Method for determining the central wavelength of a spectral line with high precision and associated system

Abstract

The invention relates to a method (100) for determining a central wavelength of interest (λc) of a spectral line of interest, comprising the steps of: A) Detecting at time t1 a first measured reference profile (PS1ref), B) Then detecting at time t0 a measured profile of interest (PSech) from said sample of interest, C) Then detecting at time t2 a second measured reference profile (PS2ref) from a reference source (Sref), D) Processing said first and second measured reference profiles and processing the measured profile of interest, E) Determining a reference position called intermediate (P0ref) at time t0 by interpolation, F) Determining a value of the central wavelength of interest from a difference between said positions of interest (Pech) and intermediate reference (P0ref), said known value of the reference wavelength, and a linear dispersion (LD) of the spectrometer and associated detector. Figure 5

Description

Title of the invention: Method for determining a central wavelength of a spectral line with high precision and associated system FIELD OF THE INVENTION

[0001] The present invention relates to the field of spectroscopy, and more particularly to the determination of the central wavelength of a spectral line with very high precision. STATE OF THE ART

[0002] For certain applications in spectroscopy, for example in atomic or molecular spectroscopy, or to determine the isotopic abundance of an element in a sample by an optical method (called LIBRIS for Laser Induced Breakdown self-Reversal Isotopic Spectrometry, see below) a high precision on the determination of the value of the central wavelength of a spectral line is required. The spectral line to be characterized is produced by a light source and can be an absorption or emission line, atomic or molecular. An uncertainty of less than 5 pm, or even less than 1 pm, on the value of the central wavelength is typically sought.

[0003] This problem has not arisen to date in the field of spectroscopy of laser ablation plasmas (LIBS techniques for "Laser Induced Breakdown Spectroscopy" or laser-induced plasma optical emission spectrometry, LAMIS for Laser Ablation Molecular Isotopic Spectrometry, etc.), because the width of the lines observed is typically a few tens of pm. The wavelength of the lines is therefore usually measured with an uncertainty of about ten pm to a few tens of pm depending on the linear dispersion of the spectrometer used. This uncertainty has no impact on these techniques because the analysis is made from the intensity of the lines generally integrated over a width of the same order, from about ten to a few tens of pm.

[0004] Conventionally, the wavelength of the detection system is calibrated using a reference source emitting known lines, typically a mercury vapor lamp or a hollow cathode lamp. The position of the line to be analyzed and the position of the reference line are identified in pixels on the detector, and the line to be analyzed is determined from its relative position with respect to that of the reference line. The detector comprises at least N pixels Pi aligned along a line, with i varying from 1 to N. When it is 2D, an integration over all the pixels of the same column is carried out. For example, the detector is a CCD technology matrix, with 2048x512 pixels.

[0005] Let Xref be the central wavelength of the reference line and X0 the wavelength to be determined, Pref the position of Xref identified in pixels of the detector and PO the position of X0 on this same detector. The wavelength Xref is of course chosen so that it appears on the detector simultaneously with X0 for the same configuration of the spectrometer. We have:

[0006] 4 = (PQ-P,.ef).DL(.^

[0007] with DL linear dispersion of the detection system, typically in pm / pixel.

[0008] For various reasons (thermal fluctuations, vibration) spectrometers and detectors drift very slightly even in the controlled environment of a research laboratory, which leads to a wavelength drift. This drift is of course even more pronounced in analysis situations outside the laboratory (in the field, online, by a portable system, etc.). For example, in the case of a 1 m focal length grating spectrometer with a 2400 lines / mm grating, a variation of only 103 degrees in the grating angle causes a wavelength shift of 10 pm, which is prohibitive for the LIBRIS analysis of lithium, for example, for which an uncertainty of less than 1 pm is aimed for to obtain an acceptable uncertainty on the isotopic abundance in 6Li.

[0009] The detection of the reference line and that of the line to be analyzed are carried out sequentially in time. In the most common case, the signal from the sample is routed to the detection system by an optical fiber. To carry out the two measurements, it is then necessary to position the optical fiber connected to the spectrometer first to collect the light flux from the reference source and then that from the emission to be characterized or vice versa, which takes a certain amount of time. Typically, these two measurements are separated by a duration of around one minute, which is sufficient for such a drift to occur.

[0010] It is therefore impossible to carry out precise LIBRIS measurements without correcting the wavelength drift of the detection system. The problem arises in the same way in atomic spectroscopy where we seek to measure X0 precisely by calibrating on a reference source.

[0011] The invention being of particular interest for the LIBRIS method, its principle is recalled below as well as the principle of the LIBS and LAMIS methods.

