Electronic apparatus monitoring method

Abstract

To detect that the possibility of occurrence of a failure in the near future is high.SOLUTION: A monitor charging element is disposed close to an electrolytic capacitor in a power source circuit of an actual electronic apparatus. When deterioration of the monitor charging element C occurs from a state where VA is substantially constant, the aforementioned effect of smoothing is less likely to be obtained so that a voltage when VP is at an L level decreases. In response to this, VOUT is constantly at the L level in the left side of FIG. 3 but subsequently a period in which VA<VB while VP is at the L level occurs. During this period, VOUT is at an H level. Therefore, with the above configuration of a monitor circuit 1, the increase in deterioration of the monitor charging element C can be acknowledged through occurrence of the period in which VOUT is at the H level.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The present invention relates to a method for monitoring electronic devices that are used over a long period of time. [Background technology]

[0002] For example, repeaters (relay transmitters: satellite equipment) for terrestrial digital broadcasting are used for long periods of time after being installed on the ground. Once installed, these satellite equipment are used continuously and unmanned, except for when periodic inspections are carried out. To ensure a stable broadcasting area, satellite equipment must be installed in various locations on the ground, and in some cases they are installed in places that are difficult for workers and inspectors to access, such as in the mountains. Such satellite equipment undergoes periodic maintenance.

[0003] For such electronic devices, technology that automatically monitors for breakdowns, deterioration over time, etc. is particularly effective. For example, Patent Document 1 describes such a monitoring device. With this technology, information about a device in which an abnormality has occurred can be quickly and accurately communicated to the end user. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] Japanese Patent Publication No. 2022-147832 DISCLOSURE OF THE INVENTION [Problem to be solved by the invention]

[0005] Even if regular inspections are performed, it is not possible to prevent all failures. Increasing the frequency of regular inspections increases the possibility of preventing failures, but it comes at a high cost. Furthermore, with conventional technologies, including the technology described in Patent Document 1, it is necessary for an end user or other person located far from the equipment to understand the details of the failure and then take action after a failure actually occurs. For this reason, particularly when the equipment is located in a difficult-to-access location as described above, it is difficult to take action after a failure occurs.

[0006] In contrast to this, it would be particularly preferable if, for example, an event that has not yet caused a failure but is likely to lead to a failure could be recognized, and it could be recognized that a failure is likely to occur in the near future, rather than after a failure has actually occurred. In other words, there has been a demand for a technology that detects that a failure is likely to occur in the near future and notifies the user that an inspection is recommended.

[0007] The present invention has been made in view of the above circumstances, and has as its object to solve the above problems. [Means for solving the problem]

[0008] The present invention is a monitoring method for an electronic device having a power supply circuit that uses smoothing by a charging element, which continuously monitors the charge and discharge characteristics of a monitor charging element that corresponds to the charging element and is installed near the electronic device while the electronic device is operating, and issues an alarm if deterioration of the charge and discharge characteristics is recognized. The alarm may be issued when the deterioration detection signal is issued using a monitor circuit including a pulse generating unit that generates a pulse signal that is repeated at a constant amplitude, and a comparator that compares the voltage of the monitor signal after inputting the pulse signal to the monitor charging element and smoothing it with a predetermined voltage threshold, and issues a deterioration detection signal when the voltage of the monitor signal becomes lower than the voltage threshold. The alarm may be issued when the deterioration detection signal is issued multiple times, or when a predetermined number of the monitor circuits issue the deterioration detection signal when multiple monitor circuits are used simultaneously. [Effects of the Invention]

[0009] According to the present invention, it is possible to detect that there is a high possibility that a failure will occur in the near future, and to notify that it is preferable to carry out an inspection. [Brief explanation of the drawings]

