Beam quality monitoring for a laser beam focus point moving at high speed and position registration of multi-laser beams

Abstract

A system for analyzing laser beam characteristics in a high-speed laser motion system, wherein the high-speed laser motion system has a plurality of lasers, each having a field of view for generating a non-stationary laser beam, and a build platform disposed at a predetermined position with respect to the non-stationary laser beam, and the analyzing system has at least one mounted pinhole sensor for receiving laser light generated by the non-stationary laser beam, and an actuator device including either the at least one pinhole sensor or an optical device for directing the laser light to the at least one pinhole sensor, and the actuator device operates in an operating environment above the build platform.

Description

Technical Field

[0001] The technology of the present disclosure generally relates to a laser system having a high-speed beam motion function, and more specifically, to a system, device, and method for characterizing, analyzing, and verifying the appropriate functions and performance of a laser focus point used in a laser processing system having a high-speed beam motion function.

Background Art

[0002] Laser processing typically involves modifying a workpiece in a predetermined manner using a laser beam. Laser processing ranges from high-intensity laser ablation processing to significantly low-intensity processing such as heat treatment that avoids melting. Almost all laser processing techniques involve forming a laser beam of a specific size and shape at a focus point from a laser system at a specific position or working distance. Accurately identifying the position at which the laser system will generate a focus point with the desired characteristics is an important aspect in performing efficient and optimized laser processing.

[0003] Laser processing technology includes laser beam welding (LBW), which is a fusion welding process used to join materials of various configurations. A laser beam welding system typically includes a laser light source, a laser light transmission system, an optical arrangement for transmitting the laser light to the workpiece, and often a motion system for moving either the laser processing image or the workpiece. The LBW system may include a beam transmitted by a fiber or an open beam path, a fixed optical system, or a galvanometer system that enables rapid deflection of the laser beam. The mechanical motion system can include a high-speed system or a low-speed system depending on the intended application. In the LBW process, the laser light is focused using an optical arrangement that includes a collimation lens or mirror, which stops the divergence of the laser light from the light source and transmits the light to a focusing lens or mirror. The focusing lens or mirror then directs the highly intense and focused laser light at the workpiece to be welded. Subsequently, the material of the workpiece is melted using the high-intensity laser light, and two or more parts or components are fused together.

[0004] The use of laser processing systems, particularly LBW systems, has become common in the manufacturing industry, and such systems have become found in many manufacturing facilities around the world. The functional success of all laser processing systems depends on certain stable and reproducible laser beam characteristics, including the shape, distribution, and position of the focus point. Accordingly, there is a continuing need for accurate, user-friendly, and affordable systems, devices, and methods for analyzing the quality and dynamic accuracy of laser focus points formed by laser processing systems having a motion function. There are devices for measuring stationary laser focus points and images, but these devices cannot measure moving focus points, particularly focus points moving at high speed. SUMMARY OF THE INVENTION

[0005] The following presents an overview of specific exemplary embodiments of the technology of the present disclosure. This summary is not an extensive overview and is not intended to identify key or important aspects or elements of the technology of the present disclosure, nor to delineate its scope. However, it should be understood that the use of the indefinite article in the language used to describe and claim the technology of the present disclosure is not intended to limit the technology being described. Rather, the use of "a" or "an" should be construed to mean "at least one" or "one or more."

[0006] One embodiment of the technology of the present disclosure is a system for analyzing laser beam characteristics in a high-speed laser motion system, the high-speed laser motion system having a plurality of lasers, each having a field of view for generating a non-stationary laser beam, and a build platform disposed at a predetermined position with respect to the non-stationary laser beam, the analyzing system having at least one mounted pinhole sensor for receiving laser light generated by the non-stationary laser beam, and an actuator device including either the at least one pinhole sensor or an optical device for directing the laser light to the at least one pinhole sensor, the actuator device operating in an operating environment above the build platform, the system being provided.

[0007] The actuator device is movable over the length of the field of view of each laser. The system further has an optical fiber cable attached to each pinhole sensor, and each optical fiber cable has a proximal end through which the laser light is received through the pinhole sensor and a distal end to which the laser light is transmitted. The system further has a photodetector disposed at the distal end of each optical fiber cable, and this photodetector converts the laser light transmitted to the photodetector into a voltage output signal based on the intensity of the laser light received through the at least one pinhole sensor. The at least one pinhole sensor is attachable to a recoater arm, and this recoater arm is movable over the length of the field of view of each laser. The at least one pinhole sensor measures the shape, quality, and position of the non-stationary laser beam during a build process. The at least one pinhole sensor is capable of measuring the shape, quality, and position of the non-stationary laser beam at any position within the field of view of each of the plurality of lasers, and an overlapping region is formed between the fields of view of each of the plurality of lasers. The at least one pinhole sensor is capable of measuring the shape, quality, and position of the non-stationary laser beam at the center point, ends, and the overlapping region of the field of view.

