Light beacon system

Abstract

The invention relates to a light beacon system (1) comprising: - a source unit (3) including at least one light source (4), and a control unit (9); - an output projector (6) including an optical device (8); - a waveguide device (7) connecting the source unit (3) to the output projector (6), the waveguide device (7) being configured to transmit the light flux (18) in a forward direction directed from at least one light source (4) to the output projector (6); in which the light beacon system (1) includes a malfunction detection device (26) which is configured to: deliver a variable Idet representing a luminous intensity of a reflected light flux (28) circulating in the waveguide device (7) in a return direction directed from the output projector (6) towards the light source (4);and detect a malfunction of the light beacon system (1) as a function of said variable Idet. Figure for the abbreviation: 2;

Description

Title of the invention: Light marking system Technical field

[0001] The invention relates to the field of light marking devices equipped with light sources, such as lasers or light-emitting diodes (LEDs), and intended to be placed on structures or high-rise buildings (television transmitters, high-voltage lines, telecommunications pylons, wind turbines, cranes, chimneys, airport buildings, etc.) to signal the presence of obstacles to air navigation.

[0002] The invention relates more particularly to light marking devices whose light source is distant from the exit projector. Technological background

[0003] Light marking devices are located on structures or high-rise buildings to signal the presence of obstacles to air navigation.

[0004] In the event of a malfunction or for regular maintenance operations, these light marking devices are difficult to access and thus lead to high maintenance costs.

[0005] To remedy this, light marking devices have been designed so as to limit the number of components of the light marking device at the top of the structure.

[0006] Document US20130223092 thus presents a light marking device of which The light source was placed at the base of the structure, while the lamp was placed at the top of the structure. The lamp and the light source are connected to each other using a waveguide. This device thus allows easier maintenance of the light source and associated electronic components.

[0007] In order to verify that the lamp and the light source are correctly connected, the light marking device of document US20130223092 provides for the use of a detection device located near the lamp and capturing the light emitted by the lamp. The emitted light which is captured by the detection device is routed via another waveguide to a photodiode in order to ensure that the lamp is operating correctly.

[0008] However, this type of detection device is complex to implement. Summary of the invention

[0009] One idea underlying the invention is to simplify the detection device in the case of a light marking device whose light source is distant from the projector.

[0010] Another idea underlying the invention is to limit the number of components of the light marking device at the top of the structure.

[0011] Furthermore, the inventors have noticed that when using a light source whose energy is concentrated and significant, for example of the laser type, poor connection or disconnection of the system can cause significant human and / or material damage which it is advantageous to control.

[0012] According to one embodiment, the invention provides a light marking system comprising: - a source housing comprising at least one light source which is configured to emit a light flux, and a control unit for controlling the at least one light source in energy; - an output projector comprising an optical device configured to shape and project the luminous flux; - a wave guide device connecting the source box to the output projector, the wave guide device being configured to transmit the light flux in a forward direction directed from the at least one light source to the output projector; wherein the light beaconing system comprises a malfunction detection device which is configured to: deliver a variable Idet representative of a luminous intensity of a reflected light flux circulating in the waveguide device in a return direction directed from the output projector towards the light source, the reflected light flux being captured by an optical sensor of the malfunction detection device; and detect a malfunction of the light beaconing system as a function of said variable Idet.

[0013] Thanks to these characteristics, the malfunction detection device makes it possible to detect a malfunction of the light beaconing system without the need for a specific waveguide. Indeed, the malfunction detection device will use the light intensity of the reflected light flux circulating in the waveguide device in the return direction in order to determine whether there is a malfunction of the system.

[0014] According to embodiments, such a system may comprise one or more of the following features.

[0015] According to one embodiment, the malfunction detection device is arranged in the source housing.

[0016] Thus, the malfunction detection device is also remote from the exit projector and is located in the source box. This further limits the number of components of the light marking system near the exit projector.

