REFERENCE MEASURING TECHNOLOGY FOR CAPACITIVE SENSING

Abstract

Examples generally refer to the use of capacitive distance measurements to adjust capacitive liquid level measurements.

Description

CROSS-REFERENCE TO RELATED REGISTRATION

[0001] This application claims the benefit under 35 USC §119(e) of the preliminary US patent application with serial number 63 / 510,980, filed on June 29, 2023, the disclosure of which is hereby incorporated herein by reference in its entirety. AREA

[0002] One or more examples relate generally to capacitive sensors. One or more examples relate generally to capacitive distance sensing and media level sensing. BACKGROUND

[0003] Capacitive sensors will be used in a variety of operational contexts, for example, without limitation for capacitive proximity sensing, capacitive distance sensing, capacitive liquid level sensing (or other media). BRIEF DESCRIPTION OF THE DRAWINGS

[0004] To make it easy to identify the discussion of a specific element or action, the principal number(s) in a reference sign refer to the figure number in which that element is first introduced. Fig. Figure 1 is a schematic diagram representing a detection system that includes media level measurement, according to one or more examples. Fig. Figure 2 is a schematic diagram representing a data acquisition system in an exemplary environment. Fig. 3A, Fig. 3B and Fig. 3C are schematic diagrams that represent a capture system according to different perspective views, in accordance with one or more examples. Fig. Figure 4 is a schematic diagram representing a data acquisition system in an exemplary environment. Fig. Figure 5 is a diagram that shows a relationship between measurements generated by a first capacitive distance sensor, a second capacitive distance sensor, and a capacitive liquid level sensor, and the water level in a tank (e.g., a liquid volume level in a tank, without limitation) at positions defined by Fig. correspond to the environment shown in section 5. Fig. Figure 6 is a schematic diagram of a data acquisition system in an exemplary environment. Fig. Figure 7 is a diagram that shows a relationship between measurements generated by a first capacitive distance sensor, a second capacitive distance sensor, and a capacitive liquid level sensor, and the water level in a tank (e.g., a liquid volume level in a tank, without limitation) at positions defined by Fig. correspond to the environment shown in section 6. Fig. Figure 8 is a flowchart that illustrates a process for adjusting capacitive liquid level measurements using capacitive distance measurements as reference values ​​according to one or more examples. Fig. Figure 9 is a flowchart that illustrates a process for determining a liquid level measurement according to one or more examples. Fig. Figure 10 is a flowchart that represents a process for changing a capacitive value at least partially based on capacitive distance measurements according to one or more examples. Fig. Figure 11 is a flowchart that illustrates a process for providing a capacitive liquid level sensing system near a holding structure for liquid level measurement according to one or more examples. Fig. Figure 12 is a flowchart that illustrates a process for providing a capacitive liquid level sensing system near a holding structure for liquid level measurement according to one or more examples. Fig. 13 and Fig. 14 are flowcharts that together represent a process 1300 for determining a liquid level of a holding structure that changes its position according to one or more examples. Fig. Figure 15 is a block diagram of a switching logic that can be used in some examples to implement various functions, operations, actions, processes or procedures disclosed herein. FORM(S) OF EXECUTION OF THE INVENTION

[0005] The following detailed description refers to the accompanying drawings, which form part of this document and show specific examples of embodiments in which the present disclosure can be applied. These embodiments are described in sufficient detail to enable a person skilled in the art to put the present disclosure into practice. However, other embodiments may also be used, and changes to the structure, material, and process may be made without departing from the scope of the disclosure.

[0006] The illustrations shown herein are not intended to be actual views of any particular method or system, or of any particular device or structure, but are merely idealized representations used to describe the embodiments of the present disclosure. The drawings shown herein are not necessarily to scale. Similar designs or components in the various drawings may retain the same or similar numbering for the convenience of the reader; however, the similarity in numbering does not imply that the designs or components are necessarily identical in size, composition, configuration, or any other characteristic.

[0007] The following description may include examples to enable a person skilled in the art to carry out the disclosed embodiments. The use of the terms "by way of example," "as an example," and "for instance" means that the accompanying description is explanatory, and although the scope of the disclosure is intended to include the examples and their legal equivalents, the use of such terms is not intended to limit the scope of any embodiment or of this disclosure to the specified components, steps, features, functions, or the like.

[0008] It is self-evident that the components of the embodiments, as generally described herein and illustrated in the drawing, can be arranged and designed in a multitude of different configurations. Therefore, the following description of various embodiments is not intended to limit the scope of protection of the present disclosure, but is merely representative of different embodiments. While the various aspects of the embodiments may be illustrated in drawings, the drawings are not necessarily drawn to scale unless expressly stated otherwise.

[0009] Furthermore, the specific implementations shown and described are only examples and should not be interpreted as the only way to implement the present disclosure unless otherwise stated herein. Elements, circuits, and functions may be shown in block diagram form to avoid obscuring the present disclosure with unnecessary details. Conversely, the specific implementations shown and described are only examples and should not be interpreted as the only way to implement the present disclosure unless otherwise stated herein. Additionally, block definitions and the distribution of logic between different blocks are examples of a specific implementation. It is readily apparent to those skilled in the art that the present disclosure can be implemented in practice through numerous other distribution solutions.Details concerning timing considerations and the like have been largely omitted, insofar as such details are not necessary for a complete understanding of the present disclosure and are within the capabilities of those skilled in the art.

[0010] It is evident to those skilled in the art that information and signals can be represented using a variety of different technologies and techniques. Some drawings may illustrate signals as a single signal for the sake of clarity in representation and description. It is also evident to those skilled in the art that the signal can represent a bus of signals, where the bus can have a variety of bit widths, and the present disclosure can be implemented with any number of data signals, including a single data signal.

[0011] The various illustrative logic blocks, modules, and circuits described in connection with the embodiments disclosed herein may be implemented or carried out using a general-purpose processor, a special-purpose processor, a digital signal processor (DSP), an integrated circuit (IC), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA) or other programmable logic device, discrete gate or transistor logic, discrete hardware components, or any combination thereof designed to perform the functions described herein.A general-purpose processor (which may herein also be referred to as a host processor or simply a host) may be a microprocessor, but alternatively it may be any conventional processor, control unit, microcontroller, or state machine. A processor may also be implemented as a combination of data processing devices, such as a combination of a DSP and a microprocessor, a plurality of microprocessors, one or more microprocessors in conjunction with a DSP core, or any other such configuration. A general-purpose computer that includes a processor is considered a special-purpose computer, while the general-purpose computer executes computational instructions (e.g., software code) relating to examples in the present disclosure.

[0012] The embodiments may be described in terms of a process represented as a flowchart, flow diagram, structure diagram, or block diagram. Although a flowchart may describe steps of operation as a sequential process, many of these operations may be performed in a different sequence, in parallel, or substantially simultaneously. Furthermore, the order of the steps may be changed. A process may correspond, without limitation, to a method, thread, function, procedure, subroutine, or subprogram. Moreover, the methods disclosed herein may be implemented in hardware, software, or both. When implemented in software, the functions may be stored or transmitted as one or more instructions or as code on computer-readable media.Computer-readable media include both computer storage media and communication media, including all media that support the transfer of a computer program from one location to another.

[0013] Any reference to an element herein using a label such as "first," "second," etc., does not restrict the set or order of such elements unless such restriction is expressly stated. Rather, these labels herein may be used as a convenient method for distinguishing between two or more elements or instances of an element. Thus, a reference to a first and a second element does not mean that only two elements may be inserted there, or that the first element must in any way precede the second element. Furthermore, unless otherwise stated, a set of elements may comprise one or more elements.

[0014] In the sense used herein, the term "essentially" means, with respect to a given parameter, property, or condition, and includes, to an extent understandable to a person skilled in the art, that the given parameter, property, or condition is satisfied with a small degree of variance, such as within acceptable manufacturing tolerances. For example, depending on the specified parameter, property, or condition that is substantially satisfied, the parameter, property, or condition may be satisfied to at least 90%, at least 95%, or even at least 99%.

[0015] As used herein, relational terms such as “above”, “below”, “on”, “underlying”, “above”, “below” are used without restriction for the sake of clarity and expediency in understanding the revelation and the accompanying drawings, and are not associated with or dependent on any particular preference, orientation or order, unless the context clearly indicates otherwise.

[0016] In this description, the term "coupled" and derivatives thereof may be used to indicate that two elements work together or interact with each other. When an element is described as "coupled" to another element, the elements may be in direct physical or electrical contact, or intermediate elements or layers may be present. Conversely, when an element is described as "directly coupled" to another element, no intermediate elements or layers are present. The term "connected" may be used interchangeably with the term "coupled" in this description and has the same meaning unless explicitly stated otherwise or the context would indicate otherwise to a person skilled in the art.

