Inspection support device
The inspection support device addresses the issue of inconsistent markings by automatically matching and displaying inspection results from different periods on a single line, enhancing the clarity of inspection history.
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2024-09-11
- Publication Date
- 2026-03-24
AI Technical Summary
Existing inspection support devices struggle with inconsistent and non-matching markings across different inspection periods, making it difficult to accurately associate and display inspection results from multiple data sets.
An inspection support device that automatically matches data sets from different inspection periods by setting a matching range in one dataset and projecting it onto another, allowing for the display of inspection information from the same location on a single line, even if the markings differ.
Enables easy understanding of inspection results from different time periods by displaying information for the same inspection location marked differently at various times on a single line, facilitating quick grasp of inspection history.
Smart Images

Figure 2026052463000001_ABST
Abstract
Description
Technical Field
[0001] The technology disclosed in this specification relates to an inspection support device that easily displays past inspection results of inspection points.
Background Art
[0002] Generally, in a structure, a plurality of inspection points are periodically inspected. An operator acquires an image for each inspection point or leaves information describing the situation such as deterioration. Inspection support devices that reduce the load on the operator performing the inspection are disclosed in, for example, Patent Documents 1 and 2. The device of Patent Document 1 stores an image of an inspection point in association with the shooting date and time. Further, the device calculates the difference in the damage level between two images at the same shooting position on the first and second shooting dates, respectively, and displays a heat map according to the difference in the damage level.
[0003] The device of Patent Document 2 calculates a score indicating the degree of surface deterioration of an inspection point from an image of the inspection point. The device stores the image and the score in association with the inspection point. The operator can refer to the image and score of the inspection point at any time.
Prior Art Documents
Patent Documents
[0004]
Patent Document 1
Patent Document 2
Summary of the Invention
Problems to be Solved by the Invention
[0005] Images of inspection points and worker comments are mainly stored as handwritten documents or digital data. Workers manually mark the inspection points on diagrams of structures that include the inspection points. In this case, the position of the marks on the diagram may differ slightly from worker to worker. Alternatively, the shape of the marks indicating the inspection points may differ from worker to worker. Even with digital data, the markings may not be properly matched across multiple data sets from different inspection dates. This specification provides an inspection support device that can automatically match data for the same inspection point across multiple data sets from different inspection dates and display the inspection results in an easy-to-understand manner. [Means for solving the problem]
[0006] The inspection support device disclosed herein comprises a storage device, a display device, and a computer. The storage device stores the following first / second data sets. The first data set is a data set created in the first period and includes a first inspection area diagram in which a first mark is marked on each of several inspection points on a diagram of the structure to be inspected, and first inspection information which is information on each inspection point in the first period and is associated with the respective first mark. For example, in a first inspection area diagram that includes two inspection points (inspection point A and inspection point B), inspection point A is marked with a firsta mark and inspection point B is marked with a firstb mark. The firsta inspection information for inspection point A is associated with the firsta mark, and the firstb inspection information for inspection point B is associated with the firstb mark.
[0007] The second dataset is similar to the first dataset, but is a dataset created in a second period different from the first period. It includes a second inspection area diagram with the same layout as the first inspection area diagram, where second marks are marked at each inspection location, and second inspection information, which is information about each inspection location in the second period and is associated with each second mark.
[0008] The computer then sets a matching range in the first inspection area diagram that includes one first mark, projects this matching range onto the second inspection area diagram, and if the second mark is included within the projected matching range, it determines that the first and second marks included within the same matching range indicate the same inspection location. The computer then displays the first inspection information associated with the first mark included within a single matching range and the second inspection information associated with the second mark included within the matching range on a single line on the display device.
[0009] The inspection support device disclosed herein can display information for the same inspection location, marked differently at different times, on a single line. This allows the operator to grasp inspection results from different time periods at a glance.
[0010] The first and second datasets may contain multiple types of information. For example, the first and second datasets may include images of inspection area diagrams with marks indicating inspection points, and comments written by workers. In this case, the computer should display the first and second datasets separately for each type of information. Specifically, the computer should display the images contained in the first and second datasets together, and also display the comments contained in the first and second datasets together. Such a display makes it easier for workers to understand the history of inspection results.
[0011] For example, if multiple inspection points are set for a single road section, the "inspection area" is the entire road section, and the "inspection area diagram" may be a structural diagram (or plan view or photograph) of the entire road section.
