Inspection during the manufacture of modules or precursors to modules

Abstract

The inspection device for layer material includes a first layer conveyor and a first drive for picking up each individual anode layer or cathode layer from a first transfer location using a pickup device and moving it to a first discharge location. The first layer diverter discharges each individual anode layer or cathode layer from the pickup device to a stack table at the first discharge location. The drive aligns the pickup device and the stack table relative to each other in response to signals based on processing of the first and second image captures. When the pickup device of the first layer diverter passes the first image sensor, the first image sensor is directed toward a first region of the layer diverter between the first transfer location and the first discharge location to capture a first image. When the pickup device of the first layer diverter passes the second image sensor, the second image sensor is directed toward a second region of the first layer diverter between the first transfer location and the first discharge location to capture a second image. In this variant, a stack table is provided and configured to receive, at the first emission location, each individual anode layer or cathode layer to form a layer stack.

Description

[Technical Field]

[0001] This document discloses an inspection in the manufacture of modules or precursors of modules. These modules or precursors thereof can be, for example, layer arrangements comprising layer materials, arrangements for or forming parts of fuel cells or battery cells. The layer materials can have electrode layers, which are formed as anode layers or cathode layers. The inspection is disclosed as a method and an apparatus, the details of which are disclosed in the claims. The specification also contains important descriptions of the structure and function of the inspection method, as well as apparatus and method variants. [Background technology]

[0002] Patent Document 1 (WO 2021 / 171946) relates to a stack table on which a laminate stack consisting of a separation foil and an electrode layer is stacked. A transfer unit is used to transfer the separation foil and the electrode layer and place them on the stack table. An inspection device on the stack table inspects the position of the electrode layer in the laminate stack released from the transfer unit.

[0003] Patent Document 2 (JP 2014-078464 A) relates to a lamination machine that forms a laminated body consisting of rectangular foils as positive electrodes and rectangular foils as negative electrodes that are alternately laminated via rectangular separating foils.

[0004] Patent document 1 (WO 2021 / 171946) relates to an inspection device for inspecting the position of an electrode layer in a laminate having a separator foil and an electrode layer bonded therein by an adhesive from the separator layer side. An infrared emitter emits infrared light from the separator layer side to the laminate. An infrared-sensitive camera records the infrared light that is transmitted through the separator foil and reflected from the electrode layer. A detection unit detects the position of the electrode layer based on the image recorded by the camera.

[0005] Patent Document 3 (WO 2020 / 130184) describes the formation of a cell stack for a secondary battery. A stack table is movable in both directions. A separator supply unit is positioned on the stack table and supplies separators to the stack table. A first multi-head is provided on one side of the stack table and stacks layers one after another by placing electrode layers on the stack table, which is moved to one side. A second multi-head is provided on the other side of the stack table and stacks electrode layers on the stack table, which is moved to the other side. [Prior art documents] [Patent documents]

[0006] [Patent Document 1] International Publication No. 2021 / 171946 [Patent Document 2] Japanese Patent Application Laid-Open No. 2014-078464 [Patent Document 3] International Publication No. 2020 / 130184 Summary of the Invention [Problem to be solved by the invention]

[0007] Based on this, the present invention aims to provide a method for stacking layer materials with high accuracy, in order to form modules or precursors of modules, such as fuel cells or battery cells containing layer materials, in a cost-effective and robust arrangement of stack units and at high working speeds. [Means for solving the problem]

[0008] To solve this problem, an inspection device according to an independent device claim and an inspection method according to an independent method claim are proposed.

[0009] The proposed solution for inspection can be integrated into a single handling (apparatus or method), in which a stack table moves in both directions and is supplied with anodes or cathodes at each end position by one of two layer conveyors, respectively, to form an electrode stack. The bidirectional movement of the stack table between the first and second discharge locations limits the number of anode or cathode layers to be discharged per unit time. The proposed solution, i.e., by radially retracting one or more pickup devices of one layer diverter when they approach one or more pickup devices of the other layer diverter (but do not touch), particularly within the space between the two layer diverters, allows the distance between the first and second discharge locations to be shorter than if the trajectories of the pickup devices of the layer diverters were circular. This therefore reduces the length of the distance traveled by the stack table between the two discharge locations. This is especially important after the pickup device has discharged the anode or cathode layer onto the tray of the stack table (position 6 o'clock in FIG. 1 ) and the empty pickup device has entered the space between the two layer deflectors. Without this radial retraction of the pickup device, its trajectory would be much larger, thereby increasing the distance between the first and second discharge locations. This also makes the overall structure of the device more compact. Overall, in this variant, the pickup devices of the two layer deflectors each move along an approximately vertical ellipse, with their (vertical) major axes extending from the center of the respective transfer location to the center of the respective discharge location, and their (horizontal) minor axes not touching each other. Guiding the pickup devices along this approximately elliptical trajectory avoids collisions when the pickup devices rotate from the discharge location to the transfer location, even though the two layer deflectors are arranged closely to each other, thereby minimizing the distance of the stack table from one layer deflector to the other.

[0010] In a variant of the device, first and second layer diverters are provided and configured to advance the pickup devices by means of their second drives when the pickup devices approach the first or second transfer point and / or the first and / or second discharge point, respectively. The pickup devices of the two layer diverters can be advanced radially to pick up the anode or cathode layer at the respective transfer point (12 o'clock or 6 o'clock position in FIG. 1). The radial movement of the pickup devices is initiated before the pickup devices reach the 6 o'clock or 12 o'clock position, but not after they reach these positions.

[0011] This increases the location accuracy at which the two conveyors pick up the anode or cathode layers at each transfer point, thereby allowing a greater number of anode or cathode layers to be discharged per unit time onto the trays of the stack table without compromising the accuracy of the electrode stack construction.

[0012] In a variant of the device, an endless separator is fed from above into the space between the two layer deflectors and folded in a Z-shape onto the stack table, which moves horizontally between the two discharge points in both directions, so that for the electrode stack, starting with the separator, alternately anode or cathode layers are then placed alternately onto the stack table by the two layer deflectors, always separated by the folded separator.

[0013] In a variant of the device, the first and second conveyors are adjacent to each other and arranged at a distance from each other. In a variant of the device, the first and / or second conveyor is configured as a belt conveyor, the underside of which is directed towards the first or second layer diverter, respectively, by means of which the individual anode layers or the individual cathode layers are transported on their underside to the first or second transfer point.

[0014] In a variant of the apparatus, the first and / or second conveyors each have a controlled underpressure / overpressure conveyor belt, which is provided and configured to use underpressure air to pick up individual anode or cathode layers and hold them during transport to the first or second transfer point. In a variant of the apparatus, controlled overpressure air, for example in the form of a short blow impulse, is used to eject the individual anode or cathode layers at the first and / or second transfer point into the first or second layer diverter.

[0015] In a variant of the device, the first and / or second layer diverter each has a plurality of pickup devices for picking up individual anode or cathode layers, which pickup devices are provided and configured to pass through the respective transfer points and the respective discharge points one after the other in a continuous or clocked rotation, in which case the pickup devices of the first and / or second layer diverter can pick up or discharge, respectively, individual anode or cathode layers.

[0016] The rotation angle of the first and / or second layer diverter is, for example, approximately 180°. However, it can also be smaller (e.g., 90°) or larger (e.g., 270°). This rotation angle represents the dimension along which the layer is oscillated or diverted by the layer conveyor between the transfer point and the discharge point. The layer is diverted by using the layer diverter to pick up the layer from the conveyor, diverting it, and then discharging it onto the stack table. That is, the free upper side of the layer before being picked up by the pickup device, away from the conveyor, is the same free upper side of the layer after being placed on the stack table, but of course with an orientation diverted by the rotation angle (e.g., 180°). The rotation of the first or second layer diverter and its pickup device occurs around their respective rotation centers / axes.

[0017] In a variant of the device, the first and second layer diverters have substantially identical structures, identical functions, and / or identical dimensions. In a variant of the device, the first and second layer diverters are provided and configured to rotate each anode or cathode layer clockwise or counterclockwise using the respective first drives from its delivery point to its discharge point while avoiding the space between the first and second layer diverters. In other words, each anode or cathode layer is transported "around the outside" of the first or second layer diverter from its delivery point to its discharge point, rather than passing between the two layer diverters.

[0018] In a variant of the device, the first and second transfer points have a first center between the first or second conveyor and the first or second layer diverter, respectively, and the first or second discharge point has a second center between the first or second layer diverter and the stack table, respectively. In a variant of the device, these respective first and second centers are on a line that substantially intersects the respective center of rotation of the first or second conveyor.

[0019] In a variant of the apparatus, the stacking table has trays for the individual anode and cathode layers. In a variant of the apparatus, the stacking table has a single-axis or multi-axis steering device that is provided and configured to move the trays along or about their respective axes to direct them to the first or second discharge locations. This allows for accurate stacking of the layers on the trays, thereby enabling reliable production without significant losses of defective electrode stacks.

[0020] In a variation of the apparatus, the stack table has at least one first and at least one second clamp finger that are provided and configured to alternately or simultaneously engage and disengage the top anode and cathode layers, respectively, and / or press the top anode and cathode layers, respectively, onto the electrode stack on the tray. In a variation, the tray / stack table is rotatable together with the clamp fingers about the z-axis (vertical axis). In a variation, the tray / stack table is positionable together with the clamp fingers in the x-direction and / or y-direction.

[0021] In a variation of the apparatus, first and second layer diverters are provided and configured to pick up and hold individual anode layers and individual cathode layers while diverting them to the first or second discharge locations by controlled negative air pressure.

[0022] Additionally or alternatively, controlled overpressure air may be used to discharge individual anode layers and individual cathode layers at first or second discharge locations, thereby stacking the layers on trays.

[0023] In a variant of the device, the first and second layer diverters each have a rotatable overpressure / underpressure distributor, which is provided and configured to supply controlled underpressure air and / or overpressure air to the pick-up device. In a variant of the device, the first and second layer diverters are provided and configured to divert only one of the anode layers or only one of the cathode layers to the first or second discharge location.

[0024] In a variant of the device, each handling device is provided and configured as follows: when stacking individual anode layers and individual cathode layers, the tray is lowered by a distance section which substantially corresponds to the thickness of the individual anode layers or individual cathode layers.

[0025] In a variant of the device, the first drive is configured as a rotary drive, which is provided and designed for deflecting the pick-up devices of the layer deflectors. In a variant of the device, the second drive has a rotary drive with an eccentric shaft drivingly connected to the pick-up devices, by means of which the pick-up devices of the respective layer deflectors can be retracted and / or advanced radially. Alternatively, the second drive has a linear drive, which is drivingly connected to one of the pick-up devices, by means of which the pick-up devices of the respective layer deflectors can be retracted and / or advanced radially.

[0026] A method for forming a fuel cell or battery cell module or a module precursor, particularly including layer materials, formed by, for example, the apparatus described above, may comprise the steps, for example in the following order: transferring individual anode layers to a first transfer location for transfer to a first layer diverter; transferring individual cathode layers to a second transfer location for transfer to a second layer diverter; and picking up, at the first or second transfer location, respectively, the individual anode or cathode layers, respectively, using the appropriate pick-up device of the first or second layer diverter, respectively. the picked-up individual anode layer or cathode layer is diverted by the respective rotational angle to the first or second discharge location, respectively; the stack table is moved in both directions between the first and second discharge locations using a drive; when the stack table is at the first or second discharge location, the individual anode layer or cathode layer is discharged to the stack table at the first or second discharge location, respectively; and the pickup device of the first and / or second layer diverter is pulled back radially when it approaches the pickup device of the other layer diverter.

[0027] This proximity of the pickup device of one layer deflector to the pickup device of the other layer deflector is important, particularly when, in the space between the two layer deflectors, the pickup device approaches the pickup device of another layer deflector on its way from its discharge point to its transfer point or from its transfer point to its discharge point.

[0028] A first variant of an inspection device for layer material, particularly for forming fuel or battery cells, includes a first layer conveyor and a first drive, which is provided and configured to pick up individual anode or cathode layers from a first transfer location using at least one pickup device and move them to a first discharge location. In this variant, the first layer conveyor is provided and configured to eject, at the first discharge location, each individual anode or cathode layer from the pickup device to the first discharge location when the at least one pickup device is located at the first discharge location. In this variant, at least one drive is provided to align the pickup device and the stack table relative to each other in accordance with signals based on processing of the first and / or second image captures. In this variation, a first image sensor is provided and configured to be directed toward a first region of the first layer conveyor between the first transfer point and the first discharge point and to perform a first image capture when at least one pickup device of the first layer conveyor passes the first image sensor. In this variation, alternatively or additionally, a second image sensor is provided and configured to be directed toward a second region of the first layer conveyor between the first transfer point and the first discharge point and to perform a second image capture when at least one pickup device of the first layer conveyor passes the second image sensor. In this variation, a stack table is provided and configured to receive each individual anode layer or cathode layer at the first discharge point to form a layer stack.

