Material testing system with testing system sensor verification device

Abstract

To provide a testing system sensor verification device, a testing system, and a method for verifying load cells in the testing system.SOLUTION: A disclosed example testing system sensor verification device comprises: a shaft; a body; and a first force generator having a first predetermined force response, the force generator coupled to the shaft and the body such that actuation of the shaft in a first direction from a predetermined position causes the force generator to generate the first predetermined force response.SELECTED DRAWING: Figure 4

Description

[Technical Field]

[0001] [Related Applications] This application claims the benefit of U.S. Provisional Patent Application No. 63 / 655,929, filed June 4, 2024, entitled "MATERIAL TESTING SYSTEMS WITH TESTING SYSTEM SENSOR VERIFICATION DEVICE," the entire contents of which are expressly incorporated herein by reference.

[0002] FIELD OF THE DISCLOSURE The present disclosure relates generally to materials testing systems, and more particularly to materials testing systems with test system sensor validation devices. [Background technology]

[0003] Materials testing machines are used to test various material specimens for attributes (e.g., tensile strength / compressive strength). Sensors in the materials testing machine can obtain measurements during testing of the various material specimens, and the specimen attributes can be evaluated based on the sensor measurements.

[0004] By comparing such a system with the present disclosure set forth in the remainder of this application with reference to the drawings, the limitations and disadvantages of the conventional and traditional approaches will become apparent to one skilled in the art. Summary of the Invention

[0005] The present disclosure relates to a materials testing system with a test system sensor validation apparatus substantially as illustrated and / or described in connection with at least one of the drawings and more fully set forth in the claims.

[0006] These and other advantages, aspects, and novel features of the present disclosure, as well as details of illustrated examples of the present disclosure, will be more fully understood from the following description and drawings. [Brief explanation of the drawings]

[0007] [Figure 1] FIG. 1 illustrates an exemplary materials testing system according to aspects of the present disclosure.

[0008] [Figure 2] FIG. 2 is a block diagram of the materials testing system of FIG. 1 according to an embodiment of the present disclosure.

[0009] [Figure 3] 3 is a perspective view of an exemplary test system sensor validator that may be used to implement the test system sensor validator of FIG. 2.

[0010] [Figure 4] FIG. 1 is a diagram of an exemplary test system sensor validation device with a portion of the body removed.

[0011] [Figure 5] 1 is a cross-sectional view of an exemplary test system sensor validation device.

[0012] [Figure 6] 3 is a schematic diagram of another exemplary test system sensor validation device that can be used to implement the test system sensor validation device of FIG. 2 using a torsion spring as the bidirectional force generating device.

[0013] [Figure 7] FIG. 3 is a schematic diagram of another exemplary test system sensor validation device that can be used to implement the test system sensor validation device of FIG. 2 using a spring as a bidirectional force generating device coupled to a shaft via a lever.

[0014] [Figure 8] 3 is a schematic diagram of another exemplary test system sensor validator that may be used to implement the test system sensor validator of FIG. 2 using a hydraulic piston.

[0015] [Figure 9]3 is a schematic diagram of another exemplary test system sensor validation device that can be used to implement the test system sensor validation device of FIG. 2 using a pneumatic piston as a force-generating device.

[0016] [Figure 10] 3 is a schematic diagram of another exemplary test system sensor validation device that can be used to implement the test system sensor validation device of FIG. 2 using an electromagnetic coil as a force generating device.

[0017] [Figure 11] 1 is a flowchart illustrating an exemplary method for performing tester verification. DETAILED DESCRIPTION OF THE INVENTION

[0018] The figures are not necessarily to scale. Where appropriate, the same or similar reference numbers are used in the figures to refer to similar or identical components. For example, a reference number utilizing a letter (e.g., gripper 124a, gripper 124b) refers to the same reference number without the letter (e.g., gripper 124).

[0019] The present disclosure relates to a materials testing system that enables testing of one or more test sensors of a materials testing machine to determine whether the sensors are still operating properly. In some examples, testing may be performed manually, periodically, and / or automatically in response to some indication that a test sensor may be malfunctioning. In some examples, if test results indicate that one or more of the sensors are malfunctioning, further testing using the materials testing machine may be prohibited. This prohibition can ensure that tests performed using the materials testing machine are not rendered unreliable by a malfunctioning test sensor and remain reliable and usable.

[0020] Disclosed examples provide a test system sensor validation device that can be quickly and easily used to verify whether a materials testing machine (e.g., a materials testing machine's load cell) is suitable for performing force tests. For example, some disclosed test system sensor validation devices generate repeatable static and / or dynamic force responses in response to actuation (e.g., a displacement input to the test system sensor validation device). By monitoring the force response and comparing the force to a stored or other predetermined (predetermined) force, the suitability of the materials testing system for testing can be verified. Verification can be performed at regular or irregular intervals, and / or prior to and / or in response to specific events to ensure that the results of force tests performed using the materials testing system are accurate.

[0021] An exemplary test system sensor validation device is disclosed that includes a shaft, a body, and a force generator having a first predetermined force response, the first force generator coupled to the shaft and the body such that actuation of the shaft in a first direction from a predetermined position causes the force generator to generate the first predetermined force response.

[0022] Some exemplary sensor validation devices further include a first fixture interface coupled to the shaft and a second fixture interface coupled to the body. In some exemplary sensor validation devices, the force generator includes a first spring having a first predetermined force response, the first spring positioned between the actuator plate and a first location on the body such that actuation of the shaft in a first direction from a predetermined position compresses the first spring, and a second spring having a second predetermined spring constant, the second spring positioned between the actuator plate and a second location on the body such that actuation of the shaft in a second direction from the predetermined position compresses the second spring. In some such examples, the first predetermined spring constant is the same as the second predetermined spring constant. In some other examples, the first predetermined spring constant is different from the second predetermined spring constant. In some exemplary sensor validation devices, the shaft extends through the first spring and the second spring. In some exemplary sensor verification devices, the first spring is on the opposite side of the actuator plate from the second spring.