[0012] Details of the technology disclosed herein and further improvements are described in the following "Modes for Carrying Out the Invention". [Brief explanation of the drawing]
[0013] [Figure 1]This is a block diagram of the inspection support device of the embodiment. [Figure 2] This is an example of the first dataset. [Figure 3] This is an example of the second dataset. [Figure 4] This is a diagram showing the matching range set in the first inspection area diagram. [Figure 5] This diagram shows the comparison range projected onto the second inspection area diagram. [Figure 6] This is an example of how inspection results are displayed. [Modes for carrying out the invention]
[0014] The inspection support device 10 of this embodiment will be described with reference to the drawings. Figure 1 shows a block diagram of the inspection support device 10. The inspection support device 10 displays multiple past inspection results for multiple inspection points set in the inspection area in an easy-to-read format. In this embodiment, the inspection area is a predetermined road section.
[0015] The inspection support device 10 comprises a computer 11 and a display device 12 and a storage device 13 connected to the computer 11. The storage device 13 may be connected to the computer 11 via a network. The inspection support device 10 also includes a camera 14 connected to the computer 11. The computer 11 can store images captured by the camera in its primary storage device or in the storage device 13. The computer 11 should be small enough to be carried by an operator.
[0016] The worker inspecting the inspection points takes an image of the inspection point with camera 14 and writes down comments about the inspection point. Alternatively, the worker enters the comments about the inspection point into computer 11 using a keyboard (not shown). The comments include the state of deterioration of the inspection point. The worker also marks the location of the inspection point on a diagram of the structure to be inspected (in this embodiment, a plan view of a predetermined road section). The marks indicate the inspection points. In this specification, the diagram of the structure to be inspected is referred to as the inspection area diagram.
[0017] A dataset is a collection of an inspection area diagram, images of inspection points, and comments regarding the inspection points. The old dataset may be recorded on paper media. In that case, the operator scans the paper media and stores it in the storage device 13.
[0018] In this embodiment, a first dataset 100 created in a first period (for example, 2017) and a second dataset 200 created in a second period (for example, 2022) different from the first period are stored in the storage device 13. The storage device 13 may store datasets of more periods.
[0019] An example of the first dataset 100 is shown in FIG. 2. The first dataset 100 includes a first inspection area diagram 110 in which first marks are marked at the positions of a plurality of inspection points in the diagram of the structure to be inspected, and first inspection information which is information regarding each inspection point. The first inspection area diagram 110 is provided with a plurality of first marks (first a mark 111 and first b mark 112), and each first inspection information is associated with each first mark. The first a mark 111 is associated with first a inspection information 120, and the first b mark 112 is associated with first b inspection information (not shown).
[0020] The first dataset 100 is data created at a predetermined first time period. In the example of FIG. 2, two inspection locations (inspection location A and inspection location B) are shown. Inspection location A is marked with a first a mark 111, and inspection location B is marked with a first b mark 112. The first a inspection information 120 includes an image 121 of inspection location A and a comment 122 regarding inspection location A. In this example, inspection location A is a road expansion device, and image 121 is an image of the expansion device at the first time period. The gray portion in image 121 indicates the displacement of the road on the left and right sides of the expansion device. The expansion device expands and contracts in width according to this displacement. Comment 122 is regarding the situation of the expansion device (inspection location A) at the first time period. In this example, the comment includes the member name, type of damage, and rank of damage of inspection location A. Comment 122 may include even more information regarding inspection location A.
[0021] Although illustration is omitted, the first dataset 100 also includes first b inspection information (an image of inspection location B at the first time period and a comment regarding inspection location B) associated with the first b mark 112 indicating inspection location B.
[0022] An example of the second dataset 200 is shown in FIG. 3. The second dataset 200 includes a second inspection area diagram 210 in which second marks are marked at the positions of a plurality of inspection locations in a diagram of the structure to be inspected, and second inspection information which is information regarding each inspection location. In the example of FIG. 3, two inspection locations (inspection location A and inspection location B) are shown. The second marks include a second a mark 211 and a second b mark 212.
[0023] The position of inspection location A is marked with a second a mark 211, and the position of inspection location B is marked with a second b mark 212. The second a mark 211 is associated with information on inspection location A at the second time period (second a inspection information 220). The second b mark 212 is associated with information on inspection location B at the second time period (second b inspection information not shown).