[0012] The principle of LIBS technology, illustrated [Fig. 1], is to focus a laser pulse on the surface of a material sample (or the material) to generate a transient plasma whose light emission is analyzed using a spectrometer. By collecting the light emission from the plasma and analyzing the spectrum by spectrometry, it is possible to identify the elements present in the plasma, and therefore to determine the composition of the material, from emission line databases. In LIBS, the intensity is integrated over the entire width of the line.

[0013] LAMIS technology, for example described in the publication by R. Russo et al., Spectrochim. Acta B 66 (2011) 99, is an alternative derived from LIBS which allows isotopic analysis to be carried out from the lines of molecules formed by reaction between the ablated material and a constituent of the ambient medium, or by reaction between two atoms of the ablated material.

[0014] A laser generator L0 generates a laser beam FL0 which is focused on the sample 1 using a first optical system 2. This generates a plasma P10. The plasma emits a light emission 3 which is collected by an optical system OS0. The focused light emission is sent to a spectrometer SpecO via an optical fiber FO. The spectrometer SpecO comprises (or is associated with) a detector DetO synchronized with the laser generator L0. The spectrometer SpecO makes it possible to record line spectra. Finally, processing means UT0 make it possible to process the recorded spectra.

[0015] LIBS makes it possible to generate a spectrum 20, which is presented in the form of a set of spectral lines which correspond to the emission lines of the elements composing the material, and make it possible - using the available correlation data between the emission lines and the elements - to determine the elemental composition of the material sample. The wavelength X of a line provides information on an element present in the material and the intensity I is linked to the concentration of this element.

[0016] LIBS emission spectrometry also applies to isotopic analysis because the atomic lines of different isotopes of the same element are at slightly different wavelengths. This spectral shift, called isotopic shift, is due to mass effects (majority for light elements) and modification of the charge distribution inside the nucleus (majority for heavy elements). If we want to do this isotopic analysis by LIBS it is imperative to separate the lines of the 2 isotopes. However, this spectral shift is generally of the order of a fraction of nm or even a few pm, as shown in Table I below: Isotopes Emission line Isotopic shift 7Li 6Li 670.775 nm + 15.8 pm 10B 11B 208.891 nm - 2.5 pm 238U 235U 424.437 nm + 25 pm 239Pu 240Pu 594.522 nm + 13 pm

[0017] Table I

[0018] Such a shift is difficult to observe in a plasma generated by laser ablation. under usual conditions, because the confinement of the plasma by ambient air at atmospheric pressure results in a high density, and therefore a broadening of the emission lines due to the Stark effect. This broadening commonly reaches several tens or even hundreds of pm and therefore masks the isotopic shift, even if the spectrometer used has sufficient spectral resolution to resolve this shift. The limitation here is physical and not instrumental.

[0019] A first solution consists of carrying out the analysis at reduced pressure, or even under vacuum. By thus limiting the confinement of the plasma by the ambient medium, its density is reduced and sufficient spectral selectivity can be found for certain isotopes. A double line is visualized, and the determination of the isotopic ratio is carried out from the intensity ratio between the two lines associated with the two isotopes. This approach is not applicable to all isotopes and requires a spectrometer with high resolution power, and therefore bulky. A second solution consists of sending a second laser beam through the plasma, in order to measure a resonant absorption or fluorescence signal, which is restrictive and complicates the measurement system.

[0020] In the state of the art of isotopic analysis at atmospheric pressure, the LAMIS technique can also be used, but this requires several conditions to be met: 1. Molecules must form in the plasma; 2. They must be sufficiently stable under the temperature / density conditions of the plasma; 3. They must have detectable lines, i.e. of sufficient lifetime, sufficiently intense, and in the spectral band of the detection system. In the case of lithium, for example, no LAMIS signal is detected, probably because the second condition is not met.

[0021] The LIBRIS technique is an optical technique for determining the isotopic abundance of an element in a sample (solid, liquid or gaseous) from the emission spectrum of a laser ablation plasma. This technique is for example described in the publication by K. Touchet et al., Spectrochim. Acta B 168 (2020) 105868 and in document US 2019 / 0041336. It is a variant of the LIBS technology and uses the same optical system. The LIBRIS technology overcomes the various drawbacks of the LIBS method by allowing measurement of an isotopic ratio at atmospheric pressure and without a second laser.

[0022] It is recalled that the electronic transitions of atoms to higher energy levels require an input of energy. This energy can be in the form of photons, in which case there is absorption of photons by the atom. A special case is that of laser ablation plasma. To simplify, we can consider that the plasma is made up of two distinct parts, the core and the periphery. Photons emitted by the core of the plasma, which is hotter, can be absorbed by the periphery, which is colder. This This phenomenon therefore prevents a certain number of emitted photons from leaving the plasma: this is the phenomenon of self-absorption.

[0023] For an observer outside the plasma, and for a measuring device, the line profile results from the emission and self-absorption at the same wavelength corresponding to the electronic transitions between two levels of all the atoms considered placed on its line of sight. Consequently, the measured intensity is not only the sum of all the emissions from the plasma, because this self-absorption must be taken into account.

