Method for operating an apparatus system

The method optimizes apparatus system operation by using a central depot with used and new devices, addressing wear and tear issues while ensuring sustainability and minimizing downtime.

DE102024130672A1Pending Publication Date: 2026-04-23ENDRESSHAUSER GRP SERVICES AG
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Patent Information

Authority / Receiving Office
DE · DE
Patent Type
Applications
Current Assignee / Owner
ENDRESSHAUSER GRP SERVICES AG
Filing Date
2024-10-22
Publication Date
2026-04-23

AI Technical Summary

Technical Problem

Existing field devices in analytical measurement technology face frequent wear and tear, unexpected failures, and high sustainability demands, necessitating frequent replacements that disrupt processes and incur high costs.

Method used

A method for operating an apparatus system that includes a central equipment depot with used and new devices, each with quality and CO2 footprint values, allowing optimized selection and installation based on quality requirements, minimizing costs and environmental impact.

Benefits of technology

Enables cost-effective and sustainable operation with minimal downtime by using used and new equipment, ensuring uninterrupted process monitoring and transparent traceability throughout the apparatus' life cycle.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention relates to a method for operating an apparatus system (100) comprising: - Providing an apparatus system (100) with a first deployment location (1) with a first quality requirement (2), a first apparatus (10) installed in the first deployment location (1), an apparatus storage facility (200) in which a second apparatus (20) with a second apparatus passport (21) and a third apparatus (30) with a third apparatus passport (31) are available and the second apparatus passport (21) includes a second quality value (22) and the third apparatus passport (31) includes a third quality value (32), wherein the second apparatus (20) is a purchased used apparatus and the third apparatus (30) is a purchased new apparatus, - Checking the first apparatus (10) for defects, - Removal of the first apparatus (10) from the first deployment location (1) in case of a defect, - Comparing the first quality requirement (2) with the second quality value (22) and the third quality value (32), - Installing the second apparatus (20) in the first deployment location (1) if the second quality value (22) meets the first quality requirement (2) or installing the third apparatus (30) in the first deployment location (1) if the second quality value (22) does not meet the first quality requirement (2) but the third quality value (32) meets the first quality requirement (2).
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Description

[0001] The invention relates to a method for operating an apparatus system.

[0002] In analytical measurement technology, particularly in water management, environmental analysis, and industrial sectors such as food technology, biotechnology, and pharmaceuticals, as well as for a wide variety of laboratory applications, field devices are used to monitor processes. Field devices are, for example, apparatus that are in contact with the process being monitored or located in its immediate vicinity. Depending on the process and environmental conditions, the apparatus is subject to wear and tear and must be replaced at regular intervals. It can also happen that the apparatus fails unexpectedly and must be replaced as quickly as possible to ensure uninterrupted process monitoring.

[0003] Due to the increasingly stringent regulations regarding the sustainability of products and their manufacturing steps, ever higher demands are also being placed on the equipment technology used in the manufacturing process of the products with regard to sustainability.

[0004] It is therefore an object of the invention to propose a method for using apparatus in analytical measurement technology in a particularly sustainable way.

[0005] This problem is solved according to the invention by a method for operating an apparatus system according to claim 1.

[0006] The method according to the invention comprises: - Providing an apparatus system with - a first deployment site with an initial quality requirement, - a first apparatus installed at the first deployment site, - an apparatus storage facility in which a second apparatus with a second apparatus pass and a third apparatus with a third apparatus pass are available, and the second apparatus pass includes a second quality value and the third apparatus pass includes a third quality value, wherein the second apparatus is a purchased used apparatus and the third apparatus is a purchased new apparatus, - Checking the first device for defects, - Removal of the first device from the first deployment site in case of a defect, - Comparing the first quality requirement with the second quality value and the third quality value, - Installing the second device at the first deployment location if the second quality value meets the first quality requirement, or installing the third device at the first deployment location if the second quality value does not meet the first quality requirement but the third quality value meets the first quality requirement.

[0007] The method according to the invention enables the operation of an apparatus system with minimal costs and maximum sustainability. Thanks to this method, an apparatus system can be supplied cost-effectively and ecologically using both used and new equipment from a central equipment depot. Production downtime due to defective sensors and waiting times for ordered new sensors are also avoided through the optimized selection of used or new equipment.

