High-frequency test contact element and test pin arrangement

Abstract

To provide a high frequency test contact member for establishing a non-permanent electrical contact between a contact partner and a test pin device.SOLUTION: The high-frequency test contact element 10 comprises a lamella-shaped base body side 10a with a first contact region at one end for establishing contact with a contact partner 30, an opposite second contact region for establishing electrical contact with a contact pin arrangement 20 accommodating the test contact element, and an intermediate meander-shaped resilient region 3, which extends along an extension direction V of the resilient region and serves for suspension of the test contact element 10 along a longitudinal extension direction L. The elastic region has a plurality of bending elements 8a, 8b, 8c, 8d which follow in the extension direction V and have a bending angle of 5 ° to 70 °. Furthermore, the invention relates to a high-frequency test pin arrangement (20) with a test contact element (10) and a test contact attachment (40) for a test pin arrangement.SELECTED DRAWING: Figure 1a

Description

[Technical Field]

[0001] The present invention relates to a high frequency test contact member and a releasable electrical connection with a contact partner in the high frequency range. and a test pin device for establishing electrical contact. [Background technology]

[0002] High frequency test pin devices with contact heads are generally known in the state of the art and are Testing is performed to test the functionality of the test partner (e.g., a group of electronic components with appropriate socket parts). For this purpose, the contacts of the test subject are A test pin device may be attached as a test pin or a contact located at one end or extending thereto. The test pin device is connected to the contact of the test object using an element (e.g., a contact pin or a contact lamella). A test signal is then applied to the contact mates via appropriate electrical contacts. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] WO2019 / 138505 [Patent Document 2] CN109782034 Summary of the Invention [Problem to be solved by the invention]

[0004] In a periodic testing process, test pin devices are typically connected to corresponding test objects at periodic intervals. Contact formation occurs due to the relative proximity of the test object. Incomplete electrical contact increases wear. This not only shortens the service life, but also adjusts the waves due to imperfect resistance adjustment, resulting in This is especially important for high frequency technology, as unwanted reflections can lead to imperfect contact and measurement results. In the field of electrical wiring, high contact quality is required during the testing process. Contact-optimized for high frequency signal penetration to minimize potential signal loss There is a demand for component and equipment design.

[0005] Patent Document 1 describes a test head pin for a test device in the high frequency range. The test head pin has first and second linear contacts connected to corresponding opposing contact portions. a lamellar region and an intermediate elastic region having a central cavity extending along the extension direction; The elastic region has several curved portions arranged in a line in the extension direction, and the curved portions The corresponding curve or bending angle of the cut part is 90° to 180°.

[0006] Patent Document 2 discloses a test head pin and an associated test device for high frequency ranges, The test head pin is realized as a continuous stamped part. The electrical contact is established between the contact and the connection part for connecting the circuit board of the test equipment. It has contact parts for establishing contact with the object. It has multiple curved or curved parts. A resilient arm is formed between the contact portion and the connecting portion. [Means for solving the problem]

[0007] Based on the known state of the art, the object of the present invention is to provide an optimized transmission of high frequency signals and At the same time, an improved A contact member and test pin arrangement are provided.

[0008] This object is achieved by the contact member and test pin arrangement according to the independent claims. The generic claims describe advantageous embodiments of the invention. The invention is further defined in the following description. It also addresses further issues discussed in

[0009] In a first aspect, the invention relates to a contact partner, in particular a board-to-board plug connector, and a test pin. The present invention relates to a high frequency test contact member for establishing a non-permanent electrical contact with a device. The high frequency test contact member has a first contact at one end for establishing contact with a contact partner. a contact area; and an opposing surface for establishing electrical contact with a contact pin device that accommodates said test contact member. a second contact region on one side of the test contact member; and an intermediate serpentine-shaped resilient region extending along the length of the test contact member. For suspension along the extension direction, the elastic region is preferably centrally located and extends in the extension direction of the elastic region. a lamella having an intermediate serpentine-shaped elastic region having a cavity extending along the longitudinal direction; The serpentine-shaped elastic regions are continuous with each other in the extension direction and have a curved angle of It has multiple curved members with angles between 5° and 70°.

[0010] The high frequency test contact member has a meander-shaped elastic region that provides elasticity in the longitudinal direction. This allows for an optimized electrical contact to be established with the contact partner. The curved member in the serpentine region has a relatively small bending angle compared to the state of the art. This means that an optimized signal transmission is achieved by the test contact member. the occurrence of vibration, radiation forces, and / or damping is minimized due to the relatively small angle of curvature; Signal transmission is greatly improved compared to the state of the art and, moreover, a large number of load variations are possible.

[0011] The test contact member has a substantially elongated or longitudinal body in side view, wherein: In particular, the first and second contact areas of the test contact member preferably extend substantially along the longitudinal extent of the contact member. The first and / or second contact areas preferably extend along a substantially linear direction. The first and / or second contact areas may have a slightly inclined and / or curved portion. The intermediate serpentine-shaped elastic region may be curved relative to the longitudinal direction. The test contact member typically extends in the longitudinal direction. It has a direction.

[0012] The corresponding curved members, or the curved angles of these members, are preferably in the same plane. The curvature of the test contact element is parallel to the longitudinal direction of the test contact element. Preferably, the lamellar-shaped substrate, and thus the area, extends in one plane. Alternatively, the lamellar-shaped substrates are formed or designed as integral components. The member is preferably made of an electrically conductive material, in particular a metal.

[0013] The meander-shaped elastic region preferably has two curved portions that are continuous in the extension direction. These curved sections have two consecutive opposing curved members, particularly arranged in an S-shape. The corresponding continuous curved portion is preferably bent in a dogleg shape, particularly The two curved members of the curved portion are preferably two substantially identical curved members. The angle of curvature is the same as that of the curved portion.

[0014] In a preferred embodiment, each of the curved members of the first, preferably S-shaped curved portion The curved angle of this portion is 40 to 70°, and more preferably 45 to 65°. The bending angle of each of the bending members is preferably 5 to 25°, more preferably 5 to 15°. Alternatively, the bending angle of each of the curved members of the second curved portion may be equal to or greater than the bending angle of the first curved portion. The first curved portion preferably establishes electrical contact with the contact partner. The first contact area is assigned to the first contact area for the purpose of detecting the first contact point. The second curved portion preferably includes a second curved portion for establishing electrical contact with the test pin device. assigned to the contact area.

[0015] In a preferred exemplary embodiment, the entire elastic region is formed into two preferably doglegs. Each curved portion has two preferably "K"-shaped portions. Preferably, the flexure only has a curved member.

[0016] The cavities extending in the direction of extension of the elastic region preferably extend through the entire thickness of the material of the substrate in the form of a lamellar. The cavities preferably extend over the entire surface of the substrate and have a substantially uniform width. The body is connected longitudinally by two preferably parallel connections. These connecting members are therefore preferably elastic regions with intermediate cavities. It extends parallel to the extension direction of the

[0017] The thickness of the lamellar substrate or material of the test contact member is preferably constant. The thickness of the body or material is preferably 0.1 mm to 0.3 mm.

[0018] The elastic region preferably has a substantially uniform total cross section extending perpendicular to the direction of extension. The total cross section is the sum of the cross sections of the parallel connecting members divided by the cavity. In addition, the cross sections of the first and second contact areas of the lamellar-shaped substrate preferably have corresponding extensions. It has a substantially uniform cross section perpendicular to the direction.

[0019] In a preferred embodiment, the elastic region has a total cross section, which preferably extends direction, and from the cross section of the corresponding adjacent portion of the first and / or second contact area, The difference is less than 0%, more preferably less than 15%, and particularly preferably less than 10%. The cross section of the elastic region preferably includes a portion of the first and / or second contact region adjacent to the elastic region. from the cross section of the This results in a particularly optimized signal transmission even in the elastic region.

[0020] The corresponding lateral widths of the first and second contact areas are preferably substantially constant in the extension direction. The corresponding width of the elastic region is preferably constant in the direction of extension. The width in the direction is greater than the width of the first and / or second contact area.

[0021] In a preferred embodiment, the serpentine-shaped elastic region extends along the extension direction. and at least one connecting bridge interrupting said cavity, wherein the connecting bridge is , a connecting portion of the connecting member extending in the extension direction, and this connecting portion is preferably perpendicular to the extension direction. The connecting bridge is preferably formed in the base of the contact element, resulting in a connecting The connecting bridge is preferably realized integrally with the contact member. This results in interference with signal transmission. The resonant frequency of the contact member can be increased and moved beyond the frequency band being transmitted. The elastic region preferably has only two connecting bridges, more preferably only one.

[0022] In a preferred embodiment, the second contact area preferably has at least a partially curved end portion, the end portion being at least partially suspended; In a test pin device, a device designed to establish electrical contact with a contact on a printed circuit board. The cross section of this end portion is preferably smaller than the cross section of the rest of the second contact area.

[0023] The first contact area of ​​the contact member is disposed distally for establishing electrical contact with the contact partner. The contact portion preferably has a preferably flat contact surface at one end. The contact portion is preferably designed in a lamellar shape similar to the first contact area. The contact area can alternatively be V-shaped or U-shaped, thus providing a tapered contact area. Alternatively, the contact portion may have a flared shape, for example an inverted V or U shape. stomach.