[0024] The phenomenon of self-absorption, well known in plasma spectroscopy for elemental analysis, is rather considered as an undesirable phenomenon because it leads to a distortion of the line profile, and therefore to a non-linearity of the signal with respect to the concentration of the element of interest. LIBRIS exploits this self-absorption effect to deduce information on the isotopes of a given element in a material.

[0025] Figures 2 and 3 illustrate an RS0 line of an element of interest, selected from a spectrum 20, obtained in two cases, depending on the concentration of the element in the material.

[0026] [Fig.2] illustrates the case where the concentration of the element in the plasma is lower, the self-absorption phenomenon is not very marked or even absent. We obtain a spectrally broad line profile, not hollowed out in its center. The dotted curves ISOi and ISO2 represent the emission of the 2 isotopes. Each line has a significant width compared to the gap between the 2 lines, mainly due to the Stark effect in the plasma, and this is why we do not distinguish them individually: we detect the solid line RS0 which corresponds to the sum of the 2. The principle of LIBRIS is that the central wavelength of the solid line varies with the isotopic abundance, that is to say with the ratio of the amplitudes of the 2 dotted lines. In this case, we measure the value of the central wavelength XO corresponding to the emission peak, i.e. the maximum point or summit 20 of the observed curve which has a bell-shaped profile.It is correlated to the ratio between two isotopes Iso1 and Iso2 of the element considered, and it is shifted according to said isotopic ratio.

[0027] [Fig.3] illustrates the case where the element is in high concentration in the plasma, the self-absorption phenomenon is then marked. We observe a line profile hollowed out in its center (double bell profile), called inverted line, resulting from the superposition of a spectrally broad emission profile, with a spectrally narrower absorption profile. In this case, we measure the value of the central wavelength ko corresponding to the absorption trough. The central wavelength X0 is in this case measured on the part of the profile corresponding to the absorption, that is to say at the minimum point 30 of the observed trough. It is correlated to the ratio between two isotopes Isoi and Iso2 of the element considered, and it is shifted according to said isotopic ratio. It is this measurement of the wavelength of the trough that defines the LIBRIS technology.

[0028] Thus, in the LIBRIS technology, the measurement of the isotopic ratio is carried out from the very precise measurement of the wavelength X0, maximum of the bell line or minimum of the line, called inverted, in double bell. This wavelength Xo shifts linearly with the isotopic abundance, between XR* and XR2, the indices 1 and 2 referring to two isotopes of the element. XR* and XR2 are physical data available in spectroscopic databases and / or in scientific publications. The analytical uncertainty on the isotopic abundance is therefore directly linked to the uncertainty on the determination of the wavelength XO.

[0029] In LIBRIS technology, the measurement of X0 directly gives the isotopic ratio. [Fig.4] illustrates this evolution of X0 measured as a function of the proportion of the 6Li isotope of Lithium, which has only two isotopes 6Li and 7Li. This curve was produced on an inverted line. The isotopic shift is given by XR* - XR2 and corresponds to the measurement range of the technique for a given line. In the case of lithium and for the line at 670.778 nm used in LIBRIS, this shift is 15.8 + / - 0.3 pm and therefore corresponds to the total variation of the isotopic abundance in 6Li from 0% to 100%, the complementary being the abundance in 7Li. Thus, an uncertainty of 1 pm in the determination of the XR wavelength leads to an uncertainty in the isotopic abundance of 1 / 15.8 = 6.3%. The measurement accuracy of the isotopic ratio is therefore directly correlated to the measurement accuracy on X0.

[0030] An aim of the present invention is to remedy the aforementioned drawbacks by proposing a method and a system for determining the central wavelength of an absorption or emission line, atomic or molecular, produced by a light source, with sub-picometric precision. DESCRIPTION OF THE INVENTION

[0031] The subject of the present invention is a method for determining a central wavelength of interest of a spectral line of interest measured by a spectrometer, the spectral line of interest corresponding to an emission or an absorption of a sample to be characterized, the spectral line of interest having either a bell-shaped profile, said central wavelength of interest then corresponding to the peak of said bell-shaped profile, or a double-bell profile, said central wavelength of interest then corresponding to the trough between the two bells, the spectrometer being associated with a detector comprising a plurality of pixels aligned in a direction X, the spectral line of interest being detected on pixels of the detector, the method comprising the steps of: • A) Detect at a time tl a first measured reference profile from a reference source having a reference spectral line having a central wavelength called the reference wavelength of known value, the reference wavelength being chosen so as to be detected on at least one pixel of the detector, • B) Then detect at a time t0 a measured profile of interest from said sample of interest, • C) Then detect at a time t2 a second measured reference profile from a reference source, • D) Processing said first and second measured reference profiles, so as to determine a first (Plref) and a second reference position of the reference wavelength, and processing the measured profile of interest so as to determine a position of interest of the central wavelength, • E) Determine a so-called intermediate reference position at time t0 by interpolation, from the first and second reference positions, and from a predetermined law of variation of the reference position as a function of time, • F) Determine a value of the central wavelength of interest from a difference between said positions of interest and intermediate reference (POref), from said known value of the reference wavelength and from a linear dispersion of the spectrometer and the associated detector.