[0008] Other embodiments of the technology of the present disclosure are systems for analyzing laser beam characteristics in a high-speed laser motion system, the high-speed laser motion system having a plurality of lasers, each having a field of view that generates a non-stationary laser beam, and a build platform disposed at a predetermined position with respect to the non-stationary laser beam, the analyzing system having at least one mounted pinhole sensor that receives laser light generated by the non-stationary laser beam, the at least one pinhole sensor performing in-process analysis during construction of the non-stationary laser beam, the pinhole sensor, and an actuator device that includes either the at least one pinhole sensor or an optical device that directs the laser light to the at least one pinhole sensor, the actuator device operating into an operating environment above the build platform. A system is provided.

[0009] The actuator device is movable over the length of the field of view of each laser. The system further has an optical fiber cable attached to each pinhole sensor, and each optical fiber cable has a proximal end through which the laser light is received through the pinhole sensor and a distal end to which the laser light is transmitted. The system further has a photodetector disposed at the distal end of each optical fiber cable, and the photodetector converts the laser light transmitted to the photodetector into a voltage output signal based on the intensity of the laser light received through the at least one pinhole sensor. The at least one pinhole sensor can be attached to a recirculator arm, and the recirculator arm is movable over the length of the field of view of each laser. The at least one pinhole sensor measures the shape, quality, and position of the non-stationary laser beam at any position within the field of view of each of the plurality of lasers, and an overlapping region is formed between the fields of view of each of the plurality of lasers. The at least one pinhole sensor can measure the shape, quality, and position of the non-stationary laser beam at the center point, the end, and the overlapping region of the field of view.

[0010] A further other embodiment of the technology of the present disclosure is a method for analyzing laser beam characteristics in a high-speed laser motion system, wherein the high-speed laser motion system has a plurality of lasers, each having a field of view for generating a non-stationary laser beam, and a build platform disposed at a predetermined position with respect to the non-stationary laser beam. The method includes attaching at least one pinhole sensor for receiving the laser light generated by the non-stationary laser beam; operating an actuator device in an operating environment above the build platform, the actuator device including either the at least one pinhole sensor or an optical device for directing the laser light to the at least one pinhole sensor; and measuring the shape, quality, and position of the non-stationary laser beam during a build process through the at least one pinhole sensor.

[0011] The method further includes attaching an optical fiber cable to each pinhole sensor, each optical fiber cable having a proximal end through which the laser light is received through the pinhole sensor and a distal end to which the laser light is transmitted to a photodetector. The shape, quality, and position of the non-stationary laser beam are measured at any position within the field of view of each of the plurality of lasers, and an overlapping region is formed between the fields of view of each of the plurality of lasers. The at least one pinhole sensor is capable of measuring the shape, quality, and position of the non-stationary laser beam at the center point, the end, and the overlapping region of the field of view. The method further includes moving the actuator device over the length of the field of view of each laser.

[0012] All combinations of the foregoing concepts and additional concepts described in further detail below, provided such concepts are not mutually inconsistent, are contemplated as part of the technology disclosed herein and can be implemented to achieve the advantages as described herein. Additional features and aspects of the systems, devices, and methods of the present disclosure will become apparent to those of ordinary skill in the art upon reading and understanding the following detailed description of the exemplary embodiments. As will be understood by those of ordinary skill in the art, additional embodiments are possible without departing from the scope and spirit of what is disclosed herein. Accordingly, the description provided herein is to be considered exemplary and not restrictive in nature. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate one or more exemplary embodiments of the technology of the present disclosure and, together with the general description above and the detailed description below, serve to explain the principles of the subject matter of the present disclosure.

Figure 1

Figure 2

Figure 3

Figure 4

Figure 5A

Figure 5B

Figure 5C

Figure 6A

Figure 6B

Figure 7A

Figure 7B

Figure 7C

Figure 7D

Figure 7E

Figure 7F

Figure 8A

Figure 8B

Figure 8C

Figure 9A

Figure 9B

Figure 10

Figure 11

Figure 12

Figure 13

Figure 14

[0014] Here, exemplary embodiments will be described with reference to the figures. Reference numerals are used throughout the detailed description to refer to various elements and structures. The following detailed description includes many specific details for purposes of explanation, but one of ordinary skill in the art will understand that many variations and modifications to the following details are within the scope of the disclosed technology. Accordingly, the following embodiments are described without detracting from the generality of the claimed subject matter and without imposing limitations on the claimed subject matter.

[0015] The examples described herein are merely illustrative and are provided to assist in the description of the apparatus, devices, systems, and methods described herein. None of the features or components shown in the drawings or described hereinafter should be considered necessary for any particular implementation of these apparatus, devices, systems, or methods, unless specifically so designated. For ease of reading and clarity, specific components, modules, or methods may be described only in relation to a particular figure. It should not be understood that a combination or partial combination of components is shown to be impossible merely because it is not specifically described. Also, with respect to the methods described, unless otherwise specified or required by the context, the explicit or implicit ordering of the steps executed in the execution of the method does not mean that the steps must be executed in the order in which they are presented. Instead, it should be understood that they may be executed in a different order or in parallel.

