Setting method and program

Abstract

To provide a method for setting an N-th order function in a control circuit for applying a control voltage generated by using the N-th order function to a voltage controlled oscillator.SOLUTION: A method of setting an Nth-order function in a control circuit that applies a control voltage generated using the Nth-order function to a voltage-controlled oscillator includes setting an initial value of a center temperature, acquiring a first variation amount of a term of each order at a plurality of temperatures when a gain of at least one order in the Nth-order function is varied, and setting a gain of each order of the Nth-order function and the center temperature based on a deviation amount of the first variation amount per unit temperature when the center temperature is shifted from the initial value and the first variation amount.SELECTED DRAWING: Figure 4

Description

[Technical Field]

[0001] The present invention relates to a setting method and a program. [Background technology]

[0002] Patent Documents 1 to 3 describe temperature compensated crystal oscillation circuits and the like. [Prior art document] [Patent Documents] Patent Document 1: International Publication No. 2004 / 025824 Patent Document 2: Japanese Patent Application Laid-Open No. 2002-76774 Patent Document 3: JP 2016-178606 A Summary of the Invention

[0003] In a first aspect of the present invention, there is provided a method for setting an Nth-order function in a control circuit that applies a control voltage generated using the Nth-order function to a voltage-controlled oscillator, the method comprising the steps of: setting an initial value of a central temperature of the Nth-order function; acquiring a first variation amount of each order term when the gain of at least one order in the Nth-order function is varied at multiple temperatures; and setting the gain of each order of the Nth-order function and the central temperature based on the deviation amount of the first variation amount per unit temperature when the central temperature is shifted from its initial value and the first variation amount.

[0004] The above setting method may include a step of acquiring, at a plurality of temperatures, a second variation of each order term when an input voltage to a control circuit corresponding to the temperature of the voltage-controlled oscillator is added by a voltage corresponding to a shift amount by which the central temperature is shifted from an initial value; a step of acquiring a third variation of each order term when the temperature is shifted by the shift amount, for the relationship between the temperature and the first variation of each order term of an N-th order function in which the central temperature is the initial value; and a step of calculating, for each order, a deviation amount of the first variation per unit temperature based on the difference between the second variation amount and the third variation amount.

[0005] The setting method may further include a step of calculating the deviation amount of the first variation amount per unit temperature for each order by dividing the difference between the second variation amount and the third variation amount by the shift amount.

[0006] In the above setting method, the step of setting the gain of each order of the Nth-order function and the central temperature may include the steps of generating a first function by multiplying the gain of each order by a first component corresponding to the third fluctuation amount of the term of each order and a second component obtained by multiplying the deviation amount by the shift amount by which the central temperature is shifted from its initial value, and setting the gain of each order of the Nth-order function and the central temperature so that the difference between the first function and the target characteristic of the control circuit is less than a predetermined threshold value.

[0007] In the above setting method, the step of setting the gain of each order of the Nth-order function and the central temperature may include the steps of: generating a second function by incorporating a first component corresponding to a third variation amount of each order term by the gain of each order; determining candidate values ​​for the gain of each order of the Nth-order function and candidate values ​​for the central temperature so that a difference between the second function and the target characteristic of the control circuit is less than a predetermined threshold; generating a third function by incorporating a second component obtained by multiplying the deviation amount by a shift amount by which the central temperature is shifted from its initial value into the second function; and setting the gain of each order of the Nth-order function and the central temperature using the candidate values ​​for the gain of each order and the candidate values ​​for the central temperature so that a difference between the third function and the target characteristic of the control circuit is less than a predetermined threshold.

[0008] In the above setting method, the step of setting the gain of each order of the Nth-order function and the central temperature may include a step of substituting the gain of each order and the central temperature based on candidate values ​​for the gain of each order and candidate values ​​for the central temperature into a third function, thereby setting the gain of each order of the Nth-order function and the central temperature so that the difference between the third function and the target characteristic of the control circuit is less than a predetermined threshold.

[0009] In a second aspect of the present invention, there is provided a program for causing a computer to execute any of the setting methods described above.

[0010] The above summary of the invention does not list all of the necessary features of the present invention, and subcombinations of these features may also constitute inventions. [Brief explanation of the drawings]

[0011] [Figure 1] 1 shows an example of the configuration of a temperature compensated oscillator 10 according to this embodiment. [Figure 2] 2 shows an example of the configuration of a fourth-order temperature compensation circuit 120. [Figure 3] 1 shows an example of the configuration of a setting device 50. [Figure 4] 1 shows a setting operation by the setting device 50. [Figure 5] The relationship between temperature and control voltage Vccal is shown. [Figure 6] 1 shows the relationship between the first fluctuation amount fn(T−T0) and temperature. [Figure 7] An example in which the input voltage Vtmp input to the control circuit 40 is shifted by the adder 110 will be shown. [Figure 8] An example of shifting the third-order first fluctuation amount f3(T-T0) in the temperature direction is shown. [Figure 9] An example of shifting the fourth-order first fluctuation amount f4(T-T0) in the temperature direction is shown. [Figure 10] A fourth-order temperature compensation circuit 120 is partially shown. [Figure 11] 10(a) shows the input voltage Vtmp2 to the fourth-order temperature compensation circuit 120, and (b) and (c) show the current I2 flowing through the second transistor 210. [Figure 12] The first fluctuation amount f4(T-T0), the second fluctuation amount f4(T-T0-ΔT), the third fluctuation amount f4(T-T0-ΔT)', and the deviation amount dTerror4×ΔT for the fourth-order term are shown. [Figure 13] An example is shown in which the gain of each degree of the Nth-order function and the shift amount ΔT from the initial value of the central temperature are calculated using the least squares method. [Figure 14]An example of calculating the optimal gain and central temperature using candidate values ​​for the gain of each order of the Nth-order function and candidate values ​​for the central temperature is shown below. [Figure 15] 22 illustrates an example computer 2200 in which aspects of the present invention may be embodied, in whole or in part. DETAILED DESCRIPTION OF THE INVENTION

[0012] The present invention will be described below through embodiments of the invention, but the following embodiments do not limit the scope of the invention according to the claims. Furthermore, not all of the combinations of features described in the embodiments are necessarily essential to the solution of the invention.

[0013] 1 shows an example of the configuration of a temperature compensated oscillator 10 according to this embodiment. The temperature compensated oscillator 10 suppresses frequency fluctuations of a voltage controlled oscillator 20 due to temperature changes within a predetermined compensated temperature range. One example of the temperature compensated oscillator 10 is a TCXO (temperature compensated crystal oscillator). The temperature compensated oscillator 10 includes the voltage controlled oscillator 20, a temperature sensor 30, a control circuit 40, and a setting device 50.

[0014] When the oscillator used in the voltage-controlled oscillator 20 is an AT-cut quartz crystal oscillator, the frequency-temperature characteristics have first- and third-order components as the main components, and therefore, when the frequency-temperature characteristics are approximated to the fourth order, they can be expressed by the following equation 1.

