Circuit board test terminal

Abstract

The present invention relates to a circuit board test terminal, and provides a circuit board test terminal including a board portion and an extension portion extending from the board portion to connect to a test point of a circuit board, the board portion including a plate unit supporting a lower portion, a partition unit formed at a predetermined height on the plate unit by dividing the plate unit into a plurality of compartments, and terminal units arranged in the divided compartments, the terminal units being contacted by test probes for testing the circuit board.

Description

[Technical Field]

[0001] This application claims the benefit of priority based on Korean Patent Application No. 10-2022-0133602, filed on October 17, 2022, and all contents disclosed in the documents of that Korean patent application are incorporated herein by reference.

[0002] The present invention relates to a circuit board test terminal, and more particularly to a terminal for testing an electronic device mounted on a circuit board. [Background technology]

[0003] A PCB (Printed Circuit Board) is an essential component used in almost all electronic devices. It is a printed circuit board that is wired on an insulation plate to connect electrical / electronic components. A PCB is a substrate-like structure in which conductors and insulators are laminated, and multiple electrical / electronic components such as semiconductors, capacitors, and resistors can be mounted. Electrical connections can be made between the mounted electrical / electronic components via the electrical circuits printed on the PCB. By efficiently designing electrical circuits, PCBs can reduce the size of electronic devices and improve their performance and productivity.

[0004] Multiple electrical / electronic devices mounted on a PCB can transmit and receive electrical signals. However, when the volume of electrical signals being transmitted and received is large or when the signals must be processed at high speed, the signal processing speed slows down, resulting in a decrease in PCB performance. To address this slowdown, methods such as increasing the number of PCB layers to expand the accommodating capacity of devices are being used.

[0005] Because it is difficult to visually confirm whether electronic elements such as semiconductors, capacitors, and diodes mounted on PCBs are properly mounted on the PCB, separate test equipment can be used to test whether they are functioning properly. When using a single test device, an operator can perform a test immediately by holding a test probe with one hand and touching a target point on the circuit board with the other, and then touching a ground probe with the other. However, when using multiple types of test devices, testing each device individually as described above can take a long time and make it difficult to visually check the results output by the test devices. Furthermore, when multiple types of test devices are simultaneously connected to target points on the circuit board by soldering or other methods, electrical shorts can occur due to contact between the probes. Furthermore, after testing, an additional process must be performed to remove the test probes, which is inconvenient.

[0006] Therefore, there is a need to develop a technique to solve the above problems. Summary of the Invention [Problem to be solved by the invention]

[0007] The present invention is intended to solve the above problems, and provides a circuit board test terminal that can quickly test electronic components and electrical circuits mounted on a circuit board at once without causing electrical shorts between various types of test equipment when testing whether they are functioning properly. [Means for solving the problem]

[0008] As one embodiment of the present invention, the present invention provides a circuit board test terminal including a board portion and an extension portion extending from the board portion and connected to a test point of a circuit board, the board portion including a plate unit configured to support a lower portion, a partition unit having a predetermined height and arranged on the plate unit to divide the plate unit into a plurality of compartments, and a terminal unit arranged in each divided compartment, the terminal unit being in contact with a test probe configured to test the circuit board.

[0009] The upper end of the bulkhead unit may also define a holding groove of a predetermined depth along the edge of the bulkhead unit.

[0010] Furthermore, an inclined guide hole portion may be defined on the upper surface of the terminal unit, and the inclined guide hole portion may be a hole portion having a predetermined inclination so as to face a retaining recess defined in the partition unit adjacent to the inclined guide hole portion.

[0011] Furthermore, the terminal unit may define a vertical guide hole into which the end of the test probe is inserted in a vertical direction.

[0012] Additionally, the vertical guide hole may be defined in the center of the terminal unit.

[0013] Additionally, the bulkhead unit may include an electrically insulating material.

[0014] Furthermore, the extension portion may include an extension unit having one end connected to the terminal unit, and a coupling unit coupled to the other end of the extension unit and coupled to the test point.

[0015] Furthermore, the coupling unit may be capable of being separated from and coupled to the extension unit.