[0017] According to one embodiment, the malfunction detection device is configured to, upon malfunction detection: - compare said variable Idet with a threshold Stot, - if said variable Idet is lower than the threshold Stot, send a signal to the control unit that a malfunction has been detected.

[0018] According to one embodiment, the malfunction detection device is configured to, upon malfunction detection: - compare said variable Idet with a threshold Smax, - if said variable Idet is greater than the threshold Smax, send a signal to the control unit that a malfunction has been detected.

[0019] According to one embodiment, the malfunction detection device is configured to, after malfunction detection, signal to the control unit where the malfunction has been detected in the following manner: - compare said variable Idet with a threshold Si having a value lower than the threshold Stot, - if said variable Idet is lower than the threshold Si, send a signal to the unit of command that the malfunction is located between the source box and a limit Li - if said variable Idet is greater than the threshold Si, send a signal to the control unit that the malfunction is located between the limit Li and the output projector.

[0020] Thus, it is possible to determine where the malfunction is located by comparing the luminous intensity of the reflected light flux with different predetermined thresholds.

[0021] According to one embodiment, the malfunction detection device is configured to, after malfunction detection; signal to the control unit where the malfunction has been detected in the following manner: - compare said variable Idet with n thresholds Si to Sn, n being a natural integer greater than or equal to 2, the thresholds SI to Sn having an increasing value from Si to Sn, and the threshold Sn having a value lower than the threshold Stot, - if said variable Idet is lower than the threshold Sb send a signal to the control unit that the malfunction is located between the source box and a limit Li - if said variable Idet is lower than the threshold Sx+i and higher than the threshold Sx, with x a natural integer between 1 and n-1, send a signal to the control unit that the malfunction is located between a limit Lx and a limit Lx+b - if said variable Idet is greater than the threshold Sn, send a signal to the control unit that the malfunction is located between a limit Ln and the output projector.

[0022] According to one embodiment, the light source is a light source main light source which is configured to emit a main light flux, and the source housing comprises a secondary light source which is configured to emit a secondary light flux, the waveguide device being configured to transmit the main light flux and the secondary light flux in a forward direction directed respectively from the main light source and the secondary light source to the output projector, and wherein the secondary light source has a different electromagnetic spectrum from the main light source and / or a different power from the main light source, the optical device being configured to shape and project the main light flux, the reflected light flux being derived from at least a reflection of a portion of the secondary light flux.

[0023] According to one embodiment, the electromagnetic spectrum of the main light source is the visible spectrum while the electromagnetic spectrum of the secondary light source is the infrared spectrum.

[0024] According to one embodiment, the power of the secondary light source is lower than the power of the main light source, preferably at least two times lower, more preferably at least ten times lower.

[0025] According to one embodiment, the power of the main light source is between 1kW and 100kW.

[0026] According to one embodiment, the power of the secondary light source is between 10 mW and 100 W.

[0027] Thus, in the case where the two light sources have a different spectrum, it is possible to use an optical sensor specific to the spectrum of the secondary light source so as to maintain the same thresholds before or after switching on the main light source.

[0028] In the case where the secondary light source has a much lower light intensity, it is possible to test whether the system is correctly connected before putting the main light source into service, limiting the risks of human and / or material damage.

[0029] According to one embodiment, the optical device comprises a projection mirror and a lens, the lens preferably being toric in shape.

[0030] According to one embodiment, the reflected light flux comes from at least one reflection of a portion of the light flux, the primary light flux and / or the secondary light flux.

[0031] According to one embodiment, the reflected light flux comes from a plurality of reflections of a portion of the light flux, the primary light flux and / or the secondary light flux in the waveguiding device and / or the optical device.

[0032] According to one embodiment, the main light source or the light source is a laser.

[0033] For example, the main light source comprises a plurality of laser diodes.

[0034] According to one embodiment, the secondary light source comprises one or more infrared diodes, diodes in the visible range or ultraviolet diodes.

[0035] According to one embodiment, the optical sensor comprises one or more photodiodes.