[0015]

number

[0016] Here, in Equation 1, Δf / f(T) represents the frequency-temperature characteristic of the voltage-controlled oscillator 20, αn represents the gain at the nth order, T represents the temperature of the voltage-controlled oscillator 20, and T0 represents the center temperature (i.e., the temperature of the center of rotation) of the voltage-controlled oscillator 20. T0 may be the temperature at the inflection point of the third-order component of the frequency-temperature characteristic, and as an example, in an AT-cut quartz voltage-controlled oscillator 20, T0 fluctuates by approximately 28°±5° depending on the product quality, etc.

[0017] If the voltage-frequency characteristic of the voltage-controlled oscillator 20 is considered to be a linear function that is independent of temperature, the frequency-temperature characteristic can be compensated for by setting the input voltage VCOUT(T) to the voltage-controlled oscillator 20 to satisfy the formula 2 (note that the proportionality coefficients of each order are omitted).

[0018]

number

[0019] Here, in Equation 2, VCOUT(T) represents the control voltage output from the control circuit 40 at temperature T, βn represents the gain at order n, T represents the temperature of the voltage-controlled oscillator 20, and T0 represents the central temperature, which may be the temperature of the inflection point of the third-order component of the N-th-order function generated by the control circuit 40. At this time, since T0 in Equation 1 varies depending on the quality of the product, etc., in order to perform temperature compensation with high precision, it is necessary to vary T0 in Equation 2 (i.e., the central temperature set in the control circuit 40) accordingly.

[0020] The temperature sensor 30 is connected to the control circuit 40. The temperature sensor 30 detects the temperature of the voltage-controlled oscillator 20 and outputs a sense voltage V tmp to the control circuit 40. The temperature sensor 30 is arranged in contact with or in the vicinity of the voltage-controlled oscillator 20, and may detect the temperature of the voltage-controlled oscillator 20 itself or the temperature of the ambient environment of the voltage-controlled oscillator 20. The temperature sensor 30 outputs a sense voltage V that changes linearly with temperature changes. tmp may be output.

[0021] The control circuit 40 applies a control voltage VCOUT generated using an N-th order function (where N is an integer equal to or greater than 2) to the voltage-controlled oscillator 20. The control circuit 40 may compensate for the temperature characteristics of the frequency of the voltage-controlled oscillator 20 by using the N-th order function to generate the control voltage VCOUT according to temperature changes in the voltage-controlled oscillator 20. The control circuit 40 includes an offset voltage supplying unit 100, an adding unit 110, a fourth-order temperature compensation circuit 120, a first amplifier 125, a third-order temperature compensation circuit 130, a second amplifier 135, a first-order temperature compensation circuit 140, a third amplifier 145, a zero-order temperature compensation circuit 150, and a control voltage supplying circuit 160.

[0022] Here, the control circuit 40 of this embodiment generates the control voltage using an approximate quartic function (N=4) obtained by fourth-order approximation of the frequency-temperature characteristic of the voltage-controlled oscillator 20, but is not limited to this, and the control circuit 40 may use an N-th order function (N≧5) that approximates the frequency-temperature characteristic of the voltage-controlled oscillator 20 with an order of 5 or more. In this case, the control circuit 40 may further include a temperature compensation circuit and an amplifier corresponding to the order.

[0023] The offset voltage supplying unit 100 is connected to the adding unit 110. The offset voltage supplying unit 100 may output a preset offset voltage to the adding unit 110. The offset voltage supplying unit 100 may output an offset voltage corresponding to the center temperature of the Nth-order function.

[0024] The adder 110 is connected to the temperature sensor 30. The adder 110 calculates the sense voltage V tmp The offset voltage output by the offset voltage supply unit 100 is added to the sum signal V tmp2 In this case, to change the central temperature T0 of equation (2), V tmp By changing the offset added to V tmp2 Just shift the

[0025] The fourth-order temperature compensation circuit 120 is connected to the adder 110. The fourth-order temperature compensation circuit 120 converts V tmp2In response to this, a fourth-order component signal of the Nth-order function (that is, a voltage or current corresponding to the value of the fourth-order term of the Nth-order function) may be output.

[0026] The first amplifier 125 is connected to the fourth-order temperature compensation circuit 120. The first amplifier 125 may amplify the fourth-order component signal output by the fourth-order temperature compensation circuit 120 by a preset gain β4 and output the amplified signal.

[0027] The third-order temperature compensation circuit 130 is connected to the adder 110. The third-order temperature compensation circuit 130 converts V tmp2 In response to the above, a third-order component signal of the Nth-order function (that is, a voltage or current corresponding to the value of the third-order term of the Nth-order function) may be output.

[0028] The second amplifier 135 is connected to the third-order temperature compensation circuit 130. The second amplifier 135 may amplify the third-order component signal output by the third-order temperature compensation circuit 130 by a preset gain β3 and output the amplified signal.

[0029] The first-order temperature compensation circuit 140 is connected to the adder 110. The first-order temperature compensation circuit 140 receives the V tmp2 In response to the above, a first-order component signal of the N-th order function (that is, a voltage or current corresponding to the value of the first-order term of the N-th order function) may be output.

[0030] The third amplifier 145 is connected to the first-order temperature compensation circuit 140. The third amplifier 145 may amplify the first-order component signal output by the first-order temperature compensation circuit 140 by a preset gain β1 and output the amplified signal.

[0031] The zeroth-order temperature compensation circuit 150 is connected to the control voltage supply circuit 160. The zeroth-order temperature compensation circuit 150 may output a zeroth-order component signal of an Nth-order function (i.e., a voltage corresponding to the value of the zeroth-order term of the Nth-order function). The zeroth-order temperature compensation circuit 150 may output a voltage according to a preset gain β0 (for example, a voltage or current obtained by multiplying a reference voltage input to the zeroth-order temperature compensation circuit 150 by the gain β0) as the zeroth-order component signal.

[0032] The control voltage supply circuit 160 is connected to the first amplifier 125, the second amplifier 135, the third amplifier 145, and the voltage-controlled oscillator 20. The control voltage supply circuit 160 may output a control voltage VCOUT according to the outputs of the first amplifier 125, the second amplifier 135, the third amplifier 145, and the zero-order temperature compensation circuit 150 to the voltage-controlled oscillator 20. The control voltage supply circuit 160 may generate the control voltage VCOUT by adding together the output signals of the first amplifier 125, the second amplifier 135, the third amplifier 145, and the zero-order temperature compensation circuit 150.

[0033] The setting device 50 is connected to the control circuit 40. The setting device 50 may be a computer such as a personal computer (PC), a tablet computer, a smartphone, a workstation, a server computer, or a general-purpose computer, or may be a computer system in which multiple computers are connected. Such a computer system is also a computer in the broad sense. The setting device 50 may also be implemented as one or more virtual computer environments executable within a computer.

