Chip accumulation area detection device, chip accumulation area detection method and chip removal device
The chip accumulation area detection device uses machining information and optional visibility determination to accurately identify chip accumulation areas, enhancing detection precision and facilitating effective chip removal.
Patent Information
- Authority / Receiving Office
- DE · DE
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2023-07-26
- Publication Date
- 2026-04-02
AI Technical Summary
Existing chip accumulation area detection devices fail to accurately identify chip accumulation areas due to poor visibility during machining, particularly when smoke or haze obstructs video monitoring.
A chip accumulation area detection device that utilizes machining information, including material, process, and tool information, to determine chip accumulation areas, and optionally incorporates a visibility determination unit and learning models to enhance detection accuracy.
Enables accurate identification of chip accumulation areas regardless of visibility conditions, improving detection precision and enabling effective chip removal through targeted cleaning fluid injection.
Smart Images

Figure 00000000_0000_ABST
Abstract
Description
TECHNICAL AREA
[0001] The present disclosure relates to a chip accumulation area detection device, a chip accumulation area detection method and a chip removal device. BACKGROUND ON THE STATE OF THE TECHNOLOGY
[0002] There are chip accumulation area detection devices to determine a chip accumulation area, which is an area where chips produced by a workpiece accumulate when a machine machine processes the workpiece.
[0003] For example, patent literature 1 discloses a machine tool system with a scattering direction calculation unit as such a chip accumulation area determination device.
[0004] The scatter direction calculation unit acquires a video recording from a camera, depicting a state in which a machine is processing the workpiece. The scatter direction calculation unit identifies a chip accumulation area by calculating the scatter directions of the chips based on the recorded video. LIST OF CITED PUBLICATION LITERATURE
[0005] Patent Literature 1: JP 2021-94624 A SUMMARY OF THE INVENTIONAL PROBLEM
[0006] The machine tool system disclosed in patent literature 1 may, in some cases, fail to detect the chips produced by a workpiece, even though the scatter direction calculation unit is monitoring a recorded video depicting the machine working on the workpiece. For example, poor visibility may result from smoke generated during machining, and although the scatter direction calculation unit is monitoring a recorded video, chips may not be detected in some cases due to this poor visibility. Thus, the problem arises that the scatter direction calculation unit cannot identify a chip accumulation area, even while monitoring a recorded video, unless chips can be detected.
[0007] The present disclosure serves to solve the problem described above, and one of its objectives is to realize a chip accumulation area detection device that can determine a chip accumulation area, which is an area in which chip material accumulates, regardless of whether visibility is poor or not. SOLUTION TO THE PROBLEM
[0008] A chip accumulation area determination device according to the present disclosure comprises: a machining information acquisition unit for acquiring machining information, including information representing a material of a machining object to be machined by a machine tool, information representing a machining process used by the machine tool for the machining object, and information representing a tool used by the machine tool for machining the machining object; a chip accumulation area determination unit for determining a chip accumulation area, which is an area in which chips produced by the machining object accumulate when the machine tool machines the machining object, based on the machining information acquired by the machining information acquisition unit. ADVANTAGEOUS EFFECTS OF THE INVENTION
[0009] According to the present disclosure, it is possible to identify a chip accumulation area regardless of whether visibility is good or bad. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a configuration representation which represents a chip removal device comprising a chip accumulation area detection device, 2 according to a first embodiment. Fig. Figure 2 is a hardware configuration representation, which depicts the hardware of the chip accumulation area detection device 2 according to the first embodiment. Fig. 3 is a hardware configuration representation of a computer in the case where the chip accumulation area detection device 2 is implemented by software, firmware or the like. Fig. Figure 4 is a perspective view, which shows an example of a working machine. Fig. Figure 5 is a flow chart illustrating a chip accumulation area determination procedure, which is a processing operation carried out by the chip accumulation area determination device 2. Fig. Figure 6 is a configuration representation which depicts a chip removal device comprising a chip accumulation area detection device 2, according to a second embodiment. Fig. Figure 7 is a hardware configuration representation, which depicts the hardware of the chip accumulation area detection device 2 according to the second embodiment. Fig. Figure 8 is a flowchart illustrating a chip accumulation area determination procedure, which is a processing operation carried out by the chip accumulation area determination device 2. Fig. Figure 9 is a configuration representation which depicts a chip removal device comprising a chip accumulation area detection device 2, according to a third embodiment. Fig. Figure 10 is a hardware configuration representation, which depicts the hardware of the chip accumulation area detection device 2 according to the third embodiment. Fig. Figure 11 is a flow chart illustrating a chip accumulation area determination procedure, which is a processing operation carried out by the chip accumulation area determination device 2. DESCRIPTION OF THE EXECUTION FORMS
[0010] The following sections, with reference to the attached figures, explain ways of implementing the present revelation in order to further clarify the present revelation. First embodiment. Fig. 1 is a configuration representation which represents a chip removal device comprising a chip accumulation area detection device, 2 according to a first embodiment. Fig. Figure 2 is a hardware configuration representation, which depicts the hardware of the chip accumulation area detection device 2 according to the first embodiment.
[0011] The in Fig. The chip removal device shown in Figure 1 comprises a learning model 1, the chip accumulation area detection device 2 and a cleaning fluid injection unit 40.
[0012] The in Fig. The chip removal device shown in Figure 1 includes the learning model 1. However, this is only an example, and the learning model 1 can also be arranged outside the chip removal device.
[0013] The first learning model 1 is implemented, for example, by a neural network.
[0014] At the time of learning, processing information and training data are passed to learning model 1. The processing information includes processing information, containing any of the following: information relating to the materials of a processing object to be processed by a machine 50 (see Fig. 4) represent information that represents a machining process used by the machine for the workpiece 50, and information that represents a tool used by the machine to machine the workpiece 50.