[0016] Additionally, the coupling unit may include an end portion having a hook shape.

[0017] Furthermore, a plurality of extension units may be provided, one end of each extension unit being connected to a different terminal unit, and a coupling unit may be coupled to the other end of each extension unit and coupled to a plurality of test points.

[0018] The connector may further include a connection unit that electrically connects the terminal unit and the extension unit, and the connection unit may be coupled to one side of the terminal unit.

[0019] In another embodiment of the present invention, the present invention includes a testing device including a circuit board test terminal, a test probe whose end contacts the test terminal, and a ground probe connected to the circuit board and grounded, wherein the circuit board test terminal includes a board portion and an extension portion extending from the board portion and connected to a test point on the circuit board, and the board portion includes a plate unit configured to support a lower portion, a partition unit having a predetermined height and arranged on the plate unit to divide the plate unit into a plurality of compartments, and a terminal unit arranged in each divided compartment, and the terminal unit may be contacted by a test probe configured to test the circuit board. [Effects of the Invention]

[0020] The present invention allows for quick testing of electronic devices mounted on a circuit board to check whether they are functioning properly by easily connecting various types of test equipment and running tests simultaneously. Since various types of test equipment can be run simultaneously, values ​​measured by the test equipment can be easily compared. Furthermore, after a test is run, the test equipment required for execution can be quickly disconnected. [Brief explanation of the drawings]

[0021] [Figure 1] FIG. 2 is a schematic plan view showing a board portion of the present invention. [Figure 2] 2 is a perspective view showing part A of FIG. 1, illustrating how the test probe is held in the inclined guide hole and the holding recess. FIG. [Figure 3] 3(a) is a schematic cross-sectional view taken along line BB' in FIG. 1, and FIG. 3(b) is a schematic cross-sectional view taken along line CC' in FIG. [Figure 4] 1 is a schematic perspective view showing a state in which a terminal unit and an extension portion of the present invention are connected via a connection unit. [Figure 5] 5(a) to 5(d) are schematic diagrams showing various embodiments of the coupling unit of the present invention. [Figure 6] 1 is a schematic perspective view showing how an extension of the present invention is connected to an electronic element mounted on a circuit board. [Figure 7] FIG. 1 is a schematic plan view illustrating one embodiment of a circuit board test assembly. DETAILED DESCRIPTION OF THE INVENTION

[0022] The present invention can be embodied in various different forms and is not limited to the following embodiments.

[0023] In order to clearly explain the present invention, detailed descriptions of parts that are not relevant to the explanation or related prior art that may obscure the gist of the present invention will be omitted. In this specification, when referring to components in each drawing, the same or similar reference numerals will be used throughout the specification to refer to the same or similar components.

[0024] Furthermore, the terms and words used in the specification and claims of this application should not be interpreted in a limited way to their ordinary or dictionary meanings, but should be interpreted in a way that is consistent with the technical idea of ​​the invention of this application, in accordance with the principle that an inventor can appropriately define the concept of terms in order to best explain his or her invention.

[0025] Circuit board test terminal 10 One embodiment of the present invention relates to a circuit board test terminal 10 (hereinafter referred to as the “test terminal”), and the test terminal 10 may include a board portion 100 and an extension portion 150 .

[0026] The board unit 100 is an element for connecting the test probes 210, and may include a plate unit 110, a bulkhead unit 120, and a terminal unit .

[0027] The plate unit 110 has a flat shape with a predetermined area and thickness, and can form the bottom of the test terminal 10 .

[0028] The planar shape of the plate unit 110 is not limited to, but may be, for example, a square, a circle, or the like.

[0029] The plate unit 110 may be disposed below the bulkhead unit 120 and the terminal unit 130 .

[0030] The plate unit 110 is made of an electrically insulating material and can prevent current from flowing between the bottom of the plate unit 110 and the terminal unit 130. Therefore, even if the board unit 100 is moved to any position, electrical noise can be prevented from flowing from the bottom of the board unit 100 to the terminal unit 130.

[0031] The partition unit 120 may be a thin wall disposed on the upper surface of the plate unit 110 in a direction perpendicular to the upper surface so as to divide the plate unit 110 into a plurality of compartments.