[0036] According to one embodiment, the control unit is configured to stop or prevent the power supply to the main light source in response to the detection of a malfunction.

[0037] According to one embodiment, in response to the absence of detection of a malfunction, the control unit is configured to turn on or maintain power to the main light source.

[0038] According to one embodiment, the waveguiding device comprises, from the source housing to the output projector, an injection lens, optionally a mixing guide, an optical fiber and a projection lens.

[0039] According to one embodiment, the optical device of the output projector comprises a projection mirror comprising a frustoconical reflecting surface, the frustoconical reflecting surface having a base facing the wave guide device, the reflecting surface widening away from the wave guide device.

[0040] According to one embodiment, the frustoconical reflective surface is centered on an optical axis of the waveguiding device.

[0041] According to one embodiment, the threshold Stot corresponds to the light intensity of a light flux reflected by the waveguide and the output projector and which comes from the secondary light flux or the light flux.

[0042] According to one embodiment, the threshold Si corresponds to the light intensity of a light flux reflected by a first element of the waveguiding device and which comes from the secondary light flux or the light flux.

[0043] According to one embodiment, the threshold or thresholds Stot, Smax, Sb Sx are determined by prior testing of the light marking system in a test environment.

[0044] According to one embodiment, the threshold or thresholds Stot, Smax, Sb Sx are determined by calculations as a function in particular of the luminous intensity of the secondary light flux, the reflection coefficients of the waveguide and the output projector.

[0045] According to one embodiment, the invention also provides a structure equipped with a aforementioned light marking system, in which the output projector is fixed to an upper end of the structure, and the source box is fixed near a lower end of the structure.

[0046] According to one embodiment, the invention also provides a method for detecting malfunction of a light beacon system, wherein the method comprises the following steps: - provide a light marking system, the light marking system comprising a source housing comprising at least one light source which is configured to emit a luminous flux, and a control unit for controlling the at least one light source in energy; an output projector comprising an optical device configured to shape and project the luminous flux; a wave guide device connecting the source housing to the output projector, the wave guide device being configured to transmit the light flux in a forward direction directed from the at least one light source to the output projector; a malfunction detection device; - switch on the power supply to the or at least one of the light sources; - deliver by means of the malfunction detection device a variable Idet representative of a luminous intensity of a reflected light flux circulating in the waveguide device in a return direction directed from the output projector towards the light source, the reflected light flux being captured by an optical sensor of the malfunction detection device; - detect a malfunction of the light marking system based on said variable Idet; - transmit a malfunction signal to the control unit.

[0047] According to one embodiment, the step of detecting the malfunction comprises the following sub-steps: - configure the malfunction detection device with an Smax threshold, - compare the said variable Idet with the threshold Smax, - if said variable Idet is greater than the threshold Smax, send a signal to the control unit that a malfunction has been detected. Brief description of the figures

[0048] The invention will be better understood, and other aims, details, characteristics and advantages thereof will appear more clearly during the following description of several particular embodiments of the invention, given solely for illustrative and non-limiting purposes, with reference to the appended drawings.

[0049] [Fig.l] represents a schematic view of a structure considered as an aerial obstacle which is equipped with a light beaconing system according to one embodiment.

[0050] [Fig.2] represents a schematic view of a light marking system according to a first embodiment.

[0051] [Fig. 3] represents a schematic view of a light marking system according to a second embodiment, in which the main light source has not been represented, the secondary light flux being represented.

[0052] [Fig.4] represents a schematic view of a light marking system according to the second embodiment, in which the main light source has not been represented, the reflected light flux being represented.

[0053] [Fig. 5] represents a schematic view of a light marking system according to the second embodiment, in which the main light source has not been represented, the reflection zones being schematically highlighted.

[0054] [Fig.6] shows a perspective view of a malfunction detection device according to one embodiment. Description of the embodiments

[0055] Several embodiments of a light marking system 1 illustrated in FIGS. 1 to 5 will be described in the remainder of the description.

