Aberration correction device and aberration correction method

Abstract

A first multipole lens configured to generate a first 6-pole field; a second multipole lens configured to generate a second 6-pole field; a first deflector configured to generate a first deflection field; and a second deflector configured to generate a second deflection field. The first deflector is positioned at a beam cross position between the first multipole lens and the second multipole lens, and the second deflector is positioned between the first deflector and either the first or the second multipole lens.The aberration correction device returns a beam deflected by the first deflector through the second deflector, allows the beam to pass through at least one center of the first multipole lens or the second multipole lens, and accordingly corrects at least one of a 2-fold symmetric first-order astigmatism aberration (A1) or a 5-fold symmetric fourth-order astigmatism aberration (A4).

Description

Technical area

[0001] The present invention relates to an aberration correction device and an aberration correction method, and relates, for example, to a scanning transmission electron microscope incorporating the aberration correction device. State of the art

[0002] In a scanning electron microscope (SEM) or scanning transmission electron microscopy (STEM), the smaller the diameter of the electron beam (probe) used to scan a sample, the higher the resolution. The diameter of the probe is mainly limited by the third-order (C3) aberration of the spherical surface of the objective lens. However, in recent years, a device mounted with an aberration corrector to correct the aberration has been put into practice.

[0003] An aberration corrector is known as an aberration corrector equipped with two multipole lenses for generating a 6-pole field and two axially symmetric lenses arranged therebetween. For example, PTL 1 discloses that "two circular lenses with the same focal length are arranged between a first sector pole and a second sector pole at an interval twice the focal length, and further at an interval corresponding to the focal length of the circular lens from a plane passing through a center of the sector pole adjacent to each circular lens."

[0004] As described above, the C3 aberration can be corrected by the aberration corrector, but in practice, an aberration called parasitic aberration is generated due to an imperfection of the aberration corrector, in other words, a positional deviation of individual poles constituting the multipole lens, a variation in the magnetic properties of pole materials, an axial deviation of each lens, and the like.

[0005] The generated third-order or lower-order parasitic aberrations are a 2-fold symmetric first-order astigmatism aberration (A1), a 1-fold symmetric second-order coma aberration (B2), a 3-fold symmetric second-order astigmatism aberration (A2), a 2-fold symmetric third-order stellar aberration (S3), and a 4-fold symmetric third-order astigmatism aberration (A3).

[0006] Parasitic aberrations include fourth-order or higher-order aberrations. Correcting higher-order aberrations increases the aberration-free angular range (flat surface). Accordingly, both high probe current and high spatial resolution are possible. Fourth-order parasitic aberrations include 5-fold symmetric fourth-order astigmatism aberration (A4), 1-fold symmetric fourth-order coma aberration (B4), 3-fold symmetric fourth-order three-lobe aberration (D4), and the like.

[0007] Regarding a method for correcting the S3 aberration and the A3 aberration, which are the third-order parasitic principal aberration, PTL 2 discloses a method for independently correcting the secondarily generated two-fold symmetric third-order stellar aberration (S3) and the four-fold symmetric third-order astigmatic aberration (A3) by providing a spherical surface aberration corrector. PTL 2 discloses "a charged particle beam device including a spherical surface aberration corrector in which a relay lens is arranged between a first multipole lens and a second multipole lens, the charged particle beam device including: a first deflection unit configured to deflect a charged particle beam to tilt the charged particle beam entering the first multipole lens with respect to an optical axis;a second deflection unit configured to deflect the charged particle beam to shift the charged particle beam entering the second multipole lens with respect to the optical axis; a third deflection unit configured to deflect the charged particle beam to return the charged particle beam emitted from the second multipole lens to the optical axis;and a control unit configured to control the first deflection unit, the second deflection unit, and the third deflection unit, wherein the control unit supplies a control signal to the first deflection unit and the second deflection unit such that a shift amount of the charged particle beam entering the second multipole lens with respect to the optical axis changes in conjunction with an inclination angle with respect to the optical axis of the charged particle beam entering the first multipole lens, in order to correct a 2-fold symmetric third-order stellar aberration without affecting a 4-fold symmetric third-order astigmatism aberration, or to correct the 4-fold symmetric third-order astigmatism aberration without affecting the 2-fold symmetric third-order stellar aberration. Citation listPatent literature PTL 1: JP2002-510431A PTL2: JP5743698B Summary of the inventionTechnical problem

[0008] However, the current art does not provide a method for independently correcting fourth-order parasitic aberrations, such as A4 aberrations, with high accuracy. When A4 aberrations become apparent, the aberration corrector must be reassembled, which is a cause of yield reduction during manufacturing.

