Winding characteristic measurement device and inspection system

Abstract

To acquire an evaluation value capable of evaluating characteristics of a winding in a state where a standard waveform for comparison does not exist.SOLUTION: A first waveform generation process in which a processing unit of the data processing device 2 divides each voltage value of the voltage waveform for the winding X measured by the voltage measurement unit 12 along with the application of the impulse voltage by the impulse power supply 11 by a charging voltage value of the impulse power supply 11 at the time of the application of the impulse voltage to generate a first waveform for a first time defined in advance; A second waveform generation process of generating a second waveform by sequentially executing each value of a processing target while changing the value in a time axis direction of a first waveform, and a process A of specifying a value A which is an average value of each value of the second waveform within a range corresponding to a range from a first value to a second value in the first waveform; SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The present invention relates to a winding characteristic measuring device that measures characteristic values ​​that indicate the winding characteristics of a winding to be measured, and an inspection system that is configured to be able to determine the quality of the winding based on the measured characteristic values. [Background technology]

[0002] For example, the following patent document discloses an invention for an apparatus (hereinafter simply referred to as a "measuring apparatus") configured to automatically calculate the integrity of an electric coil (such as the presence or absence of defects and the degree of the defects) through surge testing. This measuring apparatus applies a voltage pulse to the electric coil (hereinafter also referred to as a "winding") to be measured and measures the voltage across it. During this process, the voltage value rises sharply immediately after the voltage pulse is applied, and then the voltage value gradually decreases while oscillating. The manner in which the voltage value oscillates during this process differs depending on the capacitance, inductance, resistance, etc. of the winding. Therefore, the state of the winding can be identified based on the voltage waveform of the measured voltage value.

[0003] Specifically, a voltage waveform measured for the winding under measurement (hereinafter also referred to as the "measured waveform" for the "target winding") is compared with a voltage waveform obtained from a normal winding that does not have any defects (hereinafter also referred to as the "standard waveform" for the "normal winding"). In this case, if the standard waveform and the measured waveform match, or if the difference between the standard waveform and the measured waveform is small, it can be determined that the state of the target winding and the state of the normal winding are similar (normal). On the other hand, if the difference between the standard waveform and the measured waveform is large, it can be determined that the state of the target winding differs from the state of the normal winding and that some kind of defect exists, and the extent of the defect in the target winding can be identified based on the amount of difference. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] U.S. Patent No. 5,111,149 Summary of the Invention [Problem to be solved by the invention]

[0005] However, the measuring devices disclosed in the above patent documents have the following problems.

[0006] Specifically, the measuring device disclosed in the above patent document employs a configuration that can identify the amount of difference between a measured waveform obtained from a target winding and a standard waveform obtained from a normal winding, and evaluate the target winding based on the identified amount of difference (determine the presence or absence of a defect, the degree of the defect, and the presence or absence of a change over time and the degree of the change). Therefore, when evaluating a target winding using the measuring device disclosed in the above patent document, in addition to the measured waveform obtained from the target winding, a standard waveform obtained from a normal winding is required. Therefore, in addition to the measurement process for the target winding, measurement processes must be performed for normal windings of the same type (same specifications) as the target winding. This makes the evaluation of the target winding extremely cumbersome. Furthermore, in the field where this type of measuring device is used, measurement work may be performed on multiple types of windings with different specifications. Therefore, with the measuring device disclosed in the above patent document, managing multiple standard waveforms for each winding is extremely cumbersome.

[0007] Furthermore, with the measuring device disclosed in the above patent document, when evaluating windings at multiple locations that are far apart, even if the windings are the same type, it is necessary to perform measurement processing on the target winding as well as measurement processing on the normal winding at each measurement location, or to provide a standard waveform obtained from the normal winding at one location to the other locations. Also, with the measuring device disclosed in the above patent document, when continuing to identify the presence or absence of aging in the target winding and the extent of that change over a long period of time, it is necessary to continue saving the standard waveform used at the start of the identification until the identification of the aging change is completed, and if this standard waveform is damaged or lost, it will be impossible to identify any further aging change.

[0008] The present invention has been made in consideration of the above-mentioned problems, and another object of the present invention is to provide a winding characteristics measuring device and an inspection system that can obtain evaluation values ​​that can reliably and easily evaluate the characteristics of a target winding. [Means for solving the problem]

[0009] In order to achieve the above object, a winding characteristics measuring device according to the present invention includes a voltage application circuit that applies an impulse voltage across both ends of a winding to be measured, a measurement unit that measures the voltage across the winding to which the impulse voltage is applied by the voltage application circuit at a predetermined sampling period and records the measured values ​​to generate a voltage waveform indicative of the measurement result, and a processing unit that identifies a characteristic value indicative of the winding characteristics of the winding based on the voltage waveform, wherein the processing unit performs first waveform generation processing that divides each voltage value of the voltage waveform by a charging voltage value of the voltage application circuit when the impulse voltage is applied to generate a first waveform for a predetermined first time period, and a second waveform generation process for generating a second waveform by sequentially executing a process for identifying the amount of change in each of the voltage values ​​measured within a predetermined second time period that is shorter than the first time period while changing each of the values ​​to be processed in the time axis direction of the first waveform; and a process A for identifying a first value that is a positive value among the values ​​in the first waveform and satisfies a predetermined first condition, and a second value that is a negative value among the values ​​corresponding to the voltage values ​​measured after the voltage value corresponding to the first value and satisfies a predetermined second condition, and for identifying a value A that is the average value of each value of the second waveform within a range corresponding to the range from the first value to the second value in the first waveform, and specifying the identified value A as the characteristic value.

[0010] A winding characteristics measuring device according to the present invention is a winding characteristics measuring device comprising: a voltage application circuit that applies an impulse voltage across both ends of a winding to be measured; a measurement unit that measures the voltage across the winding to which the impulse voltage is applied by the voltage application circuit at a predetermined sampling period and records the measured values ​​to generate a voltage waveform indicative of the measurement results; and a processing unit that identifies a characteristic value indicative of the winding characteristics of the winding based on the voltage waveform, wherein the processing unit performs first waveform generation processing that divides each voltage value of the voltage waveform by a charging voltage value of the voltage application circuit when the impulse voltage is applied to generate a first waveform for a predetermined first time period; A second waveform generation process is executed to generate a second waveform by sequentially executing a process to identify the amount of change in each of the voltage values ​​measured within a shorter, predetermined second time period while changing each of the values ​​to be processed in the time axis direction of the first waveform, and a process B to identify a third value among the values ​​in the first waveform that satisfies a predetermined third condition, and a fourth value among the values ​​corresponding to the voltage values ​​measured after the voltage value corresponding to the third value that satisfies a predetermined fourth condition, and to identify a value B that is the average value of each value of the second waveform within a range corresponding to the range from the third value to the fourth value in the first waveform, and the identified value B is identified as the characteristic value.

[0011] Therefore, with the winding characteristics measuring device according to the present invention, values ​​A and B as characteristic values ​​indicating the winding characteristics of a target winding can be determined based solely on the voltage waveform obtained from the target winding, making it possible to reliably and easily evaluate the target winding without having to perform measurement processing on a normal winding to obtain a standard waveform or store the standard waveform obtained from the normal winding. Furthermore, by determining values ​​A and B based on a first waveform generated by normalizing the voltage waveform by dividing each voltage value by the charging voltage value of the application circuit when the impulse voltage is applied, the first waveform is composed of values ​​that are not affected by the charging voltage value when the voltage waveform is obtained. Therefore, even if voltage waveforms are determined in various environments in which the charging voltage value when the impulse voltage is applied is different, it is possible to compare the characteristic values ​​obtained in those environments.

[0012] Furthermore, in the winding characteristic measuring device according to the present invention, the processing unit generates the first waveform by performing the first waveform generation process, in which the value corresponding to the measurement time of the measurement value that is first recorded within the predetermined first time period is set to 0 and the value corresponding to the measurement time of the measurement value that is last recorded within the predetermined first time period is set to 1, together with the process of converting the sampling period in accordance with the normalized value of the time axis parameter. In this case, when the voltage waveform is recorded using a general waveform recording method, for example, the converted sampling period is converted to the "reciprocal of the number of sampling data" within the first time period or the "reciprocal of (the number of sampling data - 1)" within the first time period.

[0013] Therefore, with the winding characteristic measuring device according to the present invention, by normalizing the value of the time axis parameter, when the "amount of change" is calculated including the value of the "sampling period," values ​​A and B are calculated as values ​​that are not affected by the length of the first time. Furthermore, as described above, the first waveform is configured with values ​​that are not affected by the charging voltage value when the voltage waveform is obtained. This makes it possible to reliably and easily obtain characteristic values ​​(values ​​A and B) that can be suitably compared. In this case, by appropriately selecting a formula for calculating the amount of change and normalizing the voltage value and the time axis parameter, values ​​A and B fall within the range of approximately "0.000 to 1.000." Therefore, values ​​A and B can be easily written down on a piece of paper or the like, or approximate values ​​of values ​​A and B can be easily stored, allowing comparison with the written or stored approximate values.

[0014] A winding characteristics measuring device according to the present invention is a winding characteristics measuring device comprising: a voltage application circuit that applies an impulse voltage across both ends of a winding to be measured; a measurement unit that measures the voltage across the winding to which the impulse voltage is applied by the voltage application circuit at a predetermined sampling period and records the measured values ​​to generate a voltage waveform indicative of the measurement result; and a processing unit that identifies a characteristic value indicative of the winding characteristics of the winding based on the voltage waveform, wherein the processing unit divides each voltage value of the voltage waveform by a charging voltage value of the voltage application circuit when the impulse voltage is applied to generate a first waveform for a predetermined time period. A waveform generation process is performed, and a process C is performed to identify a first positive value among the values ​​in the first waveform that satisfies a predetermined first condition, and a second negative value among the values ​​that corresponds to the voltage value measured after the voltage value corresponding to the first value and that satisfies a predetermined second condition, and to identify at least one of a value Cp obtained by multiplying the sum of the positive values ​​by the value of the sampling period and a value Cm obtained by multiplying the sum of the absolute values ​​of the negative values ​​by the value of the sampling period for each value from the first value to the second value in the first waveform, and the at least one identified value is specified as the characteristic value.