[0032] According to one embodiment, the variation law is linear.

[0033] According to one embodiment, the processing step D comprises the sub-step consisting of adjusting values ​​of the measured profile of interest and of the first and second measured reference profiles with known mathematical functions so as to determine by interpolation said position of interest and said first and second reference positions with sub-pixel precision, the determination of the intermediate reference position then also being determined with sub-pixel precision.

[0034] According to one embodiment, the light signal from the sample is pulsed.

[0035] According to one embodiment, the light signal from the sample comes from an emission of a plasma emitted by the sample illuminated by a pulsed laser.

[0036] According to one embodiment, the method according to the invention is suitable for determining an isotopic abundance of an element present in said sample, said central wavelength of interest corresponding to a line resulting from the contributions of two isotopes of said element, said value of the central wavelength of interest making it possible to determine said abundance.

[0037] The invention also relates to a system for measuring a central wavelength of interest of a spectral line of interest measured by a spectrometer, the spectral line of interest corresponding to an emission or an absorption of a sample to be characterized, the spectral line of interest having either a bell-shaped profile, said central wavelength of interest then corresponding to the peak of said bell-shaped profile, or a double-bell profile, said central wavelength of interest then corresponding to the trough between the two bells, the measurement system comprising: - a detection system comprising a spectrometer (Spectro) associated with a detector (Det) comprising a plurality of pixels (Pi) aligned along a direction X, the spectral line of interest being detected on pixels of the detector, - the system being configured so that the detector detects: • at a time tl a first measured reference profile from a reference source, the reference source having a reference spectral line having a central wavelength called the reference wavelength of known value, the reference wavelength being chosen so as to be detected on at least one pixel of the detector, • then at a time t0 a measured profile of interest from said sample of interest, • then at time t2 a second measured reference profile from the source of reference, - the system further comprising a processing unit configured to: • process said first and second reference measured profiles, so as to determine a first and a second reference position of the reference wavelength, and process the measured profile of interest so as to determine a position of interest of the central wavelength, • determine a so-called intermediate reference position at time t0 by interpolation, from the first and second reference positions, and from a predetermined law of variation of the reference position as a function of time, • determine a value of the central wavelength of interest from a difference between said positions of interest (Pech) and intermediate reference, from said known value of the reference wavelength and from a linear dispersion of the detection system.

[0038] According to one embodiment, the measuring system according to the invention is suitable for measuring the isotopic abundance of an element present in the sample, and further comprises: - a pulsed laser configured to illuminate the sample so as to generate a plasma capable of emitting said light signal from the sample, - an optical fiber configured so that the input collects either a light signal from the sample or a light signal from the reference source, and the output is coupled to an input of the spectrometer, the processing unit being configured to synchronize the detector with the laser upon detection of the measured profile of interest, said central wavelength of interest corresponding to a line resulting from the contributions of two isotopes of said element, said value of the central wavelength of interest making it possible to determine said isotopic abundance.

[0039] The invention finally relates to a computer program comprising instructions which cause the system according to the invention to execute the steps of the method according to the invention.

[0040] The following description presents several exemplary embodiments of the device of the invention: these examples are not limiting of the scope of the invention. These exemplary embodiments present both the essential characteristics of the invention as well as additional characteristics linked to the embodiments considered.

[0041] The invention will be better understood and other characteristics, aims and advantages thereof will appear during the detailed description which follows and with reference to the appended drawings given as non-limiting examples and in which:

[0042] The [Fig. 1] already cited illustrates the principle of measurement by LIBS, LAMIS and LIBRIS technologies.

[0043] The [Fig.2] already cited illustrates a spectral line measured in a case where the element is in low concentration in the plasma, the self-absorption phenomenon is then not very marked or even negligible.

[0044] The [Fig.3] already cited illustrates a spectral line measured in a case where the element is in high concentration in the plasma, the phenomenon of self-absorption is then marked.

[0045] The [Fig.4] already cited illustrates the evolution of the central wavelength X0 measured as a function of the isotopic abundance of the isotope 6Li of Lithium in the sample.

[0046] [Fig.5] illustrates the method according to the invention.

[0047] [Fig.6] illustrates the measured profile of interest PSech, the first measured reference profile of PSlref and the second measured reference profile PS2ref, the first theoretical reference profile PSTlref, the second theoretical reference profile PST2ref and the theoretical profile of interest PSTech.