[0056] The light marking system 1 is intended to be placed on high-rise structures or buildings (television transmitters, high-voltage lines, telecommunications pylons, cranes, wind turbines, chimneys, airport buildings, etc.) to signal to airplanes and helicopters the presence of obstacles to air navigation.

[0057] An example of a structure 2 forming an obstacle to air navigation has been shown schematically in [Fig.l]. The structure 2 is thus equipped with a light beaconing system in order to project a light flux at its top and thus warn aircraft of the presence of this structure.

[0058] Such a light marking system 1 comprises, as shown in [Fig.l], a source box 3, an output projector 6 and an optical waveguide device 7 connecting the source box 3 to the output projector 6. Indeed, this is a light marking system 1 in which one or more light sources have been spaced from the output projector 6 in order to make them more accessible for maintenance in particular. As illustrated in [Fig.l], the source box 3 is thus placed near a foot of the structure 2 in order to be easily accessible by operators while the output projector 6 is always located at the top of the structure 2 in order to signal the presence of the structure to aircraft using a light flux.

[0059] [Fig.2] represents a first embodiment of the light marking system 1 in a schematic manner.

[0060] The source box 3 comprises a light source 4 which emits a light flux transmitted via the wave guide device 7 in a forward direction directed from the box source 3 to the output projector 6. The output projector 6 comprises an optical device 8 for shaping and projecting the light flux coming from the waveguide device 7. The source housing 3 further comprises a control unit which is configured to control and power the light source 4.

[0061] The light source 4 is in the example shown a white laser. The light source 4 thus comprises a combination of laser emitters 10, 11, 12 arranged in two paths. The first path comprises a blue laser emitter 10 followed by a green laser emitter 11 and again followed by a red laser emitter 12. The second path comprises a green laser emitter 11 followed by a red laser emitter 12. The light source 4 could however be designed differently.

[0062] The blue laser emitter 10 thus emits a blue light flux which is reflected by a deflecting mirror 13 in order to be oriented parallel to an optical axis 14 of the waveguiding device 8 and within the perimeter of an injection lens 15 of the waveguiding device 8. The blue light flux further passes through a blue low-pass dichroic plate 16 and a red high-pass dichroic plate 17.

[0063] The green laser emitter 11 of the first channel emits a green light flux which is reflected by the blue low-pass dichroic plate 16 in order to be oriented parallel to the optical axis 14 and inside the perimeter of the injection lens 15. The blue light flux also passes through the red high-pass dichroic plate 17.

[0064] The red laser emitter 12 of the first channel emits a red light flux which is reflected by the red high-pass dichroic plate 17 in order to be oriented parallel to the optical axis 14 and inside the perimeter of the injection lens 15.

[0065] In the case of the second channel and in the absence on this channel of a blue laser emitter, the flux of the green laser emitter 11 is reflected by a deflecting mirror 13 and passes through a red high-pass dichroic plate 17. The flux of the red laser emitter 12 has a path similar to that of the first channel.

[0066] It is the combination of the blue light flux, the green light fluxes and the red light fluxes which will form, when passing through the injection lens 15, a white light flux, and which will subsequently be called the luminous flux 18 of the light source 4.

[0067] The source box 3 may also include a measuring device 29 taking a predetermined portion of the luminous flux 18 in order to allow stabilization of the flux by feedback.

[0068] The light flux 18 passes through the various elements of the wave guide device 7 in order to be conveyed to the output projector 6. The wave guide device 7 comprises, in the example shown in [Fig.2], from the source box 3 to the output projector 6, the injection lens 15, an optical fiber 19 and a projection lens. 20.

[0069] On leaving the wave guide device 7, the light flux 18 is shaped and projected using the optical device 8 of the output projector 6.

