Apparatus and method for measuring the high-temperature resistivity of tin oxide electrodes in substrate glass furnaces

Abstract

The present invention discloses an apparatus and method for measuring the high-temperature resistivity of a tin oxide electrode in a substrate glass furnace. In this invention, platinum terminals are attached to both ends of a cylindrical tin oxide electrode sample, which are then connected to a DC double arm using platinum wires. Alumina fixing and insulating spacers are designed at the top and bottom of the cylindrical tin oxide electrode. The measuring apparatus is then installed in a high-temperature well furnace, a heating program is set, and the corresponding DC double arm values ​​at different temperatures are measured. Based on the resistivity calculation principle, the corresponding volume resistivity of the tin oxide electrode at different temperatures can be calculated, providing a reference basis for the electrical parameters during current flow when melting glass with a high-generation substrate glass electrode.

Description

[Technical Field]

[0001] The present invention relates to the field of high temperature resistivity testing of tin oxide electrodes, which are heating elements in advanced substrate glass furnaces, and more particularly to an apparatus and method for measuring the high temperature resistivity of tin oxide electrodes in substrate glass furnaces. [Background technology]

[0002] Glass products have always been widely used in the display field, and the development of the display device industry would be unimaginable without the support of the glass industry. Although other materials can now replace glass in some applications, they cannot replace the excellent performance of glass, from the traditional color picture tube industry to the current flat panel display industry. From the traditional color cathode ray tube industry to the current flat panel display industry, glass has always played an important role as a key component in display devices. In fact, glass is the frame and carrier for the entire device, and is also an optical component. When used as the two substrates (top and bottom) of a flat panel display device, precise micro-semiconductor processing is required. Summary of the Invention [Problem to be solved by the invention]

[0003] However, the increasing withdrawal rate of high-generation substrate glass poses greater challenges and demands on the melting capacity of kilns. Therefore, accurately measuring the high-temperature volume resistivity of tin oxide electrodes, the heating elements of kilns, at different temperatures can provide strong theoretical support and basis for the current and power settings during electrode energization. In the substrate glass manufacturing process, glass ingredients are first fed stably and smoothly through a supply system into the kiln's feed port. Then, the kiln undergoes melting, fining, and homogenization to produce a homogeneous glass liquid suitable for the next process. The glass liquid melted in the kiln is alkali-free, high-aluminum borosilicate glass, and this glass product is primarily used for flat-panel display substrates. The increasing withdrawal rate of high-generation, high-volume, and ultra-fine substrate glass inevitably places stricter demands on the melting capacity of kilns and the electrical heating parameter settings of tin oxide electrodes. Therefore, only by accurately measuring the volume resistivity parameters of tin oxide electrodes at different temperatures can more reliable technical support be provided for the optimal distribution of electrical parameters of kiln heating elements. [Means for solving the problem]

[0004] This invention discloses a device and method for measuring the high-temperature resistivity of tin oxide electrodes in substrate glass furnaces, which solves the problem that it is difficult to accurately control the electrical parameters of tin oxide electrodes in furnaces during the glass melting process. Based on the resistivity measurement principle, this invention can provide strong theoretical support for the setting, application, and accurate calculation of the electrical parameters of tin oxide electrodes within the process temperature range of the production line.

[0005] In order to achieve the above object, the present invention employs the following technical means. The present invention discloses a device for measuring the high-temperature resistivity of a tin oxide electrode in a substrate glass furnace, comprising a DC double arm (6), one end of which is connected to one end of a first platinum conducting wire (4), the other end of which is connected to a first platinum terminal (3), a first insulating spacer (1) provided above the first platinum terminal (3), the other end of which is connected to one end of a second platinum conducting wire (5), the other end of which is connected to a second platinum terminal (8), and a second insulating spacer (7) provided below the second platinum terminal (8).

[0006] Furthermore, the first insulating spacer (1) and the second insulating spacer (7) are made of an alumina material.

[0007] Furthermore, the electrical resistivity of the alumina material at 1200°C or higher is 1 × 10 3 The alumina material has a resistivity of greater than Ω·cm and an alumina purity of 99.99% or more.

[0008] Furthermore, the first platinum terminal (3) and the second platinum terminal (8) are arranged symmetrically.

[0009] Furthermore, a predetermined distance is provided between the first platinum terminal (3) and the second platinum terminal (8), and the predetermined distance is greater than the height of the columnar tin oxide electrode to be measured.