[0015] A winding characteristics measuring device according to the present invention is a winding characteristics measuring device comprising: a voltage application circuit that applies an impulse voltage across both ends of a winding to be measured; a measurement unit that measures the voltage across the winding to which the impulse voltage is applied by the voltage application circuit at a predetermined sampling period and records the measured values ​​to generate a voltage waveform indicative of the measurement results; and a processing unit that identifies characteristic values ​​indicative of the winding characteristics of the winding based on the voltage waveform, wherein the processing unit calculates each voltage value of the voltage waveform by the charging voltage value of the voltage application circuit when the impulse voltage is applied. and a process G for identifying a third value among the values ​​in the first waveform that satisfies a third predetermined condition and a fourth value among the values ​​that corresponds to the voltage value measured after the voltage value corresponding to the third value and that satisfies a fourth predetermined condition, and for identifying a value G obtained by multiplying the sum of the absolute values ​​of the values ​​from the third value to the fourth value in the first waveform by the value of the sampling period, and the identified value G is identified as the characteristic value.

[0016] Therefore, with the winding characteristics measuring device according to the present invention, the values ​​Cp, Cm, and G, which are characteristic values ​​indicating the winding characteristics of the target winding, can be determined based solely on the voltage waveform obtained from the target winding, making it possible to reliably and easily evaluate the target winding without having to perform measurement processing on a normal winding to obtain a standard waveform or store the standard waveform obtained from the normal winding. Furthermore, by determining the values ​​Cp, Cm, and G based on a first waveform generated by normalizing the voltage waveform by dividing each voltage value by the charging voltage value of the application circuit when the impulse voltage is applied, the first waveform is composed of values ​​that are not affected by the charging voltage value when the voltage waveform is obtained. Therefore, even if voltage waveforms are determined in various environments in which the charging voltage value when the impulse voltage is applied is different, it is possible to compare the characteristic values ​​obtained in those environments.

[0017] Furthermore, in the winding characteristic measuring device according to the present invention, the processing unit executes a process D to determine a value D obtained by dividing the value Cm by the value Cp, and determines the determined value D as the characteristic value.

[0018] Furthermore, in the winding characteristic measuring device according to the present invention, the processing unit executes a process H to determine a value H of an average amplitude obtained by dividing the value G by the number of the absolute values ​​totaled when the value G was determined, The specified value H is specified as the characteristic value.

[0019] Therefore, the winding characteristics measuring device according to the present invention can reliably and easily determine whether the target winding is likely to be a non-defective product, how much change has occurred in the winding over time, and so on, based on the characteristic values ​​(values ​​D and H) that vary depending on the differences in the winding characteristics of the windings.

[0020] Furthermore, in the winding characteristic measuring device according to the present invention, the processing unit executes a process E to identify at least one of a value Ep, which is the value of the positive average amplitude obtained by dividing the value Cp by the number of the positive values ​​totaled when the value Cp was determined, and a value Em, which is the value of the negative average amplitude obtained by dividing the value Cm by the number of the absolute values ​​of the negative values ​​totaled when the value Cm was determined, and identifies the at least one identified value as the characteristic value.

[0021] Therefore, the winding characteristics measuring device according to the present invention can reliably and easily determine whether or not the target winding is likely to be a non-defective product, and the extent to which the winding has changed over time, based on the characteristic values ​​(values ​​Ep, Em) that vary depending on the winding characteristics of the windings.

[0022] A winding characteristics measuring device according to the present invention is a winding characteristics measuring device comprising: a voltage application circuit that applies an impulse voltage across both ends of a winding to be measured; a measurement unit that measures the voltage across the winding to which the impulse voltage is applied by the voltage application circuit at a predetermined sampling period and records the measured values ​​to generate a voltage waveform indicative of the measurement result; and a processing unit that identifies a characteristic value indicative of the winding characteristics of the winding based on the voltage waveform, wherein the processing unit performs a waveform generation process that divides each voltage value of the voltage waveform by a charging voltage value of the voltage application circuit when the impulse voltage is applied to generate a first waveform for a predetermined time period; A third value among the values ​​in one waveform that satisfies a predetermined third condition, and a fourth value among the values ​​corresponding to the voltage value measured after the voltage value corresponding to the third value that satisfies a predetermined fourth condition, are identified, and for each value from the third value to the fourth value in the first waveform, at least one of a value Ip which is the positive average amplitude obtained by dividing the sum of the positive values ​​by the number of the summed positive values, and a value Im which is the negative average amplitude obtained by dividing the sum of the absolute values ​​of the negative values ​​by the number of the summed absolute values ​​of the negative values ​​is executed, and the at least one identified value is identified as the characteristic value.

[0023] Therefore, with the winding characteristics measuring device according to the present invention, the values ​​Ip, Im, and other characteristic values ​​indicative of the winding characteristics of the target winding can be determined solely based on the voltage waveform obtained from the target winding, making it possible to reliably and easily evaluate the target winding without having to perform measurement processing on a normal winding to obtain a standard waveform or store the standard waveform obtained from the normal winding. Furthermore, by determining the values ​​Ip, Im based on a first waveform generated by normalizing the voltage waveform by dividing each voltage value by the charging voltage value of the application circuit when the impulse voltage is applied, the first waveform is composed of values ​​that are not affected by the charging voltage value when the voltage waveform is obtained. Therefore, even if voltage waveforms are determined in various environments in which the charging voltage value when the impulse voltage is applied is different, it is possible to compare the characteristic values ​​obtained in those environments.

[0024] Furthermore, in the winding characteristic measuring device according to the present invention, the processing unit executes a process F to determine a value F obtained by dividing the value Em by the value Ep, and determines the determined value F as the characteristic value.

[0025] In addition, in the winding characteristic measuring device according to the present invention, the processing unit executes a process J to determine a value J obtained by dividing the value Im by the value Ip, and determines the determined value J as the characteristic value.

[0026] Therefore, with the winding characteristics measuring device according to the present invention, it is possible to reliably and easily determine whether or not a winding is likely to be a non-defective product, and to what extent the winding has changed over time, based on the characteristic values ​​(values ​​F and J) that vary depending on the winding characteristics of the winding.

[0027] An inspection system according to the present invention includes any one of the winding characteristic measuring devices described above, and a determination device that determines whether the winding is good or bad based on the characteristic values.

[0028] Therefore, the inspection system according to the present invention can reliably and easily evaluate the quality of the target winding based on the characteristic value determined without using a standard waveform. [Effects of the Invention]

[0029] The winding characteristics measuring device and inspection system according to the present invention apply an impulse voltage across a winding to be measured and measure the voltage across the winding at a predetermined sampling period to generate a voltage waveform indicative of the measurement results, and also include a processing unit that determines a characteristic value indicative of the winding characteristics based on the voltage waveform. This allows the characteristic value indicative of the winding characteristics of the target winding to be determined solely based on the voltage waveform obtained from the target winding, making it possible to reliably and easily evaluate the target winding without having to perform measurement processing on a normal winding to obtain a standard waveform or store the standard waveform obtained from the normal winding. Furthermore, because the first waveform is composed of values ​​that are not affected by the charging voltage value when the voltage waveform is obtained, even if voltage waveforms are determined in various environments where the charging voltage value when the impulse voltage is applied is different, it is possible to compare the characteristic values ​​obtained in those environments. [Brief explanation of the drawings]

[0030] [Figure 1] FIG. 1 is a configuration diagram of an inspection system 100. [Figure 2] FIG. 2 is another configuration diagram of the inspection system 100. [Figure 3] FIG. 10 is an explanatory diagram for explaining a waveform W0 of measurement values ​​Da, Da·· obtained by measurement processing. [Figure 4] FIG. 10 is an explanatory diagram for explaining a procedure for generating characteristic value data Dx. [Figure 5] FIG. 10 is another explanatory diagram for explaining the procedure for generating the characteristic value data Dx. [Figure 6] FIG. 10 is yet another explanatory diagram for explaining the procedure for generating the characteristic value data Dx. [Figure 7] FIG. 10 is yet another explanatory diagram for explaining the procedure for generating the characteristic value data Dx. [Figure 8] FIG. 10 is yet another explanatory diagram for explaining the procedure for generating the characteristic value data Dx. [Figure 9] FIG. 10 is yet another explanatory diagram for explaining the procedure for generating the characteristic value data Dx. [Figure 10]FIG. 10 is yet another explanatory diagram for explaining the procedure for generating the characteristic value data Dx. [Figure 11] FIG. 10 is yet another explanatory diagram for explaining the procedure for generating the characteristic value data Dx. DETAILED DESCRIPTION OF THE INVENTION

[0031] Hereinafter, embodiments of a winding characteristic measuring device and an inspection system will be described with reference to the accompanying drawings.

[0032] 1 and 2 is an "impulse test device" that is an example of an "inspection system," and is configured to operate as a "winding characteristics measuring device" that acquires characteristic values ​​that indicate the winding characteristics of a winding X that is an example of a "winding to be measured," as well as to perform pass / fail judgment (inspection) of the winding X based on characteristic value data Dx, which will be described later. This inspection system 100 is configured with a measuring device 1 and a data processing device 2.