[0024] In a second configuration, the present invention provides a permanent connection with a multi-pole contact partner, in particular a board-to-board plug connector. The present invention relates to a high frequency test pin device for electrical contact without a test an inner member having a contact portion at one end for interacting with said contact partner to perform a casing and an outer casing, wherein at least one and at least partially relative to the outer casing, particularly along the longitudinal direction of the device. In the non-contact relative position of 1, the inner casing is arranged to be fixed in that position. and in a second relative position where the inner case is in electrical contact with a second contact partner, The ring is at least partially movable, in particular rotatable, relative to the outer casing. and / or the inner casing is movably guided so as to be tiltably mounted. and an outer casing. The test pin device includes a contact member for establishing external electrical contact with the test pin device. and at least one printed circuit board having a plurality of electrodes, the plurality of electrodes being in contact with the printed circuit board and having the above-described structure. a plurality of high frequency test contact members extending toward the contact portion of the inner casing; The printed circuit board and the test contact members are arranged substantially parallel to each other in the longitudinal direction of the device. The inner casing is disposed within the inner casing so as to extend therethrough.

[0025] In this example, the term "extending substantially longitudinally" refers to the printed circuit board and test contacts. The material extends substantially in the longitudinal direction or extends parallel to the longitudinal direction. In particular, this is understood to mean that the printed circuit board also has test contacts. The members do not deviate significantly from the longitudinal direction, and extend perpendicular to the longitudinal direction. Along with that.

[0026] As intended by the present invention, the position of the printed circuit board and the test contact members contacting it is This arrangement achieves optimized signal transmission in the high frequency range. Optimized signal for state-of-the-art technology where the plate is positioned perpendicular to the extension of the test contact member. Transmission can be achieved by alignment according to the invention while interference or attenuation of the oscillator circuit is prevented. At the same time, the design according to the present invention minimizes the occurrence of contacts on the contacting side in the first relative position. and in the second relative position, the position and / or measurement of the contact partner is obtained. Here, the first relative position is preferably set to the outer casing. The inner casing corresponds to the end position of the power store. (Kraftspeicher) In particular, the spring element is preloaded in the outer casing. The relative positions of the inner casing and the outer casing are preferably such that the inner casing is closer to the outer casing in the longitudinal direction of the device. This corresponds to a partially deflected state within the housing.

[0027] The inner casing and the outer casing are held in a first relative position by a spring member in particular. The spring members are particularly arranged to be pressed in one direction from the outer casing to the inner casing. The inner casing and the outer casing are arranged so that the contacting portions of the inner casing and the outer casing are pushed aside. The spring member disposed between the casings is also referred to as the first spring member hereinafter.

[0028] The outer casing may be completely or partially circumferentially around the outside diameter of the inner casing. It is preferable that the outer casing at least partially surrounds the inner cylindrical portion. The inner casing can be guided inside or through this inner cylindrical portion. The outer casing preferably has a clamping mechanism for placing the test pin arrangement on the test fixture. The fastening mechanism may be realized as a flange on the housing, and the inner A substantially free-standing casing preferably having a central inner cylindrical portion for guiding and / or passing the casing. It may also be designed in a lunge shape.

[0029] At least one printed circuit board of the device has conductive traces disposed thereon. The conductive traces are particularly designed to establish electrical contact with the assigned test contact members. and a contact member for transmitting signals to / from the test pin device. The conductive traces disposed on the printed circuit board are preferably , extending substantially in the longitudinal direction of the device. Here, the conductive traces have a bend angle of greater than 70°. Preferably, there are no curved portions or curves or curved members greater than 45°, more preferably greater than 45°. This results in more optimized signal transmission via conductive traces and printed circuit boards. This becomes possible.

[0030] Corresponding conductive traces on the printed circuit board for establishing electrical contact with the test contact members. The contacting portion preferably has a cross section which is the result of the contacting members. The total cross section of the second contact area of ​​the high frequency test contact member adjacent to the end portion is 2 0%, more preferably less than 15%, and even more preferably less than 10%. The curved end of the test contact element matches the cross section of the contact. The traces preferably have an increased cross section compared to the contact portion.

[0031] Contact members on the printed circuit board for establishing external electrical contact with the test pin arrangement are preferred. or a corresponding conductor to be connected, e.g. for establishing external electrical contact with a test pin arrangement. The connecting cable is arranged and realized so as to extend substantially in the longitudinal direction of the device. The material is preferably disposed in a longitudinal slit in the printed circuit board and is preferably disposed along the longitudinal direction of the device. A connecting plug that is oriented in the direction of the and correspondingly arranged solder joints for connecting the two.

[0032] In a preferred embodiment, the test pin device is configured to electrically connect the test contact members in a radial direction. It has two opposing, in particular parallel, printed circuit boards preferably arranged on the outside. The printed circuit board is here constructed such that the conductive traces are arranged opposite each other, i.e., facing each other. By positioning the printed circuit board in this way, In particular, by spatially separating the printed circuit boards, mutual signal interference can be reduced. Furthermore, this orientation allows the bending angle to be adjusted at the assigned test contact member. It can be further reduced.

[0033] In another embodiment, the test pin devices are positioned side by side, parallel or directly adjacent to each other. , and preferably located substantially at the center of the test pin device, i.e., along the central axis of the device. The conductive traces of the printed circuit boards are preferably are placed on two opposite sides of the board. A separate printed circuit board having races may be provided.

[0034] The test pin arrangement preferably has insulating material disposed between the individual high frequency test contact members. The insulating material is arranged or designed as a carrier unit inside the inner casing. The insulating material may preferably consist of a plastic body disposed between the test contact members. The plastic body preferably has a plurality of lateral, in particular slit-like, cutouts. The test contact element has a notch in which it extends and / or is guided. The respective fins are preferably realized parallel to one another within the plastic body.

[0035] Preferably, there are two notches per plane, each notch receiving a test contact member; and / or oriented adjacent to each other so as to be guided. is formed as a slit-like cutout by the opposing side surfaces of the plastic body, A test contact element is placed in each of the two notches. The test contact members are preferably arranged in opposite directions with respect to the elastic region and have respective associated Contact with the printed circuit board. Between two notches arranged in one plane, a positive The tic body is particularly solid and is arranged to separate adjacent notches. The plastic body preferably extends to the contact portion of the test pin arrangement.

[0036] The contact portion is preferably multi-pole, with the individual poles being formed by contact elements as described above. The contact members are preferably arranged within the device so as to be selectively replaceable. , and have fixing or mounting means for the contact members specially designed for this purpose. This can be done.

[0037] The contact portion of the test pin device preferably has an elliptical or polygonal, especially rectangular, internal contour. The internal and / or peripheral contours are preferably used for substrate-to-substrate printing. adapted or implemented to establish electrical contact with a lug connector or a multi-line plug connector It will be revealed.

[0038] In a preferred embodiment, the contact portion is provided at one end in the longitudinal direction of the device. A centering section is provided which is resiliently attached longitudinally to the test contact member. The centering section is the assigned power store member, especially at least A spring member is preferably resiliently attached to one or more test contact members. A spring-loaded centering section provides electrical contact with the contact under test. When effective contact is established, the position of the test pin device can be further oriented in an optimized manner This becomes:

[0039] In a preferred embodiment, the inner casing is movably disposed at one end. and a piston to which spring force is applied, at the end of which the contact part of the test pin device is realized. The piston preferably comprises an inner casing, a plastic body disposed therein, and The pistons are arranged to be movable relative to the test contact members and the individual test contact members. A central opening or openings through which the contact members and the plastic body or insulating material disposed therebetween can pass. It also has holes.

[0040] The centering section is preferably designed integrally with the moving piston and has a contact The centering section is preferably formed on the inner peripheral surface facing the or has an internal contour that tapers toward a test contact member located at its center. The part profile can have at least one correspondingly inclined centering bevel. is preferably realized to surround or center the outer contour of the contact partner. In another embodiment, the centering section may have an outer contour, In the previous embodiment, the outer contours of the The outer radius of the test contact element or the distance from it increases, and the desired contact Alternatively, it may be realized to engage in a centrally located opening.

[0041] The movable piston is preferably supported by a spring element, particularly preferably by spring elements distributed in the circumferential direction. The inner casing is supported by a plurality of spring members, in particular by spring-loaded contact pins. The plastic body is preferably mounted on and / or at least partially within the substrate. The movable piston is preloaded in the direction away from the base of the inner casing. The movable piston can be positioned to press against an inner shelf of the piston surrounding the inlet. The piston and the plastic body or the The spring member disposed between the inner casing and the spring member is hereinafter referred to as a second spring member.

[0042] The movable piston is particularly adapted to the initial contact of the test contact member with the assigned plastic body. The contact portion at one end or the center assigned thereto may be in the first position. In the ring section, a pair of test contact members for establishing electrical contact with the contact mate The corresponding contact areas are protected in the initial first relative position, i.e., from the side of the device. When viewed from the outside, the contact portion is positioned so as not to protrude from the peripheral wall or side wall of the contact portion. , corresponds to a position where there is no external force or where the contact partner is removed. In the second relative position, which establishes electrical contact with the hand, the movable piston is in contact with the base of the inner casing. to move inward toward the body, preferably for establishing electrical contact with a contact partner The corresponding contact area protrudes further from the contact portion or contacts the contacting part in comparison with the first relative position. The ferrite core is disposed so as to protrude toward the ferrite core.

