Measurement device and program

Abstract

To further reduce dead time when performing phase calculation.SOLUTION: A measurement device includes a control circuit that stores measured values indicating changes in an electrical signal in a memory, determines a plurality of periods in which it is considered that a predetermined trigger condition is satisfied in the measured values indicating changes in the electrical signal stored in the memory, acquires a trigger point that is a point in time at which the trigger condition is satisfied, estimated on the basis of the measured values included in the period for each of the plurality of periods, aligns the estimated trigger point to a predetermined position for each of the plurality of periods, and causes a display unit to display waveforms relating to the measured values before and after the trigger point.SELECTED DRAWING: Figure 2

Description

[Technical Field]

[0001] The present disclosure relates to a measurement device and a program. [Background technology]

[0002] An oscilloscope is a device that acquires electrical signal data at regular sampling intervals and displays the waveform of the acquired electrical signal. Some oscilloscopes are equipped with a trigger function that detects when a certain condition (trigger condition) is met in the electrical signal and displays the waveform before and after the condition is met at a specified position. When the trigger condition is met and the waveform is displayed, it is said to be "triggered." The point in time when the trigger condition is met is called the trigger point (trigger position).

[0003] When acquiring electrical signal data at a fixed sampling interval, a trigger may occur between sample points. In such cases, the oscilloscope cannot directly acquire the exact timing at which the trigger occurred, i.e., the trigger point. Phase calculation is a method of inferring the waveform between sample points by interpolating several points before and after the trigger point, and estimating the timing at which the trigger occurred between the sample points.

[0004] Patent Documents 1 and 2 describe techniques relating to the trigger function of an oscilloscope. [Prior art documents] [Patent documents]

[0005] [Patent Document 1] Japanese Patent Application Laid-Open No. 2001-272420 [Patent Document 2] Japanese Patent Application Publication No. 6-177760 Summary of the Invention [Problem to be solved by the invention]

[0006] The conventional configuration has room for improvement in terms of reducing the dead time, which is the time during which waveforms cannot be acquired, when performing phase calculations.

[0007] The objective of this disclosure is to reduce the dead time when performing phase calculations. [Means for solving the problem]

[0008] In some embodiments, the measurement device comprises: (1) Store the measured values ​​that indicate the change in the electrical signal in memory. determining a plurality of periods during which a predetermined trigger condition is considered to be satisfied in the measured values ​​indicating the change in the electrical signal stored in the memory; For each of the plurality of periods, a trigger point is acquired, which is a point in time at which the trigger condition is satisfied, estimated based on the measurement values ​​included in the period; For each of the plurality of periods, the estimated trigger point is aligned to a predetermined position, and waveforms relating to the measurement values ​​before and after the trigger point are displayed on a display. A measuring device that includes a control circuit.

[0009] In this way, the measurement device does not perform phase calculations to estimate the trigger point each time a measurement value is obtained, but rather stores the measurement values ​​in memory and then performs phase calculations all at once, thereby making it possible to reduce the dead time when performing phase calculations.

[0010] In one embodiment, (2) In the measuring device of (1), The control circuit storing a plurality of measurement samples of the sampled and quantized electrical signal in a memory as the measurements; determining a plurality of periods during which a predetermined trigger condition is considered to be satisfied in the plurality of measurement samples stored in the memory; For each of the plurality of periods, a time point at which the trigger condition is satisfied is estimated based on interpolation of the measurement samples included in the period, and the time point is acquired as the trigger point; For each of the plurality of periods, the estimated trigger point may be aligned with the predetermined position, and waveforms relating to the measurement samples before and after the trigger point may be displayed on the display.

[0011] In this way, the measurement device processes multiple measurement samples of the sampled and quantized electrical signal, so it is possible to reduce the dead time when performing phase calculations, even when digitally converted measurement values ​​are used.

[0012] In one embodiment, (3) In the measuring device of (1) or (2), a trigger circuit configured to estimate the trigger point for each of the plurality of time periods based on the measurement values ​​included in the time period; The control circuit may obtain the trigger point estimated by the trigger circuit for each of the plurality of time periods.

[0013] In this way, since the trigger point is acquired by a dedicated trigger circuit, it is possible to perform phase calculations for estimating the trigger point at high speed.

[0014] In one embodiment, (4) In the measuring device of (3), The trigger circuit may perform the process of estimating the trigger point for each of the plurality of periods by pipeline processing.

