Integrated circuit functional and tolerant to a maximum voltage higher than a nominal voltage, and corresponding method
The integrated circuit design employs cascode transistors with lower voltage ratings and a protection circuit to manage voltage levels, ensuring USB Type-C port input-output circuits operate at both nominal and maximum voltages, addressing the lack of high-voltage transistors and reducing production costs.
Patent Information
- Application Number
- FR2023007446
- Authority / Receiving Office
- FR · FR
- Patent Type
- Patents
- Current Assignee / Owner
- Filing Date
- 2023-07-11
- Publication Date
- 2025-07-18
- Estimated Expiration
- 2043-07-11
AI Technical Summary
Conventional integrated circuits face challenges in maintaining functionality and tolerance to maximum voltages higher than the nominal voltage, particularly in USB Type-C port input-output circuits, due to the lack of transistors with sufficient voltage resistance, especially when operating at 5 V.
A method and circuit design using cascode transistors with lower voltage ratings, coupled in series with a protection circuit, to manage voltage levels by generating controlling voltages that ensure functionality at both nominal and maximum voltages, preventing current flow in the deactivated state.
Enables integrated circuits to operate functionally and tolerantly at maximum voltages without requiring high-voltage transistors, optimizing production by using lower-rated transistors and reducing manufacturing costs.
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Abstract
Description
Title of the invention: Functional integrated circuit tolerant to a maximum voltage higher than a nominal voltage, and corresponding method
[0001] Embodiments and implementations relate to integrated circuits, including circuit design with respect to operating constraints and tolerance to a maximum voltage greater than a nominal voltage, such as in USB Type-C port input-output device circuits.
[0002] Indeed, USB type-C provides in particular a "power transmission" mode usually "PD" for "power delivery" in English, which uses a CCI channel to negotiate the power supply between the connected devices. In this context, there is a detection solution on voltage levels which require a divide-by-three solution of the CCI channel pin. A small divider circuit must be able to guarantee functional and tolerant operation at a maximum voltage of 5 V (volts).
[0003] Functional at 5V means that when the USB Type-C port input-output circuit is enabled, the circuit connected to the external DC terminal can work properly when the voltage increases to 5V.
[0004] 5V tolerant means that when the USB Type-C port input-output circuit is disabled, the circuit connected to the external DC terminal can withstand a voltage increasing up to 5V.
[0005] In simple circuits of the conventional voltage divider type, there is at least one transistor which must have a voltage rating of 5 V to ensure the functionality and 5 V tolerance of the circuit.
[0006] However, there are technological sectors which do not provide for the manufacture of transistors having a voltage resistance of 5 V, in which it is nevertheless desirable to be able to ensure the operating constraints and tolerance at 5 V in order to benefit from a USB type-C port input-output circuit.
[0007] Embodiments and implementations propose producing a functional circuit tolerant of a maximum voltage, for example 5 V, higher than a nominal voltage, for example 3.3 V, only with transistors having a voltage withstand (usually "maximum absolute rating" in English) lower than the maximum voltage, for example substantially equal to the nominal voltage.
[0008] According to one aspect, there is provided in this regard a method of protecting, in an integrated circuit, an output circuit comprising a first transistor and a second transistor coupled in series between a terminal and an output stage, the terminal receiving a signal at a nominal voltage level which can rise to a maximum voltage level, the method comprising a generation, by a protection circuit, of a first voltage controlling the first transistor, and a generation of a second voltage controlling the second transistor, in which: - in an activated state, the first voltage and the second voltage are obtained by dividing the voltage level of said terminal; - in a deactivated state, the first voltage is obtained by the voltage level of said terminal, and the second voltage is obtained by the level of a control voltage removed from a threshold voltage of a protection transistor.
[0009] In other words, the second voltage is capped at a level equal to the control voltage minus the threshold voltage, for example obtained by means of a “cascode” type assembly of transistors which can have a voltage resistance lower than the maximum voltage, but arranged so as to be functional and tolerant to the maximum voltage.