[0032] The partition unit 120 may be made of an electrically insulating material so as to shield the terminal units 130 from each other and prevent short circuits from occurring.

[0033] In one embodiment, the partition unit 120 may include a horizontal portion 120a and a vertical portion 120b.

[0034] The horizontal portion 120a is arranged parallel to the edge of one surface of the plate unit 110 and the upper surface of the plate unit 110, and can divide the upper surface of the plate unit 110 into a plurality of sections.

[0035] One or more horizontal portions 120a may be arranged, and the horizontal portions 120a may be arranged on the upper surface of the plate unit 110 according to a predetermined interval or arrangement.

[0036] The vertical portion 120b may be disposed in a direction perpendicular to the horizontal portion 120a or so as to intersect with the horizontal portion 120a at a predetermined angle.

[0037] The upper end of the bulkhead unit 120 may have a retaining recess 121 defined therein.

[0038] The holding recess 121 may be a recess formed to a predetermined depth in at least a part of the edge along the edge of the upper end of the partition wall unit 120 .

[0039] The shape of the holding recess 121 is not limited, but may be, for example, a faceted shape, a curved shape, or the like.

[0040] The test probe 210 may be held in the holding recess 121. An end of the test probe 210 may contact the terminal unit 130, and a side portion of the test probe 210 may contact the holding recess 121, so that the test probe 210 is held in the holding recess 121 at a predetermined angle. A circuit board can be tested using the test probe 210 held in the holding recess 121, and while the test probe 210 is held in the holding recess 121, the worker can perform other work, thereby improving work efficiency.

[0041] The terminal units 130 may be disposed on the plate unit 110 in respective compartments divided by the partition units 120 .

[0042] The terminal unit 130 may include an electrically conductive metal material to contact and electrically connect with the test probe 210. For example, the electrically conductive metal material may be copper, aluminum, gold, silver, etc.

[0043] The terminal unit 130 may have a shape and area corresponding to the shape of the compartments divided by the partition wall unit 120 .

[0044] The terminal unit 130 may be formed in the shape of a plate having a predetermined thickness and width to eliminate the inconvenience of the conventional method of directly contacting the test probes 210 with the pins of the microelectronic elements 320 mounted on the circuit board 300 for testing. Therefore, by simply contacting the test probes 210 with the terminal unit 130, an operator can obtain the same effect as directly contacting the pins of the microelectronic elements 320 connected to the terminal unit 130 via the extensions 150, or the printed electronic circuit, thereby simplifying testing and significantly improving work efficiency.

[0045] The terminal unit 130 may have an angled guide hole 131 and a vertical guide hole 132 defined therein.

[0046] Referring to Figures 2 and 3(b), the inclination guiding hole portion 131 allows the end of the test probe 210 to be inserted to increase the contact area between the test probe 210 and the terminal unit 130, and forms an inclination in the direction in which the test probe 210 is arranged so that it can be held in the holding recess 121.

[0047] The inclined guide hole portion 131 may be defined on the upper surface of the terminal unit 130 at a predetermined distance from the partition unit 120, and may also be positioned closer to the edge of the terminal unit 130 than the vertical guide hole portion 132.

[0048] 2 and 3(b), the inclination guiding hole 131 may have a predetermined inclination so that an imaginary center line connecting the center of the open upper surface of the inclination guiding hole 131 and the apex of the lower end faces the holding recess 121. Therefore, the end of the test probe 210 is inserted into the inclination guiding hole 131, and the side surface is held in the holding recess 121, so that the test probe 210 can be tilted at a predetermined angle. In other words, the inclination guiding hole 131 and the holding recess 121 corresponding to the inclination guiding hole 131 are arranged adjacent to each other at a short distance, which makes it easy to hold the test probe 210.

[0049] A plurality of inclination guiding holes 131 may be arranged along the edge of the terminal unit 130. By arranging a plurality of inclination guiding holes 131, a plurality of types of test probes 210 for measuring different values ​​can be inserted into different inclination guiding holes 131 in one terminal unit 130 at one time, and the plurality of types of test probes 210 can measure values ​​of the same electronic element 320 electrically connected to the terminal unit 130 at one time.