[0017] Intrinsic capacity and its displays can be used in a variety of operational contexts, including to derive information about a material of interest, such as material level sensing (e.g., the level of a liquid, solution, or mixture in a tank, without limitation).

[0018] Solutions for measuring the level of liquids (or other media) based on capacitive sensing, known to the inventors of this disclosure, are highly susceptible to variations in mechanical systems. System air gaps, variations in material composition, dielectric, thickness due to production deviations, changes in operating time, or application limitations all lead to capacitive-based measurement errors.

[0019] One or more examples refer to the surface of an electrically levitated conductive structure (a reference electrode) in front of the surface of an electrode (a sensing electrode) of a capacitive electrode system sensor (a capacitive distance sensor). The electrically levitated conductive structure provides a stable and accurate reference measurement for the capacitive electrode system sensor material setup between the sensing electrode and the liquid / medium being measured.

[0020] Any application that uses liquid level measurement or a liquid level value can benefit from the examples discussed herein. Any application that uses linear liquid level measurement can benefit from the examples discussed herein. Any application that uses a tank that is movable relative to the capacitive liquid level sensor, such as a non-stationary tank like a removable / replaceable tank, a tank that is not attached to the capacitive liquid level sensor, or a tank that is attached to a structure that moves relative to the capacitive liquid level sensor.

[0021] A non-restrictive example of an application is as a water level sensor for a household appliance (beverage machine, steam oven, steam iron, dryer, dishwasher, without restriction).

[0022] One or more examples enable the measurement of the mechanical system environment perceived by the capacitive liquid level sensor without the influence of the liquid (i.e., a medium to be measured does not need to be present).

[0023] One or more examples allow for the correction of a liquid level measurement during runtime, thereby reducing inherent associated errors.

[0024] One or more examples increase the measurement accuracy in systems with variable material thickness / dielectric changes due to production variations, temperature / humidity fluctuations. For example, in a beverage machine, accurate measurements were obtained in the presence of mechanical distance variations of up to 20 centimeters between the capacitive liquid level sensor and the media volume being measured.

[0025] One or more examples refer to a combination of an electrical and mechanical hardware arrangement and a measurement technique for increasing the accuracy of a capacitive liquid level sensor that measures the level of a liquid / medium in a non-conductive tank.

[0026] One or more examples relate to generating measurement reference values ​​and using the reference values ​​to reduce measurement errors on the capacitive liquid level sensor, which, as a non-limiting example, are introduced by mechanical system variation.

[0027] Fig. Figure 1 is a schematic diagram representing a media level detection system 100, which includes level measurement according to one or more examples.

[0028] The liquid level sensing system 100 comprises a tank 102, a liquid volume 104, a reference electrode 106, a reference electrode 108, a sensing electrode 112, a sensing electrode 110, a second capacitive distance sensor 116, a first capacitive distance sensor 114 and a capacitive liquid level sensor 118.

[0029] Tank 102 is a container or vessel for receiving a medium to be measured. Tank 102 encloses a space 120 for holding, receiving, dispensing, or supplying a medium to be measured, including a liquid volume 104. The space 120 can be, as non-limiting examples, a chamber or a reservoir. In one or more examples, the amount of liquid volume 104 in space 120 can change (increase or decrease). For example, tank 102 can be configured to allow liquid to enter or exit space 120. In one or more examples, the vertical height of a free surface of the liquid volume 104 relative to the bottom of tank 102 can change (increase / rise, decrease / fall).The vertical height of a free surface of the liquid volume 104 can change because, as a non-limiting example, the amount of liquid volume 104 changes, or the bottom of tank 102 (e.g., the bottom of tank 102 moves relative to the rest of tank 102, without limitation) changes the vertical height of the free surface of the liquid volume 104. References herein to the “level” of media such as the liquid volume 104 refer to a vertical height of the free surface of the media unless expressly stated otherwise or a person skilled in the art would understand a different meaning based on the context in which it is used.

[0030] The capacitive liquid level sensor 118 measures the fill level of a medium in a tank and can generate values ​​representing the fill level, displaying the result of a comparison of the measured fill level with a threshold value, or both, without limitation. The capacitive liquid level sensor 118 includes the electrode 122 and a measuring circuit which is located in Fig. 1 is not visible (e.g., because it is located behind electrode 122, without restriction). The capacitive liquid level sensor 118 is a self-referencing capacitive liquid level sensor. More precisely, the capacitive liquid level sensor 118 is self-referencing because it includes one or more self-referencing mechanisms to compensate for changes in environmental conditions. In one or more examples, the one or more self-referencing mechanisms include a self-referencing mechanism to compensate for changes in the distance between the capacitive liquid level sensor 118 and the tank 102, as discussed below.The capacitive liquid level sensor 118 can also include self-referencing mechanisms to compensate for changes in other environmental conditions, such as temperature, humidity, or other environmental conditions that may affect measurement accuracy, without limitation.

[0031] The electrode 122 is (e.g., can be operated as, without limitation) both a sensing electrode and a reference electrode. When the capacitive liquid level sensor 118 performs a self-capacitance measurement, it measures the capacitance between the electrode 122 and its surroundings, as well as any changes therein. Here, the surroundings (e.g., is or includes, without limitation) the tank 102, the liquid volume 104, and whatever medium is in the section of space 120 that does not contain the liquid volume 104. When the level of the liquid volume 104 changes, the capacitance measured by the capacitive liquid level sensor 118 changes (i.e., the capacitance measured before the level change and the capacitance measured after the level change are different).

[0032] Electrode 122 is a mass of conductive material such as metal, conductive polymer, indium tin oxide, conductive layers or coatings (e.g., conductive paint, conductive adhesive, conductive film, combinations thereof, subcombinations thereof, without limitation), graphite, combinations thereof, or subcombinations thereof, without limitation. In the Fig. In the example shown, the electrode 122 is dimensioned and shaped such that it has a rectangular surface area that faces substantially towards the tank 102. Other sizes and shapes of the electrode 122 do not exceed the scope of this disclosure. In one or more examples, the electrodes 122 may be dimensioned and shaped for a specific application or operating conditions.

[0033] In one or more examples, including the specific example provided by Fig. As shown in Figure 1, the capacitive liquid level sensor 118 and the electrode 122 are located outside of the tank 102 (e.g., spaced away from an outer surface of the tank 102, without limitation) and never come into direct physical contact with the space 120 or media therein such as the liquid volume 104, without limitation.

[0034] The first capacitive distance sensor 114 and the second capacitive distance sensor 116 measure the physical distance between the respective sensing electrode 112 and the sensing electrode 110 and an object, here the tank 102. The first capacitive distance sensor 114 connects the sensing electrode 110, the reference electrode 106 and a respective measuring circuit, which is located in Fig. The first capacitive distance sensor is not visible because it is located behind the sensing electrode 110. The second capacitive distance sensor 116 includes a sensing electrode 112, a reference electrode 108, and a respective measuring circuit, which is located in Fig. 1 is not visible, because it is behind the detection electrode 112.

[0035] The reference electrode 106, the reference electrode 108, the sensing electrode 112, and the sensing electrode 110 are each a mass of conductive material such as metal, conductive polymer, indium tin oxide, conductive layers or coatings (e.g., conductive paint, conductive adhesive, conductive film, combinations thereof, subcombinations thereof, without limitation), graphite, combinations thereof, subcombinations thereof, without limitation. The sensing electrode 112, the sensing electrode 110, and the reference electrode 106 / reference electrode 108 have a known surface area, as discussed below.

[0036] The sensing electrode 112 and the sensing electrode 110 each detect changes in capacitance. They interact with a target object or the environment to be sensed. In various examples, the target object is the reference electrode 106 or the reference electrode 108 if it is located nearby.

[0037] Reference electrode 106 and reference electrode 108 each serve as a baseline or comparison point for sensing electrode 112 and sensing electrode 110, respectively. In various examples, reference electrode 106 and reference electrode 108 can be considered as part of sensing system 124 or as part of liquid level sensing system 100, but separate from sensing system 124. In the Fig. In the example shown, reference electrodes 106 and 108 are electrically floating and are not electrically coupled to a reference point (a specific location or voltage potential that is stable and can be used as a comparison point for measuring voltages or electrical potentials) or ground (e.g., they have no direct electrical connection to a reference point or ground, without limitation). In other examples, reference electrodes 106 and 108 may be electrically coupled to a reference point or ground. The capacitance between reference electrodes 106 and 108 and the liquid volume 104 may change, but since the location of reference electrodes 106 and 108 with respect to tank 102, space 120, and the liquid volume 104 is fixed, the capacitance remains relatively constant.Thus, the reference electrode 106 / reference electrode 108 help to establish a stable reference point for accurate capacitance measurements.

