Needle detector and needle-detection system

Abstract

To provide a needle detector and a needle-detection system capable of linking the needle detector with an inspection machine used in a post-process following inspection by the needle detector.SOLUTION: A needle detector 10 inspects an inspection target conveyed in a specified conveying direction to determine whether a metal foreign object is mixed therein. The needle detector 10 includes: a detection device 14 that generates a current in accordance with a change in a magnetic field when the metal foreign object passes through the magnetic field; a first reader 15 that reads, in a non-contact fashion, product information of the inspection target stored in an electronic tag 16 attached to the inspection target; and a first processing circuit 31 that detects the metal foreign object based on the current generated by the detection device 14. The first processing circuit 31 generates inspection history information SH that is information obtained by associating the product information of the inspection target with a detection result of the metal foreign object, and transmits the generated inspection history information SH to an X-ray inspection machine 20. The X-ray inspection machine 20 is used as an inspection machine in a post-process following inspection by the needle detector 10.SELECTED DRAWING: Figure 4

Description

[Technical Field]

[0001] The present invention relates to a meter reading machine and a meter reading system. [Background technology]

[0002] Conventionally, there have been needle detectors, such as that described in Patent Document 1. The needle detector detects metallic foreign matter mixed into the inspection object by transporting the inspection object on a conveyor belt and passing it through a detection head. The inspection object is a product such as a sewn product. The foreign matter is, for example, a metallic foreign matter such as a sewing needle. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Japanese Patent Application Laid-Open No. 2012-189412 Summary of the Invention [Problem to be solved by the invention]

[0004] After inspecting for foreign matter contamination with a needle detector, a separate inspection machine may be used to further inspect for foreign matter contamination. In this case, it may be necessary to link the needle detector with the inspection machine used in the post-processing of the inspection by the needle detector. [Means for solving the problem]

[0005] A needle detector that can solve the above problem is configured to inspect whether or not a metallic foreign object is present in an inspection object transported in a specific transport direction. The needle detector includes a detection device configured to generate a current in response to a change in a magnetic field when the metallic foreign object passes through the magnetic field, a reading device configured to contactlessly read product information of the inspection object stored in an electronic tag attached to the inspection object, and a processing circuit configured to detect the metallic foreign object based on the current generated by the detection device. The processing circuit is configured to generate inspection history information that associates the product information of the inspection object with the detection results of the metallic foreign object, and to transmit the generated inspection history information to an inspection machine used in a process subsequent to the inspection by the needle detector.

[0006] According to this configuration, the inspection machine used in the process after the inspection by the meter reading machine can use the inspection history information from the meter reading machine, so the meter reading machine and the inspection machine used in the process after the inspection by the meter reading machine can be linked.

[0007] In the above-mentioned needle reading machine, the inspection machine may be an X-ray inspection machine configured to perform a fluoroscopic inspection of the inspection object using X-rays. According to this configuration, the X-ray inspection machine can use the inspection history information from the needle detector.

[0008] A needle detection system that can solve the above problem includes a needle detector configured to inspect an inspection object transported in a specific transport direction for the presence of metallic foreign matter, and an X-ray inspection machine configured to perform a fluoroscopic inspection of the inspection object using X-rays after the inspection by the needle detector. The needle detector includes a detection device configured to generate a current in response to a change in a magnetic field when the metallic foreign matter passes through the magnetic field, a first reading device configured to contactlessly read product information of the inspection object stored in an electronic tag attached to the inspection object, and a first processing circuit configured to detect the metallic foreign matter based on the current generated by the detection device. The first processing circuit is configured to generate inspection history information that associates the product information of the inspection object with the detection results of the metallic foreign matter, and to transmit the generated inspection history information to the X-ray inspection machine.

[0009] This configuration allows the X-ray inspection machine to use the inspection history information from the needle detector, which allows the needle detector to cooperate with the X-ray inspection machine used in the process after the inspection by the needle detector.

[0010] In the above-described meter detection system, the X-ray inspection machine may include a second reading device configured to collectively read, in a non-contact manner, product information of the inspection targets stored in the electronic tags attached to each of the inspection targets, a display device configured to display the information, and a second processing circuit configured to control the display of the display device. The second processing circuit may be configured to display, on the display device, the product information of the inspection targets read by the second reading device in association with the detection result of the metallic foreign matter included in the inspection history information from the first processing circuit.

[0011] According to this configuration, the display device of the X-ray inspection machine displays the product information of the inspection target read by the second reading device in association with the metallic foreign matter detection results included in the inspection history information from the first processing circuit. This allows the worker to perform the fluoroscopic inspection using the X-ray inspection machine while checking the inspection status by the needle detector.