[0015] This means that the machining information can contain any of the information representing the materials of the machining objects 50, the information representing the machining processes used by the machine, and the information representing the tools, or any two of these. Furthermore, the machining information can contain all of the information representing the materials of the machining objects 50, the information representing the machining processes used by the machine, and the information representing the tools.
[0016] The training data is information that represents chip accumulation areas, which are the areas where chips generated by a machining object accumulate when the machine machine processes the machining objects.
[0017] If the machining information and training data are provided at the time of learning, the learning model 1 learns the chip accumulation areas that correspond to the machining information.
[0018] If machining information is given at the time of inference, the learning model 1 outputs information representing a chip accumulation area that corresponds to the machining information.
[0019] In the Fig. In the chip removal device shown in Figure 1, the learning model 1 is located outside the chip accumulation area detection device 2. However, this is only an example, and the learning model 1 can also be located inside the chip accumulation area detection device 2.
[0020] The chip accumulation area detection device 2 comprises a processing information acquisition unit 11 and a chip accumulation area detection unit 12.
[0021] The processing information acquisition unit 11 is, for example, characterized by a Fig. 2. Processing information acquisition unit 21, as shown, is implemented.
[0022] The processing information acquisition unit 11 acquires processing information, including information that represents material of a processing object to be processed by a working machine.
[0023] The processing information acquisition unit 11 outputs the processing information to the chip collection area determination unit 12.
[0024] Machining Information Acquisition Unit 11 acquires machining information here, including information representing the material of a workpiece to be machined by a machine tool. However, this is only an example. If, for instance, machining information, including information representing the materials of workpieces and information representing the machining procedures used by a machine tool, as well as training data, were passed to Learning Model 1 at the time of learning, and it has learned chip accumulation areas corresponding to the machining information, then Machining Information Acquisition Unit 11 acquires machining information, including information representing the material of a workpiece and information representing a machining procedure used by the machine tool.
[0025] Furthermore, if, for example, at the time of learning, processing information, including information representing the materials of processing objects and information representing tools, as well as training data, was passed to learning model 1, and it has learned chip accumulation areas corresponding to the processing information, the processing information acquisition unit 11 acquires processing information, including information representing a material of a processing object and information representing a tool.
[0026] If, for example, at the time of learning, processing information, including information representing the materials of machined objects, information representing the machining procedures used by a machine, and information representing tools, as well as training data, were passed to learning model 1, and it has learned chip accumulation areas corresponding to the processing information, then the processing information acquisition unit 11 acquires processing information, including information representing a material of a machined object, information representing a machining procedure used by the machine, and information representing a tool.
[0027] The chip accumulation area determination unit 12 is, for example, defined by a Fig. The chip accumulation area detection circuit 22 shown is implemented.
[0028] The chip collection area determination unit 12 acquires the processing information from the processing information acquisition unit 11.
[0029] Based on the processing information, the chip accumulation area determination unit 12 determines a chip accumulation area, which is an area in which the chips produced by the workpiece accumulate when the machine processes the workpiece.
[0030] Specifically, the chip accumulation area determination unit 12 passes on the processing information acquired by the processing information acquisition unit 11 to the learning model 1, and acquires information from the learning model 1 that represents the chip accumulation area according to the processing information acquired by the processing information acquisition unit 11.
[0031] The chip accumulation area detection unit 12 outputs the information representing the chip accumulation area to the cleaning fluid injection unit 40.
[0032] In the chip accumulation area detection device 2, shown in Fig. 1, the chip accumulation area determination unit 12 passes processing information to the learning model 1 and acquires information from the learning model 1 that indicates a chip accumulation area according to the processing information. However, this is only an example, and the chip accumulation area determination unit 12 can, for example, acquire information representing a chip accumulation area from processing information based on rules.
[0033] The cleaning fluid injection unit 40 acquires the information representing the chip accumulation area from the chip accumulation area detection unit 12.
[0034] The cleaning fluid injection unit 40 injects a cleaning fluid to flush away chips that have accumulated in the chip accumulation area determined by the chip accumulation area detection unit.
[0035] In Fig. 1 It is assumed that the processing information acquisition unit 11 and the chip accumulation area detection unit 12, which are components of the chip accumulation area detection device 2, are each implemented by special hardware, as shown in Fig. 2 shown. That is, it is assumed that the chip accumulation area detection device 2 is implemented by the processing information acquisition circuit 21 and the chip accumulation area detection circuit 22.
[0036] Each of the processing information acquisition circuit 21 and the chip accumulation area detection circuit 22 is, for example, a single circuit, a composite circuit, a programmed processor, a parallel programmed processor, an application-specific integrated circuit (ASIC), or a field-programmable gate array (FPGA), or a combination thereof.
[0037] The components of the chip accumulation area detection device 2 are not necessarily implemented by dedicated hardware, but the chip accumulation area detection device 2 can also be implemented by software, firmware or a combination of software and firmware.
[0038] The software or firmware is stored in a computer's main memory in the form of a program. The computer refers to the hardware that executes programs and is, for example, a central processing unit (CPU), a graphics processing unit (GPU), a central processor, a processing device, an arithmetic operation device, a microprocessor, a microcomputer, a processor, or a digital signal processor (DSP).
[0039] Fig. 3 is a hardware configuration representation of a computer in the case where the chip accumulation area detection device 2 is implemented by software, firmware or the like.
[0040] In a case where the chip accumulation area detection device 2 is implemented by software, firmware, or the like, a program that causes the computer to execute each processing operation performed in the machining information acquisition unit 11 and the chip accumulation area detection unit 12 is stored in a working memory 31. Then, a processor 32 of the computer executes the programs stored in the working memory 31.