[0009] As a method for correcting the fourth-order or higher-order parasitic aberration, there is a method of deflecting a trajectory of an electron beam passing through the multipole lens constituting the aberration corrector, but when the higher-order aberration is corrected accordingly, a large variation of a third-order or lower-order parasitic aberration (especially the Al aberration) occurs secondarily.

[0010] As A1 aberration correction methods currently used in practice, a method of shifting an optical axis with respect to a multipole lens and a method of superimposing a 4-pole field on a multipole lens are exemplified. One problem when high-order aberration correction is performed by deflecting the trajectory of the electron beam passing through the multipole lens described above is that the method may be incompatible with the A1 correction method of shifting the optical axis with respect to the multipole lens. This is because shifting the optical axis with respect to the multipole lens to correct A1 aberration cancels the correction for high-order aberration.

[0011] Therefore, when the trajectory of the electron beam passing through the multipole lens is deflected to introduce high-order parasitic aberration, it is necessary to superimpose a 4-pole field on the multipole lens as a method for correcting the A1 aberration. To perform 4-pole field superimposition in any direction on the multipole lens, a multipole lens with 12 or more poles is generally required. This is because it is necessary to superimpose the 4-pole field and the deflection field to cancel the 6-pole field for correcting the C3 aberration and the deflection field secondarily generated when the 6-pole field is generated. Furthermore, to superimpose the multipole fields with arbitrary intensities and directions, it is necessary to control each pole independently.Therefore, a power supply corresponding to the number of poles is required, and as the number of power supplies increases, the beam deflection sensitivity increases due to noise, which causes deterioration of an image resolving power.

[0012] The invention is made to solve such a problem, and an object of the invention is to provide an aberration correction device and an aberration correction method capable of correcting the A1 aberration or the A4 aberration and improving the image quality by reducing a beam deflection sensitivity of a multipole lens. Solution to the problem

[0013] An example of an aberration correction device according to the invention is an aberration correction device that corrects an aberration of an optical system, the aberration correction device including: a first multipole lens configured to generate a first 6-pole field; a second multipole lens configured to generate a second 6-pole field; a first deflector configured to generate a first deflection field; and a second deflector configured to generate a second deflection field, wherein the first deflector is arranged at a position of a beam cross between the first multipole lens and the second multipole lens, the second deflector is arranged between the first deflector and the first multipole lens or the second multipole lens, and the aberration correction device through the second deflector returns a beam deflected by the first deflector, allows the beam to pass through at least one center of the first multipole lens or the second multipole lens, and accordingly, at least one of a 2-fold symmetric first-order astigmatism aberration (A1) or a 5-fold symmetric fourth-order astigmatism aberration (A4) is corrected.

[0014] An example of an aberration correction method according to the invention is an aberration correction method performed by a charged particle beam device including an aberration correction device that corrects an aberration of an optical system, the aberration correction device including: a first multipole lens configured to generate a first 6-pole field, a second multipole lens configured to generate a second 6-pole field, a first deflector configured to generate a first deflection field, and a second deflector configured to generate a second deflection field, wherein the first deflector is arranged at a position of a beam cross between the first multipole lens and the second multipole lens, and the second deflector is arranged between the first deflector and the first multipole lens or the second multipole lens,wherein the aberration correction method includes: Returning, by the second deflector, a beam deflected by the first deflector; Allowing the beam to pass through at least one center of the first multipole lens or the second multipole lens; and accordingly correcting at least one of a 2-fold symmetric first-order astigmatism aberration (A1) or a 5-fold symmetric fourth-order astigmatism aberration (A4). Advantageous effects of the invention

