Probe pin for integrated circuits testing

Abstract

The material of this design is metal. This design is a probe pin that contacts electrodes, terminals, pads, etc., and is used for inspecting electronic components such as semiconductor devices, semiconductor packages, integrated circuits, and printed circuit boards. This design increases the stability of contact with the terminals of integrated circuits by forming a crown-shaped contact terminal at the top. Shoulders (projections) are formed on the upper and lower pins to adjust the portion of the pin that protrudes outside the socket. This also prevents the probe from coming out of the socket. The main feature of this design is the shape of the probe pin for inspecting integrated circuits. 1.1) Perspective view; 1.2) Front view; 1.3) Rear view; 1.4) Left side view; 1.5) Right side view; 1.6) Top view; 1.7) Bottom view; 1.8) Reference drawing

Images