[0038] The capacitance between the sensing electrode 112 / sensing electrode 110 and the reference electrode 106 / reference electrode 108 changes in response to factors such as distance (e.g., distance between the sensing electrode and the corresponding reference electrode), the presence of a dielectric material, or other physical or mechanical properties. Changes in capacitance can be measured (via a self-capacitance measurement process or an alternating capacitance measurement process) and used to determine distance information. In one or more examples, the first capacitive distance sensor 114 / second capacitive distance sensor 116 can perform a capacitance measurement and solve for the distance 'd' between parallel plates using the parallel-plate formula for capacitors, where the plates are the reference electrode 106, the reference electrode 108, the sensing electrode 112, and the sensing electrode 110.

[0039] The reference electrode 106 / reference electrode 108 can be arranged on the inner or outer surface of the tank 102 to serve as a reference for a distance measurement by the second capacitive distance sensor 116 / first capacitive distance sensor 114. In the specific configuration described by Fig. In the example shown, the reference electrode 106 / reference electrode 108 are arranged on an outer surface of the tank 102.

[0040] In one or more examples, the first capacitive distance sensor 114, the second capacitive distance sensor 116, the sensing electrode 110, the sensing electrode 112, the reference electrode 106 and the reference electrode 108 can be located anywhere outside the effective range of the capacitive liquid level sensor 118 (above, below, beside it) and are not or negligibly within the effective range, since (e.g., their presence within the effective range, without limitation) would affect the capacitive coupling between the electrode 122 and the tank 102 and the liquid volume 104, including in an unpredictable way, without limitation.

[0041] In one or more examples, a measured distance is supplied to the capacitive liquid level sensor 118 as a "distance indicator" (also referred to herein as a "reference value") between the electrode 122 of the capacitive liquid level sensor 118 and the tank 102, the room 120, and a liquid volume 104 contained therein. In one or more examples, reference values ​​can each be supplied by the first capacitive distance sensor 114 and the second capacitive distance sensor 116, without limitation. The capacitive liquid level sensor 118 can, as discussed below, use the reference values ​​to modify (or more generally, determine) capacitive measurements to increase precision, thereby improving the precision of liquid level measurements that are at least partially based thereon.In one or more examples, a first reference value generated by the first capacitive distance sensor 114 and a second reference value generated by the second capacitive distance sensor 116 are used to modify a sensor value generated by the capacitive liquid level sensor 118. In various examples, the sensor value may be a capacitance value used to calculate a liquid level or a liquid level value.

[0042] Additionally or alternatively, the capacitive liquid level sensor can use 118 reference values ​​to modify (or more generally determine) values ​​based on its capacitive measurements in order to increase precision, such as values ​​representing a liquid level, without limitation.

[0043] Although two capacitive distance sensors are shown and used in various examples discussed here, more than two capacitive distance sensors can be used without exceeding the scope of protection of this disclosure, and this is expressly taken into consideration.

[0044] Fig. Figure 2 is a schematic diagram illustrating the liquid level detection system 100 in an exemplary environment 200.

[0045] The electric fields provided by the first capacitive distance sensor 114 and the second capacitive distance sensor 116 via the sensing electrode 110 and the sensing electrode 112, respectively, close their lines at the conductive surfaces of the electrically levitated conductive structure 204 of the reference electrode 108 and the electrically levitated conductive structure 202 of the reference electrode 106, respectively. It is understood, of course, that the in Fig. The two depicted lines of electric fields are visual representations of the direction and strength of the electric fields in spatial areas and are provided as an intuitive way to understand the behavior of the electric fields discussed herein.

[0046] The materials of the electrically suspended conductive structure 204 and the electrically suspended conductive structure 202 can be the same or different. In one or more examples, the electrically suspended conductive structure 204 and the electrically suspended conductive structure 202 can be formed on an electrode copper surface on a surface of the tank 102. The materials of the respective electrically conductive structures of the detection electrode 110 and the detection electrode 112 can be the same or different.In one or more examples, the electrically conductive structures of the sensing electrode 110 and the sensing electrode 112 can be formed from an electrode copper surface on a printed circuit board (PCB) coupled to a microcontroller implementing one or more of the first capacitive distance sensor 114, the second capacitive distance sensor 116 and the capacitive liquid level sensor 118.

[0047] Reference measurements (via the first capacitive distance sensor 114 and the second capacitive distance sensor 116) are only affected by the air gap or other materials between the reference electrodes and the floating reference surfaces (e.g. surfaces of the electrically floating conductive structure 204 and the electrically floating conductive structure 202 facing the detection system 124, without limitation), but not by the liquid or air inside the container.

[0048] Fig. 3A, Fig. 3B and Fig. Figure 3C are schematic diagrams that represent a liquid level detection system 100 according to different perspective views.

[0049] Fig. 3A is an isometric view of the liquid level detection system 100.

[0050] The side view of Fig. Figure 3B shows mechanical gaps (here air gaps) between the sensing system 124, including the first capacitive distance sensor 114, the second capacitive distance sensor 116, the capacitive liquid level sensor 118, and a side wall of the tank 102. Although they are in Fig. While 3B generally appear uniform, the mechanical gaps can have variable dimensions. In other words, the distance between points of the detection system 124 and points on the side wall of the tank 102 at the same vertical height can differ. For example, the distance between the detection electrode 112 and the reference electrode 108 on vertical plane A can vary (e.g., regardless of any thickness of the reference electrode 108). (which protrudes from the outer surface of tank 102, if any, without limitation) as a difference between electrode 122 and a side wall of tank 102. In fact, the horizontal width of a geometric space that defines the mechanical gap between detection system 124 and tank 102 at a given time can change based on the vertical height at which it is measured.

[0051] Furthermore, the width of a mechanical gap (distances between the detection system and the side wall of tank 102) may change over time, including the closing of a mechanical gap or the formation of a mechanical gap.

[0052] Fig. 3C is a top view of cross-sections of the liquid level detection system 100, located on the vertical planes A and B in Fig. 3B were taken. The cross-sections of Fig. Figure 3C shows exemplary electric fields from the first capacitive distance sensor 114 or the second capacitive distance sensor 116, which reach a reference electrode (e.g., the reference electrode 106 or the reference electrode 108, without limitation) and then essentially terminate at the reference electrode, while the electric fields of the capacitive liquid level sensor 118 extend into the tank 102 and interact with the tank 102, the liquid volume 104, and whatever medium (e.g., air) is located in the space 120.

[0053] Fig. Figure 4 is a schematic diagram representing a liquid level sensing system 100 in an exemplary environment 400. In the Fig. In the example shown in Figure 4, the size of the distance between the detection system (and more precisely, the electrode 122, the detection electrode 110, and the detection electrode 112) and a side wall of the tank 102 changes from a first position “Pos1” to a second position “Pos2”. In this specific example, the position of the tank 102 (and the liquid volume 104 and the space 120) changes relative to the detection system, which is stationary. This disclosure is not limited to changes in the position of the tank 102, and changes in the position of the detection system 124 relative to the tank 102, as well as changes in the respective positions of both the detection system and the tank 102, are expressly considered and do not exceed the scope of protection.

[0054] Fig. Figure 5 is a diagram 500 that illustrates a relationship between measurements generated by the first capacitive distance sensor 114, the second capacitive distance sensor 116, and the capacitive liquid level sensor 118, and the water level in a tank (e.g., the level of liquid volume 104 in tank 102, without limitation). This disclosure is not limited to water and even liquid forms of media; the use of various examples with other media and forms of media does not exceed the scope of this disclosure.

[0055] The y-axis represents capacitive measurements and reference values ​​generated by the capacitive liquid level sensor 118, the first capacitive distance sensor 114, and the second capacitive distance sensor 116, as applicable. Water level values, which are mapped to the x-axis, increase from left to right and thus represent rising water levels from left to right. Measurement values, which are mapped to the y-axis, increase from bottom to top and thus represent rising measured values ​​from bottom to top. In this example, measured values ​​(e.g., increase or decrease, without restriction) change directly proportionally to the change (e.g., increase or decrease, without restriction) in the water level. The positions Pos 1 and Pos 2 referenced in the diagram essentially correspond to those in Fig. 4 positions shown.

[0056] Line 502 represents a relationship between measurements generated by the capacitive liquid level sensor 118 and the water level at the first position, Pos1. Line 504 represents a relationship between measurements generated by the capacitive liquid level sensor 118 and the water level at the second position, Pos2. A double-sided arrow is used to indicate that there is a non-zero perpendicular distance between line 502 and line 504.

[0057] Line 506 and line 508 represent differences between the reference value Refl (generated by one of the first capacitive distance sensor 114 or the second capacitive distance sensor 116) and the reference value Ref2 (generated by the other of the first capacitive distance sensor 114 or the second capacitive distance sensor 116), which were recorded at the first position Pos1 and at the second position Pos2, respectively, between the detection system and the tank 102.