[0034] The setting device 50 may calculate and set various setting values ​​for the control circuit 40. The setting device 50 sets an Nth-order function in the control circuit 40. For example, the setting device 50 may set the gain β and the central temperature of each order of the Nth-order function in the control circuit 40.

[0035] 2 shows an example configuration of the fourth-order temperature compensation circuit 120. The fourth-order temperature compensation circuit 120 includes a power supply VDD, a reference voltage VSS (ground, for example), a first transistor 200, a second transistor 210, a third transistor 220, a fourth transistor 230, a fifth transistor 240, a sixth transistor 250, a seventh transistor 260, and an eighth transistor 270.

[0036] The first transistor 200 has a collector terminal and an emitter terminal connected in series to a power supply VDD and a reference voltage VSS, and a base terminal connected to a first reference voltage Vref1 The second transistor 210 has a collector terminal and an emitter terminal connected in series to the output terminal of the fourth-order temperature compensation circuit 120 and the reference voltage VSS, and is connected in parallel to the first transistor 200. The second transistor 210 has a base terminal connected to the adder 110 and a sense voltage V tmp Voltage (additional voltage) V tmp2 The second transistor 210 and the first transistor 200 form a differential pair.

[0037] The third transistor 220 has a collector terminal and an emitter terminal connected in series to a power supply VDD and a reference voltage VSS, and a base terminal connected to a second reference voltage V ref2 The fourth transistor 230 has a collector terminal and an emitter terminal connected in series to the output terminal of the fourth-order temperature compensation circuit 120 and the reference voltage VSS, and is connected in parallel to the third transistor 220. The fourth transistor 230 has a base terminal connected to the adder 110 and a sense voltage V tmp Voltage (additional voltage) V tmp2 The fourth transistor 230 and the third transistor 220 form a differential pair.

[0038] The fifth transistor 240 has a collector terminal and an emitter terminal connected in series to the power supply VDD and the reference voltage VSS, a base terminal connected to the adder 110, and a sense voltage V tmp Voltage (additional voltage) V tmp2 The sixth transistor 250 has a collector terminal and an emitter terminal connected in series to the output terminal of the fourth-order temperature compensation circuit 120 and the reference voltage VSS, and a base terminal connected to the third reference voltage V ref3 The sixth transistor 250 is connected in parallel with the fifth transistor 240, and forms a differential pair with the fifth transistor 240.

[0039] The seventh transistor 260 has a collector terminal and an emitter terminal connected in series to the power supply VDD and the reference voltage VSS, a base terminal connected to the adder 110, and a sense voltage V tmp Voltage (additional voltage) Vtmp2 The eighth transistor 270 has a collector terminal and an emitter terminal connected in series to the output terminal of the fourth-order temperature compensation circuit 120 and the reference voltage VSS, and a base terminal connected to the fourth reference voltage V ref4 The eighth transistor 270 is connected in parallel with the seventh transistor 260, and forms a differential pair with the seventh transistor 260.

[0040] The fourth-order temperature compensation circuit 120 generates a first reference voltage V ref1 , second reference voltage V ref2 , the third reference voltage V ref3 , the fourth reference voltage V ref4 , and the sense voltage V tmp Voltage (additional voltage) V tmp2 is input, currents I0_1, I0_2, I0_3, and I0_4 flow, and a current Iout of a fourth-order component signal that changes fourth-order with respect to temperature change is output from the output terminal of the fourth-order temperature compensation circuit 120. Note that the first reference voltage V ref1 , second reference voltage V ref2 , the third reference voltage V ref3 , and the fourth reference voltage V ref4 may be set to different voltages and may be supplied from inside or outside the control circuit 40.

[0041] 3 shows an example configuration of the setting device 50. The setting device 50 includes an acquisition unit 300, a calculation unit 310, and an output unit 320. The acquisition unit 300 is connected to at least one of an input device (such as a PC, a mouse, or a keyboard) that receives user input, the control circuit 40, and the voltage-controlled oscillator 20. The acquisition unit 300 may acquire various data necessary to calculate multiple setting values ​​(gain β and core temperature) related to the Nth-order function from at least one of the input device, the control circuit 40, and the voltage-controlled oscillator 20. The acquisition unit 300 outputs the acquired data to the calculation unit 310.

[0042] The calculation section 310 is connected to the output section 320. The calculation section 310 may use the data acquired by the acquisition section 300 to calculate a plurality of setting values ​​related to the Nth-order function.

[0043] The output unit 320 is connected to the control circuit 40. The output unit 320 may output the setting value calculated by the calculation unit 310 to the control circuit 40 to set it. The output unit 320 does not have to be connected to the control circuit 40, and may display the calculated setting value to allow the user to set the setting value in the control circuit 40.

[0044] 4 shows the setting operation of the setting device 50. In the first example shown below, the setting device 50 sets the compensation temperature range to -30 to 85°C, as an example, and sets the gain βn (βn indicates the gain of the n-th order term in the N-th order function) of a quartic function (N=4) used in the control circuit 40 and the central temperature.

[0045] In step S400, the setting device 50 starts from the temperature T of the voltage-controlled oscillator 20=−30 degrees.

[0046] In step S410, the environmental temperature of the voltage-controlled oscillator 20 is set to a temperature T (initially -30 degrees).

[0047] In step S420, the acquisition unit 300 acquires the control voltage V at which the absolute value of the difference between the output frequency of the voltage-controlled oscillator 20 and the target frequency is less than a predetermined threshold value at the temperature T (for example, the output frequency and the target frequency match). ccal The acquisition unit 300 controls the control circuit 40 and the voltage-controlled oscillator 20 to acquire the actually measured control voltage V ccal The acquisition unit 300 may acquire the control voltage V ccal and the output frequency may be obtained.

[0048] In step S430, the setting device 50 performs a step of setting an initial value T0 of the central temperature of the Nth-order function generated by the control circuit 40. The calculation unit 310 may set the initial value T0 of the central temperature by incorporating into the Nth-order function an initial value T0 of the central temperature that is predetermined for each characteristic (serial number, material, type, shape, etc.) of the resonator used in the voltage-controlled oscillator 20. The acquisition unit 300 may acquire the initial value T0 of the central temperature from a user.

[0049] In step S440, the setting device 50 performs a step of acquiring a first fluctuation amount fn(T-T0) for each order term when at least one order of gain βn is varied in the N-th order function. The setting device 50 may acquire, for each order term of the N-th order function, the rate of change of the output voltage when the code determining the gain βn is varied from G1 to G2 as the first fluctuation amount fn(T-T0). For each order term, the setting device 50 may acquire, as the first fluctuation amount fn(T-T0), the difference in output voltage per unit programmable gain code of the amplifiers (first amplifier 125, second amplifier 135, and third amplifier 145) in the control circuit 40.