[0010] Thus, a circuit, such as a voltage divider, which is functional and tolerant to 5 V can be constructed using only transistors having a voltage rating of 3.3 V, i.e. without using "high voltage" transistors having a voltage rating of 5 V or more.
[0011] According to one mode of implementation: - in the activated state the protection circuit and the output circuit are capable of flowing a current between the terminal and a ground terminal; - in the deactivated state the protection circuit and the output circuit are unable to flow a current between the terminal and the ground terminal.
[0012] According to one embodiment, the first voltage is obtained by the drain voltage of a protection transistor and the second voltage is obtained by the source voltage of the protection transistor, the protection transistor being coupled between a first resistive element and a second resistive element of a voltage divider bridge.
[0013] According to another aspect, there is provided an integrated circuit comprising a terminal configured to receive a signal at a nominal voltage level which can rise to a maximum voltage level; - an output circuit comprising a first transistor and a second transistor coupled in series between the terminal and an output stage; - a protection circuit configured to generate a first voltage controlling the first transistor, and a second voltage controlling the second transistor, so that: — in an activated state, the first voltage and the second voltage are obtained by dividing the voltage level of said terminal, — in an off state, the first voltage is obtained by the voltage level of said terminal, and the second voltage is obtained by the level of a control voltage removed from a threshold voltage of a protection transistor.
[0014] According to one embodiment: - in the activated state the protection circuit and the output circuit are capable of flowing a current between the terminal and a ground terminal; - in the deactivated state the protection circuit and the output circuit are unable to flow a current between the terminal and a ground terminal.
[0015] According to one embodiment, the protection circuit comprises a voltage divider resistive bridge comprising a protection transistor coupled in series between a first resistive element and a second resistive element and configured to be controlled by the control voltage on its gate, the gate of the first transistor being coupled to the drain of the protection transistor, the gate of the second transistor being coupled to the source of the protection transistor.
[0016] According to one embodiment, the first resistive element is coupled between the terminal and the drain of the protection transistor, and the second resistive element is coupled between the source of the protection transistor and the ground terminal.
[0017] According to one embodiment, the protection transistor, the first transistor of the output circuit and the second transistor of the output circuit have a voltage withstand lower than the maximum voltage level.
[0018] According to one embodiment, the nominal voltage is between 3.0 V and 3.6 V and the maximum voltage is between 4.7 V and 5.0 V.
[0019] According to another aspect, there is also provided a system on chip incorporating an integrated circuit as defined above, in an input-output device of a USB type-C port.
[0020] Other advantages and characteristics of the invention will appear on examining the detailed description of the embodiment and implementation, which is in no way limiting, and the appended drawings, in which the figures:
[0021] [Fig.l] ;
[0022] [Fig.2] ;
[0023] [Fig.3] ;
[0024] [Fig.4] ;
[0025] [Fig.5] ;
[0026] [Fig.6] illustrate embodiments and implementations of the invention.
[0027] [Fig.l] illustrates an example of a DIV circuit, such as a divider, functional and tolerant to a maximum voltage, for example 5 V, comprising transistors all having a voltage resistance of less than 5 V, for example substantially 3.3 V.
[0028] The voltage withstand, or “maximum absolute rating” in English, is the voltage value beyond which the transistor risks a breakdown. in English) when applied between two of its terminals.
[0029] For the transistors of the DIV circuit, it is considered that the gate breakdown voltage, i.e. the voltage held between the gate terminal and the source / drain terminals, is the same as the junction breakdown voltage, i.e. the voltage held between the source and drain terminals.
[0030] A CRC_out output circuit of the divider DIV comprises an output stage Ra-Nout-Rb, capable of dividing the voltage V_CC present on an input terminal. In this respect, the output stage Ra-Nout-Rb will be called a “divider bridge”.
[0031] The terminal is configured to receive a signal V_CC at a nominal voltage level Vnml (figures 2 and 4) which can rise to a maximum voltage level Vmax (figures 3 and 5).