[0023] An exemplary disclosed testing system includes a frame, a first fixture and a second fixture configured to grip a specimen, an actuator configured to actuate at least one of the first fixture or the second fixture to apply a force to the specimen, a load cell configured to measure at least a portion of the force applied to the specimen by the actuator, and control circuitry, wherein the control circuitry is configured to: control the actuator to actuate at least one of the first fixture or the second fixture to apply a force to the specimen; perform load cell verification, the control circuitry controlling the actuator to actuate at least one of the first fixture or the second fixture while a load cell verification device is coupled to the first fixture and the second fixture; monitor an output of the load cell while controlling the actuator to determine a force measured by the load cell; and indicate that the testing system is in a suitable state to perform at least a first type of force test in response to determining that the force measured by the load cell is within a predetermined range of a predetermined force associated with the load cell verification device.

[0024] In some exemplary test systems, the control circuitry is configured to perform load cell verification by controlling the actuator to actuate at least one of the first fixture or the second fixture in a first direction while monitoring the output of the load cell, and controlling the actuator to actuate at least one of the first fixture or the second fixture in a second direction while monitoring the output of the load cell. In some exemplary test systems, the control circuitry is configured to monitor a tensile force measured by the load cell in the first direction and monitor a compressive force measured by the load cell in the second direction. In some exemplary test systems, the second fixture is configured to be stationary, and the actuator is configured to actuate the first fixture. In some exemplary test systems, the load cell is coupled to the first fixture or the second fixture.

[0025] In some exemplary testing systems, the load cell validation device includes a shaft, a body, and a force generator having a first predetermined force response, the first force generator coupled to the shaft and the body such that actuation of the shaft in a first direction from a predetermined position causes the force generator to generate the first predetermined force response. In some exemplary testing systems, the load cell validation device further includes a first fixture interface coupled to the shaft and a second fixture interface coupled to the body.

[0026] In some exemplary test systems, the shaft comprises an actuator plate and the force generator comprises a first spring having a first predetermined spring constant positioned between the actuator plate and a first location on the body such that actuation of the shaft in a first direction from the predetermined position compresses the first spring, and a second spring having a second predetermined spring constant positioned between the actuator plate and a second location on the body such that actuation of the shaft in a second direction from the predetermined position compresses the second spring.

[0027] In some exemplary test systems, the first fixture is configured to couple to the first fixture interface and the second fixture is configured to couple to the second fixture interface. In some exemplary test systems, the first predetermined spring constant is different from the second predetermined spring constant. In some exemplary test systems, the shaft extends through the first spring and the second spring. In some exemplary test systems, the first spring is on an opposite side of the actuator plate from the second spring.

[0028] A disclosed exemplary method of validating a load cell in a test system involves coupling a first fixture interface of a load cell validation device to a first fixture of the test system, coupling a second fixture interface of the load cell validation device to a second fixture of the test system, controlling, via processing circuitry, an actuator of the test system to actuate at least one of the first fixture or the second fixture, monitoring, via processing circuitry, an output of a load cell of the test system to determine a force measured by the load cell during or after controlling the actuator, and determining, in response to determining that the force measured by the load cell is within a predetermined range of a predetermined force associated with the load cell validation device, that the test system is in a suitable state to perform at least a first type of force test.

[0029] 1 illustrates an exemplary materials testing system 100. As shown, the materials testing system 100 includes a materials testing machine 102 (also known as a general-purpose testing machine) and a computing system 200 connected to the materials testing machine 102 through a cable 106. While the connection is illustrated as being physically connected, in some instances the connection may be wireless rather than wired.

[0030] 1, the materials testing machine 102 includes a frame 112. In some examples, the frame 112 provides rigid structural support to other components of the materials testing machine 102. As shown, the frame 112 includes a top (upper) plate 114 and a bottom base 116 connected by two support posts 118. In some examples, the support posts 118 of the frame 112 may house guide rails and / or a drive shaft 212 of the materials testing machine 102 (see, for example, FIG. 2).

[0031] 1, a movable crosshead 120 extends between the columns 118. In some examples, the movable crosshead 120 may be connected to guide rails and / or drive shafts 212 housed in the columns 118 and / or may be configured to move toward and / or away from the base 116 through actuation (e.g., motorized) of the drive shaft(s) 212. Although one movable crosshead 120 is shown in the example of FIG. 1, in some examples, the materials testing machine 102 may have multiple movable crossheads 120 and / or other moving members.

[0032] 1, fixtures 122 are attached to the bottom base 116 of the frame 112 and to the movable crosshead 120. As shown, the lower fixture 122a includes a gripper 124a, and the upper fixture 122b includes both a test sensor 126 and a gripper 124b. While one test sensor 126 and two grippers 124 are shown in the example of FIG. 1, in some examples, the test machine 102 may include more or fewer test sensors 126 and / or grippers 124.

[0033] In the example of FIG. 1 , grippers 124 hold test specimen 128. Test specimen 128 is shown as a rope (e.g., made of steel), but in some examples may be some other type of material and / or component. While grippers 124a and / or 124b are illustrated as rope holders, in some examples they may alternatively or additionally be configured as bolt holders, wedge-type grippers, side-acting grippers, manual grippers, roller grippers, capstan grippers, and / or syringe holders. In some examples, one or both of grippers 124 may be replaced by a compression platen configured to compress test specimen 128.

[0034] 1, the test sensor 126 is coupled to the gripper 124 so as to measure the force acting on the gripper 124 (and / or the specimen 128, the crosshead 120, etc.). In some examples, the test sensor 126 may be a load cell and / or a transducer. In some examples, the test sensor 126 may be some other type of sensor.

[0035] In some examples, the materials testing machine 102 may be configured for static mechanical testing. For example, the materials testing machine 102 may be configured for compressive strength testing, tensile strength testing, shear strength testing, flexural strength testing, flexural strength testing, tear strength testing, peel strength testing (e.g., adhesive bond strength), torsional strength testing, and / or any other compressive and / or tensile testing. Additionally or alternatively, the materials testing machine 102 may be configured to perform dynamic testing.

[0036] In some examples, the materials testing machine 102 is configured to interface with a computing system 200 to perform a test method. For example, the computing system 200 may communicate with a controller 214 (see, e.g., FIG. 2 ) of the materials testing machine 102 to perform the test method. In some examples, an operator (or other user) may first use the computing system 200 to set up the test method, then use the computing system 200 to execute the test method, and finally use the computing system 200 to analyze the results of the test method.

[0037] 2 is a block diagram illustrating details of the computing system 200 and additional details of the materials testing machine 102. In the example of FIG. 2, the exemplary materials testing machine 102 includes one or more actuators 210 connected to one or more drive shafts 212. In some examples, the actuators 210 may be used to provide force to and / or induce movement of the drive shafts 212. In some examples, the actuators 210 may include electric motors, pneumatic actuators, hydraulic actuators, piezoelectric actuators, relays, and / or switches.