[0008] Thanks to this method, it is possible to evaluate an apparatus throughout its entire life cycle and beyond, and to provide transparent traceability of the apparatus.

[0009] According to one embodiment of the invention, the second apparatus passport includes a second apparatus lifetime and the third apparatus passport includes a third apparatus lifetime, wherein the second quality value depends on the second apparatus lifetime and the third quality value depends on the third apparatus lifetime.

[0010] According to a further embodiment of the invention, the second apparatus passport includes a second apparatus CO2 footprint value and the third apparatus passport includes a third apparatus CO2 footprint value, wherein the second quality value depends on the second apparatus CO2 footprint value and the third quality value depends on the third apparatus CO2 footprint value.

[0011] According to one embodiment of the invention, the second device passport has a second usage history, and the second quality value depends on the second usage history.

[0012] According to one embodiment of the invention, the method comprises a step of selling the defective first apparatus to a repair service and a step of repairing the first apparatus, wherein the repair includes replacing defective components, testing the first apparatus and certifying the first apparatus.

[0013] According to one embodiment of the invention, the first apparatus has a first apparatus passport with a first quality value and a first apparatus CO2 footprint value, and the first quality value depends on the first apparatus CO2 footprint value, wherein the first apparatus CO2 footprint value is updated during repairs.

[0014] According to one embodiment of the invention, one step involves purchasing the repaired first apparatus as a used apparatus for the apparatus warehouse.

[0015] According to one embodiment of the invention, the method includes a step of purchasing a new apparatus for the apparatus warehouse when the third apparatus has been installed at the first deployment site.

[0016] According to one embodiment of the invention, the second apparatus comprises the second apparatus pass as a readable second data storage and the comparison comprises a readout of the second data storage, wherein the third apparatus comprises the third apparatus pass as a readable third data storage and the comparison comprises a readout of the third data storage.

[0017] According to one embodiment of the invention, the first deployment site has a deployment site CO2 footprint value, and the deployment site CO2 footprint value is influenced by the apparatus CO2 footprint value of the apparatus used at the first deployment site.

[0018] The invention is explained in more detail with reference to the following description of figures. The figures show: - Fig. 1: a schematic representation of an apparatus system according to the invention with various apparatus.

[0019] The in Fig. The apparatus system 100 shown in Figure 1 comprises a first operating point 1 with a first quality requirement 2, a first apparatus 10 installed in the first operating point 1, and an apparatus storage area 200. Preferably, the apparatus system 100 comprises a second operating point 3 with a second quality requirement 4, wherein the second quality requirement 4 is lower than the first quality requirement 2. Naturally, the apparatus system 100 may have a plurality of further operating points with different quality requirements. These operating points could, for example, be measuring points for a sensor.

[0020] In equipment storage 200, at least one second device 20 and at least one third device 30 are available. For example, equipment storage 200 contains a large number of purchased used devices and purchased new devices. The devices are, for example, sensors such as pH sensors, conductivity sensors, flow sensors, etc. The second device 20 is a purchased used device, and the third device 30 is a purchased new device. This means that these devices were acquired commercially. The second device 20, for example, was obtained from a used device dealer 400, who, for example, overhauled the second device 20 or replaced defective components. The used device dealer guarantees that the used device is fully functional again. For example, the used device dealer issues a corresponding certificate when selling the used device.The third apparatus 30, for example, was obtained from an apparatus manufacturer 500. The second apparatus 20 and the third apparatus 30 are ready in the apparatus depot 200 to replace the first apparatus 10, which is used at the first deployment site 1 (not shown).

[0021] For example, the equipment storage area 200 has an area where defective equipment that has been removed is stored.

[0022] Each device in the device system 100 and in the device storage 200 has a device pass. The device pass is, for example, an electrical storage device that contains information. The first device 10 therefore has a first device pass 11, the second device 20 has a second device pass 21, and the third device 30 has a third device pass 31, and so on, as long as further devices are used.

[0023] Each piece of equipment has a quality rating recorded in its equipment log. This rating reflects a recommendation regarding the equipment's suitability for a particular deployment location. The quality rating depends, for example, on the equipment's expected operating time. Therefore, the first equipment log (11) contains a first quality rating of 12, the second (21) contains a second quality rating of 22, the third (31) contains a third quality rating of 32, and so on.