[0015] According to the aberration correction device and the aberration correction method in the invention, it is possible to achieve both corrections of A1 aberration or A4 aberration and improvement of image quality by reducing the beam deflection sensitivity of a multipole lens. Short description of the drawings [ Fig. 1] Fig. 1 is a diagram showing an example of a configuration of a scanning transmission electron microscopy to which an aberration correction device according to Embodiment 1 of the invention can be applied. [ Fig. 2] Fig. 2 is a diagram showing a configuration of the aberration correction device according to Embodiment 1. [ Fig. 3] Fig. 3 is a diagram showing a 12-pole lens constituting the aberration correcting device according to Embodiment 1. [ Fig. 4] Fig. 4 is a diagram showing excitation directions for forming a 6-pole field in the aberration correcting device according to Embodiment 1. [ Fig. 5] Fig. 5 is a diagram showing excitation directions for forming a deflection field in the aberration correcting device according to Embodiment 1. [ Fig. 6] Fig. 6 is a diagram showing an example of a ray pattern when an A1 aberration correction method is performed in the prior art using the aberration correction apparatus according to Embodiment 1. [ Fig. 7] Fig. Fig. 7 is a diagram showing a method of correcting an A1 aberration and an A4 aberration by the aberration correcting device in Fig. 2 shows. [ Fig. 8] Fig. Fig. 8 is a diagram showing a procedure for correcting the A1 aberration and the A4 aberration by the aberration correcting device in Fig. 2 shows. [ Fig. 9] Fig. Figure 9 is a diagram showing Ronchigram changes after introducing A1 aberration and after introducing A4 aberration by the aberration correction device in Fig. 2 shows. [ Fig. 10] Fig. 10 is a diagram showing a result of A4 aberration measurement performed by the aberration correction device in Fig. 2 is obtained. [ Fig. 11] Fig. 11 is a diagram showing a relationship between an excitation amount of a third multipole lens and an A4 aberration coefficient in the aberration correcting device in Fig. 2 shows. Description of embodiments

[0016] An embodiment of the invention will be described below with reference to the drawings. However, the invention should not be construed as limited to the description of the following embodiment. Those skilled in the art will readily understand that a specific configuration can be changed without departing from the concept or spirit of the invention.

[0017] The terms “first,” “second,” “third,” and the like in the present specification are used to identify the components, and the numbers and order are not necessarily limited.

[0018] In order to facilitate understanding of the invention, a position, a size, a suitability, a range, and the like of each configuration and the like shown in the drawings may not represent an actual position, size, suitability, range, and the like. Therefore, the invention is not limited to the position, size, shape, range, and the like disclosed in the drawings and the like. (Embodiment 1)<Konfiguration der Ladungsteilchenstrahlvorrichtung>

[0019] Fig. 1 is a diagram showing an example of a configuration of a charged particle beam device according to Embodiment 1 of the invention. In Embodiment 1, the charged particle beam device is a scanning transmission electron microscopy (STEM) device and may be another charged particle beam device.

[0020] The STEM device 100 includes a lens barrel 101 and a control unit 102. The lens barrel 101 includes an electron source 103 for generating an electron beam, a focusing lens group 104, an aberration corrector 105, an objective lens 106, a sample stage 107, a sample holder 108, an imaging lens group 109, an annular detector 110 for detecting electrons scattered by a sample, a transmission electron detector 111 for detecting electrons transmitted through the sample, and an imaging camera 112 for imaging a Ronchigram.

[0021] Although not shown, the control unit 102 includes an electron gun control circuit, an irradiation lens control circuit, a condenser diaphragm control circuit, an aberration corrector control circuit, a deflector control circuit, an objective lens control circuit, a camera control circuit, and the like.

[0022] The control unit 102 can detect a value of a target device via a control circuit and generates an arbitrary electron-optical condition by controlling the target device via the control circuit. The control unit 102 is an example of a control mechanism that implements the control of the lens barrel 101. <Konfiguration der Aberrationskorrekturvorrichtung>

[0023] Fig. Figure 2 is a diagram showing an example of a configuration of the aberration correction device 105 according to Embodiment 1. The aberration correction device 105 is a device that corrects aberration of an optical system. The aberration correction device 105 includes a first deflection coil 201, a first alignment lens 202, a first multipole lens 203, a first transfer lens 204, a third multipole lens 205, a second transfer lens 206, a third transfer lens 207, a second deflection coil 208, a fourth transfer lens 209, a second multipole lens 210, a third deflection coil 211, and a second alignment lens 212.