[0029] In a variant, the first layer conveyor has a layer diverter, which is provided and configured to pick up each individual anode layer or cathode layer from the first transfer point using at least one pick-up device and rotate it by a respective rotation angle to the first discharge point.

[0030] In a variant, the first layer conveyor has a layer gripper that is provided and configured to pick up each individual anode or cathode layer from the first transfer point using a pick-up device, for example in the form of a suction tool or a gripping tool, and move it to the first discharge point.

[0031] In a variant, a second layer conveyor is provided and configured to pick up individual cathode or anode layers and move them to a second discharge location. In a variant, a first image sensor is directed toward a first region of the second layer conveyor between the second transfer location and the second discharge location, and is provided and configured to take a first image capture as the second layer conveyor passes the first image sensor. Alternatively, or in addition, in a variant, a second image sensor is directed toward a second region of the second layer conveyor between the second transfer location and the second discharge location, and is provided and configured to take a second image capture as the second layer conveyor passes the second image sensor.

[0032] In a variant, the second layer conveyor has a layer diverter that is provided and configured to pick up at least each individual anode layer or cathode layer from the second transfer point using at least one pick-up device and rotate it by a respective rotation angle to the second discharge point.

[0033] In a variant, the second layer conveyor has a layer gripper that is provided and configured to pick up each individual anode or cathode layer from the second transfer point using a pick-up device, for example in the form of a suction tool or a gripping tool, and move it to the second discharge point.

[0034] In a variant, a drive is associated with the stack table, the drive being provided and configured to move the stack table in both directions between the first and second discharge locations. In a variant, the first and second layer conveyors are provided and configured, respectively, to discharge individual anode or cathode layers to the stack table at the first or second discharge location. In a variant, at least one drive is provided for orienting the respective layer conveyor and / or the respective at least one layer diverter and / or layer gripper relative to the stack table in accordance with signals based on processing of the first and / or second image captures in the control. This drive can be formed as an additional drive in the Y direction and / or as a rotation drive about the z-axis in the θ direction for the trays.

[0035] In a variant, the first and second regions of the at least one pickup device of the layer diverter are corner regions diagonally positioned at each other of the at least one pickup device of the layer diverter. In a variant, the first and second corner regions of the at least one pickup device of the layer diverter are provided and configured to pick up a first corner or a second corner of each anode layer or cathode layer. In a variant, the first and / or second image sensor, between the transfer point and the release point, is oriented toward the first or second corner region of the pickup device at an angle of about 30° to about 150°, or about 60° to about 120°, or about 80° to about 100°, or about 90° with respect to the surface of the pickup device in the respective region at the time of first or second image capture.

[0036] In a variant, the first and / or second image sensor is adjustable along its optical axis and / or movable during operation for focusing. In a variant, a white light source associated with the first and / or second image sensor is defined and arranged to illuminate the anode layer / cathode layer for image capture by the first and / or second image sensor. In a variant, at least one optically active element is associated with each of the first and / or second image sensors; in which case this optically active element is defined and arranged as follows: to detect the position and / or orientation of the anode layer / cathode layer at one or more points or areas before, at the time of, or on the way to the emission point; and / or in which case the at least one optically active element is a lens or lens assembly, a mirror or mirror assembly, a prism or prism assembly, an optical fiber assembly, an area light, a coaxial ring light, a dark field light, or a combination thereof.

[0037] In a variant, the control unit is designed and configured to determine correction values ​​from one or more image captures from the position and / or orientation of the anode / cathode layers before they are received by the stack table, the position and / or orientation of the stack table, and / or the position and / or orientation of the individual picked-up anode / cathode layers relative to the stack table during the diverting of the anode / cathode layers to the stack table. In a variant, the control unit is designed and configured to take these correction values ​​into account in the operating commands for the layer diverter, the pickup device and / or the stack table when orienting the stack table with the transferred anode / cathode layers towards the release point. In a variant, the control unit is defined and configured to take these correction values ​​into account in the operating commands to the layer diverter, the pick-up device and / or the stack table for the alignment (orientation, attitude) and position of the stack table when receiving (accepting) the anode / cathode layer, so that the stack table receives the respective anode / cathode layer in a central zero position and / or oriented in alignment with the electrode stack at the ejection point. In a variant, the control unit is designed and configured to determine the alignment and position of the stack table when and / or before receiving the anode / cathode layer, just before the ejection point, by ascertaining the position of the arriving anode / cathode layer in the image capture.

[0038] In a variant, the pickup device is movable radially relative to its axis of rotation, and the first image sensor and / or the second image sensor are arranged to capture the first or second image when the pickup device moves radially outward or inward.

[0039] A variant of the inspection method when forming a module or a precursor of a module includes the following steps: picking up the anode layer / cathode layer from a transfer point; moving the anode layer / cathode layer from the transfer point to a discharge point; detecting the position and / or orientation of the anode layer / cathode layer in the layer diverter using a first image sensor between the transfer point and the discharge point, wherein the first image sensor is directed toward a first region of the layer diverter and is provided and configured to capture a first image when the anode layer / cathode layer in the layer diverter passes the first image sensor.

[0040] In a variant of the inspection method, the position and / or orientation of the anode layer / cathode layer at the layer diverter is detected between the transfer point and the discharge point by a second image sensor, the second image sensor being directed toward a second region of the layer diverter and being provided and configured to capture a second image when at least one pickup device of the layer diverter passes the second image sensor. In a variant of the inspection method, the pickup device and the stack table are oriented relative to each other according to signals resulting from processing of the first and / or second image captures. In a variant of the inspection method, when at least one pickup device is respectively at the discharge point, each individual anode layer or cathode layer is discharged from the at least one pickup device respectively onto the stack table at the discharge point to form a layer stack.

[0041] In a variant of the inspection method, the first and / or second image sensors detect the position and / or orientation of the anode layer / cathode layer in the x, y, z and / or θ directions in a vertical top view of ±approximately 25° (relative to the plane of the cathode layer / anode layer) when at least one pickup device of the layer diverter passes the respective image sensor. In a variant of the inspection method, a light source associated with the first and / or second image sensor illuminates the anode layer / cathode layer for image capture by the first and / or second image sensor. In a variant of the inspection method, the first and / or second image sensor completely detects the anode layer / cathode layer by image capture, thereby detecting the position and / or orientation in the x, y, z and / or θ directions. In a variant of the inspection method, the first and / or second image sensor detects, by a single image capture, one area of ​​the anode / cathode layer, at least one corner area, two diagonally opposite corner areas and / or at least one corner area and at least one section of the edge, respectively, relative to a fixed image sensor zero point, thereby detecting the position and / or orientation of the anode / cathode layer in the x, y, z and / or θ directions. In a variant of the inspection method, the first and / or second image sensor is formed as a matrix sensor or as a line sensor, which detects the position and / or orientation of the anode / cathode layer in the x, y, z and / or θ directions before or at the time of arrival at the emission point or on the way to the emission point.

[0042] In a variant of the inspection method, correction values ​​are determined from the position and / or orientation in the x, y, z, and / or θ direction of the anode layer / cathode layer after it has been picked up by at least one pick-up device of the layer diverter, the position and / or orientation in the x, y, z, and / or θ direction of the stack table, and / or the position and / or orientation in the x, y, z, and / or θ direction of each picked-up anode / cathode layer during the diverting of the anode / cathode layer to the stack table. In a variant of the inspection method, these correction values ​​are taken into account when orienting the pick-up device of the layer diverter in the x, y, z, and / or θ direction with respect to the stack table at the release point together with the transferred anode / cathode layer. In a variant of the inspection method, these correction values ​​are taken into account when orienting the pick-up device of the layer diverter in the x, y, z, and / or θ direction so that the anode / cathode layer is received by the stack table in a central zero position and / or aligned.

[0043] The proposed first type of inspection using the first and second image sensors (cameras) when forming a cell ensures that the electrode layers are stacked as accurately as possible using the first and second image sensors, thus ensuring the highest possible efficiency of the resulting fuel or battery cell. The more inaccurate the stacking of the electrode layers, the lower the efficiency. The proposed inspection detects the exact position of the electrode layers (during turning and therefore just before stacking). From this position, the degree of correction for the relative position between the stack table and the pick-up device of the layer turner is determined and applied. The accuracy of the placement of the individual electrode layers on the growing stack is ensured to be as precise as possible. This approach avoids defective products and ensures a higher efficiency of the resulting fuel or battery cell.

[0044] In a variant, the first and second corner regions of the tested electrode or layer diverter are different. In a variant, a stack table is provided and configured to receive the respective individual anode or cathode layers at the first emission location to form the layer stack.

[0045] In a variant, the first corner area and the second corner area of ​​the first layer diverter are areas of the first layer diverter that are diagonally opposite each other. In a variant, the first corner area and the second corner area are two (approximately equal) surface areas of at least one pickup device of the first layer diverter, if this pickup device is on its way between the first transfer point and the first release point.

[0046] In a variant, the first and second corner areas of at least one pick-up device of the first layer conveyor are provided and configured to pick up the first or second corner of each anode or cathode layer.

[0047] In a variant, the first and / or second image sensor is oriented at an angle of about 25° to about 150°, or about 60° to about 120°, or about 80° to about 100°, or about 90° (relative to the plane of the anode layer / cathode layer or the first / second pickup device) toward the first or second corner region of the first / second layer conveyor at the time of the first and / or second image capture between the first / second transfer point and the first / second discharge point.

[0048] In a variant of the inspection, the first and / or second camera detects its position and / or orientation (with respect to the plane of the anode / cathode layer or the first / second pickup device) on its pickup device at a vertical top surface of the anode / cathode layer of ± about 25° to ± about 30° when the respective pickup device passes the respective image sensor. In a variant of the inspection, the first and / or second image sensor is adjustable along its optical axis for focusing and / or is movable during operation.

[0049] In an inspection variant, a white light source associated with the first and / or second image sensor illuminates the anode / cathode layer for image capture by the first or second image sensor. In an inspection variant, the first and / or second camera completely detects the anode / cathode layer by (only) image capture, thereby determining its position and / or orientation.

[0050] In a variant of the inspection method, to detect the position and / or orientation of the anode layer / cathode layer, the first and / or second camera detects, by a single image capture, one region of the anode layer / cathode layer, at least one corner region, two corner regions diagonally opposite each other, and / or at least one section of the at least one corner region and its edge.

[0051] In an inspection variant, the first and / or second camera is formed as a matrix camera or as a line camera and detects the position and / or orientation of the anode layer / cathode layer while they are being turned onto the stack table.

[0052] In a variant of the test, correction values ​​are determined from the position and / or orientation of the anode / cathode layers on the pick-up device during the transfer of the anode / cathode layers to the release point on the stack table, and these correction values ​​are taken into account when orienting the stack table relative to the pick-up device with the transferred anode / cathode layers at the release point in the variant of the test.

[0053] In a variant of the test, these correction values ​​are taken into account when orienting the stack table to receive the anode layer / cathode layer by the stack table, so that the anode layer / cathode layer is received by the stack table in a central zero position and / or in a consistent orientation.

[0054] In a variant, during testing, the calculated correction values ​​can be used to position the stacking device relative to the anode layer / cathode layer before / when it is placed on the stacking table so that the anode layer / cathode layer is received by the stacking table in a zero position. To this end, the stacking table can be corrected in its position and / or orientation relative to the anode layer / cathode layer / relative to the layer conveyor at the discharge point. Similarly, after loading, the stacking table can be positioned during transport according to the correction values ​​based on image capture, so that the anode layer / cathode layer can be properly placed on the electrode stack there at the discharge point with minimal or no further correction movements. This can be done very quickly and with high precision. For example, the following device is suitable for testing.

[0055] In an inspection variation, a (white) light source associated with one or more cameras is designed and configured to illuminate the anode / cathode layers for image capture by the respective cameras.

[0056] In an inspection variant, one or all of the cameras are preceded by an optically active element that is designed and configured to detect the position and / or orientation of the anode / cathode layer in one or more locations or areas before it is picked up by the pick-up device, or when it arrives at the emission point, or on its way to the emission point. In a variant of the device, the at least one optically active element is a lens or lens assembly, a mirror or mirror assembly, a prism or prism assembly, an optical fiber assembly, area illumination, coaxial link illumination, dark field illumination, etc., or a combination thereof. In an inspection variant, the control unit is designed and configured to determine correction values ​​from image capture, data from the detection device and / or the first and / or second camera, the position and / or orientation of the cathode layer / anode layer before it is received by the stack table, the position and / or orientation of the stack table, and / or the position and / or orientation of the individual accommodated anode layer / cathode layer relative to the stack table during the transfer of the anode layer / cathode layer to the stack table.