[0024] Preferably, the equipment passport for each piece of equipment also includes information on its service life, CO2 footprint, usage history, and / or engineering and design information. This engineering and design information facilitates faster equipment replacement, as it contains, for example, the original engineering requirements, such as specifications for the application area and applicable standards. This information allows for direct identification of whether the equipment is suitable for use in the food industry, for instance, if a specific hygiene requirement is listed as "met" in the engineering and design information. The equipment passport also includes, for example, the production date, location of use, usage time, commissioning date, a list of all error messages encountered during operation, the date of repair, and the name of the repair shop.The quality value of each device is further influenced by the device's lifespan and / or its CO2 footprint and / or its usage history.

[0025] The CO2 footprint of the device and its duration of use are particularly relevant, as this makes it possible, for example, to relativize the CO2 footprint of the device during its use at an incident site, i.e., to put the CO2 footprint of the device in relation to the duration of use.

[0026] For example, a new appliance has a CO2 footprint of 100 CO2 units and a service life of 0 days. A used appliance of the same type but repaired, for example, has a CO2 footprint of 120 CO2 units and a service life of 10 years or 3652 days. The CO2 footprint of 120 is the sum of the initial CO2 footprint of 100 CO2 units, which corresponds to the CO2 footprint for the original manufacture of the used appliance, and the CO2 footprint of 20 CO2 units caused by the repair.

[0027] If the CO2 footprint of a used and a new device is compared during operation, for example, one year after installation at a site, it quickly becomes apparent that the used device performs better: Used device = 120 / 11 = 10.9; New device = 100 / 1 = 100. It should be noted that the used device had already been in operation for 10 years, and this operating time is taken into account. This makes sense because the original CO2 footprint of 100 CO2 units required to manufacture the used device is also considered.

[0028] Therefore, it is advantageous to use a used device instead of a new one.

[0029] The first device passport 11 therefore includes a first device lifetime 13, a first device CO2 footprint value 14, and a first usage history 15. The second device passport 21 therefore includes a second device lifetime 23, a second device CO2 footprint value 24, and a second usage history 25. The third device passport 31 therefore includes a third device lifetime 33, a third device CO2 footprint value 34, and a third usage history 35. If further device passports exist for additional devices, the same applies to them.

[0030] Preferably, the device ID card is readable from each device. For example, the data storage could be a writable RFID chip. Alternatively, the device ID card could be stored as a file in cloud storage. To access the cloud storage, a QR code containing the link to the cloud storage would be displayed on the device.

[0031] Each deployment site is preferably assigned an individual deployment site CO2 footprint value. This makes it possible to quantify the deployment site's CO2 footprint during its operational lifetime. For example, if several pieces of equipment at the deployment site wear out successively during its operational lifetime, or are replaced by a new piece of equipment before a failure, the respective equipment CO2 footprint value is added to the deployment site CO2 footprint value for each piece of equipment. It is also possible, of course, to evaluate the deployment site CO2 footprint value relative to its operational lifetime.

[0032] The inventive method for operating an apparatus system 100 is described below.

[0033] First, the apparatus system 100 described above will be provided.

[0034] Then the first device 10 is checked for defects. This check is carried out regularly, for example, so that an automatic notification of a malfunction of the first device 10 is possible.

[0035] If it is detected that the first device 10 has a defect, i.e. no longer meets the first quality requirements 2 of the first deployment site 1, the first device 10 is removed from the first deployment site 1.

[0036] Next, the first quality requirement 2 of the first deployment site 1 is compared with the second quality value 22 of the second apparatus 20 and the third quality value 32 of the third apparatus 30. If further apparatuses are available in the apparatus storage facility 200, it is also possible to compare the respective quality values ​​of these apparatuses with the first quality requirement 2 of the first deployment site 1 in order to assess the suitability of the respective apparatuses for use in the first deployment site 1. If the apparatus is a sensor and the deployment site has a measuring point and the apparatus storage facility 200 contains different sensor types, then, of course, only those sensors suitable for the measuring point and the parameter to be measured there, e.g., pH or conductivity, etc., are used in the comparison.

[0037] The second apparatus 20 is then installed in the first deployment location 1 if the second quality value 22 of the second apparatus 20 corresponds to the first quality requirement 2 of the first deployment location 1.