[0038] The drive shaft 212 is further shown connected to the movable crosshead 120 such that movement of the drive shaft(s) 212 via the actuator(s) 210 results in movement of the movable crosshead 120. Although the term drive shaft 212 is used in the example of Figure 2, in some examples the drive shaft 212 may be some other mechanical means for moving the movable crosshead 120 despite guidance from the actuator(s) 210.

[0039] The exemplary materials testing machine 102 further includes a controller 214 in electrical communication with the actuator(s) 210. In some examples, the controller 214 may include processing circuitry and / or memory circuitry. In some examples, the controller 214 may be configured to control the materials testing machine 102 based on one or more commands, control inputs, and / or test parameters. In some examples, the controller 214 may be configured to convert commands, control inputs, and / or test parameters (e.g., received from the computing system 200) into appropriate (e.g., electrical) signals that can be delivered to the actuator(s) 210, thereby controlling the operation of the materials testing machine 102 (e.g., via the actuator(s) 210). For example, the controller 214 may provide one or more signals instructing the actuator(s) 210 to provide more or less power, thereby increasing or decreasing the applied force.

[0040] 2 , controller 214 is also in electrical communication with fixture 122 (e.g., gripper 124 and test sensor 126). In some examples, controller 214 may be configured to convert commands, control inputs, and / or test parameters (e.g., received from computing system 200) into appropriate (e.g., electrical) signals that can be delivered to gripper 124 to thereby control the operation of gripper 124 (e.g., gripping or releasing). In some examples, controller 214 may be configured to convert commands, control inputs, and / or parameters (e.g., received from computing system 200) into appropriate (e.g., electrical) signals that can be delivered to sensor(s) 126 to thereby control the operation of sensor(s) 126. In some examples, controller 214 may be configured to convert measurement data received from sensor(s) 126 and / or transmit the measurement data to computing system 200.

[0041] The example controller 214 is also in electrical communication with a control panel 216 of the materials testing machine 102. In some examples, the control panel 216 may include one or more input devices (e.g., buttons, switches, slides, knobs, microphones, dials, and / or other electromechanical input devices). In some examples, the control panel 216 may be used by an operator to directly control the materials testing machine 102. In some examples, the controller 214 may be configured to convert commands, control inputs, and / or test parameters received via the control panel 216 into appropriate (e.g., electrical) signals that can be delivered to the actuator(s) 210 and / or gripper(s) 124 to control the materials testing machine 102.

[0042] The controller 214 is also shown in electronic communication with a network interface 218b of the materials testing machine 102. In some examples, the network interface 218b includes hardware, firmware, and / or software for connecting the materials testing machine 102 to a complementary network interface 218a of the computing system 200. In some examples, the controller 214 may receive information (e.g., commands) from the computing system 200 through the network interface 218 and / or send information (e.g., measurement data from the sensor(s) 126) to the computing system 200 through the network interface 218.

[0043] 2, computing system 200 includes a computing device 202 and a user interface (UI) 204 interconnected with each other. As shown, UI 204 may include one or more input devices 206 configured to receive input from a user and one or more output devices 208 configured to provide output to the user.

[0044] In some examples, the one or more input devices 206 may include one or more touchscreens, mice, keyboards, buttons, switches, slides, knobs, microphones, dials, and / or other input devices 206. In some examples, the one or more output devices 208 may include one or more displays / touchscreens, speakers, lights, tactile devices, and / or other output devices 208. In some examples, the output device(s) 208 (e.g., display screen) of the UI 204 may output one or more representations of a materials testing workflow configured to guide a user in the setup, execution, and / or analysis of a test method performed by the materials testing machine 102. In some examples, the output device(s) 208 (e.g., display screen) of the UI 204 may output one or more representations of a test method creation process configured to assist a user in easily and / or quickly generating test methods and / or materials testing workflows.

[0045] In the example of Figure 2, the exemplary computing device 202 includes a network interface 218a. As shown, one network interface 218a communicates with a network interface 218b of the materials testing machine 102 through a cable 106. As shown, the computing system 200 also includes a network interface 218a that communicates with a network 220 (e.g., the Internet). In the example of Figure 2, the computing device 202 communicates with a remote interface 230 through the network 220 and the network interface 218a. As shown, the network interface 218a is electrically connected to the common electrical bus 220 of the computing device 202.

[0046] The computing device 202 further includes processing circuitry 224 connected to the common electrical bus 220. In some examples, the processing circuitry 224 may include one or more processors. In some examples, the processing circuitry 224 is configured to process information received from the UI 204, the data import device(s) 108, and / or the materials testing machine 102. In some examples, the processing circuitry 224 is configured to send commands and / or test parameters to the materials testing machine 102 (e.g., via the network interface(s) 218a). In some examples, the processing circuitry 224 is configured to output information to an operator through the UI 204. In some examples, the processing circuitry 224 is configured to execute machine-readable instructions stored in the memory circuitry 226.

[0047] The exemplary computing device 202 further includes memory circuitry 226 coupled to the common electrical bus 220. As shown, the memory circuitry 226 includes a number of parameters 232 (and / or parameter values) and / or one or more data repositories 234.

[0048] In some examples, data repository 234 may include several different data structures (e.g., databases, lookup tables, etc.). Data repository 234 may store both historical data (e.g., previous workflows, test methods, parameters 232, test results, reports, prompts 602, user inputs, etc.) and current data (e.g., mappings between user inputs and parameters 232). In some examples, historical data may be associated with timestamps and / or other data (e.g., similar timestamps). In the example of FIG. 2, repository 234 is shown as part of memory circuitry 226 of computing device 202, but in some examples, repository 234 may be separate from computing device 202 and / or in communication with computing device 202 (e.g., via network interface 218a).

[0049] In some examples, the processing circuitry 224 is configured to execute machine-readable instructions of a materials testing workflow to guide a user in the setup, execution, and / or analysis of a test method on the materials testing machine 102. In some examples, the setup (and / or creation) of a test method may include setting values ​​for several (e.g., test, sample, analysis, etc.) parameters 232 that define the test method and / or analysis of the test results. In some examples, the UI 204 is configured to display (and / or otherwise output) one or more workflow screens that display the parameters 232 and / or allow a user to manually set the parameters 232 during execution of a materials testing workflow.