[0033] 1, the measurement device 1 includes an impulse power supply 11 and a voltage measurement unit 12, and is configured to be able to perform various measurement processes on the winding X, for example, under the control of a processing unit 23 in the data processing device 2, which will be described later. The impulse power supply 11 is an example of a "voltage application circuit," and applies an impulse voltage (surge voltage) across the winding X under the control of the processing unit 23 in the data processing device 2. The impulse power supply 11 also notifies the data processing device 2 (processing unit 23) of a charging voltage value Db when the impulse voltage is applied to the winding X.

[0034] The voltage measurement unit 12, in cooperation with the data processing device 2, constitutes a "measurement unit" that, under the control of the processing unit 23 in the data processing device 2, measures the voltage across the winding X when an impulse voltage is applied to generate a measurement value Da, and sequentially outputs the generated measurement values ​​Da to the data processing device 2 to be recorded as a "voltage waveform indicating the measurement result." Specifically, under the control of the processing unit 23, the voltage measurement unit 12 performs a measurement process in which the voltage applied from the impulse power supply 11 to the winding X is A / D converted (sampled) at a predetermined period ("predetermined sampling period: measurement period"), and also performs a recording process in which the measurement values ​​Da generated by the A / D conversion are output to the data processing device 2 to be recorded (saved).

[0035] The data processing device 2 is, for example, composed of a personal computer on which a data processing program is installed, and is configured to perform processing for generating characteristic value data Dx (described below) and to function as a "determination device" to perform, for example, a pass / fail determination of the winding X based on the characteristic value data Dx. As shown in FIG. 2, the data processing device 2 includes an operation unit 21, a display unit 22, a processing unit 23, and a storage unit 24. The operation unit 21 is composed of a keyboard and a pointing device for inputting measurement conditions and the like, and outputs operation signals to the processing unit 23 in response to their operation. The display unit 22 displays the operating status of the data processing device 2 (inspection system 100), the measurement results by the measuring device 1, the inspection results of the winding X, and the like.

[0036] Processing unit 23 controls data processing device 2 as a whole, and also controls impulse power supply 11 and voltage measurement unit 12 of measurement device 1. Processing unit 23 is an example of a "processing unit" and controls impulse power supply 11 to apply an impulse voltage to winding X as described above, and also stores charging voltage value Db output from impulse power supply 11 and measurement values ​​Da sequentially output from voltage measurement unit 12 in memory unit 24 (an example of a process for recording measurement values ​​Da, Da·· as "voltage waveforms"). Note that the process for recording measurement values ​​Da, Da·· as "voltage waveforms" may be performed in measurement device 1, and the generated "voltage waveform" data may be output from measurement device 1 to data processing device 2.

[0037] Furthermore, the processing unit 23 generates characteristic value data Dx indicating characteristic values ​​of the winding X based on the measured values ​​Da, Da·· ("voltage waveform" data) and the charging voltage value Db, through a series of processes described below. Furthermore, the processing unit 23 inspects (determines) the quality of the winding X based on the generated characteristic value data Dx. The storage unit 24 stores the above-mentioned data processing program, the measured values ​​Da, Da·· and the charging voltage value Db output from the measuring device 1, the characteristic value data Dx generated by the processing unit 23, and the like.

[0038] Next, the method of inspecting the winding X using the inspection system 100 will be described with reference to the accompanying drawings, mainly focusing on how to determine the "characteristic values ​​indicative of the winding characteristics."

[0039] When acquiring the characteristic value data Dx for the winding X or inspecting the winding X based on the characteristic value data Dx, the user operates the operation unit 21 of the data processing device 2 to set various measurement conditions and connects the measuring device 1 (the impulse power supply 11 and the voltage measuring unit 12) to both ends of the winding X. Next, the user operates the operation unit 21 of the data processing device 2 to instruct the start of measurement processing. In response to this, the processing unit 23 controls the measuring device 1 to execute measurement processing in accordance with the set measurement conditions.

[0040] Specifically, processing unit 23 first controls voltage measurement unit 12 to start sampling (measurement). As a result, measurement values ​​Da, which can identify the voltage value between both ends of winding X, are sequentially output from measurement device 1 (voltage measurement unit 12) to data processing device 2. Furthermore, while continuing the voltage value measurement process by voltage measurement unit 12, processing unit 23 controls impulse power supply 11 to apply an impulse voltage to winding X and starts storing the measurement values ​​Da output from measurement device 1 (voltage measurement unit 12) in memory unit 24 (recording of "voltage waveforms") (an example in which recording of voltage waveforms starts from the time when application of impulse voltage starts). At this time, charging voltage value Db of voltage measurement unit 12 at the time when impulse voltage is applied to winding X is output to data processing device 2, and the values ​​of measurement values ​​Da, Da·· change as shown in waveform W0 in FIG. 3 .

[0041] Thereafter, when a preset time has elapsed since the start of measurement by voltage measurement unit 12 (for example, when 10 μs has elapsed since the start of storage (recording) of measured values ​​Da, Da··), processing unit 23 terminates the measurement process by voltage measurement unit 12 and terminates storage of measured value Da in storage unit 24 (recording of "voltage waveform"). This completes the process of acquiring the "voltage waveform" for winding X. Note that in FIG. 3, to facilitate understanding of the "voltage waveform," measured values ​​before the start of application of the impulse voltage from impulse power supply 11 are also shown as waveforms. However, in this example, measured values ​​Da, Da·· for 10 μs from the time of application of the impulse voltage are recorded as the "voltage waveform," as described above. Alternatively, it is possible to store (record) all of the measurement values ​​Da, Da·· sequentially output from the measuring device 1 in the memory unit 24, and then, for example, delete the measurement values ​​Da, Da other than the measurement values ​​Da, Da·· within 10 μs from the time the impulse voltage is applied, thereby obtaining a “voltage waveform” for a desired period of time.

[0042] Next, the processing unit 23 starts the process of generating the characteristic value data Dx. In this case, the inspection system 100 (data processing device 2) of this example is configured to be able to generate the characteristic value data Dx according to a procedure that is set in advance (selected by the user) from various processing procedures exemplified below, for example.

[0043] In the "first procedure," processing unit 23 first divides each of the measured values ​​Da, Da·· stored in storage unit 24 by the charging voltage value Db at the time of application of the impulse voltage, thereby normalizing the value on the voltage value axis of waveform W0 and generating waveform W1 shown in FIG. 4 (an example of "first waveform generation processing for generating a first waveform for a predetermined first time period"). Note that in the example of the same figure, recording of measured value Da (voltage value) ends "10 μs" from the start of recording of measured value Da (in this example, from the start of application of impulse voltage to winding X), and this "10 μs" corresponds to the "first time period."

[0044] Furthermore, in the "first waveform generation process" for generating the waveform W1, the processing unit 23 normalizes the values ​​of the time axis parameters by, for example, setting the value corresponding to the measurement time of the first measurement value Da among the recorded measurement values ​​Da, Da·· (the measurement time when the measurement value Da began to rise as the impulse voltage was applied: time point Ps in Figure 3) to "0 (0.0)" and setting the value corresponding to the measurement time of the last measurement value Da among the recorded measurement values ​​Da, Da·· (the last measurement time in a pre-defined "first time": time point Pe in Figure 3: in this example, the time when 10 μs has elapsed since the start of measurement) to "1 (1.0)."

[0045] Next, the processing unit 23 identifies a "first value" that is a positive value among the values ​​in the waveform W1 and satisfies a "predetermined first condition," and a "second value" that is a negative value among the values ​​corresponding to voltage values ​​measured after the voltage value corresponding to the "first value" and satisfies a "predetermined second condition." In this case, as an example, the "positive peak value having the smallest value of the time axis parameter (corresponding to the earliest measurement time)" is defined as the "first condition," and the "negative peak value having the smallest value of the time axis parameter" is defined as the "second condition," and the corresponding values ​​are identified. As a result, the value at time Pp shown in FIG. 4 is identified as the "first value," and the value at time Pm is identified as the "second value."

[0046] As for the "first condition" and the "second condition," instead of the above-described exemplary conditions, the "first condition" may be a condition that "the voltage value reaches a maximum value" or a condition that "the voltage value exceeds (or falls below) a specified value (positive value) for the first time," and the "second condition" may be a condition that "the voltage value reaches a minimum value" or a condition that "the voltage value falls below (or exceeds) a specified value (negative value) for the first time." Furthermore, the process of identifying the values ​​of the points Pp and Pm may be executed after the completion of the "second waveform generation process" described later (before the start of "process A").

[0047] In addition, in this example, the impulse voltage is applied so that the positive voltage value measured immediately after application rises sharply toward a positive peak value, but instead of this configuration, it is also possible to adopt a configuration in which the impulse voltage is applied so that the voltage value measured immediately after application drops sharply toward a negative peak value. When this configuration is adopted, for example, by reversing the positive and negative signs of each value in the recorded "voltage waveform," it is possible to obtain a waveform similar to the "voltage waveform" described in the above example, and using such a "voltage waveform," it is possible to obtain the "characteristic value" described below by processing similar to that in this example.

[0048] Next, the processing unit 23 sequentially executes a process for determining the "amount of change" of each voltage value measured within a "predetermined second time" shorter than the above-mentioned "predetermined first time" in the waveform W1 during the "second time" while shifting each value to be processed along the time axis of the waveform W1, thereby generating a "second waveform" (an example of a "second waveform generation process"). In this example, the "amount of change" is determined using "9 samplings (the time required to measure 9 measurement values ​​Da)" as the "second time." Note that the "amount of change" refers to the "magnitude of change," "speed of change," and "both the magnitude and speed of change." Specific procedures for determining this "amount of change" include the following example.