[0012] In the above meter reading system, the meter reading machine may include a first storage device that stores information. The X-ray inspection machine may include a second storage device that stores information. In this case, the first processing circuit may be configured to transmit the generated inspection history information to the X-ray inspection machine as is without storing it in the first storage device. The second processing circuit may be configured to store the inspection history information from the first processing circuit in the second storage device.

[0013] According to this configuration, the first processing circuit does not store the generated examination history information in the first storage device, which makes it possible to prevent the data stored in the first storage device from becoming too large. In the above meter reading system, the meter reading machine may include a first storage device that stores information. The X-ray inspection machine may include a second storage device that stores information. In this case, the first processing circuit may be configured to store the generated inspection history information in the first storage device and transmit the stored inspection history information to the X-ray inspection machine. The second processing circuit may be configured to store the inspection history information from the first processing circuit in the second storage device.

[0014] According to this configuration, the examination history information stored in the first storage device can be backed up in the second storage device. In the above-mentioned meter reading system, the inspection history information may be information that associates product information of the inspection target, the detection result of the metallic foreign matter, and identification information of the meter reading device.

[0015] According to this configuration, even if the meter reading system has a plurality of meter reading devices, the X-ray inspection device can identify the inspection history information from the plurality of meter reading devices. [Effects of the Invention]

[0016] According to the meter reading machine and meter reading system of the present invention, the meter reading machine can be linked to an inspection machine used in a process subsequent to the inspection by the meter reading machine. [Brief explanation of the drawings]

[0017] [Figure 1] 1 is a perspective view of an embodiment of a meter reading device that constitutes a meter reading system. [Figure 2] 1 is a perspective view of an embodiment of an X-ray inspection machine that constitutes a meter detection system. FIG. [Figure 3] FIG. 1 is a perspective view of a box for explaining a boxing process of inspection objects according to an embodiment. [Figure 4] FIG. 1 is a block diagram of a needle detector and an X-ray inspection machine according to an embodiment. [Figure 5] FIG. 2 is a front view of a display screen of the X-ray inspection apparatus according to the embodiment. DETAILED DESCRIPTION OF THE INVENTION

[0018] An embodiment of the meter reading system will be described below. The needle detection system 1 includes a needle detector 10 shown in FIG. 1 and an X-ray inspection machine 20 shown in FIG. 2. The needle detector 10 is a metal detection type device that inspects whether or not a metallic foreign object is present in an inspection object TG, which is a product. The inspection object is, for example, a sewn product. The metallic foreign object is a magnetic material, such as a sewing needle, a safety pin, or a broken needle. The X-ray inspection machine 20 is a device that uses X-rays to perform a fluoroscopic inspection of the inspection object. Since the X-rays make the foreign object visible, the presence or absence of the foreign object in the inspection object can be visually inspected. The foreign object is not limited to a metallic foreign object but also includes non-metallic foreign objects such as resin and glass.

[0019] <Meter detector 10> First, the configuration of the meter reading device 10 will be described. As shown in FIG. 1, the needle detector 10 has a base 11. The base 11 is, for example, a box-shaped body having a rectangular cross section, and is installed on a mounting surface of an inspection space in a factory. A first side frame 11A and a second side frame 11B are provided on the upper part of the base 11. The first side frame 11A and the second side frame 11B are hollow columnar bodies extending in the long side direction of the base 11. The first side frame 11A and the second side frame 11B are arranged at an interval in the short side direction of the base 11.

[0020] The first side frame 11A has a first display device 12. The first display device 12 is, for example, a touch panel. The touch panel has a screen, and by touching the display on the screen, it is possible to input various data and give instructions to operate the meter reading device 10. The screen of the first display device 12 is exposed on the top surface of the first side frame 11A.

[0021] The needle detector 10 has a first conveying device 13. The first conveying device 13 is, for example, a belt conveyor. The first conveying device 13 is provided between the first side frame 11A and the second side frame 11B. The first conveying device 13 has a first conveying belt 13A. The first conveying belt 13A is an endless belt-shaped member having a predetermined thickness and is stretched over a plurality of rollers. The first conveying belt 13A rotates so as to convey the inspection object TG placed on the conveying surface in a first conveying direction DR1. The conveying surface is the surface of the conveying belt on which the inspection object TG is placed. The first conveying direction DR1 is the traveling direction of the first conveying belt 13A.