[0050] Since the end of the test probe 210 is inserted into and fixed in the inclination guide hole 131, the position of the test probe 210 held in the holding recess 121 can also be stably fixed.

[0051] 3(a), the vertical guide hole 132 may be defined in the center of the top surface of the terminal unit 130. The vertical guide hole 132 may be arranged such that an imaginary center line connecting the center of the opened top surface and the apex of the bottom end faces the center of the opened top surface.

[0052] The vertical guide hole portion 132 may be formed to be deeper than the inclined guide hole portion 131 and with a narrower open upper surface so that when the end of the test probe 210 is inserted, the test probe 210 can stand in a direction perpendicular to the upper surface of the terminal unit 130 without being held in the holding recess 121.

[0053] Since the vertical guide hole portion 132 and the inclined guide hole portion 131 are formed in one terminal unit 130, multiple types of test probes 210 measuring different values ​​can be inserted into the inclined guide hole portion 131 and the vertical guide hole portion 132 at the same time, and the multiple types of test probes 210 can measure the values ​​of the same electronic element 320 electrically connected to the terminal unit 130 at the same time.

[0054] The vertical guide hole portion 132 and the inclined guide hole portion 131 may be spaced apart by a predetermined distance to prevent contact between the inserted test probes 210. If contact occurs between the test probes 210, current may flow between the test probes 210, causing an electrical short circuit. However, since the vertical guide hole portion 132 and the inclined guide hole portion 131 are spaced apart by a predetermined distance, the distance between the test probes 210 is also increased, preventing the above problem from occurring.

[0055] Since the end of the test probe 210 is inserted into the vertical guide hole 132 to fix the position, the position of the test probe 210 can also be stably fixed.

[0056] The connection unit 140 is disposed on one side of the terminal unit 130 and can connect the terminal unit 130 and the extension 150 .

[0057] The connection unit 140 may be coupled to one side of the terminal unit 130. The coupling method is not limited to, but may be, for example, a method in which the lower end of the connection unit 140 is welded to one side of the upper surface of the terminal unit 130, or a method in which the connection unit 140 is coupled to one side of the terminal unit 130 with a screw using a spiral thread formed on the body of the connection unit 140.

[0058] The connection unit 140 can electrically connect the terminal unit 130 and the extension 150. The connection unit 140 may include an electrically conductive metal material to electrically connect the terminal unit 130 and the extension 150. The connection unit 140 may include, but is not limited to, copper, aluminum, silver, gold, tungsten, or the like.

[0059] 4, the connection unit 140 may include a body 141 disposed in a direction perpendicular to the upper surface of the terminal unit 130, and a head 142 formed on the upper end of the body 141. The body 141 may have a shape such as a cylinder, a rectangular prism, or a polygonal prism, and the terminal unit 130 and the extension 150 may be connected to each other by coupling the extension unit 151 of the extension 150 to the body 141.

[0060] The extension 150 may include an extension unit 151 and a coupling unit 152 .

[0061] The extension portion 150 allows the board portion 100 to be spaced apart from the circuit board 300 at any desired distance, allowing the electronic elements 320 mounted on the circuit board 300 to be tested by the test device 200 regardless of their position.

[0062] The extension unit 151 may have one end connected to the terminal unit 130 and the other end coupled to the coupling unit 152. Specifically, the extension unit 151 may be connected to a body of the connection unit 140, one end of which is coupled to the terminal unit 130.

[0063] 4, the extension unit 151 may have an annular structure made of an electrically conductive metal material formed on one end thereof. The annular structure can be hooked onto the body 141 of the connection unit 140 to quickly connect the extension unit 151 and the connection unit 140.

[0064] The extension unit 151 may include an extension wire extending from a hook-shaped structure formed at one end toward the other end. The extension wire may include a metal layer (not shown) made of an electrically conductive material connected to the hook-shaped structure formed at one end of the extension unit 151, and an electrically insulating layer (not shown) covering the outer surface of the metal layer along the length with an electrically insulating material. The metal layer and the electrically insulating layer of the extension wire may be made of a plastically deformable material that can be easily bent or curved when force is applied. For example, the metal layer may be made of copper, aluminum, or the like, and the electrically insulating layer may be made of natural rubber, synthetic rubber, synthetic resin, or the like.