[0015] In this way, the process of estimating the trigger point is executed in parallel by pipeline processing, so that the phase calculation can be performed at high speed.

[0016] In one embodiment, (5) In any of the measuring devices (1) to (4), The control circuit As the trigger condition, a plurality of periods during which the electrical signal is considered to rise across a predetermined trigger level are determined; For each of the plurality of periods, a time point at which the electrical signal rises across a predetermined trigger level, estimated based on the measurement values ​​included in the period, is acquired as the trigger point; For each of the plurality of periods, the estimated trigger point may be aligned with the predetermined position, and waveforms relating to the measurement values ​​before and after the trigger point may be displayed on the display.

[0017] Therefore, it is possible to analyze the waveform by focusing on the rise of the electrical signal across a predetermined trigger level as a trigger condition.

[0018] In one embodiment, (6) In any of the measuring devices described in (1) to (4), The control circuit As the trigger condition, a plurality of periods during which the electrical signal is considered to have crossed a predetermined trigger level and fallen are determined; For each of the plurality of periods, a time point at which the electrical signal falls across a predetermined trigger level, estimated based on the measurement values ​​included in the period, is acquired as the trigger point; For each of the plurality of periods, the estimated trigger point may be aligned with the predetermined position, and waveforms relating to the measurement values ​​before and after the trigger point may be displayed on the display.

[0019] Therefore, it is possible to analyze the waveform by focusing on the falling edge of the electrical signal across a predetermined trigger level as a trigger condition.

[0020] In some embodiments, the program (7) To the computer, storing the measurements indicative of the change in the electrical signal in memory; determining a plurality of periods during which a predetermined trigger condition is considered to be met in the measurements stored in memory; a step of acquiring, for each of the plurality of periods, a trigger point that is a point in time at which the trigger condition is satisfied, estimated based on the measurement values ​​included in the period; a step of aligning the estimated trigger point with a predetermined position for each of the plurality of time periods and displaying waveforms relating to the measurement values ​​before and after the trigger point on a display; Execute the following.

[0021] In this way, the program does not perform phase calculations to estimate the trigger point each time a measurement value is obtained, but rather stores the measurement values ​​in memory and then performs phase calculations all at once, thereby making it possible to reduce the dead time when performing phase calculations.

[0022] In one embodiment, (8) In the program of (7), storing a plurality of measurement samples of the sampled and quantized electrical signal in a memory as the measurements; determining a plurality of periods during which a predetermined trigger condition is considered to be satisfied in the plurality of measurement samples stored in the memory; For each of the plurality of periods, a time point at which the trigger condition is satisfied is estimated based on interpolation of the measurement samples included in the period, and the time point is acquired as the trigger point; For each of the plurality of periods, the estimated trigger point may be aligned with the predetermined position, and waveforms relating to the measurement samples before and after the trigger point may be displayed on the display.

[0023] In this way, the program processes multiple measurement samples of sampled and quantized electrical signals, making it possible to reduce the dead time when performing phase calculations, even when digitally converted measurement values ​​are used.

[0024] In one embodiment, (9) In the program of (7) or (8), The estimated trigger point for each of the plurality of time periods may be obtained by pipeline processing.

[0025] In this way, the process of estimating the trigger point is executed in parallel by pipeline processing, so that the phase calculation can be performed at high speed.

[0026] In one embodiment, (10) In any of the programs listed in (7) to (9), As the trigger condition, a plurality of periods during which the electrical signal is considered to rise across a predetermined trigger level are determined; For each of the plurality of periods, a time point at which the electrical signal rises across a predetermined trigger level, estimated based on the measurement values ​​included in the period, is acquired as the trigger point; For each of the plurality of periods, the estimated trigger point may be aligned with the predetermined position, and waveforms relating to the measurement values ​​before and after the trigger point may be displayed on the display.

[0027] Therefore, it is possible to analyze the waveform by focusing on the rise of the electrical signal across a predetermined trigger level as a trigger condition.

[0028] In one embodiment, (11) In any of the programs listed in (7) to (9), As the trigger condition, a plurality of periods during which the electrical signal is considered to have crossed a predetermined trigger level and fallen are determined; For each of the plurality of periods, a time point at which the electrical signal falls across a predetermined trigger level, estimated based on the measurement values ​​included in the period, is acquired as the trigger point; For each of the plurality of periods, the estimated trigger point may be aligned with the predetermined position, and waveforms relating to the measurement values ​​before and after the trigger point may be displayed on the display.