[0043] In a preferred embodiment, the insulating material or plastic body of the device is designed in two parts. For this purpose, the plastic body is preferably assigned to the contact part of the device and The plastic body has a guide member movable relative to the rear base. The guide member is preferably , which are arranged in a plastic substrate so as to be partially guided. The assigned power store preloads the guide element towards the contacting element, in particular at least one A spring member, more preferably a compression spring, is disposed between the base and the guide member. The spring element between the base of the stick and the guide element of the plastic body is hereinafter referred to as the third spring element. It is called material.

[0044] Here, the guide member is preferably in electrical contact with the limiting member. or a pin or spring alignment pin disposed substantially perpendicular to the direction of movement of the guide member. The pin or spring alignment pin is preferably secured in place. and a guide member extending substantially perpendicular to the direction of movement of the guide member. In this example, the side wall of the restricting member may be positioned in a recess or hole in the inner member. The maximum length of the guide member is 100 mm. The stroke may also be limited by the limiting member, in particular by interacting with the recess or hole mentioned above. For this purpose, the opposite side wall of the restricting member may be provided with a notch or hole. The inner wall of the casing can serve as an abutment surface for the opposing inner wall of the casing.

[0045] The guide members are preferably movably disposed relative to the individual test contact members. The guide member may be formed at an end side thereof in a first position relative to the test contact member. Within the opening, a corresponding contact area of ​​the test contact member for establishing electrical contact with the contact partner is Preferably, only a part is provided so that it is protected, i.e. does not protrude when viewing the device from the side. The first relative position is preferably such that the external This corresponds to a position where the contact is not subjected to any electrical force or where the contact is removed. In the second relative position, the contact area contacts the corresponding contact area for establishing electrical contact with the contact partner. The area at least partially projects from the corresponding opening of the guide member or at least a first The second relative position is a position where the contact hole is located at ... The counter-acting force exerts a force externally on the guide member and towards the base body against the preload force.

[0046] The openings at one end for the contact areas of the test contact members preferably allow the individual contact members to be Corresponding slits arranged laterally on the plastic body for mounting and / or guiding The electrical contact with the contacting part is realized independently of the guide member. When this is established, each test contact element is inserted into the correspondingly assigned cutout of the plastic body. The guide member is movable within the recess, in particular within a corresponding recess in the base member. This allows for improved tolerance compensation when establishing electrical contact with the individual contacts of the contacting pair. will be done.

[0047] In a preferred embodiment, the guide member is configured to guide the contact member when electrical contact with the contact partner is established. The inner member first moves from an initial first relative position to a second or spring-loaded relative position. The test contact element is moved to a relative position or The contacting member is arranged so as to contact the test contact member while the guide member is moving further. Establish electrical contact via the contact area. During continued further stroke of the device towards the contact partner , the guide member and the test contact member deflect simultaneously or parallel to each other.

[0048] The guide member preferably has an end portion of the guide member that is assigned to a contact partner for electrical contact. The distal centering section is advantageously The device preferably has a protrusion oriented toward the center of the contact portion of the device or a The contact portion has a centrally oriented recess. This protrusion or recess is electrically connected to the contact partner. When establishing electrical contact, the contact is designed to engage with a corresponding central recess or protrusion on the other contact. The centering section is formed on a front surface substantially perpendicular to the longitudinal direction of the device. The front surface may have a groove for mounting and / or guiding the test contact member. An opening is formed at one end of the transverse cutout, particularly a slit-shaped cutout, and a test The distal contact area of ​​the contact member is either protruded or retracted depending on its position relative to the guide member.

[0049] Alternatively or additionally, the centering section may include a contact for guiding the test contact member. The side of the portion has a plurality of raised or recessed portions each disposed adjacent to the opening of the notch. It is possible.

[0050] In another preferred embodiment, the movable piston of the inner casing is The shortening contact member can be connected to the inner casing contact member. In addition to the multiple high frequency test contact members extending toward the part, they have position-dependent signal A shortened contact member is provided and arranged to be connectable to the movable piston to transmit a signal. The first contact is arranged parallel to the other test contact members and is shorter than the other test contact members. In all other examples, the shortened contact member has a test contact area substantially similar to that described above. The shortened contact member is preferably designed in the same way as the test contact member according to the invention. The material makes electrical contact with a printed circuit board similar to the material.

[0051] The moving piston is made of electrically conductive material and has a large contact point with the contacting element. The movable piston is realized to establish electrical contact with the rear and preferably annular or The contact ledge has a step shape. The contact ledge can be moved from an initial first relative position to a second relative position. When the movable piston deflects towards the Here, the shortened contact members are advantageously located radially outward relative to the other test contact members. In particular, the shortened contact members are arranged at four outer edge positions relative to the other contact members. It will be placed.

[0052] When establishing electrical contact with the contact partner, the movable piston is actuated by the second spring element. against the spring force of the spring element or against (second) spring elements advantageously arranged in a distributed manner in the circumferential direction. The piston deflects against the rear contact ledge after the piston has traveled a predetermined working stroke. The shortened contact member is then electrically connected to the piston so that the shortened contact member can transmit a signal. In this way, the shortened contact element is connected to the contacting element, in particular to the large contact point of the contacting element. The inherent spring effect through the elastic region exerts a spring force on the piston in the longitudinal direction of the device. When the piston is removed from its contact, it Through the addition of a spring force, on the one hand, through the spring force of the shortened contact element, and on the other hand, through the The spring force of the second spring element is preferably distributed in the circumferential direction. The spring member returns to the initial first relative position.

[0053] In a preferred embodiment, a heat exchanger is disposed between the inner casing and the outer casing. The first spring member is connected to the movable piston and the base or plastic of the inner casing. The spring force is stronger than that of the second spring member disposed between the base and the contacting member. Deformation of the first spring member relative to the second spring member when establishing electrical contact with the Therefore, the deflection of the spring is delayed. In particular, the second spring member, and therefore the movable piston, The first spring element and therefore the inner casing are first deflected against the base of the casing. does not deflect relative to the outer casing until other and / or stronger forces are applied .

[0054] In a preferred embodiment, the first spring member also comprises a plastic base and a guide member. The spring force is stronger than that of the third spring member disposed between the first spring member and the second spring member. wherein the first spring member has a spring force stronger than the combined spring force of the second and third spring members. Has.

[0055] The second spring member is a third spring member disposed between the plastic base and the guide member. This preferably allows the contact partner to be electrically connected via the guide member. When contacted, the guide member may be moved first or initially against the application of a spring force. The individual contact points of the contacting partners are therefore guided, allowing for improved contact. This is especially true when the contacting element is laterally offset from the piston. In this case, if the piston is initially at the center of the contact, at least partial displacement of the moving piston occurs. It can also be done in parallel with the deflection.

[0056] In yet another embodiment, the spring forces of the second and third spring members may be approximately the same. In this embodiment, the spring force of the second and third spring members is preferably equal to that of the first spring member. The spring force of the third spring member is weaker than the spring force of the second spring member. It's okay to be strong.

[0057] The spring force of the first spring member is preferably 4N to 18N, more preferably 4N to 8N, and even more preferably 5N to 18N. The spring force of the second spring member is preferably 5.5N to 6.5N. , 2N to 7N, more preferably 2.5N to 4.5N, and even more preferably 2.5N to The spring force of the second spring member is preferably 3N. Advantageously, the second spring element is made up of four spring elements distributed in the circumferential direction. The spring force mentioned above is the resultant spring force of the four spring members.

[0058] The spring force of the third spring member is preferably 0.1N to 2N, more preferably 0.3N to 1. The high frequency test connection according to the present invention has a resistance of 0.2N, and more preferably 0.5N to 0.8N. The spring force of the contact members and of the shortened test contact members extending in the longitudinal direction of the test contact members is preferably is 0.1N to 0.5N, more preferably 0.15N to 0.3N, and even more preferably is 0.18N~0.25N.

[0059] In another aspect of the invention, the invention provides a test contact attachment for a test pin arrangement as described above. The test contact attachment extends longitudinally and is connected to the test pin device. a first housing portion preferably having a connecting member for selectively connecting to a front end of the and a second housing portion protruding from the first housing portion. The second housing portion is particularly a notch extending in the longitudinal direction and serving to receive a portion of the test pin device at one end; When the contact is made, a non-permanent electrical contact is established with a contacting part disposed radially outside the notch. and a contact portion that serves to stand the second housing portion. and is formed at least partially elastically in the longitudinal direction.

[0060] The contact attachment according to the present invention allows the contact of the test object to be The test pin device can be selectively expanded and adapted. and especially additional test pins that are placed directly next to the contacts that are to be tested by the test pin arrangement. Simultaneous simple testing can be performed using a test pin device on the other device.

[0061] The contact attachment preferably has a continuous housing. is preferably formed or arranged in a substantially L-shape in a side view. The connecting member to be arranged may be, for example, a test contact attachment having a selectively connectable screw connection. Alternatively, the connection member may comprise a test pin arrangement or a suitable receiving member located thereon. The insertion member may have a clamp or catch mechanism for selectively interacting with the insertion member.

[0062] The first housing part is preferably plate-shaped or has a shape perpendicular to the longitudinal extension. The first housing part is preferably designed with thin walls. In particular, the test contact attachment is connected to the test pin device. The width of the first housing part, i.e., the length in the longitudinal direction, is kept relatively thin at the periphery. The intersecting extension is preferably less than 6 mm, more preferably less than 4 mm.