[0032] The voltage division is for example obtained by means of a series of resistive elements Ra, Rb, so as to provide the divided voltage V_CC_div on an output node Nout at a level equal to the ratio B / (A+B) of the level of the voltage of the input signal V_CC (with A the value of the resistance Ra and B the value of the resistance Rb).
[0033] For example, the values A and B can be chosen so that the ratio B / (A+B) is equal to 1 / 3, in particular in a detector application on the CC1 / 2 channel of USB type-C in the power transmission mode, usually “USB PD CC”. That being said, the ratio of the resistances Ra, Rb implementing the voltage division on the output Nout, can be chosen at any value without influencing the functionality and tolerance of the DIV circuit at the maximum voltage.
[0034] The voltage of the input signal V_CC is transmitted to the divider bridge Ra, Rb via a first transistor TPcd and a second transistor TPcs coupled in series between the terminal V_CC and the resistor Ra of the output stage.
[0035] The first transistor TPcd and the second transistor TPcs are PMOS type transistors (acronym commonly known in itself for “P-type Metal Oxide Semiconductor” in English).
[0036] The first transistor TPcd is controlled on its gate by a first voltage, called “cascode”, V_CASCd, while the second transistor TPcs is controlled on its gate by a second voltage, also called “cascode”, V_CASCs.
[0037] The first cascode voltage V_CASCd and the second cascode voltage V_CASCd are generated by a CRC_prot protection circuit, in particular from the voltage V_CC of the input signal on the terminal.
[0038] The CRC_prot protection circuit comprises a resistive voltage divider bridge Rl-TNc-R2 comprising a protection transistor TNc coupled in series between a first resistive element RI and a second resistive element R2.
[0039] For example, the first resistive element RI is coupled between the terminal and the drain of the protection transistor TNc, and the second resistive element R2 is coupled between the source protection transistor TNc and ground terminal GND.
[0040] In an example suitable for a nominal voltage of substantially 3.3 V (for example between 3.0 V and 3.6 V), and a maximum voltage of substantially 5 V (for example between 4.7 V and 5.3 V), a ratio substantially equal to 1 / 3 will be chosen in the voltage divider of the CRC_prot protection circuit.
[0041] The TNc protection transistor is for example of the NMOS type (acronym commonly known in itself for “N-type Metal Oxide Semiconductor” in English).
[0042] The protection transistor TNc is configured to be controlled by a control voltage V_CASC on its gate, again called “cascode voltage”.
[0043] In fact, the term “cascode voltage” means a control voltage, for example static, making it possible to place the transistor in a state that is substantially invariable with respect to the implementation of the functionality of the circuit to which it belongs.
[0044] In particular here, with the cascode control voltage V_CASC on the gate of the protection transistor TNc, it is possible to cap the level of the source voltage “Vs”, with respect to the drain voltage “Vd”, the functionality of the circuit comprising the transistor being to divide the voltage V_CC of the terminal.
[0045] Indeed, the source voltage Vs of the protection transistor TNc is capped at the level of the gate voltage “Vg” (Vg=V_CASC) removed from the threshold value “Vt” of the protection transistor TNc.
[0046] Let: Vs <Vg-Vt=V_CASC-Vt.
[0047] The threshold voltage Vt of the protection transistor TNc is for example between 0.6 V and 0.8 V.
[0048] The cascode control voltage V_CASC is for example generated by an “external” PWR_I0 supply circuit, for example the supply circuit of the integrated circuit incorporating the divider DIV.
[0049] The cascode control voltage V_CASC is for example generated at the nominal voltage level, independently of the effective voltage level V_CC on the terminal.
[0050] The first cascode voltage V_CASCd controlling the first transistor TPcd of the output circuit CRC_out, is taken from the drain of the protection transistor TNc.
[0051] Respectively, the second cascode voltage V_CASCd controlling the second transistor TPcs of the output circuit CRC_out, is taken from the source of the protection transistor TNc.
[0052] For example in this regard, the gate (V_CASCd) of the first transistor TPcd is coupled to the drain of the protection transistor TNc; while the gate (V_CASCs) of the second transistor TPcs is coupled to the source of the protection transistor TNc.