[0022] The needle detector 10 has a detector 14. The detector 14 is a part of the needle detector 10 for detecting metallic foreign matter. The detector 14 is supported by a first side frame 11A and a second side frame 11B. The detector 14 has an upper head 14A, a lower head 14B, and two connecting frames 14C.

[0023] The upper head 14A and the lower head 14B extend in a direction perpendicular to the traveling direction of the first conveyor belt 13A. The upper head 14A faces the first conveyor belt 13A at an interval in a direction perpendicular to the conveying surface of the first conveyor belt 13A. The lower head 14B is disposed inside the first conveyor belt 13A in a non-contact state. Two connecting frames 14C extend in the vertical direction and connect both ends of the upper head 14A to both ends of the lower head 14B. The test object TG can pass between the upper head 14A and the conveying surface of the first conveyor belt 13A in a non-contact state.

[0024] The upper head 14A has a plurality of detection coils. The detection coils are arranged in a row at equal intervals in a direction perpendicular to the traveling direction of the first conveyor belt 13A. The axial direction of the detection coils is the vertical direction. The lower head 14B has a permanent magnet. The permanent magnet extends in a direction perpendicular to the traveling direction of the first conveyor belt 13A. The detection coils are arranged corresponding to the space surrounded by the upper head 14A, the lower head 14B, and the two connecting frames 14C. A magnetic field directed from the north pole to the south pole is applied to the detection coils by the permanent magnets.

[0025] If a metallic foreign object is present in the inspection object TG, the metallic foreign object is transported together with the inspection object TG in the first transport direction DR1 by the first transport device 13. As the metallic foreign object approaches the magnetic field as it is transported, the magnetic field changes. When the magnetic field changes, a current is generated in the detection coil due to electromagnetic induction. The current is an induced current and is therefore weak. It is possible to detect the metallic foreign object based on the current generated in the detection coil.

[0026] The meter reading device 10 has a first reading device 15. The first reading device 15 is arranged downstream of the detection device 14 in the first conveying direction DR1. The first reading device 15 is an RFID (Radio Frequency Identification) reader, and is a part of the meter reading device 10 for contactlessly reading information on an IC (Integrated Circuit) tag 16 attached to the inspection object TG. The IC tag 16 may be directly attached to the inspection object TG or may be packed together with the inspection object TG. The IC tag 16 is an IC chip and an antenna covered with a protective material. The IC tag 16 is an electronic tag that operates using external radio waves as a power source and transmits information wirelessly using radio waves.

[0027] The information is stored in the memory of the IC chip. The information is information related to the inspection object TG and includes product information of the inspection object TG. The product information is, for example, information for identifying the inspection object TG and may include identification information unique to the inspection object TG. The product information may also include information such as the product name, color, size, and shipping destination of the inspection object TG. The product information may also include manufacturing information or inspection information of the inspection object TG. The manufacturing information is information such as the factory or manufacturing line where the inspection object TG was manufactured. The inspection information is information related to inspections performed during the manufacturing process of the inspection object TG.

[0028] The first reading device 15 has a reading head body 15A and two support legs 15B. The reading head body 15A extends in a direction perpendicular to the traveling direction of the first conveyor belt 13A. Both ends of the reading head body 15A are supported by the two support legs 15B on the upper surfaces of the first side frame 11A and the second side frame 11B. The reading head bodies 15A face each other at an interval in a direction perpendicular to the conveying surface of the first conveyor belt 13A. The test object TG can pass between the reading head body 15A and the conveying surface of the first conveyor belt 13A in a non-contact state.

[0029] The reading head body 15A has an antenna and a control unit. The antenna transmits and receives radio waves. The antenna transmits a driving radio wave for operating the IC tag 16. The directivity of the antenna is adjusted so that the driving radio wave is transmitted into the space surrounded by the reading head body 15A and the two support legs 15B, that is, so that the driving radio wave does not leak outside the first reading device 15. The antenna receives the radio wave transmitted from the IC tag 16. The control unit controls the output of the radio wave, the frequency of the radio wave, and the like.

[0030] <Packing process> As shown in FIG. 3, after the inspection of the inspection target TG by the needle detector 10 is completed, the inspection target TG is packed in the box 17 in the packing process. The box 17 is, for example, a cardboard packing material having a rectangular cross-sectional shape. Packing is an operation performed to protect the inspection target TG, which is a product, with a packing material, and is an operation to make it suitable for transportation or storage. A plurality of inspection target TGs are accommodated in the box 17. The box 17 is inspected by the X-ray inspection machine 20.