[0063] The first housing part preferably has a contact for establishing external contact with the test contact attachment. The contact member preferably has a contact for establishing a non-permanent contact with the test partner. The contact members are particularly arranged in the housing area at the opposite end of the contact portion. At least one plug connector serves to selectively establish electrical contact with the Alternatively, instead of the contact member, a conductor extending to the housing may be provided in the first housing. The corresponding contact elements, in particular plug connectors, may be introduced directly from the end of the part. may be provided, for example, at the end of the conductor and outside the housing.

[0064] The cutout in the second housing part is preferably cylindrical or rectangular. Preferably, it matches the outer contour of the portion of the test pin arrangement located at one end.

[0065] The contact portion of the test pin attachment is preferably multi-pole. However, the poles may be arranged in any other way. stomach.

[0066] In another preferred embodiment, the contact portion preferably has a cutout extending parallel to the receiving portion. In particular, in the hole, a small hole is provided at least partially resiliently attached to the second housing part. The resilient mounting of the conductor is carried out by the housing of the test contact attachment. By guiding the conductor in an at least partially curved manner within the body, and / or by This is possible by providing an additional power store via a spring member acting on the body.

[0067] In another embodiment the contact portion is preferably spring loaded at both ends and preferably has a notch At least one of the above is arranged in a parallel receptacle and is fixed in place. Each of the contact pins has a contact pin, which may for example be fitted into a corresponding receptacle. .

[0068] The details and advantages of the present invention are explained below with the aid of purely schematic and merely exemplary figures. Reveal. [Brief explanation of the drawings]

[0069] [Figure 1a] 1 is a side view of a high frequency test contact member according to a preferred embodiment of the present invention; [Figure 1b] 1 is a side perspective view of a high frequency test contact member according to a preferred embodiment of the present invention; [Figure 2a] 10 is a diagram of another preferred embodiment of a high frequency test contact member according to the present invention; [Figure 2b] 10A-10C illustrate another embodiment of a distally disposed contact portion of a test contact member. [Figure 3] FIG. 1 is a side perspective view of a preferred embodiment of a high frequency test pin apparatus. [Figure 4] 4 is an exploded view of the high-frequency test pin device according to FIG. 3. [Figure 5a] FIG. 5 is a partial cross-sectional side view of the high frequency test pin arrangement according to FIGS. 3 and 4. [Figure 5b] FIG. 5 is a partial cross-sectional side view of the high frequency test pin arrangement according to FIGS. 3 and 4. [Figure 6a]FIG. 5 is a side cross-sectional view of the high-frequency test pin arrangement according to FIGS. 3 and 4. [Figure 6b] FIG. 5 is a side cross-sectional view of the high-frequency test pin arrangement according to FIGS. 3 and 4. [Figure 6c] FIG. 5 is a side cross-sectional view of the high-frequency test pin arrangement according to FIGS. 3 and 4. [Figure 7a] 1 is a side cross-sectional view of a contact portion of a high frequency test pin device interacting with a contact partner. [Figure 7b] 1 is a side cross-sectional view of a contact portion of a high frequency test pin device interacting with a contact partner. [Figure 8a] 1 is a side cross-sectional view of a preferred embodiment of a high frequency test pin apparatus having an internally disposed test contact member; [Figure 8b] FIG. 8b is a detailed view corresponding to FIG. 8a. [Figure 8c] FIG. 8b is a detailed view corresponding to FIG. 8a. [Figure 8d] FIG. 8b is a detailed view corresponding to FIG. 8a. [Figure 9] FIG. 9 is a cross-sectional side perspective view of the high-frequency test pin device according to FIG. 8. [Figure 10a] 1b is a side perspective view of a preferred embodiment of a high frequency test pin arrangement with test contact members according to FIG. 1a, with some components removed for clarity; FIG. [Figure 10b] 2b is a side perspective view of another preferred embodiment of a high frequency test pin arrangement with test contact members according to FIG. 2a, with some components removed for clarity of the overall view; FIG. [Figure 10c] 10b shows a detailed view of the printed circuit board of the embodiment according to FIG. 10a. [Figure 11a] FIG. 10 is a side cross-sectional view of another preferred embodiment of a high frequency test pin apparatus. [Figure 11b] FIG. 10 is a side cross-sectional view of another preferred embodiment of a high frequency test pin apparatus. [Figure 11c] FIG. 10 is a side cross-sectional view of another preferred embodiment of a high frequency test pin apparatus. [Figure 12a] FIG. 1 is a side perspective view of an insulating material having a test contact member guided therein. [Figure 12b]11a-c are perspective, partially cut-away views of the high-frequency test pin arrangement; FIG. [Figure 13a] 11a-c, a partial cross-sectional side view of the movable piston of the test pin device according to FIGS. 11a-c, with the test contact member guided therein and the insulating material arranged therebetween, when electrical contact is established with a multi-pole contact partner; [Figure 13b] 11a-c, a partial cross-sectional side view of the movable piston of the test pin device according to FIGS. 11a-c, with the test contact member guided therein and the insulating material arranged therebetween, when electrical contact is established with a multi-pole contact partner; [Figure 13c] 11a-c, a partial cross-sectional side view of the movable piston of the test pin device according to FIGS. 11a-c, with the test contact member guided therein and the insulating material arranged therebetween, when electrical contact is established with a multi-pole contact partner; [Figure 14a] 11a-c in cross-sections of the test pin device in a non-contact relative position of the device components and in a relative position of the device components establishing electrical contact with their contact partners. [Figure 14b] 11a-c in cross-sections of the test pin device in a non-contact relative position of the device components and in a relative position of the device components establishing electrical contact with their contact partners. [Figure 15a] A partial side cross-sectional view of a movable piston of another preferred test pin device having an internally guided test contact member and an insulating material disposed therebetween when establishing electrical contact with another multi-polar contact partner. [Figure 15b] A partial side cross-sectional view of a movable piston of another preferred test pin device having an internally guided test contact member and an insulating material disposed therebetween when establishing electrical contact with another multi-polar contact partner. [Figure 15c] A partial side cross-sectional view of a movable piston of another preferred test pin device having an internally guided test contact member and an insulating material disposed therebetween when establishing electrical contact with another multi-polar contact partner. [Figure 16a]15a-c show cross-sectional side views of the test pin device according to FIGS. 15a-c in a non-contact relative position of the device components and in a relative position of the device components establishing electrical contact with their contact counterparts; [Figure 16b] 15a-c show cross-sectional side views of the test pin device according to FIGS. 15a-c in a non-contact relative position of the device components and in a relative position of the device components establishing electrical contact with their contact counterparts; [Figure 17a] 1 is a perspective view of a preferred embodiment of a test contact attachment according to the present invention; [Figure 17b] 1 is a perspective view of a preferred embodiment of a test contact attachment according to the present invention; [Figure 17c] 1 is a side view corresponding to the above perspective view of a preferred embodiment of a test contact attachment according to the present invention; FIG. [Figure 18a] 1A-1C are side cross-sectional views of two preferred embodiments of a test contact attachment according to the present invention; [Figure 18b] 1A-1C are side cross-sectional views of two preferred embodiments of a test contact attachment according to the present invention; DETAILED DESCRIPTION OF THE INVENTION

[0070] 1a and 1b show a first preferred embodiment of a high frequency test contact member 10 according to the present invention. The test contact member is preferably substantially laminar with a uniform thickness or material thickness (t). The test contact member 10 has a rectangular base body 10a. As a component, preferably produced by stamping, etching or electroforming. The conductor 10 extends along the longitudinal direction L.

[0071] The test contact member or its base 10a is electrically connected to a contact mate 30 (see, for example, FIG. 10b). A first contact area 1 at one end for establishing contact and a test pin for receiving a test contact member. the opposite end of the substrate 10b for establishing electrical contact with the power supply device 20 (see, for example, FIG. 3). The first and second contact regions 2 are arranged at the center of the first and second contact regions 2, and the intermediate serpentine elastic region 3. The contact areas 1 and 2 preferably extend substantially in the longitudinal direction L and preferably in a side view. The first and second contact areas 1 and 2 have uniform widths b1 and b2. 2 are preferably the same size, which may be 0.25 mm to 0.45 mm.

[0072] The meandering region 3 between the first and second contact regions 1 and 2 curves along the longitudinal direction L. The region 3 has a meandering extending direction V. The region 3 is preferably formed in the center of the region 3. The cavity 5 allows the base body 10a to have two preferably equal shapes. The resulting total thickness b3 is preferably is greater than the widths b1 and b2 of the first and second contact portions 1 and 2, and is preferably 0.35 mm. The diameter is 0.65 mm. The test contact is particularly The region 3 can be made elastic along the longitudinal extension direction L of the member 10 .

[0073] The meandering elastic region 3 continues in the extension direction V, and has respective bending angles α1, α2, β1, The base body 10a has a plurality of curved members 8a, 8b, 8c, and 8d, each of which is β2. The bending angle is preferably in the range of 5° to 70°. In particular, the meandering elastic region 3 has a bending angle exceeding 70°. The direction of extension V of the meandering region 3 preferably lies in one plane. This means that the curved members 8a, 8b, 8c, 8d all lie in the same plane.

[0074] The serpentine elastic region 3 is preferably directly connected in the direction of extension V, i.e., arranged one behind the other. The curved portions 6a and 6b are arranged in the direction of extension. The two curved sections are bent or arranged to form a curved line. The members 8a, 8b, 8c, and 8d preferably have the same curvature angles α1 and α2, and β1 and β2. The respective curves of the curved members 8a, 8b of the first curved portion 6a The bending angle is 40° to 70°, preferably 45° to 65°. The bending angle of each of the bending members 8c and 8d is 5° to 25°, preferably 5° to 1 5°.