[0016] U.S. Patent No. 10,976,219 and U.S. Patent No. 10,627,311 are related to the technology of the present disclosure, and the entire content of each of these patents is hereby expressly incorporated by reference into this specification and made a part of this patent application for all purposes. These documents disclose systems used in additive manufacturing, which is an industrial process of creating three-dimensional objects by adding successive ultra-thin layers of material. Each successive layer is joined or fused with a previous layer of melted or partially melted material and a different substance for laying down the material, including metal powders, thermoplastic plastics, ceramics, composite materials, glass, and other materials. Laser powder bed fusion (L-PBF) is a particular process used in additive manufacturing that constructs three-dimensional components or parts in a layer-by-layer approach using a high-power laser. L-PBF typically includes (1) a step of spreading a layer of powder material (e.g., metal, etc.) on a build platform or plate, (2) a step of fusing the first layer or first cross-section of the part using a laser, (3) a step of spreading a new layer of powder over the entire previous layer using a roller, recoater arm, coating blade, or similar device, (4) a step of fusing the new layer or new cross-section of the part using a laser, (5) a step of adding and fusing successive layers or cross-sections, and (6) a step of repeating the process until the entire part is created. Loose unfused powder material remains in place but is removed during post-processing.

[0017] The functional success of an L-PBF system depends on the existence of a known and stable laser focus point on the powder bed working plane. The techniques disclosed in U.S. Patent No. 10,976,219 and U.S. Patent No. 10,627,311 provide a portable test device for analyzing the quality and dynamic accuracy of laser focus points in various L-PBF systems and devices. This test device is used together with a laser powder bed fusion additive manufacturing device, and the laser powder bed fusion additive manufacturing device further includes at least one laser that generates a non-stationary laser beam having known or predetermined characteristics, and a build surface disposed at a predetermined position with respect to the non-stationary laser beam. The non-stationary laser beam translates (i.e., traverses) across the build surface in a controlled manner during the additive manufacturing process. The device includes a support having an upper surface adapted to receive and absorb the laser light generated by the non-stationary laser beam, a plurality of pinhole defining structures, each positioned to receive the laser light generated by the non-stationary laser beam, and each pinhole being arranged parallel at a predetermined height from the upper surface of the support. The pinhole defining structure, and an optical fiber cable disposed within each pinhole defining structure, each optical fiber cable having a proximal end through which the laser light is received through the pinhole and a distal end to which the laser light is transmitted. The optical fiber cable, and a photodetector disposed at the distal end of each optical fiber cable, the photodetector converting the laser light transmitted to the photodetector into a voltage output signal based on the intensity of the laser light received through each pinhole. Figures 1-4, 5A-5C, 6A-6B, 7A-7F, and Figures 8A-8C provide various exemplary views of an exemplary test device for analyzing the quality and dynamic accuracy of laser focus points in various laser-based manufacturing systems including L-PBF systems and laser beam welding (LBW) systems.

[0018] As best shown in FIGS. 1-4, an exemplary test apparatus 10 includes a support 100, a base 200, pinhole defining structures or pinhole sensors 300, 400, 500, 600 attached to the support 100, and a photodetector 700 disposed on the base 200. The support 100 is generally square in shape, also referred to as a calibration plate, and includes an absorbent upper surface 110, which may further include a series of concentrically arranged ridges or other raised structures (see FIG. 4), which absorb and dissipate heat generated by the laser beam and prevent damage to the upper surface 110 and the support 100. The support 100 further includes a first mounting recess 120 (for receiving the first pinhole defining structure 300), a first setscrew opening 122 (for receiving a setscrew for fixing the first pinhole defining structure 300 within the first mounting recess 120), a second mounting recess 130 (for receiving the second pinhole defining structure 400), a second setscrew opening 132 (for receiving a setscrew for fixing the second pinhole defining structure 400 within the second mounting recess 130), a third mounting recess 140 (for receiving the third pinhole defining structure 500), a third setscrew opening 142 (for receiving a setscrew for fixing the third pinhole defining structure 500 within the third mounting recess 140), a fourth mounting recess 150 (for receiving the fourth pinhole defining structure 600), and a fourth setscrew opening 152 (for receiving a setscrew for fixing the fourth pinhole defining structure 600 within the fourth mounting recess 150). The support 100 also includes a first opening 160 for receiving a first coolant fitting 162, a second opening 164 for receiving a second coolant fitting 166, and a channel 170 for receiving and transporting a liquid or gaseous coolant that transfers the energy absorbed by the support 100 away from the test apparatus 10.