[0050] In some examples, during a sensor testing process, one or more sensor test methods are set up and / or executed to test the test sensor(s) 126 of the materials testing machine 102. In some examples, the test method(s) may be executed manually (e.g., via a materials testing workflow). In some examples, the test method(s) may be executed automatically, for example, in response to the expiration of a particular time limit and / or an indication that one or more of the sensors 126 is malfunctioning. In some examples, if the test results of the sensor test method(s) indicate that one or more of the sensors 126 is malfunctioning, the execution of further test methods (e.g., testing the analyte 128) may be inhibited. In some examples, this inhibition may continue until the test results of the sensor test method(s) indicate that all of the test sensors 126 are functioning properly.

[0051] To help detect malfunction of the sensor(s) 126 measuring the load on the fixture 122, a test system sensor verifier 250 may be attached to the load string (e.g., via the gripper 124 or other fixture 122). The actuator 210 is controlled to actuate the test system sensor verifier 250 via the gripper 124 or other fixture 122, and the controller 214 and / or processing circuitry 224 monitors the force(s) measured by the sensor(s) 126.

[0052] In some examples, test system sensor verifier 250 is constructed, tuned, and / or calibrated to have an accurate and repeatable response to the force applied by actuator(s) 210. For example, test system sensor verifier 250 may include one or more springs having a predetermined spring constant. The predetermined spring constant or other force response value(s) 236 may be stored in memory circuitry 226 of computing device 202. In some other examples, test system sensor verifier 250 may include opposing or attracting magnets having predetermined characteristics (e.g., material, size, shape, etc.), electromagnets configured to generate a predetermined magnetic field and corresponding force, hydraulic pistons, pneumatic pistons, and / or any other type of static and / or dynamic force generating and / or force absorbing unit(s).

[0053] Once the test system sensor validation device 250 is attached, the example computing device 202 controls the actuator(s) 210 to apply a force to the test system sensor validation device 250 via the fixture 122. For example, the actuator(s) 210 may be controlled to actuate the crosshead(s) 120 through a predetermined displacement or at a predetermined displacement rate. For example, in the case of a static force-generating device such as one or more springs, the actuator 210 may be controlled to move the crosshead 120 a predetermined distance, thereby compressing one of the springs. The relationship with displacement may be substantially linear for a spring or other force-generating device with low friction, or nonlinear for a spring or other force-generating device that experiences a frictional force in response to displacement. In some such examples, the difference or change in force may be linearly related to displacement. In another example of a dynamic force generating device, such as a pneumatic piston, the actuator 210 can be controlled to move the crosshead 120 at a predetermined displacement rate to generate a displacement resistance force based on the properties of the fluid and the geometry of the pneumatic piston.

[0054] While the actuator(s) 210 apply a force to the test system sensor validation device 250, the sensor(s) 126 (e.g., load cell(s) coupled to the crosshead 120 and / or moving and / or stationary fixtures) measure the force and output a corresponding signal to the processing circuitry 224 (e.g., via the communications interfaces 218a, 218b). The processing circuitry 224 compares the measured force to a predetermined force (or a force calculated based on the stored force response value(s) 236) to confirm that the sensor 126 is in a suitable state to perform one or more types of force tests. For example, the processing circuitry 224 can determine that the sensor 126 is suitable (e.g., sufficiently accurate) when the measured force is within a predetermined threshold difference or range of the stored force response value(s) 236. Processing circuitry 224 can determine the measured force for one or more displacement values ​​or positions of crosshead 120 and / or can determine the measured force for one or more types of force tests by actuating crosshead 120 in different directions from a neutral position (e.g., tension in a first direction and compression in a second direction). For each different directional displacement value, processing circuitry 224 compares the measured force to a corresponding force response 136 stored in memory circuitry 226.

[0055] Figure 3 is a perspective view of an example test system sensor validation device 300 that may be used to implement the test system sensor validation device 250 of Figure 2. Figure 4 is a view of the example test system sensor validation device 300 with a portion of the body removed. Figure 5 is a cross-sectional view of the example test system sensor validation device 300.

[0056] Test system sensor validation device 300 includes a shaft 302 having an actuator plate 304, a first spring 306 and a second spring 308, a body 310, and a first fixture interface 312 and a second fixture interface 314. Test system sensor validation device 300 is selectively coupled to fixture 122 of test machine 102 to provide a predetermined test force that verifies that test machine 102 (e.g., sensor 126) is suitable for performing a force test.

[0057] In the illustrated example, first fastener interface 312 is coupled to shaft 302 and second fastener interface 314 is coupled to body 310. The exemplary body 310 includes an interior portion 312, which may include a single segment or multiple segments 316a, 316b, as shown in Figures 3-5. First fastener interface 312 actuates shaft 302 and actuator plate 304 relative to second fastener interface 314 and body 310.

[0058] The first spring 306 is positioned between the actuator plate 304 and a first location on the body 310 (e.g., a first end of the first body segment 316a). Conversely, the second spring 308 is positioned between the actuator plate 304 and a second location on the body 310 (e.g., a second end of the first body segment 316a). In some examples, the body 310 may include one or more stop surfaces 318a, 318b against which the springs 306, 308 abut. As shown in FIGS. 4 and 5, the springs 306, 308 are positioned on opposite sides of the actuator plate 304. The actuator plate 304 includes engagement surfaces that engage the springs 306, 308.

[0059] The exemplary first fastener interface 312 is configured to be engaged by a first type of gripper 124 or a first type of fastener, and the second fastener interface 314 is configured to be engaged by a second type of fastener. The first fastener interface 312 is a cylindrical fastener interface that can be engaged by a gripper having a V-shaped engagement surface. The second fastener interface 314 is configured to be engaged by a retention plate, which may not apply a lateral gripping force to the second fastener interface 314 but limits movement of the second fastener interface 314 along the direction of movement of the crosshead(s) 120 (e.g., parallel to the axis of the shaft 302).

[0060] In some examples, first fastener interface 312 and second fastener interface 314 are removable and interchangeable with different types of fastener interfaces. For example, first fastener interface 312 may be threaded onto shaft 302, fixedly attached to shaft 302 using one or more fasteners (e.g., bolts, clips, set screws, etc.), and / or otherwise removably attached to shaft 302. Similarly, second fastener interface 314 may be threaded onto body 306, fixedly attached to body 306 using one or more fasteners (e.g., bolts, clips, set screws, etc.), and / or otherwise removably attached to body 306. For example, different fixture interfaces can include flat surfaces for interfacing with side-action grippers, wedge-action grippers, roller tension grippers, cord / yarn / rope / wire testing grippers, webbing grippers, fastener tension grippers, axial and / or torsional grippers, capstan grippers, O-ring grippers, loop grippers, and / or any other type of dynamic and / or static grippers for tension, compression, torsion, or any other type of force testing. Fixture interfaces can be configured for use with static, manual, electronic, pneumatic, and / or hydraulic fixtures.