[0041] Furthermore, it illustrates Fig. 2 an example in which each of the components of the chip accumulation area detection device 2 is implemented by dedicated hardware, and Fig. Figure 3 illustrates an example in which the chip accumulation area detection device 2 is implemented by software, firmware, or the like. However, these are only examples, and some of the components of the chip accumulation area detection device 2 may be implemented by dedicated hardware, and the remaining components may be implemented by software, firmware, or the like.
[0042] Fig. Figure 4 is a perspective view, which shows an example of a working machine.
[0043] The in Fig. 4 The machine shown comprises a table 51 on which a workpiece 50 is mounted, and a spindle 52 to which a tool for machining the workpiece 50 is attached.
[0044] As in Fig. As shown in Figure 4, the machine is covered by a cover 54. Chips produced by the machine during the machining of the workpiece 50 accumulate in a chip accumulation area 56.
[0045] In the example in Fig. 4. The chip accumulation area 56 is an area surrounded by a dashed line. The chip accumulation area 56 changes depending on the material of the workpiece 50, a machining method used by the machine tool for the workpiece 50, or the tool used by the machine tool to machine the workpiece 50.
[0046] For example, the harder the material of the workpiece 50, the further the chips are scattered and accumulate. The directions in which the chips can be scattered change depending on the machining method used for the workpiece 50. The directions in which the chips can be scattered also change depending on the tool used.
[0047] Examples of machining methods used for workpiece 50 include a machining method using a file for polishing and a machining method using a saw for cutting. Examples of tools include a file, a saw, and a drill.
[0048] As in Fig. As shown in Figure 4, the working machine comprises a plurality of nozzles 53, and each nozzle 53 injects the cleaning fluid dispensed by the cleaning fluid injection unit 40.
[0049] Sloping surfaces 55 are provided on both sides of the table 51. In the example in Fig. In section 4, the inclined surfaces 55 are angled such that the rear sides are lower than the front sides in the drawing. For this reason, the cleaning fluid injected from the nozzles 53 is discharged to the outside after flowing along the inclined surfaces 55 from the front to the rear sides of the machine. At this point, the swarf is removed from the machine along with the cleaning fluid.
[0050] Next, a chip accumulation area detection device 2, shown in Fig. 1. The operation performed is explained.
[0051] Fig. Figure 5 is a flow chart illustrating a chip accumulation area determination procedure, which is a processing operation carried out by the chip accumulation area determination device 2.
[0052] The processing information acquisition unit 11, for example, acquires processing information from a control device of the machine (step ST1 in ) that is not shown. Fig. 5).
[0053] The machining information contains information representing the material of the machining object 50. Instead of information representing the material of the machining object 50, the machining information can also contain information representing a machining process used by the machine, or information representing a tool used to machine the machining object 50, or it can contain all information representing the material of the machining object 50, the information representing the machining process used by the machine, and the information representing the tool used to machine the machining object 50.
[0054] The processing information acquisition unit 11 outputs the processing information to the chip collection area determination unit 12.
[0055] The chip collection area determination unit 12 acquires the processing information from the processing information acquisition unit 11.
[0056] Based on the processing information, the chip accumulation area determination unit 12 determines a chip accumulation area 56, which is an area in which chips generated by the workpiece 50 accumulate when the machine processes the workpiece 50 (step ST2 in Fig. 5).
[0057] Specifically, the chip accumulation area determination unit 12 passes the processing information to the learning model 1, and acquires information from the learning model 1 that represents the chip accumulation area 56 according to the processing information.
[0058] The chip accumulation area 56, which corresponds to the machining information, changes when the information contained in the machining information, which represents the material of the machined object 50, changes, and the chip accumulation area 56, which corresponds to the machining information, changes when the information contained in the machining information, which represents the machining method used by the machine, changes.
[0059] Der Spangut-Ansammlungsbereich 56, der den Bearbeitungsinformationen entspricht, ändert sich, wenn sich die in den Bearbeitungsinformationen enthaltenen Informationen, die das Werkzeug darstellen, ändern.
[0060] The chip accumulation area detection unit 12 outputs the information representing the chip accumulation area 56 to the cleaning fluid injection unit 40.
[0061] The chip accumulation area determination unit 12 can determine the chip accumulation area 56 based on machining information that contains only information representing the material of the machined object 50, machining information that contains only information representing a machining procedure used by the machine, or machining information that contains only information representing a tool. However, the accuracy of the chip accumulation area determination in the chip accumulation area determination unit 12 is better when the machining information contains two or more pieces of information representing the material, the machining procedure used by the machine, and the tool than when the machining information contains only one piece of information.
[0062] The cleaning fluid injection unit 40 acquires the information representing the chip accumulation area 56 from the chip accumulation area detection unit 12.
[0063] The cleaning fluid injection unit 40 selects one or more nozzles 53 from the multitude of nozzles 53 from which the cleaning fluid is injected, based on the information representing the chip accumulation area 56.
[0064] For example, if a table representing the correspondence between the chip accumulation area 56 and the nozzles 53 is created as shown below, the cleaning fluid injection unit 40 refers to the table and selects one or more nozzles 53 that correspond to the chip accumulation area 56 represented by the information. [Tabel] - The chip accumulation area 56 is an area A: for example, an area on the left front side in Fig. 4. → The first nozzle 53 from the front among a plurality of nozzles 53 arranged on the left side, in the plurality of nozzles 53 arranged on the left side. - The chip accumulation area 56 is an area B: for example, an area on the left rear side in Fig. 4. → The second nozzle 53 from the front and the third nozzle 53 from the front among the multitude of nozzles 53 arranged on the left side. - The chip accumulation area 56 is an area C: for example, an area on the right front side in Fig. 4. → The first nozzle 53 from the front and the second nozzle 53 from the front in a plurality of nozzles 53 arranged on the right side: for example, an area on the right rear in Fig. 4. - The chip collection area 56 is an area D. → The third nozzle 53 from the front in the multitude of nozzles 53 that are arranged on the right side.