[0075] The first contact area 1 has a contact portion 1a at its distal end and establishes electrical contact with a contact partner 30. The contact portion 1a has a flat contact surface perpendicular to the extension in the contact area 1. It is possible.

[0076] The second contact area 2 is opposite the contact area 1 or its distal contact portion 1a and is Implemented to establish electrical contact with contact portion 18 (see FIG. 10c) in pin device 20 The second contact area 2 has a curved end portion 2a that is connected to the test contact member. The end portion of the spool 2 has laterally projecting lugs 2b which are intended for fastening and in particular for mounting in the receiving part of the spool 2. It is located adjacent to 2a.

[0077] Preferably in the central part, the elastic region 3 has a joint that interrupts the cavity extending along the extension direction V. It has a connecting bridge 7.

[0078] in the direction of extension V, from the first contact area 1 through the elastic area 3 to the second contact area 2 The substrates are preferably arranged so that the cross sections F1, F2, and F3 are substantially constant. This is achieved in that the cross sections are separated from each other by less than 20%, preferably less than 15%. In particular, the elastic region 3 has a total cross section of 10% or less. F3, i.e. the sum of the cross sections of the first and second connecting members 4a, 4b, the total cross section F3 is Extending parallel to the connecting member 1 and adjacent to each of the first and / or second contact areas 1, 2 From the cross sections F1 and F2 of the portion to be cut, it is preferably less than 20%, more preferably less than 15%, and even more preferably differ by less than 10%.

[0079] FIG. 2a shows a substantially identical directly connected two-phase circuit board, which is different from the first embodiment described above. 1 shows another preferred embodiment of a test contact member 10 having two curved portions 6a, 6b. The bending angles α1 and α2 of the bending members 8a and 8b of the curved portion 6a are 40° to 70°. , preferably 45 to 65°. The curved members 8c′ and 8d′ of the second curved portion 6b The respective bending angles β1′ and β2′ are 40 to 70°, preferably 45 to 65°. .

[0080] As shown in Figure 2a, the second contact area 2 may also have a cavity 5'. The corresponding geometry is similar to that of the embodiment of FIG. 1, but in this example, the corresponding sum of the regions 2 The cross section is selected so that it does not differ substantially from the other cross sections of the test contact member. Although not shown, the test contact member 10 may also have a connecting bridge 7 for the cavity 5 .

[0081] Figure 2b shows another embodiment of the distal contact portion 1a of the test contact member 10. The contact portion 1a may have a V-shaped contact point that at least partially protrudes. As an alternative to a tapered shape, it may be a flared shape, for example an inverted V or U shape.

[0082] 3 to 5b show a multi-pole contact mating 30, in particular a board-to-board plug connector or a multi-line Preferred embodiment of high frequency test pin device 20 for non-permanent contact of plug connectors Shows. The test pin device 20 is electrically connected to a contact 30 for interaction, particularly for testing. an inner casing 11 having a contact portion 12 at one end for electrically contacting the inner casing; , and an outer casing 13. The outer casing 13 is particularly a central housing portion a flange 13a protruding from the base 13a, and a mounting and / or connecting member 1 formed on the flange 13a. 3b. Therefore, the outer casing 13 is a part of the mobile test unit. It can be attached to a clamping device such as a clamping screen.

[0083] The inner casing 11 is located at the rear of the device 20, opposite the contact portion 12, in particular Conductors and / or cables 17a, 17b transmit electrical signals and / or The connector 9 has a function of interrupting the transmission of signals and is connected to a contact portion 12.

[0084] The inner casing 11 is at least partially attached to the outer casing 13. For this purpose, the inner casing 11 is connected to the outer casing 13. , are guided substantially movably along the longitudinal direction L1 of the device. The first spring member, preferably disposed between the inner and outer casings 11, 13, is 3 and 5a in the non-contact end position or first relative position shown in FIG. A preload force is provided to hold the device between 11 and 13. Figure 5b shows the inner and outer casings. In the figure, the inner casing 11 is movably In particular, the outer casing 13 is rotatably, tiltably, and laterally offset relative to the outer casing 13. and / or movably mounted so that the test contact or contact partner 30 and the electrical When establishing physical contact, it is preferable to provide several degrees of freedom for the movement of the inner casing 11. Since the pressure is applied from the inside of the inner casing 11 to the contact portion 12 and the contacting portion 30, Effective tolerance compensation is permitted.

[0085] As shown in FIG. 4, the device 20 further includes at least one, and preferably two, printed circuits. The substrates 14a, 14b are electrically connected to the printed circuit board and extend toward the contact portion 12. and a plurality of high frequency test contact members 10 as described above. The plate is placed in an inner casing 11 and is covered with an insulating material 19, such as a carrier unit, in particular a plastic body. Here, the printed circuit boards 14a, 14b are arranged on the board 14a, 14b, for example, by means of screw connections 22a, 22b, etc., are secured to the carrier unit 19 using the intended fastening or attachment mechanism.

[0086] The contact portion 12 is connected to the inner casing, and in particular to the high frequency test contact member 10. and a centering section 12a at one end of the The centering section 12a is allocated power stores 23, especially For example, by a second spring element, preferably comprising several spring elements 23 scattered in the circumferential direction. , can be attached to a carrier unit or insulating material 19. The centering section 12a is preferably a movable piston of the inner casing 11. The contact 30 is formed in the cavity 27 and is disposed at one end of the cavity 27. The piston 27 is disposed at one end of the inner casing 11, The spring force applied by the second spring member 23 is received.

[0087] The movable piston 27 is mounted on the base 11a of the inner casing 11, preferably a hollow cylindrical base. The movable piston 27 is preloaded in the direction away from the body. against the inner shelf 34a of the piston 34 and against the inner casing. can be positioned so that they cannot move.

[0088] The inner casing 11 preferably comprises a plurality of individual components, in particular those that can be attached. These components are preferably screwed together in the longitudinal direction L1 of the device. The two components may be fastened together to form a single unit.

[0089] 6a-6c show first and second relative positions of the inner and outer casings 11, 13. For illustrative purposes, several cross-sectional side views of a high frequency test pin device 20 are shown. Thus, the inner casing 11 may be fitted to the inner contour of the outer casing 13 depending on its position. In particular, the inner casing 11 has a variable outer contour. and a bearing sleeve extending axially between the contact portion 12 and the connecting portion 9 formed at the other end. The bearing shaft portion 24 is an outer shaft extending along the longitudinal direction L of the device. - at least partially received or guided in a guide recess 25 in the casing 13. The shaft portion 24 has at least one preferably substantially conical protrusion 24a. 24a is attached to the recess 25a of the complementary guide recess 25 at a first relative position. In order to prevent the protrusion 24a and the recess 25a from rotating at this position, it is preferable to The protrusion 24a and the recess 25a are not rotationally symmetric in the circumferential direction. It may be rectangular when viewed from the outside (see FIG. 4).

[0090] The effect of the first spring member 21, in particular the coil spring, is to The inner casing 11 and the outer casing 13 are preloaded. The coil spring 21 is attached to the inner casing 13 at one end. The first annular shelf 26a of the lid 11 is provided with another annular shelf 26b arranged on the opposite side along the longitudinal direction L1 of the device. At the end of the outer casing 13, it acts on the second annular shelf 26b, and the inner casing The space between the inner casing 11 and the outer casing 13 is widened. In this case, the maximum stroke of the casing 11 is the bearing shaft portion of the inner casing 11. Limited by centering section 24b of 24. Centering section 24b is disposed on the outside and engages with an extension of the outer casing 25b at one end. At the maximum stroke, it abuts against the expanded portion of the outer casing 25b.

[0091] As shown in Figures 6b and 6c, when electrical contact is established, the outer cable is at least partially When the inner casing 11 is bent (second relative position), the protrusions 24a and The allocated recesses 25 are spaced apart from one another. Furthermore, the outer diameter of the bearing shaft portion 24 is The outer casing 13 has a smaller guide recess 25 than the inner casing. In this second position, the outer casing 11 is now positioned within the defined boundaries of the outer casing 11. This means that rotation, tilt, and / or offset within 13 are possible.

[0092] Figure 6c shows a cross section in the plane of the radial offset of Figure 6b. The centering section 12a of the part 12, the power store, in particular, is preferably circumferentially The second spring element or elements 23 are shown biased to the second position. The spring member 23 is preferably a spring-loaded contact that is arranged parallel to the longitudinal direction L1 of the device 10. Equipped with a pin.

[0093] Figure 7a shows a contact part 12 with a centering section 12a at one end. The centering section 12a is particularly protruding from the centering section 12a. The test contact element 10 is resiliently mounted opposite the test contact element 10. This is particularly By positioning the contact portion 12 at or on the end of the movable piston 27 The centering section is preferably tapered toward the test contact member. has an internal contour with circumferentially scattered centering ramps 12b. The contact portion 12 and the contacting portion 30 are shown in FIG. When the contacting part 30 approaches the centering section 12b, the contacting part 30 contacts the centering section 12b. 12a and guided towards the contact portion 12 so that it is centered and fixed in place. .

[0094] 8a-d show a high frequency test pin device 20 having a test contact member 10 disposed therein. 9 shows a side cross-sectional view of the preferred embodiment and corresponding detail views B, C, and D. 1 shows a corresponding cross-sectional perspective view of the device.