[0070] The optical device 8 comprises in particular, as illustrated in [Fig.2], a projection mirror 21 which is provided with a frustoconical reflecting surface 22. The frustoconical reflecting surface 22 has a flat base 23 facing the waveguiding device 7 and perpendicular to the optical axis 14. The frustoconical reflecting surface 22 also has a lateral surface 24 widening away from the waveguiding device 7. The frustoconical reflecting surface 22 is furthermore centered on the optical axis 14 so that a light flux centered on the optical axis 14 and coming from the waveguiding device 7 is mainly, or even entirely, reflected on the base 23 parallel to the optical axis 14 and in a return direction.

[0071] As an exemplary embodiment, the base 23 of the frustoconical reflecting surface 22 may measure 5 mm in diameter and the frustoconical reflecting surface would widen to a diameter of approximately 35 mm.

[0072] The majority of the light flux 18 which will be reflected by the lateral surface 24 will be shaped advantageously by a toric lens 25 and will form the flux useful for signaling the structure 2 to aircraft.

[0073] To ensure the proper functioning of the light marking system 1 and the fact that the light source 4 is distant from the exit projector 6, a malfunction detection device 26 is provided in the light marking system 1.

[0074] In addition to ensuring the proper functioning of the light beaconing system 1, the malfunction detection device 26 is also present to limit the risks of material and / or human damage in the event that there is a leak of the concentrated light flux from the laser-type light source 4 due to a malfunction or a bad connection for example.

[0075] The malfunction detection device 26 is located in the source housing 3 and comprises an optical sensor 27, which is shown in [Fig.6], for example in the form of a photodiode, which will capture a reflected light flux 28 circulating in the wave guide device 7 in a return direction directed from the output projector 6 towards the source housing 3.

[0076] In the first embodiment, this reflected light flux 28 comes from natural reflections of the light flux 18 in the waveguide device 7 and in the output projector 6. The areas on which these reflections occur will be detailed in relation to [Fig.5].

[0077] The malfunction detection device 26 will thus deliver a variable Idet representative of the luminous intensity of the reflected light flux 28 which has been captured by the optical sensor 27.

[0078] This variable Idet will then be compared to a threshold Stot and in the case where the variable I det is lower than the threshold Stot, the malfunction detection device 26 will send a signal to the control unit 9 of the light source 4 that a malfunction has been detected. In response to the detection of a malfunction, the control unit 9 is configured to stop the power supply to the light source 4.

[0079] Advantageously, the variable Idet will also be compared to a threshold Smax and in the case where the variable Idet is greater than the threshold Smax, the malfunction detection device 26 will send a signal to the control unit 9 of the light source 4 that a malfunction has been detected.

[0080] The malfunction detection device 26 is, prior to the installation of the light beaconing system 1 on the structure 2, configured in order to determine the values ​​of the variable Idet corresponding to a compliant operation of the light beaconing system 1, which makes it possible to deduce for which values ​​of the variable Idet a malfunction has occurred.

[0081] The thresholds Stot and Smax can be determined by calculating the theoretically reflected light intensity of the light flux 18 by the different elements of the waveguide device 7 and the output projector 6. This theoretical value is then multiplied by a coefficient so as to frame this theoretical value. For example, in the case where the theoretical value would be equal to 100, the threshold Stot could be set at 80 while the threshold Smax could be set at 120.

[0082] The thresholds Stot and Smax can also be determined using prior testing of the light marking system 1 so as to know the reflected light intensity of the light flux 18 by the different elements of the wave guide device 7 and the output projector 6 in the case where the output projector does indeed emit the useful light flux. This value is then multiplied by a coefficient so as to frame this value.

[0083] After having determined the thresholds Stot and Smax, the malfunction detection device 26 is configured according to these thresholds so as to emit a malfunction or proper functioning signal according to the comparison of Idet with these thresholds.

[0084] In the example shown in [Fig.2], the optical sensor 27 is positioned in the source housing 3 so that a mirror 30, for example a hot mirror, which is not aligned with the dichroic plates 16, 17 or the deflecting mirrors 13, and which is aligned with the optical axis 14, transmits the reflected light flux 28 to it.

[0085] Figures 3 to 5 show a second embodiment in which the source box 3 this time comprises a main light source 4 and a secondary light source 5.