[0065] The other end of the extension unit 151 may be coupled to a coupling unit 152 .

[0066] The coupling unit 152 may be coupled to the extension unit 151 in a structure that allows it to be separated and coupled to the extension unit 151 .

[0067] The coupling unit 152 may include a coupling portion 153, a support portion 154, and hook portions 152a, 152b, 152c, and 152d.

[0068] A coupling portion 153 that can be coupled to the other end of the extension unit 151 may be formed at one end of the coupling unit 152. The coupling portion 153 may be, for example, a bolt, and the coupling portion 153 may perform bolt coupling that allows separation and coupling to the other end of the extension unit 151.

[0069] The support portion 154 may have a connecting portion 153 at one end and hook portions 152a, 152b, 152c, and 152d at the other end.

[0070] The support portion 154 may be formed in a faceted cylinder shape, such as a square prism or a pentagonal prism. Because the support portion 154 has a square prism shape, it can be stably positioned on the circuit board 300 without rolling. Therefore, the hook portions 152a, 152b, 152c, and 152d can stably support the positions on the circuit board 300 where they are coupled to the electronic element 320 and adjacent positions thereto.

[0071] Since the support portion 154 includes an electrically insulating material, even if the support portion 154 comes into contact with other printed electrical circuits on the circuit board 300, the support portion 154 can prevent current from flowing through the coupling unit 152.

[0072] Various embodiments of the hooks 152a, 152b, 152c, and 152d will be described below with reference to FIG.

[0073] Referring to FIGS. 5(a) and 6, in one embodiment of the present invention, a first hook 152a may be formed at the other end of the coupling unit 152. The first hook 152a is formed by only half or less of the circumference of a circular hook, and is not limited to a circular hook, but may also be an elliptical hook or other closed curve-shaped hook. The first hook 152a is formed with a structure that can easily hook onto a pin of the electronic component 320 on the circuit board 300, allowing for quick coupling. The first hook 152a may be made of an electrically conductive metal material, and the outer surface of the hook, excluding the inner surface that contacts the pin, may be covered with an electrically insulating material to prevent short circuits caused by contact with adjacent pins.

[0074] 5(b), in another embodiment of the present invention, a second hook 152b may be formed at the other end of the coupling unit 152. The second hook 152b may be formed in a circular hook shape. The second hook 152b may be made of an electrically conductive metal material, and the outer surface of the circular hook, excluding the inner surface that contacts the pin of the electronic element 320, may be covered with an electrically insulating material to prevent short circuits caused by contact with adjacent pins.

[0075] 5(c), in yet another embodiment of the present invention, a third hook 152c may be formed at the other end of the coupling unit 152. The third hook 152c may be formed in a V- or Y-shaped hook. The third hook 152c may be made of an electrically conductive metal material, and the outer surface of the V- or Y-shaped hook, excluding the inner surface that contacts the pin of the electronic element 320, may be covered with an electrically insulating material to prevent contact with adjacent pins and resulting in a short circuit.

[0076] Referring to FIG. 5(d), in yet another embodiment of the present invention, a fourth hook 152d may be formed at the other end of the coupling unit 152. The fourth hook 152d is formed by more than half the circumference of a circular hook, and is not limited to a circular hook, but may also be an elliptical hook or another closed curve hook. The fourth hook 152d may be made of an electrically conductive metal material, and the outer surface of the hook, excluding the inner surface that contacts the pin of the electronic element 320, may be coated with an electrically insulating material to prevent short circuits caused by contact with adjacent pins.

[0077] Circuit Board Test Assembly 20 7, the circuit board test assembly 20 may include a circuit board test terminal 10 and a test device 200. The test device 200 may include a test probe 210 whose end contacts the terminal unit 130 of the test terminal 10, and a ground probe 220 whose end is connected to a ground point 310 of the circuit board 300 for grounding.

[0078] By grounding the ground probe 220, the test device 200 can set a reference value for the value measured by the test probe 210, reduce noise entering the test probe 210, and improve the reliability of the value measured by the test probe 210.