[0049] In the first method, the difference between the "value corresponding to the earliest measurement time" and the "value corresponding to the latest measurement time" in the "second time" in the waveform W1 is calculated by sequentially changing each value to be processed (the "second time" to be processed) along the time axis of the waveform W1, to generate a "waveform of the amount of change per unit time." In this case, the "difference between the [value corresponding to the earliest measurement time] and the [value corresponding to the latest measurement time]" is calculated by, for example, calculating the difference between the "value corresponding to the earliest measurement time" and the "value corresponding to the latest measurement time" in the "second time" in the waveform W1. A difference dVa between the value at time P1a, which is the "value with the earliest corresponding measurement time," and the value at time P2a, which is the "value with the latest corresponding measurement time," is associated with time P0a and identified. Also, a difference dVb between the value at time P1b, which is the "value with the earliest corresponding measurement time," and the value at time P2b, which is the "value with the latest corresponding measurement time," within time T2 (second time) centered at time P0b, is associated with time P0b and identified. Hereinafter, when differences dVa, dVb, etc. are not to be distinguished from each other, they are also referred to as "difference dV."

[0050] By sequentially executing the process of identifying such difference dV while changing each value to be processed (in this example, nine values ​​within time T2) along the time axis, a waveform W2 (a waveform of the "amount of change within unit time": an example of a "second waveform") is generated in which each difference dV, dV... is plotted along the time axis, as shown in Fig. 8. According to this first method, the "amount of change (difference dV)" within time T2 can be found based on two of the nine values ​​within time T2, and therefore waveform W2 can be easily generated in a short amount of time.

[0051] In the second method, a "waveform generation process" is performed to generate a "waveform of change per unit time" by sequentially calculating the difference between the maximum and minimum values ​​corresponding to each voltage value measured within a "second time period" on waveform W1 while changing each value (the "second time period" to be processed) along the time axis of waveform W1. In this process, as shown in FIG. 6, for example, the "difference between the maximum and minimum values" is determined by identifying the difference dWc between the maximum value of each value within time T2 (second time period) centered around time P0c and the minimum value of each value within time T2, and the difference dWd between the maximum value of each value within time T2 (second time period) centered around time P0d and the minimum value of each value within time T2 is determined by identifying the difference dWd between the maximum value of each value within time T2 (second time period) centered around time P0d and the minimum value of each value within time T2. Hereinafter, when differences dWc, dWd, etc. are not distinguished, they are also referred to as "difference dW."

[0052] By sequentially executing the process of identifying such difference dW while changing each value to be processed (in this example, nine values ​​within time T2) along the time axis, a "waveform of the amount of change within unit time (a waveform similar to waveform W2 shown in FIG. 8: an example of a "second waveform": not shown)" is generated in which each difference dW, dW·· is plotted along the time axis. In this case, with the first method described above, when the value continues to rise within time T2 (example on the left) or continues to fall within time T2 (example on the right), as in the example shown in FIG. 5, the calculated difference dV becomes an appropriate value as the amount of change in the value within time T2. 6, when a maximum value exists among the values ​​within time T2 and any value other than the first or last value within time T2 is the maximum value (example on the left), or when a minimum value exists among the values ​​within time T2 and any value other than the first or last value within time T2 is the minimum value (example on the right), the calculated difference dV (differences dVa, dVb, etc. in the example of the figure) is determined to be a smaller amount of change than the change in value within time T2. In contrast, this second method requires comparing the magnitudes of all nine values ​​within time T2, which increases the processing load compared to the first method, but it is possible to obtain an appropriate difference dW as the amount of change in value within time T2 in various change patterns of waveform W0.

[0053] In the third method, a "waveform generation process" is performed in which a "waveform of change per unit time" is generated by sequentially executing a process of determining, as a change amount, a value specified based on the angle between a "first virtual line" connecting two points on the waveform W1 within the second time period: [the value at the earliest corresponding measurement time] and [the value at the center of the second time period], and a "second virtual line" connecting two points on the waveform W1 within the second time period: [the value at the latest corresponding measurement time] and [the value at the center of the second time period]. This process is performed while changing each value to be processed (the "second time" to be processed) along the time axis of the waveform W1. As described above, in this example, the values ​​on the voltage axis and the time axis parameter are normalized when generating the waveform W1. Therefore, the coordinates of the three points for specifying the "first virtual line" and the "second virtual line" can be processed simply using the coordinates specified by the normalized horizontal axis (time axis) values ​​and normalized vertical axis (voltage axis) values, without considering the units of the voltage axis and the time axis parameter.

[0054] In this case, the "amount of change determined based on the angle between the [first virtual line] and the [second virtual line]" can be calculated as follows, for example. For example, when processing a time T2 (second time) from points P1e to P2e centered around point P0e shown in FIG. 7, the line segment e0-e1 connecting the value of point P0e (point e0 in the figure) and the value of point P1e (point e1) on the waveform W1 is determined as the "first virtual line," and the line segment e0-e2 connecting the value of point P0e (point e0) and the value of point P2e (point e2) on the waveform W1 is determined as the "second virtual line." Next, the cosine (cos θa) of the angle between the line segments e0-e1 and e0-e2 is calculated. When this cos θa is the value Ha, the value Ia obtained by the formula "Ia=(Ha+1) / 2" is identified as the "amount of change within the time T2 from time P1e to time P2e" and is associated with time P0e.

[0055] Furthermore, when processing a time T2 (second time) from points P1f to P2f centered around point P0f, the line segment f0-f1 connecting the value at point P0f (point f0 in the figure) on waveform W1 to the value at point P1f (point f1) on waveform W1 is identified as a "first virtual line," and the line segment f0-f2 connecting the value at point P0f (point f0) on waveform W1 to the value at point P2f (point f2) on waveform W1 is identified as a "second virtual line." Next, the cosine (cos θa) of the angle between the line segments f0-f1 and f0-ef is calculated. When this cos θb is the value Hb, the value Ib calculated using the formula "Ib = (Hb + 1) / 2" is identified as the "amount of change from points P1f to P2f within time T2" ​​and associated with point P0f.

[0056] In this case, if the value fluctuates (increases or decreases) in a short cycle during time T2 from time P1e to P2e in the above example, the angle between line segments e0-e1 and e0-e2 will be small, resulting in a large value for Ia. Also, if the value fluctuates (increases or decreases) in a long cycle during time T2 from time P1e to P2e, the angle between line segments e0-e1 and e0-e2 will be large, resulting in a small value for Ia. Also, if the value fluctuates (increases or decreases) in a short cycle during time T2 from time P1f to P2f in the above example, the angle between line segments f0-f1 and f0-f2 will be small, resulting in a large value for Ib. Also, if the value fluctuates (increases or decreases) in a long cycle during time T2 from time P1f to P2f, the angle between line segments f0-f1 and f0-f2 will be large, resulting in a small value for Ib.

[0057] By sequentially executing this process of identifying values ​​Ia and Ib (hereinafter, also referred to as "value I" when not distinguishing between them) while changing each value to be processed (in this example, nine values ​​within time T2) along the time axis, a "waveform of the amount of change within unit time (a waveform similar to waveform W2 shown in FIG. 8 : an example of a "second waveform": not shown)" is generated in which each value I, I· is plotted along the time axis. This third method may increase the processing load compared to the first and second methods described above, but compared to the method of determining the "amount of change" within time T2 based on two of the nine values ​​within time T2, it is possible to determine an "amount of change" that accurately represents the change in value within time T2 by increasing the number of values ​​that affect the determined "amount of change" to three.

[0058] By generating waveform W2 using the above-described exemplary method, the "second waveform generation process" is completed. Note that, when the values ​​of points Pp and Pm have been determined as in this example, this "second waveform generation process" may be configured to be performed only on the values ​​of waveform W1 between points Pp and Pm (not on the values ​​of waveform W1 before point Pp or after point Pm).

[0059] Next, among the values ​​of the "second waveform" generated by the "second waveform generation process," a "value A" is identified, which is the average value of the values ​​within the range corresponding to the previously identified range from time Pp to time Pm (an example of "processing A"), and the identified "value A" is saved as characteristic value data Dx. In this case, the values ​​within the range from time Pp to time Pm are generally within the range of "0.000 to 1.000." Therefore, the "average value" of these values, "value A," is also generally within the range of "0.000 to 1.000."

[0060] This "value A" corresponds to the change in waveform W0 from the "first positive peak" to the "first negative peak" measured when an impulse voltage is applied to winding X. In this case, the voltage waveforms measured when an impulse voltage is applied to winding X and the like will change in the same manner for windings with the same winding characteristics, but will change in different manners for windings with different winding characteristics. Therefore, when two "values ​​A" are equal or nearly equal, it can be determined that the "values ​​A" are likely to have been obtained from "windings" with the same or nearly equal winding characteristics, and when two "values ​​A" are different, it can be determined that the "values ​​A" are likely to have been obtained from "windings" with different winding characteristics.

[0061] Therefore, for example, when determining whether the winding X under inspection is good or bad by comparing it with a good winding X, even if there is no "voltage waveform (standard waveform)" measured on the good winding X, by comparing "value A" obtained in advance from the good winding X with "value A" obtained from the winding X under inspection, it is possible to easily determine whether the winding characteristics of the good winding X and the winding characteristics of the winding X under inspection are equal, nearly equal, or different (i.e., whether the winding X under inspection is likely to be good or low).

[0062] Furthermore, the quality of the winding X to be inspected can be determined based only on the "value A" of the winding X to be inspected, rather than by comparing it with the "value A" of a good winding X. Specifically, the "value A" is obtained for each of a plurality of windings X to be inspected of the same type, and the windings X for which similar "values ​​A" are obtained can be determined to have a high probability of being good, while the windings X for which a "value A" that is significantly different from the other "values ​​A" can be determined to have a high probability of being defective.

[0063] Furthermore, for example, when observing the change over time of any one of the windings X, it is possible to easily determine whether or not a change over time has occurred in the winding characteristics of that winding X and to what extent the change has occurred, by comparing the "value A" obtained at the start of observation for the winding X to be observed with the "value A" obtained at any time point, without obtaining the "value A" for a good winding X.