[0065] After selecting one or more nozzles 53, which causes the cleaning fluid to be injected, the cleaning fluid injection unit 40 causes the selected nozzles 53 to inject the cleaning fluid by supplying the cleaning fluid to the selected nozzles 53.
[0066] The shavings that have accumulated in the shavings collection area 56 are washed away by the cleaning fluid and discharged to the outside of the machine.
[0067] In the first embodiment described above, the chip accumulation area determination device 2 comprises: the machining information acquisition unit 11 for acquiring machining information, containing any of: information representing a material of a machining object 50 to be machined by a machine tool, information representing a machining method used by the machine tool for the machining object 50, and information representing a tool used by the machine tool to machine the machining object 50; and a chip accumulation area determination unit 12 for determining a chip accumulation area 56, which is an area in which chips produced by the machining object 50 accumulate when the machine tool machines the machining object 50, based on the machining information acquired by the machining information acquisition unit 11.Accordingly, the chip accumulation area determination unit 2 can determine the chip accumulation area 56 regardless of whether the visibility is poor or not.
[0068] In the Fig. The chip accumulation area detection device 2 shown in 1 acquires the machining information acquisition unit 11 the machining information which may contain: information representing a material of a machining object 50 to be machined by a machine tool, information representing a machining procedure used by the machine tool for the machining object 50, and information representing a tool used by the machine tool to machine the machining object 50.However, it is sufficient if the machining information is information that can be used to determine the chip accumulation area 56, and the machining information may contain information that differs from the information representing the material of the machined object 50, the information representing the machining process used by the machine, and the information representing the tool. Second embodiment.
[0069] A chip accumulation area detection device 2, as described in a second embodiment, comprises a visibility determination unit 14 for determining the visibility of chips produced by a machining object 50, based on a recorded video depicting a state in which a machine is machining the machining object 50.
[0070] Fig. Figure 6 is a configuration representation showing a chip removal device comprising the chip accumulation area detection device 2, according to the second embodiment. Reference numerals in Fig. 6, who are with those in Fig. If the parts listed are identical or equivalent, they represent the same or equivalent parts. Therefore, a detailed description of them is omitted.
[0071] Fig. Figure 7 is a hardware configuration diagram, which depicts the hardware of the chip accumulation area detection device 2 according to the second embodiment. Reference numerals in Fig. 7, who are with those in Fig. If two parts match, they represent the same or equivalent parts. Therefore, a detailed description of them is omitted.
[0072] The in Fig. The chip removal device shown in Figure 6 comprises a learning model 1, a camera 3, the chip accumulation area detection device 2 and a cleaning fluid injection unit 40.
[0073] The in Fig. Figure 6 shows a chip removal device comprising the learning model 1 and the camera 3. However, this is only an example, and the learning model 1 and the camera 3 can each also be provided outside the chip removal device.
[0074] Camera 3 records a video depicting a state in which a machine is processing a workpiece 50 and outputs the recorded video to the chip accumulation area detection device 2.
[0075] The in Fig. The chip accumulation area detection device 2 shown in Figure 6 comprises a processing information acquisition unit 11, a recorded video acquisition unit 13, the visibility determination unit 14 and a chip accumulation area detection unit 15.
[0076] The recorded video acquisition unit 13, for example, is defined by a Fig. 7. Recorded Video Acquisition Unit 23 is implemented.
[0077] The Recorded Video Acquisition Unit 13 acquires the recorded video from camera 3.
[0078] The recorded video acquisition unit 13 outputs the recorded video to the visibility determination unit 14 and the chip accumulation area determination unit 15.
[0079] The visibility determination unit 14 is, for example, represented by a Fig. Visibility determination circuit 24 shown in 7 is implemented.
[0080] Visibility determination unit 14 acquires the recorded video from recorded video acquisition unit 13.
[0081] The visibility determination unit 14 determines the visibility of chip material produced by the machining object 50 based on the recorded video.
[0082] The visibility determination unit 14 outputs a result of the visibility determination to the chip accumulation area determination unit 15.
[0083] The chip accumulation area determination unit 15 is, for example, defined by a Fig. The chip accumulation area detection circuit 25 shown in section 7 is implemented.
[0084] The chip collection area determination unit 15 acquires processing information from the processing information acquisition unit 11.
[0085] The chip accumulation area determination unit 15 acquires the recorded video from the recorded video acquisition unit 13, and acquires the result of the visibility determination from the visibility determination unit 14.
[0086] In a case where the result of the visibility determination by the visibility determination unit 14 indicates that chip material is visible, the chip material accumulation area determination unit 15 determines a chip material accumulation area 56 based on the recorded video.
[0087] In a case where the result of the visibility determination by the visibility determination unit 14 indicates that chips are not visible, the chip accumulation area determination unit 15 determines the chip accumulation area 56 based on the processing information similar to that in Fig. 1 depicted chip accumulation area determination unit 12.
[0088] The chip accumulation area detection unit 15 outputs information representing the chip accumulation area 56 to the cleaning fluid injection unit 40.
[0089] In Fig. 6 It is assumed that each of the processing information acquisition unit 11, the recorded video acquisition unit 13, the visibility determination unit 14 and the chip accumulation area determination unit 15, which are components of the chip accumulation area determination device 2, is implemented by dedicated hardware as shown in Fig. 7 shown. That is, it is assumed that the chip accumulation area detection device 2 is implemented by the processing information acquisition circuit 21, the recorded video acquisition circuit 23, the visibility determination circuit 24 and the chip accumulation area detection circuit 25.
[0090] Each of the processing information acquisition circuit 21, the recorded video acquisition circuit 23, the visibility determination circuit 24 and the chip accumulation area determination circuit 25 is, for example, a single circuit, a composite circuit, a programmed processor, a parallel programmed processor, an application-specific integrated circuit (ASIC), or a field programmable gate array (FPGA) or a combination thereof.