[0050] For example, the acquiring unit 300 may acquire the output voltage of the third amplifier 145 when the codes determining the gain β1 of the third amplifier 145 are set to G1 and G2, respectively, for the first-order term of the N-th order function at temperature T (for example, when G1=20, β1=0.03, and when G2=21, β1=0.032), and the calculating unit 310 may calculate the first fluctuation amount f1(T−T0) for the first order by dividing the difference between the output voltage for G1 and the output voltage for G2 by the difference between G1 and G2.

[0051] For example, the acquiring unit 300 may acquire the output voltage of the second amplifier 135 when the codes determining the gain β3 of the second amplifier 135 are set to G1 and G2, respectively, for the third-order term of an Nth-order function at temperature T (for example, when G1=6, β3=0.2×10^(-3), and when G2=7, β3=0.22×10^(-3)). The calculating unit 310 may divide the difference between the output voltage for G1 and the output voltage for G2 by the difference between G1 and G2 to calculate the first fluctuation amount f3(T-T0) for the third order.

[0052] For example, the acquiring unit 300 may acquire the output voltage of the first amplifier 125 when the codes determining the gain β4 of the first amplifier 125 are set to G1 and G2 (for example, G1=10, G2=11) for the fourth-order term of the N-th order function at temperature T. The calculating unit 310 may calculate the first variation amount f4(T−T0) for the fourth order by dividing the difference between the output voltage for G1 and the output voltage for G2 by the difference between G1 and G2.

[0053] The calculation section 310 may acquire the first fluctuation amount fn(T−T0) of each degree term as shown in the following equation 3.

[0054]

number

[0055] Here, in Equation 3, fn(T-T0) denotes the first fluctuation amount fn(T-T0) of the nth order term at temperature T, G1 and G2 denote codes that determine the gain βn, VCOUT(G1) denotes the output voltage corresponding to the nth order term when the code that determines the gain βn is G1, and VCOUT(G2) denotes the output voltage corresponding to the nth order term when the code that determines the gain βn is G2.

[0056] The acquiring section 300 may acquire the actually measured output voltage corresponding to each order when the code determining the gain βn is set to G1 and G2, respectively, by controlling the control circuit 40 and the voltage-controlled oscillator 20. Furthermore, the acquiring section 300 may acquire the output voltage corresponding to each order when the code determining the gain βn is set to G1 and G2, respectively, by a simulation using the characteristics of the control circuit 40.

[0057] In step S450, if the temperature T is not the upper limit of the temperature compensation range (85 degrees in this embodiment) (No in FIG. 4), the setting device 50 changes the temperature T (for example, to the current temperature T+5 degrees) and returns to step S410. If the current temperature T is the upper limit of the temperature compensation range (Yes in FIG. 4), the setting device 50 proceeds to the next step S460.

[0058] This allows the setting device 50 to calculate the control voltage V ccal and the first fluctuation amount fn(T-T0). The setting device 50 can obtain the obtained control voltage V ccal and the first fluctuation amount fn(T-T0), the temperature and control voltage V ccal A function showing the relationship between the temperature and the first fluctuation amount fn(T−T0) can be obtained for each order.

[0059] Figure 5 shows the relationship between temperature and control voltage V ccal 5, the vertical axis represents the voltage value and the horizontal axis represents the temperature. The setting device 50 controls the temperature and the control voltage V ccal It is possible to obtain a function that shows the relationship between V ccal An offset voltage may be applied to the

[0060] FIG. 6 shows the relationship between temperature and the first variation amount fn(T-T0). FIG. 6 shows the first variation amount f1(T-T0) for the first order, the first variation amount f3(T-T0) for the third order, and the first variation amount f4(T-T0) for the fourth order. In FIG. 6, the vertical axis represents the voltage value, and the horizontal axis represents the temperature. The setting device 50 can obtain a function showing the relationship between temperature and the first variation amount fn(T-T0) as shown in FIG. 6 for each order.

[0061] In step S460 of FIG. 4, the setting device 50 calculates the deviation dT of the first fluctuation amount fn(T−T0) per unit temperature of the shift amount when the center temperature of the Nth-order function generated by the control circuit 40 is shifted from the initial value T0. error_n The setting device 50 calculates the deviation dT error_n (Error) may be calculated.

[0062] Displacement dT error_n In calculating the temperature T of the voltage-controlled oscillator 20, the setting device 50 first calculates the input voltage V tmpThe input voltage V to the control circuit 40 corresponding to the temperature of the voltage-controlled oscillator 20 may be calculated by adding a voltage corresponding to a shift amount ΔT by which the central temperature is shifted from the initial value to the voltage V. tmp is the sense voltage V output by the temperature sensor 30 tmp Therefore, the setting device 50 may add, to the offset voltage of the offset voltage supply unit 100 of the control circuit 40, a voltage corresponding to the shift amount ΔT by which the central temperature is shifted from the initial value T0. With the central temperature shifted from the initial value T0, the setting device 50 may acquire the second fluctuation amount fn(T-T0-ΔT) at multiple temperatures within the compensated temperature range, similar to the first fluctuation amount fn(T-T0) (similar to step S440).

[0063] As an example, the setting device 50 may be tmp For each order term of an N-th order function in which the central temperature is shifted by ΔT from the initial value T0 by adding a voltage corresponding to the shift amount ΔT to the N-th order term, the change in output voltage per unit code when the code determining the gain βn is varied from G1 to G2 may be acquired as the second fluctuation amount fn(T-T0-ΔT). The setting device 50 may acquire the second fluctuation amount fn(T-T0-ΔT) at multiple temperatures for each order term, and acquire a function indicating the relationship between the temperature and the second fluctuation amount fn(T-T0-ΔT). Note that the codes G1 and G2 that determine the gain βn in step S460 may have the same values ​​as those in step S440 or may have different values. The setting device 50 may calculate the second fluctuation amount fn(T-T0-ΔT) by actual measurement or simulation.

[0064] FIG. 7 shows the input voltage V tmp 7 shows an example in which the input voltage V before being shifted is shown in FIG. 7, the vertical axis indicates the voltage value, and the horizontal axis indicates the temperature of the voltage-controlled oscillator 20. In FIG. 7, tmp2 is shown by a dashed line, and V tmp The input voltage V after adding and shifting the voltage by Vo tmp2is shown by a solid line. When the center temperature of the Nth order function is shifted by a shift amount ΔT from the initial value T0, the temperature T and the input voltage V tmp2 The function showing the relationship between the temperature and the input voltage V tmp2 A voltage of V0 is added to the offset voltage supply unit 100 of the control circuit 40. Since V0 is a voltage corresponding to the shift amount ΔT, the setting device 50 can change the offset voltage of the offset voltage supply unit 100 of the control circuit 40 by V0, thereby shifting the central temperature of the Nth-order function generated by the control circuit 40 by the shift amount ΔT.