[0053] Finally, NMOS type transistors, TNswl, TNsw2, TNsw3 having the function of activation / deactivation switches of the divider circuit DIV are provided between a ground reference terminal GND and the protection circuit CRC_prot, the circuit of CRC_out output and the Nout output node.
[0054] A first switch TNswl controlled by an activation signal V_EN can for example be coupled between the ground GND and the second resistive element R2 of the protection circuit CRC_prot.
[0055] A second switch TNsw2 controlled by the activation signal V_EN can for example be coupled between the ground GND and the resistive element Rb of the output circuit CRC_out.
[0056] A third switch TNsw3 controlled by the inverse of the activation signal V_nEN can for example be coupled between the ground GND and the output node Nout of the output circuit CRC_out.
[0057] Thus, the activation signal V_EN and its inverse V_nEN make it possible to place the DIV circuit either in the activated ON state (figures 2 and 3), or in the deactivated OFF state (figures 4 and 5).
[0058] In the ON activated state, the switches TNswl, TNsw2 are controlled to be on by the activation signal V_EN, and the third switch TNsw3 is controlled to be off by the inverse of the activation signal V_nEN.
[0059] Thus, in the activated ON state the protection circuit CRC_prot and the output circuit CRC_out are able to flow a current between terminal and the ground terminal GND.
[0060] In the OFF state, the switches TNswl, TNsw2 are controlled blocked by the activation signal V_EN, and the third switch TNsw3 is controlled passing by the inverse of the activation signal V_nEN.
[0061] Thus, in the OFF state, the CRC_prot protection circuit and the CRC_out output circuit are unable to flow a current between terminal and the GND ground terminal. In addition, the Nout output node is “short-circuited” to GND ground.
[0062] Therefore, this example of CRC_prot protection circuit makes it possible to implement this double functional condition:
[0063] — In the ON state, the first cascode voltage V_CASCd and the second cascode voltage V_CASCs controlling the output circuit CRC_out, are obtained by a division (factor N / (N+2N)=l / 3) of the voltage level of the terminal V_CC. In this regard, we will refer to [Fig.2] and 3 described below. And:
[0064] — In the OFF state, the first cascode voltage V_CASCd controlling the output circuit CRC_out is obtained by the voltage level of the terminal V_CC; and the second cascode voltage V_CASCs controlling the output circuit CRC_out is capped by the level of the cascode control voltage V_CASC removed from the threshold voltage Vt of the protection transistor TNc. In this regard, reference will be made to [Fig.4] and 5 described below.
[0065] [Fig.2] illustrates the DIV circuit described above in relation to [Fig.l], in the ON activated state, for a voltage on the V_CC terminal at the nominal value Vnml.
[0066] The nominal voltage Vnml can be between 3.0 V and 3.6 V, for example 3.3 V. The activation signal V_EN is brought to 3.3 V and its inverse V_nEN to 0 V.
[0067] In this case, the control voltage V_CASC at 3.3V controls the protection transistor TNc (NMOS type), with respect to its source voltage, in the on state.
[0068] The drain voltage V_CASCd of the transistor TNc is equal to the division (by 3) of the level V_CC on the terminal, i.e. 1.1 V, since the protection circuit CRC_prot is capable of flowing a current.
[0069] The source voltage V_CASCs of the transistor TNc is equal to the drain voltage V_CASCd, at 1.1V.
[0070] The first voltage V_CASCd at 1.1 V controls the first transistor TPcd (of PMOS type) of the output circuit CRC_out in the on state; and similarly, the second voltage V_CASCd at 1.1 V controls the second transistor TPcd (of PMOS type) of the output circuit CRC_out in the on state.
[0071] Thus, the voltage V_CC at 3.3 V is transmitted to the output stage Ra-Nout-Rb and the division function of V_CC is implemented on the voltage V_CC_div on the output node Nout, again since the output circuit CRC_out is capable of flowing a current.
[0072] [Fig.3] illustrates the DIV circuit described above in relation to [Fig.l], in the state activated ON, for a voltage on the V_CC terminal at the maximum value Vmax.