[0048] [Fig.7] illustrates the system according to the invention.

[0049] [Fig.8] illustrates the system according to the invention adapted for measuring a ratio isotope of an element present in the sample.

[0050] [Fig.9] illustrates the data obtained by repeating the measurement 17 times (measurements i numbered from 1 to 17). For each measurement i, a raw value Xc B(i) (cross) is determined on the one hand and a corrected value Xc(i) (points) determined according to method 100 according to the invention on the other hand.

[0051] [Fig. 10] shows the mean and standard deviation o of these 17 measurements in both cases, raw and corrected with Xref of the HCL lamp, respectively (XBm, oB) and (Xcm, oc). DETAILED DESCRIPTION OF THE INVENTION

[0052] The invention relates to a method 100 for measuring the central wavelength of interest Xc of a spectral line of interest RSe measured by a spectrometer, illustrated [Fig.5]. The invention also relates to a system 10 for measuring a central wavelength.

[0053] The spectral line of interest corresponds to an emission or an absorption of a sample Ech to be characterized and presents either a bell-shaped profile, Xc then corresponding to the wavelength of the peak of the bell-shaped profile, or a double-bell profile, Xc then corresponding to the wavelength of the trough between the two bells.

[0054] The spectrometer carrying out the measurement comprises (or is associated with) a detector Det comprising a plurality of pixels Pi, i pixel index varying from 1 to N, aligned in a direction X. The spectral line of interest RSe is detected on pixels of the detector Det.

[0055] In a first step A of the method 10 according to the invention, a first measured reference profile PSlref is detected at a time t1 from a reference source Sref having a reference spectral line RSref having a central wavelength called reference wavelength of known value Xref. The reference wavelength is chosen so as to be detected on at least one pixel of the detector Det. To carry out the detection and generate the measured spectral profile PSlref, a light signal SLlref from the source Sref is injected at the input of the spectrometer Spectro. The reference source is chosen according to the spectral characteristics of the sample to be analyzed.

[0056] The measured spectral profile PSlref is a set of measurement points indexed according to the pixels Pi of the detector, and each i is associated with a detected intensity Ili.

[0057] Then in a step B, a measured profile of interest PSech from the sample to be characterized is detected at a time t0 (i.e. t0>tl). For this, a light signal SLech from the sample Ech is injected at the input of the spectrometer Spectro. The measured spectral profile PSech is a set of measurement points indexed according to the pixels of the detector, and each j is associated with a detected intensity l0j.

[0058] The source Sref is chosen so that the RSref line is detected by the detector without modifying the setting of the spectrometer associated with the detection of RSe. According to one embodiment, the pixels of the detector detecting the RSe line can be located in a zone of the detector different from that detecting the RSref line. According to another embodiment realization the RSref and RSe lines are located at the same place on the detector. It is then appropriate to turn off the reference source during the measurement of the sample or to ensure that SLref is negligible compared to SLech.

[0059] Then, in a step C, a second measured reference profile PS2ref from the reference source Sref is detected at a time t2 (i.e. t2>tl). For this, a light signal SL2ref from the source Sref is injected again at the input of the spectrometer Spectro.

[0060] The measured profiles PSlref and PS2ref correspond to the spectral line RSref measured at two different times tl and t2, these two times framing a measurement of the spectral line of interest RSe. We thus have tl <t0<t2 : le détecteur Det détecte séquentiellement dans le temps le signal issu de la source de référence à tl, le signal issu de l’échantillon à tO et à nouveau le signal issu de la source de référence à t2.

[0061] In a step D, the first and second measured reference profiles PSlref and PS2ref are processed so as to determine a first reference position Plref of the reference wavelength Xref and a second reference position P2ref of the reference wavelength. These two positions are measured in pixels of the detector, the index i constituting the abscissa of the detected spectrum. In step D, the measured profile of interest PSech is also processed so as to determine the position of interest Pech of the central wavelength Xc, still measured in pixels of the detector.

[0062] The wavelength drift of the detection system [spectrometer + detector] is measured by the difference (P2ref-Plref).

[0063] In a step E, the reference position POref at the instant tO Pref(tO) called intermediate is determined, by interpolation, from Plref, P2ref and a law of variation of the reference position as a function of the predetermined time Pref(t).

[0064] Finally, in a step F, a value of the central wavelength of interest Xc is determined from the difference between Pech and POref, the known value of the reference wavelength Xref and the linear dispersion DL of the detection system [spectrometer + detector] (typically in pm / pixel).

[0065] Typically we have the formula:

[0066] 4=4,z+ (p^.po^lw

[0067] It is of course appropriate to take the value of DL corresponding to the spectral region in which Xref and X0 are located.