[0010] [Figure 1] 1 is a diagram showing a configuration of a monitor circuit used in a method for monitoring an electronic device according to an embodiment; [Figure 2] 1 is a simplified diagram illustrating the operation at the start of operation of a monitor circuit used in a method for monitoring an electronic device according to an embodiment. FIG. [Figure 3] 10 is a simplified diagram showing the operation of the monitor circuit used in the electronic device monitoring method of the embodiment when deterioration of the monitor charging element occurs. FIG. [Figure 4] 1 is a diagram showing a configuration of a satellite device and its surroundings to which a method for monitoring electronic devices according to an embodiment is applied; DETAILED DESCRIPTION OF THE INVENTION

[0011] Next, a method for monitoring an electronic device according to an embodiment of the present invention will be described in detail. Generally, electronic devices that operate on a commercial AC power supply use a power supply circuit that generates, from the commercial AC power supply, the DC voltage required to operate various circuits. In such electronic devices, it is this power supply circuit that is most susceptible to breakdown due to aging.

[0012] Although power supply circuits are also equipped with other elements such as coils, electrolytic capacitors generally have the shortest lifespan. In other words, the degradation of electrolytic capacitors over time is the biggest factor determining the lifespan of power supply circuits or electronic devices. The degradation of electrolytic capacitors over time is greatly influenced by the environment (temperature, humidity, and fluctuations in these).

[0013] Therefore, in this monitoring method, the characteristics of such electrolytic capacitors (charging elements) are the specific and direct targets of monitoring. However, what is directly monitored here is not the electrolytic capacitor used in the power supply circuit of the actual electronic device, but a separate electrolytic capacitor (monitoring charging element) with the same specifications, and this monitoring charging element is installed in close proximity to the electrolytic capacitor in the power supply circuit of the actual electronic device. Therefore, the operating environment of this monitoring charging element is nearly identical to that of the electrolytic capacitor in the power supply circuit of the actual electronic device. Alternatively, this monitoring charging element may be installed in an environment where degradation is expected to be greater than that of the electrolytic capacitor in the power supply circuit of the actual electronic device, such as the location with the highest temperature within the electronic device.

[0014] In this monitoring method, the characteristics of the monitor charging element are continuously monitored while the electronic device is operating. This deterioration can include, for example, a decrease in charge / discharge capacity. Figure 1 shows the configuration of a monitor circuit for monitoring such deterioration.

[0015] This monitor circuit 1 is configured using four types of voltages: a DC power supply voltage VCC for operating the clock generation unit 11 and the comparator 12, the output VP of the clock generation unit 11, a signal VA that is directly monitored, and a comparison signal VB of the comparator 12.

[0016] The output VP of the clock generating unit 11 is generated as a pulse signal with a constant period and a constant amplitude, with the L level being the ground potential and the H level being VCC. This period (frequency) is set appropriately according to the charge capacity and charge / discharge time of the charging element C.

[0017] This pulse signal VP is input to the aforementioned monitoring charging element C, and the terminal voltage thereof becomes a signal (monitoring signal) VA that is directly monitored in this monitoring circuit 1. This monitoring signal VA becomes one input of the comparator 12. The other input in the comparator 12 is a threshold value VB for issuing an alarm. The output VOUT of the comparator 12 is at the L level when VA≧VB, and at the H level when VA<VB.

[0018] The situation of the passage of time of VA and VOUT when this monitoring circuit 1 starts operating is shown in a simplified manner in FIG. 2. At this point, it is assumed that no deterioration has occurred in the monitoring charging element C. Here, the L level is 0V, the H level is VCC>0, and VB is set as shown in the figure such that VB<VCC.

[0019] The output where VP, which is a pulse output, is smoothed by the monitoring charging element C becomes VA, and this operation is the same as the operation of an electrolytic capacitor in a power supply circuit, and is an imitation using this monitoring charging element C.