[0031] <X-ray inspection machine 20> Next, the configuration of the X-ray inspection machine 20 will be described. As shown in FIG. 3, the X-ray inspection machine 20 has a housing 21. The housing 21 is made of metal and has an X-ray blocking effect. The housing 21 has a base 21A and a housing 21B. The base 21A is, for example, a box-shaped body having a rectangular cross-sectional shape and is installed on the installation surface of the inspection space in the factory. The housing 21B is, for example, a box-shaped body having a rectangular cross-sectional shape and is provided above the base 21A. The housing 21B has a carry-in port 21B1 and a carry-out port 21B2. The carry-in port 21B1 is an opening of the housing 21B for carrying the box 17 into the inside of the housing 21B. The carry-out port 21B2 is an opening of the housing 21B for carrying the box 17 out of the housing 21B. A shielding curtain may be provided at the carry-in port 21B1 and the carry-out port 21B2. The shielding curtain shields X-rays.

[0032] The X-ray inspection machine 20 has a second conveying device 22. The second conveying device 22 is, for example, a belt conveyor, and is provided on the upper part of the base 21A. The second conveying device 22 is arranged to extend in the long side direction of the base 21A. Both ends of the second conveying device 22 extend outside the base 21A. In the long side direction of the base 21A, a predetermined range including the center of the second conveying device 22 is covered by the housing 21B.

[0033] The second conveying device 22 has a second conveying belt 22A. The second conveying belt 22A is an endless belt-shaped member having a predetermined thickness and is stretched over a plurality of rollers. The second conveying belt 22A rotates to convey the boxes 17 placed on its conveying surface in a second conveying direction DR2. The conveying surface is the surface of the second conveying belt 22A on which the boxes 17 are placed. The second conveying direction DR2 is the traveling direction of the second conveying belt 22A.

[0034] X-ray inspection machine 20 has X-ray source 23. X-ray source 23 is built into the upper part of housing 21B. X-ray source 23 generates X-rays. The direction of X-ray irradiation by X-ray source 23 is, for example, vertically downward, a direction perpendicular to the conveying surface of second conveyor belt 22A. The X-rays are irradiated onto box 17 conveyed into housing 21B by second conveyor device 22.

[0035] X-ray inspection machine 20 has X-ray detector 24. X-ray detector 24 is arranged directly below X-ray source 23 and inside second conveyor belt 22A in a non-contact manner. X-ray detector 24 is, for example, a line sensor. A line sensor is a sensor whose X-ray detection range extends one-dimensionally in a direction perpendicular to second conveyance direction DR2. The detection range is the range of the sensor in which elements that detect X-rays are arranged. X-ray detector 24 is capable of detecting X-rays that have passed through box 17. X-ray detector 24 generates an electrical signal according to the amount of X-rays that have passed through box 17.

[0036] That is, the X-ray detector 24 captures a transmission X-ray image. The images captured in a line by the X-ray detector 24 are treated as a single image, and by continuously capturing images of the box 17 as the subject while moving it in the second conveying direction DR2, it is possible to create a transmission X-ray image, which is a planar image.

[0037] The X-ray inspection machine 20 has a second reading device 25. The second reading device 25 is built into the upper part of the housing 21B. The second reading device 25 is disposed downstream of the X-ray source 23 in the second transport direction DR2. The second reading device 25 is an RFID reader that contactlessly reads information from the IC tags 16 attached to the multiple inspection targets TG housed in the box 17 all at once. Like the first reading device 15, the second reading device 25 has an antenna and a control unit. Driving radio waves from the antenna reach the IC tags 16 of all inspection targets TG in the box 17 transported by the second transport device 22. The antenna can also receive radio waves from the IC tags 16 of all inspection targets TG in the box 17 transported by the second transport device 22.

[0038] X-ray inspection machine 20 has second display device 26. Second display device 26 is provided, for example, on the upper part of housing 21B. Second display device 26 is a touch panel, a liquid crystal display, or an organic EL (Electro-Luminescence) display. Second display device 26 displays various information. The information includes a transmitted X-ray image and information read from IC tag 16. X-ray inspection machine 20 may have multiple second display devices 26 depending on the specifications, etc.

[0039] <Electrical configuration of the meter reading device 10> Next, the electrical configuration of the meter reading device 10 will be described. As shown in FIG. 4, the meter reading device 10 has a first processing circuit 31 and a first storage device 32.