[0068] With the method according to the invention, the position in pixels of the detector of the reference wavelength is determined more precisely, taking into account the drift of the detection system, by establishing a law of variation of the reference position as a function of time. This allows a determination of Xc with improved precision compared to a measurement which would only take into account Plref (measurement of the reference prior to the measurement of the spectrum of interest) or P2ref (measurement of the reference subsequent to the measurement of the spectrum of interest). With the method according to the invention, a very low uncertainty on the value of Xc is obtained.

[0069] According to a preferred embodiment, the time difference between the two measurements of the Sref spectrum is small, typically of the order of a minute or less, and it is considered that the drift of Pref as a function of time is linear. Indeed, to carry out the measurement practically, the input of an optical fiber FOp is moved, the output of which is coupled to the input of the Spectro spectrometer, so as to collect either the light signal from the Sref source (SL1ref for the first measurement and SL2ref for the second measurement), or the light signal SLech from the sample to be characterized (see further figures 7 and 8). The time to carry out this manipulation, to which the spectrum recording time should be added, is typically less than a minute.

[0070] For a linear drift of Pref(t), we have:

[0071] = POref = a.to+b(2)

[0072] The parameters a and b are determined from the measurements at times ti and t2:

[0073] _ (3) a ~ Mi ~ Mi

[0074] b = Pref(t2)-ad^

[0075] The detector Det sequentially detects in time the first reference signal, the signal of interest and the second reference signal. This detection generates a first measured reference profile of PSlref, a measured profile of interest PSech, and a second measured reference profile PS2ref as illustrated [Fig.6]. The abscissa of the profiles is the index i of the pixels Pi of the detector and the ordinate is an intensity detected for each pixel, respectively Ili, lOi and I2i.

[0076] To be able to measure Xc with very high precision, we seek to obtain its position Pech with a precision better than the pixel of the detector, that is to say measured as a fraction of the whole index i. The same applies to the positions Plref and P2ref. For this, according to one embodiment, the processing step D comprises the sub-step consisting of adjusting the values ​​of the measured reference profiles PSlref and PS2ref and of the measured profile of interest PSech with known mathematical functions, so as to determine by interpolation the positions of interest and reference with a precision lower than the pixel, as illustrated [Fig.6].

[0077] Thus, theoretical profiles are determined, the first theoretical reference profile PSTlref, the second theoretical reference profile PST2ref and the theoretical profile of interest PSTech, also illustrated [Fig.6], which fit best with the experimental points. Typically the mathematical functions used are chosen from: Gaussian, Lorentzian, Voigt.

[0078] We see in [Fig.6] that without this adjustment the determined positions would correspond to the pixel k of the maximum of the measured spectrum. We cannot then have a wavelength precision better than the interval between two adjacent pixels. Thanks to these theoretical profiles the positions Plref, P2ref and Pech are determined in fractions of pixels (typically with a precision to the second decimal place) and the precision is greatly improved.

[0079] According to one embodiment, the light signal from the sample SLref is pulsed. Preferably, the light signal from the sample SLech comes from an emission of a plasma emitted by the sample illuminated by a pulsed laser.

[0080] According to one embodiment, the method according to the invention is associated with the implementation of LIBRIS technology, that is to say it is adapted for the precise measurement of an isotopic ratio of an element present in the sample Ech. The light signal SLech comes from an emission of a plasma PI emitted by the sample Ech, illuminated by a pulsed laser L. The central wavelength of interest corresponds to a line resulting from the contributions of two isotopes of the element, and the precise value of the central wavelength of interest Xc makes it possible to determine the isotopic ratio as explained above. Preferably in step B the detector Det is synchronized with the laser L.

[0081] The system 10 according to the invention is illustrated [Fig.7]. It comprises a spectrometer Spectro associated with the detector Det, the latter comprising a plurality of pixels Pi aligned in a direction X. Typically the detector is of the intensified CCD type. An example is i pixel index varying from 1 to 2048. When the detector is matrix-based, the intensities are preferably summed in the vertical direction of the columns.

[0082] The system is further configured so that the detector Det detects at a time t1 the first measured reference profile PSlref from the reference source Sref, then at a time t0 the measured profile of interest PSech from said sample of interest, then at a time t2 the second measured reference profile PS2ref from the reference source Sref. For this, according to an illustrated embodiment [Fig.7], the input E of an optical fiber Fop is moved as a function of the signal that it is desired to detect, then the measurement is carried out with the spectrometer.

[0083] The system further comprises a processing unit UT configured to implement steps D, E and F.

[0084] The source Sref is chosen according to the wavelength Xc of interest: it is necessary that Xref is sufficiently close to Xc so that the two wavelengths can be detected on the detector without changing the spectrometer setting. Typically Sref is a hollow cathode lamp, which emits few photons continuously. The signal from the sample being typically intense and of short duration, the acquisition parameters of the detection system are in this case different for the detection of the two signals (from the reference and the sample).