[0065] Furthermore, the setting device 50 may execute a step of acquiring a third fluctuation amount fn(T-T0-ΔT)' of each order term when the temperature is shifted by a shift amount ΔT for the relationship between the first fluctuation amount fn(T-T0) of each order term of an Nth-order function in which the central temperature is the initial value T0 and the temperature. The setting device 50 may acquire the third fluctuation amount fn(T-T0-ΔT)' by shifting the function of Equation 3, which shows the relationship between the first fluctuation amount fn(T-T0) of each order term of an Nth-order function in which the central temperature is the initial value T0, by the shift amount ΔT. The calculation unit 310 may acquire the third fluctuation amount fn(T-T0-ΔT)' by shifting the function showing the relationship of the acquired first fluctuation amount fn(T-T0) in the temperature axis direction by the shift amount ΔT. Therefore, the third variation fn(T-T0-ΔT)' is obtained by adding the shift amount ΔT to the initial value T0 in the function of the first variation fn(T-T0) of each degree term in Equation 3.

[0066] Fig. 8 shows an example in which the first fluctuation amount f3(T-T0) is shifted in the temperature direction. In Fig. 8, the vertical axis represents the voltage value, and the horizontal axis represents the temperature of the voltage-controlled oscillator 20. In Fig. 8, the first fluctuation amount f3(T-T0) (i.e., the same as that shown in Fig. 6) is shown by a dashed line, and the third fluctuation amount f3(T-T0-ΔT)' after being shifted by the shift amount ΔT is shown by a solid line.

[0067] Fig. 9 shows an example in which the first fluctuation amount f4(T-T0) is shifted in the temperature direction. In Fig. 9, the vertical axis represents the voltage value, and the horizontal axis represents the temperature of the voltage-controlled oscillator 20. In Fig. 9, the first fluctuation amount f4(T-T0) (i.e., the same as that shown in Fig. 6) is shown by a dashed line, and the third fluctuation amount f4(T-T0-ΔT)' after being shifted by the shift amount ΔT is shown by a solid line.

[0068] Here, an error occurs between the function of the third fluctuation amount fn(T-T0-ΔT)' obtained by shifting the function of the first fluctuation amount fn(T-T0) by the shift amount ΔT and the actual second fluctuation amount fn(T-T0-ΔT) obtained by actual measurement or simulation. The error will be explained below.

[0069] Fig. 10 partially illustrates the fourth-order temperature compensation circuit 120. In Fig. 10, the current flowing through the first transistor 200 is indicated as I1, and the current flowing through the second transistor 210 is indicated as I2.

[0070] FIG. 11(a) shows the input voltage V tmp2 11, (b) and (c) show the current I2 flowing through the second transistor 210. In (a) of FIG. 11, the vertical axis represents voltage and the horizontal axis represents temperature. In (b) and (c) of FIG. 11, the vertical axis represents the value of the current I2 and the horizontal axis represents temperature. FIG. 11 shows an example where the shift amount ΔT is 5 degrees.

[0071] In FIG. 11(a), the first reference voltage V ref1 is a constant voltage (1 V) regardless of temperature changes. tmp2 7, when the center temperature is shifted using the adder 110, the input voltage V tmp2 is the voltage V that is shifted by the voltage corresponding to the shift amount ΔT. tmp2_5deg_shift This becomes:

[0072] Figure 11(b) shows the input voltage V tmp2 The current I2 before shifting and the input voltage V as shown in Figure 11(a) tmp2 The actual current I2 when shifted by the shift amount ΔT is I2_ V tmp2_shift Current I2 _ V tmp2_shift indicates the current value corresponding to the second fluctuation amount fn(T-T0-ΔT).

[0073] In addition to Figure 11(b), Figure 11(c) shows V tmp2 The current I2 is obtained by shifting the function showing the relationship between temperature and current by the shift amount ΔT along the temperature axis. _5deg_shift 10 shows a current value corresponding to the third fluctuation amount fn(T-T0-ΔT)′.

[0074] As shown in Figure 11(c), the function showing the relationship between temperature and current I2 is shifted (5 degrees in this example) to obtain I2 _5deg_shift and the input voltage V tmp2 (In this example, 5 degrees) is the actual current I2 when shifted. _ V tmp2_shift An error occurs between the second fluctuation amount fn(T-T0-ΔT) and the third fluctuation amount fn(T-T0-ΔT)'. The circuit for Nth-order functions including the quartic function in Figure 2 uses multiple differential pairs as shown in Figure 10, and as a result, an error occurs between the second fluctuation amount fn(T-T0-ΔT) and the third fluctuation amount fn(T-T0-ΔT)'. Here, the function showing the relationship between temperature and current I2 is shown in Equation 4 below.

[0075]

number

[0076] In Equation 4, I2 represents the current I2 at temperature T, I0 represents the sum of the collector current of the first transistor 200 and the collector current of the second transistor 210, and V T is the thermal voltage (V T = kT / q, where k is the Boltzmann constant, q is the electron charge, and T is the temperature. ref1 denotes the first reference voltage, and V tmp2 indicates the input voltage.

[0077] As can be seen from equation 4, the first reference voltage Vref1 and the input voltage V tmp2 Even if the difference between these is constant, the current I2 changes.

[0078] Therefore, the setting device 50 calculates the deviation dT of the first fluctuation amount fn(T-T0) per unit temperature based on the difference between the second fluctuation amount fn(T-T0-ΔT) and the third fluctuation amount fn(T-T0-ΔT)′. error_n For example, the setting device 50 may calculate the deviation dT of the first variation fn(T-T0) per unit temperature by dividing the difference between the second variation fn(T-T0-ΔT) and the third variation fn(T-T0-ΔT)′ by the shift ΔT. error_n The calculation unit 310 may calculate the deviation amount dT error_n may be calculated.

[0079]

number

[0080] where dT error_n (T) is the deviation dT per unit temperature of the shift amount ΔT in the nth order term of temperature T error_n where fn(T-T0-ΔT) represents the second fluctuation amount, and fn(T-T0-ΔT)′ represents the third fluctuation amount.

[0081] Figure 12 shows the first fluctuation amount f4(T-T0), the second fluctuation amount f4(T-T0-ΔT), the third fluctuation amount f4(T-T0-ΔT)', and the deviation amount dT error4 ×ΔT. In FIG. 12, the vertical axis represents voltage, and the horizontal axis represents the temperature of the voltage-controlled oscillator 20. As shown in FIG. 12, a third variation f4(T-T0-ΔT)′, which is obtained by shifting the first variation f4(T-T0) in the temperature axis direction, is tmp2 The deviation dT between the actual second fluctuation f4 (T-T0-ΔT) measured by shifting error4 ×ΔT occurs.

[0082] In step S470, the setting device 50 calculates the first fluctuation amount fn(T-T0) and the deviation amount dT error_n The setting device 50 may calculate the optimal values ​​of the gain βn of the Nth-order function and the central temperature using, for example, the least squares method as follows:

[0083] First, the setting device 50 calculates the deviation amount dT error_n The setting device 50 may generate a basis function incorporating the first component corresponding to the third fluctuation amount fn(T-T0-ΔT)′ of each order term and the deviation amount dT error_n The calculation unit 310 may perform a step of generating a first function by multiplying a second component obtained by multiplying the gain β of each order by a shift amount ΔT obtained by shifting the central temperature from the initial value T0, and the second component obtained by multiplying the gain β of each order by the third fluctuation amount fn(T-T0-ΔT)' of the term of each order, and error_n The second component may be obtained by multiplying a function indicating the relationship between the above and the second component by the shift amount ΔT. For each order, the calculating section 310 may derive an N-th order function by multiplying the first and second components by the gain βn, as the first function (basis function).