[0019] Also, as best shown in FIGS. 1-4, the base 200 has a shape corresponding to that of the support 100 and cooperates with the support 100 to form a housing. The base 200 includes an outer wall 210 and an internal cavity 212, and various optical fiber cables attached to the photodetector 700 and the pinhole defining structure are disposed in the internal cavity 212. The base 200 also includes an opening 214 for receiving a Bayonet Neill-Concelman (BNC) partition 216 to which a BNC connector 218 is attached, a second opening 220 for receiving a gas joint 222, and a third opening 224 for receiving a gas release valve 226. In a particular embodiment, a source of pressurized gas is connected to the gas joint 222 to supply gas flowing outwardly to and through each pinhole to prevent contamination of the pinholes by debris or other fragments generated during the test process.

[0020] Referring to FIGS. 1-4, FIGS. 5A-C, and FIGS. 6A-6B, an exemplary embodiment of the test apparatus 10 shown in the figures includes four pinhole defining structures, also referred to as "pedestals". Only the first pinhole defining structure 300 is shown in FIGS. 5A-C and FIGS. 6A-6B, but the remaining pinhole defining structures (400, 500, and 600) are configured similarly to the first pinhole defining structure 300. Thus, FIGS. 5A-C and FIGS. 6A-6B are meant to be representative of all of the pinhole defining structures shown.

[0021] As shown in FIGS. 5A - C and 6A - 6B, the first pinhole definition structure or pedestal 300 includes a first pinhole 302, and the first pinhole 302 is formed at the tip 304 through which the channel 306 passes. The diameter of the pinhole 302 is typically from one - third to one - thirtieth of the diameter of the laser beam characterized by the test device 10 (e.g., pinhole diameter: 5 - 50 μm). The tip 304 typically includes a highly reflective material such as gold, copper, or other reflective metals to minimize damage to the pinhole and the pinhole definition structure caused by the absorption of energy from the laser beam. The tip 304 is mounted within the body 310, and the body 310 includes a tapered portion 312 and a cylindrical portion 326 through which the channel 328 passes. The first set - screw opening 330 is adapted to receive a first set - screw 332, and the first set - screw 332 secures the first optical fiber cable 350 to the body 310. The first optical fiber 352 is inserted into the channel 306 and brought close to the first pinhole 302. The first pinhole definition structure or pedestal 300 is mounted within the support 100 so as to be higher than the upper surface 110 by a height (e.g., 20 - 40 mm) that minimizes any damage to the pinhole and the pedestal that may be caused by the energy of the non - stationary laser beam.

[0022] FIGS. 7A - 7F are diagrams for analyzing the characteristics of a non - stationary laser beam generated by a laser light source existing in a laser powder bed fusion system used for additive manufacturing using the test device 10. In these figures, the laser light source 800 generates a laser beam 802, and the laser beam 802 contacts the upper surface 110 of the test device 10 at a plurality of positions or locations including the position containing the aforementioned pinhole. During normal operation of the test device 10, the laser beam 802 is continuously operated at a typical operating power so that all laser beam transmission elements of the laser powder bed fusion machine or system are at normal operating temperature and functionality, thereby enabling detection of any deviation of the laser beam 802 or degradation in the quality of laser beam focusing.

[0023] FIG. 8A is a cross-sectional view of the pinhole defining structure 300, showing that the pinhole defining structure 300 is attached to the support 100 and receives laser light from the laser beam 802 during normal operation of the laser powder bed fusion system to be analyzed. FIG. 8B is a detailed view of the upper part of FIG. 8A, showing the laser light reflected by the pinhole defining structure 300. Also, FIG. 8C is a view for analyzing the characteristics of the non-stationary laser beam 802 generated by the laser light source 800 using the test apparatus 10, showing that the laser beam 802 is reflected from the pinhole defining structure 400. In FIGS. 8A - 8B, it is shown that the light from the laser beam 802 passes through the pinhole 302 and enters the optical fiber 352, and a signal is transmitted through the optical fiber 352 to the photodetector 700 (see FIG. 1). The laser light passing through the pinhole 302 is only a very small amount of the laser light generated by the laser beam 802. For example, in the case of a laser beam having a total diameter of about 0.1 mm, the diameter of the beam portion passing through the pinhole 302 is about 0.025 mm. The laser light collected from each pinhole can be transmitted through an optical fiber coupling to one or more optical measurement devices. The test apparatus 10 includes a data acquisition device that communicates with the photodetector 700, and the data acquisition device receives, stores, organizes, and analyzes an electrical signal as a function of time or time and position for the pinhole where the laser light is received. The data analysis algorithm associated with the data acquisition device calculates and determines the quality of the laser beam based on data obtained from multiple passes on multiple pinholes by the non-stationary laser beam. The data acquisition device can also include hardware and / or software (e.g., Bluetooth (registered trademark), etc.) that enables data transmission to a receiver located outside the additive manufacturing device.