[0057] In a test variant, the control device is designed and configured to take these correction values ​​into account in the operating instructions for the layer diverter and / or the pick-up device and / or the stack table when orienting the stack table with the transferred anode / cathode layers towards the discharge point. In a test variant, the control unit is designed and configured to take these correction values ​​into account in the operating instructions for the orientation and location of the stack table when receiving the anode / cathode layers so that the stack table receives (receives) the respective anode / cathode layers in a central zero position and / or oriented in alignment with the electrode stack at the discharge point.

[0058] By determining the position of the arriving anode / cathode layer just before the release point, the alignment and position of the stack table when or before receiving the anode / cathode layer is precisely determined, thereby enabling a precisely determined and corrected receiving of the anode / cathode layer by the stack table to form a stack of electrode layers that is precisely aligned in height extension and angular position about the vertical axis.

[0059] In a second variant, an inspection device for layer material, in particular for forming fuel cells or battery cells, has a first layer conveyor having at least one pickup device and a first drive, and is provided and configured to pick up each individual anode layer or cathode layer from a first transfer location using the at least one pickup device and move it to a first discharge location. In a variant, a stack table is provided and configured to receive each individual anode layer or cathode layer from the pickup device at the first discharge location and form a layer stack. In a variant, the first layer conveyor is provided and configured to discharge each individual anode layer or cathode layer from the pickup device to the stack table at the first discharge location when the pickup device is at the first discharge location. In a variant, a third image sensor is provided and configured to be directed toward a region in a side view of the layer stack that includes the top edge of the layer stack resting on the stack table, the region having the connection tab of the topmost anode or cathode layer of the layer stack, and the third image sensor is provided and configured to perform a third image capture before or after the anode or cathode layer is placed on the stack table. In a variant, a control is provided and configured to indicate the (un)usability of the layer stack according to a signal based on processing of the third image capture. Subsequent removal of the stack can be (automatically) performed.

[0060] In a variant, the layer conveyor has a layer diverter that is provided and configured as follows: to pick up each individual anode or cathode layer from the first transfer point using at least one pick-up device and rotate it by a respective rotation angle to the first discharge point.

[0061] In another variant, the layer conveyor has a layer gripper that is provided and configured to pick up each individual anode or cathode layer from a first transfer point and move it to a first discharge point using a pick-up device, for example in the form of a suction tool or a gripping tool.

[0062] In another variation, the inspection apparatus includes a second layer conveyor that is provided and configured to pick up individual cathode or anode layers and move them to a second discharge location. In another variation, a drive is associated with the stack table that is provided and configured to move the stack table in both directions between the first and second discharge locations. In another variation, the first and second layer conveyors are provided and configured to discharge individual anode or cathode layers, respectively, to the stack table at the first or second discharge location. In another variation, at least one drive is provided to orient the respective layer conveyor and / or at least one layer diverter or layer gripper relative to the stack table in accordance with signals based on processing of the first and / or second image captures in the control.

[0063] In a variant, the second layer conveyor has a layer diverter, which is provided and configured to pick up each individual anode layer or cathode layer from the second transfer point using at least one pick-up device and rotate it by a respective rotation angle to the second discharge point.

[0064] In a variant, the second layer conveyor has a layer gripper, which is provided and configured to pick up each individual anode or cathode layer from the second transfer point using a pick-up device, for example in the form of a suction tool or a gripping tool, and move it to the second discharge point.

[0065] In a variant, the first and second third regions of the layer stack each have a connection tab for the top anode layer or cathode layer on the stack table at the first or second emission location, respectively. In a variant, one or two third image sensors are arranged on a first side of the inspection device and one or two third image sensors are arranged on a second side of the inspection device. In a variant, the one or more third image sensors are arranged in a fixed position with respect to the movable stack table. In a variant, the one or more third image sensors are coupled to the stack table so that they can move together with the stack table.

[0066] In a variation of the inspection apparatus, the at least one third image sensor is adjustable along its optical axis for focusing and / or movable during operation. In a variation, a light source associated with the third image sensor is designed and configured to illuminate the anode layer / cathode layer for image capture by the third image sensor. In a variation, at least one optically active element is associated with the at least one third image sensor. In a variation, the optically active element is designed and configured to enable recognition of a connection tab of the uppermost anode layer or cathode layer of the layer stack after the anode layer or cathode layer is placed on the layer stack. In a variation, the at least one optically active element is a lens or lens assembly, a mirror or mirror assembly, a prism or prism assembly, an optical fiber assembly, area illumination, coaxial ring illumination, dark field illumination, transmitted light illumination, or a combination thereof.

[0067] In the case of transmitted light illumination, the light is directed against the line of sight of the image sensor, in which case the light does not pass through the material of the connection tabs, as is the case for example with semiconductor chips with IR light.

[0068] In a variation of the inspection apparatus, the transmitted light illumination is positioned across the location of the connection tab on the stack table, opposite the third image sensor, and is arranged to bring the connection tab into the light path. Processing of the third image capture is then used to identify lifted connection tabs in the image capture where the top edge of the connection tab is not substantially horizontal (<±10° relative to the horizontal axis, or relative to the optical axis of the third image sensor, respectively) or is oriented flush with the electrode, and / or results in a noise contour.

[0069] In a variant of the inspection device, a coaxial ring light is positioned in front of the position of the connection tab on the stack table, on the side of the third image sensor, and is arranged to bring the connection tab into the optical path so that processing of the third image capture is used to recognize any lifting of the connection tab in the image capture where the top edge of the connection tab is not horizontal (<±10° relative to the horizontal axis or, respectively, relative to the optical axis of the third image sensor) or is positioned flush with the electrode and / or results in a noise contour.

[0070] A second inspection method for forming a module or a precursor of a module includes the following steps: picking up an anode layer / cathode layer at a first transfer location and moving the anode layer or cathode layer from the first transfer location to a first discharge location; discharging each individual anode layer or cathode layer onto a stack table at the discharge location to form a layer stack; directing a third image sensor toward an area including the top edge of the layer stack on the stack table in a side view, where the area has a layer flag of the anode layer or cathode layer that is at the top of the layer stack; and where, after the anode layer or cathode layer is placed on the stack table, a third image is captured by the third image sensor; and indicating the (un)usability of the layer stack according to a signal based on processing the third image capture.

[0071] In a variant, the inspection method further comprises the steps of: adjusting at least one third image sensor along its optical axis to focus and / or moving the at least one third image sensor along its optical axis during movement to focus; and / or illuminating the anode layer / cathode layer by a light source associated with the at least one third image sensor for third image capture by the at least one third image sensor; and / or associating at least one optically active element with the at least one third image sensor, wherein the optically active element is designed and configured as follows: after the anode layer or cathode layer is placed on the layer stack, the connection tab of the anode layer or cathode layer that is at the top of the layer stack in side view is recognizable in the third image capture; and / or wherein the at least one optically active element is a lens or lens assembly, a mirror or mirror assembly, a prism or prism assembly, an optical fiber assembly, area illumination, coaxial ring illumination, dark field illumination, transmitted light illumination or a combination thereof.

[0072] In a variant, the inspection method further includes the following steps: positioning a transmitted light illuminator opposite at least one third image sensor, across from the position of the connection tab on the stack table, and further aligning the at least one third image sensor so that the connection tab is within its optical path; and using processing of the third image capture to recognize lifting of the connection tab due to the top edge of the connection tab not being oriented horizontally (<±10° relative to the horizontal or to the optical axis of each third image sensor) or being oriented flat with the electrode and / or resulting in a noise contour.

[0073] In a variant, the inspection method further includes the following steps: positioning a coaxial ring light on the side of at least one third image sensor, in front of the position of the connection tab on the stack table, and further arranging at least one third image sensor so that the connection tab is in the light path; processing the third image capture to recognize lifting of the connection tab by detecting in the third image capture that the top edge of the connection tab is not horizontal (<±10° relative to the horizontal axis or the optical axis of the respective third image sensor) or is oriented flat with the electrode and / or results in a noise contour.

[0074] Another, second inspection proposed here when forming cells, by means of at least one third image sensor (camera), also controls the orientation of the connection tabs of the top electrode layer as planar as possible relative to one or more connection tabs below it.

[0075] This additional inspection can be performed instead of or in addition to the first inspection. This avoids potential defects or efficiency losses in the finished fuel or battery cells. When stacking electrode layers, their connection tabs can rise, curl, or bend upward, creating a risk of bending the connection tabs even when stacking the next electrode layer of the same polarity. If the connection tabs are not fully overlapped and bonded, the efficiency of the fuel or battery cell decreases. If the connection tabs bend over the separator foil and come into contact with the counter electrode layer, a short circuit of the cell can result. The proposed inspection determines the exact orientation of the connection tabs of each electrode layer immediately after stacking. From this position, the degree of correction for the relative position between the stack table and the layer deflector pickup device is determined and applied. This means that the accuracy of placing each electrode layer on the stack to be built is as accurate as possible with respect to the electrode stack already on the stack table. This minimizes the risk of defective products and achieves higher efficiency.

[0076] Another, third inspection of cell manufacturing includes steps, for example in the following order: preparing individualized anode layers / cathode layers; transporting the anode layers / cathode layers to the discharge location; stacking the transported anode layers / cathode layers on a stack table; detecting the electrode stack that is increased by the stacked anode layers / cathode layers at the discharge location in at least one side view of a corner and / or vertical edge of the electrode stack at the discharge location; and verifying the orientation and / or position of one or each stacked anode layer / cathode layer relative to the remaining electrode stack that is increased at the discharge location.

[0077] This is achieved in a third variant by an inspection device for layer materials, in particular for forming fuel cells or battery cells, in which: a first layer conveyor is provided and configured to pick up and move each individual anode layer or cathode layer to a first discharge location; a stack table is provided and configured to receive each individual anode layer or cathode layer at the first discharge location and form a layer stack; the first layer conveyor is provided and configured to discharge each individual anode layer or cathode layer at the first discharge location to the stack table; and a fourth image sensor is directed towards a fourth region of the layer stack consisting of the anode layer and the cathode layer in a planar side view of the layer stack, and after the anode layer or cathode layer has been placed on the layer stack on the stack table, a fifth image sensor is provided and configured for image capture, wherein the fourth region comprises a corner of the uppermost anode or cathode layer of the layer stack and / or a vertical edge of the layer stack; and / or a fifth image sensor is provided and configured, directed toward the fifth region of the layer stack consisting of the anode and cathode layers in a planar side view of the layer stack, and for image capture after the anode or cathode layer has been placed on the layer stack on the stack table, wherein the fifth region comprises a corner of the uppermost anode or cathode layer of the layer stack and / or a vertical edge of the layer stack; and the fourth or fifth region of the anode or cathode layer are adjacent to each other in the layer plane or comprise diagonal regions of the layer stack consisting of the anode and cathode layers in the respective side view of the layer stack. The inspection device can be arranged to indicate the (un)usability of the layer stack according to a signal based on processing of the image capture of the fourth or fifth image sensor.

[0078] In a variant, the fourth and fifth regions are different regions of the layer stack on the stack table.

[0079] In a variant, the layer conveyor has a layer diverter which is provided and configured as follows: to pick up each individual anode layer or cathode layer from the first transfer point using at least one pick-up device and rotate it by a respective rotation angle to the first discharge point.

[0080] In a variant, the layer conveyor has a layer gripper that is provided and configured to pick up each individual anode or cathode layer from a first transfer point using a pick-up device, for example in the form of a suction tool or a gripping tool, and move it to a first discharge point.

[0081] In a variant, the fourth and / or fifth image sensor is adjustable along its optical axis for focusing and / or movable during operation. In a variant, a light source associated with the fourth and / or fifth image sensor, respectively, is designed and configured to illuminate the anode / cathode layer for the fourth or fifth image capture by the fourth or fifth image sensor. In a variant, at least one optically active element is associated with the fourth or fifth image sensor. In a variant, the optically active element is designed and configured such that, after the anode or cathode layer has been placed on the layer stack, the corners of the uppermost anode or cathode layer of the layer stack and / or the vertical edges of the layer stack are recognizable in the fourth or fifth image capture. In a variant, the at least one optically active element is a lens or lens assembly, a mirror or mirror assembly, a prism or prism assembly, an optical fiber assembly, area illumination, coaxial ring illumination, dark field illumination, transmitted light illumination, or a combination thereof.

[0082] In a variant, the transmitted light illumination is positioned opposite the fourth or fifth image sensor, beyond the position of the corners of the uppermost anode or cathode layer of the layer stack and / or the vertical edges of the layer stack, and is arranged to bring the corners and / or vertical edges into the light path. In a variant, processing of the fourth or fifth image capture is used to recognize lifting, displacement or rotation of the anode or cathode layer by the corners and / or vertical edges of the uppermost anode or cathode layer introducing noise contours in the image capture.

[0083] In a variant, a coaxial ring illumination is arranged on the side of the fourth or fifth image sensor in front of the corners of the uppermost anode or cathode layer of the layer stack and / or the vertical edges of the layer stack, and is arranged to bring the corners and / or vertical edges into the light path. In a variant, processing of the fourth or fifth image capture is used to recognize lifting, displacement and / or rotation of the anode or cathode layer, as the corners and / or vertical edges will cause noise contours in the image capture.