[0040] The first storage device 32 is, for example, a hard disk or a flash memory. The first processing circuit 31 is, for example, a PLC (Programmable Logic Controller). The first processing circuit 31 includes one of the following three configurations A1, A2, and A3.

[0041] A1. One or more processors that operate according to a computer program, which is software. The processor includes a CPU (Central Processing Unit) and memory. A2. One or more dedicated hardware circuits, such as an application-specific integrated circuit (ASIC), that perform at least some of the processing.

[0042] A3. A hardware circuit that combines two configurations A1 and A2. The memory is a computer-readable medium that stores a program that describes processes or instructions for the computer. In this embodiment, the computer is a CPU. The memory includes RAM (Random Access Memory) and ROM (Read Only Memory). The CPU executes various processes by executing the programs stored in the memory at a predetermined calculation cycle.

[0043] The first processing circuit 31 controls the driving of the first conveying device 13. The first processing circuit 31 controls, for example, the rotation speed and rotation direction of the first conveying belt 13A. The first processing circuit 31 controls the operation of the detection device 14. The first processing circuit 31 receives the current generated in each detection coil of the detection device 14 and detects metallic foreign matter based on the received current. That is, the first processing circuit 31 determines whether or not metallic foreign matter is present in the test object TG based on the value of the current received from each detection coil.

[0044] When it is determined that no metallic foreign matter is present in the inspection object TG, the first processing circuit 31 controls the driving of the first conveyor device 13 so that the first conveyor belt 13A moves in the first conveying direction DR1. When it is determined that a metallic foreign matter is present in the inspection object TG, the first processing circuit 31 controls the driving of the first conveyor device 13 so that the first conveyor belt 13A moves in the direction opposite to the first conveying direction DR1. The inspection object TG containing the metallic foreign matter is returned to the end of the first conveyor belt 13A by the first conveyor belt 13A moving in the direction opposite to the first conveying direction DR1.

[0045] The first processing circuit 31 controls the operation of the first reading device 15. The first processing circuit 31 captures information from the IC tag 16 read by the first reading device 15. The first processing circuit 31 generates inspection history information SH based on the captured information from the IC tag 16, and stores the generated inspection history information SH in the first storage device 32. The inspection history information SH is information that associates the information read from the IC tag 16, the detection results of metal foreign matter, the identification information of the needle detector 10, and the SKU code (Stock Keeping Unit Code).

[0046] The information read from the IC tag 16 includes product information of the TG to be inspected. The detection result of the metal foreign matter is the detection result immediately before reading the information of the IC tag 16, and is the determination result of whether or not a metal foreign matter is present in the TG to be inspected. The identification information of the needle detector 10 may be a serial number unique to the needle detector 10. The "SKU code" is a product code, which indicates the smallest unit for inventory management. In order to manage individual products, items are subdivided and classified by design, size, color, etc. The first processing circuit 31 may generate an SKU code based on the information read from the IC tag 16. The SKU code is also one piece of product information of the TG to be inspected.

[0047] The first processing circuit 31 controls the display of the first display device 12 and controls the operation of the needle detector 10 based on an instruction input by operating the screen of the first display device 12. The display content of the first display device 12 includes inspection history information SH.

[0048] The first processing circuit 31 has, as operation modes, a first operation mode and a second operation mode. By performing a touch operation on the first display device 12, the operation mode of the first processing circuit 31 can be switched between the first operation mode and the second operation mode. The handling of the inspection history information SH by the first processing circuit 31 is different between the first operation mode and the second operation mode.

[0049] When the operation mode is the first operation mode, the first processing circuit 31 directly transmits the generated inspection history information SH to the X-ray inspection machine 20. In this case, the first processing circuit 31 does not store the generated inspection history information SH in the first storage device 32. When the operation mode is the second operation mode, the first processing circuit 31 stores the generated inspection history information SH in the first storage device 32 and transmits the stored inspection history information SH to the X-ray inspection machine 20.

[0050] <Electrical configuration of the X-ray inspection machine 20> Next, the electrical configuration of the X-ray inspection machine 20 will be described. As shown in FIG. 4, the X-ray inspection machine 20 has a second processing circuit 41 and a second storage device 42.

[0051] The second storage device 42 has the same configuration as the first storage device 32. The second storage device 42 is, for example, a hard disk or a flash memory. The second processing circuit 41 has the same configuration as the first processing circuit 31. The second processing circuit 41 is, for example, a PLC and includes any one of the three previous configurations A1, A2, and A3.