[0024] The first multipole lens 203 generates a first 6-pole field, and the second multipole lens 210 generates a second 6-pole field. The first multipole lens 203 and the second multipole lens 210 are in a conjugated relationship using the first transfer lens 204, the second transfer lens 206, the third transfer lens 207, and the fourth transfer lens 209. That is, in this configuration, since a main surface of the first multipole lens 203 is projected onto the second multipole lens 210 at a magnification of 1, it is possible to cancel a second-order astigmatism aberration (A2) and generate a third-order negative spherical surface aberration (C3) by providing a 6-pole field to the first multipole lens 203 and a 6-pole field to the second multipole lens 210 with the same intensity but in an opposite phase to that of the first multipole lens 203.

[0025] After the C3 aberration of the objective lens is corrected by the negative C3 aberration generated as described above, a fifth-order astigmatism aberration (A5) remains, except for the parasitic aberration. By providing the 6-pole field to the third multipole lens 205, located at an intermediate position between the first transfer lens 204 and the second transfer lens 206, it is possible to generate the A5 aberration and cancel the remaining A5 aberration.

[0026] Although aberrations up to the fifth order can be corrected in this way, aberrations called parasitic aberrations are generated due to positional deviation of individual poles constituting the multipole lens, variation in the magnetic properties of pole materials, axial deviation of each lens, and the like.

[0027] Parasitic aberrations include 2-fold symmetric first-order astigmatism aberration (A1), 1-fold symmetric second-order coma aberration (B2), 3-fold symmetric second-order astigmatism aberration (A2), 2-fold symmetric third-order stellar aberration (S3), 4-fold symmetric third-order astigmatism aberration (A3), 5-fold symmetric fourth-order astigmatism aberration (A4), 1-fold symmetric fourth-order coma aberration (B4), 3-fold symmetric fourth-order three-lobe aberration (D4), and the like. Correcting parasitic aberrations is important for the practical use of aberration correction devices.

[0028] The configuration of the aberration correction device 105 shown in Fig. 2 is an example and is not limited thereto. At least one optical transfer system (e.g., a transfer lens) and at least two multipoles may be provided.

[0029] With respect to an off-axis beam trajectory 213, the beam is tilted by the first transfer lens 204, forms a beam cross through the third multipole lens 205, and enters the second transfer lens 206. That is, the third multipole lens 205 is arranged at a beam cross position between the first multipole lens 203 and the second multipole lens 210. The number of beam cross positions between the first multipole lens 203 and the second multipole lens 210 is shown in the example in Fig. 2 two, and not limited thereto. The number of positions of the beam cross between the first multipole lens 203 and the second multipole lens 210 is preferably an even number.

[0030] The second deflection coil 208 is arranged between the third multipole lens 205 and the second multipole lens 210. As a modification, the second deflection coil 208 may be arranged between the third multipole lens 205 and the first multipole lens 203.

[0031] In the present embodiment, the third multipole lens 205 functions as a first deflector to generate a first deflection field (note: in the present embodiment, the third multipole lens 205 is referred to as the "first deflector" instead of the first deflection coil 201). The second deflection coil 208 functions as a second deflector to generate a second deflection field. <Konfiguration der Multipollinse>

[0032] As the multipole lens used in the aberration correcting device 105, for example, a 12-pole lens is used. Fig. Figure 3 is an example of a 12-pole lens structure. By setting the number of poles to twelve, it is possible to add 6-pole fields in two directions, thus creating a 6-pole field of any phase.

[0033] In a configuration of a 12-pole lens 300, twelve magnetic poles 304, to which a main coil 302 and a sub-coil 303 are attached, are arranged along an annular magnetic path 301. The main coil 302 is a coil for exciting a 6-pole field for generating the third-order negative spherical surface aberration, and the sub-coil 303 is a coil for generating each multipole field for canceling a deflection field, a 4-pole field, and the like, which are secondarily generated when the 6-pole field is generated. In the present embodiment, the Fig. 3 is used as the first multipole lens 203, the second multipole lens 210 and the third multipole lens 205. Generating a 6-pole field

[0034] Fig. Figure 4 shows a method for exciting the main coil to generate the 6-pole field. As in Fig. As shown in Figure 4, every second main coil 302 is connected in series. The directly connected main coils 302 have opposite polarities. By exciting these main coils 302 using a power supply 401, it is possible to generate the 6-pole fields in two directions (X-direction and Y-direction).