[0058] In particular, the change in the difference between the first reference value Refl and the second reference value Ref2 can be used to determine a change in a capacitive measurement used for liquid level sensing. As a non-restrictive example, the change in the difference between the first reference value Refl and the second reference value Ref2, recorded at different times, e.g., at time 0 and time 1, can be detected without restriction, and a capacitive measurement by the capacitive liquid level sensor 118 at time 1 can be modified so that it can be used to detect a change in the liquid level compared to a capacitive measurement by the capacitive liquid level sensor 118 at time 0.

[0059] Since the first reference value Refl and the second reference value Ref2 remain constant, they can be used to modify a capacitive measurement by the capacitive liquid level sensor 118, as discussed below.

[0060] Fig. Figure 6 is a schematic diagram of a liquid level detection system 100 in an exemplary environment 600.

[0061] Here, the mechanical gap between a point on the top of the detection system and the top of a side wall of tank 102 is larger than the mechanical gap between a point on the bottom of the detection system and the bottom of the side wall of tank 102. The mechanical gap between points on the detection system and points on the side wall of tank 102 increases from bottom to top. In this example, this is because tank 102 tilts from position 1 to position 2, where it is inclined.

[0062] Fig. Figure 7 is a diagram 700 that represents a relationship between measured values ​​generated by the first capacitive distance sensor 114, the second capacitive distance sensor 116 and the capacitive liquid level sensor 118, and the water level in a tank (e.g., a level of liquid volume 104 in the tank 102, without limitation).

[0063] Lines 706 and 708 represent relationships between measurements generated by the capacitive liquid level sensor 118 and the water level at a first position Pos1 and a second position Pos2, respectively. The first position Pos1 and the second position Pos2 correspond to the first position Pos1 and the second position Pos2 of tank 102, which is located in Fig. Figure 6 illustrates this. In particular, lines 702 and 704 are not perpendicular to each other. The linear relationship between capacitive measurement and liquid level, represented by line 706, thus differs from the linear relationship between capacitive measurement and liquid level, represented by line 708. The difference in the linear relationship is represented by the different respective rates of change of lines 702 and 704 and is visually represented by an increasing distance between them, which generally corresponds to the increasing mechanical gap from bottom to top when they are in the first position (Pos 1) and the second position (Pos 2).

[0064] Lines 702 and 704 represent differences between the reference value Refl (generated by either the first capacitive distance sensor 114 or the second capacitive distance sensor 116) and the reference value Ref2 (generated by either the first capacitive distance sensor 114 or the second capacitive distance sensor 116), recorded at the first position Pos1 and the second position Pos2, respectively. Specifically, since the position of the reference electrode 106 and the reference electrode 108 is fixed with respect to the tank 102, the space 120, and the liquid volume 104, the first reference value Refl and the second reference value Ref2 are both generally constant despite changing liquid levels.

[0065] Since the first reference value Refl and the second reference value Ref2 remain constant, they can be used to modify a capacitive measurement by the capacitive liquid level sensor 118, as discussed below.

[0066] Fig. Figure 8 is a flowchart illustrating Process 800 for adjusting capacitive liquid level measurements using capacitive distance measurements as reference values ​​according to one or more examples. In one or more examples, one or more of the operations discussed in relation to Process 800 can be performed by the liquid level sensing system 100.

[0067] Procedure 802 includes the start of the reference measurement.

[0068] Procedure 804 includes sensor 1 and reference 2, which are connected to ground (GND). The capacitive liquid level sensor 118, the second capacitive distance sensor 116, the sensing electrode 112, and the electrode 122 are coupled to a ground voltage source. The first capacitive distance sensor 114 and the sensing electrode 110 are not coupled to the ground voltage source at this time.

[0069] The process 806 includes the measurement reference 1 (RM1). The first capacitive distance sensor 114 performs a capacitive distance measurement and generates a value “RM1” in response to the measurement.

[0070] Operation 808 includes sensor 1 and reference 1, which are connected to ground (GND). The capacitive liquid level sensor 118, the first capacitive distance sensor 114, the sensing electrode 110, and the electrode 122 are coupled to a ground voltage source. The second capacitive distance sensor 116 and the sensing electrode 112 are not coupled to the ground voltage source at this time.

[0071] The process 810 includes the measurement reference 2 (RM2). The second capacitive distance sensor 116 performs a capacitive distance measurement and generates a value “RM2” in response to the measurement.

[0072] Process 812 includes the start of the measurement. This is the start of a measurement by the capacitive liquid level sensor 118.

[0073] Procedure 814 includes reference 1 and reference 2, which are connected to ground (GND). The first capacitive distance sensor 114, the sensing electrode 110, the second capacitive distance sensor 116, and the sensing electrode 112 are coupled to a ground voltage source. The capacitive liquid level sensor 118 and the electrode 122 are not coupled to a ground voltage source at this time.

[0074] The process 816 includes an s1 measurement (SM). The capacitive liquid level sensor 118 performs a capacitive liquid level sensing measurement and generates a value “SM” in response to the measurement.

[0075] Procedure 818 includes M = SM + kl(RM1) + k2(RM2). The values ​​RM1 and RM2 are multiplied by the scaling factors k1 and k2 and combined to obtain an adjustment amount. The adjustment amount is added to the value SM to obtain an adjusted capacitive liquid level reading. In some cases, the adjustment can be positive, and in others, negative, depending on whether the capacity value was increased or decreased by the change in position. In one or more examples, the scaling factors k1 and k2 can be linear functions, nonlinear functions, or expressions defined by piecewise functions. In one or more examples, the scaling factors k1 and k2 can be chosen to scale the first reference value and the second reference value according to predetermined linear or nonlinear relationships.Alternatively or additionally, in one or more examples, the scaling factors k1 and k2 can be chosen based on a non-linear relationship between the error in a capacitance value, which is acquired and used for liquid measurement, and the width of an air gap, for example based on the formula for a planar capacitor C = ε*S / d, where 'd' is the distance between capacitor plates in the formula and here corresponds to the width of the mechanical gap, 'S' is the area of ​​the plates of the capacitor and here corresponds to the area of ​​the sensing electrodes and reference electrodes, and epsilon 'ε' is the permittivity / dielectric constant of the material between the capacitor plates and here can correspond to the permittivity of the air between the sensing electrodes and reference electrodes.

[0076] Procedure 820 includes the compensated measurement result. The adjusted value is output or stored as a value representative of the water level in tank 102.

[0077] Fig. Figure 9 is a flowchart illustrating a process 900 for determining a liquid level measurement according to one or more examples. Although the exemplary process 900 represents a specific sequence of operations, the sequence can be modified without infringing upon the scope of protection of this disclosure. For example, some of the illustrated operations can be performed in parallel or in a different sequence that does not substantially affect the function of the process 900. In other examples, different components of an exemplary device or system implementing the process 900 can perform functions essentially at the same time or in a specific sequence. As a non-limiting example, one or more operations of the process 900 can be performed by the liquid level sensing system 100 of the system 124.

[0078] According to one or more examples, process 900 may include obtaining a capacitance value generated at least partially in response to a capacitive level measurement performed using a level sensing electrode of a capacitive level sensor, wherein the capacitance value depends at least partially on a level of a liquid within a holding area of ​​a holding structure in process 902.

[0079] According to one or more examples, process 900 may include obtaining a first reference value generated at least partially in response to a first capacitive distance measurement performed using a first distance sensing electrode of a capacitive distance sensor, wherein the first reference value depends at least partially on a distance between the first distance sensing electrode and a first conductive structure on a wall of the holding structure in process 904.

[0080] According to one or more examples, process 900 may include obtaining a second reference value generated at least partially in response to a second capacitive distance measurement performed using a second distance sensing electrode of a second capacitive distance sensor, wherein the second reference value depends at least partially on a distance between the second distance sensing electrode and a second conductive structure on the wall of the holding structure in process 906.

[0081] According to one or more examples, process 900 may include changing the capacity value at least partially based on the first reference value and the second reference value in operation 908.

[0082] According to one or more examples, process 900 may include determining a value representative of the liquid level within the holding area of ​​the holding structure, at least partially based on the changed capacity value in process 910.

[0083] Fig. Figure 10 is a flowchart illustrating a process 1000 for changing a capacity value, at least partially, based on capacitive distance measurements, according to one or more examples. Although the exemplary process 1000 represents a specific sequence of operations, the sequence can be modified without infringing upon the scope of protection of this disclosure. For example, some of the illustrated operations can be performed in parallel or in a different sequence that does not substantially affect the function of the process 1000. In other examples, different components of an exemplary device or system implementing the process 1000 can perform functions essentially at the same time or in a specific sequence.One or more operations of process 1000 can be carried out, as a non-limiting example, by the liquid level detection system 100 of system 124.

[0084] According to one or more examples, process 1000 may include determining a difference between the first reference value and the second reference value in operation 1002.

[0085] According to one or more examples, process 1000 may include changing the capacity value at least partially based on the difference between the first reference value and the second reference value in operation 1004.