[0029] Therefore, it is possible to analyze the waveform by focusing on the falling edge of the electrical signal across a predetermined trigger level as a trigger condition. [Effects of the Invention]

[0030] According to an embodiment of the present disclosure, the dead time when performing phase calculation can be further reduced. [Brief explanation of the drawings]

[0031] [Figure 1] 10 is a timing chart showing the relationship between waveform acquisition and phase calculation in a comparative example. [Figure 2] 1 is a block diagram showing an example of the configuration of a measurement device according to an embodiment; [Figure 3] FIG. 10 is a schematic diagram illustrating a process for estimating a trigger point by phase calculation. [Figure 4] 4 is a timing chart showing an example of the relationship between waveform acquisition and phase calculation in this embodiment. DETAILED DESCRIPTION OF THE INVENTION

[0032] <Comparative Example> FIG. 1 is a timing chart showing the relationship between waveform acquisition and phase calculation in the comparative example. In FIG. 1, the horizontal axis represents time. In the comparative example, phase calculation is performed between waveform acquisitions. Specifically, in FIG. 1, the comparative example acquires waveforms from time t1 to time t3, and performs phase calculation based on the electrical signals of the acquired waveforms from time t2 to time t4 in response to the occurrence of a trigger at time t2. After the phase calculation at time t4 is completed, the comparative example acquires waveforms from time t5 to time t7, and performs phase calculation based on the electrical signals of the acquired waveforms from time t6 to time t8 in response to the occurrence of a trigger at time t6.

[0033] In this way, when a trigger occurs during waveform acquisition, the comparative example calculates the phase using the measured values ​​before and after the trigger point. In this case, the comparative example cannot accept the next trigger during phase calculation. Therefore, after waveform acquisition ends at time t3, the comparative example cannot acquire the next waveform until phase calculation based on the acquired waveform ends at time t5. Therefore, the time required for phase calculation from time t3 to time t5 becomes a dead time during which waveform acquisition is not possible. Even if a trigger occurs during the dead time, the comparative example cannot acquire or display the signal before and after the trigger.

[0034] <Embodiment> Hereinafter, an embodiment of the present disclosure will be described with reference to the drawings. In each drawing, parts having the same configuration or function are denoted by the same reference numerals. In the description of this embodiment, duplicated descriptions of the same parts may be omitted or simplified as appropriate.

[0035] 2 is a block diagram showing an example of the configuration of a measurement device 10 according to an embodiment. The measurement device 10 is, for example, an oscilloscope that acquires electrical signal data and displays the waveform. The measurement device 10 includes a control circuit 11, an AD (Analog-to-Digital) converter 12, a memory 13, a trigger circuit 14, and a display 15.

[0036] The control circuit 11 includes one or more processors. In one embodiment, the "processor" may be, but is not limited to, a general-purpose processor or a dedicated processor specialized for a particular process. The control circuit 11 is communicatively connected to each component of the measurement device 10 and controls the operation of the entire measurement device 10.

[0037] The AD converter 12 receives an analog electrical signal to be measured, converts the received electrical signal into a digital signal, and outputs it to the control circuit 11 and the trigger circuit 14. The AD converter 12 samples the received analog signal at a constant sampling frequency and quantizes it to digitize the input signal in the time and amplitude directions.

[0038] The memory 13 includes any storage module, such as a hard disk drive (HDD), a solid state drive (SSD), a read-only memory (ROM), and a random access memory (RAM). The memory 13 may function as, for example, a main storage device, an auxiliary storage device, or a cache memory. The memory 13 stores any information used in the operation of the measurement device 10. For example, the memory 13 may store the measurement values ​​of the electrical signal digitized by the AD converter 12, trigger conditions, detected trigger points, etc. The memory 13 is not limited to being built into the measurement device 10, but may also be an external database or an external storage module.

[0039] The trigger circuit 14 detects that a certain trigger condition is met in the electrical signal and determines the timing for acquiring the waveform of the electrical signal. For example, the trigger circuit 14 detects that the electrical signal rises or falls across a certain level (trigger level) (edge ​​trigger) as a trigger condition, but the trigger conditions that the trigger circuit 14 can detect are not limited to edge triggers. For example, the trigger circuit 14 may detect conditions based on the pulse width, rise / fall time, runt, timeout, window, interval, etc. of the electrical signal as a trigger condition. When measuring multiple electrical signals in parallel, the trigger circuit 14 may detect that the edge, pulse width, rise / fall time, runt, timeout, window, interval, etc. of any of the electrical signals satisfies a certain condition as the trigger condition being met.