[0084] Furthermore, the setting device 50 may execute a step of setting the gain βn of each degree of the N-th order function and the central temperature so that the difference between the first function and the target characteristic of the control circuit 40 is less than a predetermined threshold. ccal may be set as the target characteristic of the control circuit 40. The calculation section 310 may calculate the gain βn and the central temperature that satisfy the following equation (6).

[0085]

number

[0086] In equation 6, V ccal(T) denotes the control voltage at which the output frequency of the voltage-controlled oscillator 20 matches the target frequency at temperature T, β0, β1, β3, and β4 denote the gains β of the zeroth, first, third, and fourth order terms, respectively, and dT error1 indicates the deviation per unit temperature in the first-order term, and dT error3 indicates the deviation per unit temperature in the third-order term, and dT error4 indicates the deviation per unit temperature in the fourth-order term, f1(T-T0-ΔT)' indicates the third fluctuation amount in the first-order term, f3(T-T0-ΔT)' indicates the third fluctuation amount in the third-order term, and f4(T-T0-ΔT)' indicates the third fluctuation amount in the fourth-order term.

[0087] The calculation unit 310 calculates the target characteristic (V ccal The output section 320 of the setting device 50 may output to the control circuit 40 a combination of the central temperature (initial value T0+shift amount ΔT) and gain βn that minimizes the difference from the target characteristic of the control circuit 40, and set the combination to the gain βn and central temperature (initial value T0+shift amount ΔT) of the N-th order function shown in Equation 2.

[0088] FIG. 13 shows an example of calculation of the code that determines the gain βn of the Nth-order function and the shift amount ΔT from the initial value of the core temperature by the least squares method. FIG. 13 shows some combinations of the code that determines the gain βn calculated for each of a plurality of shift amounts ΔT. Using Equation 6, the calculation unit 310 calculates the combination of the code that determines the gain βn by the least squares method when the shift amount ΔT is -0.5, 0, and +0.5, for example, and calculates the target characteristic (V ccal 13, the calculation unit 310 may determine the combination of the codes of each degree, β4⇒10, β3⇒6, β1⇒20, and β0⇒9, at ΔT=-0.5, where the maximum difference is the smallest at 1.6, as the code and central temperature (in this example, 28°C-0.5°C=27.5°C) that determine the gain βn of the Nth-order function of the control circuit 40.

[0089] According to this embodiment, the setting device 50 calculates the deviation amount dT error_n The optimum values ​​of the center temperature and gain βn of the Nth-order function can be determined using a basis function including the following: As a result, the control circuit 40, for which the optimum values ​​have been set, can perform temperature compensation of the output frequency with higher accuracy.

[0090] Next, a second embodiment of the setting operation of the setting value by the setting device 50 will be described. The setting device 50 may execute steps S400-S460 of the setting operation in Fig. 4 in the same manner as in the first embodiment described above.

[0091] In step S470, the setting device 50 may first execute a step of generating a second function incorporating a first component corresponding to the third fluctuation amount fn(T-T0-ΔT)' of each order term by multiplying the gain βn of each order. The calculation unit 310 may derive an N-th order function as the second function (basis function) by multiplying the first component by the gain βn for each order. Here, the second function differs from the first function in that it includes a deviation amount dT error_n Does not contain ingredients.

[0092] The setting device 50 executes a step of determining candidate values ​​for the gain βn of each degree of the N-th order function and the central temperature so that the difference between the generated second function and the target characteristic of the control circuit 40 is less than (e.g., minimum) a predetermined threshold. ccal may be set as the target characteristic of the control circuit 40. The calculation section 310 may determine, by the least squares method, a candidate value for the gain βn and a candidate value for the central temperature (T0+ΔT) that satisfy the following equation (7).

[0093]

number

[0094] In equation 7, V ccal(T) indicates the control voltage at which the output frequency of the voltage-controlled oscillator 20 matches the target frequency at temperature T, β0, β1, β3, and β4 indicate the gains of the 0th, 1st, 3rd, and 4th order terms, respectively, f1(T-T0-ΔT)' indicates the third fluctuation amount in the 1st order term, f3(T-T0-ΔT)' indicates the third fluctuation amount in the 3rd order term, and f4(T-T0-ΔT)' indicates the third fluctuation amount in the 4th order term.

[0095] The calculation unit 310 calculates the target characteristic (V ccal The output section 320 of the setting device 50 may determine, as a candidate value, an optimal value of the combination of the central temperature (initial value T0+shift amount ΔT) and the gain βn that minimizes the difference from the target characteristic of the control circuit 40. As an example, the candidate values ​​are determined as follows, when ΔT=-0.5: β4⇒9, β3⇒5, β1⇒20, β0⇒9, etc. Unlike Equation 6, Equation 7 does not consider the shift amount dT error_n Since the components of are not included, the values ​​calculated by Equation 7 and Equation 6 may differ.

[0096] Next, the setting device 50 adds a deviation amount dT error_n The setting device 50 may generate a new basis function by incorporating a component related to the amount of deviation dT error_n The setting device 50 may perform a step of generating a third function (basis function) by incorporating into the second function a second component obtained by multiplying the second component by a shift amount ΔT obtained by shifting the central temperature from the initial value T0. The setting device 50 may generate the third function by incorporating into the second function a component obtained by multiplying the second component by a gain βn of each order. The setting device 50 may generate the third function by incorporating into the second function a shift amount dT error_n may be incorporated to generate the third function shown in Equation 8 below.

[0097]

number

[0098] In equation 8, dT error1 (T) indicates the deviation per unit temperature in the first-order term of temperature T, and dT error3 (T) indicates the deviation per unit temperature in the third order term of temperature T, and dT error4 (T) indicates the deviation per unit temperature in the fourth-order term of temperature T.

[0099] Next, the setting device 50 may execute a step of setting the gain βn of each order of the N-th order function and the central temperature using the candidate value of the gain βn of each order and the candidate value of the central temperature so that the difference between the third function and the target characteristic of the control circuit 40 is less than (e.g., minimum) a predetermined threshold. The setting device 50 sets the gain βn of each order of the N-th order function and the central temperature using the candidate value of the gain βn of each order and the candidate value of the central temperature so that the difference between the third function and the target characteristic of the control circuit 40 is less than (e.g., minimum) a predetermined threshold. ccal The gain βn of each order and the central temperature may be determined using the candidate values ​​so that the difference between the temperature (T) and the temperature (T) is minimized.