[0085] These parameters are (non-exhaustive list): measurement delay relative to the laser shot (for the sample signal only), width of the acquisition time gate, number and rate of accumulations, detector gain, signal averaging.

[0086] These parameters are for example the following: Sample Reference Measurement delay relative to laser shot 1 ps Not applicable Acquisition time gate width 500 ns 200 ms Number and rate of accumulations 20 at 20 Hz 10 at 3 Hz Detector gain 3000 3000 Signal averaged over... 10 acquisitions 1 acquisition

[0087] Table II

[0088] According to one embodiment, the system 10 according to the invention is suitable for measuring an isotopic ratio of an element present in the sample, as illustrated [Fig.8]. The system further comprises a pulsed laser L configured to illuminate the sample so as to generate the plasma PI capable of emitting the light signal SLech from the sample. It also comprises an optical fiber FOp configured so that the input collects either a light signal from the sample or a light signal from the reference source, and its output S is coupled to an input of the spectrometer Spectro.

[0089] The processing unit UT is configured to synchronize the detector Det with the laser L during the detection of the measured profile of interest, the central wavelength of interest corresponding to a line resulting from the contributions of two isotopes of the element, the value of the central wavelength of interest making it possible to determine the isotopic abundance.

[0090] Preferably, the system 10 comprises, in addition to the laser L, an optic 2 which focuses the laser beam on the sample and an optical system SO configured to inject a portion of the light signal from the sample into the input E of the optical fiber.

[0091] Below are briefly presented results illustrating the interest of the correction method by framing. A Jobin Yvon THR1000 spectrometer equipped with a 2400 lines / mm grating centered at 670 nm is used. The detector is an intensified Andor iStar camera of 2048x512 pixels, with a linear dispersion DL of 2.774 pm / pixel at 670 nm.

[0092] A line from a mercury vapor lamp is measured in the presence of spectrometer drift; the line from the mercury vapor source constitutes the spectral line of interest.

[0093] Before and after detection of the spectral line of interest, the line of the reference source constituted by a lithium hollow cathode lamp (HCL) is measured, which is known precisely, equal to Xref = 670.776 nm.

[0094] The drift of the spectrometer is then corrected according to method 100 according to the invention.

[0095] The acquisition parameters are given in Table III below. Acquisition time gate width 50 ms Number and rate of accumulations 100 to 18 Hz Detector gain 4000

[0096] Table III

[0097] The graph in [Fig.9] illustrates the data obtained by repeating the measurement 17 times (measurements i numbered from 1 to 17). For each measurement i, a raw value XcB(i) (cross) is determined on the one hand and a corrected value Xc(i) (points) determined according to method 100 according to the invention on the other hand. The raw values ​​are obtained by direct measurement with the detection system. The dispersion of the raw data is obvious and results from the drift of the spectrometer. The corrected values ​​of Xc are very little dispersed over the 17 measurements.

[0098] [Fig. 10] shows the mean and standard deviation o of these 17 measurements in both cases, raw and corrected with Xref of the HCL lamp, respectively (XBm, oB) and (Xcm, oj. The reference value, moreover, known very precisely for the wavelength of the mercury vapor lamp, is Xivm = 671.643 nm. This value is also mentioned in [Fig. 10] and makes it possible to test the relevance of the method according to the invention. The value Xcm is much closer to Xivm than the value XBm. It emerges that the measurement method according to the invention significantly improves the accuracy and fidelity of the measured wavelength.

[0099] We determine the bias for the two measurements as follows:

[0100] Bias(raw measurements) = Xkm XHm = 35 pm

[0101] Bias (corrected measurements) = Xkm Xjn = - 3 pm

[0102] And we deduce the uncertainties I of the two measurements by applying the formula:

[0103] / _ (5)

[0104] The uncertainty in the wavelength measurement thus goes from 38 pm for the raw measurement to 4 pm for the corrected measurement.

[0105] Table IV below specifies, on an example of measurement (no. 5), the times t0, tl, t2, the positions measured in pixels Plref, Pech, P2ref by adjustment of the experimental data with theoretical curves, the coefficients a and b determined with the formulas (3) and (4), the interpolated intermediate position POref, the wavelength of the reference source Xref, and that of the measured source Xc, before and after correction by framing. tl (hh:min:ss) 17:09:00 Plref (pixel) 1028.985 tO (hh:min:ss) 17:09:24 Pech (pixel) 1343.168 t2 (hh:min:ss) 17:11:38 P2ref (pixel) 1028.965 a 0.088 b 1028.985 Xref (nm) 670.776 POref (pixel) 1031.088 Xc before correction (nm) 671.585