[0010] The present invention also discloses a method for measuring the high-temperature resistivity of tin oxide electrodes in a substrate glass furnace using the above-mentioned measuring device, comprising the steps of: step S1: measuring the height and cross-sectional diameter of the columnar tin oxide electrode to be measured, then connecting both ends of the columnar tin oxide electrode to a first platinum terminal (3) and a second platinum terminal (8), respectively, and connecting the electrode to a DC double arm (6) via a first platinum lead wire (4) and a second platinum lead wire (5); step S2: fixing both ends of the columnar tin oxide electrode to be measured with a first insulating spacer (1) and a second insulating spacer (7), then placing the measuring device in a high-temperature well furnace and measuring the resistance value of the columnar tin oxide electrode to be measured using the DC double arm (6) at a predetermined set temperature; and step S3: obtaining the resistivity of the columnar tin oxide electrode to be measured according to resistivity calculation principles based on the height, cross-sectional diameter, and resistance value of the columnar tin oxide electrode to be measured.

[0011] Furthermore, in step S2, the predetermined set temperature is 400°C to 1600°C.

[0012] Furthermore, in step S2, the rate of temperature rise to the predetermined set temperature is 4°C / min to 6°C / min.

[0013] Furthermore, in step S2, the resistance value of the columnar tin oxide electrode to be measured is measured using the DC double arm (6) at the predetermined set temperature. Specifically, measurement is performed once every 100°C using the DC double arm (6) at the predetermined set temperature, and the resistance value of the columnar tin oxide electrode to be measured is recorded.

[0014] Furthermore, in step S3, the calculation principle of the resistivity includes the following formula:

number

[0015] The present invention has the following beneficial effects. This invention provides an apparatus for measuring the high-temperature resistivity of tin oxide electrodes in substrate glass furnaces. This apparatus uses a DC double arm to measure the resistance of the tin oxide electrode, with both ends connected to platinum terminals with platinum wires. An insulating spacer is installed on the side of the platinum terminal. The measurement principle of this apparatus is simple, and the construction cost is very low. Repeated cross-sectional verification and multiple reproduction tests can be performed using process data from the production line, saving on expensive equipment costs and outsourcing testing fees, thereby reducing production costs.

[0016] Furthermore, the first insulating spacer and the second insulating spacer of the present invention are both made of alumina material, with a purity of 99.99% or more, which can ensure stability during the testing process.

[0017] The present invention also discloses a method for measuring the high-temperature resistivity of tin oxide electrodes in substrate glass furnaces. First, the height and diameter of the columnar tin oxide electrode to be measured are measured. Next, the aforementioned measuring device is used to measure the resistance values ​​of the columnar tin oxide electrode to be measured at different temperatures. Finally, based on the resistivity calculation principle, the resistivity of the columnar tin oxide electrode to be measured at different temperatures is obtained. This measurement method provides strong theoretical support for the application and accurate calculation of electrical parameter settings for tin oxide electrodes within the process temperature range of the production line. [Brief explanation of the drawings]

[0018] [Figure 1] The present invention provides a high-temperature resistivity measuring device for tin oxide electrodes in a substrate glass furnace. DETAILED DESCRIPTION OF THE INVENTION

[0019] Certain illustrative embodiments are briefly described below, but the described embodiments can be modified in various ways without departing from the spirit or scope of the invention. Accordingly, the drawings and description are to be regarded as illustrative in nature and not restrictive.

[0020] In describing the present invention, the terms "center," "vertical," "horizontal," "length," "width," "thickness," "top," "bottom," and "front" should be understood as follows. Orientations and positional relationships indicated by "front," "rear," "left," "right," "vertical," "horizontal," "up," "down," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," "circumferential," and the like are based on the orientations and positional relationships shown in the drawings and are intended to simplify the description of the present invention. It is intended that devices or elements must have a specific orientation, or be constructed or operated in a specific orientation, and therefore should not be construed as limiting the present invention.

[0021] Furthermore, the terms "first" and "second" are used for descriptive purposes only and do not indicate relative importance or imply a quantity of the specified technical features. Thus, features qualified as "first" or "second" may explicitly or implicitly include one or more of the corresponding features. In describing this invention, "plurality" means two or more, unless expressly specified otherwise.