[0084] In a variant, the first fourth and first fifth regions of the layer stack each have a substantially horizontally oriented first edge corner of the uppermost anode or cathode layer of the layer stack and / or a vertical edge of the layer stack on the stack table, and / or the second fourth and second fifth regions of the layer stack each have a second edge corner of the uppermost anode or cathode layer of the layer stack and / or a vertical edge of the layer stack on the stack table. In a variant, the one or more fourth or fifth image sensors are arranged in a fixed position relative to the movable stack table. In a variant, the one or more fourth or fifth image sensors are coupled to the stack table and thereby can move therewith.

[0085] In a variant, a third inspection method for forming a module or a precursor of a module comprises the following steps: picking up an anode layer / cathode layer from a transfer point using at least one pick-up device; when the at least one pick-up device is at a discharge point, each individual anode layer or cathode layer is discharged by the at least one pick-up device at the discharge point onto a stack table to form a layer stack; directing a fourth image sensor toward a fourth region of the layer stack consisting of an anode layer and a cathode layer in a planar side view of the layer stack, the fourth region including a corner of the top anode layer or cathode layer of the layer stack and / or a vertical edge of the layer stack; and detecting whether the anode layer or cathode layer is in contact with the layer stack on the stack table. and / or directing a fifth image sensor toward a fifth region of the layer stack consisting of the anode layer and the cathode layer in a side view of the layer stack, wherein the fifth region comprises a corner of the uppermost anode layer or cathode layer of the layer stack and / or a vertical edge of the layer stack; and / or performing a fifth image capture after the anode layer or cathode layer is placed on the layer stack on the stack table; and / or wherein the fourth region or fifth region of the anode layer or cathode layer are adjacent in the layer plane or comprise regions of the layer stack consisting of the anode layer and the cathode layer that are diagonally opposite each other in the respective side view of the layer stack; and indicating the usability of the layer stack according to a signal based on processing the fourth or fifth image capture.

[0086] In a variant, the inspection method comprises the following steps: adjusting the fourth or fifth image sensor along its optical axis to focus and / or moving the respective image sensor along its optical axis to focus during operation. In a variant, for the fourth or fifth image capture by the respective image sensor, illumination of the fourth or fifth area is performed using a light source associated with the fourth or fifth image sensor. In a variant, after the anode layer or cathode layer is placed on the layer stack, at least one optically active element is associated with the fourth or fifth image sensor to make the corners of the uppermost anode or cathode layer of the layer stack and / or the vertical edges of the layer stack recognizable in the fourth or fifth image capture. In a variant, the at least one optically active element is a lens or lens assembly, a mirror or mirror assembly, a prism or prism assembly, an optical fiber assembly, area illumination, coaxial ring illumination, dark field illumination, transmitted light illumination, or a combination thereof.

[0087] In a variant, the inspection method comprises the steps of: positioning a transmitted light illuminator opposite the fourth or fifth image sensor, beyond the position of a corner of the uppermost anode or cathode layer of the layer stack and / or a vertical edge of the layer stack on the stack table, and aligning the transmitted light illuminator to bring the corner and / or vertical edge of the layer stack into its optical path. In a variant, processing of the fourth or fifth image capture is used to recognize at least partial lifting, displacement and / or rotation of the uppermost anode or cathode layer of the layer stack, with the uppermost corner and / or vertical edge providing a noise contour.

[0088] In a variant, the inspection method comprises the steps of: arranging a coaxial ring illumination near a fourth or fifth image sensor, in front of a corner of the uppermost anode or cathode layer of the layer stack and / or a vertical edge of the layer stack on the stack table, and further arranging the transmitted light illumination so that the corner and / or vertical edge of the layer stack is in the light path; in a variant, processing the fourth or fifth image capture is used to recognize at least a partial lift, displacement or rotation of the uppermost anode or cathode layer of the layer stack, by which the uppermost corner and / or vertical edge introduces a noise contour. In a variant, the one or more fourth or fifth image sensors are oriented at an angle of about ±5° to about ±25°, for example ±13°, relative to a longitudinal or lateral edge of the uppermost anode or cathode layer of the layer stack.

[0089] In a variant, the inspection method for forming a module or a precursor of a module comprises the following steps: picking up an anode layer / cathode layer from a second delivery location using at least one second pickup device of a second layer diverter; when each second pickup device is at a discharge location, ejecting each individual anode layer or cathode layer from each at least one pickup device onto a stack table at the second discharge location to form a layer stack; directing a fourth image sensor toward a fourth region of the layer stack consisting of an anode layer and a cathode layer in a planar side view of the layer stack, wherein the fourth region includes a corner of the uppermost anode layer or cathode layer of the layer stack and / or a vertical edge of the layer stack; and After the anode layer or cathode layer is placed on the stack, a fourth image capture is performed; and / or a fifth image sensor is directed toward a fifth region of the layer stack consisting of an anode layer and a cathode layer in a planar side view of the layer stack, wherein the fifth region has a corner of the uppermost anode layer or cathode layer of the layer stack and / or a vertical edge (HK) of the layer stack; and after the anode layer or cathode layer is placed on the layer stack on the stack table, a fifth image capture is performed; and / or wherein the fourth or fifth region of the anode layer or cathode layer are adjacent in the layer plane or have regions of the layer stack consisting of an anode layer and a cathode layer that are diagonally opposite each other in the respective side view of the layer stack; and indicates the (un)usability of the layer stack according to a signal based on processing the fourth or fifth image capture.

[0090] This other, third test may be performed instead of or in addition to the first and / or second test.

[0091] This approach makes it possible to accurately determine the position of the top layer relative to the remaining layers of the electrode stack. This test becomes more important as the height of the electrode stack increases, since an error in the placement of the top layer, if not corrected, would require the electrode stack to be discarded. In this case, the control becomes more accurate as the height of the electrode stack increases, since the geometric area to be measured (corners or vertical edges of the electrode stack) can be detected and evaluated more easily and accurately.

[0092] In the third test variant, this also allows for more accurate correction values ​​to be calculated when placing the next layer on the electrode stack. Overall, this approach with accurate position testing allows for a significant reduction in the risk of short circuits, for example in fuel cells or battery cells.

[0093] This is also evident in the fact that while conventional solutions place layers with an accuracy of about ±0.5 mm, the solution proposed here allows for an accuracy of ±0.1 mm and better when placing anode / cathode layers on the electrode stack, reducing rejects and improving efficiency.

[0094] In a variant of the method, four matrix cameras are used, which are directed (side-view) at all four corners / (vertical) edges of the electrode stack at the emission point. In a variant of the method, the respective light sources are used to provide incident light illumination, backlight or dark field illumination, thereby allowing for a good recognition of the important areas of the various anode / cathode layers. In a variant of the method, the optical path of the third camera is guided by mirrors or prisms to suit the spatial conditions.

[0095] In variants of the method, one matrix camera (with a field of view towards the electrode stack from the side and detecting the electrode stack as a whole in one image capture), two matrix cameras (each detecting one of the two corners of the electrode stack from the side) to four matrix cameras (detecting all four corners of the electrode stack from above and directed towards the electrode stack at the emission point in a side view) are used. Again, in variants, the optical paths of the cameras are guided to suit the spatial conditions by appropriately positioning mirror assemblies, prisms, etc. For illumination, in variants, coaxial (red) illumination and / or (white) spotlights are used for each of the cameras.

[0096] This ensures with great precision that the anode / cathode layers are always placed on the electrode stack in the correct place and with the correct orientation.

[0097] In a variant of the method, before starting to place the anode / cathode layers to form the electrode stack, the x, y positions of the workpiece support at various z-heights are detected by a camera, thereby taking into account the movement and inaccuracy along the vertical axis (z-axis) of the lifting device with each workpiece support. That is, while the anode / cathode layers are being placed, the camera can check whether the anode / cathode layers are stacked at the correct x, y positions corresponding to the respective z positions of the workpiece support on the lifting device. This allows the rotational accuracy around the vertical axis (θ direction) when the anode / cathode layers are accommodated by the stacking device to be corrected so that the anode / cathode layers of the electrode stack are later stacked correctly.

[0098] In a variant of the device, the control unit is designed and configured to: after placing the anode / cathode layers on the electrode stack, the position, rotation and / or displacement of the individual anode / cathode layers relative to one another is examined to determine the position of the emitted anode / cathode layer relative to the remaining layers of the electrode stack, and in which case the control unit is designed and configured to: determine the displacement of the individual anode / cathode layers relative to one another by image capture by a third camera from at least one of at least one (vertical and / or lateral) edge of the electrode stack. In a variant of the device, the control unit is designed and configured to: examine the image capture obtained by the corner / edge search as to whether one or more of the anode / cathode layers of the electrode stack are above or below the remaining anode / cathode layers and / or whether precision in stacking the anode / cathode layers has been maintained.

[0099] In a variant of the device, the control unit is designed and configured to examine the shape and / or dimensions of the stacked anode and cathode layers from image captures of the alternating anode and cathode layers of the electrode stack to determine various dimensions that have stepped (vertical) edges in the z direction in side view. In a variant of the device, the control unit is designed and configured to examine the stacked anode and cathode layers to determine how each individual layer is above or below the rest of the anode or cathode layers of the electrode stack. In a variant of the device, the control unit is designed and configured to examine image captures to determine how the various anode / cathode layers are offset in the z direction (vertical axis) to form steps in the electrode stack.

[0100] In a variant of the device, the control unit is designed and configured to receive image captures from at least two third cameras, including the corners of the electrode stack at the points of lateral emission and / or its edges in the vertical axis (z-axis), and to determine, for anode and cathode layers stacked on top of each other, how each individual layer is above / below the remaining anode or cathode layers of the electrode stack in the longitudinal and / or transverse direction of the layer, in the x-direction or y-direction (horizontal, vertical) and / or how various anode / cathode layers within the electrode stack are offset in the z-direction (vertical axis) to form steps in the electrode stack.

[0101] In a variant of the device, at least two cameras are aimed at the (vertical) edges of the electrode stack and / or a (white) spotlight illuminates a desired position on the electrode stack to illuminate each edge of the electrode stack.

[0102] In a variant of the device, the control unit is designed and configured to receive image captures from at least four cameras, including four corners of the electrode stack at the point of emission, viewed from the side, and after placing the anode / cathode layers on the electrode stack, determine the position / rotation / displacement of the individual anode / cathode layers relative to one another using the image captures from each of the four cameras, thereby determining the position of the anode / cathode layer emitted at the top of the electrode stack relative to at least one layer located below it.

[0103] In a variant of the device, the control unit detects the x, y positions of the workpiece support at various z-heights by means of image capture by a third camera before starting the deposition of the anode / cathode layers to form the electrode stack, and the corresponding data is stored in a data memory for comparison with the x, y positions of the workpiece support at various z-heights during the deposition of the anode / cathode layers, It is designed and configured to take into account the movement and inaccuracy along the vertical axis (z-axis) of the lifting device having each workpiece support, check whether the anode layer / cathode layer is stacked within the x, y position accuracy corresponding to the respective z positions of the workpiece support on the lifting device, and / or correct the orientation in the rotational direction around the z-axis (vertical axis) (θ direction) when accommodating and / or placing the anode layer / cathode layer.

[0104] The above-described method and apparatus allows for a significant reduction in the risk of short circuits in the modules thus formed, which in turn allows for an improvement in the overall quality and efficiency of the resulting fuel or battery cells.

[0105] Overall, the above described apparatus and method allows for accuracy of ±0.1 mm or better at high stack throughput.

[0106] Above, method aspects are shown as device concepts and vice versa, whereby both method and device aspects are used to describe the arrangement and its operation.

[0107] Other features, characteristics and advantages of the device and method will become apparent from the following description, which is given with the aid of the drawings. Possible variations will become apparent to those skilled in the art from the following description, in which reference is made to the accompanying drawings, in which the figures diagrammatically show the device described herein and explain its operation. In the figures, equal or similar parts do not in individual cases have individual reference signs. [Brief explanation of the drawings]

[0108] [Figure 1] FIG. 1 shows in a schematic front view an apparatus for forming a module or a precursor to a module. [Figure 2] FIG. 2 shows in a schematic side view one layer diverter of an apparatus for forming modules or precursors of modules in another variant. [Figure 3]FIG. 3 shows a side perspective view of a layer diverter with a stack table on which a layer stack rests. [Figure 4a] FIG. 4a shows a tray of the stack table with the layer stack in a top view at the first and second ejection locations, together with the image sensor arrangement for the second inspection. [Figure 4b] FIG. 4b shows a top view of the stack table tray with the layer stack at the first and second ejection locations together with the image sensor arrangement for the second inspection. [Figure 5a] FIG. 5a shows a tray of the stack table with the layer stack in a top view at the first and second ejection locations together with a third inspection image sensor configuration. [Figure 5b] FIG. 5b shows a top view of the stack table tray with the layer stack at the first and second ejection locations together with the image sensor configuration for the third inspection. [Figure 6] FIG. 6 shows the tray of the stack table with the layer stack in top view at the first and second ejection locations, together with the image sensor arrangement for the second inspection. [Figure 7] FIG. 7 shows a tray of the stack table with a layer stack in a top view at the first and second ejection locations, together with another configuration of the image sensor for the third inspection. DETAILED DESCRIPTION OF THE INVENTION

[0109] 1 shows a schematic of an apparatus 100 for forming a module or precursor to a module, where the apparatus 100 is illustrated with the formation of a fuel cell or battery cell containing layer materials and / or fluids.