[0035] Amounts of currents for exciting the main coils 302 are determined, for example, as follows. Where I A and I B each an amount of current flowing through a respective one of the systems, Xhex corresponds to an intensity of the 6-pole field in the X-direction to be generated and Yhex corresponds to an intensity of the 6-pole field in the Y-direction to be generated. IA=Xhex IB=Yhex

[0036] To generate the 6-pole field in each direction using the 12-pole lens in this way, at least two independent power supplies are required. Twelve independent power supplies can be used to excite each pole independently. Generating a deflection field

[0037] When deflection fields are generated in two directions (X-direction and Y-direction) using the twelve sub-coils 303, an amount of current for exciting each sub-coil is determined, for example, as follows. Where, I n an amount of current flowing through the sub-coil in an n-o'clock direction (1 ≤ n ≤ 12), Xdef corresponds to an intensity of the deflection field in the X-direction to be generated, and Ydef corresponds to an intensity of the deflection field in the Y-direction to be generated.

[0038] If a deflection field is generated in each direction by controlling the amounts of currents flowing through the twelve sub-coils in this way, twelve independent power supplies are required. In=Xdef×cos(2π×n / 12)+Ydef×sin(2π×n / 12)

[0039] Furthermore, as in Fig. As shown in Figure 5, deflection fields can be generated in two directions (X-direction and Y-direction) using four power supplies 501 and two sets of opposing sub-coils 303. For example, four sub-coils can be excited as follows. I12=Ydef I3=Xdef I6=−Ydef I9=−Xdef

[0040] When a deflection field is generated in each direction by controlling the amounts of current flowing through the four sub-coils in this way, the control can be performed by at least two independent power supplies. When the control is performed by the two power supplies, the sub-coils in a 12 o'clock direction and a 6 o'clock direction can be connected in series with opposite polarities, and the sub-coils in a 3 o'clock direction and a 9 o'clock direction can be connected in series with opposite polarities. Generating a 4-pole field

[0041] When 4-pole fields are generated in two directions (X-direction and Y-direction) using the twelve partial coils 303, an amount of current for exciting each partial coil 303 is determined, for example, as follows. Where, I nan amount of current flowing through sub-coil 303 in the n-o'clock direction (n = 1 to 12), Xquad corresponds to the intensity of the deflection field to be generated in the X direction, and Yquad corresponds to the intensity of the deflection field to be generated in the Y direction. If the deflection field is generated in each direction by controlling the amounts of current flowing through the twelve sub-coils 303 in this way, twelve independent power supplies are required. In=Xquad×cos(4π×n / 12)+Yquad×sin(4π×n / 12) <Superposition of the multipole field>

[0042] When the 6-pole field required for aberration correction is generated by the multipole lens, not only the 6-pole field but also the deflection field and the 4-pole field are generated due to the positional deviation of individual poles forming the multipole lens and the variation in the magnetic properties of pole materials. Therefore, it is common practice to generate the 6-pole field by the main coils and cancel unnecessary deflection fields and 4-pole fields by the sub-coils.

[0043] When using twelve independent power supplies for the sub-coils as described above, the deflection fields and the 4-pole fields can be superimposed in any direction. However, when using twelve independent power supplies, the influence of noise from the power supplies increases.

[0044] If it is assumed that a beam deflection sensitivity on a sample surface by the individual poles of the multipole lens is d [pm / µA], a maximum current amount I m [A], a power supply stability s [ppm] and the number of poles is N, a total noise d N [pm] expressed by the following formula. dN=2×Im×d×s×N

[0045] Therefore, it is desirable to reduce the number of power supplies used for the sub-coils as much as possible.

[0046] If an unnecessary deflection field exists, since there is a high risk of parasitic aberration increasing from low order to high order due to tilt of a beam center axis, it is desirable to cancel the unnecessary deflection field in the multipole lens. For the unnecessary 4-pole field, since the beam center axis does not change and only the A1 aberration increases, if a correction unit other than the multipole lens can be used, the number of power supplies used for the sub-coils can be reduced to at least two. <Verfahren zum Korrigieren von A1-Aberration und A4-Aberration>

[0047] Fig. 6 is a diagram showing an example of a ray pattern when an A1 aberration correction method in the prior art, which is currently put into practical use, is performed using the aberration correction device 105 according to the present embodiment.