[0086] Fig. Figure 11 is a flowchart illustrating a process 1100 for providing a capacitive liquid level sensing system near a holding structure for liquid level measurement, according to one or more examples. Although the exemplary process 1100 represents a specific sequence of operations, the sequence can be modified without infringing upon the scope of protection of this disclosure. For example, some of the illustrated operations can be performed in parallel or in a different sequence that does not substantially affect the function of the process 1100. In other examples, different components of an exemplary device or system implementing the process 1100 can perform functions essentially at the same time or in a specific sequence.One or more operations of process 1100 can be carried out, as a non-limiting example, by the liquid level detection system 100 of system 124.

[0087] According to one or more examples, process 1100 may include the provision of the following near the wall of the holding structure: the level sensing electrode, the first distance sensing electrode, and the second distance sensing electrode in process 1102.

[0088] According to one or more examples, process 1100 may include the provision of the level sensing electrode opposite the wall of the holding structure in process 1104.

[0089] According to one or more examples, process 1100 may include providing the first distance sensing electrode adjacent to a first end of the level sensing electrode, wherein the first distance sensing electrode is opposite the first conductive structure on the wall of the holding structure, wherein the first conductive structure is electrically connected to ground voltage potential, in process 1106.

[0090] According to one or more examples, process 1100 may include providing the second distance sensing electrode adjacent to a second end of the level sensing electrode, wherein the second distance sensing electrode is opposite the second conductive structure on the wall of the holding structure, wherein the second conductive structure is electrically connected to the ground voltage potential, in process 1108.

[0091] Fig. Figure 12 is a flowchart illustrating a process 1200 for providing a capacitive liquid level sensing system near a holding structure for liquid level measurement, according to one or more examples. Although the exemplary process 1200 represents a specific sequence of operations, the sequence can be modified without infringing upon the scope of protection of this disclosure. For example, some of the illustrated operations can be performed in parallel or in a different sequence that does not substantially affect the function of the process 1200. In other examples, different components of an exemplary device or system implementing the process 1200 can perform functions essentially at the same time or in a specific sequence.One or more operations of process 1200 can be carried out, as a non-limiting example, by the liquid level detection system 100 of system 124.

[0092] According to one or more examples, process 1200 may include the provision of the following near the wall of the holding structure: the level sensing electrode, the first distance sensing electrode, and the second distance sensing electrode in process 1212.

[0093] According to one or more examples, process 1200 may include the provision of the level sensing electrode opposite the wall of the holding structure in process 1214.

[0094] According to one or more examples, process 1200 can include providing the first distance sensing electrode adjacent to a first end of the level sensing electrode, wherein the first distance sensing electrode is opposite the first conductive structure on the wall of the holding structure, wherein the first conductive structure is electrically floating with respect to the first capacitive distance sensor in process 1216.

[0095] According to one or more examples, process 1200 can include providing the second distance sensing electrode adjacent to a second end of the level sensing electrode, wherein the second distance sensing electrode is opposite the second conductive structure on the wall of the holding structure, wherein the second conductive structure is electrically floating with respect to the second capacitive distance sensor in process 1218.

[0096] Fig. 13 and Fig. 14 are flowcharts that together represent a process 1300 for determining a liquid level of a holding structure that changes its position according to one or more examples.

[0097] Although the exemplary process 1300 represents a specific sequence of operations, this sequence can be modified without deviating from the scope of protection of this disclosure. For example, some of the described operations can be performed in parallel or in a different sequence that does not substantially affect the function of process 1300. In other examples, different components of an exemplary device or system implementing process 1300 can perform functions essentially at the same time or in a specific sequence. As a non-limiting example, one or more operations of process 1300 can be performed by the liquid level sensing system 100 of system 124.

[0098] According to one or more examples, process 1300 may include obtaining a further capacity value, which is generated at least partially in response to a further capacitive level measurement performed using the level sensing electrode of a capacitive level sensor, wherein the further capacity value depends at least partially on a level of a liquid within the holding area of ​​the holding structure in process 1302.

[0099] According to one or more examples, process 1300 may include obtaining a first further reference value generated at least partially in response to a first further capacitive distance measurement performed using the first distance sensing electrode of a capacitive distance sensor, wherein the first further reference value depends at least partially on a distance between the first distance sensing electrode and the first conductive structure on the wall of the holding structure in process 1304.

[0100] According to one or more examples, process 1300 may include obtaining a second further reference value, which is generated at least partially in response to a second further capacitive distance measurement performed using the second distance sensing electrode of the second capacitive distance sensor, wherein the second reference value depends at least partially on a distance between the first distance sensing electrode and the second conductive structure on the wall of the holding structure in process 1306.

[0101] According to one or more examples, process 1300 may include determining a first difference value based on a difference between the first reference value and the second reference value in operation 1308.

[0102] According to one or more examples, process 1300 may include determining a second difference value based on a difference between the first further reference value and the second further reference value in operation 1310.

[0103] According to one or more examples, process 1300 may include determining a first scaling factor and a second scaling factor at least partially based on the first difference value and the second difference value in operation 1312.

[0104] Fig. 14 continues the process 1300.

[0105] According to one or more examples, process 1300 may include changing the first further reference value based on the first scaling factor in operation 1414.

[0106] According to one or more examples, process 1300 may include changing the second further reference value based on the second scaling factor in operation 1416.

[0107] According to one or more examples, process 1300 may include changing the further capacity value at least partially based on the changed first further reference value and the changed second further reference value; and in operation 1418.

[0108] According to one or more examples, process 1300 can include determining another value representing the liquid level within the holding area of ​​the holding structure, at least partially based on the changed further capacity value in process 1420. The system includes one process 1300.

[0109] It is understood by experts that functional elements of the examples disclosed herein (e.g., functions, operations, actions, processes and / or procedures) can be implemented in any suitable hardware, software, firmware or combinations thereof. Fig. Section 15 illustrates non-restrictive examples of implementations of functional elements disclosed herein. In some examples, some or all sections of the functional elements disclosed herein can be performed by hardware capable of executing the functional elements.

[0110] Fig.Figure 15 is a block diagram of a logic circuit 1500, which can be used in some examples to implement various functions, operations, actions, processes, or procedures disclosed herein. The circuit 1500 includes one or more processors 1502 (hereafter sometimes referred to as "processors 1502") that are operationally coupled to one or more data storage devices 1504 (hereafter sometimes referred to as "memories 1504"). The memories 1504 include machine-executable instructions 1508 stored therein, and the processors 1502 include the logic circuit 1506. The machine-executable instruction information 1508 describes functional elements that can be implemented (e.g., performed) by the logic circuit 1506. The logic circuit 1506 is designed to implement (e.g., perform) the functional elements described by the machine-executable instructions 1508.The switching logic 1500 should be considered as special hardware for executing the functional elements described by the machine-executable instructions 1508. In some examples, the processors 1502 can execute the functional elements described by the machine-executable instructions 1508 sequentially, simultaneously (e.g., on one or more different hardware platforms), or in one or more parallel process streams.

[0111] When implemented by the logic circuit 1506 of the processors 1502, the machine-executable instructions 1508 adapt the processors 1502 to perform operations of examples disclosed herein, including those discussed in relation to the liquid level sensing system 100, the environment 200, the environment 400 or the environment 600; or the sensing system 124; or the first capacitive distance sensor 114, the second capacitive distance sensor 116 or the capacitive liquid level sensor 118. As a non-limiting example, the machine-executable instructions 1508 can adapt the processors 1502 to perform some or all of the operations for adjusting the capacity liquid level measurement values, including one or more of the following: the process 800, the process 900, the process 1000, the process 1100, the process 1200, or the process 1300.

[0112] Also as a non-limiting example, the machine-executable instructions 1508 can adapt the processors 1502 to perform some or all of the features, functions, or operations disclosed herein for one or more of the following: the sensing system 124. More specifically, features, functions, or operations disclosed herein for one or more of the following: the first capacitive distance sensor 114, the second capacitive distance sensor 116, the capacitive liquid level sensor 118.

[0113] The processors 1502 may include a general-purpose processor, a special-purpose processor, a central processing unit (CPU), a microcontroller, a programmable logic controller (PLC), a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or any other programmable logic device, discrete gate or transistor logic, discrete hardware components, any other programmable device, or any combination thereof designed to perform the functions disclosed herein. A general-purpose computer, including a processor, is considered a special-purpose computer if the general-purpose computer executes functional elements corresponding to the machine-executable instructions 1508 (e.g., software code, firmware code, hardware descriptions) that refer to examples in this disclosure.It should be noted that a general-purpose processor (which may also be referred to herein as a host processor or simply as the host) can be a microprocessor, but alternatively, the Processors 1502 can include any conventional processor, control unit, microcontroller, or state machine. The Processors 1502 can also be implemented as a combination of data processing devices, such as a combination of a DSP and a microprocessor, a plurality of microprocessors, one or more microprocessors in conjunction with a DSP core, or any other such configuration.