[0091] The components of the chip accumulation area detection device 2 are not necessarily implemented by dedicated hardware, but the chip accumulation area detection device 2 can also be implemented by software, firmware or a combination of software and firmware.
[0092] In a case where the chip accumulation area detection device 2 is implemented by software, firmware or the like, a program that causes a computer to execute each processing operation that is carried out in the processing information acquisition unit 11, the recorded video acquisition unit 13, the visibility determination unit 14 and the chip accumulation area detection unit 15, in which in Fig. The memory 31 shown in the diagram is stored. Then the process is carried out in Fig. 3. The processor 32 shown executes the programs stored in the main memory 31.
[0093] Furthermore, it illustrates Fig. 7 an example in which each of the components of the chip accumulation area detection device 2 is implemented by dedicated hardware, and Fig. Figure 3 illustrates an example in which the chip accumulation area detection device 2 is implemented by software, firmware, or the like. However, these are only examples, and some of the components of the chip accumulation area detection device 2 may be implemented by dedicated hardware, and the remaining components may be implemented by software, firmware, or the like.
[0094] Next, a chip accumulation area detection device 2, shown in Fig. 6. The operation performed is explained.
[0095] Fig. Figure 8 is a flowchart illustrating a chip accumulation area determination procedure, which is a processing operation carried out by the chip accumulation area determination device 2.
[0096] The processing information acquisition unit 11, for example, acquires processing information from a control device of a machine tool (step ST11 in ). Fig. 8) The machining information includes any of: information representing a material of a machining object 50 to be machined by a machine tool, information representing a machining procedure used by the machine tool for the machining object 50, and information representing a tool used by the machine tool to machine the machining object 50.
[0097] The processing information acquisition unit 11 outputs the processing information to the chip collection area determination unit 15.
[0098] Camera 3 records a video depicting a state in which a machine is processing the workpiece 50 and outputs the recorded video to the chip accumulation area detection device 2.
[0099] The Recorded Video Acquisition Unit 13 acquires the recorded video from camera 3 (step ST12 in Fig. 8).
[0100] The recorded video acquisition unit 13 outputs the recorded video to the visibility determination unit 14 and the chip accumulation area determination unit 15.
[0101] Visibility determination unit 14 acquires the recorded video from recorded video acquisition unit 13.
[0102] The visibility determination unit 14 determines the visibility of chips produced by the workpiece 50 based on the recorded video (step ST13 in Fig. 8).
[0103] The visibility determination unit 14 outputs a result of the visibility determination to the chip accumulation area determination unit 15.
[0104] The following section explains in more detail a visibility determination process carried out by Visibility Determination Unit 14.
[0105] A recorded video (hereinafter referred to as "good visibility video"), captured when the visibility of the chip material was good, is stored in the internal memory of the visibility determination unit 14. It is assumed that the good visibility video is stored in the internal memory of the visibility determination unit 14. However, this is only an example, and the good visibility video can be transmitted to the visibility determination unit 14 from outside of it.
[0106] Visibility Determination Unit 14 acquires the recorded video (hereinafter referred to as "current recorded video") from Recorded Video Acquisition Unit 13.
[0107] Visibility determination unit 14 calculates the difference between the video with good visibility and the currently recorded video.
[0108] Visibility determination unit 14 determines that the visibility of the material being cut is poor if the difference is equal to or greater than a threshold value, and determines that the visibility of the material being cut is good if the difference is less than the threshold value. The threshold value can be stored in an internal memory of visibility determination unit 14 or specified from outside visibility determination unit 14. Determining that the visibility of the material being cut is poor is equivalent to determining that the material being cut is not visible, and determining that the visibility of the material being cut is good is equivalent to determining that the material being cut is visible.
[0109] Here, the visibility determination unit 14 calculates the difference between the video with good visibility and the currently recorded video and determines the visibility of the chip material based on this difference. However, this is only an example, and the visibility determination unit 14 can extract edges from both the video with good visibility and the currently recorded video, and determine the visibility of the chip material based on the difference between the edges extracted from the video with good visibility and the edges extracted from the currently recorded video.
[0110] In a situation where, for example, smoke or haze is produced, the edges extracted from the currently recorded video are less pronounced than those from the video with good visibility.
[0111] The chip collection area determination unit 15 acquires the processing information from the processing information acquisition unit 11.
[0112] The chip accumulation area determination unit 15 acquires the recorded video from the recorded video acquisition unit 13, and acquires the result of the visibility determination from the visibility determination unit 14.
[0113] In a case where the result of the visibility determination by the visibility determination unit 14 indicates that chip material is visible (a case of step ST14: YES in Fig. 8), the chip accumulation area determination unit 15 determines a chip accumulation area 56 based on the recorded video (step ST15 in Fig. 8).
[0114] In particular, the chip accumulation area detection unit 15 detects an optical flow between a large number of recorded videos that were recorded at mutually different times.
[0115] The chip accumulation area determination unit 15 determines the chip accumulation area 56 by determining flight directions and flight distances of the chip material based on the optical flux.
[0116] Here, the chip accumulation area determination unit 15 determines the chip accumulation area 56 based on the optical flux. However, this is only an example, and the chip accumulation area determination unit 15 can determine the chip accumulation area 56 based on the difference between a recorded video taken before the chip accumulation and the currently recorded video.
[0117] In a case where the result of the visibility determination by the visibility determination unit 14 is that the chip material is not visible (a case of step ST14: NO in Fig. 8), the chip accumulation area determination unit 15 determines the chip accumulation area 56 based on the processing information similar to the one in Fig. 1 depicted chip accumulation area determination unit 12 (step ST16 in Fig. 8).