[0073] The maximum voltage Vmax can be between 4.7 V and 5.3 V, for example 5.0 V.
[0074] In this case, the control voltage V_CASC at 3.3V controls the protection transistor TNc (NMOS type), with respect to its source voltage, in the on state.
[0075] The drain voltage V_CASCd of the transistor TNc is equal to the division (by 3) of the level V_CC on the terminal, i.e. to approximately 1.7 V, since the protection circuit CRC_prot is capable of flowing a current.
[0076] The source voltage V_CASCs of the transistor TNc is equal to the drain voltage V_CASCd, at 1.7V.
[0077] The first voltage V_CASCd at 1.7 V controls the first transistor TPcd (of PMOS type) of the output circuit CRC_out, with respect to its source voltage, in the on state; and similarly, the second voltage V_CASCd at 1.7 V controls the second transistor TPcd (of PMOS type) of the output circuit CRC_out, with respect to its source voltage, in the on state.
[0078] Thus, the voltage V_CC at 5 V is transmitted to the output stage Ra-Nout-Rb and the division function of V_CC is implemented on the voltage V_CC_div on the output node Nout, again since the protection circuit CRC_prot is able to flow a current.
[0079] Therefore, the DIV circuit is operational at the maximum voltage value v_cc.
[0080] [Fig.4] illustrates the DIV circuit described above in relation to [Fig.l], in the deactivated state OFF, for a voltage on the terminal V_CC at the nominal value Vnml, for example 3.3 V.
[0081] In this case, as the protection circuit CRC_prot is unable to flow a current, the voltage V_CC at 3.3 V of the terminal is transmitted by resistive coupling to the conduction terminals (drain / source) of the protection transistor TNc.
[0082] Thus, the control voltage V_CASC at 3.3V controls the protection transistor TNc (NMOS type), with respect to its source voltage, in the linear (or “ohmic”) state, that is to say in a self-regulated manner at a source-gate voltage Vs-Vg equal to the threshold voltage Vt of the transistor TNc.
[0083] The drain voltage V_CASCd of the transistor TNc is equal to the level V_CC on the terminal, i.e. 3.3 V.
[0084] The source voltage V_CASCs of the transistor TNc is capped by the level of the cascode control voltage V_CASC removed from the threshold voltage Vt of the protection transistor TNc, that is to say at substantially 2.5 V.
[0085] The first voltage V_CASCd at 3.3 V controls the first transistor TPcd (PMOS type) of the output circuit CRC_out in the on state.
[0086] The second voltage V_CASCd at 2.5 V controls the second transistor TPcd (of PMOS type) of the output circuit CRC_out in the linear state, i.e. in a self-regulated manner at a source-gate voltage Vs-Vg equal to the threshold voltage Vtp of the second transistor TPcs. The threshold voltage Vtp of the P-type transistor has a negative sign, for example Vtp = -0.7 V.
[0087] This thus makes it possible to cap the source voltage V_INT1 of the second transistor TPcs of the output circuit CRC_out, at the second voltage V_CASCd removed from the threshold voltage Vtp of the P-type transistor, TPcs, i.e. at substantially 3.3V = 2.5V -(-0.7V) (or between 3.0 V and 3.3 V, in practice).
[0088] The output node Nout is connected to ground, and the voltage V_CC_div = 0V is transmitted to the drain of the second PMOS transistor TPcs, by resistive coupling via the resistor Ra.
[0089] [Fig.5] illustrates the DIV circuit described above in relation to [Fig.l], in the deactivated state OFF, for a voltage on the terminal V_CC at the maximum value Vmax, for example 5 V.
[0090] In this case, as the protection circuit CRC_prot is unable to flow a current, the voltage V_CC at 5 V of the terminal is transmitted by resistive coupling to the conduction terminals (drain / source) of the protection transistor TNc.
[0091] Thus, the control voltage V_CASC at 3.3V controls the protection transistor TNc (NMOS type), with respect to its source voltage, in the linear state (or “ohmic”), that is to say self-regulated at a source-gate voltage Vs-Vg equal to the threshold voltage Vt of the TNc transistor.