[0095] As shown in FIG. 8a, the device 20 preferably comprises two pairs of electrodes spaced apart from each other. The printed circuit board has a centrally located carrier unit 1 8b shows a typical position of the test contact element 10. The test contact members 10 are electrically connected to the printed circuit boards 14a, 14b. b to the opposing contact area 12 of the device. , preferably arranged on both sides of the centrally arranged carrier unit 19. The contact member 10 fits into a corresponding notch 19a in the conveying member or carrier unit 19 (see FIG. 9). The notch 19a extends inward in the longitudinal direction L1 of the contact member 10 or the test contact member 10 is formed so as to allow spring deflection in the longitudinal direction L thereof.

[0096] FIG. 8c shows a detailed view of how the test contact members 10 are attached to the printed circuit board 14a. For this purpose, the curved end portion 2a of the test contact member 10 is connected to the printed circuit board 14. a, so that the test contact member 10 is placed on the assigned contact portion 18 (see FIG. 10c) 1. The conductive traces 15a are electrically connected to the corresponding conductive traces 15a of the printed circuit board 14a via one of the conductive traces 15a. The laterally projecting lugs 2b of the test contact member 10 are designed to catch on the target. It is caught in a recess 19b of the intended carrier unit 19. As shown in the detailed view of Figure 8b , the opposite end of the test contact member 10, in particular its first contact area 1, is connected to the inner casing 11 or the guide portion 12c of the movable piston 27, or The piston 27 is linearly guided in the longitudinal direction L1.

[0097] 10a and 10b show a high frequency test pin device 20 having a test contact member 10 according to the present invention. 1 shows another embodiment of the present invention, but for the sake of clarity, the outer casing 13 and The outer components of the inner casing 11 are omitted. A corresponding detailed view of the printed circuit board 14a is shown.

[0098] As shown in Figures 10a and 10b, a plurality of high frequency test contact members 10 are The test contact member 10 is electrically connected to the printed circuit boards 14a and 14b. The substrates 14a and 14b are arranged so as to extend substantially in the longitudinal direction L1 of the device or in parallel thereto. The corresponding test contact members 10 are arranged in the inner casing 11 in the longitudinal direction L (see FIG. 1a) extends in particular parallel to the longitudinal direction L1 of the device. , from the contact partner 30 for the signal tap at the connecting part 9 located at the rear of the device. This allows the signal to be transmitted optimally.

[0099] The printed circuit boards 14a and 14b have conductive traces 15a and 15b, respectively. The electrical traces 15a, 15b are disposed on the printed circuit boards 14a, 14b and correspond to A contact portion 18 that is in electrical contact with the test contact member 10 is connected to the corresponding connecting portion 9. Conductive traces 15a, 15b disposed on the printed circuit board are also preferred. The conductive traces 15a extend substantially in or parallel to the longitudinal direction L1 of the device. 15b has a curved angle of more than 70° along or parallel to the longitudinal extension L1, and more preferably Preferably, the curved portion or curve or element does not have a curved portion or curve of greater than 45°.

[0100] A connection portion 9 of the printed circuit board for establishing external electrical contact with the test pin device is Corresponding conductors 17a, 17b are connected from the printed circuit boards 14a, 14b to the longitudinal The connecting portion 9 is preferably arranged or formed to extend substantially in the direction L1. Or, a connector for soldering to an external connector or conductor 9b to provide a permanent connection. The connector or conductor 9b is provided with contact members 9a, e.g., solder contact locations, in the longitudinal direction L of the device. The printed circuit board may be at least partially disposed in a longitudinal slit 16 extending in the direction of the arrow 1. Alternatively, the contact member 9b may have a plug connector (not shown). The connectors preferably extend in the longitudinal direction L1 of the device and are connected to the printed circuit boards 14a, 14b. via the assigned external plug connector 9b, which is placed in the longitudinal slit 16 of the Instead, the connecting portion 9 preferably serves to establish contact. The plug connector 9a is located at one end of the surface of the main circuit board (see FIG. 10b). It is possible.

[0101] According to the embodiment shown in FIG. 10a, the test pin device 20 is a test terminal for making electrical contact. Two opposing, in particular parallel, printed circuit boards arranged radially outward of the contact members. The printed circuit boards 14a and 14b are The conductive traces 15a, 15b disposed on the conductive traces 14b are opposed to each other, i.e., facing each other. It is directed in this way.

[0102] According to the embodiment shown in FIG. 10b, the test pin arrangement 20 is connected to two printed circuit boards. The printed circuit boards 14a and 14b are abutted against each other in parallel. or are located directly adjacent to each other, or preferably substantially in the center of the test pin arrangement. The conductive trays of the printed circuit boards 14a and 14b are arranged along the central axis of the device. The electrodes 15a and 15b are preferably arranged on opposite sides of the electrode. The test contact members 10 are positioned radially outward of the printed circuit boards 14a, 14b relative to the device 20. will be placed in.

[0103] As shown in FIG. 10c, the test contact members 10 are connected to the corresponding conductive traces 15. The contact portion 18 preferably comprises a conductive trace or contact The cross section perpendicular to the direction of extension of the portion 18 is The cross section of the second contact area 2 of the high frequency test contact member 10 near the end portion 2a is Tests that differ by less than 0%, more preferably by less than 15%, and even more preferably by less than 10%. The cross section of the end portion 2a contacting the contact portion 18 of the test contact member 10 matches the cross section of the end portion 2a. Preferably, outside the contact portion 18, the cross section is larger than the contact portion. During the process, the conductive traces preferably have a substantially constant cross section.

[0104] 11a-c show side cross-sectional views of a further preferred embodiment of the high frequency test pin device 10. The depiction in Figure 11c is taken in a plane perpendicular to the cross section shown in Figure 11b. do.

[0105] In this embodiment, the carrier unit or insulating material 19 is realized in two parts. The carrier unit is fixedly disposed in the inner casing as a fixed unit, and the The printed circuit boards 14a, b have a base 19c disposed thereon, while the inner case The carrier unit also has a guide member 19d which is movable relative to the shingle. The notch 19a, which serves to mount and guide the test contact member 10, is formed on the base 19c. and guide member 19d. As shown in FIG. The notches 19a face each other in planes, and the carrier unit or the solid insulating material is The power store, particularly the third spring member 19e, is disposed between the base 19c and the guide member The third spring member 19e is realized as a compression spring and is electrically A preload is applied to the guide member 19d toward the contact portion or the contacting partner that contacts the guide member 19d.

[0106] The guide member 19d is biased against a pin or spring alignment pin 28. The spring alignment pin 28 is preferably positioned substantially perpendicular to the direction of movement of the guide member. or is arranged in the inner casing 11 so as to be fixed in position, and The spring alignment pin is located in a hole 19e in a guide member 19d that extends perpendicular to the direction of movement. The side or jacket surface of the nut 28 serves as an abutment surface against the inner wall of the hole 19e. The maximum stroke of the guide member 19d is the spring positioning pin 18 and the hole 19e. The interaction between the opposing inner walls of the

[0107] In this first relative position, the test contact member 10 establishes electrical contact with the contact partner 30. The corresponding contact portion 1a of the guide member 19d is preferably located within an opening 29 formed at one end thereof in the guide member 19d. That is, the contact portion 1a is arranged so as to be protected or at least partially protected by the side In the second relative position of the guide member 19d, the third The test contact member 10 is moved toward the base 19c against the preload of the spring member 19e. The portion 1a preferably projects further into the allocated opening 29 than it does in the first relative position. The opening 29 at one end of the test contact member 10 for the contact area 1a is preferably Preferably, a carrier unit 19 for mounting and / or guiding the individual contact elements 10. The corresponding laterally arranged slit-shaped notch 19a is integrally formed or cut out. This forms the front end portion of the notch 19a (see Figures 12a and 12b).

[0108] The guide element 19d is preferably assigned to an electrical contact 30. At least one distal centering section 3 disposed at one end portion of the member 19 1. The centering section 31 preferably has at least one protrusion or recess. The protrusion or recess is preferably oriented toward the center of the contact portion 12 of the device 20 and is in contact with the When electrically contacting the contacting partner, the contacting partner 30 is contacted with the corresponding central recess or protrusion. As shown in Figure 12a and b, the centering section 3 The centering section may include a recess located at the front and center. 31 is a partially protruding portion of the contact member 10 formed laterally of the centrally disposed recess. It has a plurality of protrusions 31a for at least partially surrounding the contact portion 1a.

[0109] As shown in Figures 12a and 12b, the embodiment is similar to the high frequency test contact member 10. Preferably, the wiring board 14a, 14b includes a shortened contact member 32 that makes electrical contact with the wiring board 14a, 14b. Each of the contact members 32 is preferably positioned radially outward relative to the other high frequency test contact members 10. In particular, the shortened contact members 32 are preferably positioned at the outer edge relative to the other test contact members 10. In the first relative position of the piston 27, the contact member 32 and the piston 27 In the second relative position of the piston 27, the contact member 32 is in contact with the piston 27. 27 and a force is applied to the second relative position, so that the piston 27 The contacts interact with the movable piston 27 to allow signal tapping via large contacts. The position-dependent contact is realized at the rear of the piston 27. This occurs preferably via an annular or step-shaped contact ledge 33 (see FIG. 11c). The contact member 32 is spring-loaded relative to the piston 27 with a corresponding contact front side 32a. , the contact ledge 33 comes to rest or is pressed against the contact ledge 33.