[0100] The setting device 50 may execute a step of setting the gain βn of each order of the Nth-order function and the central temperature so that the difference between the third function and the target characteristic of the control circuit 40 is less than a predetermined threshold (for example, a minimum) by substituting the candidate value of the gain βn of each order and the central temperature, based on the candidate value of the gain βn of each order, into the third function. The calculation unit 310 substitutes, into the third function, a plurality of shift amounts ΔT (candidate values ​​of the shift amount ΔT±c (for example, c=0.5 degrees and 0 degrees)) based on the candidate value of the central temperature and a plurality of codes for determining the gain βn based on the candidate value βn of the gain (±m (for example, m=1, 2, 3, . . .) centered on the code for determining the candidate value βn of the gain), and selects the target characteristic (V ccalThe output section 320 of the setting device 50 may output the combination of the code that determines the gain βn (initial value T0+shift amount ΔT) and the central temperature that minimizes the difference from the target characteristic, as shown in FIG. 14 , to the control circuit 40, which may then set the combination of the code that determines the gain βn and the central temperature (initial value T0+shift amount ΔT) that minimizes the maximum value of the calculated difference, to the control circuit 40, which may then set the combination in the N-th order function (for example, the offset voltage supplying section 100, each amplifier, and the zero-order temperature compensation circuit 150).

[0101] According to this embodiment, the setting device 50 calculates the deviation amount dT error_n The candidate values ​​for the gain βn and the central temperature that are not based on the βn are determined, and the deviation amount dT is calculated in the second stage by using the third function with the candidate values ​​close to the optimal values. error_n Therefore, the setting device 50 can set the optimum setting value to the control circuit 40 with higher accuracy.

[0102] The setting device 50 may set the gain βn and the central temperature by combining the first and second embodiments. That is, while the setting device 50 used Equation 8 to determine the candidate values ​​for the gain βn and the central temperature for each order in the second embodiment, it may also use Equation 6. The reason for performing such calculations is that when the gain βn and the central temperature for each order are derived using the least squares method in the first embodiment, a solution that minimizes the maximum difference from the target characteristic of the control circuit 40 is not necessarily obtained. To minimize the maximum difference from the target characteristic of the control circuit 40 while using Equation 6, the setting device 50 may treat the gain βn and the central temperature for each order derived by Equation 6 as candidate values ​​and select the optimal one from multiple cases centered around the candidate value, as in the second embodiment.

[0103] The values ​​of the gains G1 and G2, the predetermined threshold, the shift amount ΔT, and the like used in the setting device 50 may be acquired by the acquisition unit 300 of the setting device 50 through user input.

[0104] Various embodiments of the present invention may be described with reference to flowcharts and block diagrams, where the blocks may represent (1) stages of a process in which operations are performed or (2) sections of an apparatus responsible for performing the operations. Particular stages and sections may be implemented by dedicated circuitry, programmable circuitry provided with computer-readable instructions stored on a computer-readable medium, and / or a processor provided with computer-readable instructions stored on a computer-readable medium. Dedicated circuitry may include digital and / or analog hardware circuitry, and may include integrated circuits (ICs) and / or discrete circuits. Programmable circuitry may include reconfigurable hardware circuitry, including logical AND, OR, XOR, NAND, NOR, and other logical operations, flip-flops, registers, memory elements such as field programmable gate arrays (FPGAs), programmable logic arrays (PLAs), and the like.

[0105] A computer-readable medium may include any tangible device capable of storing instructions that are executed by an appropriate device, such that the computer-readable medium having instructions stored thereon comprises an article of manufacture containing instructions that can be executed to create means for performing the operations specified in the flowcharts or block diagrams. Examples of computer-readable media may include electronic, magnetic, optical, electromagnetic, and semiconductor storage media. More specific examples of computer-readable media may include floppy disks, diskettes, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), electrically erasable programmable read-only memory (EEPROM), static random access memory (SRAM), compact disc read-only memory (CD-ROM), digital versatile disc (DVD), Blu-ray disc, memory stick, integrated circuit card, and the like.

[0106] The computer readable instructions may include either assembler instructions, Instruction Set Architecture (ISA) instructions, machine instructions, machine-dependent instructions, microcode, firmware instructions, state-setting data, or source or object code written in any combination of one or more programming languages, including object-oriented programming languages ​​such as Smalltalk®, JAVA®, C++, etc., and conventional procedural programming languages ​​such as the “C” programming language or similar programming languages.

[0107] The computer-readable instructions may be provided to a processor or programmable circuitry of a programmable data processing apparatus, such as a general-purpose computer, special-purpose computer, or other computer, either locally or over a wide-area network (WAN) such as a local area network (LAN), the Internet, etc., which executes the computer-readable instructions to create means for performing the operations specified in the flowcharts or block diagrams. Examples of processors include computer processors, processing units, microprocessors, digital signal processors, controllers, microcontrollers, etc.

[0108] 15 illustrates an example of a computer 2200 in which aspects of the present invention may be embodied, in whole or in part. Programs installed on the computer 2200 may cause the computer 2200 to function as or perform operations associated with an apparatus or one or more sections of the apparatus according to embodiments of the present invention, and / or to perform a process or steps of a process according to embodiments of the present invention. Such programs may be executed by the CPU 2212 to cause the computer 2200 to perform specific operations associated with some or all of the blocks in the flowcharts and block diagrams described herein.

[0109] A computer 2200 according to this embodiment includes a CPU 2212, a RAM 2214, a graphics controller 2216, and a display device 2218, which are interconnected by a host controller 2210. The computer 2200 also includes input / output units such as a communication interface 2222, a hard disk drive 2224, a DVD-ROM drive 2226, and an IC card drive, which are connected to the host controller 2210 via an input / output controller 2220. The computer also includes legacy input / output units such as a ROM 2230 and a keyboard 2242, which are connected to the input / output controller 2220 via an input / output chip 2240.

[0110] The CPU 2212 operates according to programs stored in the ROM 2230 and RAM 2214, thereby controlling each unit. The graphics controller 2216 acquires image data generated by the CPU 2212 into a frame buffer or the like provided in the RAM 2214 or into the graphics controller 2216 itself, and causes the image data to be displayed on the display device 2218.

[0111] The communications interface 2222 communicates with other electronic devices via a network. The hard disk drive 2224 stores programs and data used by the CPU 2212 in the computer 2200. The DVD-ROM drive 2226 reads programs or data from the DVD-ROM 2201 and provides the programs or data to the hard disk drive 2224 via the RAM 2214. The IC card drive reads programs and data from an IC card and / or writes programs and data to an IC card.

[0112] The ROM 2230 stores therein a boot program or the like that is executed by the computer 2200 upon activation, and / or programs that depend on the hardware of the computer 2200. The input / output chip 2240 may also connect various input / output units to the input / output controller 2220 via a parallel port, a serial port, a keyboard port, a mouse port, etc.