[0038] If the second quality value 22 of the second device 20 does not meet the first quality requirement 2 of the first deployment location 1, but the third quality value 32 of the third device 30 meets the first quality requirement 2, the third device 30 is installed in the first deployment location 1. The first quality requirement 2 refers, for example, to measurement accuracy if the device is a sensor.

[0039] As explained above, the quality rating of a device also depends, for example, on its CO2 footprint. If, for instance, the CO2 footprint of a used device is lower than that of a new device, the used device might be better suited for use at the site. As mentioned above, the device's lifespan and / or usage history are also preferably taken into account when assessing its quality rating. For example, a device's usage history might preclude its use at a particular site. This is especially clear in the example where the site is a measuring point in food production and the device is a used sensor that was previously used in an unhygienic environment.

[0040] For example, if the deployment site is a non-critical measuring point, i.e., with low required measurement accuracy, as in Fig. Since the second deployment location 3 is represented by the stars (1), a used device, i.e., a used sensor, is particularly suitable here. The in Fig. The three full stars shown represent the required measurement accuracy or quality requirements. The first deployment location (1), with three full stars as the first quality requirement (2), exhibits the maximum possible measurement accuracy. The second deployment location (3), with one full star as the second quality requirement (4), exhibits a lower measurement accuracy than the first deployment location (1).

[0041] Furthermore, it is also conceivable that a used piece of equipment could be deployed at a site for a limited period, e.g., a few days, until a higher-quality piece of equipment can be obtained and installed. This is particularly relevant if, for example, a high-quality new piece of equipment can only be received and installed after a predetermined delivery time, e.g., one week. Thus, the used equipment helps to minimize disruption to the process at the site.

[0042] As an optional step, the procedure further includes selling the defective first device 10 to a repair service 300 and a step involving the repair of the first device 10. Repair service 300 is, for example, a service provider certified by the manufacturer of the device to be repaired. This means that repair service 300 has been qualified by the manufacturer. For example, repair service 300 has received training from the manufacturer to perform repairs. If repair service 300 performs a repair on device 10, a certificate is recorded in the device's logbook confirming that the repair was carried out by a certified repair service 300. If the repair is performed by a repair service 300 that is not qualified by the manufacturer, this repair is marked in the device's logbook as having been carried out by a non-certified repair service 300.Alternatively, the repair service 300 could be part of the manufacturer who originally produced the device to be repaired. Alternatively, the repair service 300 could be, for example, an intermediary.

[0043] Repair includes replacing defective components, testing the first device (10), and certifying the first device (10). Testing includes, for example, calibrating the device. Certification includes, for example, issuing an operating warranty and device quality certificate.

[0044] Preferably, the CO2 footprint value of the repaired device is updated during the repair process. For example, the CO2 footprint value is increased by the difference caused by the repair.

[0045] For example, if a device or sensor with an initial CO2 footprint value of FP1 is removed and repaired, and the repair itself results in a CO2 footprint value of FP2, then the updated CO2 footprint value for that device will be FP1+FP2. Naturally, a repair only makes sense if it requires less cost and lower CO2 emissions.

[0046] In this case of repairing the device (here, the sensor), the CO2 footprint value for the deployment site (here, the measuring point) where the repaired device is reused is naturally updated. The cumulative CO2 footprint value for the deployment site would then be FP1+FP2.

[0047] However, if the sensor at the measuring point were not repaired but replaced by a new sensor with an apparatus CO2 footprint value of FP3, the updated deployment site CO2 footprint value for this measuring point would be FP1+FP3.

[0048] Preferably, after repair by the repair service 300, a step is taken to purchase the repaired first apparatus 10 as a used apparatus for the apparatus warehouse 200.

[0049] According to an optional step, the procedure further includes the purchase of a new apparatus 30' into the apparatus storage 200 when the third apparatus 30 has been installed in the first deployment location 1.

[0050] According to an optional step, the second apparatus 20 includes the second apparatus pass 21 as a readable second data memory, and the third apparatus 30 includes the third apparatus pass 31 as a readable third data memory. In this case, the comparison involves reading the second data memory and the third data memory.