[0061] Once first fixture interface 312 and second fixture interface 314 are secured to fixtures 122 of test system 100, processing circuitry 224 performs load cell validation, which includes controlling actuator(s) 210 to actuate first fixture 122 coupled to first fixture interface 312 and / or second fixture 122 coupled to second fixture interface 314 in a first direction while monitoring the output of the load cell. Actuating crosshead 120 in the first direction (e.g., compression) moves first fixture interface 312 toward second fixture interface 312. Displacement of first fixture interface 312 causes shaft 302 and actuator plate 304 to compress second spring 308 against body 310. During and / or after displacement by the actuator(s) 210, the sensor(s) 126 (e.g., one or more load cells coupled to the first fixture interface 312 and / or the second fixture interface 314) monitor the force and output a signal representative of the monitored force to the processing circuitry 224. The processing circuitry 224 can control the actuator(s) 210 to move the crosshead a first displacement, then pause, and then move the crosshead again the same or a different displacement to perform a second measurement. Each displacement is associated with a corresponding force response 236, which is compared to the force measured by the processing circuitry 224 to determine whether the sensor 126 is suitable for force testing.

[0062] After measuring the force at one or more positions in the first direction (e.g., compressing the second spring 308), the processing circuitry 224 can further control the actuator(s) 210 to actuate the first fixture and / or the second fixture 122 in a second direction while monitoring the output of the load cell. For example, the processing circuitry 224 can control the actuator(s) 210 to return to a neutral or start position and actuate the crosshead 120 in a second direction (e.g., tension), thereby moving the first fixture interface 312 away from the second fixture interface 312. The displacement of the first fixture interface 312 causes the shaft 302 and actuator plate 304 to compress the first spring 308 against the body 310.

[0063] In some examples, in response to determining that one or more forces measured by the sensors 126 (e.g., load cells) are within a predetermined range of one or more corresponding predetermined force(s) associated with the load cell validator, the processing circuitry 224 indicates (e.g., via the UI 204) that the test system 108 is in a suitable condition to perform one or more types of force tests. For example, if the forces measured by the load cells are within threshold ranges of corresponding stored values ​​of the force response 236 for displacements corresponding to tension and compression, the processing circuitry 224 may output an indication, such as text or a graphic, via the UI 204 that the test system has been verified to be suitable for tension and compression testing. Conversely, if the forces measured by the load cells are outside the threshold ranges for one or more of the displacement values, the processing circuitry 224 outputs an indication that the test system 108 is not in a suitable condition to perform one or more types of force tests.

[0064] In some examples, processing circuitry 224 can authorize or disauthorize tester 102 to perform certain types of tests based on a comparison of the measured force and force response 236. For example, an authorized system may be enabled to certify test results for tests where such certification is required or to generate reports related to the test results for traceability purposes. Conversely, a disauthorized system may be enabled to perform tests (e.g., for diagnostic or other purposes) but may not be enabled to certify test results or generate usability reports.

[0065] Additionally or alternatively, the processing circuitry 224 can enable or disable the testing machine 102 from running certain types of tests based on a comparison of the measured force and the force response 236. For example, an enabled system may be enabled to run tests that have been validated using the test system sensor validator 250, and the control panel 216 and / or UI 204 include and / or enable inputs that allow an operator (or automated process) to run tests using the enabled system. Conversely, the processing circuitry 224 can disable the testing machine 102 from running some or all types of tests, such as by disabling (e.g., locking, powering down) the actuator(s) 210 and / or other elements of the materials testing machine 102 necessary to run the disabled tests. Additionally or alternatively, the control panel 216 and / or UI 204 can cancel and / or disable inputs that allow an operator to control the machine 102 to run tests.

[0066] Although an exemplary test system sensor validation device 300 is shown in Figures 3-5, other types of force generating devices may be used to implement the test system sensor validation device 250. Figures 6, 7, 8, and 9 show other exemplary implementations of the test system sensor validation device 250.

[0067] Figure 6 is a schematic diagram of another example test system sensor validation device 600 that may be used to implement the test system sensor validation device 250 of Figure 2 using a torsion spring as a bidirectional force generating device. The example test system sensor validation device 600 includes the shaft 302, first fixture interface 312, and second fixture interface 314 described above with reference to Figures 3-5, which may be modified as disclosed above.

[0068] 3-5 , the exemplary test system sensor validation device 600 includes a torsion spring 602 as a force-generating device. The torsion spring 602 is coupled to a body 604, which is coupled to a second fixture interface 314, such that the torsion spring 602, body 604, and second fixture interface 314 are stationary relative to one another.

[0069] 6 is coupled to a torsion spring 602 via a linkage 606. The example linkage 606 may couple to the torsion spring 602 at the center of the spring 602, at the ends of the spring 602, and / or between multiple springs 602 coupled to the body 604. In the example shown, the torsion spring 602 is in a neutral state or position. As the shaft 302 is displaced in either direction via the actuator 210 during the verification process, the torsion spring 602 is torqued in the corresponding direction by the shaft 302 and linkage 606, causing the torsion spring 602 to generate a force response that is measured by the load cell sensor(s) 126 coupled to the first fixture interface 312 and / or the second fixture interface 314.

[0070] Figure 7 is a schematic diagram of another example test system sensor validation device 700 that may be used to implement test system sensor validation device 250 of Figure 2 using a spring as a bidirectional force generating device coupled to a shaft via a lever. The example test system sensor validation device 700 includes shaft 302, first fixture interface 312, and second fixture interface 314 described above with reference to Figures 3-5, which may be modified as disclosed above.

[0071] 3-5, the exemplary test system sensor validation device 700 includes a single bidirectional spring 702 as a force-generating device. The spring 702 is coupled to a body 704, which is coupled to the second fixture interface 314, such that the spring 702, body 704, and second fixture interface 314 are stationary relative to one another.