[0064] In this case, as mentioned above, since "value A," which is the average value of each value in the range from time Pp to time Pm, is a value that falls roughly within the range of "0.000 to 1.000," it can be easily written down on a piece of paper or stored as an approximate number, which makes it easy to compare. This completes the generation of characteristic value data Dx by the "first procedure."

[0065] Furthermore, in the "second procedure," the basic "method of determining characteristic values" is the same as in the above-mentioned "first procedure," but the start and end points of the range in which "value A," which is the average value of the "amount of change within the second time period," was determined in the "first procedure," are defined as follows, and "process B" is executed to identify "value B" instead of "value A." Note that duplicated explanations of the processing content in this "second procedure" that is the same as in the above-mentioned "first procedure" will be omitted.

[0066] Specifically, as an example, the waveform W1 is generated by a "first waveform generation process" similar to the "first procedure." Next, the processing unit 23 identifies a "third value" that satisfies a "predetermined third condition" among the values ​​in the waveform W1, and a "fourth value" that satisfies a "predetermined fourth condition" among the values ​​corresponding to voltage values ​​measured after the voltage value corresponding to the "third value." In this case, as an example, the "third condition" is the condition of "the negative peak value having the smallest time axis parameter value (corresponding to the earliest measurement time)," and the "fourth condition" is the condition of "the last recorded value," and the corresponding values ​​are identified. As a result, the value at time Pa shown in FIG. 4 is identified as the "third value," and the value at time Pb is identified as the "fourth value."

[0067] Note that the "third condition" and "fourth condition" may be, instead of the above-mentioned exemplary conditions, "the voltage value exceeds (or falls below) a specified value for the first time," "the voltage value exceeds (or falls below) a specified number of times," or "a specified time has elapsed since the application of the impulse voltage." Furthermore, the process of determining the values ​​of the time points Pa and Pb may be performed after the completion of the "second waveform generation process" (before the start of "process B"), which will be described later. Next, a "second waveform generation process" is performed to determine the "amount of change within the second time period" by one of the three methods exemplified in the "first procedure," and a "second waveform" is generated.

[0068] Next, among the values ​​of the "second waveform" generated by the "second waveform generation process", a "value B" is identified, which is the average value of each value within the range corresponding to the previously identified range from time Pa to time Pb (an example of "processing B"), and the identified "value B" is saved as characteristic value data Dx.

[0069] Like the aforementioned "value A," this "value B" is a value that corresponds to the change in waveform W0 measured when an impulse voltage is applied to winding X, from the "value that satisfies the third condition" to the "final value." Therefore, when two "values ​​B" are equal or nearly equal, it can be determined that "value B" is likely to have been obtained from "windings" with equal or nearly equal winding characteristics. When two "values ​​B" are different, it can be determined that "value B" is likely to have been obtained from "windings" with different winding characteristics. Therefore, by obtaining "value B," it is possible to inspect whether winding X is likely to be a non-defective product or to observe changes in winding X over time.

[0070] In this case, as mentioned above, "value B," which is the average value of each value in the range from time Pp to time Pm, is a value that generally falls within the range of "0.000 to 1.000," just like "value A" above, and therefore can be easily written down on a piece of paper or stored as an approximate number, making it easy to compare. This completes the generation of characteristic value data Dx by the "second procedure."

[0071] As described above, the inspection system 100 (the measurement device 1 and the data processing device 2) includes an impulse power supply 11 that applies an impulse voltage across both ends of the winding X to be measured, a "measurement unit (voltage measurement unit 12 and processing unit 23)" that measures the voltage across both ends of the winding X to which the impulse voltage is applied by the impulse power supply 11 at a predetermined sampling period and generates a waveform W0 that indicates the measurement result, and a processing unit 23 that identifies a characteristic value that indicates the winding characteristics of the winding X based on the waveform W0. The processing unit 23 performs a "first waveform generation process" in which the processing unit 23 divides each voltage value of the waveform W0 by the charging voltage value of the impulse power supply 11 when the impulse voltage is applied to generate a "first waveform (waveform W1)" for a predetermined "first time". a "second waveform generation process" that generates a "second waveform" by sequentially executing a process of identifying the amount of change within a "second time" of each voltage value measured within a predetermined "second time" that is shorter than the "first time" while changing each value to be processed in the time axis direction of the "first waveform"; and a "processing A" that identifies a "first value" that is a positive value among the values ​​in the "first waveform" that satisfies a predetermined "first condition" and a "second value" that is a negative value among the values ​​corresponding to voltage values ​​measured after the voltage value corresponding to the "first value" that satisfies a predetermined "second condition," and identifies a "value A" that is the average value of each value of the "second waveform" within a range corresponding to the range from the "first value" to the "second value" in the "first waveform," and identifies the identified "value A" as a characteristic value.

[0072] Furthermore, in this inspection system 100 (measuring device 1 and data processing device 2), the processing unit 23 executes a "first waveform generation process" and a "second waveform generation process," and a "process B" that identifies a "third value" among the values ​​in the "first waveform" that satisfies a predetermined "third condition," and a "fourth value" among the values ​​corresponding to voltage values ​​measured after the voltage value corresponding to the "third value" that satisfies a predetermined "fourth condition," and identifies "value B," which is the average value of the values ​​in the "second waveform" within a range corresponding to the range from the "third value" to the "fourth value" in the "first waveform," and identifies the identified "value B" as a characteristic value.

[0073] Therefore, with this inspection system 100 (measurement device 1 and data processing device 2), "value A" and "value B" as characteristic values ​​indicating the winding characteristics of winding X can be determined solely on the basis of waveform W0 (voltage waveform) obtained from the winding X to be evaluated, making it possible to reliably and easily evaluate the target winding X without performing measurement processing on a normal winding to obtain a standard waveform or storing the standard waveform obtained from the normal winding. Furthermore, by determining "value A" and "value B" based on waveform W1 (first waveform) generated by normalizing by dividing each voltage value of waveform W0 by the charging voltage value of impulse power supply 11 when an impulse voltage is applied, waveform W1 is composed of values ​​that are not affected by the charging voltage value when waveform W0 is obtained. Therefore, even if waveform W0 is determined in various environments where the charging voltage value when an impulse voltage is applied is different, it is possible to compare the characteristic values ​​obtained in those environments.

[0074] Furthermore, in this inspection system 100 (measuring device 1 and data processing device 2), in the "first waveform generation process," the processing unit 23 performs a process of normalizing the value of the time axis parameter by setting the value corresponding to the measurement time of the first recorded measurement value at a predetermined "first time" to 0 and setting the value corresponding to the measurement time of the last recorded measurement value at the predetermined "first time" to 1, together with a process of converting the sampling period in accordance with the normalized value of the time axis parameter, thereby generating a "first waveform."

[0075] Therefore, according to this inspection system 100 (measuring device 1 and data processing device 2), by normalizing the values ​​of the time axis parameters, when the "amount of change" is calculated including the value of the "sampling period", "value A" and "value B" are calculated as values ​​that are not affected by the length of the "first time".Furthermore, as described above, since waveform W1 (first waveform) is composed of values ​​that are not affected by the charging voltage value when waveform W0 (voltage waveform) is obtained, characteristic values ​​("value A" and "value B") that can be suitably compared can be reliably and easily obtained.

[0076] Furthermore, this inspection system 100 (measurement device 1 and data processing device 2) includes a "winding characteristic measuring device" and a "judgment device" that judges the quality of the winding X based on the characteristic values. Therefore, this inspection system 100 (measurement device 1 and data processing device 2) makes it possible to reliably and easily evaluate the quality of the winding X based on the characteristic values ​​("value A" and "value B") that are identified without using a standard waveform.

[0077] Next, another method for determining the "characteristic value indicative of the winding characteristics" will be described with reference to the accompanying drawings.

[0078] In the "third procedure" for generating the characteristic value data Dx, first, a series of processes similar to the "first waveform generation process" in the "first procedure" and "second procedure" described above are performed to generate a waveform W1 (an example of a "waveform generation process"). Next, as in the "first procedure," as an example, the value at time Pp shown in FIG. 4 is identified as the "first value," and the value at time Pm is identified as the "second value." Next, for each value from the "first value" to the "second value" in the waveform W1, at least one of the following values ​​is identified: a value Cp obtained by multiplying the "sum of positive values" by the "value of the sampling period" and a value Cm obtained by multiplying the "sum of absolute values ​​of negative values" by the "value of the sampling period." In this case, if the value of the time axis parameter is normalized as in the example described above, the values ​​Cp and Cm are identified using the value of the "sampling period" converted according to the value of the time axis parameter after normalization.

[0079] In this case, the value Cp is a value corresponding to the area of ​​the region Aap shown in FIG. 9 and corresponds to the manner in which the positive values ​​change in the waveform W1. Therefore, when the two "values ​​Cp" are equal or approximately equal, it can be determined that the "values ​​Cp" are likely to have been obtained from "windings" with equal or approximately equal winding characteristics. When the two "values ​​Cp" are different, it can be determined that the "values ​​Cp" are likely to have been obtained from "windings" with different winding characteristics. Furthermore, the value Cm is a value corresponding to the area of ​​the region Aam shown in FIG. 9 and corresponds to the manner in which the negative values ​​change in the waveform W1. Therefore, when the two "values ​​Cm" are equal or approximately equal, it can be determined that the "values ​​Cm" are likely to have been obtained from "windings" with equal or approximately equal winding characteristics. When the two "values ​​Cm" are different, it can be determined that the "values ​​Cm" are likely to have been obtained from "windings" with different winding characteristics. Therefore, either one of the values ​​Cp and Cm can be generated as characteristic value data Dx of the "characteristic value" indicating the winding characteristics of the winding X, and can be used to inspect the quality of the winding X or to observe changes over time.