[0110] 13a to 13c show the state when the movable piston 27 is in electrical contact with the contact partner 30 and when the movable piston 27 is in its position. 11a-c when interacting with the shortened contact member 32, independently of the positioning thereof. 13a shows a partial cross-sectional side view of the movable piston 27 of the pump device 20. The contacting part 30 is first centered by the centering section 12b of the device or piston 27. Between the movable piston 27 and the inner and / or outer casing 11, 13 The relative movement of the two elements preferably does not occur yet, and the resulting alignment is as shown in FIG. a and the corresponding detail in Figure 15a. However, contact with the piston 27 in particular If the offset of the mating member 30 is more pronounced, the movable piston 27 will move in the inner casing 1. 1a, it can be partially deflected by the spring force of the second spring member 23.

[0111] As shown in FIG. 13b, continued application of force to the device 20 in the direction of the contact 30 causes the movable pin The spring 27 acts against the spring force of the second spring member or the second spring members 23 scattered in the circumferential direction. The piston 27 is deflected relative to the rest of the inner casing 11. After the travel, the shortened contact member 32 makes electrical contact via the rear contact ledge 33. Therefore, the shortened contact member 32 is specifically connected to the contact partner 30 to transmit the signal. The shortened contact members 32 are connected to the contacting partners in large contact points. Thanks to the inherent spring effect via 3, the device can be moved in the longitudinal direction L With the relative movement of the piston 27 described above, The guide member 19d of the carrier unit 19 is deflected when it makes electrical contact with the contact partner 30. Here, the contacting part 30 is positioned by the centering section 31 of the guide member 19d. The direction towards the device 20 can be further centered or optimized. The position is shown in Figure 14b.

[0112] In a preferred embodiment, a first insulating layer 14 is disposed between the inner and outer casings 11, 13. The first spring member 21 has a stronger spring force than the second spring member 23 or the second spring member 2 The second spring member 23 has a combined spring force of 3. The second spring member 23 is connected to the movable piston 27 and the inner case. The support 11 is disposed between the base 11a of the support 11 and / or the carrier unit base 19c. As a result, when electrical contact is made with the contact partner 30, the first spring member 22 is forced against the second spring member 23. In particular, the deformation and thus the deflection of the second spring member 23 is delayed. Therefore, the movable piston 27 is preferably first deflected relative to the carrier unit base 19c, and , the first spring member 21 and therefore the inner casing 11 may be subjected to other and / or stronger forces. It will not deflect until a

[0113] 15a-c and the corresponding Figs. 16a, b, electrical contact with another contact partner 30 Another preferred embodiment of the device 20 according to the invention is shown in FIGS. 13a to 13c, This alternative embodiment is shown similar to the previously described embodiment, with the differences noted below. However, it essentially corresponds to the device described above.

[0114] The movable piston 27 in this embodiment is located radially outward of the centering section 12b. The contact protrusion 27a has an outer contour tapered toward the contact mating part 30. The contact protrusions 27a are arranged in a correspondingly intended opening or openings in the contact mate 30. The contact protrusion 27a is preferably formed to engage with the notch 30a. The contact protrusions 27a are arranged adjacent to the slopes of the centering section 12b in the paired directions. Preferably, the center has at least two opposing slopes disposed radially outward. The ring section 12b can be a separate component and is connected to one of the movable pistons 27. The centering member 27b can be realized as an attachment member 27b at the distal end of the The section 27a is preferably formed integrally with the piston 27 and has a contact 30 13a-c, the large contact points are in short contact with the piston 27. Preferably, the function is established through a position-dependent interaction between the member 32 and the sensor.

[0115] As can be seen in the corresponding Figures 16a and 16b, the guide member 19d is a distal centering section 31, which, in contrast to the previous embodiment, is realized as a front central protrusion. When contact is established, the protrusion 31 engages with the central opening or notch 30b of the contacting part 30. The lateral surfaces that contact the contacting part 30 are tapered towards the contacting part 30, providing optimal guidance when establishing contact. This makes it possible to

[0116] The contact portion 1a of each contact member 10 is in an inverted U shape in this embodiment. , to electrically contact the contact member 30c of the contact partner 30 protruding in the direction of the device 20. In particular, this inverted U allows the individual contact elements to be moved in an improved manner during the contact process. 30c can be aligned.

[0117] 17a-c are perspective views of a preferred embodiment of a test contact attachment 40 according to the present invention. 18a and 18b show a side view and a corresponding side view when mounted in a test pin device. A corresponding cross-sectional view of the test contact attachment 40 is shown.

[0118] The test contact attachment 40 has a housing that is substantially L-shaped in side view. The housing includes a first housing portion 41 and a second housing portion 42 connected to the first housing portion 41. The first housing portion preferably has a plate-like shape and a second housing portion 42 extending away from the first housing portion. and / or has a thin wall and extends along the longitudinal direction L2 of the attachment 40. The second housing portion 42 preferably extends substantially perpendicular to the longitudinal direction L2. Here, the test pin device 20 extends in the longitudinal direction L2 and receives a portion 12 of the test pin device 20 disposed at one end. The inner contour of the notch 43 preferably has a width of 1 / 4" that is larger than the width of the hole 41. The test contact attachment 4 therefore conforms to the outer contour of the contact portion 12 of the device 20 being used. 0 slips at the contact portion 12 of the test pin device 20 located at one end. The connection member 48 disposed in the first housing portion 41 can be used to select the test pin device 20. selectively fixed (see Figure 17c).

[0119] The second receiving portion 42 is provided radially outward of the receiving portion 43 with a non-permanent contacting part (not shown). The contact portion 44 is preferably located at one end. The second housing portion 42 is disposed on the flat surface 46 of the second housing portion 42 and extends perpendicular to the longitudinal direction L2. and is designed to be at least partially elastic in the longitudinal direction L2. The contact portion 44 here extends parallel to the notch 43 and is a receiving portion of the second housing portion 42. At least one conductor 45a is resiliently mounted and / or guided in a portion 45b. The housing portion 51a is stored in a curved shape and is extended in the longitudinal direction L2. With the portion 51 of the conductor 45a at least partially movably mounted, the In this embodiment, the conductor 45a is elastic in the axial direction. or extend throughout the housings 41, 42 to establish external contact with the test contact attachment 40. The contact member 47 is connected to the opposite housing side. As a connector, for example, it is possible to establish an external electrical contact between contact portion 44 and outer conductor 49. This can be achieved by:

[0120] In another embodiment according to FIG. 18b, the axial elasticity of the contact portion 44 is preferably This is achieved by a contact pin 45a' that is spring-biased to the side and placed in a corresponding receptacle 45b. The contact pins 45a' are electrically connected to a conductor or a circuit board 50 disposed in the second housing portion 42. The circuit board 50 can be externally contacted by the contact members 47 provided. 49.

[0121] The contact attachment of the present invention allows the contact of the test object to be The test pin arrangement can be selectively expanded and adapted. Additional test partners are placed, for example, directly adjacent to the contact partner under test by the test pin device. However, by using a test pin device, simultaneous testing can be easily performed. [Explanation of symbols]

[0122] 1 First Contact Area 1a Contact part 2 Second contact area 2a Curved end 2b Rug 3 Elastic Region 4a, b Connection members 5 hollow 6a, b Curved part 7 Connecting Bridges 8a~d Curved members 9 Connecting part 9a Contact member 9b Outer conductor 10 High frequency test contact member 10a Thin plate-shaped substrate 11 Inner casing 11a Inner casing base 11a-e Individual components of the inner casing 12 Contact area 12a Centering Section 12b Centering bevel 12c Information Department 13 Outer casing 13a flange 13b Connecting member 14a, b Printed circuit board 15a, b Conductive traces 16 Vertical slit 17a,b conductor 18 Contact area 19 Carrier unit, plastic body 19a Notch in conveying member 19b Lug cutout 19c base 19d Guide member 19e Third spring member 19f Spring alignment pin holes 20 Test pin device 21 first spring member 22a, b screw connection 23 Second spring member 24 Bearing shaft 24a Convex part 24b Centering Section 25 Guide recess 25a Recess 25b Outer casing extension 26a, b Circular shelf 27 Movable Piston 27a Contact slope 27b Piston attachment member 28 Spring Alignment Pin 29 End guide openings 30 Contact Person 30a Contact notch 30b Center notch 31 Centering Section 31a Convex part 32 Shortened contact member 32a Front side of contact 33 Contact shelf 34 Fixed Piston 34a Internal shelf 40 Test Contact Attachment 41 First housing part 42 Second housing part 43 Cutout 44 Contact part 45a Conductor 45a' Double-spring-loaded contact pin 45b Receptor 46 sides 47 Contact member 49 Outer conductor 50 Conductors, circuit boards 48 Connecting member 51 Curved part of conductor 51a Curved housing part α1, 2, β1, 2 bending angles b1 Width of the first contact area b2 Width of the second contact area b3 Total thickness of the elastic region F1-3 cross section L Longitudinal direction L1 Longitudinal direction of the device L2 Longitudinal direction of attachment t: thickness of the substrate V Extending direction

Claims

1. Test pin device for detachably contacting a contacting partner, particularly a board-to-board plug connector A high frequency test contact member (10) comprising: The high frequency test contact member (10) a first contact area at one end for establishing contact with a contact partner (30); A contact pin device (20) containing said test contact member and a receptacle for establishing electrical contact. a second contralateral contact area; An intermediate serpentine-shaped elastic region (3) extending longitudinally of said test contact member (10). For suspension along the direction (L), it is preferably located in the center and in the extension direction of the elastic region. said intermediate serpentine-shaped elastic region (3) having a cavity (5) extending along (V); The high frequency test contact member (10) has a lamellar-shaped substrate (10a) having And, The serpentine-shaped elastic regions (3) are formed by respective curves which follow each other in the extension direction (V). Angle (α １ , α ２ , β １ , β ２ ) are 5° to 70° 8. A high frequency test contact member, characterized in that it has:

2. 2. The high frequency test contact member according to claim 1, The serpentine-shaped elastic region (3) is made up of two curved portions ( 6a, 6b), each of the two curved portions (6a, 6b) having two consecutive and opposite bays. The curved members are arranged in particular in an S-shape, each of the curved members preferably being substantially The same curvature angle (α １ , α ２ , β １ , β ２ ) a high frequency test contact Components.