[0048] The beam has a center trajectory 601. In the aberration correction device 105, an optical axis runs through the centers of the individual lenses to the third transfer lens 207. The optical axis is tilted by the second deflection coil 208 and shifted relative to the second multipole lens 210. The third deflection coil 211 is adjusted so that the optical axis runs through the center of the second adjustment lens 212.

[0049] Under such trajectory control, the A1 aberration is mainly generated, but the third-order or higher-order aberration is easily generated. Accordingly, a problem with a method for correcting high-order aberration by deflecting a trajectory of an electron beam passing through the multipole lenses described above is that the method is not comparable with the method described in Fig. 6 shown A1 correction method. Because if the optical axis is shifted with respect to the multipole lens to correct the A1 aberration, as in Fig. As shown in Figure 6, the amount of correction of the corrected high-order aberration is canceled. In this case, the method for correcting the A1 aberration requires a 4-pole field superposition on the multipole lens, and as the number of power supplies increases as described above, the beam deflection sensitivity increases due to noise, causing a deterioration in image resolving power.

[0050] Fig. 7 shows an example of a ray diagram in a method for correcting A1 aberration and A4 aberration as an example of the aberration correction method according to the present embodiment. The beam has a center trajectory 701. In the aberration correction device 105 according to the present embodiment, an optical axis passes through the centers of the individual lenses up to the first transfer lens 204. The optical axis is tilted by the third multipole lens 205, onto which the deflection field is superimposed. The second deflection coil 208 is adjusted so that the optical axis passes through the center of the second multipole lens 210.

[0051] It is possible to control A1 aberration and A4 aberration primarily through such trajectory control. This method can be used as the method for correcting A1 aberration within a range where A4 aberration does not cause problems. That is, A1 aberration can be corrected. If A1 aberration is corrected by another method, A4 aberration can be corrected.

[0052] As the method for correcting the A1 aberration, it is possible to correct the A1 aberration using the method of tilting the optical axis by the second deflection coil 208 and shifting the optical axis with respect to the second multipole lens 210 as shown in Fig. 6, and it is also possible to correct the A1 aberration by the 4-pole field superposition on the multipole lens as described above. However, as the number of power supplies increases, it is desirable to correct the A1 aberration by the Fig. 6 to correct the procedure shown.

[0053] Fig. 8 shows a detailed procedure for performing the Fig. 7. In the Ronchigram image, a movement of a field of view position relative to the sample corresponds to a translational movement of the beam, and a movement of a shadow 805 of an aperture of an irradiation system corresponds to a change in a tilt component of the beam.

[0054] After a target 806 on the sample and the shadow of the aperture are aligned to a center of the camera's field of view, the shadow of the aperture and the target move when a deflection field is provided to the third multipole lens 205. A diagram 801 in which the target 806 and the shadow 805 of the aperture are aligned with the center of the camera's field of view, and a diagram 802 in which the shadow 805 of the aperture and the target 806 are moved, are shown.

[0055] The target 806 and the shadow 805 of the thus-moved aperture are returned to the center of the camera's field of view using the second deflection coil 208. The second deflection coil 208 is a deflector formed by two upper and lower stages, and the translation component and the tilt component with respect to the target 806 can be independently controlled by appropriately setting an upper and lower ratio. That is, in the aberration correction device 105 according to the present embodiment, the second deflection coil 208 includes two deflection elements (for example, an upper-stage coil and a lower-stage coil), and accordingly, the second deflection coil 208 can independently control the deflection and translation of the beam.

[0056] A diagram 803 is shown in which the shadow 805 of the aperture is moved to the center of the camera's field of view. A diagram 804 is shown in which the target 806 is further moved from a state in 803 to the center of the camera's field of view. At this time, by performing control while keeping a ratio between a size of the deflection field (for example, the excitation amount of the coil) provided to the third multipole lens 205 and the excitation amount during the return by the second deflection coil 208 constant, it is possible to perform trajectory control of the return to an axis center as shown in Fig. 7 when a deflection field of any size is provided to the third multipole lens 205.

[0057] As described above, the aberration correction device 105 according to the present embodiment returns the beam deflected by the third multipole lens 205 through the second deflection coil 208 and allows the beam to pass through the center of the second multipole lens 210. As a modification, the beam may pass through the center of the first multipole lens 203, or the beam may pass through the centers of both the first multipole lens 203 and the second multipole lens 210.