[0114] In some examples, the storage 1504 includes volatile data storage (e.g., random access memory (RAM)), non-volatile data storage (e.g., flash memory, a hard disk drive, a solid-state drive, an erasable programmable read-only memory (EPROM), without limitation). In some examples, the processors 1502 and the storage 1504 can be implemented in a single device (e.g., in a semiconductor device product, in a system-on-a-chip (SoC), without limitation). In some examples, the processors 1502 and the storage 1504 can be implemented in separate devices.

[0115] In some examples, the machine-executable instructions 1508 may include computer-readable instructions (e.g., software code, firmware code). As a non-restrictive example, the computer-readable instructions may be stored by the memory 1504, directly called by the processors 1502, and executed by the processors 1502 using at least the logic circuit 1506. Also as a non-restrictive example, the computer-readable instructions may be stored on the memory 1504, transferred to a storage device (not shown) for execution, and executed by the processors 1502 using at least the logic circuit 1506. Accordingly, in some examples, the logic circuit 1506 includes an electrically configurable logic circuit 1506.

[0116] In some examples, the machine-executable instructions 1508 can describe hardware (e.g., a circuit) to be implemented in the logic circuit 1506 to perform the functional elements. This hardware can be described at a number of levels of abstraction, from concrete transistor layouts to highly abstract description languages. At a high level of abstraction, a hardware description language (HDL), such as an IEEE standard hardware description language, can be used. Non-restrictive examples include VERILOG®, SYSTEMVERILOG™, or a hardware description language using VLSI (Very Large Scale Integration) (VHDL).

[0117] HDL descriptions can be converted at will into descriptions at any of numerous other levels of abstraction. As a non-restrictive example, a highly abstract description can be converted into a logic-level description, such as a register-transfer language (RTL), a gate-level (GL), a layout-level, or a mask-level description. As a non-restrictive example, microoperations performed by hardware logic circuits (e.g.,The description of gates, flip-flops, registers (without limitation) of the logic circuit 1506 is to be performed in an RTL and then converted into a GL description by a synthesis tool, and the GL description can be converted by a placement and routing tool into a layout-level description corresponding to a physical layout of an integrated circuit, a programmable logic device, discrete gate or transistor logic, discrete hardware components, or combinations thereof. Accordingly, in some examples, the capture system 124 may include an HDL, an RTL, a GL description, a mask-level description, another hardware description, or any combination thereof.

[0118] In examples where the machine-executable instructions 1508 include a hardware description (at any level of abstraction), a system (not shown, but including storage 1504) implements the hardware description provided by the machine-executable instructions 1508. As a non-restrictive example, the processors 1502 may include a programmable logic device (e.g., an FPGA or a PLC), and the logic circuits 1506 may be electrically controlled to implement a circuit arrangement corresponding to the hardware description. Also as a non-restrictive example, the logic circuit 1506 may include hard-wired logic manufactured by a fabrication system (not shown, but including storage 1504) according to the hardware description of the machine-executable instructions 1508.

[0119] Regardless of whether the machine-executable instructions 1508 include computer-readable instructions or a hardware description, the logic circuit 1506 is designed to perform the functional elements described by the machine-executable instructions 1508 when the functional elements of the machine-executable instructions 1508 are implemented. It should be noted that, although a hardware description may not directly describe functional elements, a hardware description indirectly describes functional elements that can perform the hardware elements described by the hardware description.

[0120] As used in this disclosure, the terms “module” or “component” may refer to specific hardware implementations configured to perform the actions of the module or component and / or software objects or routines that can be stored on and / or executed by general-purpose hardware (e.g., computer-readable media, processing devices, without limitation) of the computing system. In some examples, the various components, modules, engines, and services described in this disclosure may be implemented as objects or processes that run on the computing system (e.g., as separate threads).Although some of the systems and methods described in the present disclosure are generally described as being implemented in software (stored on and / or executed by universal hardware), specific hardware implementations or a combination of software and specific hardware implementations are also possible and are considered.

[0121] As used in the present revelation, the term “combination” in relation to a multitude of elements can include a combination of all the elements or any of several different subcombinations of some of the elements. For example, the phrase “A, B, C, D or combinations thereof” can refer to any one of A, B, C or D; the combination of each of A, B, C and D; and any subcombination of A, B, C or D, such as A, B and C; A, B and D; A, C and D; B, C and D; A and B; A and C; A and D; B and C; B and D; or C and D.

[0122] Terms used in this disclosure, and in particular in the accompanying claims (e.g., the main parts of the accompanying claims, without limitation), are generally to be understood as "open" terms (e.g., the term "including" should be interpreted as "including, without limitation," the term "having" should be interpreted as "having at least"; the term "includes" should be interpreted as "includes, without limitation"). As used herein, the term "each" means "some or a whole." As used herein, the term "all" means a "whole."

[0123] Furthermore, if a specific number is intended in an introductory claim statement, this intention will be expressly stated in the claim, and in the absence of such a statement, no such intention exists. For example, the following appended claims may contain the use of the introductory phrases "at least one" and "one or more" to introduce claim statements. However, the use of such phrases should not be interpreted to imply that introducing a claim statement with the indefinite articles "one" or "a" limits a particular claim containing such an introduced claim statement to examples that contain only one such statement, even if the same claim includes the introductory phrases "one or more" or "at least one" and indefinite articles such as "one" or "a" (e.g.,“A” and / or “an” should be interpreted as meaning “at least one” or “one or more”, without restriction); the same applies to the use of certain articles used to introduce claims.

[0124] Even if a specific number of an introduced claim statement is explicitly stated, the person skilled in the art will additionally recognize that such a statement should be interpreted as meaning at least the stated number (e.g., the mere statement of "two statements" without any other modifiers means at least two statements, or two or more statements without limitation). Furthermore, in cases where a convention is used analogously to "at least one of A, B, and C, without being limited thereto" or "one or more of A, B, and C, without being limited thereto," such a construction should generally include A alone, B alone, C alone, A and B together, A and C together, B and C together, or A, B, and C together, without being limited thereto.

[0125] Furthermore, any disjunctive word or phrase representing two or more alternative terms, whether in the description, claims, or drawings, should be understood as including either term, either term, or both terms. For example, the phrase "A or B" should be understood to include the possibilities of "A" or "B" or "A and B".