[0110] In the apparatus 100, a first conveyor 110 is used to transport individual anode layers AL to a first transfer point U1 for transfer to a first layer diverter 150. A second conveyor 120 is used to transport individual cathode layers KL to a second transfer point U2 for transfer to a second layer diverter 200.

[0111] 1, the first conveyor 110 and the second conveyor 120 are arranged level, adjacent and spaced apart in the upper region of the apparatus 100. Here, the first conveyor 110 and the second conveyor 120 are configured as belt conveyors, with their respective undersides 112, 122 directed towards the first or second layer diverters 150, 200. This means that the first conveyor 110 and the second conveyor 120 can transport the individual anode layers AL or cathode layers KL at their undersides 112, 122 to the first or second transfer points U1, U2. In particular, here, the first conveyor 110 and the second conveyor 120 comprise controlled negative pressure conveyor belts with suction openings 114, 124, respectively, for picking up and holding the individual anode layers AL or the individual cathode layers KL during transport to the first or second transfer point U1, U2 using controlled negative pressure air p. ++ can be used to manage and quickly discharge the individual anode layers AL or the individual cathode layers KL at the first or second transfer point U1, U2 to the first or second layer diverter 150, 200. Alternatively, the negative pressure air p -- can be reduced or disabled at the first or second transfer point U1, U2. The first conveyor 110 can take off the individual anode layers AL from the stack or from a third conveyor (not shown), in particular a vacuum belt conveyor. The second conveyor 120 can take off the individual cathode layers KL from the stack or from a fourth conveyor (not shown), in particular a vacuum belt conveyor.

[0112] The first and second layer deflectors 150, 200 each have four substantially rectangular, flat pickup devices 156, 206 and a first drive 300 (see FIG. 2). The pickup devices 156, 206 flatly receive the individual anode layers AL or cathode layers KL from the first or second conveyor 110, 120 at the first or second transfer point U1, U2, respectively. The pickup devices 156, 206 are radially slidably supported on indirectly rotatably supported shafts 160, 210. The shafts 160, 210 rotate the respective pickup devices 156, 206 by a respective rotation angle RW—here, 180°—to the first or second discharge point A1, A2, respectively, using the first drive 300. The first drive 300 rotates the entire layer deflector 150, 200. The respective pick-up devices of the first and second layer diverters 150, 200 are therefore arranged to receive or discharge an individual anode layer AL or cathode layer KL when the pick-up devices rotate such that they pass successively or in a clocked manner through the respective transfer points U1, U2 and the respective discharge points A1, A2, and in so doing receive (receive) or discharge, respectively, an individual anode layer AL or cathode layer KL. The first and second layer diverters 150, 200 are rotated by their respective first drives 300 in a clockwise or counterclockwise direction as follows: i.e., so that an individual anode layer AL or cathode layer KL reaches its transfer point U1, U2 from its discharge point A1, A2, avoiding the space R between the first and second layer diverters 150, 200.

[0113] Obviously, the first and second layer diverters 150, 200 have substantially identical structures, identical functions and / or identical dimensions.

[0114] An endless separator belt, not shown in detail, is guided into and through the space R between the two conveyors 110, 120 from above and emerges from the gap between two rotatably supported drums at the lower end of the space R. This separator belt is folded in a Z-shape onto the stack table, and the anode and cathode layers are separated from each other by a separator.

[0115] The first and second layer deflectors 150, 200 (see Figure 1) have as second drives 350 for the pickup devices 156, 206 an arrangement consisting of linear drives 351 arranged on the pivoting rim, each of which is drivingly coupled to one of the pickup devices 156, 206, thereby enabling the pickup device of the respective layer deflector 150, 200 to be retracted and / or advanced radially.

[0116] In another variant, the first and second layer diverters 150, 200 each have a second drive 350 (see FIG. 2) for the pickup device 156, 206. This second drive 350 is used to radially retract the respective pickup device 156, 206 when, after the respective layer has been placed on the stack table 400, the pickup device of the other layer diverter approaches in the space between the two layer diverters on its way to its transfer point U1, U2. The second drive 350 rotates the pipe, the associated turntable, and the pickup device 156, 206 about the center of rotation DZ. The pickup device 156, 206 is moved radially based on its connection to an eccentric, which will be described later. The first drive 300 is a controlled servomotor that rotates the entire layer diverter in order to turn the pickup device about its center of rotation. In the variant shown in Fig. 2, the second drive 350 is a servomotor that must be controlled independently of the first rotary drive 300 and is geared to the internal shaft 160, 210, which is configured as an eccentric shaft. This eccentric shaft has an eccentric 372, 374 for each pickup device 156, 206 of the respective layer deflector 150, 200 to radially retract and advance the pickup device. For this purpose, each eccentric 372, 374 is surrounded by a needle bearing, which has an outer ring 376, 378 that is linked to the respective pickup device 156, 206. The respective eccentric 372, 374 causes the pickup device 156, 206, guided by radially oriented linear guides 380, 382, ​​to move outward or inward when the shaft 160, 210 rotates. In particular, the radial retraction of the pickup device of the first and / or second layer deflector is carried out when the pickup device approaches the pickup device of another layer deflector on its way from its release point to its transfer point or from its transfer point to its release point.

[0117] The second drive 350 rotates the respective inner shafts 160, 210 and radially advances and retracts the pickup devices. In particular, the second drive 350 is also used by the first and second layer diverters to radially advance the respective pickup devices when they approach the first or second transfer point U1, U2 and the first or second discharge point A1, A2, respectively. In this variant, the pickup devices of the two layer diverters as a whole move along an approximately elongated ellipse E, the major axes of which run from the center of the respective transfer point to the center of the respective discharge point, and the minor axes of which do not touch each other. In FIG. 1, this ellipse E is shown by a dashed line on the second layer diverter 200. It will be appreciated that this movement does not have to be symmetrical, since the pickup devices further away from the space R are radially extended much further than the pickup devices within the space R. The first drive 300 and the second drive 350 are guided together via an angular and axial gear combination 390 and rotate independently of each other the inner shafts 160, 210 or all the pick-up devices of the layer diverter as a whole via a connecting element, for example a pipe 352. As shown in Figure 2, the pipe 352 and the shaft connected to the first drive 300 have collinear axes of rotation.

[0118] A stack table 400 for receiving individual anode layers AL or cathode layers KL at the first or second discharge locations A1, A2, respectively, is provided with a drive 410. The drive 410 controls the stack table 400 to move along the x-axis in both directions between the first and second discharge locations A1, A2, so that the stack table 400 is oriented in the correct position relative to the individual anode layers AL or cathode layers KL placed thereon. In Figure 1, the stack table is shown in solid lines below the layer diverter 150 in the left-oriented position and in dashed lines below the layer diverter 200 in the right-oriented position.

[0119] When the pickup device 156, 206 is at the first or second discharge location A1, A2, the first and second layer deflectors 150, 200 eject the individual anode layer AL or cathode layer KL from the pickup device 156, 206 at the first or second discharge location A1, A2, respectively, onto the stack table 400 - at the 6 o'clock position in Figure 1.

[0120] To this end, in the variant of the device 100 shown here, the first and second transfer locations U1 and U2 each have a first center (approximately above the center of the pickup device at the 12 o'clock position between the pickup device and the conveyor), and the first or second discharge location A1 and A2 each have a second center (approximately below the center of the pickup device at the 6 o'clock position between the pickup device and the stack table). These respective first and second centers are located on an imaginary line intersecting with the rotation center DZ of the first layer diverter 150 or the second layer diverter 200, respectively. The first and second layer diverters diverte only one anode layer AL or only one cathode layer KL to the first or second discharge location A1 or A2, respectively.

[0121] In an arrangement with eccentric drives, the first drive of a layer deflector and the second drive of the same layer deflector can rotate consistently in the same direction or occasionally in opposite directions. This allows the rotational movement of the layer deflector as a whole to be superimposed on the radial in / out movement of its pickup devices, allowing for particularly small spacing between the two layer deflectors and therefore particularly short distances between the two discharge points. Furthermore, the two layer deflectors (in the two variants of FIGS. 1 and 2) can be rotated by their respective first drives in the following way: the pickup device(s) of one layer deflector rotates exactly in antiphase with the pickup device(s) of the other layer deflector. This means that, in the case of one pickup device per layer deflector, the pickup device of one layer deflector is located near the transfer point and the pickup device of the other layer deflector is located near the discharge point. In the case of four pick-up devices per layer diverter, one pick-up device on one layer diverter leads one pick-up device on the other layer diverter by approximately 45°.

[0122] The stack table 400 has trays 420 for the individual anode layers AL and cathode layers KL and a handling device 430 with a corresponding rotation drive about the z-axis, which moves the trays 420 along the axis and about the z-axis, so that the stack table 400 and its trays 420, or more precisely their centers, are oriented precisely and purposefully towards the first or second discharge point A1, A2 and the pick-up device at the 6 o'clock position.

[0123] The stack table 400 has first and second clamp fingers 442, 444. In a variant, two clamp fingers are provided on each of two opposing sides. In this case, the clamp fingers move in the y direction, which is perpendicular to the rotation direction of the pickup device. These two clamp fingers 442, 444 move laterally along the x or y direction from both sides (lateral or longitudinal sides) onto the electrode stack formed from the anode layer AL and the cathode layer KL, and under control, engage or disengage with the uppermost anode layer AL and cathode layer KL, respectively, thereby pushing the uppermost anode layer AL and cathode layer KL toward the electrode stack ES on the tray 420. For this purpose, suitable linear drives 446, 448 are provided in the z-direction and the x- or y-direction, respectively, depending on the arrangement of the clamp fingers 442, 444, which controllably move the first and second clamp fingers 442, 444 relative to the base plate 450 of the stack table 400 and its tray 420. In a variant, the stack table 400 is supported on a fixed plate, which has a notch. The base plate 450 can move only in the x-direction relative to the fixed plate along two linear guides. On the base plate 450 is a Y-plate, which can move in the y-direction relative to the base plate 450. This Y-plate supports an actuator plate. On this actuator plate is the tray 420. The actuator plate can rotate around the z-axis together with the tray 420, and therefore the clamp fingers and their actuators.

[0124] For each clamp finger, there is an x-actuator or a y-actuator on the actuator plate, depending on the direction and location of the clamp finger, which allows the individual clamp finger to be positioned in the y-direction. The z-actuator for each clamp finger is located on a separate plate, which is located on the Y-plate and next to the tray 420. The y-actuator therefore slides the separate plate, and with it the respective clamp finger 442, 444, along with its z-actuator.

[0125] The clamp fingers 442, 444 are also used to press the endless separator belt against the tray 420 or previously formed stack while the stack table is moving between the discharge points A1, A2, so that the anode layer Al and cathode layer KL placed on the tray 420 are always separated by an electrically insulating separator.

[0126] When the Y-plate moves in the y-direction, the actuator plate is moved in the y-direction with the clamp fingers. The tray 420 is positionable in the z-direction by a z-drive, which can be positioned precisely below the tray and has free space for movement in the X-direction within a central cutout in the fixed plate.

[0127] The first and second layer diverters 150, 200 diverter the individual anode layers AL and the individual cathode layers KL with controlled negative pressure air p -- , and are arranged to pick up and hold the material while diverting it to the first or second discharge point A1, A2. Furthermore, in the presently shown variant of the device 100, the first and second layer diverters 150, 200 are arranged to be diverted by controlled overpressure air p ++ is used to eject individual anode layers AL and individual cathode layers KL at the first or second ejection point by a short blow impact, thereby stacking the layers AL, KL on the tray 420 to form an electrode stack ES.

[0128] To this end, FIG. 2 shows that the first and second layer diverters 150, 200 each have a rotatable overpressure / underpressure distributor 650, which is arranged around an inner shaft 160, 210, and which delivers controlled underpressure air p to the pick-up device. -- and / or overpressure air p ++ is provided. In this case, two concentric rings 652, 654 are provided rotatably and fluid-tightly surrounded by each other, in which an overpressure / underpressure delivery 656 is realized for each of the pickup devices. From the overpressure / underpressure delivery 656 for each pickup device 156, 206, a fluid conduit leads into the inner shaft 160, 210 and from there to a connection end for a radial flexible conduit 656 for the respective pickup device 156, 206. The flexible conduit 656 is connected to a number of openings in the surface of the pickup device opposite to the center of rotation.