3. 3. The high-frequency test contact member according to claim 1, The bending angle of each of the bending members (8a, 8b) of the first bending portion (6a) is 40 to 50°. 70°, preferably 45 to 65°, and / or The bending angle of each of the curved members (8c, 8d) of the second curved portion (6b) is 5 to 2. 5°, preferably 5 to 15°.

4. The high-frequency contact member according to any one of claims 1 to 3, The elastic region (3) Preferably uniform in the extension direction (V), The cross sections (F １ , F ２ ) to less than 20%, preferably The total cross-section (F ３ a high frequency test contact member having 。

5. The high-frequency test contact member according to any one of claims 1 to 4, The meander-shaped elastic region shields the cavity (5) extending along the extension direction (V). High frequency test contact, characterized in that it has at least one connecting bridge (7) Material.

6. The high-frequency test contact member according to any one of claims 1 to 5, The second contact area (2) is The test piece for establishing at least a partially elastic electrical contact with the contact portion (18) formed on the test pin device (20) and preferably having a cross section narrower than said second contact area (2).

1. A high frequency test contact member, characterized in that it has a curved end portion (2a) having

7. Multi-pole contact mate (30), particularly for detachable connection to a board-to-board plug connector A frequency test pin device (20) comprising: The high frequency test pin device (20) a contact portion at one end for interacting with said contact partner (30) for the purpose of carrying out the test; an inner casing (11) having a casing (12); An outer casing (13), inside of which , at least partially and relative to the outer casing (13), in particular in the longitudinal direction of the device Direction (L １ ), in the first non-contact relative position, the inner casing (11) is and is arranged to be fixed in position and is in electrical contact with a second contact partner (30). In the second relative position, the inner casing (11) is in contact with the outer casing (13). ) at least partially movably, in particular rotatably and / or tiltably attached to the The inner casing (11) is movably guided so that the outer a casing (13), The high frequency test pin device (20) A contact member (9a) for establishing an external electrical contact with the high frequency test pin device (20). At least one printed circuit board (14a, 14b) having a The printed circuit board (14a, 14b) is in contact with the inner casing (11).

7. A plurality of the contact portions (12) according to any one of claims 1 to 6, a high frequency test contact member (10); The printed circuit board (14a, 14b) and the test contact member (10) are Longitudinal direction (L １ ) is disposed in the inner casing (11) so as to extend substantially to the A high frequency test pin device (20).

8. 8. The high frequency test pin device (20) of claim 7, Conductive traces (15a, 15b) disposed on the printed circuit boards (14a, 14b) ) is the longitudinal direction of the device (L １ ) and extends substantially in the device longitudinal direction (L １ ) Preferably, the high-speed electric motor does not have any curved portion having a curved angle of more than 45°. Frequency test pin device (20).

9. 9. The high frequency test pin device (20) according to claim 7 or 8, The contact member (9a) is used to establish an external electrical contact of the test pin device (20). To this end, the respective conductors (17a, 17b) connected to the contact members (9a) are Longitudinal direction (L １ ) Test pin device (20).

10. In the high-frequency test pin device (20) according to any one of Claims 7 to 9, the corresponding contact portions (18) of the conductive traces (15a, 15b) on the printed circuit boards (14a, 14b) are such that the total cross-section resulting therefrom differs from the cross-section (F2) of the adjacent second contact region (2) of the high-frequency test contact member (10) by less than 20%, preferably less than 15%, and matches the cross-section of the end portion (2a) of the high-frequency test contact member (10) that makes contact, characterizing the high-frequency test pin device (20).

11. In the high-frequency test pin device (20) according to any one of Claims 7 to 10, the test pin device (20) has two opposing printed circuit boards (14a, 14b), and the printed circuit boards (14a, 14b) are preferably arranged radially outside the test contact member (10) that makes contact, characterizing the high-frequency test pin device (20).

12. In the high-frequency test pin device (20) according to any one of Claims 7 to 10, the test pin device (20) has two adjacent printed circuit boards (14a, 14b), or has one printed circuit board having conductive traces (15b) arranged substantially at the center of the test pin device and facing and arranged on both sides, characterizing the high-frequency test pin device (20).

13. In the high-frequency test pin device (20) according to any one of Claims 7 to 12, the test pin device (20) has an insulating material arranged between the individual high-frequency test contact members (10), particularly an intermediate plastic body having a plurality of lateral cutouts (19a) inside which the test contact members (10) extend, characterizing the high-frequency test pin device. （２０）。

14. In the high-frequency test pin device (20) according to any one of Claims 7 to 13, The contact portion (12) of the test pin device is in the longitudinal direction (L １ ) on the other hand at the end, particularly having a centering section (12a) elastically attached to the high-frequency test contact member (10), characterizing the high-frequency test pin device (20).

15. In the high-frequency test pin device (20) according to any one of Claims 7 to 14, the inner casing (11) and the outer casing (13) are pre-pressed against each other at the first relative position by a first spring member (21), and / or The inner casing (11) is a piston (27) which is movably mounted in one position. The test pin is attached to the end of the second spring member (23) to which the spring force of the second spring member (23) is applied. The contact portion (12) of the device (20) is formed with the piston (27), A high frequency test pin device (20) characterized by:

16. A high frequency test pin device (20) according to any one of claims 7 to 15, The carrier unit (19), in particular the plastic body, assigned to the contact part (12) of the device and movable relative to the rear base (19c) Possibly, a guide member (19d), The allocated member (19c) is disposed between the base (19c) and the guide member (19d). A high frequency tester characterized in that it has a power store (19e), in particular a third spring member. Test pin device (20).

17. A high frequency test pin device (20) according to any one of claims 7 to 16, The movable piston (27) of the inner casing (11) moves the device depending on its position. (20) is designed to be connectable to the shortening contact member (32), The shortening contact member (32) is arranged parallel to the high frequency test contact member (10). A high frequency test pin device (20) characterized in that:

18. A high frequency test pin device (20) according to any one of claims 7 to 17, The first spring member (21) of the device (20) is connected to the inner casing and the outer casing. - a spring stronger than the second spring member (23) arranged between the casings (11, 13) The second spring member (23) has a force, and the movable member (23) of the inner casing (11) It is disposed between the piston (27) and the base (11a) of the inner casing (11). A high frequency test pin device (20) characterized in that

19. 20. The high frequency test pin device (20) of claim 18, The first spring member and the second spring member (21, 23) are connected to a third spring member (19e). The third spring member (19e) has a stronger spring force and is connected to the base (19c) and the high frequency with the guide element (19d) of the carrier unit (19) assigned to the test contact element (10). A high frequency test pin device (20) characterized in that it is disposed between

20. Test contact for a high frequency test pin device (20) according to any one of claims 7 to 19 An attachment (40), The test contact attachment (40) Longitudinal direction (L ２ ) for selectively connecting to said test pin arrangement (20). a first housing portion (41) preferably having a member (48); a second housing portion (42) protruding from the first housing portion (41) at one end; Preparation, The second housing portion (42) comprises: In particular, the longitudinal direction (L ２ ) and at one end of the test pin device (20) 12) and a notch (43) serving to receive the The contacts are arranged radially outward of the notches (43) and are electrically connected to each other in a non-permanent manner. a contact portion (44) that serves to establish contact; The contact portion (44) is at least partially connected to the second housing portion (42). The longitudinal direction (L ２ ) a test contact attachment (40) resiliently formed on the test contact attachment (40).

21. 21. A test contact attachment (40) according to claim 20, The contact portion (44) is fitted into a receiving portion (45b) of the second housing portion (45), in particular a hole and at least one conductor (45a) at least partially resiliently attached to the picture, The receiving portion (45b) preferably extends parallel to the notch (43). A test contact attachment (40) characterized by:

22. 21. A test contact attachment (40) according to claim 20, The contact portion (44) is preferably spring-loaded on both sides and preferably fits into the notch ( 43) in a receiver (45b) arranged parallel to the receiver (43) and fixed in that position. and at least one contact pin (45a') attached so as to A test contact attachment (40).

23. A test contact attachment (40) according to any one of claims 20 to 22, The first housing part (41) is opposite to the contact part (44) and is connected to an external electrical a contact member (41) electrically connected to the first housing portion (41) for establishing electrical contact therewith; 47).

24. A test contact attachment (40) according to any one of claims 20 to 23, The first and second housing portions (41) are arranged in a substantially L-shape in a side view. A test contact attachment (40) characterized by:

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