[0024] Inspection Information 220 (2a) includes an image 221 of inspection point A during the second period and a comment 222 regarding inspection point A during the second period. Image 221 is an image of an expansion joint, and the width of the gray area is wider than that of the expansion joint during the first period (image 121). The increase in width indicates that the expansion joint has deteriorated. Comment 222 concerns inspection point B during the second period and notes that deterioration is progressing.
[0025] Although not shown in the diagram, the second dataset 200 also includes the second b inspection information (image of inspection location B and comments about inspection location B during the second period) associated with the second b mark 212 indicating inspection location B.
[0026] The first dataset 100 is data created at a predetermined first time (e.g., 2017), and the second dataset 200 is data created at a different time (e.g., 2022).
[0027] In this embodiment, the structure to be inspected is a predetermined road section, and inspection area diagrams 110 and 210 show plan views of the road section.
[0028] Marks 1a111 and 1b112 are rectangular marks that were hand-drawn by workers during the first period. Marks 2a211 and 2b212 are rectangular marks that were hand-drawn by workers during the second period.
[0029] The first data set 100 (first inspection area diagram 110, first a inspection information 120, and first b inspection information) created in the first period is simultaneously imported into the computer 11. The first inspection area diagram 110 is converted into an image by a scanner and imported into the computer 11. At this time, the characters in the first data set are read as digital data by an optical character recognition (OCR) device and stored in the storage device 13. At this time, the computer 11 stores the first inspection information in association with the marks of each inspection point in the first inspection area diagram 110. More specifically, the computer 11 stores the first a inspection information 120 in association with the first a mark 111 marked at the location of inspection point A in the first period. The computer 11 also stores the first b inspection information (not shown) in association with the first b mark 112 marked at the location of inspection point B.
[0030] An example of an algorithm for extracting marks from an inspection area diagram is as follows:
[0031] Computer 11 (storage device 13) stores an inspection area diagram without any marks. The inspection area diagram without marks will be referred to below as the basic area diagram. The basic area diagram is also the same type of image (e.g., a bitmap image) as the inspection area diagrams 110 and 210 captured by the scanner. Computer 11 creates a diagram showing the difference between the first inspection area diagram 110 and the basic area diagram. The diagram showing only the difference will be referred to below as the first difference diagram. The first difference diagram shows only the first mark, which is not depicted in the basic area diagram. Similarly, computer 11 creates a diagram showing the difference between the second inspection area diagram 210 and the basic area diagram (second difference diagram). The second difference diagram shows only the second mark, which is not depicted in the basic area diagram. Computer 11 can identify the position and shape of the first marks (first a mark 111 and first b mark 112) in the diagram from the first difference diagram, and can identify the position and shape of the second marks (second a mark 211 and second b mark 212) in the diagram from the second difference diagram.
[0032] The same applies to the second dataset 200 (second inspection area diagram 210, second a inspection information 220, and second b inspection information) created in the second period. Computer 11 stores the second a inspection information 220 in association with the second a mark 211 marked at the location of inspection point A in the second period. Similarly, computer 11 stores the second b inspection information (not shown) in association with the second b mark 212 marked at the location of inspection point B.
[0033] Mark 1a111 and Mark 2a211 are handwritten marks by the workers. Therefore, although both indicate the same inspection point A, their positions on the inspection area diagram are slightly different, and their mark shapes are also slightly different. The same applies to Mark 1b112 and Mark 2b212.
[0034] Computer 11 can compare the first inspection area diagram 110 and the second inspection area diagram 210, extract marks indicating the same inspection locations, and display inspection information for the same locations from different time periods. The mechanism is explained below.
[0035] Computer 11 sets a matching range in the first inspection area diagram 110 that includes each first mark. Figure 4 shows a diagram in the first inspection area diagram 110 in which a matching range 21 including the first a mark 111 is set. As mentioned earlier, the position and shape of the first a mark 111 in the diagram are extracted from the first difference diagram. In the example of Figure 4, the matching range 21 including the first a mark 111 is set at the coordinate (X1, Y1) in the first inspection area diagram 110.
[0036] Next, the computer 11 projects the matching range 21 onto the second inspection area diagram 210. Figure 5 shows the second inspection area diagram 210 with the matching range 21 projected onto it. If a mark indicating an inspection location exists within the projected matching range 21, the computer 11 determines that the mark indicates the same inspection location as the first a mark 111. As mentioned earlier, the position and shape of the second a mark 211 in the diagram are extracted from the second difference diagram. In practice, the computer 11 projects the matching range 21 onto the second difference diagram, and if a mark exists within the projected matching range, it determines that the mark indicates the same inspection location as the first a mark 111. In the example in Figure 5, since the second a mark 211 is located within the matching range 21, the computer 11 determines that the second a mark 211 indicates the same inspection location A as the first a mark 111.