[0129] Alternatively, each of these openings is assigned a resilient nozzle that extends slightly (for example, by less than 3 mm) beyond the surface of the pick-up device and is connected to a flexible conduit 656. The anode layers AL and cathode layers KL can thus be securely and carefully accommodated and repositioned on the tray 420 with high precision in their orientation. The handling device 430 controls the lowering of the tray 420 by a distance corresponding to the thickness of the individual anode layers AL or cathode layers KL when the individual anode layers AL and cathode layers KL are placed and then stacked. This ensures a very short, defined free distance between the separation from the pick-up device 156, 206 and the contact with the electrode stack ES.

[0130] Next, the first to third tests of layer materials integrated into the above-mentioned variants, for example when forming a fuel cell or a battery cell, will be described.

[0131] The first inspection device has a first layer conveyor 150 (left in FIG. 1 ) with four pickup devices 156 and a first drive 300 for picking up each individual anode layer AL or cathode layer KL from a first transfer point U1 using at least one pickup device 156 and moving it to a first discharge point A1. When each at least one pickup device 156 is at the first discharge point A1, the first layer diverter 150 discharges each individual anode layer AL or cathode layer KL from its pickup device 156 to a stack table 400, or more precisely, its tray 420, at the first discharge point A1. A drive 410 aligns the pickup device 156 and the stack table 400 relative to each other according to a signal based on processing of the first and / or second image captures. The first image sensor K1 is directed to a first region E1 of the first layer diverter 150 between the first transfer point U1 and the first discharge point A1, and performs a first image capture when the pickup device 156 of the first layer diverter 150 with the individual anode layer AL or cathode layer KL passes over the first image sensor K1. The second image sensor K2 is directed to a second region E2 of the first layer diverter 150 between the first transfer point U2 and the first discharge point A2, and performs a second image capture when the pickup device 156 of the first layer diverter 150 with the individual anode layer AL or cathode layer KL passes over the image sensor K2. The second region E2 may be different from the first region E1. The stack table 400 accommodates each individual anode layer AL at the first discharge location A1 and each individual cathode layer KL at the second discharge location A2 to form a layer stack.

[0132] In the illustrated variant, the first layer conveyor 150 has a layer diverter 156 for picking up each individual anode layer or cathode layer from the first transfer point U1 using at least one pickup device 156 and rotating it by a respective rotation angle - here approximately 180° - relative to the first discharge point A1.

[0133] In a variant not shown here, the first layer conveyor 150 has a layer gripper which picks up each individual anode or cathode layer from the first transfer point U1 using a pick-up device, for example in the form of a suction tool or a gripping tool, and moves it to the first discharge point A1.

[0134] Similar to the first layer conveyor 150, the second layer conveyor 200 (right in FIG. 1) is provided and configured to pick up individual cathode layers KL or anode layers AL and move them to the second discharge location A2. A first image sensor K1' between the second transfer location U2 and the second discharge location A2 is directed toward a first region E1' of the second layer diverter 200 and performs a first image capture when the second layer conveyor 200 passes the first image sensor K1'. A second image sensor K2' between the second transfer location U2 and the second discharge location A2 is directed toward a second region E2' of the second layer conveyor and performs a second image capture when the second layer conveyor passes the second image sensor K2'.

[0135] In the illustrated variant, the second layer conveyor 200 has a layer diverter 206, which picks up each individual anode or cathode layer from the second transfer point U2 using at least one pickup device 206 and rotates it by a respective rotation angle - here 180° - to the second discharge point A2.

[0136] In a variant not shown here, the second layer conveyor 200 has a layer gripper, which is provided and configured to pick up each individual anode or cathode layer from the second transfer point U2 using a pick-up device, for example in the form of a suction tool or a gripping tool, and move it to the second discharge point A2.

[0137] A drive 410 is associated with the stack table 400 and drives the stack table 400 bidirectionally between the first and second discharge locations A1 and A2. At the first and second discharge locations A1 and A2, respectively, the first and second layer conveyors discharge individual anode layers AL or cathode layers KL onto the stack table 400 when the stack table is at the first or second discharge location A1 or A2. The drive directs the respective layer conveyors and / or at least one layer diverter 156, 206, respectively, towards the stack table 400 according to signals based on processing of the first and second image captures.

[0138] The first and second areas E1 and E2 of the pickup devices of the two layer deflectors 150 and 200 are here diagonally opposite corner areas of the pickup devices of the layer deflectors 150 and 200. The first and second areas E1 and E2 of the pickup devices of the two layer deflectors 150 and 200 are provided and configured to pick up a first or second corner of each anode layer AL or cathode layer KL. The first and second image sensors K1, K2, K1', K2' are therefore arranged diagonally opposite each other and are directed towards the first and second areas E1 and E2 of the pickup devices of the two layer deflectors 150 and 200 as the pickup devices pass by the first and second image sensors K1, K2, K1', K2'. The first and second image sensors K1, K2, K1', K2' are here arranged between the two transfer points U1, U2 and the two release points A1, A2 as follows: at the time of the first and / or second image capture, within the inspection position for the first and second image sensors K1, K2, K1', K2', at an angle of approximately 90° between the camera axis and the anode or cathode, respectively, directed towards the first or second area E1, E2 of the respective pickup device 156, 206.

[0139] The first and second image sensors K1, K2, K1', K2' are here adjustable for focusing along their optical axes. In other variants, they are alternatively or additionally movable during operation. A white light source associated with the first and second image sensors K1, K2, K1', K2' illuminates the anode / cathode layers for image capture. In other variants, one or more optically active elements are associated with the first and second image sensors K1, K2, K1', K2', which detect the position and / or orientation of the anode / cathode layers at one or more locations or regions before, during, or en route to the emission location. The optically active elements may be lenses or lens assemblies, mirrors or mirror assemblies, prisms or prism assemblies, optical fiber assemblies, area illumination, coaxial link illumination, dark field illumination, etc., or combinations thereof.

[0140] The control unit ECU determines correction values ​​from one or more image captures from the position and / or orientation of the anode / cathode layers AL, KL before they are received by the stack table 400, the position and / or orientation of the stack table 400 and / or the position and / or orientation of the picked-up individual anode / cathode layers AL, KL relative to the stack table 400 while the cathode / anode layers AL, KL are being diverted to the stack table 400. The control unit ECU takes these correction values ​​into account in its operating commands to the layer diverter, pickup device and / or stack table when orienting the stack table 400 with the transferred anode / cathode layers relative to the discharge locations A1, A2. The control unit 400 takes these correction values ​​into account in particular in the operation commands to the layer diverter, pick-up device and / or stack table for the alignment and position of the stack table when receiving the anode layer / cathode layer, such that the stack table receives the respective anode layer / cathode layer in the central zero position and / or in alignment with the electrode stack at the discharge point.

[0141] The control unit determines the alignment and position of the stack table 400 when or before receiving the anode / cathode layers AL, KL by inspecting the position of the arriving anode / cathode layers AL, KL in the image capture immediately prior to each release point A1, A2.

[0142] For the inspection, an inspection method is also used, which comprises the following steps: picking up the anode / cathode layers AL, KL from the transfer points U1, U2 using the pick-up devices 156 of the layer diverters 150, 200; transporting the pick-up devices 156 of the layer diverters 150, 200 from the transfer points to the discharge points A1, A2; detecting the position and / or orientation of the anode / cathode layers AL, KL in the x, y, z, and / or θ directions at the pick-up devices 156 of the layer diverters 150, 200 between the transfer points U1 and the discharge point A1 using a first image sensor K1, where the first image sensor K1 is directed toward a first area E1 of the layer diverter 150 and is provided and configured to capture a first image when the pick-up devices of the layer diverters pass the first image sensor K1; transporting the anode / cathode layers AL, KL from the transfer points U1, U2 to the discharge points A1, A2 using a second image sensor K2 between the transfer points U1, U2 and the discharge point A1. , 200, detects the position and / or orientation in the x, y, z, and / or θ directions of the anode layer / cathode layer AL, KL in at least one pickup device 156, wherein the second image sensor K2 is directed toward the second region E2 of the layer diverter 150 and is provided and configured to capture a second image when the pickup device of the layer diverter passes the second image sensor K2; aligns the pickup device 156 and the stack table 400, more precisely its tray 420, relative to each other according to a signal based on processing of the first and / or second image capture; and when each pickup device 156 is at the release location A1, A2, releases the anode layer / cathode layer AL, KL from the pickup device 156 onto the stack table 400 at the release location A1, A2 to form a layer stack.

[0143] The first and second image sensors K1, K2 detect the position and / or orientation of the anode / cathode layers AL, KL in the x, y, z and / or θ directions in a vertical top view when the pickup device of the layer deflector passes over the respective image sensors K1, K2. Light sources L1, L2 associated with the first and / or second image sensors K1, K2 illuminate the anode / cathode layers AL, KL for image capture by the first and second image sensors K1, K2. In a variant not shown, the first and second image sensors K1, K2 completely detect the anode / cathode layers AL, KL by image capture, thereby determining their position and / or orientation in the x, y, z and / or θ directions. In another variant, the first and / or second image sensor K1, K2 detects, with a single image capture relative to a fixed image sensor zero point, one area, at least one corner area, two diagonal areas, or at least one corner area and at least one edge section of the anode / cathode layer AL, KL, thereby detecting the position and / or orientation of the anode / cathode layer AL, KL in the x, y, z, and / or θ directions. The first or second image sensor K1, K2 can be formed as a matrix camera or as a line camera, which detects the position and / or orientation of the anode / cathode layer AL, KL in the x, y, z, and / or θ directions before or when it arrives at the emission point A1 or on its way to the emission point A1.

[0144] The correction values ​​are determined from the position and / or orientation in x, y, z of the anode / cathode layers AL, KL after pick-up by at least one pick-up device of the layer diverter, the position and / or orientation in x, y, z, and / or θ of the stack table 400, and / or the position and / or orientation in x, y, z, and / or θ of the individual picked-up anode / cathode layers AL, KL while they are being diverted to the stack table 400. These correction values ​​are taken into account when orienting the stack table 400 in the x, y, z, and / or θ directions at the discharge locations A1, A2 relative to the pick-up devices of the layer diverter with the anode / cathode layers AL, KL transferred to the discharge locations A1, A2. These correction values ​​are taken into account when orienting the stack table 400 or the layer deflector pickup device in the x, y, z and / or θ directions so that the anode / cathode layers AL, KL are accommodated by the stack table 400 in a central zero position and / or oriented in a straight line.

[0145] In the second inspection device 100, a first layer conveyor 150 picks up individual anode and / or cathode layers AL, KL from a first transfer point U1 and moves them to a first discharge point A1. A stack table 400, or more precisely, its tray 420, receives the individual anode or cathode layers AL, KL at the first discharge point A1 to form a layer stack. The first layer conveyor 150 discharges the individual anode or cathode layers AL, KL, respectively, onto the stack table 400 when the stack table 400 is at the first discharge point A1. A third image sensor K3, K3' is directed in a side view toward at least one area E3, E3' that includes the upper edge OK of the layer stack on the stack table 400. This area E3, E3' includes the connection tab T of the uppermost anode / cathode layer AL, KL on the layer stack. This third image sensor K3, K3' performs a third image capture after the anode layer AL or the cathode layer KL is placed onto the layer stack on the stack table 400. The control unit ECU indicates the (un)usability of the layer stack according to a signal based on processing of the third image capture.

[0146] The layer conveyor has a layer diverter which picks up each individual anode or cathode layer from the first transfer point U1 using one of four pickup devices 156 and rotates it by a respective rotation angle - here 180° - to the first discharge point A1.

[0147] In a variant not shown, the layer conveyor has a layer gripper, which picks up individual anode or cathode layers from the first transfer point U1 using a pick-up device, for example in the form of a suction tool or a gripping tool, and moves them to the first discharge point A1.

[0148] A second ply conveyor, similar to the first ply conveyor, picks up individual cathode or anode layers KL, AL and moves them to a second discharge location A2. Drives 410 are associated with the stack table 400 and move the stack table 400 bidirectionally between the first and second discharge locations A1, A2. The first and second ply conveyors discharge individual anode or cathode layers AL, KL to the stack table at the first and second discharge locations A1, A2, respectively, when the stack table 400 is at the first or second discharge location A1, A2. At least one drive is used to orient the respective ply conveyor and / or at least one ply diverter 156, 206 or ply gripper relative to the stack table 400 according to signals based on processing of the first and / or second image captures in the control unit ECU.

[0149] The second layer conveyor likewise has a layer deflector and likewise uses a pick-up device 206 to pick up individual anode or cathode layers from the second transfer point U2 and rotate them by a rotation angle - here 180° - to the second discharge point A2.

