Probe pin for integrated circuits testing

Abstract

The material of this design is metal. This design is a probe pin that contacts electrodes, terminals, pads, etc., and is used for inspecting electronic components such as semiconductor devices, semiconductor packages, integrated circuits, and printed circuit boards. The main feature of this design is the shape of the probe pin for inspecting integrated circuits. 1.1) Perspective view; 1.2) Front view; 1.3) Rear view; 1.4) Left side view; 1.5) Right side view; 1.6) Top view; 1.7) Bottom view

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