[0024] The above-described systems, devices, and methods, as well as those in U.S. Patent Publication No. 2021 / 0223140, which is incorporated herein by reference in its entirety, are useful for analyzing many aspects of a high-speed laser motion system. In one embodiment, the techniques of the present disclosure are used in a method for analyzing a multi-laser system. Operators of laser powder bed fusion machines and remote laser welding systems where multiple lasers operate in a single work area often have to adjust the laser system. This is accomplished by analyzing the quality and position of the laser beam for each laser included in the system. In these systems, it is important for each laser focus point motion system to generate a laser focus point that is as similar as possible to the other laser focus points included in the system and to recognize and understand the differences between the focus points of the laser beams. In areas where the fields of view (i.e., the work areas) overlap, the position accuracy and calibration of the high-speed laser beam motion system are also important. In these areas, both high-speed laser motion systems need to process parts without discontinuities. The ability to test the high-speed laser focus point motion system during pre-production and post-production is important and can be achieved by the techniques of the present disclosure. However, this method also enables in-build analysis of the system layer-by-layer or section-by-section, and in the case of laser powder bed fusion (LPBF), the performance of the laser can be registered based on a specific layer of the build, or in the case of remote laser welding, based on a specific area of the weld.

[0025] The technology of the present disclosure uses a pinhole laser beam analyzer similar to those described above for quality monitoring of a rapidly moving laser beam and position registration of multiple laser beams in a high-speed laser motion system. The technology of the present disclosure is also used to analyze the shape, quality, and position of a laser beam, and more importantly, to analyze the beam in the overlapping region of the field of view of a high-speed motion system. As described below, exemplary embodiments use an alternative configuration of the pinhole system to temporarily move the device to a predetermined position and sample the beam. The pinhole analyzer of the present disclosure may be configured as part of an operating system that provides automatic laser analysis. Alternatively, optical elements that direct the laser light to a pinhole analyzer located elsewhere may be included in the operating system that provides automatic laser analysis.

[0026] Referring to FIGS. 9A-9B and FIGS. 10-11, an exemplary embodiment of the technology of the present disclosure includes a sensor fixed to an actuator device. One or more pinhole sensors are fixed to the actuator device, and the actuator device positions the sensor at a single desired position within the field of view of the high-speed motion system. This position can be an overlapping region of the multi-laser system for the analysis of the quality of each laser processing spot or image and the position registration of each system. The position can also be anywhere within the field of view of a single system, a single laser system, or a multi-laser system. Other possible positions include near the center of the field of view and / or near the edge of the field of view. Also, the pinhole sensor can be fixed to a movable actuator device recorder arm system that can move the sensor along the length of the field of view of the high-speed motion system. Alternatively, one or more pinhole sensors can be fixed to a movable actuator device separate from the recorder arm system that can move the sensor along the length of the field of view of the high-speed motion system, thereby isolating the sensor from vibrations and positional inaccuracies caused by the recorder arm. In either case, the sensor can operate both within and outside the field of view.

[0027] Referring to FIGS. 12 - 14, another exemplary embodiment of the technology of the present disclosure includes a mirror or prism fixed to an actuator device. One or more optical devices (e.g., a mirror, a partial reflection mirror, a beam splitter, or a prism, etc.) are fixed to the actuator device so that the optical device can be positioned at a single desired position within the field of view of the high - speed motion system. The optical device directs the sampling of the laser beam to a pinhole located at a position away from the area that may damage the device. The optical device can be positioned in the overlapping area of the multi - laser system for the analysis of the quality of each laser and the registration of the position of each system. The optical device may also be placed anywhere within the field of view of a single system, a single - laser system, or a multi - laser system. Possible positions include near the center of the field of view and / or near the edge of the field of view, etc.

[0028] The main advantages and aspects of the technology of the present disclosure include: (i) the described configuration provides the ability to perform process evaluation / verification of the laser beam and motion system; (ii) the scanning motion system enables the pinhole sensor to sample the beam at multiple positions where the pinhole sensor has access to the system field of view; (iii) the beam can be transmitted to the measurement device using one or more pinhole sensors connected to an optical fiber; (iv) mirrors and optical elements can be used to transmit and sample the beam through an open beam path to the pinhole sensor; (v) configuration (b) allows the pinhole sensor to be positioned in a safe location, thereby extending the system life; and (vi) consumables that can be easily replicated can be used within the field of view. Prior art systems, including prime scan field monitors and off-field beam watchAMs, have limited sampling capabilities and positions. In these systems, the ability to sample the beam during motion is limited, and there is currently no ability to sample the entire field of view during manufacturing. Many entities are contract manufacturers, users, customizers, and analysts of laser processing systems, including laser powder bed fusion systems and remote laser welding systems. Commercially available analysis systems are insufficient for the analysis of laser processing systems due to design limitations that require a stationary beam and limited field of view areas that can be analyzed in large analysis systems. Furthermore, industry standards such as AMS7003 have created a demand for systems such as the technology of the present disclosure that are not subject to the design limitations of existing systems.

[0029] Referring to FIGS. 9A - 9B and 10, an exemplary embodiment of the laser system 900 includes a housing 910, a recoater arm 920, a build platform 930, an actuator device 1100 with a pinhole sensor 300, and a photodetector 700. In these figures, the actuator device 1100 moves from a non - operating position (shown in FIG. 9A) to an operating position within the operating environment 940 and above the build platform 930 (shown in FIG. 9B). In this exemplary embodiment, the actuator device 1100 moves into the operating environment 940 by moving through an angular displacement of 90 degrees from the non - operating position. In other exemplary embodiments, the actuator device 1100 moves into the operating environment 940 through extension and contraction movements.