[0052] The second processing circuit 41 controls the driving of the second conveying device 22. The second processing circuit 41 controls, for example, the rotation speed and rotation direction of the second conveying belt 22A. The second processing circuitry 41 controls the operation of the X-ray source 23. For example, the second processing circuitry 41 controls the start and stop of X-ray irradiation from the X-ray source 23. The second processing circuitry 41 also controls the X-ray output of the X-ray source 23.

[0053] The second processing circuit 41 controls the operation of the X-ray detector 24. The second processing circuit 41 generates transmission X-ray image data of the box 17 based on the electrical signal generated by the X-ray detector 24.

[0054] The second processing circuit 41 controls the display of the second display device 26. Based on the transmission X-ray image data, the second processing circuit 41 displays a transmission X-ray image of the box 17 on the screen of the second display device 26. The transmission X-ray image is an image that is expressed in shades that vary from white to black according to the amount of transmitted X-rays.

[0055] The second processing circuit 41 controls the operation of the second reading device 25. The second processing circuit 41 captures information from the IC tags 16 of the multiple inspection targets TG in the box 17 that has been read by the second reading device 25. The second processing circuit 41 stores the captured information from the IC tags 16 as reading history information in the second storage device 42. The information from the IC tags 16 includes product information for the inspection targets TG.

[0056] The second processing circuit 41 imports the inspection history information SH from the first processing circuit 31 regardless of whether the operating mode of the first processing circuit 31 is the first operating mode or the second operating mode, and stores the imported inspection history information SH in the second memory device 42.

[0057] The second processing circuit 41 associates the detection results of metallic foreign matter contained in the inspection history information SH taken in from the first processing circuit 31 with the read history information, which is product information of the inspection object TG read by the second reading device 25, and displays it on the screen of the second display device 26. The second processing circuit 41 displays the read history information, for example, in a table format on the screen of the second display device 26. An example of the screen display is as follows.

[0058] <Screen display example> As shown in FIG. 5, the screen of the second display device 26 is rectangular. A number of items are displayed at the top of the screen. The items are arranged in a row along the long side of the screen. Examples of the items include "read time," "SKU code," "product name," "size," "color," "number of orders," "number of reads," "meter read," and "unread." The second processing circuit 41 displays the contents of each item on the screen in the order in which the information of the IC tags 16 is retrieved from the second reading device 25. The contents of the items are displayed in order from the top of the screen for each IC tag 16.

[0059] The "read time" is the time when the second processing circuit 41 retrieves the information of the IC tag 16 from the second reader 25. The "SKU code," "product name," "size," and "color" are product information related to the inspection object TG. The "product name," "size," and "color" are information included in the inspection history information SH when the product is, for example, a sewn product.

[0060] The "number of indications" and "number of readings" are information relating to the reading status of the IC tags 16 by the second reading device 25. The number of indications is the number of TGs to be inspected in the box 17 that is specified in advance, and is stored in the second storage device 42. The "number of readings" is the number of IC tags 16 in the box 17 that were actually read by the second reading device 25, i.e., the number of TGs to be inspected.

[0061] "Meter read" and "unread" are information about the inspection status of the TGs to be inspected in the box 17 by the meter reading device 10. "Meter read" is the number of TGs to be inspected that have been inspected by the meter reading device 10. "Unread" is the number of TGs to be inspected that have not been inspected by the meter reading device 10.

[0062] If the number of reads matches the specified number, the second processing circuit 41 determines that the reading status is normal. If the number of meters read matches the specified number and the number of meters not read is "0," the second processing circuit 41 determines that the inspection status is normal. If both the reading status and the inspection status are normal, the second processing circuit 41 colors all the squares in a specific row of the table, including the squares displaying the number of normal reads and the number of normal meters read. The color indicates normality, for example, green.

[0063] If the number of reads does not match the specified number, the second processing circuit 41 determines that the reading situation is abnormal. If the number of reads does not match the specified number, this includes cases where the number of reads is greater than the specified number and cases where the number of reads is less than the specified number. If the reading situation is abnormal, the second processing circuit 41 colors the square in the table where the abnormal number of reads is displayed. The color indicates an abnormality, for example, red.

[0064] The second processing circuit 41 also determines that the reading situation is abnormal when the number of instructions is "0" but the number of reads is not "0." If the reading situation is abnormal, the second processing circuit 41 colors the square in the table where the SKU code is displayed. The color indicates an abnormality, for example, red.

[0065] If the number of meters that have been read does not match the indicated number, i.e., if the number of unread meters is not "0", the second processing circuit 41 determines that the inspection status is abnormal. If the inspection status is abnormal, the second processing circuit 41 colors the square in the table that displays the abnormal number of unread meters. The color indicates an abnormality, for example, red.