[0058] In this way, the aberration correcting device 105 according to the present embodiment corrects the A4 aberration and corrects the A1 aberration generated accordingly by the beam is deflected by the second deflection coil 208 and the optical axis is shifted with respect to the 6-pole field generated by the second multipole lens 210.

[0059] In this way, both A1 aberration and A4 aberration can be corrected.

[0060] When both the A1 aberration and the A4 aberration are corrected as in the present embodiment, the aberration can be further reduced comprehensively. Alternatively, if it is not necessary to correct both aberrations, only one of the A1 aberration and the A4 aberration can be corrected. <Tatsächliches Maschinenbestätigungsergebnis>

[0061] R1 to R4 in Fig. 9 show Ronchigrams in which the A1 aberration is introduced after deflection fields of 0.02 AT in four directions (X+ direction, X- direction, Y+ direction and Y- direction) are introduced into the third multipole lens 205 from a state in which a flat surface (aberration-free angular range) is sufficiently broadened, respectively.

[0062] The Ronchigram after introducing the deflection field in the X+ direction is R1, the Ronchigram after introducing the deflection field in the X- direction is R2, the Ronchigram after introducing the deflection field in the Y+ direction is R3 and the Ronchigram after introducing the deflection field in the Y- direction is R4.

[0063] Since the A1 aberration appears as a 2-fold symmetric figure on the Ronchigram, 180° corresponds to one period. Accordingly, if a rotation control of 180° can be performed on the Ronchigram, the A1 aberrations of all phases can be generated.

[0064] When comparing R1 and R3, R3 and R2, R2 and R4, and R4 and R1, it can be seen that R1 and R3, R3 and R2, R2 and R4, and R4 and R1 are rotated 45 degrees relative to each other. From the above, it has been confirmed in an actual machine that when the deflection field provided to the third multipole lens 205 is rotated 90 degrees, a form of A1 aberration appearing on the Ronchigram is rotated 45 degrees.

[0065] R5 to R8 in Fig. 9 show Ronchigrams in which deflection fields of 0.3 AT in the four directions (X+ direction, X- direction, Y+ direction and Y- direction) are introduced into the third multipole lens 205 from the state where the flat surface (aberration-free angular range) is sufficiently broadened, respectively, and the A4 aberration remains after the aberration is corrected up to the third order.

[0066] The Ronchigram when introducing the deflection field in the X+ direction is R5, the Ronchigram when introducing the deflection field in the X- direction is R6, the Ronchigram when introducing the deflection field in the Y+ direction is R7 and the Ronchigram when introducing the deflection field in the Y- direction is R8.

[0067] Since the A4 aberration appears as a 5-fold symmetric figure on the Ronchigram, 72° corresponds to one period. Accordingly, if a rotation control of 72° can be performed on the Ronchigram, the A4 aberrations of all phases can be generated.

[0068] When comparing R5 and R7, R7 and R6, R6 and R8, and R8 and R5, it can be seen that R5 and R7, R7 and R6, R6 and R8, and R8 and R5 are rotated by 18 degrees relative to each other. From the above, it has been confirmed in the actual machine that when the deflection field provided to the third multipole is rotated by 90°, a form of A4 aberration appearing on the Ronchigram is rotated by 18°.

[0069] Fig. 10 is a table showing an average value of an A4 aberration coefficient and an average value of a rotation angle of the A4 aberration figure when the deflection fields of 0.3 AT in the four directions (X+ direction, X- direction, Y+ direction, and Y- direction) are introduced into the third multipole lens 205 and when the deflection fields of 0.6 AT in the four directions (X+ direction, X- direction, Y+ direction, and Y- direction) are introduced into the third multipole lens 205 in a certain experiment.

[0070] Fig. 11 is a diagram showing a relationship between a coil excitation amount of the third multipole lens 205 and the A4 aberration coefficient generated accordingly in another experiment.

[0071] Out of Fig.11, it can be seen that the A4 aberration is introduced linearly into the deflection field provided to the third multipole lens 205. This tendency also applies to each of the four directions (X+ direction, X- direction, Y+ direction, and Y- direction).

[0072] As described above, according to the aberration correction device and the aberration correction method in the present embodiment, it is possible to achieve both the corrections of the A1 aberration or the A4 aberration and an improvement in image quality by reducing the beam deflection sensitivity of the multipole lens.

