting a test system (112) for performing a test of a circuit arrangement (110) comprising the electronic device (114); b) implementing a communication protocol between the circuit arrangement (110) and the test system (112); c) reading a predetermined unique identifier (UID) of the electronic device (114) using the test system (112); d) assigning the UID to at least one property of the electronic device (114) within a lookup table (136), the property being determined using the test system (112); and e) assigning an address to the electronic device (114) using the lookup table (136). [2] The method of the preceding claim, wherein the characteristic of the electronic device (114) comprises a position of the electronic device (114) in the circuit arrangement (110). [3] The method according to any one of the preceding claims, wherein the circuit arrangement (110) comprises a plurality of electronic devices (114), the method comprising assigning an individual address to each electronic device (114) of the circuit arrangement (110). [4] The method according to the preceding claim, wherein at least two of the electronic devices (114) are of the same type, wherein different addresses are assigned to the at least two electronic devices (114) of the same type. [5] The method according to any one of the preceding claims, wherein the circuit arrangement (114) comprises at least one printed circuit board (PCB) (132), wherein the test of the circuit arrangement (110) is an in-circuit test (ICT), wherein the test system (112) is an ICT system. [6] The method of any preceding claim, wherein the electronic device (114) is part of a network (134) and wherein the address is a network address. [7] The method of any preceding claim, wherein the communication protocol determines at least one set of addresses, the set of addresses comprising at least one set of available addresses, wherein step e) comprises assigning the UID and / or the property of the electronic device (114) determined using the test system (112) to an available address. [8] The method according to any one of the preceding claims, wherein the communication protocol determines at least one set of commands for communication between the circuitry (110) and the test system (112), the set of commands comprising at least one general command sent to all electronic devices (114) included in the circuitry (110). [9] The method according to any one of the preceding claims, wherein the reading of the UID in step c) is triggered by detecting a predetermined logical state of the electronic device (114) with the test system (112), the logical state being determined in the communication protocol. [10] The method of the preceding claim, wherein the predetermined logic state comprises a predetermined voltage applied to at least one pin (130) of the electronic device (114). [11] The method according to any one of the preceding claims, wherein at least one of step d) and step e) is performed at least partially using the test system (112). [12] The method according to any one of the preceding claims, wherein at least one of step d) and step e) is performed at least partially using a controller (122). [13] The method according to any one of the preceding claims, wherein at least one of step d) and step e) is performed upon initial power-up of the circuit arrangement (110). [14] The method according to any one of the preceding claims, wherein step a) comprises connecting the test system to an interface (116) of the circuit arrangement (110) using an adapter (126) of the test system (112), wherein step a) further comprises contacting a pin (120, 130) of the electronic device (114) using the adapter (126). [15] An electronic device (114) having an assigned address using at least the following steps: a) starting a test system (112) for performing a test of a circuit arrangement (110) comprising the electronic device (114); b) implementing a communication protocol between the circuit arrangement (110) and the test system (112); c) reading a predetermined unique identifier (UID) of the electronic device (114) using the test system (112); d) assigning the UID to at least one property of the electronic device (114) within a lookup table (136), the property being determined using the test system (112); and e) assigning an address to the electronic device (114) using the lookup table (136). [16] A circuit arrangement (110) comprising at least one electronic device (114) and at least one interface (116), wherein the electronic device (114) is assigned an address using at least the following steps: a) starting a test system (112) for performing a test of a circuit arrangement (110) comprising the electronic device (114); b) implementing a communication protocol between the circuit arrangement (110) and the test system (112); c) reading a predetermined unique identifier (UID) of the electronic device (114) using the test system (112); d) assigning the UID to at least one property of the electronic device (114) within a lookup table (136), the property being determined using the test system (112); and e) assigning an address to the electronic device (114) using the lookup table (136). [17] The circuit arrangement (110) according to the preceding claim, wherein the interface (116) is a serial interface. [18] The circuit arrangement (110) according to any one of the preceding claims relating to a circuit arrangement (110), wherein the interface (116) comprises at least one bus (118), wherein the bus (118) comprises an inter-integrated circuit (I 2 C) is. [19] A test system (112) configured to perform a test of at least one circuit arrangement (110), wherein the circuit arrangement (110) comprises at least one electronic device (114) and at least one interface (116), wherein the test system (112) is further configured to read out a predetermined unique identifier (UID) of the electronic device (114), wherein the test system (112) is further configured to determine at least one property of the electronic device (114). [20] A use of the method according to any one of the preceding method claims, an electronic device (114) according to any one of the preceding claims relating to an electronic device (114), a circuit arrangement (110) according to any one of the preceding claims relating to a circuit arrangement (110) and / or a test system (112) according to any one of the preceding claims relating to a test system (112), wherein the intended use is an automotive application.

Images