[0037] When the computer 11 determines that the first a mark 111 and the second a mark 211 indicate the same inspection point, it displays the first a inspection information 120 associated with the first a mark 111 and the second a inspection information 220 associated with the second a mark 211 on the display device 12. At this time, the computer 11 displays the first a inspection information 120 and the second a inspection information 220 on a single line on the screen of the display device 12.
[0038] Figure 6 shows an example of the display. As mentioned earlier, the 1a inspection information 120 includes an image 121 of inspection location A during the first period and a comment 122 regarding inspection location A during the first period. The 2a inspection information 220 includes an image 221 of inspection location A during the second period and a comment 222 regarding inspection location A during the second period. In the example in Figure 6, the 1a inspection information 120 (image 121 of inspection location A and comment 122 regarding inspection location A) and the 2a inspection information 220 (image 221 of inspection location A and comment 222 regarding inspection location A) are displayed on a single line 12a.
[0039] In addition, in the example in Figure 6, the first inspection area diagram 110 and the second inspection area diagram 210 are also displayed on the same row 12a. That is, the computer 11 displays the first data set 100 and the second data set 200 related to inspection location A on a single row 12a.
[0040] More specifically, the computer 11 displays the first data set 100 and the second data set 200 on the display device 12, according to the type of information. The first data set 100 includes the first inspection area diagram 110 and the first a inspection information 120 (image 121 of inspection location A and comments 122 regarding inspection location A). The data type of the first inspection area diagram 110 is a scanned bitmap image, image 121 is an image of another data structure (e.g., TIFF format), and comments 122 are text data captured by an optical character recognition device. The second data set 200 also contains similar types of information. In Figure 6, the bitmap first inspection area diagram 110 and the second inspection area diagram 210 are displayed together in column 12b on the screen. Similarly, images 121 and 221, which are TIFF type image data, are displayed together in column 12c on the screen, and comments 122 and 222, which are text data, are displayed together in column 12d on the screen.
[0041] Computer 11 performs the same processing on the first b mark 112 as it did on the first a mark 111. If Computer 11 determines that the first b mark 112 and the second b mark 212 are marks indicating the same inspection point B, it displays the first b inspection information associated with the first b mark and the second b inspection information associated with the second b mark 212 on the display device 12 on a single line.
[0042] Computer 11 extracts marks from the inspection area diagram and identifies their location and shape (size). Computer 11 can then display information for the same inspection location, marked differently at different times, on a single line. This allows the worker to quickly grasp the history of inspection results.
[0043] The features of the inspection support device 10 of the embodiment are summarized below. The inspection support device 10 comprises a computer 11, a display device 12, and a storage device 13. The storage device 13 stores a first data set 100 and a second data set 200. The first data set 100 is a data set created in the first period. The first data set 100 includes a first inspection area diagram 110 in which a first mark is marked on each of the multiple inspection points on a diagram of the structure to be inspected, and first inspection information which is information on each inspection point in the first period and is associated with each first mark. In the embodiment, the first mark includes a first a mark 111 and a first b mark 112. The first a mark 111 is associated with the first a inspection information 120, and the first b mark 112 is associated with the first b inspection information (not shown).
[0044] The second dataset 200 is a dataset created in a second period, different from the first period. The second dataset 200 includes a second inspection area diagram 210 in which a second mark is marked on each of the multiple inspection points on a diagram of the structure to be inspected, and second inspection information which is information on each inspection point in the second period and is associated with each second mark. In the example, the second marks include second a mark 211 and second b mark 212. Second a mark 211 is associated with second a inspection information 220, and second b mark 212 is associated with second b inspection information (not shown).
[0045] Computer 11 sets a matching range 21 in the first inspection area diagram 110 that includes one first mark (for example, first a mark 111), and projects the matching range 21 onto the second inspection area diagram 210. If the projected matching range 21 includes a second mark (second a mark 211), Computer 11 determines that both marks indicate the same inspection location. In this case, Computer 11 displays the first a inspection information 120 and the second a inspection information 220 on the display device 12 screen in a single row (displayed horizontally).
