METHOD AND DEVICE FOR DETECTING LOCAL DEFECTS ON A MIRROR SURFACE
Patent Information
- Authority / Receiving Office
- DE · DE
- Patent Type
- Patents
- Current Assignee / Owner
- ISRA VISION GMBH
- Filing Date
- 2022-09-09
- Publication Date
- 2026-06-11
AI Technical Summary
Existing methods for detecting defects on reflective surfaces are complex, requiring extensive calculations and large, uniquely coded patterns, making them slow and difficult to implement, especially for large or highly curved surfaces.
A method and device using a camera and data processing unit to detect local defects on reflective surfaces by analyzing the contrast and shape of essentially linear light-dark transitions in reflected patterns, without geometric measurement, allowing for fast and accurate defect localization.
Enables fast and cost-effective detection of local defects on reflective surfaces, including large or curved surfaces, without the need for complex calibration or large patterns, using a simple pattern and image analysis.