[0092] The drain voltage V_CASCd of the transistor TNc is equal to the level V_CC on the terminal, i.e. 5 V.
[0093] The source voltage V_CASCs of the transistor TNc is capped by the level of the cascode control voltage V_CASC removed from the threshold voltage Vt of the protection transistor TNc, that is to say at substantially 2.5 V = 3.3 V - 0.7 V.
[0094] The first voltage V_CASCd at 5 V controls the first transistor TPcd (PMOS type) of the output circuit CRC_out in the on state.
[0095] The second voltage V_CASCd at 2.5 V controls the second transistor TPcd (of PMOS type) of the output circuit CRC_out in the linear state, i.e. in a self-regulated manner at a source-gate voltage Vs-Vg equal to the threshold voltage Vtp of the second transistor TPcs. The threshold voltage Vtp of the P-type transistor has a negative sign, for example Vtp = -0.7 V.
[0096] This thus makes it possible to cap the source voltage V_INT1 of the second transistor TPcs of the output circuit CRC_out, at the second voltage V_CASCd removed from the threshold voltage Vtp of the P-type transistor, TPcs, i.e. at substantially 3.3V = 2.5V -(-0.7V) (or between 3.3 V and 3.5 V, in practice).
[0097] The output node Nout is connected to ground, and the voltage V_CC_div = 0V is transmitted to the drain of the second PMOS transistor TPcs, by resistive coupling via the resistor Ra.
[0098] Thus, in this case, none of the transistors of the DIV circuit are biased with a voltage greater than the breakdown voltage between each of their terminals.
[0099] In particular, neither the protection transistor, nor the first switch TNswl, nor the two transistors TPcd, TPcs of the output circuit CRC_out are polarized with a voltage greater than the breakdown voltage, for example 3.3 V (or even 3.5 V), between their conduction terminals, nor between their gate terminal and the conduction terminals.
[0100] Therefore, the DIV circuit is tolerant to the maximum value of the voltage V_CC.
[0101] [Fig.6] schematically illustrates a system on chip SOC, which may include a network of input-output terminals IO_RNG and different functional blocks.
[0102] The functional blocks may include a digital circuit DIG, for example a core or a processor; a memory circuit MEM, for example a volatile memory of the “SRAM” type and possibly a non-volatile memory of the “EEPROM” or “Flash” type; an analog circuit ANL, for example for wireless communication or having a functionality for analog detection of a physical quantity; a power supply circuit SUP, for example capable of providing a regulated voltage, and possibly comprising the power supply PWR_I0 mentioned previously in relation to [Fig.l].
[0103] The I0_RNG input-output terminal network comprises in particular an IO_CC_CIRC input-output device capable of controlling an IO_CC_PIN terminal of a CC1 / CC2 port of a USB type-C connection.
[0104] The input-output device IO_CC_CIRC notably comprises a means of detecting DET on voltage levels which require a divider-by-3 solution of the voltage level V_CC on the terminal IO_CC_PIN.
[0105] The detection means DET incorporates in particular the divider circuit DIV, as described previously in relation to FIGS. 1 to 5, which makes it possible to guarantee functional and tolerant operation at the maximum voltage of 5 V (for a nominal voltage of 3.3 V).
[0106] The IO_CC_CIRC input-output device also includes internal terminals, INTRN_PIN, enabling communication with the DIG-SUP functional blocks of the SOC system on chip, for example according to conventional I2C, AHB or AXI protocols.
[0107] Thus, the 5 V tolerance and functionality constraint imposed by the USB PD CC standard on the IO_CC_CIRC input-output device does not prevent the SOC system on chip from being produced in a technological sector which does not provide for the manufacture of transistors having a voltage resistance greater than or equal to 5 V. This can be advantageous in particular in terms of production costs and optimization of manufacturing processes.