[0040] The display 15 is a display that outputs information as an image. The display 15 may be, for example, a liquid crystal panel display or an organic EL (Electro Luminescence) display. The display 15 may be configured as a touch panel integrated with a touch screen that detects a user's touch. The display 15 may be configured as an integral part of the measuring device 10, or may be provided separately.

[0041] When the trigger circuit 14 determines the timing to capture the waveform, it notifies the control circuit 11. The control circuit 11 determines the timing notified by the trigger circuit 14 as the trigger point and causes the display 15 to display the waveform of the input signal before and after the trigger point.

[0042] The functions of the measuring device 10 can be realized by executing a computer program (program) according to this embodiment on a processor included in the control circuit 11. That is, the functions of the measuring device 10 can be realized by software. The computer program causes a computer to execute the processing of steps included in the operation of the measuring device 10, thereby causing the computer to realize the functions corresponding to the processing of each step. That is, the computer program is a program for causing a computer to function as the measuring device 10 according to this embodiment. The computer program may be recorded on a computer-readable recording medium. Programs include information used for processing by an electronic computer that is equivalent to a program. For example, data that is not a direct instruction to a computer but has properties that define computer processing falls under the category of "something equivalent to a program."

[0043] Some or all of the functions of the measuring device 10 may be realized by a dedicated circuit included in the control circuit 11. That is, some or all of the functions of the measuring device 10 may be realized by hardware. Furthermore, the measuring device 10 may be realized by a single computer or by multiple computers working together.

[0044] In the above configuration, the measurement apparatus 10 postpones the phase calculation, which takes a long time to perform, and further reduces the dead time by parallelizing the phase calculation through pipeline processing.

[0045] Although the following describes an example in which the measuring device 10 acquires a voltage signal as an electrical signal, the measuring device 10 may acquire other signals, such as a current signal, as an electrical signal. Also, the following describes an example in which the measuring device 10 detects an edge trigger as a trigger condition, but the measuring device 10 may operate based on other trigger conditions as the trigger condition.

[0046] Figure 3 is a schematic diagram illustrating the process of estimating a trigger point by phase calculation. In an oscilloscope, even if a trigger point exists between samplings, the trigger point can be accurately estimated by estimating the waveform of the input signal by interpolating using sample data before and after the trigger point. Phase calculation is a process that estimates the timing (trigger point) of a trigger by estimating the true signal waveform by interpolating based on the signal that has been discretized in the time and amplitude directions.

[0047] FIG. 3 shows an example in which a signal rising across a trigger level Th is detected as a trigger condition. In FIG. 3, the horizontal axis represents time. The vertical axis represents the voltage of the input signal. Sample point 41 represents a sample point of the input signal digitized by the AD converter 12. In the example of FIG. 3, the voltage of sample point 41a is lower than the trigger level Th, and the voltage of the next sampled sample point 41b is higher than the trigger level Th. Therefore, the trigger circuit 14 performs sine interpolation or the like using a predetermined number of sample points 41 before and after sample points 41a and 41b to obtain an approximate waveform 42 of the input signal. The trigger circuit 14 estimates the time t0 at which the voltage of the approximate waveform 42 reaches the trigger level Th as the trigger point. Note that the trigger circuit 14 may obtain the approximate waveform 42 from the sample points 41 using any method other than sine interpolation, such as regression analysis.

[0048] It is known that such phase calculations generally take time. Therefore, if a phase calculation is performed each time a trigger condition is detected, the dead time during which waveform data cannot be acquired increases, as described above with reference to FIG. 1. Therefore, the measurement apparatus 10 according to this embodiment reduces the dead time by performing a phase calculation after acquiring multiple waveforms for which trigger occurrences have been detected, rather than performing a phase calculation each time a waveform, including a trigger occurrence, is acquired.

[0049] 4 is a timing chart showing an example of the relationship between waveform acquisition and phase calculation in this embodiment. In FIG. 4, the horizontal axis represents time. In the example of FIG. 4, the measurement device 10 continuously performs waveform acquisition 1, waveform acquisition 2, ..., waveform acquisition N N times, each time a trigger occurrence is detected. Thereafter, the measurement device 10 performs phase calculation 1 based on waveform acquisition 1, phase calculation 2 based on waveform acquisition 2, ..., phase calculation N based on waveform acquisition N, through pipeline processing.