[0080] Alternatively, both values ​​Cp and Cm may be identified, and the "characteristic value" may be determined using the identified values ​​Cp and Cm. Specifically, as an example, the value D is determined by dividing the value Cm by the value Cp (an example of "process D"), and the identified value D is used as the "characteristic value" to generate characteristic value data Dx (a modified example of the "third procedure"). In this case, as described above, the value Cp corresponds to the manner in which positive values ​​change in the waveform W1, and the value Cm corresponds to the manner in which negative values ​​change in the waveform W1. Therefore, when the two "values ​​D" are equal or nearly equal, it can be determined that the "values ​​D" are likely to have been obtained from "windings" with equal or nearly equal winding characteristics. When the two "values ​​D" are different, it can be determined that the "values ​​D" are likely to have been obtained from "windings" with different winding characteristics. Therefore, the value D can be generated as characteristic value data Dx of the "characteristic value" indicating the winding characteristics of the winding X, and can be used to inspect the quality of the winding X and to observe changes over time.

[0081] Furthermore, at least one of the value Ep of the positive average amplitude Vap obtained by dividing the value Cp by the number of positive values ​​totaled when the value Cp was determined, and the value Em of the negative average amplitude Vam obtained by dividing the value Cm by the number of absolute values ​​of the negative values ​​totaled when the value Cm was determined, can be determined (an example of "Process E"). The characteristic value data Dx can be generated using at least one of the determined values ​​Ep and Em as the "characteristic value" (another modified example of "Third Procedure"). Furthermore, the value F obtained by dividing the value Em by the value Ep can be determined (an example of "Process F"), and the characteristic value data Dx can be generated using the determined value F as the "characteristic value" (yet another modified example of "Third Procedure").

[0082] In this case, as described above, the value Cp corresponds to the manner in which positive values ​​change in the waveform W1, and the value Cm corresponds to the manner in which negative values ​​change in the waveform W1. Therefore, when the two "values ​​Ep" are equal or approximately equal, it can be determined that the "values ​​Ep" are likely to have been obtained from "windings" with equal or approximately equal winding characteristics. When the two "values ​​Ep" are different, it can be determined that the "values ​​Ep" are likely to have been obtained from "windings" with different winding characteristics. Furthermore, when the two "values ​​Em" are equal or approximately equal, it can be determined that the "value Em" is likely to have been obtained from "windings" with equal or approximately equal winding characteristics. When the two "values ​​Em" are different, it can be determined that the "value E" is likely to have been obtained from "windings" with different winding characteristics. Furthermore, when the two "values ​​F" are equal or nearly equal, it can be determined that there is a high probability that the "value F" was obtained from "windings" with equal or nearly equal winding characteristics, and when the two "values ​​F" differ, it can be determined that there is a high probability that the "value F" was obtained from "windings" with different winding characteristics. Therefore, the values ​​Ep, Em and the value F can be generated as characteristic value data Dx of the "characteristic value" that indicates the winding characteristics of the winding X, and can be used to inspect the quality of the winding X and to observe changes over time.

[0083] In this case, when only one of the above-mentioned "characteristic values" such as "Cp, Cm," "D," "Ep, Em," and "F" is used, the winding characteristics of the two windings X may differ even if the characteristic values ​​of the two windings X are equal or nearly equal. Therefore, it is preferable to determine whether the winding characteristics of the two windings X are equal or nearly equal by calculating and comparing multiple types of "characteristic values," thereby improving the accuracy of the determination result. Note that the above-mentioned "Cp, Cm," "D," "Ep, Em," and "F" values ​​generally fall within the range of "0.000 to 1.000." Therefore, they can be easily written down on a piece of paper or stored as approximate numbers, facilitating comparison. This completes the generation of the characteristic value data Dx in the "third step."

[0084] Furthermore, in the "fourth procedure," the basic "method of determining characteristic values" is the same as in the above-mentioned "third procedure," but the "characteristic values" are specified by changing the start and end points of the ranges in which "values ​​Cp, Cm," "value D," "values ​​Ep, Em," and "value F" are determined as "characteristic values" in the "third procedure" to the above-mentioned points Pa and Pb. Note that duplicated explanations of the processing content in this "fourth procedure" that is the same as in the above-mentioned "third procedure" will be omitted.

[0085] Specifically, as an example, waveform W1 is generated by a "waveform generation process" similar to the "third procedure." Next, processing unit 23 identifies a "third value" that satisfies a "predetermined third condition" among the values ​​in waveform W1, and a "fourth value" that satisfies a "predetermined fourth condition" among the values ​​corresponding to voltage values ​​measured after the voltage value corresponding to the "third value." In this case, as an example, the value at time Pa shown in FIG. 4 is identified as the "third value," and the value at time Pb is identified as the "fourth value."

[0086] Next, the value G is determined by multiplying the sum of the absolute values ​​of the values ​​from the "third value" to the "fourth value" in the waveform W1 by the "value of the sampling period" (an example of "processing G"). At this time, if the value of the time axis parameter has been normalized as in the example described above, the value G is determined using the value of the "sampling period" converted according to the value of the time axis parameter after normalization. In this case, the value G corresponds to the sum of the areas of the regions Ap1 to Ap8 and the regions Am1 to Am9 shown in FIG. 10, and is a value that corresponds to the manner in which the value of the waveform W1 changes. Therefore, when two "values ​​G" are equal or nearly equal, it can be determined that the "value G" is likely to have been obtained from "windings" with equal or nearly equal winding characteristics. When two "values ​​G" differ, it can be determined that the "value G" is likely to have been obtained from "windings" with different winding characteristics. Therefore, the value G can be generated as characteristic value data Dx of the "characteristic value" indicating the winding characteristics of the winding X, and can be used to inspect the quality of the winding X and to observe changes over time.

[0087] Alternatively, a value H, which is the average amplitude Vam obtained by dividing the value G by the number of absolute values ​​totaled when the value G was determined (an example of "process H"), can be determined, and the characteristic value data Dx can be generated using the determined value H as the "characteristic value" (a modified example of the "fourth procedure"). In this case, as described above, the value G corresponds to the manner in which the value of the waveform W1 changes. Therefore, when two "values ​​H" are equal or nearly equal, it can be determined that the "value H" is likely to have been obtained from "windings" with equal or nearly equal winding characteristics. When two "values ​​H" differ, it can be determined that the "value H" is likely to have been obtained from "windings" with different winding characteristics. Therefore, the value H can be generated as characteristic value data Dx of the "characteristic value" indicating the winding characteristics of the winding X, and can be used for inspecting the quality of the winding X and observing changes over time.

[0088] Furthermore, for each value from the "third value" to the "fourth value" in the waveform W1 (values ​​within the range of time points Pa to Pb), at least one of the following values ​​can be identified: a value Ip, which is the average positive amplitude obtained by dividing the sum of the positive values ​​by the total number of the positive values; and a value Im, which is the average negative amplitude obtained by dividing the sum of the absolute values ​​of the negative values ​​by the total number of the absolute values ​​of the negative values ​​(an example of "Process I"). Then, characteristic value data Dx can be generated using at least one of the identified values ​​Ip and Im as the "characteristic value" (another modified example of the "fourth procedure"). Furthermore, a value J, which is the value Im divided by the value Ip (an example of "Process J"), can be identified. Then, characteristic value data Dx can be generated using the identified value J as the "characteristic value" (yet another modified example of the "fourth procedure").

[0089] In this case, as described above, the value Ip corresponds to the manner in which the positive values ​​change in the waveform W1, and the value Im corresponds to the manner in which the negative values ​​change in the waveform W1. Therefore, when the two "values ​​Ip" are equal or approximately equal, it can be determined that the "value Ip" is likely to have been obtained from "windings" with equal or approximately equal winding characteristics. When the two "values ​​Ip" are different, it can be determined that the "value Ip" is likely to have been obtained from "windings" with different winding characteristics. Furthermore, when the two "values ​​Im" are equal or approximately equal, it can be determined that the "value Im" is likely to have been obtained from "windings" with equal or approximately equal winding characteristics. When the two "values ​​Im" are different, it can be determined that the "value Im" is likely to have been obtained from "windings" with different winding characteristics.

[0090] Furthermore, when the two "values ​​J" are equal or nearly equal, it can be determined that there is a high probability that the "value J" was obtained from "windings" with equal or nearly equal winding characteristics, and when the two "values ​​J" differ, it can be determined that there is a high probability that the "value J" was obtained from "windings" with different winding characteristics. Therefore, the values ​​Ip, Im and value J can be generated as characteristic value data Dx of the "characteristic value" that indicates the winding characteristics of winding X, and can be used to inspect the quality of winding X and observe changes over time.

[0091] In this case, the above-mentioned "value G," "value H," "values ​​Ip, Im," and "value J" are generally within the range of "0.000 to 1.000," so they can be easily written down on a piece of paper or stored as approximate numbers, making it easy to compare. This completes the generation of the characteristic value data Dx by the "fourth step."

[0092] Thus, the inspection system 100 (the measurement device 1 and the data processing device 2) includes an impulse power supply 11 that applies an impulse voltage across both ends of the winding X to be measured, a "measurement unit (voltage measurement unit 12 and processing unit 23)" that measures the voltage across both ends of the winding X to which the impulse voltage is applied by the impulse power supply 11 at a predetermined sampling period and generates a waveform W0 that indicates the measurement result, and a processing unit 23 that specifies a characteristic value that indicates the winding characteristic of the winding X based on the waveform W0, and the processing unit 23 divides each voltage value of the waveform W0 by the charging voltage value of the impulse power supply 11 when the impulse voltage is applied to generate a "first waveform (waveform W and "Process C" that identifies a "first value" that is a positive value among the values ​​in the "first waveform" and satisfies a predetermined "first condition," and a "second value" that is a negative value among the values ​​corresponding to voltage values ​​measured after the voltage value corresponding to the "first value" and satisfies a predetermined "second condition," and identifies at least one of a "value Cp" obtained by multiplying the sum of the positive values ​​by the value of the sampling period and a "value Cm" obtained by multiplying the sum of the absolute values ​​of the negative values ​​by the value of the sampling period for each value from the "first value" to the "second value" in the "first waveform," and specifies at least one of the identified values ​​as the characteristic value.