[0118] The chip accumulation area detection unit 15 outputs information representing the chip accumulation area 56 to the cleaning fluid injection unit 40.
[0119] In a situation where chip material is not visible, the accuracy of determining the chip accumulation area 56 based on recorded videos is more likely to deteriorate than the accuracy of determining the chip accumulation area 56 based on machining information. Conversely, in a situation where chip material is visible, the accuracy of determining the chip accumulation area 56 based on recorded videos may be higher than the accuracy of determining the chip accumulation area 56 based on machining information.
[0120] In the second embodiment described above, the chip accumulation area detection device 2 comprises: the recorded video acquisition unit 13 to acquire a recorded video depicting a state in which a machine is processing a workpiece 50; and the visibility determination unit 14 to determine the visibility of chips produced by the workpiece 50 based on the recorded video acquired by the recorded video acquisition unit 13.The chip accumulation area determination unit 15 of the chip accumulation area determination device 2 determines a chip accumulation area 56 based on the recorded video in a case where the visibility determination unit 14 indicates that the chip is visible, and determines the chip accumulation area 56 based on the processing information acquired by the processing information acquisition unit 11 in a case where the visibility determination unit 14 indicates that the chip is not visible. Accordingly, the in . Fig. 6. The chip accumulation area detection device 2 shown determines a chip accumulation area 56 regardless of whether visibility is poor or not, and there is the possibility that the in Fig. The chip accumulation area determination device 2 shown in section 6 can improve the accuracy of determining a chip accumulation area 56 more than the one shown in Fig. 1. Determining device for chip accumulation area 2. Third embodiment.
[0121] A chip accumulation area detection device 2 described in a third embodiment comprises a chip accumulation area detection device 16 for determining a chip accumulation area 56 using a first learning model 4 or a second learning model 5.
[0122] Fig. Figure 9 is a configuration representation showing a chip removal device comprising the chip accumulation area detection device 2, according to the third embodiment. Reference numerals in Fig. 9, who are with those in Fig. 1 and Fig. 6. These represent the same or equivalent parts, so a detailed description of them is therefore omitted.
[0123] Fig. Figure 10 is a hardware configuration representation, which depicts the hardware of the chip accumulation area detection device 2 according to the third embodiment. Reference numerals in Fig. 10, who are with those in Fig. 2 and Fig. 7. If the parts are identical, they represent the same or equivalent parts, so a detailed description of them is omitted.
[0124] The in Fig. The chip removal device shown in Figure 9 comprises a camera 3, the first learning model 4, the second learning model 5, the chip accumulation area detection device 2 and a cleaning fluid injection unit 40.
[0125] The in Fig. Figure 9 shows a chip removal device comprising camera 3, first learning model 4, and second learning model 5. However, this is only an example, and camera 3, first learning model 4, and second learning model 5 may each also be located outside the chip removal device.
[0126] The first learning model 4, for example, is implemented using a neural network.
[0127] At the time of learning, the first learning model receives 4 recorded videos depicting states in which a work machine processes 50 processing objects, as well as training data.
[0128] The training data is information which represents chip accumulation areas 56, which are areas in which chips generated by machining objects 50 accumulate when the machine machine processes the machining objects 50.
[0129] Given the recorded videos and training data at the time of learning, the first learning model 4 learns the chip accumulation areas 56 that correspond to the recorded videos. The chip accumulation areas 56 that correspond to the recorded videos are, in this context, the chip accumulation areas 56 represented by the training data.
[0130] If a recorded video is available at the time of inference, the first learning model outputs 4 pieces of information representing a chip accumulation area 56 that corresponds to the recorded video.
[0131] The second learning model 5, for example, is implemented using a neural network.
[0132] The second learning model 5 receives processing information and training data at the time of learning. The processing information includes any of the following: information representing the materials of the processing objects 50 to be processed by a worker machine, information representing the processing methods used by the worker machine, and information representing the tools used by the worker machine to process the processing objects 50.
[0133] The training data is information which represents chip accumulation areas 56, which are areas in which chips generated by machining objects 50 accumulate when the machine machine processes the machining objects 50.
[0134] Given the processing information and training data at the time of learning, the second learning model 5 learns the chip accumulation areas 56 that correspond to the processing information. The chip accumulation areas 56 corresponding to the processing information are, in this case, the chip accumulation areas 56 represented by the training data.
[0135] If the machining information is given at the time of inference, the second learning model 5 outputs information representing a chip accumulation area 56 that corresponds to the machining information.
[0136] In the Fig. In the chip removal device shown in Figure 9, the first learning model 4 and the second learning model 5 are provided outside the chip accumulation area detection device 2. However, this is only an example, and the first learning model 4 and the second learning model 5 can each also be provided inside the chip accumulation area detection device 2.
[0137] The in Fig. The chip accumulation area detection device 2 shown in Figure 9 comprises a processing information acquisition unit 11, a recorded video acquisition unit 13, a visibility determination unit 14 and the chip accumulation area detection unit 16.
[0138] The chip accumulation area determination unit 16 is, for example, defined by a Fig. The chip accumulation area detection circuit 26 shown in 10 is implemented.
[0139] The chip accumulation area detection unit 16 acquires machining information from the machining information acquisition unit 11. The machining information includes any of: information representing the material of a machining object 50 to be machined by a machine tool, information representing a machining procedure used by the machine tool, and information representing a tool used by the machine tool to machine the machining object 50.
[0140] The chip accumulation area determination unit 16 acquires a recorded video from the recorded video acquisition unit 13, and acquires a result of the determination about visibility from the visibility determination unit 14.
[0141] In a case where the result of the visibility determination by the visibility determination unit 14 indicates that chip material is visible, the chip material accumulation area determination unit 16 passes the recorded video to the first learning model 4 and acquires information from the first learning model 4 which represents a chip material accumulation area 56 that corresponds to the recorded video.