[0072] 7 is coupled to a spring 702 via a linkage that includes a lever 706 and a rotational linkage 708 that couples the lever 706 to the shaft 302. The lever 706 is further coupled to the spring 702 opposite a fulcrum 710 that rotationally couples the lever 706 to the body 704. Linear movement of the shaft 302 rotates the lever 706, exerting an opposing force on the spring 702.

[0073] The example spring 702 may be in a neutral position or may be preloaded prior to performing the verification method. When the shaft 302 is displaced in either direction via the actuator 210 during the verification process, the shaft 302 and lever 706 apply a tension and / or compression force to the spring 702, causing the spring 702 to generate a force response that is measured by the load cell sensor(s) 126 coupled to the first fixture interface 312 and / or the second fixture interface 314.

[0074] Although the exemplary test system sensor validation device 700 uses a lever to connect the shaft 302 and the spring 702, in other examples, a single one-way or two-way spring may be connected or coupled to the shaft using other types of linkages.

[0075] Figure 8 is a schematic diagram of another example test system sensor validation device 800 that may be used to implement the test system sensor validation device 250 of Figure 2 using a hydraulic piston 802. The example test system sensor validation device 800 includes the shaft 302, first fixture interface 312, and second fixture interface 314 described above with reference to Figures 3-5, which may be modified as disclosed above.

[0076] The exemplary test system sensor validation device 800 includes a hydraulic piston 802 as a dynamic force generating device. The piston 802 is coupled to the shaft 302 within a body 804, which is coupled to the second fixture interface 314. The body 804 is at least partially filled with a hydraulic fluid 806. The body 804 further includes a fluid channel 808 connecting the body 804 at locations on either side of the piston 802. When the piston 802 is actuated by the shaft 302, the fluid 806 is pushed through the fluid channel 808 by the piston 802 according to the speed at which the piston 802 moves.

[0077] In addition to, or as an alternative to, fluid channel 808, piston 802 and / or body 804 may be sized to allow fluid 806 to flow around piston 802, through piston 802, and / or through other paths transverse to the plane of piston 802.

[0078] 8, fluid channel 808 may be provided with a flow restrictor 810 to increase the force required by piston 802 to push fluid 806 through fluid channel 808. The example stored force response 236 of FIG. 2 may be determined based on the dimensions of piston 802 and body 804, the properties of hydraulic fluid 806, the dimensions of fluid channel 808, and / or the properties of flow restrictor 810.

[0079] As the shaft 302 is displaced in either direction via the actuator 210 during the validation process, the shaft 302 and piston 802 push fluid 806 through the fluid channel 808, resulting in a dynamic force response that is measured by the load cell sensor(s) 126 coupled to the first fixture interface 312 and / or the second fixture interface 314. The example processing circuitry 224 can compare the dynamic measured force (e.g., rate of force increase and / or decay, peak measured force, average measured force, etc.) to the calculated dynamic force response.

[0080] Although the examples disclosed above are described as hydraulic pistons, in other examples, compressible fluids may be used to measure the dynamic measured force.

[0081] Figure 9 is a schematic diagram of another example test system sensor validation device 900 that may be used to implement the test system sensor validation device 250 of Figure 2 using a pneumatic piston 902 as the force-generating device. The example test system sensor validation device 900 includes the shaft 302, first fixture interface 312, and second fixture interface 314 described above with reference to Figures 3-5, which may be modified as disclosed above.

[0082] The exemplary test system sensor validation device 900 includes a pneumatic piston 902 as a dynamic force generating device. The piston 902 is coupled to the shaft 302 within a body 904, which is coupled to the second fixture interface 314. The body 904 is at least partially filled with a compressible fluid 906, such as a predetermined gas having a predetermined density and pressure. In some examples, the piston 902 is filled with a gas of the same or different properties on both sides of the piston 902, but is not allowed to travel across the plane of the piston 902. When the piston 902 is actuated by the shaft 302, the fluid 906 in the direction of movement of the piston 902 is compressed within the body 904, causing a static force response that can be measured by a load cell(s) coupled to the first fixture interface 312 and / or the second fixture interface 314.

[0083] When the shaft 302 is displaced in either direction via the actuator 210 during the verification process, the shaft 302 and piston 902 compress the fluid 906a, 906b in one of the subvolumes of the body 904, resulting in a force response that is measured by the load cell sensor(s) 126 coupled to the first fixture interface 312 and / or the second fixture interface 314.

[0084] Figure 10 is a schematic diagram of another example test system sensor validation device 1000 that may be used to implement the test system sensor validation device 250 of Figure 2 using an electromagnetic coil 1002 as a force generating device. The example test system sensor validation device 1000 includes the shaft 302, first fixture interface 312, and second fixture interface 314 described above with reference to Figures 3-5, which may be modified as disclosed above.

[0085] The exemplary test system sensor validation device 1000 includes an electromagnetic coil 1002 as a force-generating device. A ferromagnetic target 1004 is coupled to the shaft 302 and can be actuated to different positions along the length of the electromagnetic coil 1002. The electromagnetic coil 1002 can be powered (e.g., via a power source that may be provided by the computing system 200 and / or the test machine 102, or via connecting the electromagnetic coil 1002 to a separate power source such as a wall outlet or a battery). The current and polarity of the power supplied to the electromagnetic coil 1002 and the position of the target 1004 along the electromagnetic coil 1002 result in the application of a magnetic force to the target 1004.

[0086] The target 1004 can be actuated to different positions via the shaft 302 while a current is applied to the coil to generate an electromagnetic force on the target 1004. The force can be measured by a load cell(s) coupled to the first fixture interface 312 and / or the second fixture interface 314, and is a static force response that corresponds to current and polarity parameters and can be compared to a predetermined force based on the displacement of the target 1004.

[0087] 11 is a flowchart illustrating an example method 1100 for performing tester validation. The example method 1100 may be performed to validate that the test system 100 of FIGS. 1 and / or 2 is suitable for performing one or more types of force tests.

[0088] In block 1102, a first fixture interface (e.g., first fixture interface 312) of a load cell verification device (e.g., load cell verification device 300, 600-1000) is coupled to a first fixture (e.g., fixture 122) of a test system (e.g., testing machine 102 of FIGS. 1 and / or 2). In block 1104, a second fixture interface (e.g., second fixture interface 314) of the load cell verification device (e.g., load cell verification device 300, 600-1000) is coupled to a second fixture (e.g., fixture 122) of the test system (e.g., testing machine 102 of FIGS. 1 and / or 2). In some examples, the first fixture interface 312 and / or the second fixture interface 314 are selected to fit the fixture 122 and installed on the load cell verification device, or the fixture 122 is selected to fit the first fixture interface 312 and / or the second fixture interface 314 and installed.