[0126] Other non-restrictive examples include: Example 1: Method comprising: Obtaining a capacitance value generated at least partially in response to a capacitive level measurement performed using a level sensing electrode of a capacitive level sensor, wherein the capacitance value depends at least partially on a level of a liquid within a holding area of ​​a holding structure; Obtaining a first reference value generated at least partially in response to a first capacitive distance measurement performed using a first distance sensing electrode of a capacitive distance sensor, wherein the first reference value depends at least partially on a distance between the first distance sensing electrode and a first conductive structure on a wall of the holding structure;Obtaining a second reference value, generated at least partially in response to a second capacitive distance measurement performed using a second distance sensing electrode of a second capacitive distance sensor, wherein the second reference value depends at least partially on a distance between the second distance sensing electrode and a second conductive structure on the wall of the holding structure; changing the capacitance value at least partially based on the first reference value and the second reference value; and determining a value representative of the liquid level within the holding area of ​​the holding structure, at least partially based on the changed capacitance value. Example 2: Procedure according to Example 1, wherein changing the capacity value includes at least partially based on the first reference value and the second reference value: determining a difference between the first reference value and the second reference value; and changing the capacity value at least partially based on the difference between the first reference value and the second reference value. Example 3: Method according to Examples 1 and 2, comprising: providing near the wall of the holding structure: the level sensing electrode, the first distance sensing electrode and the second distance sensing electrode. Example 4: Method according to Examples 1 to 3, wherein providing near the wall of the holding structure comprises: the level sensing electrode, the first distance sensing electrode and the second distance sensing electrode: providing the level sensing electrode opposite the wall of the holding structure; providing the first distance sensing electrode adjacent to a first end of the level sensing electrode, wherein the first distance sensing electrode is opposite the first conductive structure on the wall of the holding structure, wherein the first conductive structure is electrically connected to the ground potential;and providing the second distance sensing electrode adjacent to a second end of the level sensing electrode, wherein the second distance sensing electrode is opposite the second conductive structure on the wall of the holding structure, wherein the second conductive structure is electrically connected to the ground voltage potential. Example 5: Method according to Examples 1 to 4, wherein providing near the wall of the holding structure comprises: the level sensing electrode, the first distance sensing electrode and the second distance sensing electrode: providing the level sensing electrode opposite the wall of the holding structure; providing the first distance sensing electrode adjacent to a first end of the level sensing electrode, wherein the first distance sensing electrode is opposite the first conductive structure on the wall of the holding structure, wherein the first conductive structure is electrically floating with respect to the first capacitive distance sensor;and providing the second distance sensing electrode adjacent to a second end of the level sensing electrode, wherein the second distance sensing electrode is opposite the second conductive structure on the wall of the holding structure, wherein the second conductive structure is electrically floating with respect to the second capacitive distance sensor. Example 6: Method according to Examples 1 to 5, comprising: obtaining a further capacitance value, which is generated at least partially in response to a further capacitive level measurement performed using the level sensing electrode of a capacitive level sensor, wherein the further capacitance value is at least partially dependent on a level of a liquid within the holding area of ​​the holding structure; obtaining a first further reference value, which is generated at least partially in response to a first further capacitive distance measurement performed using the first distance sensing electrode of a capacitive distance sensor, wherein the first further reference value is at least partially dependent on a distance between the first distance sensing electrode and the first conductive structure on the wall of the holding structure;Obtaining a second further reference value, generated at least partially in response to a second further capacitive distance measurement performed using the second distance sensing electrode of the second capacitive distance sensor, wherein the second reference value depends at least partially on a distance between the first distance sensing electrode and the second conductive structure on the wall of the mounting structure; determining a first differential value based on a difference between the first reference value and the second reference value; determining a second differential value based on a difference between the first further reference value and the second further reference value; determining a first scaling factor and a second scaling factor at least partially based on the first differential value and the second differential value;Changing the first further reference value based on the first scaling factor; changing the second further reference value based on the second scaling factor; changing the further capacity value at least partially based on the changed first further reference value and the changed second further reference value; and determining a further value representative of the fluid level within the holding area of ​​the holding structure, at least partially based on the changed further capacity value. Example 7: Device comprising: a capacitive level sensor, wherein the capacitive level sensor includes a level sensing electrode, wherein the capacitive level sensor is configured to generate capacitance values ​​at least partially in response to capacitive level measurements via the level sensing electrode of the capacitive level sensor, wherein the capacitance values ​​depend at least partially on the level of a liquid within a holding area of ​​a holding structure;a first capacitive distance sensor with a distance sensing electrode, wherein the first capacitive distance sensor is configured to generate reference values ​​at least partially in response to capacitive distance measurements via the distance sensing electrode of the first capacitive distance sensor, wherein the reference values ​​generated by the first capacitive distance sensor depend at least partially on the distance between the first distance sensing electrode and a first conductive structure on a wall of the holding structure;a second capacitive distance sensor with a distance sensing electrode, wherein the second capacitive distance sensor is configured to generate reference values ​​at least partially in response to capacitive distance measurements via the distance sensing electrode of the first capacitive distance sensor, wherein the reference values ​​generated by the second capacitive distance sensor depend at least partially on the distance between the second distance sensing electrode and a second conductive structure on the wall of the mounting structure; and a logic circuit for: obtaining a capacitance value from the capacitive level sensor; obtaining a first reference value from the first capacitive sensor; obtaining a second reference value from the second capacitive sensor; changing the capacitance values ​​at least partially based on the first reference value and the second reference value;and determining a value that is representative of the fluid level within the holding area of ​​the holding structure, at least partially based on the changed capacity value. Example 8: Setup according to Example 7, wherein: the first distance sensing electrode is arranged adjacent to a first end of the level sensing electrode; and the second distance sensing electrode is arranged adjacent to a second end of the level sensing electrode. Example 9: Setup according to Examples 7 and 8, wherein the first distance sensing electrode and the second distance sensing electrode are located outside an effective area of ​​the capacitive level sensor. Example 10: Setup according to Examples 7 to 9, wherein the logic circuit is set up to: determine a difference between the first reference value and the second reference value; and change the capacitance value at least partially based on the difference between the first reference value and the second reference value. Example 11: Setup according to Examples 7 to 10, wherein the logic circuit is configured to: obtain another capacitance value from the capacitive level sensor; obtain a first additional reference value from the first distance sensor; obtain a second additional reference value from the second capacitive distance sensor; determine a first differential value based on a difference between the first reference value and the second reference value; determine a second differential value based on a difference between the first additional reference value and the second additional reference value; determine a first scaling factor and a second scaling factor at least partially based on the first differential value and the second differential value; change the first additional reference value based on the first scaling factor; change the second additional reference value based on the second scaling factor;Changing the further capacity value at least partially based on the changed first further reference value and the changed second further reference value; and determining a further value that is representative of the fluid level within the holding area of ​​the holding structure, at least partially based on the changed further capacity value. Example 12: Device according to Examples 7 to 11, comprising a support structure having on one surface thereof: the level sensing electrode of the capacitive level sensor; the distance sensing electrode of the first capacitive distance sensor; and the distance sensing electrode of the second capacitive distance sensor. Example 13: System comprising: a support structure; a support structure, wherein the support structure has a surface that is to be positioned near a wall of the support structure; a capacitive level sensor, wherein the capacitive level sensor comprises a level sensing electrode on the surface of the support structure; a first capacitive distance sensor, wherein the first capacitive distance sensor includes a first distance sensing electrode and a first conductive structure, wherein the first distance sensing electrode is arranged on the surface of the support structure adjacent to a first end of the level sensing electrode, and wherein the first distance sensing electrode is opposite a first conductive structure on a wall of the support structure;and a second capacitive distance sensor, wherein the second capacitive distance sensor includes a second distance sensing electrode and a second conductive structure, wherein the second distance sensing electrode is arranged on the surface of the support structure adjacent to a second end of the level sensing electrode, wherein the second distance sensing electrode is opposite a second conductive structure on the wall of the support structure. Example 14: System according to Example 13, wherein the first conductive structure and the second conductive structure are electrically connected to a ground potential. Example 15: System according to Examples 13 and 14, wherein the first conductive structure and the second conductive structure are electrically floating with respect to the first capacitive distance sensor. Example 16: System according to Examples 13 to 15, comprising a logic circuit for: obtaining a capacitance value from the capacitive level sensor; obtaining a first reference value from the first capacitive sensor; obtaining a second reference value from the second capacitive sensor; changing the capacitance values ​​at least partially based on the first reference value and the second reference value; and determining a value representative of the liquid level within the holding area of ​​the holding structure, at least partially based on the changed capacitance value. Example 17: System according to Examples 13 to 16, wherein the logic circuit is configured to: obtain another capacitance value from the capacitive level sensor; obtain a first additional reference value from the first distance sensor; obtain a second additional reference value from the second capacitive distance sensor; determine a first differential value based on a difference between the first reference value and the second reference value; determine a second differential value based on a difference between the first additional reference value and the second additional reference value; determine a first scaling factor and a second scaling factor at least partially based on the first differential value and the second differential value; change the first additional reference value based on the first scaling factor; change the second additional reference value based on the second scaling factor;Changing the further capacity value at least partially based on the changed first further reference value and the changed second further reference value; and determining a further value that is representative of the fluid level within the holding area of ​​the holding structure, at least partially based on the changed further capacity value. Example 18: System according to Examples 13 to 17, wherein the logic circuit is configured to: obtain another capacitance value from the capacitive level sensor; obtain a first further reference value from the first distance sensor; obtain a second further reference value from the second capacitive distance sensor; determine a first differential value based on a difference between the first reference value and the second reference value; determine a second differential value based on a difference between the first further reference value and the second further reference value; generate a signal to indicate a change in the position of the holding structure, at least partially in response to the first differential value and the second differential value being different.

[0127] Although the present disclosure has been described herein with respect to certain illustrated examples, those skilled in the art will recognize and understand that the present invention is not limited to these. Rather, many additions, omissions, and modifications can be made to the illustrated and described examples without altering the scope of protection of the invention as claimed below together with its legal equivalents. Furthermore, features of one example can be combined with features of another example and still remain within the scope of protection of the invention as envisaged by the inventor. QUOTES INCLUDED IN THE DESCRIPTION

[0000] This list of documents cited by the applicant was automatically generated and is included solely for the reader's convenience. The list is not part of the German patent or utility model application. The DPMA accepts no liability for any errors or omissions. Cited patent literature

[0000] US 63 / 510,980

[0001]