[0150] In a variant not shown, the second layer conveyor has a layer gripper which picks up the individual anode or cathode layers, respectively, from the second transfer point U2 using a pick-up device, for example in the form of a suction tool or a gripping tool, and moves them to the second discharge point A2.

[0151] The first third region E3 and the second third region E3' of the layer stack—see FIG. 4a—each have—in side view—connection tabs for the uppermost anode layer AL or cathode layer KL on the stack table 400 at the first or second emission locations A1, A2, respectively. One or two third image sensors K3, K3a, K3', K3a' are arranged on a first side of the inspection device 100 or tray 420, e.g., the left side in FIG. 1, and one or two third image sensors K3, K3a, K3', K3a' are arranged on a second side opposite the first side of the inspection device 100, e.g., the right side in FIG. 1. The two third image sensors K3, K3a, K3', K3a' on one side of the inspection device 100 or tray 420 are spaced apart from each other in the Y direction. In a variant, one or more third image sensors K3, K3a, K3', K3a' are arranged in fixed positions relative to the stack table 400, which travels bidirectionally between the two discharge locations A1, A2. This is shown in FIG. 4a. In a variant not shown in detail, only two of the four fixedly arranged third image sensors K3, K3a, K3', K3a' are provided, which are arranged diagonally, i.e., the third image sensors K3, K3a' or K3a, K3' in FIG. 4a. Alternatively, in a variant not shown in detail, only two of the four fixedly arranged third image sensors K3, K3a, K3', K3a' are provided, which are arranged on one side of the stack table 400, i.e., the third image sensors K3, K3a or K3a', K3' in FIG. 4a. In a variant, the optical axis of the third image sensor, or of each of the image sensors, is oriented horizontally or has a deviation of at most ±10° from the horizontal.

[0152] 6 shows a top view of the stack table tray 420 at the first and second discharge locations, together with the image sensor configuration for the second inspection, on which the layer stack is located. Third image sensors K3a, K3' are shown, which detect—externally in a side view—the first, second, and third areas E3, E3', respectively, by means of backlighting or transmitted light from the light source WL. That is, one connection tab of each of the top anode or cathode layers AL, KL on the stack table 400 is inspected at the first or second discharge locations A1, A2, respectively.

[0153] If space conditions permit, in another variant, one or more third image sensors K3, K3a, K3', K3a' can be fixedly connected to the stack table 400 - see FIG. 4b - and travel therewith between the two discharge locations A1, A2. In a variant not shown in detail, of the four third image sensors K3, K3a, K3', K3a' that can travel with the stack table, only two diagonally arranged third image sensors are provided, thus in FIG. 4b only third image sensors K3, K3a' or third image sensors K3a, K3' are provided. Alternatively, in a variant not shown in detail, of the four third image sensors K3, K3a, K3', K3a' that can move together with the stack table, only two third image sensors are provided, arranged on one side of the stack table 400, and therefore in Figure 4b, the third image sensors K3, K3a that can move together with the stack table or the third image sensors K3a', K3' that can move together with the stack table are provided.

[0154] The one or more image sensors K3, K3a, K3', K3a' are adjustable along their optical axes to focus on the regions E3, E3'. A light source L3 (see FIG. 3 ), associated with each of the image sensors K3, K3a, K3', K3a', respectively, illuminates the anode / cathode layers on the stack table 400 for image capture by the image sensor(s). Here, the light source L3 is a coaxial ring light. The coaxial ring light is positioned on the side of the third image sensor K3, directly on the side of the connection tab T on the stack table 400 at each of the third image sensors K3, K3a, K3', K3a', and is arranged to bring the connection tab T into the optical path. That is, processing of the third image capture identifies the vertical lift of the connection tab T by causing the top edge of the connection tab T to be misoriented horizontally and / or resulting in a noise contour in the image capture.

[0155] A second inspection method for forming a module or a precursor of a module includes the following steps: picking up the anode / cathode layers AL, KL at the first transfer location U1 and moving the anode / cathode layers AL, KL from the first transfer location U1 to the first release location A1; releasing each individual anode / cathode layer AL, KL onto the stack table 400 at the release locations A1, A2 to form a layer stack; directing the third image sensor K3, K3' toward an area E3 including the top edge OK of the layer stack on the stack table 400 in side view, where the area has the connection tab T of the topmost anode / cathode layer AL, KL on the layer stack; and after the anode / cathode layers AL, KL have been released onto the stack table 400, a third image capture is performed using the third image sensor K3, K3'; and indicating the unusability of the layer stack according to a signal based on processing the third image capture.

[0156] In the illustrated variation, a coaxial ring light is positioned on the side of the third image sensor, on this side of the location of the connection tab T on the stack table 400, and the third image sensor K3 is aligned so that the connection tab T is in the light path. A third image capture is then taken and processed in the ECU, whereby the top edge of the connection tab T is not horizontally oriented in the third image capture and / or a noise contour is introduced, thereby recognizing a lift of the connection tab T using processing of the third image capture.

[0157] In a third inspection apparatus 100 for layer materials, particularly for manufacturing fuel or battery cells, a first layer conveyor 150 picks up individual anode / cathode layers AL, KL and moves them to a first discharge location A1. A stack table 400 receives the anode / cathode layers AL, KL at the first discharge location A1 to form a layer stack. The first layer conveyor 150 discharges the anode / cathode layers AL, KL to the stack table 400 at the first discharge location A1. A fourth image sensor K4 is directed toward a fourth region E4 of the layer stack, consisting of the anode and cathode layers AL, KL, in a planar side view of the layer stack, and performs a fourth image capture after the anode or cathode layer AL, KL is placed on the layer stack on the stack table 400, with the fourth region E4 including a corner of the top anode or cathode layer AL, KL and / or a vertical edge HK of the layer stack. In this way, not only the top layer but also one or more misaligned layers further down in the overall stack are recognized. This means that outliers introduced into the process due to variations can also be detected. In the illustrated variant, the fifth image sensor K5 is directed toward a fifth region E5 of the layer stack consisting of the anode and cathode layers AL, KL in the planar side view of the layer stack, and performs a fifth image capture after the anode or cathode layer AL, KL is released onto the layer stack on the stack table 400, where the fifth region E5 comprises a corner of the anode or cathode layer AL, KL that is uppermost (or lower; see above) on the layer stack and / or a vertical edge of the layer stack. Here, regions E4 and E5 are separated. In particular, the fourth region E4 or the fifth region E5 of the anode or cathode layer AL, KL comprises regions of the layer stack consisting of the anode and cathode layers AL, KL that are adjacent to each other or diagonally opposite each other in the layer plane in the respective side view of the layer stack.

[0158] The layer conveyor has a layer diverter 156 for picking up individual anode or cathode layers from the first transfer point U1 using at least one pickup device 156 and rotating them by a respective rotation angle - here 180° - to the first discharge point A1.

[0159] The fourth and fifth image sensors K4 and K5 are adjustable along their optical axes for focusing. Light sources associated with the fourth and fifth image sensors K4 and K5, respectively, illuminate the anode / cathode layers for the fourth and fifth image captures by the fourth and fifth image sensors K4 and K5. At least one optically active element is associated with the fourth and fifth image sensors K4 and K5, respectively, which enables the corners E4 and E5 of the uppermost anode or cathode layer of the layer stack and the respective vertical edges of the layer stack to be recognized in the fourth and fifth image captures after the anode or cathode layer AL, KL has been placed on the layer stack. The at least one optically active element is a coaxial ring light. This coaxial ring illumination is located on the side of the fourth image sensor K4 or the fifth image sensor K5, on the side of the corners of the topmost (or further down; see above) anode or cathode layer AL, KL on the layer stack and the respective vertical edges HK of the layer stack, which—together with the respective image sensor—brings the corners and / or vertical edges HK into the optical path, i.e., processing of the fourth or fifth image capture can be used to recognize any lifting, displacement or rotation about the vertical axis of the anode or cathode layer AL, KL, as the corners and / or vertical edges will introduce noise contours in the image capture.

[0160] The first fourth region E4 and the second fourth region E4' of the layer stack respectively include the corners of the top anode or cathode layer AL, KL of the layer stack and the vertical edges of the layer stack on the stack table 400 when the stack table is at the first or second emission location A1, A2.

[0161] In a variant, the first fourth image sensor K4 and the first fifth image sensor K5 are arranged on a first side of the inspection device 100 (left in FIG. 5a), and the second fourth image sensor K4' and the second fifth image sensor K5' are arranged on a second side opposite to the first side of the inspection device 100 (right in FIG. 5a). In FIG. 5a, these fourth or fifth image sensors are arranged in a fixed position relative to the movable stack table 400, more precisely its tray 420. In FIG. 5b, these fourth or fifth image sensors are coupled to the stack table 400 so as to be able to move together with the stack table 400.

[0162] To achieve a compact overall arrangement of the inspection device and a low vibration profile for inspection, in a variant, the first and / or second image sensors K1, K2, optionally also the first fourth image sensor K4 and / or the first fifth image sensor K5, are arranged on a support frame that extends parallel to the pickup device 156 when the pickup device 156 passes over the first and / or second image sensors K1, K2. In another embodiment, the support frame can be L-shaped (horizontally lying L) and can hold the layer diverter 150 in an L-shape, so that the side of the layer diverter 150 facing away from the first drive 300 (see FIG. 2) is rotatably accommodated in the support frame. For the same purpose, a support frame of this type can also be associated with the second layer diverter 200 and accommodate the image sensors associated with the second layer diverter 200.

[0163] In a variant not shown in detail, of the fourth and fifth four image sensors K4, K4', K5, K5', only two image sensors arranged diagonally are provided, i.e., image sensors K4, K5' or image sensors K4', K5 in Figure 5a or 5b. Alternatively, in a variant not shown in detail, of the fourth and fifth four image sensors K4, K4', K5, K5' movable together with the stack table, only two image sensors arranged on one side of the stack table 400 are provided, i.e., image sensors K4, K5 movable together with the stack table 400 in Figure 5b, or image sensors K4', K5' movable together with the stack table 400.

[0164] As another alternative, FIG. 7 shows a stack table tray with a third inspection image sensor arrangement at the first and second emission locations, from above, on which a layer stack is located. In this case, the fourth or fifth image sensor K4, K5, K4', K5' is illustrated oriented at an angle β of approximately ±5° to approximately ±25°, e.g., approximately ±13°, relative to the longitudinal or lateral edge of the uppermost anode or cathode layer AL, KL of the layer stack. This avoids the interfering effects of a tubular or S-shaped endless separator (not shown). In this case, the optical axis of the fourth or fifth image sensor K4, K5, K4', K5' can be selectively tilted to the left or right by the angle β, as viewed from above, relative to the (imaginary) extended lateral or longitudinal edge of the uppermost anode or cathode layer AL, KL of the layer stack at the first or second emission locations A1, A2. This is shown by the image sensor shown by the dashed line in Figure 7. That is, at the first or second emission point A1 or A2, a corner area of ​​the uppermost anode or cathode layer AL or KL, respectively, on the stack table 400 is inspected.The third inspection method comprises the following steps: picking up anode / cathode layers AL, KL from transfer points U1, U2 using at least one pick-up device 156, 206 of the layer diverter 150, 200; when the at least one pick-up device 156, 206, respectively, is at a discharge point A1, A2, respectively, ejecting the individual anode or cathode layers AL, KL from the at least one pick-up device 156, 206, respectively, at the discharge points A1, A2 onto the stack table 400 to form a layer stack; directing a fourth image sensor K4 towards a fourth region E4 of the layer stack consisting of the anode and cathode layers AL, KL in a planar side view of the layer stack, wherein the fourth region E4 is the layer The fourth image capture includes the corners of the anode or cathode layer AL, KL at the top of the stack and / or the vertical edges of the layer stack; and is performed after the anode or cathode layer AL, KL is released onto the layer stack on the stack table 400; and / or the fifth image sensor K5 is directed toward a fifth region E5 of the layer stack consisting of the anode and cathode layers AL, KL in a planar side view of the layer stack, wherein the fifth region E5 includes the corners of the anode or cathode layer AL, KL at the top of the layer stack and / or the vertical edges HK of the layer stack; and the fifth image capture is performed after the anode or cathode layer AL, KL is released onto the layer stack on the stack table 400. In that case, the fourth region E4 or fifth region E5 of the anode layer or cathode layer AL, KL comprises, in the respective side view of the layer stack, regions of the layer stack consisting of the anode layer and the cathode layer AL, KL that are adjacent in the layer plane (for example located at the same edge of the layer) or diagonal to each other; and indicate the (un)usability of the layer stack according to a signal based on processing of the fourth or fifth image capture.