[0089] In block 1106, processing circuitry 224 controls actuator(s) of the test system (e.g., actuator(s) 210) to actuate at least one of the first fixture or the second fixture. For example, processing circuitry 224 may control actuator 210 to move crosshead 120 a predetermined displacement corresponding to the stored displacement value of force response 236.

[0090] In block 1108, while controlling the actuator 210 (e.g., to measure dynamic force) or after controlling the actuator 210 (e.g., to measure static force), the processing circuitry 224 monitors the output of the load cell (e.g., sensor 126) of the testing machine 102 to determine the force measured by the load cell. For example, depending on the type of load cell verification device 300, 600-1000, the processing circuitry 224 may monitor the dynamic force and / or the static force for comparison to the stored force response 236.

[0091] In block 1110, processing circuitry 224 determines whether the measured force is within a predetermined range of a predetermined force associated with the load cell validation device 300, 600-1000. For example, processing circuitry 224 may look up or calculate an expected force response based on force measurements obtained by the load cell(s) at a selected displacement value and / or a selected displacement rate. The expected force response may be based on a precise calibrated response expected for the load cell validation device 300, 600-1000 to ensure repeatability of the validation process.

[0092] If the measured force is within a predetermined range of the predetermined force (block 1110), then in block 1112 the processing circuitry 224 determines that the tester 102 is in a suitable state to perform at least a first type of force test (e.g., a type of test corresponding to the verification test that was performed).

[0093] If the measured force is not within a predetermined range of the predetermined force (block 1110), then in block 1114, processing circuitry 224 determines that the tester 102 is not in a suitable condition to perform a force test. In some examples, after determining that the measured force is not within the predetermined range (block 1110), blocks 1102-1110 can be performed using the secondary verification device 300, 600-1000 before determining that the tester is not in a suitable condition. If the measured force is not within the predetermined range for both the primary verification device and the secondary verification device 300, 600-1000, processing circuitry 224 can determine that the tester 102 is not in a suitable condition to perform a force test. For example, the test sensor 126 may require calibration, repair, or replacement. Conversely, if the measured force is not within the predetermined range for the primary verification device 300, 600-1000, but the measured force is within the predetermined range for the second verification device 300, 600-1000, the processing circuitry 224 can determine that the test machine 102 is in a suitable condition to perform a force test and that the primary verification device 300, 600-1000 may require repair or replacement.

[0094] In some examples, processing circuitry 224 may output an indication of the measured forces and / or the determination via UI 204.

[0095] After determining whether the tester 102 is in a suitable condition to perform a force test (blocks 1112, 1114), the exemplary processing circuitry 224 can control the tester 102 to perform a force test on one or more subjects and / or can require replacement and re-verification of the sensor 126 before performing a force test.

[0096] The methods and / or systems can be implemented in hardware, software, and / or a combination of hardware and software. The methods and / or systems can be implemented centrally in at least one computing system, or in a distributed manner where different elements are distributed across several interconnected computing or cloud systems. Any kind of computing system or other device adapted to perform the methods described herein is suitable. A typical combination of hardware and software can be a general-purpose computing system with programs or other code that, when loaded and executed, controls the computing system to perform the methods described herein. Another typical embodiment can include an application-specific integrated circuit or chip. Some embodiments can include a non-transitory machine-readable (e.g., computer-readable) medium (e.g., a flash drive, optical disk, magnetic storage disk, etc.) that stores one or more lines of machine-executable code to cause the machine to perform a process as described herein.

[0097] While the present method and / or system has been described with reference to certain specific embodiments, those skilled in the art will recognize that various modifications can be made and equivalents can be substituted without departing from the scope of the present method and / or system. In addition, many modifications can be made to adapt a particular situation or material to the teachings of the disclosure without departing from the scope of the disclosure. Therefore, the present method and / or system is not limited to the particular embodiments disclosed, but it is intended that the present method and / or system include all embodiments falling within the scope of the appended claims.

[0098] As used herein, "and / or" means any one or more of the items in the list connected by "and / or." As an example, "x and / or y" means any element of the three-element set {(x), (y), (x,y)}. In other words, "x and / or y" means "one or both of x and y." As another example, "x, y and / or z" means any element of the seven-element set {(x), (y), (z), (x,y), (x,z), (y,z), (x,y,z)}. In other words, "x, y and / or z" means "one or more of x, y and z."

[0099] As used herein, the term "for example" emphasizes a list of one or more non-limiting examples, instances, or illustrations.

[0100] As used herein, the terms "coupled," "coupled to," and "coupled with" refer to a structural and / or electrical connection, whether attached, attached, connected, joined, fastened, coupled, and / or otherwise secured. As used herein, the term "attach" means attached, attached, connected, joined, fastened, coupled, and / or otherwise secured. As used herein, the term "connect" means attached, attached, connected, joined, fastened, coupled, and / or otherwise secured.

[0101] As used herein, the terms "circuitry" and "circuitry" refer to physical electronic components (i.e., hardware) and any software and / or firmware ("code") that can comprise, be executed by, and / or be otherwise associated with hardware. As used herein, for example, a particular processor and memory can comprise a first "circuit" when executing a first one or more lines of code, and can comprise a second "circuit" when executing a second one or more lines of code. As used herein, whenever circuitry includes the hardware and / or code (if either is necessary) necessary to perform a function, the circuitry is "operable" and / or "configured" to perform that function, regardless of whether performance of that function is disabled or enabled (e.g., by a user-configurable setting, factory trim, etc.).

[0102] As used herein, control circuitry can include digital and / or analog circuitry, discrete and / or integrated circuitry, microprocessors, DSPs, etc., software, hardware, and / or firmware located on one or more boards that form part or all of a controller and / or are used to control the welding process and / or devices such as a power supply or wire feeder.