[0020] Such a smoothing operation is performed by the charging and discharging of the charge accumulated in the large capacitance of the monitoring charging element C. Initially, since the charging of this capacitance is not sufficiently performed at this time, smoothing is not performed, and after sufficient charging is performed by repeatedly inputting the pulse signal VP thereafter, smoothing is normally performed. Therefore, the passage of time of VA in this case is as shown in the upper part of FIG. 2. In the initial stage (the leftmost cycle), no smoothing is performed and VA reflects VP as it is, but after the 6th cycle from the left, sufficient smoothing is performed and VA becomes substantially constant. Although it is shown in a simplified manner here, in reality, there is a ripple, so VA does not become a strictly constant value even in this case.

[0021] When VB is set as shown above the upper side of Figure 2, due to the operation of the comparator 12 as described above, VOUT becomes as shown below the lower side of Figure 2 and is fixed at the L level after the fifth cycle from the left. This situation continues hereafter. This corresponds to the power supply circuit of the electronic device operating normally. That is, when VOUT continues to be maintained at the L level, it is presumed that the electronic device continues to operate normally.

[0022] Next, the situation when deterioration occurs in the monitoring charging element C after continuously operating the monitoring circuit 1 in this way is shown in Figure 3 corresponding to Figure 2. When deterioration occurs in the monitoring charging element C from the state where VA is substantially constant as described above, it becomes difficult to obtain the smoothing effect as described above, the voltage when VP is at the L level decreases, and it approaches the L level. Since the degree of this decrease increases with the passage of time, VA changes as shown above the upper side of Figure 3.

[0023] Correspondingly, VOUT is constant at the L level as described above on the left side in Figure 3, but then a period occurs during which VA < VB when VP is at the L level, and during this period VOUT becomes at the H level. Therefore, when the deterioration of the monitoring charging element C becomes large, a period occurs during which VOUT becomes at the H level. Therefore, in this monitoring circuit 1, with the above configuration, it can be recognized that the deterioration of the monitoring charging element C has become large by the occurrence of the period during which VOUT becomes at the H level. That is, VOUT at the H level becomes a deterioration detection signal indicating that deterioration has been recognized in the monitoring charging element C.

[0024] As described above, if the electrolytic capacitor (charging element) of the power supply circuit of an electronic device using this monitor circuit 1 and the monitor charging element C are installed close to each other and the environmental loads on them are similar, if the monitor charging element C is deteriorating as described above, it can be assumed that the electrolytic capacitor of this electronic device (power supply circuit) is also deteriorating. Therefore, in this case, if the electronic device is configured to issue an alarm to the user or administrator (user, etc.) to notify this fact, subsequent measures can be taken.

[0025] The degree of deterioration required to trigger such an alarm can be set by VB. As mentioned above, even if there is absolutely no deterioration in the monitor charging element C (or the charging element in an actual power supply circuit), VA (or the output voltage of an actual power supply circuit) will not be strictly constant, and in electronic devices, it is sufficient that it remains within a certain range so as not to adversely affect its operation.

[0026] In Figure 3, the minimum value of VA decreases as degradation progresses, and these values ​​at the beginning of degradation are designated V1 and V2 in order of elapsed time, and this value after degradation has progressed sufficiently is designated V0 (V1>V2>V0). Here, it is assumed that the operation of the electronic device is not adversely affected in situations corresponding to V1 and V2, but is adversely affected in situations corresponding to V0. In this case, if VB is set in the range V1>VB>V2, a warning can be issued in situations where it is estimated that the operation of the electronic circuit has not yet been adversely affected. This allows the above warning to be issued and countermeasures to be taken before abnormalities occur in the operation of the electronic device.

[0027] Incidentally, due to the influence of noise or the like, VA may accidentally become less than VB and VOUT may become the H level. To handle such cases and set the criteria for issuing an alarm, for example, an alarm may be issued only when there is a period during which VOUT is at the H level continuously for a certain number of cycles, or when there is a period at the H level in M (M < N) cycles out of N consecutive cycles. Since the deterioration of the charging element generally progresses gradually, according to such settings, after removing the influence of noise, the degree of deterioration can be more appropriately evaluated.