[0030] Referring to FIGS. 10 - 11, the laser system 900 further includes a plurality of laser light sources or lasers 800, each having a field of view 1000, and the lasers 800 generate non - stationary laser beams 802. As shown in FIG. 10, the fields of view 1000 from each laser 800 create an overlapping region 1010 at the intersection of the respective fields of view 1000. In one embodiment of the techniques of the present disclosure, the actuator device 1100 moves into the operating environment 940 such that the pinhole sensor 300 can be positioned within the overlapping region 1010. In other embodiments of the techniques of the present disclosure, the actuator device 1100 can move across the length of the build platform 930, thereby enabling the pinhole sensor 300 to be positioned at any position within each field of view 1000, including the center point and the end points of the field of view 1000. In yet other exemplary embodiments, the pinhole sensor 300 can be attached to the recoater arm 920, or to other components within a high - speed laser motion system.

[0031] Further, referring to FIGS. 10-11, the pinhole sensor 300 is fixed or attached to the actuator device 1100 and measures laser beam characteristics during construction. The pinhole sensor 300 receives laser light from the non-stationary laser beam 802 and transmits the laser light to the photodetector 700 through the optical fiber cable 950. In this exemplary embodiment, the optical fiber cable 950 is disposed within the actuator device 1100, the pin sensor 300 is attached to the proximal end of the optical fiber cable 950, and the photodetector 700 is attached to the distal end of the optical fiber cable 950. The photodetector 700 converts the laser light transmitted to the photodetector 700 into a voltage output signal based on the intensity of the laser light received through the pinhole sensor 300.

[0032] Referring to FIGS. 12 - 14, another exemplary embodiment of the laser system 900 includes a housing 910, a recoater arm 920, a build platform 930, an actuator device 1100 having optical devices 1400, 1500, and a photodetector 700. In this embodiment, the laser system 900 functions similarly to the laser system 900 described and illustrated in FIGS. 9A - 9B and FIGS. 10 - 11, except that the laser system 900 in this embodiment includes an actuator device 1100 having optical devices 1400, 1500. The actuator device 1100 having optical devices 1400, 1500 moves from a non - operating position to an operating position within the operating environment 940 (shown in FIG. 12) and above the build platform 930. The actuator device 1100 having optical devices 1400, 1500 can move to the operating environment 940 by moving through an angular displacement of 90 degrees from the non - operating position or through extension and retraction movements. In one embodiment of the technology of the present disclosure, the actuator device 1100 moves into the operating environment 940 such that the optical devices 400, 1500 can be positioned in the overlapping region 1010. In other embodiments of the technology of the present disclosure, the actuator device 1100 can move along the length of the build platform 930, whereby the optical devices 1400, 1500 can be positioned at any position within each field of view 1000 from the laser 800, including the center point and the end points of the field of view 1000.

[0033] Referring now to FIGS. 13-14, optical devices 1400, 1500 are fixed or attached to actuator device 1100. In this embodiment, optical device 1400 receives laser light from non-stationary laser beam 802 and directs the laser light from non-stationary laser beam 802 to optical device 1500. Optical device 1500 then directs the laser light from non-stationary laser beam 802 to pinhole sensor 300. In this embodiment, pinhole sensor 300 is not fixed to actuator device 1100. Pinhole sensor 300 receives the directional laser light from non-stationary laser beam 802 and transmits the laser light through optical fiber cable 950 to its own photodetector 700.

[0034] All documents and similar materials cited in this application, including but not limited to patents, patent applications, papers, books, monographs, web pages, are hereby expressly incorporated by reference in their entirety, regardless of their form. If one or more of the incorporated documents and similar materials differ from or conflict with this application, including but not limited to defined terms, term usage, described techniques, etc., this application shall govern.

[0035] As described above and as used herein, the singular forms "a," "an," and "the" refer to both the singular and plural forms unless the context clearly indicates otherwise. The term "comprising" as used herein is synonymous with "including," "containing," or "characterized by," and is inclusive or open-ended and does not exclude additional, unrecited elements or method steps. Although many methods and materials similar or equivalent to those described herein can be used, particular preferred methods and materials are described herein. Unless the context indicates otherwise, the recitation of numerical ranges by endpoints includes all numbers within that range. Further, references to "one embodiment" are not intended to be construed as excluding the existence of additional embodiments that also incorporate the recited features. Further, unless the contrary is explicitly stated, embodiments having an element or elements with a particular property "having" or "comprising" can include additional elements, whether or not they have that property.

[0036] The terms "substantially" and "about," when used throughout this specification or when used, account for and describe minor variations, such as variations in processing. For example, these terms can refer to ±5% or less, such as ±2% or less, such as ±1% or less, such as ±0.5% or less, such as ±0.2% or less, such as ±0.1% or less, such as ±0.05% or less, and / or 0%.