[0073] The invention is not limited to the above-described embodiments and includes various modifications. For example, the above-described embodiment is described in detail to facilitate understanding of the invention, and the invention is not necessarily limited to those that include all of the described configurations. A part of a configuration in each embodiment may be added to, deleted from, or replaced by another configuration. List of reference symbols 100 STEM device (charged particle beam device) 101 Lens barrel 102 Control unit 103 Electron source 104 Focusing lens group 105 Aberration correction device 106 objective lens 107 Sample table 108 sample holders 109 Image-forming lens group 110 ring-shaped detector 111 Transmission electron detector 112 imaging camera 201 first deflection coil 202 first adjustment lens 203 first multipole lens 204 first transfer lens 205 third multipole lens (first deflector) 206 second transfer lens 207 third transfer lens 208 second deflection coil (second deflector) 209 fourth transfer lens 210 second multipole lens 211 third deflection coil 212 second adjustment lens 213 Beam trajectory 300 pollen lenses 301 Magnetic Path 302 main coil 303 secondary coil 304 magnetic pole 401 Power supply 501 Power supply 601 Center trajectory 701 Center trajectory 805 Shadow of the Aperture 806 Target QUOTES CONTAINED IN THE DESCRIPTION

[0000] This list of documents submitted by the applicant was generated automatically and is included solely for the convenience of the reader. This list is not part of the German patent or utility model application. The DPMA assumes no liability for any errors or omissions. Cited patent literature

[0000] JP 2002-510431A

[0007] JP 5743698B

[0007]

Claims

[1] An aberration correction device that corrects an aberration of an optical system, the aberration correction device comprising: a first multipole lens configured to generate a first 6-pole field; a second multipole lens configured to generate a second 6-pole field; a first deflector configured to generate a first deflection field; and a second deflector configured to generate a second deflection field, wherein the first deflector is arranged at a position of a beam cross between the first multipole lens and the second multipole lens, the second deflector is arranged between the first deflector and the first multipole lens or the second multipole lens, and the aberration correction device through the second deflector returns a beam deflected by the first deflector, allows the beam to pass through at least one center of the first multipole lens or the second multipole lens, and accordingly, at least one of a 2-fold symmetric first-order astigmatism aberration (A1) or a 5-fold symmetric fourth-order astigmatism aberration (A4) is corrected. [2] The aberration correcting device according to claim 1, wherein the aberration correcting device corrects the 2-fold symmetric first-order astigmatism aberration (A1) and the 5-fold symmetric fourth-order astigmatism aberration (A4). [3] The aberration correction device according to claim 1, wherein a number of positions of the beam cross between the first multipole lens and the second multipole lens is an even number. [4] The aberration correction device according to claim 1, wherein the first deflector is a multipole lens. [5] The aberration correction device according to claim 1, wherein the second deflector includes two deflection elements and accordingly the second deflector is configured to independently control a deflection and a translation of the beam. [6] An aberration correction method performed by a charged particle beam device including an aberration correction device that corrects an aberration of an optical system, the aberration correction device including: a first multipole lens configured to generate a first 6-pole field, a second multipole lens configured to generate a second 6-pole field, a first deflector configured to generate a first deflection field, and a second deflector configured to generate a second deflection field, wherein the first deflector is arranged at a position of a beam cross between the first multipole lens and the second multipole lens, and the second deflector is arranged between the first deflector and the first multipole lens or the second multipole lens, wherein the aberration correction method comprises: Returning, by the second deflector, a beam deflected by the first deflector; Allowing the beam to pass through at least one center of the first multipole lens or the second multipole lens; and accordingly correcting at least one of a 2-fold symmetric first-order astigmatism aberration (A1) or a 5-fold symmetric fourth-order astigmatism aberration (A4). [7] The aberration correction method according to claim 6, wherein the aberration correction device corrects the 2-fold symmetric first-order astigmatism aberration (A1) and the 5-fold symmetric fourth-order astigmatism aberration (A4). [8] The aberration correction method according to claim 6, wherein a number of positions of the beam cross between the first multipole lens and the second multipole lens is an even number. [9] An aberration correction method according to claim 7, wherein the aberration correction device corrects the 2-fold symmetric first-order astigmatism aberration (A1) produced by correcting the 5-fold symmetric fourth-order astigmatism aberration (A4) by the beam is deflected by the second deflector, and an optical axis is shifted with respect to the second 6-pole field.

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