[0028] Also, a plurality of such monitor circuits 1 (monitor charging elements C) may be provided, and an alarm may be issued when a deterioration detection signal is issued from one or a predetermined number of the monitor circuits 1. Such settings can be appropriately made according to variations in the settings and quality of the monitor charging element C.

[0029] FIG. 4 is a diagram showing an aspect when this monitor circuit 1 is used. Here, as the electronic device, a repeater (satellite device) 20 for terrestrial digital broadcasting including a power supply circuit 21 uses this monitor circuit 1. In FIG. 1, a plurality of monitor charging elements C are provided in the vicinity of the power supply circuit 21, but only the monitor charging element C in FIG. 1 may be placed in the vicinity of the power supply circuit 21, and other components may be separated from it.

[0030] The alarm unit 30 is also connected to the monitor circuit 1 and issues an alarm in response to VOUT as described above. That is, an alarm is issued when a deterioration detection signal is issued from a predetermined number (including one) of the multiple monitor circuits 1. In this case, the alarm unit 30 may be configured to recognize that a deterioration detection signal has been detected only when the deterioration detection signal is issued continuously over multiple cycles as described above. This alarm may be transmitted together with a transmission signal (such as an alarm signal) issued by the satellite device 20, or may be transmitted as a signal on a separate system from the transmission signal. The final destination of the alarm is the administrator of the satellite device 20, but if the alarm is transmitted as a signal on a separate system from the transmission signal, it may be transmitted ultimately to the administrator from the receiving side.

[0031] The monitor charging element C is assumed to have the same specifications as the electrolytic capacitor in the power supply circuit of the electronic device (satellite device) to be monitored, but a capacitor that corresponds to it at least in terms of degradation can be used as the monitor charging element C. For example, a capacitor with half the lifespan of the electrolytic capacitor in the power supply circuit may be used as the monitor charging element C. In this case, the alarm issuing unit 30 may issue an alarm, for example, after twice the period has elapsed since the degradation detection signal was first detected. In other words, a capacitor that corresponds to it at least in terms of lifespan can be used as the monitor charging element C.

[0032] In the above example, the deterioration of the monitor charging element is detected using the monitor circuit 1, but other detection circuits can be used as long as they are capable of detecting a decrease in capacity. For example, if the deterioration to be detected is a decrease in insulation resistance rather than a decrease in capacity, a detection circuit using another method for detecting a decrease in insulation resistance can be used. In other words, the specific method for detecting the deterioration of the monitor charging element can be set as appropriate.

[0033] The present invention has been described above based on an embodiment. This embodiment is merely an example, and it will be understood by those skilled in the art that various modifications are possible in the combination of the respective components, and that such modifications are also within the scope of the present invention. [Explanation of symbols]

[0034] 1 Monitor circuit 11 Clock generation unit 12 Comparators 20 Satellite equipment (electronic devices) 21 Power circuit 30 Alarm Department C Monitor charging element

Claims

1. A monitoring method for an electronic device having a power supply circuit in which smoothing by a charging element is used, comprising: A method for monitoring an electronic device, characterized in that the charge and discharge characteristics of a monitor charging element corresponding to the charging element and installed near the electronic device are continuously monitored while the electronic device is operating, and an alarm is issued when deterioration of the charge and discharge characteristics is recognized.

2. a pulse generating unit that generates a pulse signal that is repeated at a constant amplitude; a comparator that compares the voltage of the monitor signal obtained by inputting the pulse signal to the monitor charging element and smoothing it with a preset voltage threshold, and issues a deterioration detection signal when the voltage of the monitor signal becomes lower than the voltage threshold; 2. The method for monitoring an electronic device according to claim 1, wherein the alarm is issued when the deterioration detection signal is issued using a monitor circuit having a function of detecting a deterioration of an electronic device.

3. 3. The electronic device monitoring method according to claim 2, wherein the alarm is issued when the deterioration detection signal is issued multiple times, or when a predetermined number of the monitor circuits are used simultaneously and the deterioration detection signal is issued from a predetermined number of the monitor circuits.

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