[0022] In the present invention, unless otherwise clearly specified or limited, the terms "attached," "connected," "coupled," "fixed," and the like should be interpreted broadly. For example, they may refer to a fixed connection, a detachable connection, or an integral connection. They may also refer to a mechanical connection, an electrical connection, or a connection by communication. They may also refer to a direct connection, an indirect connection via an intermediate medium, or a communication or interactive relationship between two elements. Those skilled in the art will be able to understand the specific meanings of these terms in the present invention according to the specific circumstances.

[0023] Hereinafter, an embodiment of the present invention will be described in detail with reference to the drawings.

[0024] Example 1 In a preferred embodiment of the present invention, an apparatus for measuring the high temperature resistivity of tin oxide electrodes in a substrate glass furnace is disclosed, based on the resistivity measurement principle.

[0025] The device according to the present invention comprises a DC double arm 6 , a first platinum conductor 4 , a second platinum conductor 5 , a first insulating spacer 1 , a second insulating spacer 7 , a first platinum terminal 3 , and a second platinum terminal 8 .

[0026] Here, both ends of the DC double arm 6 are connected to a first platinum terminal 3 and a second platinum terminal 8 via a first platinum conducting wire 4 and a second platinum conducting wire 5, respectively.

[0027] The first insulating spacer 1 is attached to the upper side of a first platinum terminal 3 , and the second insulating spacer 7 is attached to the upper side of a second platinum terminal 8 .

[0028] Specifically, in order to ensure the accuracy of the resistivity measurement of the tin oxide electrode in a high-temperature well furnace (high-temperature pit furnace), high-purity alumina is used as the material for the first insulating spacer 1 and the second insulating spacer 7, and the material has a resistivity of 1×10 at 1200°C or higher. 3 The alumina has a purity of 99.99% or more, which ensures stability during the testing process.

[0029] Specifically, the first platinum terminal 3 and the second platinum terminal 8 are arranged symmetrically above and below, with a certain distance (predetermined distance) between them, which distance must be greater than the height of the tin oxide electrode to be measured.

[0030] In order to ensure the reliability of the above-mentioned measuring device, the present invention discloses a method for measuring the high temperature resistivity of tin oxide electrodes in a substrate glass furnace, which includes the following steps:

[0031] In step (1), the height and bottom diameter of a columnar tin oxide electrode are measured. Next, a first platinum terminal 3 and a second platinum terminal 8 are connected to both ends of the columnar tin oxide electrode, respectively, and the electrode is connected to a DC double arm 6 using a first platinum conducting wire 4 and a second platinum conducting wire 5. The top and bottom ends of the columnar tin oxide electrode are fixed with a first insulating spacer 1 and a second insulating spacer 7.

[0032] In step (2), the measurement device assembled in step (1) is installed in a high-temperature well furnace, and the high-temperature volume resistivity of the tin oxide electrode is tested at different temperatures.

[0033] Specifically, the temperature measurement range of the high-temperature well furnace is 400°C to 1600°C, and the set heating rate is 4°C / min to 6°C / min, which fully meets the requirements for the measurement temperature range.

[0034] Specifically, during the temperature rise process, the resistance value RT displayed by the DC double arm 6 is recorded every 100°C.

[0035] Based on the resistivity calculation principle, the present invention processes tin oxide electrode material used in the production line furnace into a cylindrical shape and uses the above-mentioned measuring device to measure the resistance R at different temperatures, thereby calculating the volume resistivity of the tin oxide electrode at different temperatures. This measurement method has a simple measurement principle, low equipment construction costs, and can utilize production line process data to perform repeated control verification and multiple reproduction tests, thereby saving expensive equipment costs and outsourcing testing costs and reducing production costs. This provides strong theoretical support for the setting, application, and accurate calculation of electrical parameters for tin oxide electrodes within the process temperature range of the production line.

[0036] The resistivity calculation principle on which the present invention is based is specifically as follows:

number

[0037] Compared with the prior art, the present invention is simple, reliable, and easy to operate. This invention uses tin oxide electrode material used in the furnace of the production line, processes it into a cylindrical shape, attaches platinum terminals and platinum wires to both ends, and connects it to a DC double arm. A temperature-raising program is then set up using a laboratory high-temperature well furnace. Using the resistivity calculation principle, the high-temperature volume resistivity of the tin oxide electrode at different temperatures is calculated. The measurement principle of the present invention is simple, and the equipment construction cost is low. Furthermore, repeated control verification and multiple reproduction tests can be performed using process data from the production line, saving expensive equipment costs and outsourced testing costs. This provides strong theoretical support for the application and accurate calculation of electrical parameter settings for tin oxide electrodes within the process temperature range of the production line.