[0037] Underlined and / or italic headings and subheadings are used for convenience only and do not limit the disclosed subject matter nor are they to be referred to in connection with the interpretation of the description of the disclosed subject matter. All structural and functional equivalents to the various elements of the various embodiments described throughout this disclosure that are known or later become known to those of ordinary skill in the art are hereby expressly incorporated by reference and are intended to be encompassed by the disclosed subject matter. Further, what is disclosed herein is not intended to be dedicated generally, whether or not such disclosure is expressly recited in the above description.

[0038] There may be many alternative ways of implementing the technology of this disclosure. The various functions and elements described herein may be divided differently than shown without departing from the scope of the technology of this disclosure. The general principles defined herein may be applied to other embodiments. Different numbers of a given module or unit may be employed, different types or kinds of a given module or unit may be employed, a given module or unit may be added, or a given module or unit may be omitted.

[0039] Also, in the present disclosure, the term "plurality" refers to two or more. Unless otherwise clearly defined, the orientation or positional relationship indicated by terms such as "upper" and "lower" is only based on the orientation or positional relationship shown in the figures for the purpose of facilitating and simplifying the description of the technology of the present disclosure, and does not indicate or imply that the referenced device or element must be in a specific orientation, or must be configured or operate in a specific orientation. Therefore, it should not be construed as limiting the technology of the present disclosure. Terms such as "connected", "attached", "fixed", etc. should be understood in a broad sense. For example, "connected" means fixed connection, detachable connection, integral connection, direct connection, or indirect connection through an intermediate medium, etc. For those skilled in the art, the specific meaning of the above terms in the technology of the present disclosure can be understood according to specific situations.

[0040] Specific details have been shown in the above description for a thorough understanding of the technology of the present disclosure. However, it is understood that the embodiments and implementation manners of the present disclosure can be implemented without these specific details. For example, the circuit can be shown in a block diagram in order not to obscure the embodiments of the present disclosure unnecessarily in detail. In other examples, well-known circuits, processes, algorithms, structures, and technologies can be shown without unnecessary details in order not to obscure the embodiments of the present disclosure.

[0041] The implementation of the above-described technologies, blocks, steps, and means can be realized in various ways. For example, these technologies, blocks, steps, and means can be implemented in hardware, software, or a combination thereof. In the case of hardware implementation, the processing unit can be implemented within one or more application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field-programmable gate arrays (FPGAs), processors, controllers, microcontrollers, microprocessors, other electronic units designed to perform the above functions, and / or combinations thereof.

[0042] The technology of the present disclosure can be described as a process depicted as a flowchart, a flow diagram, a data flow diagram, a structural diagram, or a block diagram. A flowchart can describe operations as sequential processes, but many operations can be executed in parallel or concurrently. Furthermore, the order of the operations can be rearranged. A process ends when its operations are completed, but it can also have additional steps not included in the figure. A process corresponds to a method, a function, a procedure, a subroutine, a subprogram, etc. When a process corresponds to a function, its end corresponds to the function returning to the calling function or the main function.

[0043] Furthermore, the technology of the present disclosure can be implemented by hardware, software, a scripting language, firmware, middleware, microcode, a hardware description language, and / or any combination thereof. When implemented in software, firmware, middleware, a scripting language, and / or microcode, the program code or code segments for performing the necessary tasks can be stored in a machine-readable medium such as a storage medium. A code segment or machine-executable instruction can represent a procedure, a function, a subroutine, a program, a routine, a subroutine, a module, a software package, a script, a class, or any combination of instructions, data structures, and / or program statements. A code segment can be coupled to other code segments or hardware circuits by passing information, data, arguments, parameters, and / or memory contents. Information, arguments, parameters, data, etc. can be passed, transferred, or transmitted via any suitable means including memory sharing, message passing, ticket passing, network transmission, etc.

[0044] It should be understood that all combinations of the foregoing concepts and additional concepts described in more detail herein, provided that such concepts are not mutually inconsistent, are intended to be part of the technology of this disclosure. In particular, all combinations of the claimed subject matter appearing at the end of this disclosure are intended to be part of the technology disclosed herein. The technology of this disclosure is illustrated by the description of exemplary embodiments, and although the exemplary embodiments have been described in certain details, there is no intention to limit the appended claims to such details or to limit them in any way. Further advantages and modifications will be readily apparent to those skilled in the art. Accordingly, the technology of this disclosure is not limited to the specific details, representative devices and methods, and / or exemplary examples illustrated and described in its broad aspects. Thus, departures from such details can be made without departing from the spirit or scope of the general inventive concept.