[0051] According to a step not shown, if repair of the apparatus by the repair service 300 is not possible, the apparatus can be sent to a waste management organization so that, for example, the apparatus is dismantled and the various materials are sent for material recycling. Reference symbol list 1 first deployment location 2. First quality requirement 3 second deployment location 4. Second quality requirement 10 first apparatus 11 first device pass 12 first quality value 13 first apparatus lifetime 14 first apparatus CO2 footprint value 20 second apparatus 21 second apparatus pass 22 second quality value 23 second apparatus lifespan 24 second apparatus CO2 footprint value 25 second deployment history 30 third apparatus 31 third apparatus pass 32 third quality value 33 third apparatus lifespan 34 third apparatus CO2 footprint value 35 third deployment history 100 apparatus systems 200 equipment storage 300 repair service 400 used equipment dealers 500 equipment manufacturers

Claims

[1] Method for operating an apparatus system (100) comprising: - Providing an apparatus system (100) with ◯ a first deployment site (1) with a first quality requirement (2), ◯ a first apparatus (10) installed in the first deployment site (1), ◯ an apparatus storage facility (200) in which a second apparatus (20) with a second apparatus pass (21) and a third apparatus (30) with a third apparatus pass (31) are available and the second apparatus pass (21) includes a second quality value (22) and the third apparatus pass (31) includes a third quality value (32), wherein the second apparatus (20) is a purchased used apparatus and the third apparatus (30) is a purchased new apparatus, - Checking the first apparatus (10) for defects, - Removal of the first apparatus (10) from the first deployment location (1) in case of a defect, - Comparing the first quality requirement (2) with the second quality value (22) and the third quality value (32), - Installing the second apparatus (20) in the first deployment location (1) if the second quality value (22) meets the first quality requirement (2) or installing the third apparatus (30) in the first deployment location (1) if the second quality value (22) does not meet the first quality requirement (2) but the third quality value (32) meets the first quality requirement (2). [2] Method according to claim 1, wherein the second apparatus pass (21) comprises a second apparatus lifetime (23) and the third apparatus pass (31) comprises a third apparatus lifetime (33), wherein the second quality value (22) depends on the second apparatus lifetime (23) and the third quality value (32) depends on the third apparatus lifetime (33). [3] Method according to claim 1 or 2, wherein the second apparatus passport (21) comprises a second apparatus CO2 footprint value (24) and the third apparatus passport (31) comprises a third apparatus CO2 footprint value (34), wherein the second quality value (22) depends on the second apparatus CO2 footprint value (24) and the third quality value (32) depends on the third apparatus CO2 footprint value (34). [4] Method according to one of the preceding claims, wherein the second apparatus pass (21) has a second usage history (25), and the second quality value (22) depends on the second usage history (25). [5] Method according to any of the preceding claims, wherein the method comprises a step of selling the defective first apparatus (10) to a repair service (300) and a step of repairing the first apparatus (10), wherein the repair comprises replacing defective components, testing the first apparatus (10) and certifying the first apparatus (10). [6] Method according to claim 5, wherein the first apparatus (10) has a first apparatus passport (11) with a first quality value (12) and a first apparatus CO2 footprint value (14) and the first quality value (12) depends on the first apparatus CO2 footprint value, wherein the first apparatus CO2 footprint value (12) is updated during repair. [7] Method according to claim 5 or 6, wherein a step of purchasing the repaired first apparatus (10') as a used apparatus is carried out in the apparatus warehouse (200). [8] Method according to one of the preceding claims, wherein the method comprises a step of purchasing a new apparatus (30') for the apparatus stock (200) when the third apparatus (30) has been installed in the first deployment location (1). [9] Method according to one of the preceding claims, wherein the second apparatus (20) comprises the second apparatus pass (21) as a readable second data storage and the comparison comprises a readout of the second data storage, wherein the third apparatus (30) comprises the third apparatus pass (31) as a readable third data storage and the comparison comprises a readout of the third data storage. [10] Method according to claim 3, wherein the first deployment site (1) has a deployment site CO2 footprint value and the deployment site CO2 footprint value is influenced by the apparatus CO2 footprint value of the apparatus used at the first deployment site (1).

Citation Information

Patent Citations

  • Product lifecycle sustainability score tracking and indicia

    EP2244218A1

  • Systems and methods to outsource service and support operations

    US20110251929A1

  • Supporting a Post-Installation Deployment of Components of Equipment

    US20150278772A1

  • Information handling system micro manufacturing center for reuse and recycling factoring carbon footprint

    US20240255919A1