[0142] In a case where the result of the visibility determination by the visibility determination unit 14 indicates that the chip material is not visible, the chip accumulation area determination unit 16 passes the processing information to the second learning model 5 and acquires information from the second learning model 5 which represents a chip accumulation area 56 that corresponds to the processing information.
[0143] The chip accumulation area detection unit 16 outputs the information representing the chip accumulation area 56 to the cleaning fluid injection unit 40.
[0144] In Fig. 9 It is assumed that each of the processing information acquisition unit 11, the recorded video acquisition unit 13, the visibility determination unit 14 and the chip accumulation area determination unit 16, which are components of the chip accumulation area determination device 2, is implemented by dedicated hardware as shown in Fig. Figure 10 shows that the chip accumulation area detection device 2 is implemented by a processing information acquisition circuit 21, a recorded video acquisition circuit 23, a visibility determination circuit 24 and the chip accumulation area detection circuit 26.
[0145] Each of the processing information acquisition circuit 21, the recorded video acquisition circuit 23, the visibility determination circuit 24 and the chip accumulation area determination circuit 26 is, for example, a single circuit, a composite circuit, a programmed processor, a parallel programmed processor, an application-specific integrated circuit (ASIC), or a field programmable gate array (FPGA) or a combination thereof.
[0146] The components of the chip accumulation area detection device 2 are not necessarily implemented by dedicated hardware, but the chip accumulation area detection device 2 can also be implemented by software, firmware or a combination of software and firmware.
[0147] In a case where the chip accumulation area detection device 2 is implemented by software, firmware or the like, a program that causes a computer to execute each processing operation that is carried out in the processing information acquisition unit 11, the recorded video acquisition unit 13, the visibility determination unit 14 and the chip accumulation area detection unit 16, in which in Fig. The memory 31 shown in the diagram is stored. Then the process is carried out in Fig. 3. The processor 32 shown executes the programs stored in the main memory 31.
[0148] Furthermore, it illustrates Fig. 10 an example in which each of the components of the chip accumulation area detection device 2 is implemented by dedicated hardware, and Fig. Figure 3 illustrates an example in which the chip accumulation area detection device 2 is implemented by software, firmware, or the like. However, these are only examples, and some of the components of the chip accumulation area detection device 2 may be implemented by dedicated hardware, and the remaining components may be implemented by software, firmware, or the like.
[0149] Next, a chip accumulation area detection device 2, shown in Fig. 9, the operation performed is explained.
[0150] Fig. Figure 11 is a flow chart illustrating a chip accumulation area determination procedure, which is a processing operation carried out by the chip accumulation area determination device 2.
[0151] For example, the processing information acquisition unit 11 acquires processing information from a control device of a machine tool (step ST21 in ). Fig. 11).
[0152] The processing information acquisition unit 11 outputs the processing information to the chip collection area determination unit 16.
[0153] Camera 3 records a video depicting a state in which a machine is processing a workpiece 50 and outputs the recorded video to the chip accumulation area detection device 2.
[0154] The Recorded Video Acquisition Unit 13 acquires the recorded video from camera 3 (step ST22 in Fig. 11).
[0155] The recorded video acquisition unit 13 outputs the recorded video to the visibility determination unit 14 and the chip accumulation area determination unit 16.
[0156] Visibility determination unit 14 acquires the recorded video from recorded video acquisition unit 13.
[0157] The visibility determination unit 14 determines the visibility of chips produced by the machining object 50 based on the recorded video (step ST23 in Fig. 11).
[0158] The visibility determination unit 14 outputs a result of the visibility determination to the chip accumulation area determination unit 16.
[0159] The chip collection area determination unit 16 acquires the processing information from the processing information acquisition unit 11.
[0160] The chip accumulation area determination unit 16 acquires the recorded video from the recorded video acquisition unit 13, and acquires the result of the visibility determination from the visibility determination unit 14.
[0161] In a case where the result of the visibility determination by the visibility determination unit 14 indicates that chip material is visible (a case of step ST24: YES in Fig. 11), the chip accumulation area determination unit 16 passes the recorded video to the first learning model 4, and acquires information from the first learning model 4 which represents a chip accumulation area 56 that corresponds to the recorded video (step ST25 in Fig. 11).
[0162] In a case where the result of the visibility determination by the visibility determination unit 14 is that the chip material is not visible (a case of step ST24: NO in Fig. 11), the chip accumulation area determination unit 16 passes the processing information to the second learning model 5, and acquires information from the second learning model 5 which represents a chip accumulation area 56 that corresponds to the processing information (step ST26 in Fig. 11).
[0163] The chip accumulation area detection unit 16 outputs the information representing the chip accumulation area 56 to the cleaning fluid injection unit 40.
[0164] In the third embodiment described above, the following are included: the first learning model 4, to which a recorded video depicting a state in which a machine is processing a workpiece 50 and training data representing a chip accumulation area 56 were passed, and which learned the chip accumulation area 56 according to the recorded video; and the second learning model 5, to which the processing information and training data representing the chip accumulation area 56 were passed, and which learned the chip accumulation area 56 according to the processing information. The chip accumulation area detection device 2, shown in Fig. 9, comprising: the recorded video acquisition unit 13 for acquiring a recorded video depicting a state in which a machine is machining a workpiece 50; and the visibility determination unit 14 for determining the visibility of chips produced by the workpiece 50 based on the recorded video acquired by the recorded video acquisition unit 13. The chip accumulation area determination unit 16 in the chip accumulation area determination device 2, shown in Fig. 9, in a case where the visibility determination by the visibility determination unit 14 indicates that the material being cut is visible, passes the recorded video, acquired by the recorded video acquisition unit 13, to the first learning model 4 and acquires information from the first learning model 4 that represents a material accumulation area 56 corresponding to the recorded video. In a case where the visibility determination by the visibility determination unit 14 indicates that the material being cut is not visible, passes the processing information acquired by the processing information acquisition unit 11 to the second learning model 5 and acquires information from the second learning model 5 that represents the material accumulation area 56 corresponding to the processing information. Accordingly, the in Fig. 9. The chip accumulation area detection device 2 shown determines a chip accumulation area 56 regardless of whether visibility is poor or not, and there is the possibility that the in Fig. 9. The chip accumulation area determination device 2 shown can improve the accuracy of determining a chip accumulation area 56 more than the one shown in Fig. 1. Determining device for chip accumulation area 2.