Claims

[1] Procedure, encompassing: Obtaining a capacitance value generated at least partially in response to a capacitive level measurement performed using a level sensing electrode of a capacitive level sensor, wherein the capacitance value depends at least partially on a liquid level within a holding area of ​​a holding structure; Obtaining a first reference value, generated at least partially in response to a first capacitive distance measurement performed using a first distance sensing electrode of a capacitive distance sensor, wherein the first reference value depends at least partially on a distance between the first distance sensing electrode and a first conductive structure on a wall of the holding structure; Obtaining a second reference value, generated at least partially in response to a second capacitive distance measurement performed using a second distance sensing electrode of a second capacitive distance sensor, wherein the second reference value depends at least partially on a distance between the second distance sensing electrode and a second conductive structure on the wall of the holding structure; Changing the capacity value, at least partially, based on the first reference value and the second reference value; and Determining a value that is representative of the fluid level within the holding area of ​​the holding structure, at least partially based on the modified capacity value. [2] The method of claim 1, wherein the changing of the capacity value comprises at least partially based on the first reference value and the second reference value: Determining the difference between the first reference value and the second reference value; and Changing the capacity value at least partially based on the difference between the first reference value and the second reference value. [3] The method of claim 1, comprising: Position near the wall of the support structure: the level sensing electrode, the first distance sensing electrode, and the second distance sensing electrode. [4] Method according to claim 3, wherein providing near the wall of the holding structure: the level sensing electrode, the first distance sensing electrode and the second distance sensing electrode, comprises: Positioning the level sensing electrode opposite the wall of the support structure; Providing the first distance sensing electrode adjacent to a first end of the level sensing electrode, wherein the first distance sensing electrode is opposite the first conductive structure on the wall of the holding structure, wherein the first conductive structure is electrically connected to the ground voltage potential; and Providing the second distance sensing electrode adjacent to a second end of the level sensing electrode, wherein the second distance sensing electrode is opposite the second conductive structure on the wall of the holding structure, wherein the second conductive structure is electrically connected to the ground voltage potential. [5] Method according to claim 3, wherein providing near the wall of the holding structure: the level sensing electrode, the first distance sensing electrode and the second distance sensing electrode, comprises: Positioning the level sensing electrode opposite the wall of the support structure; Providing the first distance sensing electrode adjacent to a first end of the level sensing electrode, wherein the first distance sensing electrode is opposite the first conductive structure on the wall of the holding structure, wherein the first conductive structure is electrically floating with respect to the first capacitive distance sensor; and Providing the second distance sensing electrode adjacent to a second end of the level sensing electrode, wherein the second distance sensing electrode is opposite the second conductive structure on the wall of the holding structure, wherein the second conductive structure is electrically floating with respect to the second capacitive distance sensor. [6] The method of claim 1, comprising: Obtaining a further capacitance value, generated at least partially in response to a further capacitive level measurement performed using the level sensing electrode of a capacitive level sensor, wherein the further capacitance value depends at least partially on a liquid level within the holding area of ​​the holding structure; Obtaining a first further reference value, generated at least partially in response to a first further capacitive distance measurement performed using the first distance sensing electrode of a capacitive distance sensor, wherein the first further reference value depends at least partially on a distance between the first distance sensing electrode and the first conductive structure on the wall of the holding structure; Obtaining a second further reference value, generated at least partially in response to a second further capacitive distance measurement, which is performed using the second distance sensing electrode of the second capacitive distance sensor, wherein the second reference value depends at least partially on a distance between the first distance sensing electrode and the second conductive structure on the wall of the holding structure; Determining a first difference value based on a difference between the first reference value and the second reference value; Determining a second difference value based on a difference between the first further reference value and the second further reference value; Determining a first scaling factor and a second scaling factor at least partially based on the first difference value and the second difference value; Changing the first further reference value based on the first scaling factor; Changing the second further reference value based on the second scaling factor; Changing the further capacity value at least partially based on the changed first further reference value and the changed second further reference value; and Determining a further value that is representative of the fluid level within the holding area of ​​the holding structure, at least partially based on the modified further capacity value. [7] Institution, comprehensive: a capacitive level sensor, wherein the capacitive level sensor includes a level sensing electrode, wherein the capacitive level sensor is configured to generate capacitance values ​​at least partially in response to capacitive level measurements via the level sensing electrode of the capacitive level sensor, where the capacity values ​​depend at least partially on the fill level of a liquid within a holding area of ​​a holding structure; a first capacitive distance sensor with a distance sensing electrode, wherein the first capacitive distance sensor is configured to generate reference values ​​at least partially in response to capacitive distance measurements via the distance sensing electrode of the first capacitive distance sensor, wherein the reference values ​​generated by the first capacitive distance sensor depend at least partially on the distance between the first distance sensing electrode and a first conductive structure on a wall of the holding structure; a second capacitive distance sensor with a Distance sensing electrode, wherein the second capacitive distance sensor is configured to generate reference values ​​at least partially in response to capacitive distance measurements via the distance sensing electrode of the first capacitive distance sensor, wherein the reference values ​​generated by the second capacitive distance sensor depend at least partially on the distance between the second distance sensing electrode and a second conductive structure on the wall of the support structure; and a logic circuit for: Obtaining a capacity value from the capacitive level sensor; Obtaining an initial reference value from the first capacitive distance sensor; Obtaining a second reference value from the second capacitive distance sensor; Changing the capacity values, at least partially, based on the first reference value and the second reference value; and Determining a value that is representative of the fluid level within the holding area of ​​the holding structure, at least partially based on the changed capacity value. [8] Device according to claim 7, wherein: the first distance sensing electrode is arranged adjacent to a first end of the level sensing electrode; and the second distance sensing electrode is arranged adjacent to a second end of the level sensing electrode. [9] Device according to claim 8, wherein the first distance sensing electrode and the second distance sensing electrode are arranged outside an effective area of ​​the capacitive level sensor. [10] Device according to claim 7, wherein the logic circuit is configured to: Determining the difference between the first reference value and the second reference value; and Changing the capacity value at least partially based on the difference between the first reference value and the second reference value. [11] Device according to claim 7, wherein the logic circuit is configured to: Obtaining another capacity value from the capacitive level sensor; Receiving a first additional reference value from the first distance sensor; Receiving a second additional reference value from the second capacitive distance sensor; Determining a first difference value based on a difference between the first reference value and the second reference value; Determining a second difference value based on a difference between the first further reference value and the second further reference value; Determining a first scaling factor and a second scaling factor at least partially based on the first difference value and the second difference value; Changing the first further reference value based on the first scaling factor; Changing the second further reference value based on the second scaling factor; Changing the further capacity value at least partially based on the changed first further reference value and the changed second further reference value; and Determining a further value that is representative of the fluid level within the holding area of ​​the holding structure, at least partially based on the modified further capacity value. [12] Device according to claim 7, comprising a support structure, having on a surface thereof: the level detection electrode of the capacitive level sensor; the distance sensing electrode of the first capacitive distance sensor; and the distance detection electrode of the second capacitive distance sensor. [13] System, encompassing: a support structure; a support structure, wherein the support structure has a surface that is to be positioned near a wall of the support structure; a capacitive level sensor, wherein the capacitive level sensor comprises a level sensing electrode on the surface of the support structure; a first capacitive distance sensor, wherein the first capacitive distance sensor includes a first distance sensing electrode and a first conductive structure, wherein the first distance sensing electrode is arranged on the surface of the support structure adjacent to a first end of the level sensing electrode, wherein the first distance sensing electrode is opposite a first conductive structure on a wall of the support structure; and a second capacitive distance sensor, wherein the second capacitive distance sensor comprises a second distance sensing electrode and a second conductive structure, wherein the second distance sensing electrode is arranged on the surface of the support structure adjacent to a second end of the level sensing electrode, wherein the second distance sensing electrode is opposite a second conductive structure on the wall of the support structure. [14] System according to claim 13, wherein the first conductive structure and the second conductive structure are electrically connected to a ground potential. [15] System according to claim 13, wherein the first conductive structure and the second conductive structure are electrically levitated with respect to the first capacitive distance sensor. [16] System according to claim 13, comprising a logic circuit configured to: Obtaining a capacity value from the capacitive level sensor; Obtaining an initial reference value from the first capacitive sensor; Obtaining a second reference value from the second capacitive sensor; Changing the capacity values, at least partially, based on the first reference value and the second reference value; and Determining a value that is representative of the fluid level within a holding area of ​​the holding structure, at least partially based on the changed capacity value. [17] System according to claim 16, wherein the logic circuit is configured to: Obtaining another capacity value from the capacitive level sensor; Receiving a first additional reference value from the first distance sensor; Receiving a second additional reference value from the second capacitive distance sensor; Determining a first difference value based on a difference between the first reference value and the second reference value; Determining a second difference value based on a difference between the first further reference value and the second further reference value; Determining a first scaling factor and a second scaling factor at least partially based on the first difference value and the second difference value; Changing the first further reference value based on the first scaling factor; Changing the second further reference value based on the second scaling factor; Changing the further capacity value at least partially based on the changed first further reference value and the changed second further reference value; and Determining a further value that is representative of the fluid level within the holding area of ​​the holding structure, at least partially based on the modified further capacity value. [18] System according to claim 16, wherein the logic circuit is configured to: Obtaining another capacity value from the capacitive level sensor; Receiving a first additional reference value from the first distance sensor; Receiving a second additional reference value from the second capacitive distance sensor; Determining a first difference value based on a difference between the first reference value and the second reference value; Determining a second difference value based on a difference between the first further reference value and the second further reference value; and Generating a signal to indicate a change in the position of the holding structure, at least partially in response to the fact that the first difference value and the second difference value are different.

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