[0093] Furthermore, in this inspection system 100 (the measuring device 1 and the data processing device 2), the processing unit 23 executes a "waveform generation process" and a "process G" in which the processing unit 23 identifies a "third value" among the values ​​in the "first waveform" that satisfies a predetermined "third condition" and a "fourth value" among the values ​​corresponding to voltage values ​​measured after the voltage value corresponding to the "third value" that satisfies a predetermined "fourth condition," and identifies a "value G" obtained by multiplying the sum of the absolute values ​​of the values ​​from the "third value" to the "fourth value" in the "first waveform" by the value of the sampling period, and identifies the identified "value G" as a characteristic value.

[0094] Therefore, according to this inspection system 100 (measurement device 1 and data processing device 2), the "value Cp" and / or the "value Cm" and the "value G" as characteristic values ​​indicating the winding characteristics of the winding X can be determined solely on the basis of the waveform W0 (voltage waveform) obtained from the winding X to be evaluated, thereby enabling reliable and easy evaluation of the target winding X without performing measurement processing on a normal winding to obtain a standard waveform or storing the standard waveform obtained from the normal winding. Furthermore, by determining the "value Cp" and / or the "value Cm" and the "value G" based on the waveform W1 (first waveform) generated by normalizing the waveform W0 by dividing each voltage value by the charging voltage value of the impulse power supply 11 when the impulse voltage is applied, the waveform W1 is composed of values ​​that are not affected by the charging voltage value when the waveform W0 is obtained. Therefore, even if the waveform W0 is determined in various environments in which the charging voltage value when the impulse voltage is applied is different, it is possible to compare the characteristic values ​​obtained in those environments.

[0095] Furthermore, in this inspection system 100 (measuring device 1 and data processing device 2), the processing unit 23 executes "process D" to identify "value D" obtained by dividing "value Cm" by "value Cp", and identifies the identified "value D" as a characteristic value.

[0096] Furthermore, in this inspection system 100 (measuring device 1 and data processing device 2), the processing unit 23 executes "processing H" to identify "value H" of the average amplitude obtained by dividing "value G" by the number of absolute values ​​totaled when identifying "value G", and identifies the identified "value H" as a characteristic value.

[0097] Therefore, with this inspection system 100 (the measuring device 1 and the data processing device 2), it is possible to reliably and easily determine whether or not the winding X is likely to be a non-defective product, how much change has occurred in the winding X over time, and so on, based on the "characteristic values ​​("value D" and "value H")" that vary depending on differences in the winding characteristics of the winding X.

[0098] Furthermore, in this inspection system 100 (measuring device 1 and data processing device 2), the processing unit 23 executes "processing E" to identify at least one of the values ​​of "value Ep," which is the value of the positive average amplitude obtained by dividing "value Cp" by the number of positive values ​​totaled when determining "value Cp," and "value Em," which is the value of the negative average amplitude obtained by dividing "value Cm" by the number of absolute values ​​of negative values ​​totaled when determining "value Cm," and identifies at least one of the identified values ​​as a characteristic value.

[0099] Furthermore, in this inspection system 100 (the measuring device 1 and the data processing device 2), the processing unit 23 executes a "waveform generation process" and a "process I" in which the processing unit 23 identifies a "third value" among the values ​​in the "first waveform" that satisfies a predetermined "third condition" and a "fourth value" among the values ​​corresponding to voltage values ​​measured after the voltage value corresponding to the "third value" that satisfies a predetermined "fourth condition," and identifies at least one of the following values ​​for each of the "third value" to "fourth value" in the "first waveform": a "value Ip" that is the positive average amplitude obtained by dividing the sum of the positive values ​​by the number of the summed positive values; and a "value Im" that is the negative average amplitude obtained by dividing the sum of the absolute values ​​of the negative values ​​by the number of the summed absolute values ​​of the negative values; and identifies at least one of the identified values ​​as a characteristic value.

[0100] Therefore, with this inspection system 100 (the measuring device 1 and the data processing device 2), it is possible to reliably and easily determine whether or not the winding X is likely to be a non-defective product, how much change has occurred in the winding X over time, and so on, based on the "characteristic values ​​("value Ep" and / or "value Em" or "value Ip" and / or "value Im")" which vary depending on differences in the winding characteristics of the winding X.

[0101] Furthermore, in this inspection system 100 (measuring device 1 and data processing device 2), the processing unit 23 executes "process F" to identify "value F" obtained by dividing "value Em" by "value Ep", and identifies the identified "value F" as a characteristic value.

[0102] Furthermore, in this inspection system 100 (measuring device 1 and data processing device 2), the processing unit 23 executes "process J" to identify "value J" obtained by dividing "value Im" by "value Ip", and identifies the identified "value J" as a characteristic value.

[0103] Therefore, with this inspection system 100 (the measuring device 1 and the data processing device 2), it is possible to reliably and easily determine whether or not the winding X is likely to be a non-defective product, how much change has occurred in the winding X over time, and so on, based on the "characteristic values ​​("value F" and "value J")" that vary depending on differences in the winding characteristics of the winding X.

[0104] In addition, in this inspection system 100 (measurement device 1 and data processing device 2), the processing unit 23 performs a process in the "waveform generation process" to normalize the value of the time axis parameter by setting the value corresponding to the measurement time of the first recorded measurement value at a predetermined time to 0 and the value corresponding to the measurement time of the last recorded measurement value at a predetermined time to 1, together with a process to convert the sampling period according to the normalized value of the time axis parameter, thereby generating a "first waveform."

[0105] Therefore, according to this inspection system 100 (measuring device 1 and data processing device 2), by normalizing the values ​​of the time axis parameters, when the "amount of change" is calculated including the value of the "sampling period", "value Cp", "value Cm", "value G", etc. are calculated as values ​​that are not affected by the length of the "first time".Furthermore, as described above, since the waveform W1 (first waveform) is composed of values ​​that are not affected by the charging voltage value when obtaining the waveform W0 (voltage waveform), it is possible to reliably and easily obtain characteristic values ​​("value Cp", "value Cm", "value G", etc.) that can be suitably compared.

[0106] Furthermore, this inspection system 100 (measurement device 1 and data processing device 2) includes a "winding characteristic measuring device" and a "judgment device" that judges the quality of the winding X based on the characteristic values. Therefore, this inspection system 100 (measurement device 1 and data processing device 2) makes it possible to reliably and easily evaluate the quality of the winding X based on the characteristic values ​​(such as "value Cp," "value Cm," and "value G") that are identified without using a standard waveform.

[0107] It should be noted that, with regard to the identification of the "characteristic values" of the winding X (generation of the characteristic value data Dx), it is possible to determine in advance only one of the above-mentioned "first procedure" to "fourth procedure" and identify and use one type of "characteristic value" that can be compared based on the determined procedure, or it is also possible to identify and use multiple types of "characteristic values" that can be compared based on any multiple procedures. In this case, by identifying multiple "characteristic values," it becomes possible to more appropriately determine whether the winding X is likely to be good or bad, whether changes over time have occurred, etc.

[0108] Furthermore, the configurations of the "winding characteristic measuring device" and "inspection system" are not limited to the example configuration of the inspection system 100 (measurement device 1 and data processing device 2) described above. For example, an example configuration has been described in which a "characteristic value" is determined by sequentially generating a "first waveform" and a "second waveform" based on waveform W0, which is an example of a "voltage waveform." However, when the amount of attenuation of the "voltage waveform" during the "first time" during which the "first waveform" is generated is small (when the decrease in the amplitude of oscillation of the voltage waveform during the "first time" is small), there is a risk that the "secondary periodic fluctuation occurring in the amount of change" caused by fluctuations in the period of the voltage waveform will increase with each measurement. Therefore, as an example, as shown in FIG. 11, a "weighting coefficient" is set so that when the value of the normalized time axis parameter is "0 (0.0)", the value is "1 (1.0)" and when the value of the normalized time axis parameter is "1 (1.0)", the value is "0 (0.0)", and a waveform W0a is generated by multiplying each voltage value by the set coefficient. Based on this waveform W0a, the "characteristic values" generated sequentially to generate the "first waveform" and the "second waveform" are determined. This makes it possible to sufficiently reduce the "secondary periodic fluctuations in the amount of change" that occur due to fluctuations in the period of the voltage waveform, and to obtain characteristic value data Dx of the suitable "characteristic value".