Claims
Claims
1. Method for protecting, in an integrated circuit, an output circuit comprising a first transistor and a second transistor coupled in series between a terminal (IO_CC_PIN) and an output stage (Ra, Rb, Nout), the terminal (IO_CC_PIN) receiving a signal (V_CC) at a nominal voltage level (Vnml) which can rise to a maximum voltage level (Vmax), the method comprising a generation, by a protection circuit, of a first voltage (V_CASCd) controlling the first transistor, and a generation of a second voltage (V_CASCs) controlling the second transistor, in which: - in an activated state (ON), the first voltage (V_CASCd) and the second voltage (V_CASCs) are obtained by a division of the voltage level of said terminal (V_CC);- in a deactivated state (OFF), the first voltage (V_CASCd) is obtained by the voltage level of said terminal (V_CC), and the second voltage (V_CASCs) is obtained by the level of a control voltage (V_CASC) removed from a threshold voltage of a protection transistor (TNc).;
2. Method according to claim 1, in which: - in the activated state (ON) the protection circuit and the output circuit are capable of flowing a current between the terminal and a ground terminal; - in the deactivated state (OFF) the protection circuit and the output circuit are incapable of flowing a current between the terminal and the ground terminal.
3. Method according to one of claims 1 or 2, in which the first voltage (V_CASCd) is obtained by the drain voltage of a protection transistor (TNc) and the second voltage (V_CASCs) is obtained by the source voltage of the protection transistor (TNc), the protection transistor (TNc) being coupled between a first resistive element (RI) and a second resistive element (R2) of a voltage divider bridge (RDIV).
4. Integrated circuit comprising: - a terminal (IO_CC_PIN) configured to receive a signal (V_CC) at a nominal voltage level (Vnml) which can rise to a maximum voltage level (Vmax); - an output circuit comprising a first transistor (TPcd) and a second transistor (TPcs) coupled in series between the terminal (IO_CC_PIN) and an output stage (Ra, Rb, Nout); - a protection circuit configured to generate a first voltage (V_CASCd) controlling the first transistor, and a second voltage (V_CASCs) controlling the second transistor, such that: — in an activated state (ON), the first voltage (V_CASCd) and the second voltage (V_CASCs) are obtained by dividing the voltage level of said terminal (V_CC), — in a deactivated state (OFF), the first voltage (V_CASCd) is obtained by the voltage level of said terminal (V_CC), and the second voltage (V_CASCs) is obtained by the level of a control voltage (V_CASC) removed from a threshold voltage of a protection transistor (TNc).
5. Integrated circuit according to claim 4, in which: - in the activated state (ON) the protection circuit and the output circuit are capable of flowing a current between the terminal and a ground terminal; - in the deactivated state (OFF) the protection circuit and the output circuit are incapable of flowing a current between the terminal and the ground terminal.
6. Integrated circuit according to one of claims 4 or 5, in which the protection circuit comprises a resistive voltage divider bridge (RDIV) comprising a protection transistor (TNc) coupled in series between a first resistive element (RI) and a second resistive element (R2) and configured to be controlled by the control voltage (V_CASC) on its gate, the gate of the first transistor (V_CASCd) being coupled to the drain of the protection transistor, the gate of the second transistor (V_CASCs) being coupled to the source of the protection transistor.
7. Integrated circuit according to one of claims 4 or 5, in which the first resistive element (RI) is coupled between the terminal (IO_CC_PIN) and the drain of the protection transistor (TNc), and the second resistive element (R2) is coupled between the source of the protection transistor (TNc) and the ground terminal (GND).
8. Integrated circuit according to one of claims 4 to 6, in which the protection transistor (TNc), the first transistor (TPcd) of the output circuit and the second transistor (TPcs) of the output circuit have a voltage withstand lower than the maximum voltage level.
9. An integrated circuit according to one of claims 4 to 7, wherein the nominal voltage is between 3.0 V and 3.6 V and the maximum voltage is between 4.7 V and 5.3 V.
10. System on chip (SOC) incorporating an integrated circuit according to one of the claims 4 to 9, in an input-output device (IO_CC_CIRC) of a terminal (IO_CC_PIN) of a USB type-C port.