[0066] The operator of the X-ray inspection machine 20 can, for example, visually check the details of the inspection object TG in the box 17. The operator of the X-ray inspection machine 20 can also visually check the reading status and the inspection status. The operator of the X-ray inspection machine 20 can perform a fluoroscopic inspection by the X-ray inspection machine 20 while checking the inspection status by the needle detector 10.

[0067] <Effects of the embodiment> (1) The meter detection system 1 includes a meter detector 10 that inspects whether or not a metal foreign object is present in an inspection object TG transported in a specific transport direction, and an X-ray inspection device 20 that performs a fluoroscopic inspection of the inspection object TG using X-rays after the inspection by the meter detector 10. The specific transport direction is a first transport direction DR1. The X-ray inspection device 20 is an inspection device used in a process after the inspection by the meter detector 10. The meter detector 10 includes a detection device 14, a first reading device 15, and a first processing circuit 31. The detection device 14 generates a current in response to a change in a magnetic field when a metal foreign object passes through the magnetic field. The first reading device 15 contactlessly reads product information of the inspection object TG stored in an IC tag 16 attached to the inspection object TG. The first processing circuit 31 detects the metal foreign object based on the current generated by the detection device 14. The first processing circuit 31 generates inspection history information SH, which is information that associates product information of the inspection object TG with the detection results of metallic foreign matter, and transmits the generated inspection history information SH to the X-ray inspection machine 20. According to this configuration, the X-ray inspection machine 20, which is used in a process subsequent to the inspection by the needle detection machine 10, can use the inspection history information SH from the needle detection machine 10. Therefore, the needle detection machine 10 and the X-ray inspection machine 20 can be linked together.

[0068] (2) The X-ray inspection machine 20 includes a second reading device 25, a second display device 26, and a second processing circuit 41. The second reading device 25 contactlessly reads product information of the inspection objects TG stored in IC tags 16 attached to each of the multiple inspection objects TG all at once. The multiple inspection objects TG are packed in boxes 17, for example. The second display device 26 displays information. The second processing circuit 41 controls the display of the second display device 26. The second processing circuit 41 also displays, on the second display device 26, the product information of the inspection objects TG read by the second reading device 25, in association with the detection results of metallic foreign matter included in the inspection history information SH from the first processing circuit 31. According to this configuration, the second display device 26 of the X-ray inspection machine 20 displays the product information of the inspection objects TG read by the second reading device 25, in association with the detection results of metallic foreign matter included in the inspection history information SH from the first processing circuit 31. Therefore, the worker can perform the fluoroscopic inspection by the X-ray inspection machine 20 while checking the inspection status by the meter detector 10.

[0069] (3) The meter reading device 10 includes a first storage device 32 that stores information. The X-ray inspection device 20 includes a second storage device 42 that stores information. When the operation mode of the first processing circuit 31 is the first operation mode, the first processing circuit 31 transmits the generated inspection history information SH to the X-ray inspection device 20 as is without storing it in the first storage device 32. The second processing circuit 41 stores the inspection history information SH from the first processing circuit 31 in the second storage device 42. According to this configuration, the first processing circuit 31 does not store the generated inspection history information SH in the first storage device 32. This makes it possible to prevent the data stored in the first storage device 32 from becoming bloated. Furthermore, it is possible to save the storage capacity of the first storage device 32.

[0070] (4) When the operation mode of the first processing circuit 31 is the second operation mode, the first processing circuit 31 stores the generated inspection history information SH in the first storage device 32 and transmits the stored inspection history information SH to the X-ray inspection device 20. The second processing circuit 41 stores the inspection history information SH from the first processing circuit 31 in the second storage device 42. According to this configuration, the inspection history information SH stored in the first storage device 32 can be backed up in the second storage device 42. Therefore, if an abnormality occurs in the first storage device 32, the first processing circuit 31 can refer to the inspection history information SH stored in the second storage device 42. Furthermore, if an abnormality occurs in the second storage device 42, the second processing circuit 41 can refer to the inspection history information SH stored in the first storage device 32.

[0071] (5) The inspection history information SH is information that associates product information of the inspection object TG, the detection results of metal foreign matter, and the identification information of the meter reading device 10. According to this configuration, even if the meter reading system 1 has multiple meter reading devices 10, the X-ray inspection device 20 can identify the inspection history information SH from the multiple meter reading devices 10.