[0106] Table IV

Claims

1. Claims Method (100) for determining a central wavelength of interest (Xc) of a spectral line of interest (RSe) measured by a spectrometer, the spectral line of interest corresponding to an emission or an absorption of a sample (Ech) to be characterized, the spectral line of interest having either a bell-shaped profile, said central wavelength of interest then corresponding to the peak of said bell-shaped profile, or a double-bell profile, said central wavelength of interest then corresponding to the trough between the two bells, the spectrometer being associated with a detector (Det) comprising a plurality of pixels (Pi) aligned in a direction X, the spectral line of interest being detected on pixels of the detector, the method comprising the steps of: • A) Detect at a time tl a first measured reference profile (PSlref) from a reference source (Sref) having a reference spectral line (RSref) having a central wavelength called the reference wavelength of known value (Xref), the reference wavelength being chosen so as to be detected on at least one pixel of the detector, • B) Then detect at a time tO a measured profile of interest (PSech) from said sample of interest, • C) Then detect at a time t2 a second measured reference profile (PS2ref) from a reference source (Sref), • D) Processing said first and second measured reference profiles, so as to determine a first (Plref) and a second (P2ref) reference position of the reference wavelength, and processing the measured profile of interest so as to determine a position of interest (Pech) of the central wavelength, • E) Determine a so-called intermediate reference position (POref) at time t0 by interpolation, from the first and second reference positions, and from a law of variation of the linear reference position as a function of time between times t1 and t2, • F) Determine a value of the central wavelength of interest from a difference between said positions of interest (Pech) and intermediate reference (POref), from said known value of the reference wavelength and from a linear dispersion (DL) of the spectrometer and the associated detector.

2. Method according to one of the preceding claims in which the processing step D comprises the sub-step of adjusting values of the measured profile of interest and of the first and second measured reference profiles with known mathematical functions so as to determine by interpolation said position of interest and said first and second reference positions with sub-pixel precision, the determination of the intermediate reference position then also being determined with sub-pixel precision.

3. Method according to one of the preceding claims in which the light signal from the sample is pulsed.

4. Method according to the preceding claim in which the light signal from the sample comes from an emission of a plasma emitted by the sample illuminated by a pulsed laser.

5. Method according to the preceding claim adapted to determine an isotopic abundance of an element present in said sample, said central wavelength of interest corresponding to a line resulting from the contributions of two isotopes of said element, said value of the central wavelength of interest making it possible to determine said abundance.

6. System (10) for measuring a central wavelength of interest (Xc) of a spectral line of interest (RSe) measured by a spectrometer, the spectral line of interest corresponding to an emission or an absorption of a sample (Ech) to be characterized, the spectral line of interest having either a bell-shaped profile, said central wavelength of interest then corresponding to the top of said bell-shaped profile, or a double-bell profile, said central wavelength of interest then corresponding to the hollow between the two bells, the measurement system comprising: - a detection system comprising a spectrometer (Spectro) associated with a detector (Det) comprising a plurality of pixels (Pi) aligned along a direction X, the spectral line of interest being detected on pixels of the detector, the system being configured so that the detector detects: • at a time tl a first measured reference profile (PSlref) from a reference source (Sref), the reference source (Sref) having a reference spectral line (RSref) having a central wavelength called the reference wavelength of known value (Xref), the reference wavelength being chosen so as to be detected on at least one pixel of the detector, • then at a time tO a measured profile of interest (PSech) from said sample of interest, • then at time t2 a second measured reference profile (PS2ref) from the reference source (Sref), - the system further comprising a processing unit (UT) configured to: • process said first and second measured reference profiles, so as to determine a first (Plref) and a second (P2ref) reference position of the reference wavelength, and process the measured profile of interest so as to determine a position of interest (Pech) of the central wavelength, • determine a so-called intermediate reference position (POref) at time t0 by interpolation, from the first and second reference positions, and from a law of variation of the linear reference position as a function of time between times t1 and t2, • determine a value of the central wavelength of interest from a difference between said positions of interest (Pech) and intermediate reference (POref), from said known value of the reference wavelength and from a linear dispersion (DL) of the detection system.

7. Measuring system according to the preceding claim adapted for measuring the isotopic abundance of an element present in the sample further comprising: - a pulsed laser (L) configured to illuminate the sample so as to generate a plasma (PI) capable of emitting said light signal from the sample, - an optical fiber (FOp) configured so that the input collects either a light signal from the sample or a light signal from the reference source, and the output is coupled to an input of the spectrometer, the processing unit being configured to synchronize the detector with the laser upon detection of the measured profile of interest, said central wavelength of interest corresponding to a line resulting from the contributions of two isotopes of said element, said value of the central wavelength of interest making it possible to determine said isotopic abundance.

8. A computer program comprising instructions which cause the system of claim 6 to execute the steps of the method according to one of claims 1 to 5.

Images