[0050] In FIG. 4, the measurement device 10 11 From time t 12 Waveform acquisition 1 is performed until time t 21 Similarly, for m=2, 3, . . . , N, the measurement device 10 generates a trigger at time t 1m From time t 1(m+1) Waveform acquisition m is performed until time t 2m (t 1m <t 2m <t 1(m+1) ) A trigger is generated. The measurement device 10 stores the measurement values ​​of waveform acquisitions 1 to N in the memory 13.

[0051] After waveform acquisition N is completed, the measurement device 10 31 From time t 41 The electrical signal of the waveform acquired in waveform acquisition 1 is read from memory 13, and phase calculation 1 is performed based on this electrical signal. Similarly, for m=2, 3, . . . , N, the measurement device 10 performs phase calculation 1 from time t 3m From time t 4mUp to waveform acquisition m, phase calculation m is performed based on the electrical signal of the waveform acquired.

[0052] In this way, the measurement device 10 performs N waveform acquisitions consecutively, and then performs phase calculations based on the electrical signals of the waveforms acquired in each waveform acquisition. After all phase calculations are completed, the measurement device 10 aligns each waveform according to its trigger point and displays it on the display 15. Therefore, the measurement device 10 calculates the phases of the waveforms acquired 1 to N (time t 11 From time t 1(N+1) It is possible to detect all trigger occurrences and display waveforms before and after all triggers without causing dead time in the entire measurement range (up to the trigger point).

[0053] Furthermore, the measurement device 10 executes phase calculation 1 to phase calculation N by pipeline processing. For example, the measurement device 10 may implement a series of processing elements related to the phase calculations using multiple pieces of hardware connected in series with each other, and the output of one element may be the input of the next element, so that the processing is performed in parallel. In the example of FIG. 4, for m=2,...,N, t 3(m-1) <t 3m <t 4m holds, and a plurality of phase calculations are performed in parallel. With this configuration, the measurement apparatus 10 can perform a plurality of phase calculations at high speed.

[0054] As described above, the measuring device 10 stores the measurement values ​​indicating changes in the electrical signal in the memory 13. The measuring device 10 determines multiple periods during which a predetermined trigger condition is considered to be met based on the measurement values ​​indicating changes in the electrical signal stored in the memory 13. For each of the multiple periods, the measuring device 10 acquires a trigger point, which is the point in time when the trigger condition is satisfied, estimated based on the measurement values ​​included in that period. For each of the multiple periods, the measuring device 10 aligns the estimated trigger point to a predetermined position and displays waveforms related to the measurement values ​​before and after the trigger point on the display 15.

[0055] In this way, the measurement device 10 does not perform phase calculations to estimate the trigger point each time a measurement value is acquired, but rather temporarily stores the measurement values ​​in memory 13 and then performs phase calculations all at once, thereby making it possible to reduce the dead time when performing phase calculations. Note that, although the present embodiment has been described as an example in which processing is performed on measurement values ​​of electrical signals that have been digitized by sampling and quantization, the measurement device 10 may also perform similar processing on analog signals.

[0056] Furthermore, the measurement apparatus 10 obtains the estimated trigger points for each of the multiple periods through pipeline processing, and therefore, the measurement apparatus 10 performs phase calculations in parallel through pipeline processing, enabling high-speed phase calculations.

[0057] As described above, while the comparative example performs phase calculations each time a trigger is activated, the measurement device 10 performs phase calculations all at once using data stored in memory after waveform acquisition is complete. This allows the measurement device 10 to reduce dead time. After waveform acquisition is complete, the measurement device 10 performs phase calculations from sample data stored in memory 13 and uses the data to display the waveform. Furthermore, the measurement device 10 can speed up phase calculations by performing pipeline processing when calculating phases after waveform acquisition.

[0058] The present disclosure is not limited to the above-described embodiments. For example, multiple blocks shown in the block diagrams may be integrated, or one block may be divided. Other modifications may be made without departing from the spirit of the present disclosure. [Explanation of symbols]

[0059] 10. Measuring equipment 11 Control circuit 12 AD converter 13. Memory 14 Trigger Circuit 15 Display 41, 41a, 41b Sample points 42 Approximate waveform

Claims

1. The measured values ​​that indicate the change in the electrical signal are stored in memory. determining a plurality of periods during which a predetermined trigger condition is considered to be satisfied in the measured values ​​indicating the change in the electrical signal stored in the memory; For each of the plurality of periods, a trigger point is acquired, which is a point in time at which the trigger condition is satisfied, estimated based on the measurement values ​​included in the period; For each of the plurality of periods, the estimated trigger point is aligned to a predetermined position, and waveforms relating to the measurement values ​​before and after the trigger point are displayed on a display. A measuring device comprising a control circuit.