[0038] As is clear from common general knowledge, the present invention can be realized in other embodiments without departing from the spirit or essential features thereof. Therefore, the embodiments disclosed above are illustrative in all respects and are not limiting. All modifications within the scope of the present invention or its equivalent range are included in the present invention. [Explanation of symbols]

[0039] 1 First insulating spacer 2. Columnar tin oxide electrode to be measured 3 1st platinum terminal 4 1st platinum conductor 5 Second platinum conductor 6 DC double arm 7 Second insulating spacer 8 2nd platinum terminal

Claims

1. The device includes a DC double arm (6), one end of which is connected to one end of a first platinum conductor (4), the other end of which is connected to a first platinum terminal (3), and a first insulating spacer (1) is provided above the first platinum terminal (3); The other end of the DC double arm (6) is connected to one end of a second platinum conducting wire (5), the other end of the second platinum conducting wire (5) is connected to a second platinum terminal (8), and a second insulating spacer (7) is provided below the second platinum terminal (8), in this device for measuring the high-temperature resistivity of a tin oxide electrode in a substrate glass furnace.

2. 2. The apparatus for measuring the high temperature resistivity of tin oxide electrodes in a substrate glass furnace as claimed in claim 1, wherein the first insulating spacer (1) and the second insulating spacer (7) are made of alumina material.

3. The electrical resistivity of the alumina material at 1200°C or higher is 1 x 10 ３ 3. The apparatus for measuring the high temperature resistivity of a tin oxide electrode in a substrate glass furnace according to claim 2, wherein the resistivity is greater than Ω·cm, and the alumina purity of the alumina material is 99.99% or more.

4. 2. The apparatus for measuring the high temperature resistivity of a tin oxide electrode in a substrate glass furnace as claimed in claim 1, wherein the first platinum terminal (3) and the second platinum terminal (8) are arranged symmetrically.

5. 2. The device for measuring the high temperature resistivity of a tin oxide electrode in a substrate glass furnace according to claim 1, wherein a predetermined distance is provided between the first platinum terminal (3) and the second platinum terminal (8), and the predetermined distance is greater than the height of the columnar tin oxide electrode to be measured.

6. A method for measuring the high-temperature resistivity of a tin oxide electrode in a substrate glass furnace using the measuring device according to any one of claims 1 to 5, comprising: Step S1: after measuring the height and cross-sectional diameter of the columnar tin oxide electrode to be measured, connect both ends of the columnar tin oxide electrode to a first platinum terminal (3) and a second platinum terminal (8), respectively, and connect the electrode to a DC double arm (6) via a first platinum conducting wire (4) and a second platinum conducting wire (5); Step S2: fixing both ends of the columnar tin oxide electrode to be measured with a first insulating spacer (1) and a second insulating spacer (7), then placing the measuring device in a high-temperature well furnace, and measuring the resistance value of the columnar tin oxide electrode to be measured at a predetermined set temperature using the DC double arm (6); and step S3 of obtaining the resistivity of the columnar tin oxide electrode to be measured according to a resistivity calculation principle based on the height, cross-sectional diameter, and resistance value of the columnar tin oxide electrode to be measured.

7. 7. The method for measuring the high temperature resistivity of a tin oxide electrode in a substrate glass furnace according to claim 6, wherein in step S2, the predetermined set temperature is 400°C to 1600°C.

8. 7. The method for measuring the high temperature resistivity of a tin oxide electrode in a substrate glass furnace according to claim 6, wherein in step S2, the rate of temperature rise to the predetermined set temperature is 4° C. / min to 6° C. / min.

9. In step S2, the resistance value of the columnar tin oxide electrode to be measured is measured using the DC double arm (6) at the predetermined set temperature, and specifically, 7. The method for measuring the high temperature resistivity of a tin oxide electrode in a substrate glass furnace according to claim 6, wherein the DC double arm (6) is used to measure once every 100°C at the predetermined set temperature, and the resistance value of the columnar tin oxide electrode to be measured is recorded.

10. In step S3, the resistivity calculation principle includes the following formula: [Equation 1] where ρ Ｔ 7. The method for measuring the high-temperature resistivity of a tin oxide electrode in a substrate glass furnace according to claim 6, wherein: π is the resistivity of the tin oxide electrode to be measured, R is the resistance value of the tin oxide electrode to be measured, S is the cross-sectional area of ​​the tin oxide electrode to be measured, and D is the cross-sectional diameter of the tin oxide electrode to be measured.

Images