[0072] <Other embodiments> This embodiment may be modified as follows. The first reading device 15 may be detachable from the first side frame 11A and the second side frame 11B. In this way, the first reading device 15 can be retrofitted to an existing meter reading machine 10 that does not have the first reading device 15. Also, an existing reader that has only the first reading device 15 may be arranged downstream of an existing meter reading machine 10 that does not have the first reading device 15 so as to be continuous with it.

[0073] The X-ray detector 24 does not have to be a line sensor. The X-ray detector 24 may be, for example, an area sensor that extends two-dimensionally. The first processing circuit 31 may store the inspection history information SH stored in the first storage device 32 in a server. The first processing circuit 31 transmits the inspection history information SH to the server via a communication network such as the Internet. The server may be a stationary server or a cloud server. A cloud server is a server that is intended to be used via a communication network and is installed in a cloud environment.

[0074] After the inspection by the needle detector 10 is completed, a robot may be used to pack the inspection target TG into a box 17. Furthermore, the packed box 17 may be carried into the second transport device 22 of the X-ray inspection machine 20 by the robot.

[0075] The inspection machine used in the process after the inspection by the needle detector 10 is not limited to the X-ray inspection machine 20. The inspection history information SH does not have to include identification information of the meter detector 10. In other words, the inspection history information SH may be information that associates product information of the inspection object TG with the detection results of metallic foreign matter. [Explanation of symbols]

[0076] 1...Meter reading system 10...Meter reading machine 14...Detection device 15...First reading device (reading device) 16...IC tag (electronic tag) 20...X-ray inspection machine 25...Second reading device 26...Second display device (display device) 31...First processing circuit (processing circuit) 32...First storage device 41...Second processing circuit 42...Second storage device

Claims

1. A needle detector configured to inspect whether or not a metal foreign substance is mixed into an inspection object transported in a specific transport direction, a detection device configured to generate a current in response to a change in the magnetic field when the metallic foreign object passes through the magnetic field; a reading device configured to contactlessly read product information of the inspection object stored in an electronic tag attached to the inspection object; a processing circuit configured to detect the metallic foreign object based on the current generated by the detection device; The processing circuit generates inspection history information that associates product information of the inspection target with the detection results of the metal foreign matter, and transmits the generated inspection history information to an inspection machine used in a process subsequent to the inspection by the needle detector.

2. The needle detector according to claim 1 , wherein the inspection machine is an X-ray inspection machine configured to perform a fluoroscopic inspection of the inspection object using X-rays.

3. a needle detector configured to inspect whether or not a metal foreign substance is present in an inspection object being transported in a specific transport direction; an X-ray inspection machine configured to perform a fluoroscopic inspection of the inspection object using X-rays after the inspection by the meter reading machine, The meter reading machine is a detection device configured to generate a current in response to a change in the magnetic field when the metallic foreign object passes through the magnetic field; a first reading device configured to contactlessly read product information of the inspection object stored in an electronic tag attached to the inspection object; a first processing circuit configured to detect the metallic foreign object based on a current generated by the detection device; the first processing circuit is configured to generate inspection history information that is information that associates product information of the inspection target with the detection results of the metallic foreign matter, and to transmit the generated inspection history information to the X-ray inspection machine.

4. The X-ray inspection machine is a second reading device configured to contactlessly read the product information of the inspection objects stored in the electronic tags attached to each of the plurality of inspection objects all at once; a display device configured to display information; a second processing circuit configured to control a display of the display device; 4. The meter reading system according to claim 3, wherein the second processing circuit is configured to display, on the display device, product information of the inspection target read by the second reading device in association with the detection result of the metal foreign matter included in the inspection history information from the first processing circuit.

5. The meter reading device includes a first storage device that stores information, the X-ray inspection machine includes a second storage device that stores information; the first processing circuit is configured to transmit the generated inspection history information to the X-ray inspection machine without storing it in the first storage device, The meter reading system according to claim 4 , wherein the second processing circuit is configured to store the inspection history information from the first processing circuit in the second storage device.

6. The meter reading device includes a first storage device that stores information, the X-ray inspection machine includes a second storage device that stores information; the first processing circuit is configured to store the generated inspection history information in the first storage device and to transmit the stored inspection history information to the X-ray inspection machine; The meter reading system according to claim 4 , wherein the second processing circuit is configured to store the inspection history information from the first processing circuit in the second storage device.

7. 5. The meter-detection system according to claim 3, wherein the inspection history information is information that associates product information of the inspection target, the detection result of the metallic foreign matter, and identification information of the meter-detection device.

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