2. The control circuit storing a plurality of measurement samples of the sampled and quantized electrical signal in a memory as the measurements; determining a plurality of periods during which a predetermined trigger condition is considered to be satisfied in the plurality of measurement samples stored in the memory; For each of the plurality of periods, a time point at which the trigger condition is satisfied is estimated based on interpolation of the measurement samples included in the period, and the time point is acquired as the trigger point; aligning the estimated trigger point with the predetermined position for each of the plurality of periods, and displaying waveforms relating to the measurement samples before and after the trigger point on the display device; The measuring device according to claim 1 .

3. a trigger circuit configured to estimate the trigger point for each of the plurality of time periods based on the measurement values ​​included in the time period; the control circuit acquires the trigger point estimated by the trigger circuit for each of the plurality of time periods; The measuring device according to claim 1 .

4. The measurement device according to claim 3 , wherein the trigger circuit executes the process of estimating the trigger point for each of the plurality of periods by pipeline processing.

5. The control circuit As the trigger condition, a plurality of periods during which the electrical signal is considered to rise across a predetermined trigger level are determined; For each of the plurality of periods, a time point at which the electrical signal rises across a predetermined trigger level, estimated based on the measurement values ​​included in the period, is acquired as the trigger point; For each of the plurality of periods, the estimated trigger point is aligned with the predetermined position, and waveforms relating to the measurement values ​​before and after the trigger point are displayed on the display. The measuring device according to claim 1 .

6. The control circuit As the trigger condition, a plurality of periods during which the electrical signal is considered to have crossed a predetermined trigger level and fallen are determined; For each of the plurality of periods, a time point at which the electrical signal falls across a predetermined trigger level, estimated based on the measurement values ​​included in the period, is acquired as the trigger point; For each of the plurality of periods, the estimated trigger point is aligned with the predetermined position, and waveforms relating to the measurement values ​​before and after the trigger point are displayed on the display. The measuring device according to claim 1 .

7. On the computer, storing the measurements indicative of the change in the electrical signal in memory; determining a plurality of periods during which a predetermined trigger condition is considered to be met in the measurements stored in memory; a step of acquiring, for each of the plurality of periods, a trigger point that is a point in time at which the trigger condition is satisfied, estimated based on the measurement values ​​included in the period; a step of aligning the estimated trigger point with a predetermined position for each of the plurality of time periods and displaying waveforms relating to the measurement values ​​before and after the trigger point on a display; A program that executes.

8. storing a plurality of measurement samples of the sampled and quantized electrical signal in a memory as the measurements; determining a plurality of periods during which a predetermined trigger condition is considered to be satisfied in the plurality of measurement samples stored in the memory; For each of the plurality of periods, a time point at which the trigger condition is satisfied is estimated based on interpolation of the measurement samples included in the period, and the time point is acquired as the trigger point; aligning the estimated trigger point with the predetermined position for each of the plurality of periods, and displaying waveforms relating to the measurement samples before and after the trigger point on the display device; The program according to claim 7.

9. The program according to claim 7 , wherein the trigger point estimated for each of the plurality of periods is obtained by pipeline processing.

10. As the trigger condition, a plurality of periods during which the electrical signal is considered to rise across a predetermined trigger level are determined; For each of the plurality of periods, a time point at which the electrical signal rises across a predetermined trigger level, estimated based on the measurement values ​​included in the period, is acquired as the trigger point; For each of the plurality of periods, the estimated trigger point is aligned with the predetermined position, and waveforms relating to the measurement values ​​before and after the trigger point are displayed on the display. The program according to claim 7.

11. As the trigger condition, a plurality of periods during which the electrical signal is considered to have crossed a predetermined trigger level and fallen are determined; For each of the plurality of periods, a time point at which the electrical signal falls across a predetermined trigger level, estimated based on the measurement values ​​included in the period, is acquired as the trigger point; For each of the plurality of periods, the estimated trigger point is aligned with the predetermined position, and waveforms relating to the measurement values ​​before and after the trigger point are displayed on the display. The program according to claim 7.

Images