[0046] More specifically, computer 11 performs the following processing. Computer 11 (storage device 13) stores a diagram (basic area diagram) of the structure to be inspected that does not have any marks. The first inspection area diagram 110, the second inspection area diagram 210, and the basic area diagram are image data of the same type. Computer 11 creates a first difference diagram by taking the difference between the first inspection area diagram 110 and the basic area diagram, and creates a second difference diagram by taking the difference between the second inspection area diagram 210 and the basic area diagram. "Taking the difference between images" means taking the difference in numerical values that indicate the intensity of each pixel. Only shapes that are not represented in the basic area diagram remain in the difference diagram. In other words, only marks drawn at the locations of the inspection points remain in the difference diagram. Multiple marks remain in the difference diagram. From the first difference diagram, computer 11 identifies the position and shape (size) of each of the multiple first marks in the diagram, and from the second difference diagram, it identifies the position and shape (size) of each of the multiple second marks in the diagram. Since the position and shape of each mark are specified in the first inspection area diagram 110 and the second inspection area diagram 210, the computer 11 can determine the positional relationship between the first and second marks, as described above.
[0047] The size of the matching area is set to, for example, the size of one first mark plus a predetermined margin. Alternatively, the size of the matching area is set to one-tenth (or one-twentieth) the size of the area of the inspection area diagram.
[0048] The inspection support device 10 in this embodiment automatically associates inspection results from different inspection periods that were not originally associated, and displays past inspection results for each inspection location in an easy-to-understand manner.
[0049] The following points concern the technology of the embodiment. When the structure to be inspected is a nuclear reactor, the "inspection area diagram" may be a perspective view, plan view, or side view of the structure including the inspection points. Alternatively, the "inspection area diagram" may be a photograph of the structure including the inspection points. Structures such as bridges and nuclear reactors may be schematic or simplified in the "inspection area diagram". When the inspection points are structures along a specific road (such as guardrails, road signs, or utility poles), the "inspection area diagram" may be a map including the specific road. The structure to be inspected may be a road in a predetermined section. In that case, the road may be represented by schematic lines in the "inspection area diagram". The locations of multiple inspection points are illustrated on the "inspection area diagram".
[0050] Comments regarding the inspection points may include the names and numbers of the components, or characteristics of the components. The comments should also include the inspection results (such as the degree of deterioration of the inspected points).
[0051] Inspection information can originally be in digital data format. Within a dataset for the same period, inspection information is associated with marks. However, the correspondence between marks and inspection information from one period and marks and inspection information from another period is unknown. The technology described in the embodiment allows marks from one period to be associated with marks from another period, and as a result, it is found that inspection information from one period and inspection information from another period relate to the same inspection location.
[0052] Although specific examples of the present invention have been described in detail above, these are merely illustrative and do not limit the scope of the claims. The technologies described in the claims include various modifications and changes to the specific examples illustrated above. The technical elements described in this specification or drawings exhibit technical usefulness individually or in various combinations, and are not limited to the combinations described in the claims at the time of filing. Furthermore, the technologies illustrated in this specification or drawings can achieve multiple objectives simultaneously, and achieving even one of these objectives itself constitutes technical usefulness. [Explanation of Symbols]
[0053] 10: Inspection support device 11: Computer 12: Display device 13: Storage device 14: Camera 21: Matching range 100: First data set 110: First inspection area diagram 111, 112: First mark 120: Firsta inspection information (First inspection information) 121, 221: Image 122, 222: Comment 200: Second data set 210: Second inspection area diagram 211, 212: Second mark 220: Seconda inspection information (Second inspection information)
Claims
1. Memory device and Display device and Computers and, It is equipped with, The aforementioned storage device includes: A dataset created in the first period, comprising: a first inspection area diagram in which a first mark is marked on each of multiple inspection points on a diagram of the structure to be inspected; and first inspection information which is information on each of the said inspection points in the first period and is associated with each of the said first marks; A dataset created in a second period different from the first period, comprising: a second inspection area diagram having the same composition as the first inspection area diagram, with a second mark indicated at each of the inspection locations; and a second inspection information set in the second period, with information on each of the inspection locations associated with each of the second marks; It is stored there, The computer sets a matching range in the first inspection area diagram that includes one first mark, projects the matching range onto the second inspection area diagram, and if the second mark is included within the projected matching range, it displays the first inspection information associated with the first mark included within the matching range and the second inspection information associated with the second mark included within the matching range on the display device in a single row. Inspection support device.
2. The inspection support device according to claim 1, wherein the first dataset and the second dataset contain multiple types of information, and the computer displays the first dataset and the second dataset on the display device for each type.
Citation Information
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