[0113] The programs are provided by a computer-readable medium such as a DVD-ROM 2201 or an IC card. The programs are read from the computer-readable medium, installed in the hard disk drive 2224, RAM 2214, or ROM 2230, which are also examples of computer-readable media, and executed by the CPU 2212. Information processing described in these programs is read by the computer 2200, and brings about cooperation between the programs and the various types of hardware resources described above. An apparatus or method may be configured by realizing information manipulation or processing in accordance with the use of the computer 2200.

[0114] For example, when communication is performed between the computer 2200 and an external device, the CPU 2212 may execute a communication program loaded into the RAM 2214 and instruct the communication interface 2222 to perform communication processing based on the processing described in the communication program. Under the control of the CPU 2212, the communication interface 2222 reads transmission data stored in a transmission buffer processing area provided in the RAM 2214, the hard disk drive 2224, the DVD-ROM 2201, or a recording medium such as an IC card, and transmits the read transmission data to the network, or writes reception data received from the network to a reception buffer processing area or the like provided on the recording medium.

[0115] The CPU 2212 may also cause all or a necessary portion of a file or database stored on an external recording medium such as the hard disk drive 2224, the DVD-ROM drive 2226 (DVD-ROM 2201), an IC card, etc. to be read into the RAM 2214, and perform various types of processing on the data on the RAM 2214. The CPU 2212 then writes back the processed data to the external recording medium.

[0116] Various types of information, such as various types of programs, data, tables, and databases, may be stored on the recording medium and may undergo information processing. The CPU 2212 may perform various types of processing on data read from the RAM 2214, including various types of operations, information processing, conditional judgment, conditional branching, unconditional branching, information search / replacement, etc., as described throughout this disclosure and specified by the instruction sequences of the programs, and write the results back to the RAM 2214. The CPU 2212 may also search for information in a file, database, etc. on the recording medium. For example, if multiple entries each having an attribute value of a first attribute associated with an attribute value of a second attribute are stored on the recording medium, the CPU 2212 may search for an entry that matches a condition specified by the attribute value of the first attribute from among the multiple entries, read the attribute value of the second attribute stored in the entry, and thereby obtain the attribute value of the second attribute associated with the first attribute that satisfies a predetermined condition.

[0117] The above-described programs or software modules may be stored in a computer-readable medium on or near the computer 2200. A recording medium such as a hard disk or RAM provided in a server system connected to a dedicated communication network or the Internet can also be used as a computer-readable medium, thereby providing the programs to the computer 2200 via the network.

[0118] Although the present invention has been described above using embodiments, the technical scope of the present invention is not limited to the scope described in the above embodiments. It will be apparent to those skilled in the art that various modifications and improvements can be made to the above embodiments. It is clear from the claims that such modifications and improvements can also be included within the technical scope of the present invention.

[0119] It should be noted that the order of execution of each process, such as operations, procedures, steps, and stages, in the devices, systems, programs, and methods shown in the claims, specifications, and drawings is not specifically stated as "before," "prior to," etc., and that the processes can be performed in any order unless the output of a previous process is used in a subsequent process. Even if the operational flow in the claims, specifications, and drawings is described using "first," "next," etc. for convenience, this does not mean that the processes must be performed in this order. [Explanation of symbols]

[0120] 10 Temperature compensated oscillator 20 Voltage Controlled Oscillator 30 Temperature Sensor 40 Control circuit 50 Setting device 100 Offset voltage supply unit 110 Addition section 120 4th order temperature compensation circuit 125 First Amplifier 130 Third-order temperature compensation circuit 135 Second Amplifier 140 Primary temperature compensation circuit 145 Third Amplifier 150 0th order temperature compensation circuit 160 Control voltage supply circuit 200 First transistor 210 Second transistor 220 Third Transistor 230 4th transistor 240 5th transistor 250 6th transistor 260 7th Transistor 270 8th Transistor 300 Acquisition Department 310 Calculation Unit 320 Output Section 2200 Computer 2201 DVD-ROM 2210 host controller 2212 CPU 2214 RAM 2216 Graphics Controller 2218 Display Device 2220 Input / Output Controller 2222 communication interface 2224 hard disk drive 2226 DVD-ROM drive 2230 ROM 2240 I / O chip 2242 keyboard

Claims

1. A method for setting an Nth-order function in a control circuit that applies a control voltage generated using the Nth-order function to a voltage-controlled oscillator, the method comprising: Setting an initial value of the center temperature of the Nth-order function; acquiring, at a plurality of temperatures, a first variation amount of a term of each order when a gain of at least one order in the N-th order function is varied; and setting the gain of each order of the N-th order function and the central temperature based on the deviation of the first fluctuation amount per unit temperature when the central temperature is shifted from the initial value and the first fluctuation amount. How to set it up.

2. acquiring, at a plurality of temperatures, a second variation amount of each order term when a voltage corresponding to a shift amount when the central temperature is shifted from the initial value is added to an input voltage to the control circuit corresponding to the temperature of the voltage-controlled oscillator; acquiring a third variation amount of each of the terms of the order of the N-th order function when the temperature is shifted by the shift amount with respect to the relationship between the first variation amount of each of the terms of the order of the N-th order function and the temperature, and calculating, for each order, a deviation amount of the first fluctuation amount per unit temperature based on a difference between the second fluctuation amount and the third fluctuation amount. The setting method according to claim 1 .

3. a step of calculating a deviation amount of the first variation amount per unit temperature for each order by dividing a difference between the second variation amount and the third variation amount by the shift amount. The setting method according to claim 2 .

4. The step of setting the gain of each degree of the N-th order function and the central temperature includes: generating a first function by multiplying a gain of each order by a first component corresponding to the third fluctuation amount of each order term and a second component obtained by multiplying the deviation amount by a shift amount obtained by shifting the central temperature from the initial value; and setting the gain of each order of the N-th order function and the central temperature so that a difference between the first function and a target characteristic of the control circuit is less than a predetermined threshold. The setting method according to claim 2 .

5. The step of setting the gain of each degree of the N-th order function and the central temperature includes: generating a second function incorporating a first component corresponding to the third fluctuation amount of each order term by multiplying the gain of each order; determining candidate values ​​for the gain of each order of the N-th order function and the candidate value of the central temperature so that a difference between the second function and a target characteristic of the control circuit is less than a predetermined threshold; generating a third function by incorporating a second component obtained by multiplying the deviation amount by a shift amount obtained by shifting the central temperature from the initial value into the second function; and setting the gain of each order of the N-th order function and the central temperature using the candidate value of the gain of each order and the candidate value of the central temperature so that a difference between the third function and a target characteristic of the control circuit is less than a predetermined threshold value. The setting method according to claim 2 .

6. The step of setting the gain of each degree of the N-th order function and the central temperature includes: and substituting the candidate value of the gain of each order and the candidate value of the central temperature into the third function, thereby setting the gain of each order of the N-th order function and the central temperature so that a difference between the third function and a target characteristic of the control circuit becomes less than a predetermined threshold value. The setting method according to claim 5 .

7. A program for causing a computer to execute the setting method according to claim 1.

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