[0086] In this embodiment, only the main luminous flux 18 from the source The main light source 4 is used to be projected and shaped by the output projector 6. The secondary light flux 31 from the secondary light source 5 is used as a light flux to test the operation of the light marking system 1. In fact, the reflected light flux 28 which will be analyzed by the malfunction detection device 26 comes from the reflections of the secondary light flux 31.

[0087] Figures 3 and 4 illustrate more particularly the secondary light source 5 and the secondary light flux 31 passing through the wave guide device 7 to the output projector 6. In the case of [Fig. 3], it is the light flux in the forward direction which is represented, namely the secondary light flux 31 coming from the secondary light source 5 and going to the projection mirror 21 while in the case of [Fig. 4], it is the reflected light flux 28 which is represented, coming from the reflections of the secondary light flux 31 on the wave guide device 7 and on the output projector 6 and going to the optical sensor 27.

[0088] Thus, in this embodiment, the light marking system 1 can be tested even before the main light source 4 is switched on and therefore before the laser is switched on, which can represent a danger in the event of an incorrect connection. Moreover, in the example shown of the malfunction detection device 26 in [Fig. 6], the secondary light source 5 is an infrared diode, for example with a wavelength of the order of 850 nm, with a luminous flux of the order of 60 mW. In comparison, the white laser shown in [Fig. 2] emits a luminous flux of the order of 100 W. Therefore, the secondary light source 5 does not emit in the same electromagnetic spectrum as the primary light source 4 and, in addition, emits a flux of much lower intensity so that it does not represent a danger for the environment of the light marking system in the event of a leak.

[0089] In the second embodiment, before the main light source 4 is switched on, the secondary light source 5 is switched on and the reflected light flux 28 is analyzed by the malfunction detection device 26. This analysis is carried out in the same way as in the first embodiment, i.e. by comparing the variable Idet with thresholds Stot and Smax, which are here specific to the secondary light source 5. As soon as the variable Idet is not between Stot and Smax, the malfunction detection device 26 transmits a signal to the control unit 9 that a malfunction has been detected. Otherwise, a proper operation signal is transmitted.

[0090] When the control unit 9 receives a malfunction signal, it prohibits the switching on of the main light source 4 or displays to the user a danger in the event of switching on of the main light source 4.

[0091] The advantage of having different electromagnetic spectra between the source main light source 4 and the secondary light source 5 is that by adapting the photodiode forming the optical sensor 27 to the infrared spectrum, the calibration of the thresholds of the malfunction detection device 26 does not need to be modified whether the main light source is on or not.

[0092] As visible in [Fig.6], the optical sensor 27 and the secondary light source 5 are located very close to each other on the same card, for example at a distance of the order of a few millimeters.

[0093] This second embodiment is also applicable if the main light source 4 is already switched on in order to test it during operation. Indeed, a disconnection or breakage of the waveguide device could occur during use and not only upon switching on. Thus, it is advantageous to switch on intermittently, for example in the form of a light flash, the secondary light source 5 in order to carry out a regular test of the correct operation of the light beaconing system 1.

[0094] In the same way, the variable Idet is compared to a threshold Stot and optionally to a threshold Smax during these intermittent flux emissions. And when the control unit 9 receives a malfunction signal, it cuts the power supply to the main light source 4 and, for example, displays that a malfunction has been detected.

[0095] [Fig. 5] schematically illustrates on the path of the secondary light flux 31 the zones on which the flux is reflected at least partially so as to form the reflected light flux 28. The wave guide device 7 here optionally comprises a mixing guide 32 located upstream of the optical fiber 19.

[0096] The zones identified as generating a reflection are the following: - a first zone 33 formed by the injection lens 15, - a second zone 34 formed by the input and output of the mixing guide 32, - a third zone 35 formed by the input and output of the optical fiber 19, - a fourth zone 36 formed by the projection lens 20, - a fifth zone 37 formed by the projection mirror 21 and in particular the base 23 of the frustoconical reflecting surface 22.