[0109] Furthermore, when generating the "first waveform for a predetermined first time period" in the "first waveform generation process," instead of normalizing each voltage value of the "voltage waveform" by dividing it by the "charge voltage value of the voltage application circuit when the impulse voltage is applied," it is also possible to employ a configuration that performs simple normalization, for example, by setting the "first positive peak value of the voltage waveform (the maximum value among the recorded voltage values)" to "1 (1.0)." [Industrial Applicability]

[0110] According to the present invention, an impulse voltage is applied across both ends of a winding to be measured, the voltage across the winding is measured at a predetermined sampling period to generate a voltage waveform indicative of the measurement results, and a processing unit is provided to identify a characteristic value indicative of the winding characteristics of the winding based solely on the generated voltage waveform, thereby making it possible to suitably evaluate the winding to be measured based on the identified characteristic value without using a standard waveform for comparison. This makes the present invention widely applicable to winding characteristic measuring devices that measure characteristic values ​​for testing the quality of windings or for the presence or absence of changes over time, and to inspection systems that test the quality of windings based on the characteristic values. [Explanation of symbols]

[0111] 100 Inspection Systems 1. Measuring equipment 2. Data Processing Device 11 Impulse power supply 12 Voltage measurement section 21 Control section 22 Display section 23 Processing section 24 Memory section Aap,Aam,Ap1~Ap8,Am1~Am9 area dVa, dVb, dWc, dWd difference Da measurement Db Charging voltage value Dx characteristic value data e0~e2,f0~f2 points Ps, Pe, Pa, Pb, Pp, Pm time T2 time W0,W0a,W1,W2 waveform X Winding

Claims

1. a voltage application circuit that applies an impulse voltage across both ends of the winding to be measured; a measurement unit that measures the voltage across the winding to which the impulse voltage is applied by the voltage application circuit at a predetermined sampling period, records the measured value, and generates a voltage waveform that indicates the measurement result; a processing unit that identifies a characteristic value indicating a winding characteristic of the winding based on the voltage waveform, The processing unit a first waveform generation process for generating a first waveform for a predetermined first time period by dividing each voltage value of the voltage waveform by a charging voltage value of a voltage application circuit when the impulse voltage is applied; a second waveform generation process for generating a second waveform by sequentially executing a process for identifying an amount of change in each of the voltage values ​​measured within a predetermined second time period, the second time period being shorter than the predetermined first time period, while changing each of the values ​​to be processed in a time axis direction of the first waveform; a process A for identifying a first value among the values ​​in the first waveform that is a positive value and satisfies a first predetermined condition, and a second value among the values ​​that corresponds to a voltage value measured after the voltage value corresponding to the first value and is a negative value that satisfies a second predetermined condition, and for identifying a value A that is an average value of the values ​​of the second waveform within a range corresponding to a range from the first value to the second value in the first waveform; The winding characteristic measuring device specifies the specified value A as the characteristic value.

2. 2. The winding characteristic measuring device according to claim 1, wherein the processing unit, in the first waveform generation process, normalizes the value of a time axis parameter by setting a value corresponding to a measurement time of the measurement value that is first recorded within the predetermined first time period to 0 and a value corresponding to a measurement time of the measurement value that is last recorded within the predetermined first time period to 1, together with a process of converting the sampling period in accordance with the normalized value of the time axis parameter, thereby generating the first waveform.

3. a voltage application circuit that applies an impulse voltage across both ends of the winding to be measured; a measurement unit that measures the voltage across the winding to which the impulse voltage is applied by the voltage application circuit at a predetermined sampling period, records the measured value, and generates a voltage waveform that indicates the measurement result; a processing unit that identifies a characteristic value indicating a winding characteristic of the winding based on the voltage waveform, The processing unit a first waveform generation process for generating a first waveform for a predetermined first time period by dividing each voltage value of the voltage waveform by a charging voltage value of a voltage application circuit when the impulse voltage is applied; a second waveform generation process for generating a second waveform by sequentially executing a process for identifying an amount of change in each of the voltage values ​​measured within a predetermined second time period, the second time period being shorter than the predetermined first time period, while changing each of the values ​​to be processed in a time axis direction of the first waveform; a process B for identifying a third value among the values ​​in the first waveform that satisfies a third predetermined condition, and a fourth value among the values ​​that corresponds to a voltage value measured after the voltage value corresponding to the third value that satisfies a fourth predetermined condition, and for identifying a value B that is an average value of the values ​​in the second waveform within a range corresponding to the range from the third value to the fourth value in the first waveform; The winding characteristic measuring device specifies the specified value B as the characteristic value.

4. 4. The winding characteristic measuring device according to claim 3, wherein the processing unit, in the first waveform generation process, normalizes the value of a time axis parameter by setting a value corresponding to a measurement time of the measurement value that is first recorded within the predetermined first time period to 0 and setting a value corresponding to a measurement time of the measurement value that is last recorded within the predetermined first time period to 1, together with a process of converting the sampling period in accordance with the normalized value of the time axis parameter, thereby generating the first waveform.

5. a voltage application circuit that applies an impulse voltage across both ends of the winding to be measured; a measurement unit that measures the voltage across the winding to which the impulse voltage is applied by the voltage application circuit at a predetermined sampling period, records the measured value, and generates a voltage waveform that indicates the measurement result; a processing unit that identifies a characteristic value indicating a winding characteristic of the winding based on the voltage waveform, The processing unit a waveform generation process for generating a first waveform for a predetermined time by dividing each voltage value of the voltage waveform by a charging voltage value of a voltage application circuit when the impulse voltage is applied; a process C for identifying a first positive value among the values ​​in the first waveform that satisfies a first predetermined condition, and a second negative value among the values ​​that corresponds to the voltage value measured after the voltage value corresponding to the first value and that satisfies a second predetermined condition, and for each value from the first value to the second value in the first waveform, identifying at least one of a value Cp obtained by multiplying the sum of the positive values ​​by the value of the sampling period and a value Cm obtained by multiplying the sum of the absolute values ​​of the negative values ​​by the value of the sampling period; The winding characteristic measuring device specifies the determined at least one value as the characteristic value.

6. the processing unit executes a process D to determine a value D obtained by dividing the value Cm by the value Cp; 6. The winding characteristic measuring device according to claim 5, wherein the specified value D is specified as the characteristic value.

7. the processing unit executes a process E to identify at least one of a value Ep, which is a value of a positive average amplitude obtained by dividing the value Cp by the number of the positive values ​​totaled when the value Cp was identified, and a value Em, which is a value of a negative average amplitude obtained by dividing the value Cm by the number of absolute values ​​of the negative values ​​totaled when the value Cm was identified; 6. The winding characteristic measuring device according to claim 5, wherein the at least one of the determined values ​​is determined as the characteristic value.

8. the processing unit executes a process F to determine a value F obtained by dividing the value Em by the value Ep; 8. The winding characteristic measuring device according to claim 7, wherein the specified value F is specified as the characteristic value.

9. 6. The winding characteristic measuring device according to claim 5, wherein the processing unit, in the first waveform generation process, normalizes the value of a time axis parameter by setting a value corresponding to a measurement time of the measurement value that is first recorded within the predetermined first time period to 0 and a value corresponding to a measurement time of the measurement value that is last recorded within the predetermined first time period to 1, together with a process of converting the sampling period in accordance with the normalized value of the time axis parameter, thereby generating the first waveform.

10. a voltage application circuit that applies an impulse voltage across both ends of the winding to be measured; a measurement unit that measures the voltage across the winding to which the impulse voltage is applied by the voltage application circuit at a predetermined sampling period, records the measured value, and generates a voltage waveform that indicates the measurement result; a processing unit that identifies a characteristic value indicating a winding characteristic of the winding based on the voltage waveform, The processing unit a waveform generation process for generating a first waveform for a predetermined time by dividing each voltage value of the voltage waveform by a charging voltage value of a voltage application circuit when the impulse voltage is applied; a process G for respectively identifying a third value among the values ​​in the first waveform that satisfies a third predetermined condition and a fourth value among the values ​​that corresponds to the voltage value measured after the voltage value corresponding to the third value and that satisfies a fourth predetermined condition, and for identifying a value G obtained by multiplying the sum of the absolute values ​​of the values ​​from the third value to the fourth value in the first waveform by the value of the sampling period; The winding characteristic measuring device specifies the specified value G as the characteristic value.

11. the processing unit executes a process H for determining an average amplitude value H obtained by dividing the value G by the number of the absolute values ​​summed up when the value G was determined; 11. The winding characteristic measuring device according to claim 10, wherein the specified value H is specified as the characteristic value.

12. 11. The winding characteristic measuring device according to claim 10, wherein the processing unit, in the first waveform generation process, normalizes the value of a time axis parameter by setting a value corresponding to a measurement time of the measurement value that is first recorded within the predetermined first time period to 0 and setting a value corresponding to a measurement time of the measurement value that is last recorded within the predetermined first time period to 1, together with a process of converting the sampling period in accordance with the normalized value of the time axis parameter, thereby generating the first waveform.

13. a voltage application circuit that applies an impulse voltage across both ends of the winding to be measured; a measurement unit that measures the voltage across the winding to which the impulse voltage is applied by the voltage application circuit at a predetermined sampling period, records the measured value, and generates a voltage waveform that indicates the measurement result; a processing unit that identifies a characteristic value indicating a winding characteristic of the winding based on the voltage waveform, The processing unit a waveform generation process for generating a first waveform for a predetermined time by dividing each voltage value of the voltage waveform by a charging voltage value of a voltage application circuit when the impulse voltage is applied; a third value among the values ​​in the first waveform that satisfies a predetermined third condition, and a fourth value among the values ​​corresponding to the voltage values ​​measured after the voltage value corresponding to the third value that satisfies a predetermined fourth condition, and for each of the third value to the fourth value in the first waveform, a process I is performed to identify at least one of a value Ip that is a positive average amplitude obtained by dividing the sum of the positive values ​​by the number of the positive values, and a value Im that is a negative average amplitude obtained by dividing the sum of the absolute values ​​of the negative values ​​by the number of the absolute values ​​of the negative values, The winding characteristic measuring device specifies the determined at least one value as the characteristic value.

14. the processing unit executes a process J for determining a value J obtained by dividing the value Im by the value Ip; 14. The winding characteristic measuring device according to claim 13, wherein the specified value J is specified as the characteristic value.

15. 14. The winding characteristic measuring device according to claim 13, wherein the processing unit, in the first waveform generation process, normalizes the value of a time axis parameter by setting a value corresponding to a measurement time of the measured value that is first recorded within the predetermined first time period to 0 and setting a value corresponding to a measurement time of the measured value that is last recorded within the predetermined first time period to 1, together with a process of converting the sampling period in accordance with the normalized value of the time axis parameter, thereby generating the first waveform.

16. A winding characteristic measuring device according to any one of claims 1 to 15, An inspection system comprising a determination device that determines whether the winding is good or bad based on the characteristic value.

Images