Claims

1. A system for analyzing laser beam characteristics in a high-speed laser motion system, wherein the high-speed laser motion system has a plurality of lasers, each having a field of view for generating a non-stationary laser beam, and a build platform disposed at a predetermined position with respect to the non-stationary laser beam, and the system for analysis comprises: (a) at least one mounted pinhole sensor for receiving laser light generated by the non-stationary laser beam; (b) an actuator device, (i) the at least one pinhole sensor, or (ii) an optical device for directing the laser light to the at least one pinhole sensor, wherein the actuator device includes either of the above, and the actuator device operates in an operating environment above the build platform. System.

2. The system according to claim 1, wherein the actuator device is movable over the length of the field of view of each laser.

3. The system according to claim 1, further comprising an optical fiber cable attached to each pinhole sensor, each optical fiber cable having a proximal end through which the laser light is received by the pinhole sensor and a distal end to which the laser light is transmitted.

4. The system according to claim 3, further comprising a photodetector disposed at the distal end of each optical fiber cable, the photodetector converting the laser light transmitted to the photodetector into a voltage output signal based on the intensity of the laser light received through the at least one pinhole sensor.

5. The system according to claim 1, wherein the at least one pinhole sensor is attachable to a recirculator arm, and the recirculator arm is movable over the length of the field of view of each laser.

6. The system according to claim 1, wherein the at least one pinhole sensor measures the shape, quality, and position of the non-stationary laser beam during a construction process.

7. The system according to claim 6, wherein the at least one pinhole sensor is capable of measuring the shape, quality, and position of the non-stationary laser beam at any position within the field of view of each of the plurality of lasers, and an overlapping region is formed between the fields of view of each of the plurality of lasers.

8. The system according to claim 7, wherein the at least one pinhole sensor is capable of measuring the shape, quality, and position of the non-stationary laser beam at the center point, the end, and the overlapping region of the field of view.

9. A system for analyzing laser beam characteristics in a high-speed laser motion system, the high-speed laser motion system having a plurality of lasers, each having a field of view for generating a non-stationary laser beam, and a build platform disposed at a predetermined position with respect to the non-stationary laser beam, the analyzing system comprising: (a) at least one mounted pinhole sensor that receives laser light generated by the non-stationary laser beam, and the at least one pinhole sensor performs in-process analysis during construction of the non-stationary laser beam; the pinhole sensor; (b) an actuator device, (i) the at least one pinhole sensor, or (ii) an optical device that directs the laser light to the at least one pinhole sensor including any one of them; the actuator device and having the actuator device operates into an operating environment above the build platform. System.

10. The system according to claim 9, wherein the actuator device is movable over the length of the field of view of each laser.

11. In the system according to claim 9, the system further has an optical fiber cable attached to each pinhole sensor, and each optical fiber cable has a proximal end through which the laser light is received through the pinhole sensor and a distal end to which the laser light is transmitted. System.

12. In the system according to claim 11, the system further has a photodetector disposed at the distal end of each optical fiber cable, and this photodetector converts the laser light transmitted to the photodetector into a voltage output signal based on the intensity of the laser light received through the at least one pinhole sensor. System.

13. In the system according to claim 9, the at least one pinhole sensor can be attached to a recoater arm, and this recoater arm is movable over the length of the field of view of each laser. System.

14. In the system according to claim 9, the at least one pinhole sensor measures the shape, quality, and position of the non-stationary laser beam at any position within the field of view of each of the plurality of lasers, and an overlapping region is formed between the fields of view of each of the plurality of lasers. System.

15. In the system according to claim 14, the at least one pinhole sensor can measure the shape, quality, and position of the non-stationary laser beam at the center point, end, and overlapping region of the field of view. System.

16. A method for analyzing laser beam characteristics in a high-speed laser motion system, the high-speed laser motion system having a plurality of lasers, each having a field of view for generating a non-stationary laser beam, and a build platform disposed at a predetermined position with respect to the non-stationary laser beam, and this method includes (a) attaching at least one pinhole sensor for receiving the laser light generated by the non-stationary laser beam; (b) operating an actuator device into an operating environment above the build platform, the actuator device being (i) the at least one pinhole sensor, or (ii)an optical device that directs the laser light towards the at least one pinhole sensor either of which is included in the step of operating the device, (c) measuring the shape, quality, and position of the non-stationary laser beam during the construction process through the at least one pinhole sensor A method comprising: **Claim 17** The method according to claim 16, further comprising the step of attaching an optical fiber cable to each pinhole sensor, each optical fiber cable having a proximal end through which the laser light is received through the pinhole sensor and a distal end to which the laser light is transmitted to a photodetector. A method. **Claim 18** In the method according to claim 16, the shape, quality, and position of the non-stationary laser beam are measured at an arbitrary position within the field of view of each of the plurality of lasers, and an overlapping region is formed between the fields of view of each of the plurality of lasers. A method. **Claim 19** In the method according to claim 18, the at least one pinhole sensor is capable of measuring the shape, quality, and position of the non-stationary laser beam at the center point, the end, and the overlapping region of the field of view. A method. **Claim 20** The method according to claim 16, further comprising the step of moving the actuator device over the length of the field of view of each laser. A method.

Images