[0097] By quantifying the reflection of each of these zones 33 to 37, it is advantageously possible to identify the location of the disconnection or malfunction of the light marking system. Indeed, as soon as a disconnection occurs on the path of the secondary light flux 31, the light intensity of the reflection zones located downstream of this disconnection will not be transmitted to the optical sensor 27.

[0098] Thus, by comparing the variable Idet to different intermediate thresholds lower than the threshold Stot and depending on the reflections of the zones 33 to 37, the malfunction detection device 26 can transmit to the control unit 9 a location at least approximate disconnection or malfunction.

[0099] For example, by setting the malfunction detection device 26 with a threshold Sn corresponding to a reflection value of the zones 33 to 36 and therefore with the exception of the fifth zone 37 corresponding to the reflection of the projection mirror 21, it is possible to determine that: if said variable Idet is lower than the threshold Sn, the malfunction is located at or before the connection between the projection lens 20 and the projection mirror 21. By providing a plurality of thresholds corresponding to different limits of the waveguiding device in particular, it is possible to precisely identify the disconnection or malfunction.

[0100] In order to improve this localization, the optical sensor 27 may be, in an embodiment not shown, composed of several photodiodes with different gains, several photodiodes with different detection ranges, or even an optical sensor controlled by several different acquisition chains.

[0101] Although the invention has been described in connection with several particular embodiments, it is quite obvious that it is in no way limited thereto and that it includes all the technical equivalents of the means described as well as their combinations if these fall within the scope of the invention.

[0102] The use of the verb “comprise”, “comprise” or “include” and its conjugated forms does not exclude the presence of other elements or other steps than those set out in a claim.

[0103] In the claims, any reference sign in parentheses cannot be interpreted as a limitation of the claim.

Claims

Claims

1. Light marking system (1) comprising: - a source housing (3) comprising at least one light source (4, 5) which is configured to emit a light flux (18, 31), and a control unit (9) for controlling the at least one light source (4, 5) in energy; - an output projector (6) comprising an optical device (8) configured to shape and project the light flux (18); - a waveguiding device (7) connecting the source housing (3) to the output projector (6), the waveguiding device (7) being configured to transmit the light flux (18, 31) in a forward direction directed from the at least one light source (4, 5) to the output projector (6);in which the light marking system (1) comprises a malfunction detection device (26) which is configured to: deliver a variable Idet representative of a light intensity of a reflected light flux (28) circulating in the wave guide device (7) in a return direction directed from the output projector (6) towards the light source (4, 5), the reflected light flux (28) being captured by an optical sensor (27) of the malfunction detection device (26); and detect a malfunction of the light marking system (1) as a function of said variable Idet> in which the reflected light flux (28) comes from natural reflections of the light flux (18) in the wave guide device (7) and in the output projector (6).;

2. A light marking system (1) according to claim 1, wherein the malfunction detection device (26) is arranged in the source housing (3).

3. A lighting system (1) according to claim 1 or claim 2, wherein the malfunction detection device (26) is configured to, upon malfunction detection: - compare said variable Idet with a threshold Stot, - if said variable Idet is lower than the threshold Stot, send a signal to the control unit (9) that a malfunction has been detected.

4. Light marking system (1) according to one of claims 1 to 3, in which the malfunction detection device (26) is configured for when detecting a malfunction: - compare said variable Idet with a threshold Smax, - if said variable Idet is greater than the threshold Smax, send a signal to the control unit (9) that a malfunction has been detected.

5. Light marking system (1) according to one of claims 1 to 4, wherein the malfunction detection device (26) is configured to, after malfunction detection, signal to the control unit (9) where the malfunction has been detected in the following manner: - compare said variable Idet with a threshold Si having a value lower than the threshold Stot, - if said variable Idet is lower than the threshold Sb send a signal to the control unit (9) that the malfunction is located between the source box (3) and a limit Lb - if said variable Idet is higher than the threshold Si, send a signal to the control unit (9) that the malfunction is located between the limit Li and the output projector (6).