[0165] It should be noted that the present disclosure includes any combinations of the respective embodiments, modifications of any components in the respective embodiments, and the omission of any components in the respective embodiments. INDUSTRIAL APPLICABILITY
[0166] The present disclosure is suitable for a chip accumulation area detection device, a chip accumulation area detection method and a chip removal device. REFERENCE MARK LIST
[0167] 1: Learning model; 2: Chip accumulation area detection device; 3: Camera; 4: First learning model; 5: Second learning model; 11: Machining information acquisition unit; 12: Chip accumulation area detection unit; 13: Recorded video acquisition unit; 14: Visibility determination unit; 15, 16: Chip accumulation area detection unit; 21: Machining information acquisition circuit; 22: Chip accumulation area detection circuit; 23: Recorded video acquisition circuit; 24: Visibility determination unit; 25, 26: Chip accumulation area detection circuit; 31: Working memory; 32: Processor; 40: Cleaning fluid injection unit; 50: Machining object; 51: Table; 52: Spindle; 53: Nozzle; 54: Cover; 55: Inclined; 56: Chip collection area QUOTES INCLUDED IN THE DESCRIPTION
[0000] This list of documents cited by the applicant was automatically generated and is included solely for the reader's convenience. The list is not part of the German patent or utility model application. The DPMA accepts no liability for any errors or omissions. Cited patent literature
[0000] JP 2021-94624 A
[0005]
Claims
[1] Chip accumulation area detection device, comprising: a machining information acquisition unit for acquiring machining information, comprising any of: information representing a material of a machining object to be machined by a machine tool, information representing a machining procedure used by the machine tool for the machining object, and information representing a tool used by the machine tool for machining the machining object; and a chip accumulation area determination unit to determine a chip accumulation area, which is an area where chips produced by the workpiece accumulate when the machine machine processes the workpiece, based on the machining information acquired by the machining information acquisition unit. [2] Chip accumulation area detection device according to claim 1, wherein there is a learning model to which the machining information and training data representing the chip accumulation area have been passed, and which has learned the chip accumulation area according to the machining information, and The chip accumulation area determination unit passes the processing information acquired by the processing information acquisition unit to the learning model, and acquires information from the learning model that represents a chip accumulation area corresponding to the processing information acquired by the processing information acquisition unit. [3] Chip accumulation area detection device according to claim 1, comprising: a recorded video acquisition unit to acquire a recorded video that depicts a state in which the working machine is processing the object being processed; and a visibility determination unit to determine the visibility of chips produced by the workpiece based on the recorded video acquired by the recorded video acquisition unit, wherein The chip accumulation area determination unit determines the chip accumulation area based on the recorded video in a case where the result of the visibility determination by the visibility determination unit indicates that the chip is visible, and determines the chip accumulation area based on the processing information acquired by the processing information acquisition unit in a case where the result of the visibility determination by the visibility determination unit indicates that the chip is not visible. [4] Chip accumulation area detection device according to claim 1, wherein there is: a first learning model, to which a recorded video representing a state in which the machine is processing the workpiece and training data representing the chip accumulation area were passed, and which learned the chip accumulation area according to the recorded video; and a second learning model, to which the machining information and training data representing the chip accumulation area were passed, and which learned the chip accumulation area according to the machining information, and The chip accumulation area detection device includes: a recorded video acquisition unit to acquire a recorded video that depicts a state in which the working machine is processing the object being processed; and a visibility determination unit to determine the visibility of chips produced by the workpiece, based on the recorded video acquired by the recorded video acquisition unit, and The chip accumulation area determination unit, in a case where the result of the visibility determination by the visibility determination unit indicates that the chip is visible, passes the recorded video, acquired by the recorded video acquisition unit, to the first learning model and acquires information from the first learning model that represents the chip accumulation area according to the recorded video; and in a case where the result of the visibility determination by the visibility determination unit indicates that the chip is not visible, passes the processing information, acquired by the processing information acquisition unit, to the second learning model and acquires information from the second learning model that represents the chip accumulation area according to the processing information. [5] Chip accumulation area determination procedure, comprising: Acquire, through a machining information acquisition unit, machining information, comprising any of: information representing a material of a machining object to be machined by a machine tool, information representing a machining procedure used by the machine tool for the machining object, and information representing a tool used by the machine tool to machine the machining object; and Determine, by a chip accumulation area determination unit, a chip accumulation area which is an area in which chips produced by the workpiece accumulate when the machine machine processes the workpiece, based on the machining information acquired by the machining information acquisition unit. [6] Chip removal device comprising: a processing information acquisition unit to acquire processing information, including any information representing a material of a processing object to be processed by a working machine, information representing a processing procedure used by the working machine for the processing object, and information representing a tool used by the working machine to process the processing object; a chip accumulation area determination unit to determine a chip accumulation area, which is an area where chips produced by the workpiece accumulate when the machine machine processes the workpiece, based on the machining information acquired by the machining information acquisition unit; and a cleaning fluid injection unit to inject a cleaning fluid to flush away the chip material that has accumulated in the chip accumulation area determined by the chip accumulation area detection unit.
Citation Information
Patent Citations
Chip processing device for machine tool and chip processing method
EP3939744A1