[0165] The fourth or fifth image sensor K4, K5 is adjustable along its optical axis for focusing. The fourth or fifth area E4, E5 for the fourth or fifth image capture is illuminated by the respective image sensor K4, K5, K4', K5' using a light source associated with the fourth or fifth image sensor. An optically active element, here in the form of a coaxial ring light, is associated with the fourth or fifth image sensor, respectively, so that after the anode or cathode layer AL, KL is emitted onto the layer stack, the corner of the uppermost anode or cathode layer AL, KL of the layer stack and / or the vertical edge of the layer stack can be recognized in the fourth or fifth image capture. The coaxial ring light is positioned as the incident light on the side of the fourth or fifth image sensor, on the side of the corner of the uppermost anode or cathode layer of the layer stack or the vertical edge of the layer stack on the stack table. Therefore, the incident light illumination is arranged to bring the corners and the vertical edges HK of the layer stack into the light path, so that the top corners and / or vertical edges HK will introduce noise contours that allow the processing of the fourth or fifth image capture to be used to recognize at least a partial lifting, displacement or rotation of the top anode or cathode layer AL, KL of the layer stack.

[0166] The above-described variations and inspections of operation, as well as variations in the structure, driving perspective, and method are used only to facilitate understanding of the structure, functioning methods, and characteristics; they do not limit the disclosure to, for example, the embodiments. The figures are partially schematic. In these cases, the main characteristics and effects are clearly shown, partly enlarged, to clarify the function, operating principle, technical features, and characteristics. In these cases, each functioning method, principle, technical feature, and feature disclosed in the figures or text can be freely and arbitrarily combined with all claims, features in the text and other figures, and with other functioning methods, principles, technical features, and features contained in and arising from this disclosure, so that all possible combinations are associated with the manner described. This includes combinations between all individual features within the text, i.e., within each paragraph of the specification and in the claims, as well as combinations between various variants within the text, claims, and drawings. The claims also do not limit the possibility of combining all features disclosed and shown therein with one another. All disclosed features are expressly disclosed herein individually and in combination with all other features.

Claims

1. An inspection device (100) for layer materials, in particular for manufacturing fuel cells or battery cells, comprising: a first layer conveyor is provided and configured to include at least one pick-up device (156) and a first drive (300) and to pick up each individual anode or cathode layer (AL, KL) from a first transfer point (U1) by said at least one pick-up device (156) and move it to a first discharge point (A1); the first layer conveyor (150) is provided and configured to discharge each individual anode or cathode layer (AL, KL) from its pickup device (156) to a stack table (400) at the first discharge location (A1) when each of the at least one pickup device (156) is at the first discharge location (A1); at least one drive (410) is provided to align the pickup device (156) and the stack table (400) relative to one another in response to signals based on processing of the first and / or second image captures; and a first image sensor (K1) is provided and configured to be directed towards a first area (E1) of the first layer conveyor (150) between the first transfer point (U1) and the first release point (A1), and the first image sensor (K1) is configured to perform a first image capture when the at least one pick-up device of the first layer conveyor passes by the first image sensor (K1); and / or a second image sensor (K2) is provided and configured to be directed towards a second region (E2) of the first layer conveyor (150) between the first transfer point (U1) and the first release point (A1), and the second image sensor (K2) is provided and configured to perform a second image capture when the at least one pick-up device of the first layer conveyor (150) passes the second image sensor (K2); An inspection device (100), wherein a stack table (400) is provided and configured to receive each individual anode or cathode layer (AL, KL) at said first emission location (A1) to form a layer stack.

2. 2. The inspection device (100) of claim 1, wherein the first layer conveyor comprises a layer diverter (150) provided and configured to pick up each individual anode or cathode layer from the first transfer point (U1) using the at least one pickup device (156) and rotate it by a respective rotation angle to a first discharge point (A1).

3. 2. The inspection device (100) of claim 1, wherein the first layer conveyor comprises a layer gripper, which is provided and configured to pick up each individual anode or cathode layer from the first transfer point (U1) using a pick-up device, for example in the form of a suction tool or a gripping tool, and move it to the first discharge point (A1).

4. a second layer conveyor (200) is provided and configured to pick up individual cathode or anode layers (KL, AL) and move them to a second discharge point (A2); a first image sensor (K1') is provided and configured to be directed towards a first region (E1') of the first layer conveyor (200) between a second transfer point (U2) and the second discharge point (A2) and to perform a first image capture when the second layer conveyor (200) passes the first image sensor (K1'); and / or An inspection device (100) according to any one of claims 1 to 3, wherein a second image sensor (K2') is provided and configured to be directed towards a second region (E2') of the second layer conveyor between the second transfer point (U2) and the second discharge point (A2) and to perform a second image capture when the second layer conveyor passes the second image sensor (K2).

5. 5. The inspection device (100) of claim 4, wherein the second layer conveyor comprises a layer diverter, which is provided and configured to pick up each individual anode layer or cathode layer from the second transfer point (U2) using the at least one pickup device (206) and rotate it by a respective rotation angle to a second discharge point (A2).

6. 5. The inspection device (100) of claim 4, wherein the second layer conveyor comprises a layer gripper, which is provided and configured to pick up each individual anode or cathode layer from the second transfer point (U2) using a pick-up device, for example in the form of a suction tool or a gripping tool, and move it to the second release point (A2).

7. a drive (410) associated with the stack table (400), the drive (410) being provided and configured to reciprocate the stack table (400) between the first discharge location (A1) and the second discharge location (A2); the first layer conveyor and the second layer conveyor are respectively provided and configured to discharge individual anode or cathode layers (AL, KL) to the stack table (400) at the first or second discharge location (A1) or (A2) when the stack table is at the corresponding first or second discharge location (A1), respectively; and An inspection device (100) according to any one of claims 1 to 6, wherein at least one drive is provided for positioning the respective layer conveyor and / or the respective at least one layer diverter (150, 200) or the respective at least one layer gripper relative to the stack table (400) in response to a signal based on processing of the first image capture and / or the second image capture in a control unit, and / or this drive can be set relative to the positioning location (420) as an additional drive in the Y direction and / or as a rotation drive around the z-axis (θ direction).

8. the first area (E1) and the second area (E2) of the at least one pick-up device of the layer diverter (150, 200) are corner areas diagonally opposite each other of the at least one pick-up device of the layer diverter (150, 200); and / or the first area (E1) and the second area (E2) of the at least one pick-up device of the layer diverter (150, 200) are provided and configured to pick up a first corner or a second corner of the respective anode or cathode layer (AL, KL); and / or 4. The inspection device (100) of claim 1, wherein the first and / or second image sensors (K1, K2, K1', K2') are oriented towards the first or second area (E2) of the pickup device (156, 206) between the transfer point (U1, U2) and the release point (A1, A2) at an angle of about 30° to about 150°, or at an angle of about 60° to about 120°, or at an angle of about 80° to about 100°, or at an angle of about 90° with respect to a surface of the pickup device at the time of the first image capture or the second image capture.

9. the first and / or second image sensor (K1, K2, K1', K2') is adjustable along its optical axis for focusing and / or movable during operation, and / or a white light source associated with the first and / or second image sensor (K1, K2, K1', K2') is designed and configured to illuminate the anode / cathode layers for image capture by the first and / or second image sensor (K1, K2, K1', K2'); and / or 9. The inspection device (100) according to any one of claims 1 to 8, wherein the first and / or second image sensors (K1, K2, K1', K2') are respectively associated with at least one optically active element, the optically active element being designed and configured to detect the position and / or orientation of the anode / cathode layer in one or more locations or areas before or upon arrival of the anode / cathode layer at the emission location or on the way to the emission location, and / or the at least one optically active element being a lens or lens assembly, a mirror or mirror assembly, a prism or prism assembly, an optical fiber assembly, area illumination, coaxial ring illumination, dark field illumination, or a combination thereof.

10. the control unit is designed and configured to determine correction values ​​from one or more of the image captures based on the position and / or orientation of the anode layer / cathode layer before it is received by the stack table, the position and / or orientation of the stack table, and / or the position of the picked-up individual anode layer / cathode layer relative to the stack table during its transfer to the stack table; and / or the control unit is designed and configured to take these correction values ​​into account in positioning commands to the layer diverter, the pick-up device and / or the stack table when aligning the stack table with respect to the discharge point; and / or the control unit is designed and configured to take these correction values ​​into account in positioning commands to the layer diverter, the pick-up device and / or the stack table for alignment and positioning of the stack table when picking up the anode / cathode layers, so that the stack table receives each anode / cathode layer in a central zero position and / or aligned with the electrode stack at the release point; and / or 10. The inspection apparatus (100) of claim 1, wherein the control unit is designed and configured to determine the alignment and position of the stack table when or before receiving the anode / cathode layer by examining the position of the arriving anode / cathode layer in the image capture just before the emission point.

11. 11. The inspection device (100) of claim 1, wherein the pickup device is movable radially relative to its axis of rotation, and the first image sensor and / or the second image sensor (K1, K2, K1', K2') are configured to capture a first and / or a second image when the pickup device moves radially outward or inward.

12. 1. A method of inspection in the manufacture of a module or a precursor of a module, comprising the following steps: picking up the individual anode / cathode layers (AL, KL) from the transfer points (U1, U2) using at least one pick-up device (156) of the layer diverter (150, 200); rotating the at least one pick-up device (156) of the layer diverter (150, 200) from the transfer point to a discharge point (A1, A2) by a respective rotation angle; detecting a position and / or orientation (x, y, z, and / or θ direction) of the anode layer / cathode layer (AL, KL) on the at least one pickup device (156) of the layer diverter (150, 200) between the transfer point (U1) and the release point (A1) using a first image sensor (K1), the first image sensor (K1) being directed towards a first area (E1) of the layer diverter (150) and the first image sensor (K1) being provided and configured to perform a first image capture when the at least one pickup device of the layer diverter passes over the first image sensor (K1); detecting the position and / or orientation (x, y, z, and / or θ direction) of the anode layer / cathode layer (AL, KL) on the at least one pick-up device (156) of the layer diverter (150, 200) using a second image sensor (K2) between the transfer point (U1, U2) and the release point (A1), the second image sensor (K2) being directed towards a second area (E1) of the layer diverter (150) and the second image sensor (K2) being provided and configured to perform a second image capture when the at least one pick-up device of the layer diverter passes the second image sensor (K2); aligning the pickup device (156) and stack table (400) relative to one another in response to signals based on processing of the first and / or second image captures; and when the at least one pick-up device (156) is at the discharge location (A1, A2), respectively, ejecting the respective individual anode or cathode layers (AL, KL) from the at least one pick-up device (156) onto the stack table (400) at the discharge location (A1, A2) to form a layer stack; 12. A testing method comprising:

13. the first and / or second image sensors (K1, K2) detect the position and / or orientation (x, y, z and / or θ direction) of the anode / cathode layers (AL, KL) in a plan view of ±approximately 25° from the vertical direction when the at least one pickup device of the layer deflector passes over the respective image sensor (K1, K2); and / or a light source (L1, L2) associated with the first and / or second image sensor (K1, K2) for illuminating the anode / cathode layer (AL, KL) for image capture by the first and / or second image sensor (K1, K2); and / or the first image sensor (K1) and / or the second image sensor (K2) completely detect the anode layer / cathode layer (AL, KL) by image capture in order to detect the position and / or orientation (x, y, z and / or θ direction) of the anode layer / cathode layer (AL, KL); and / or The first and / or second image sensors (K1, K2) each capture an image once with respect to a fixed image sensor zero point, region, at least one corner region; two diagonally opposite corner regions, and / or at least one corner region and at least one section of an edge of the anode layer / cathode layer (AL, KL) for detecting the position and / or orientation (x, y, z, and / or θ direction) of the anode layer / cathode layer (AL, KL); and / or 13. The inspection method of claim 12, wherein the first and / or second image sensors (K1, K2) are designed as matrix cameras or as line cameras and detect the position and / or orientation (x, y, z and / or θ direction) of the anode / cathode layers (AL, KL) before or upon arrival at the emission point (A1) or on the way to the emission point (A1).

14. The correction value is the position and / or orientation (x, y, z, and / or θ direction) of the anode layer / cathode layer (AL, KL) after being picked up by the at least one pick-up device of the layer diverter, the position and / or orientation (x, y, z, and / or θ directions) of the stack table (400), and / or determined from the position and / or orientation (x, y, z, and / or θ directions) of the individual anode / cathode layers (AL, KL) picked up during the transfer of the anode / cathode layers (AL, KL) onto the stack table (400); and These correction values ​​are taken into account when aligning (in the x, y, z and / or θ direction) the pick-up device of the layer diverter with the anode / cathode layers (AL, KL) to be transferred relative to the stack table (400) at the discharge points (A1, A2), and / or 14. The inspection method according to claim 12 or 13, wherein these correction values ​​(x, y, z and / or θ directions) are taken into account when aligning the pickup device of the layer deflector so that the anode layer / cathode layer (AL, KL) is received by the stack table (400) in a central zero position and / or in an aligned state.

Images