6. Light marking system (1) according to one of claims 1 to 4, wherein the malfunction detection device (26) is configured for after malfunction detection;signal to the control unit (9) where the malfunction has been detected in the following way: - compare said variable Idet with n thresholds Si to Sn, n being a natural integer greater than or equal to 2, the thresholds Si to Sn having an increasing value from Si to Sn, and the threshold Sn having a value lower than the threshold S early? - if said variable Idet is lower than the threshold Sb send a signal to the control unit (9) that the malfunction is located between the source box (3) and a limit LH - if said variable Idet is lower than the threshold Sx+i and higher than the threshold Sx, with x a natural integer between 1 and n-1, send a signal to the control unit (9) that the malfunction is located between a limit Lx and a limit Lx+b - if said variable Idet is higher than the threshold Sn, send a signal to the control unit (9) that the malfunction is located between a limit Ln and the output projector (6).;

7. Light marking system (1) according to one of claims 1 to 6, in which the light source is a main light source (4) which is configured to emit a main light flux (18), and the source housing (3) comprises a secondary light source (5) which is configured to emit a secondary light flux (31), the waveguide device (7) being configured to transmit the main light flux (18) and the secondary light flux (31) in a forward direction directed respectively from the main light source (4) and the secondary light source (5) to the output projector (6), and in which the secondary light source (5) has a wavelength spectrum different from the main light source (4) and / or a power different from the main light source (4), the optical device (8) being configured to shape and project the main light flux (18), the reflected light flux (28) coming from at least one reflection of a portion of the secondary light flux (31).

8. A light marking system (1) according to claim 7, wherein the main light source (4) is a laser.

9. A light marking system (1) according to claim 7 or claim 8, wherein the secondary light source (5) is an infrared diode.

10. Light marking system (1) according to one of claims 7 to 9, in which the control unit (9) is configured to stop or prevent the supply of the main light source (4) in response to the detection of a malfunction.

11. Light marking system (1) according to one of claims 1 to 10, in which the wave guide device (7) comprises, from the source housing (3) to the output projector (6), an injection lens (15), a mixing guide (32), an optical fiber (19) and a projection lens (20).

12. Light marking system (1) according to one of claims 1 to 11, in which the optical device (8) of the output projector (6) comprises a projection mirror (21) comprising a frustoconical reflecting surface (22), the frustoconical reflecting surface (22) having a base (23) facing the wave guide device (7), the reflecting surface (22) widening away from the wave guide device (7).

13. Light marking system (1) according to claim 12, wherein the frustoconical reflective surface (22) is centered on an optical axis (14) of the waveguide device (7).

14. Structure equipped with a light marking system (1) according to one of claims 1 to 13, in which the output projector (6) is fixed to an upper end of the structure (2), and the source box (3) is fixed near a lower end of the structure (2).

15. A method for detecting a malfunction of a light beacon system, wherein the method comprises the following steps: - providing a light beacon system (1), the light beacon system (1) comprising a source housing (3) comprising at least one light source (4, 5) which is configured to emit a light flux (18, 31), and a control unit (9) for controlling the at least one light source (4, 5) in energy; an output projector (6) comprising an optical device (8) configured to shape and project the light flux (18); a waveguide device (7) connecting the source housing (3) to the output projector (6), the waveguide device (7) being configured to transmit the light flux (18, 31) in a forward direction directed from the at least one light source (4, 5) to the output projector (6); a malfunction detection device (26);- switching on the power supply of the or one of the at least one light source (4, 5); - delivering by means of the malfunction detection device (26) a variable Idet representative of a light intensity of a reflected light flux (28) circulating in the waveguide device (7) in a return direction directed from the output projector (6) towards the light source (4, 5), the reflected light flux (28) being captured by an optical sensor (27) of the malfunction detection device (26); - detecting a malfunction of the light beaconing system (1) as a function of said variable Idet; - transmitting a malfunction signal to the control unit (9).;

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