[0079] The test probe 210 can contact the terminal unit 130 and test whether the electronic elements 320, printed electrical circuits, etc. electrically connected to the circuit board test terminal 10 are operating normally on the circuit board 300.

[0080] The circuit board 300 may be any of various types of circuit boards, including, but not limited to, a PCB (Printed Circuit Board), an FPCB (Flexible Printed Circuit Board), an RF-PCB (Rigid-Flexible Printed Circuit Board), or an HDI (High Density Interconnection), and is preferably a PCB board.

[0081] An electric circuit may be printed on the circuit board 300 using printed electronics, and an electronic element 320 may be mounted at a predetermined position.

[0082] For a detailed description of the circuit board test terminal 10, please refer to the above description.

[0083] The present invention has been described above using limited embodiments and drawings, but the present invention is not limited to these, and various implementations are possible within the technical spirit of the present invention and the scope of equivalents of the appended claims by a person having ordinary skill in the art to which the present invention pertains. [Explanation of symbols]

[0084] 10 Circuit board test terminal 20 Circuit Board Test Assembly 100 Board Section 110 Plate Unit 120 Partition unit 120a side part 120b Vertical section 121 Retaining recess 130 Terminal Unit 131 Inclined guide hole 132 Vertical guide hole 140 Connection Unit 150 Extension 151 Extension unit 152 Combined Unit 200 Test Equipment 210 test probe 300 Circuit Boards 310 Grounding Point 320 Electronic Elements

Claims

1. The board section and an extension portion extending from the board portion and connected to a test point on a circuit board; The board portion is a plate unit configured to support the lower portion; a partition wall unit disposed on the plate unit so as to divide the plate unit into a plurality of compartments, the partition wall unit having a predetermined height; a terminal unit disposed in each divided section; A circuit board test terminal, in which a test probe configured to test the circuit board is in contact with the terminal unit.

2. 2. The circuit board test terminal according to claim 1, wherein a holding recess of a predetermined depth is defined at the upper end of said partition unit along the edge of said partition unit.

3. An inclined guide hole is defined on the upper surface of the terminal unit; 3. The circuit board test terminal according to claim 2, wherein the inclination guide hole portion is a hole portion having a predetermined inclination so as to face the holding recess portion defined in the partition wall unit adjacent to the inclination guide hole portion.

4. 4. The circuit board test terminal according to claim 1, wherein the terminal unit is provided with a vertical guide hole into which the end of the test probe is inserted in a vertical direction.

5. 5. The circuit board test terminal according to claim 4, wherein the vertical guide hole is defined in the center of the terminal unit.

6. The circuit board test terminal according to claim 1 , wherein the partition unit includes an electrically insulating material.

7. The extension portion is an extension unit having one end connected to the terminal unit; 4. The circuit board test terminal according to claim 1, further comprising: a coupling unit coupled to the other end of the extension unit and coupled to the test point.

8. The circuit board test terminal according to claim 7 , wherein the coupling unit is connectable to and disconnectable from the extension unit.

9. The circuit board test terminal according to claim 7 , wherein the coupling unit includes an end portion having a hook shape.

10. A plurality of the extension units are provided, and one end of each extension unit is connected to a different terminal unit; 8. The circuit board test terminal according to claim 7, wherein the coupling unit is coupled to the other end of each extension unit and is coupled to a plurality of test points.

11. a connection unit that electrically connects the terminal unit and the extension unit; 8. The circuit board test terminal according to claim 7, wherein the connection unit is coupled to one side of the terminal unit.

12. a circuit board test terminal; a test device including a test probe whose end is in contact with the circuit board test terminal, and a ground probe connected to the circuit board and grounded; The circuit board test terminal is The board section and an extension portion extending from the board portion and connected to a test point on a circuit board; The board portion is a plate unit configured to support the lower portion; a partition wall unit disposed on the plate unit so as to divide the plate unit into a plurality of compartments, the partition wall unit having a predetermined height; a terminal unit disposed in each divided section; The circuit board test assembly includes a terminal unit contacted by a test probe configured to test the circuit board.

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