[0103] As used herein, the term "processor" refers to processing devices, apparatus, programs, circuits, components, systems, and subsystems, whether implemented in hardware, tangibly embodied software, or both, and whether programmable or not. As used herein, the term "processor" includes, but is not limited to, one or more computing devices, hardwired circuits, signal modifying devices and systems, system control devices and machines, central processing units, programmable devices and systems, field programmable gate arrays, application specific integrated circuits, systems-on-chips, systems comprising discrete elements and / or circuits, state machines, virtual machines, data processors, processing facilities, and any combination of the above. A processor may be, for example, any type of general-purpose microprocessor or microcontroller, a digital signal processing (DSP) processor, an application specific integrated circuit (ASIC), a graphics processing unit (GPU), a reduced instruction set computer (RISC) processor with an advanced RISC machine (ARM) core, etc. A processor may be coupled to and / or integrated into a memory device.

[0104] As used herein, the terms "memory" and / or "memory device" refer to computer hardware or circuitry that stores information for use by a processor and / or other digital device. The memory and / or memory device can be any suitable type of computer memory or any other type of electronic storage medium, such as read-only memory (ROM), random access memory (RAM), cache memory, compact disc read-only memory (CDROM), electro-optical memory, magneto-optical memory, programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), computer-readable medium, etc. Memory may include, for example, non-transitory memory, non-transitory processor-readable medium, non-transitory computer-readable medium, non-volatile memory, dynamic RAM (DRAM), volatile memory, ferroelectric RAM (FRAM®), first-in-first-out (FIFO) memory, last-in-first-out (LIFO) memory, stacked memory, non-volatile RAM (NVRAM), static RAM (SRAM), cache, buffer, semiconductor memory, magnetic memory, optical memory, flash memory, flash card, CompactFlash® card, memory card, secure digital memory card, micro card, mini card, expansion card, smart card, memory stick, multimedia card, picture card, flash storage, subscriber identity module (SIM) card, hard drive (HDD), solid state drive (SSD), etc. Memory may be configured to store code, instructions, applications, software, firmware, and / or data and may be external, internal, or both to the processor.

Claims

1. 1. A test system sensor validation device comprising: A shaft and The main body and a force generator having a first predetermined force response, the first force generator coupled to the shaft and the body such that actuation of the shaft in a first direction from a predetermined position causes the force generator to generate the first predetermined force response; A sensor verification device comprising:

2. Furthermore, a first fastener interface coupled to the shaft; a second fastener interface coupled to the body; The sensor verification device of claim 1 .

3. The force generator a first spring having a first predetermined force response, the first force generator positioned between the actuator plate and a first location on the body such that actuation of the shaft in a first direction from a predetermined position compresses the first spring; a second spring having a second predetermined spring constant, the second spring being positioned between the actuator plate and a second location on the body such that actuation of the shaft in a second direction from the predetermined position compresses the second spring; and The sensor verification device of claim 1 .

4. The sensor verification device of claim 3 , wherein the first predetermined spring constant is the same as the second predetermined spring constant.

5. The sensor validation device of claim 3 , wherein the first predetermined spring constant is different from the second predetermined spring constant.

6. The sensor validation device of claim 3 , wherein the shaft extends through the first spring and the second spring.

7. The sensor validation device of claim 6 , wherein the first spring is on an opposite side of the actuator plate from the second spring.

8. 1. A test system comprising: The frame and a first fixture and a second fixture configured to grasp a subject; an actuator configured to actuate at least one of the first fixture or the second fixture to apply a force to the subject; a load cell configured to measure at least a portion of the force applied to the subject by the actuator; and a processing circuit unit; The processing circuit unit comprises: controlling the actuator to actuate the at least one of the first fixture or the second fixture to apply the force to the subject; performing a load cell verification, controlling the actuator to actuate the at least one of the first fixture or the second fixture while a load cell verification device is coupled to the first fixture and the second fixture; monitoring the output of the load cell while controlling the actuator to determine the force measured by the load cell; indicating that the testing system is in a suitable state to perform at least a first type of force test in response to determining that the force measured by the load cell is within a predetermined range of a predetermined force associated with the load cell verifier; performing a load cell verification, including: A test system configured to:

9. The processing circuitry is configured to perform the load cell verification, the load cell verification further comprising: controlling the actuator to actuate the at least one of the first fixture or the second fixture in a first direction while monitoring the output of the load cell; controlling the actuator to actuate the at least one of the first fixture or the second fixture in a second direction while monitoring the output of the load cell; The test system of claim 8 , comprising:

10. 10. The test system of claim 9, wherein the processing circuitry is configured to monitor a tensile force measured by the load cell in the first direction and to monitor a compressive force measured by the load cell in the second direction.

11. The test system of claim 8 , wherein the second fixture is configured to be stationary and the actuator is configured to actuate the first fixture.

12. The test system of claim 11 , wherein the load cell is coupled to the first fixture or the second fixture.

13. The load cell verification device includes: A shaft and The main body and a force generator having a first predetermined force response, the first force generator coupled to the shaft and the body such that actuation of the shaft in a first direction from a predetermined position causes the force generator to generate the first predetermined force response; The test system of claim 8 , comprising:

14. The load cell verification device further comprises: a first fastener interface coupled to the shaft; a second fastener interface coupled to the body; 14. The test system of claim 13, comprising:

15. The shaft includes an actuator plate, and the force generator includes: a first spring having a first predetermined spring constant, the first spring being positioned between the actuator plate and a first location on the body such that actuation of the shaft in a first direction from a predetermined position compresses the first spring; a second spring having a second predetermined spring constant, the second spring being positioned between the actuator plate and a second location on the body such that actuation of the shaft in a second direction from the predetermined position compresses the second spring; and 14. The test system of claim 13, comprising:

16. 16. The test system of claim 15, wherein the first fixture is configured to couple to the first fixture interface and the second fixture is configured to couple to the second fixture interface.

17. 16. The test system of claim 15, wherein the first predetermined spring constant is different from the second predetermined spring constant.

18. 16. The test system of claim 15, wherein the shaft extends through the first spring and the second spring.

19. 16. The test system of claim 15, wherein the first spring is on an opposite side of the actuator plate from the second spring.

20. 1. A method for verifying a load cell in a testing system, comprising: coupling a first fixture interface of the load cell verification device to a first fixture of the test system; coupling a second fixture interface of the load cell verification device to a second fixture of the test system; controlling, via processing circuitry, an actuator of the test system to actuate the at least one of the first fixture or the second fixture; monitoring, via said processing circuitry, an output of a load cell of said test system during or after controlling said actuator to determine the force measured by said load cell; determining that the testing system is in a suitable state to perform at least a first type of force test in response to determining that the force measured by the load cell is within a predetermined range of a predetermined force associated with the load cell verifier; A method comprising:

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